CN103811624A - Encapsulation-free type UVLED (Ultraviolet Light-Emitting Diode) chip - Google Patents
Encapsulation-free type UVLED (Ultraviolet Light-Emitting Diode) chip Download PDFInfo
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- CN103811624A CN103811624A CN201410053805.2A CN201410053805A CN103811624A CN 103811624 A CN103811624 A CN 103811624A CN 201410053805 A CN201410053805 A CN 201410053805A CN 103811624 A CN103811624 A CN 103811624A
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- 230000005496 eutectics Effects 0.000 claims abstract description 36
- 239000000758 substrate Substances 0.000 claims abstract description 11
- 238000005538 encapsulation Methods 0.000 abstract description 5
- 238000005516 engineering process Methods 0.000 abstract description 4
- 230000017525 heat dissipation Effects 0.000 abstract description 4
- 239000002184 metal Substances 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000010931 gold Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 4
- 238000004806 packaging method and process Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 2
- 238000005566 electron beam evaporation Methods 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000003698 laser cutting Methods 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000012858 packaging process Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
- H10H20/831—Electrodes characterised by their shape
- H10H20/8312—Electrodes characterised by their shape extending at least partially through the bodies
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0133—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0137—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials the light-emitting regions comprising nitride materials
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
- H10H20/832—Electrodes characterised by their material
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/032—Manufacture or treatment of electrodes
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Abstract
本发明涉及一种免封装型UVLED芯片,包括衬底,在衬底的正面依次设置N-GaN层、发光层、P-GaN层和反射层;其特征是:在所述反射层、P-GaN层和发光层中设置通孔,通孔由反射层延伸至发光层的底部,通孔与N-GaN层连通;在所述通孔中和反射层的表面设置N共晶电极,在反射层表面设置P共晶电极。所述N共晶电极与P共晶电极的上表面平齐。本发明所述免封装型UVLED芯片热阻小、散热好,可以采用免封装技术,减少共晶封装的内应力。
The invention relates to an encapsulation-free UVLED chip, which includes a substrate, and an N-GaN layer, a light-emitting layer, a P-GaN layer and a reflective layer are sequentially arranged on the front of the substrate; it is characterized in that: on the reflective layer, P- Through holes are set in the GaN layer and the light-emitting layer, and the through holes extend from the reflective layer to the bottom of the light-emitting layer, and the through holes communicate with the N-GaN layer; N eutectic electrodes are set in the through holes and on the surface of the reflective layer. P eutectic electrodes are arranged on the surface of the layer. The N eutectic electrode is flush with the upper surface of the P eutectic electrode. The encapsulation-free UVLED chip of the present invention has small thermal resistance and good heat dissipation, and the encapsulation-free technology can be used to reduce the internal stress of eutectic encapsulation.
Description
技术领域 technical field
本发明涉及一种免封装型UVLED芯片,属于半导体封装技术领域。 The invention relates to an encapsulation-free UVLED chip, which belongs to the technical field of semiconductor encapsulation.
背景技术 Background technique
现有技术中LED芯片的封装方式大多较为复杂,并且封装过程中散热不好。而采用免封装技术大多采用的是植金球方式的倒装封装,现有的LED芯片结构在采用倒装封装时存在一定的难度。 Most of the packaging methods of LED chips in the prior art are relatively complicated, and the heat dissipation during the packaging process is not good. However, most of the non-encapsulation technologies adopt flip-chip packaging in the way of planting gold balls, and there are certain difficulties in using flip-chip packaging for the existing LED chip structure.
发明内容 Contents of the invention
本发明的目的是克服现有技术中存在的不足,提供一种免封装型UVLED芯片,热阻小,散热好,可以采用免封装技术,减少共晶封装的内应力。 The purpose of the present invention is to overcome the deficiencies in the prior art, and provide an encapsulation-free UVLED chip with small thermal resistance and good heat dissipation. Encapsulation-free technology can be used to reduce the internal stress of eutectic encapsulation.
按照本发明提供的技术方案,所述免封装型UVLED芯片,包括衬底,在衬底的正面依次设置N-GaN层、发光层、P-GaN层和反射层;其特征是:在所述反射层、P-GaN层和发光层中设置通孔,通孔由反射层延伸至发光层的底部,通孔与N-GaN层连通;在所述通孔中和反射层的表面设置N共晶电极,在反射层表面设置P共晶电极。 According to the technical solution provided by the present invention, the encapsulation-free UVLED chip includes a substrate, and an N-GaN layer, a light-emitting layer, a P-GaN layer and a reflective layer are sequentially arranged on the front of the substrate; it is characterized in that: A through hole is set in the reflective layer, the P-GaN layer and the light-emitting layer, the through hole extends from the reflective layer to the bottom of the light-emitting layer, and the through hole communicates with the N-GaN layer; N common is set in the through hole and the surface of the reflective layer The crystal electrode is provided with a P eutectic electrode on the surface of the reflective layer.
所述N共晶电极与P共晶电极的上表面平齐。 The N eutectic electrode is flush with the upper surface of the P eutectic electrode.
本发明所述免封装型UVLED芯片热阻小、散热好,可以采用免封装技术,减少共晶封装的内应力。 The encapsulation-free UVLED chip of the present invention has small thermal resistance and good heat dissipation, and the encapsulation-free technology can be used to reduce the internal stress of eutectic encapsulation.
附图说明 Description of drawings
图1为本发明的结构示意图。 Fig. 1 is a structural schematic diagram of the present invention.
图2为本发明的剖面示意图。 Fig. 2 is a schematic cross-sectional view of the present invention.
