CN103134988A - Multichannel value of resistance automation measuring system - Google Patents
Multichannel value of resistance automation measuring system Download PDFInfo
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- CN103134988A CN103134988A CN2013100395355A CN201310039535A CN103134988A CN 103134988 A CN103134988 A CN 103134988A CN 2013100395355 A CN2013100395355 A CN 2013100395355A CN 201310039535 A CN201310039535 A CN 201310039535A CN 103134988 A CN103134988 A CN 103134988A
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Abstract
本发明公开了一种多路阻值自动化测量系统。其包括老化电源、多路电子开关阵列、数据采集器、限流电阻、电路保护单元及计算机。其中多路电子开关阵列是一个多路单刀双闸开关阵列，其可根据多路红外器件中的任意一路元器件的测试要求，断开该路元器件与老化电源连接，将其接通至数据采集器，以完成元器件的试验状态与测试状态的自动切换；同时使用数据采集器对切换过来的元器件进行阻值测量，实现阻值自动测试的目的。通过计算机发送向数据采集器的RS232接口方式命令的方式，将测量数据转移至计算机进行存储；此系统实现了对多路元器件自动阻值测试和自动数据存储，提高了元器件老化数据采集的速率、准确度、数据量。
The invention discloses a multi-channel resistance automatic measurement system. It includes an aging power supply, a multi-way electronic switch array, a data collector, a current limiting resistor, a circuit protection unit and a computer. The multi-channel electronic switch array is a multi-channel single-pole double-gate switch array, which can disconnect the component from the aging power supply according to the test requirements of any component in the multi-channel infrared device, and connect it to the data The collector is used to complete the automatic switching between the test state and the test state of the components; at the same time, the data collector is used to measure the resistance of the switched components to achieve the purpose of automatic resistance testing. The measurement data is transferred to the computer for storage by sending RS232 interface commands to the data collector from the computer; this system realizes automatic resistance testing and automatic data storage of multi-channel components, and improves the efficiency of component aging data collection. Speed, accuracy, data volume.
Description
Technical field
The present invention relates to a kind of full-automatic multichannel resistance measuring system, specifically refer to a kind of multichannel resistance automatic measuring system.
Background technology
In traditional infrared detector assembly aging test, photosensitive first resistance test needs first deenergization and current-limiting resistance thereof, the line of then drawing by vacuum tank is regularly manually measured, inaccuracy and the inconvenience of resistance test have so greatly been increased, the data of measuring simultaneously need the manual entry data, easily produce mistake in process of the test, and the data volume of accumulation is very limited, data processing speed is slow, can not process in real time.
Summary of the invention
Difficulty based on above-mentioned research multichannel infrared eye resistance test; this patent discloses a kind of full-automatic multichannel resistance measuring system of high-reliability; it comprises circuit protection unit, multi-channel electronic switch array and data acquisition unit, current-limiting resistance, aging power supply and computing machine, it is characterized in that the test of multichannel component aging and measures automatic switchover, resistance measurement process automation, the storage of collection acquisition data computer, high-reliability.
Wherein, the multi-channel electronic switch array is multichannel hilted broadsword double-gate switch arrays, it is comprised of multi-disc SPDT chip ADG1634, the break-make of arbitrary switch can be by the built-in Single-chip Controlling of switch arrays, and the Simultaneous Switching array can be communicated by letter with data acquisition unit by the digital quantity input and output DIO of data acquisition unit; Data acquisition unit is fluke2620A, and it has RS232 data communication interface and digital quantity IO interface D0 ~ D7; Circuit protection unit is comprised of fuse, filter capacitor and three kinds of surge suppression devices, and wherein, three kinds of surge suppression devices of employing are respectively gas-discharge tube, twin zener dioder TVS and voltage dependent resistor (VDR); Aging power supply is large magnificent 15V constant voltage source; Labview software is housed in computing machine.
Aging power supply is as the power supply of whole aging test components and parts.Be connected to circuit protection unit after aging power supply, guarantee the stability of aging test.The circuit that connects after circuit protection unit is divided into 64 branch roads, each branch road all comprises then a current-limiting resistance X, a SPDT switch and tested components and parts, and wherein, current-limiting resistance X is different according to the tested components and parts of each branch road, resistance is also different, and its Standard resistance range is 4 ~ 10K Ω; The SPDT switch is a branch road form of multi-way switch array, and SPDT switch one end A_X meets current-limiting resistance X, and other end B_X connects the input end of data acquisition unit, and the non-common port 1 ~ 64 of components and parts is surveyed in the common port C_X reception of SPDT switch; The common port D of components and parts to be measured meets the output terminal of data acquisition unit, the common port C_X that non-common port 1 ~ 64 is received respectively the SPDT switch; Its circuit theory diagrams such as Fig. 1.
When any one components and parts in 64 tunnel components and parts to be measured have test request, computing machine by the RS232 interface communication with the D0 in data acquisition unit DIO for setting low, have components and parts etc. to be tested with expression; After the multi-channel electronic switch array is read and is set low signal, switch arrays switch SPDT on off state corresponding to these road components and parts, the plug-in strip of SPDT is from the A_X contact change-over to the B_X contact, namely disconnecting these road components and parts is connected with aging power supply, it is switched to data acquisition unit, completes the trystate of components and parts and the automatic switchover of test mode; Simultaneous computer sends test command by the RS232 interface to data acquisition unit, and the components and parts that switching is come carry out the resistance measurement, realizes the resistance purpose of test automatically; Computing machine sends to the mode of the RS232 interface mode order of data acquisition unit, measurement data is transferred to computing machine stores; Last computing machine sets low the D1 position in the DIO of data acquisition unit, sends to the multi-way switch array and is completed signal; The multi-channel electronic switch array reads D1 and sets low signal, and change-over switch is connected these road components and parts with aging power supply, and components and parts return to the aging test state.
Great advantage of the present invention is: fiduciary level is high, can guarantee to flow through the curent change of device less than 0.1mA, guarantee that components and parts can not sustain damage in process of the test and test process, but robotization realizes No. 64 components and parts and tests and independent test simultaneously, the automaticdata storage can improve speed, accuracy, the data volume of component aging data acquisition greatly.
Description of drawings
Fig. 1 is circuit theory diagrams of the present invention.
Fig. 2 workflow diagram of the present invention.
Embodiment
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described in further detail:
5 tunnel components and parts to be measured according to schematic diagram 1 wiring, are about to No. 5 components and parts one ends and receive respectively switch arrays joint C_1 ~ C_5, and the other end is received common port D, and D receives the output terminal of data acquisition unit; Aging power acquisition is followed the tracks of stabilized voltage supply with the DH1718E-5 type two-way of Beijing Dahua Radio Instruments Factory, when clicking the beginning testing button on computing machine, and step such as Fig. 2 of system's operation:
1, the selected components and parts loop numbering formation formation to be measured that needs test, computing machine sends the test initiation command to the multi-channel electronic switch array.
2, the minimum hilted broadsword double-gate switch of multi-channel electronic switch array switching circuit numbering, be connected to data acquisition unit with these road components and parts, simultaneously to data acquisition unit transmit button signal in place.
3, computing machine reads from data acquisition unit the switch signal in place that the multi-channel electronic switch array sends, if read switch signal in place, computing machine sends data acquisition command to data acquisition unit, and waits for the feedback information of data acquisition unit;
4, computing machine receives data acquisition unit and returns to valid data, the valid data that return is stored, and sent the complete signal of data acquisition to the multi-channel electronic switch array, removes the minimum components and parts of numbering from formation to be measured.
5, repeating step 2 ~ 4, and all components and parts to be measured are tested.
6, complete when all component testings to be measured, computing machine sends to the multi-channel electronic switch array and is completed signal.
7, the multi-channel electronic switch array receives that computing machine sends be completed signal after, the multi-channel electronic switch array is completed with all the hilted broadsword double-gate switch of testing loop, components and parts place and is switched, so that all components and parts are connected on aging power supply, allow components and parts proceed aging.
Claims (1)
1. a multichannel resistance automatic measuring system, comprise circuit protection unit, multi-channel electronic switch array and data acquisition unit, current-limiting resistance, aging power supply and computing machine, it is characterized in that:
Described multi-channel electronic switch array is multichannel hilted broadsword double-gate switch arrays, it is comprised of multi-disc SPDT chip ADG1634, the break-make of arbitrary switch is by the built-in Single-chip Controlling of switch arrays, and the Simultaneous Switching array is communicated by letter with data acquisition unit by the digital quantity input and output DIO of data acquisition unit;
Described data acquisition unit is fluke 2620A, and it has RS232 data communication interface and digital quantity IO interface D0 ~ D7;
Described circuit protection unit is comprised of fuse, filter capacitor and three kinds of surge suppression devices, and wherein, three kinds of surge suppression devices of employing are respectively gas-discharge tube, twin zener dioder TVS and voltage dependent resistor (VDR);
Described aging power acquisition is with large magnificent 15V constant voltage source;
Labview software is housed in described computing machine;
Aging power supply is as the power supply of whole aging test components and parts, be connected to circuit protection unit after aging power supply, the circuit that connects after circuit protection unit is divided into 64 branch roads, each branch road all comprises then a current-limiting resistance X, a SPDT switch and tested components and parts, wherein, current-limiting resistance X is different according to the tested components and parts of each branch road, and resistance is also different, and its Standard resistance range is 4 ~ 10K Ω; The SPDT switch is a branch road form of multi-way switch array, and SPDT switch one end A_X meets current-limiting resistance X, and other end B_X connects the input end of data acquisition unit, and the non-common port 1 ~ 64 of components and parts is surveyed in the common port C_X reception of SPDT switch; The common port D of components and parts to be measured meets the output terminal of data acquisition unit, the common port C_X that non-common port 1 ~ 64 is received respectively the SPDT switch.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108519518A (en) * | 2018-05-31 | 2018-09-11 | 常州机电职业技术学院 | High-resistance potentiometer carbon diaphragm array plate whole plate resistance value extraction circuit |
| CN108535556A (en) * | 2017-03-02 | 2018-09-14 | 台达电子工业股份有限公司 | Composite product testing system and testing method thereof |
| CN111157792A (en) * | 2020-01-07 | 2020-05-15 | 聚融医疗科技(杭州)有限公司 | High-reliability power supply impedance detection circuit system |
| CN111337741A (en) * | 2020-04-17 | 2020-06-26 | 常州华威电子有限公司 | Automatic test recorder for leakage current of electrolytic capacitor |
| CN115561527A (en) * | 2022-11-17 | 2023-01-03 | 之江实验室 | A system and method for multi-channel small-size and small resistance energization aging and resistance monitoring |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108535556A (en) * | 2017-03-02 | 2018-09-14 | 台达电子工业股份有限公司 | Composite product testing system and testing method thereof |
| CN108519518A (en) * | 2018-05-31 | 2018-09-11 | 常州机电职业技术学院 | High-resistance potentiometer carbon diaphragm array plate whole plate resistance value extraction circuit |
| CN111157792A (en) * | 2020-01-07 | 2020-05-15 | 聚融医疗科技(杭州)有限公司 | High-reliability power supply impedance detection circuit system |
| CN111337741A (en) * | 2020-04-17 | 2020-06-26 | 常州华威电子有限公司 | Automatic test recorder for leakage current of electrolytic capacitor |
| CN115561527A (en) * | 2022-11-17 | 2023-01-03 | 之江实验室 | A system and method for multi-channel small-size and small resistance energization aging and resistance monitoring |
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Application publication date: 20130605 |