具体实施方式 Detailed ways
下面结合具体附图对本发明作进一步说明。 The present invention will be further described below in conjunction with specific drawings.
如图1、图2所示:所述免封装型UVLED芯片包括P共晶电极1、N共晶电极2、反射层3、P-GaN层4、发光层5、N-GaN层6、衬底7、通孔8等。
As shown in Figure 1 and Figure 2: the encapsulation-free UVLED chip includes P eutectic electrode 1, N
如图1、图2所示,本发明所述免封装型UVLED芯片包括衬底7,衬底7可以采用蓝宝石衬底等,在衬底7的正面依次设置N-GaN层6、发光层5、P-GaN层4和反射层3;在所述反射层3、P-GaN层4和发光层5中设置通孔8,通孔8由反射层3延伸至发光层5的底部,通孔8与N-GaN层6连通;在所述通孔8中和反射层3的表面设置N共晶电极2,在反射层3表面设置P共晶电极1,N共晶电极2与P共晶电极1的上表面平齐;
As shown in Figure 1 and Figure 2, the encapsulation-free UVLED chip of the present invention includes a
所述P共晶电极1和N共晶电极2采用Cr/Pt/Au/Sn金属层,Sn金属的厚度不低于3μm;所述反射层3为Al/Ni/Au金属层,反射层3材质主要为Al,反射层3通过Ni/Au金属层与P-GaN层4欧姆接触,在紫光365~420nm波段范围内反射率达到85%以上。
The P eutectic electrode 1 and the N
所述免封装型UVLED芯片的制备方法,采用以下步骤: The preparation method of the encapsulation-free UVLED chip adopts the following steps:
步骤1:利用MOCVD设备在蓝宝石衬底7上生长形成N-GaN层6、发光层5和P-GaN层4,通过改变生长过程中温度可以改变发光波长;
Step 1: using MOCVD equipment to grow and form N-
步骤2:利用ICP设备在发光层5和P-GaN层4上刻蚀出通孔和N共晶电极2的形状;
Step 2: using an ICP device to etch the shape of the through hole and the N
步骤3:利用电子束蒸发设备在P-GaN层4制作反射层3,反射层3金属为Al/Ni/Au,反射层3的主体为Al,Ni/Au的厚度为1~5nm,作为欧姆接触层与P-GaN层4接触;
Step 3: Make
步骤4:利用电子束蒸发设备和热阻蒸发设备在反射层3上制作P共晶电极1,在N-GaN层6上制作N共晶电极2,P共晶电极1和N共晶电极2彩和金属层Cr/Pt/Au/Sn,其中Sn层厚度不低于3μm;在制作N共晶电极2电时,在步骤2刻蚀成的通孔上蒸镀金属层后,N共晶电极2通孔8与N-GaN层6相连接;
Step 4: Make P eutectic electrode 1 on
步骤5:利用减薄、研磨设备将晶圆减薄到100~200um,再利用激光切割机将晶圆上的器件进行分离。 Step 5: Use thinning and grinding equipment to thin the wafer to 100~200um, and then use a laser cutting machine to separate the devices on the wafer.
本发明通过通孔8电极的设计,实现P共晶电极1和N共晶电极2高度相同,有利于提高回流焊时金属层的键合效果,减少共晶封装的内应力;本发明所述的P共晶电极1和N共晶电极2的主要材质为Sn,利用助焊剂固晶,无氧回流焊共晶的方式,在无氧环境中避免Sn氧化问题;可以实现低热阻封装,试验测试封装热阻小于2℃/W,共晶推力大于2000g。
The present invention realizes the same height of the P eutectic electrode 1 and the N
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410053805.2A CN103811624A (en) | 2014-02-18 | 2014-02-18 | Encapsulation-free type UVLED (Ultraviolet Light-Emitting Diode) chip |
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| CN201410053805.2A CN103811624A (en) | 2014-02-18 | 2014-02-18 | Encapsulation-free type UVLED (Ultraviolet Light-Emitting Diode) chip |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112366265A (en) * | 2020-11-06 | 2021-02-12 | 河源市天和第三代半导体产业技术研究院 | LED purple light whole surface Al reflection light-emitting device |
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|---|---|---|---|---|
| US20070228386A1 (en) * | 2006-03-30 | 2007-10-04 | Jin-Shown Shie | Wire-bonding free packaging structure of light emitted diode |
| CN101933166A (en) * | 2007-11-14 | 2010-12-29 | 克利公司 | Wafer level light emitting diode without wire bonding |
| CN102709438A (en) * | 2012-03-22 | 2012-10-03 | 浙江英特来光电科技有限公司 | Wireless packaging structure of high-power ceramic LED (Light-emitting Diode) |
| CN102738344A (en) * | 2011-04-15 | 2012-10-17 | 晶元光电股份有限公司 | light emitting device |
| CN203434182U (en) * | 2013-08-23 | 2014-02-12 | 严敏 | LED eutectic wafer |
| CN203826419U (en) * | 2014-02-18 | 2014-09-10 | 江苏新广联科技股份有限公司 | Package-free type UVLED chip |
| CN104064634A (en) * | 2013-03-22 | 2014-09-24 | 上海蓝光科技有限公司 | A method for manufacturing a high-brightness GaN-based eutectic welding light-emitting diode |
-
2014
- 2014-02-18 CN CN201410053805.2A patent/CN103811624A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070228386A1 (en) * | 2006-03-30 | 2007-10-04 | Jin-Shown Shie | Wire-bonding free packaging structure of light emitted diode |
| CN101933166A (en) * | 2007-11-14 | 2010-12-29 | 克利公司 | Wafer level light emitting diode without wire bonding |
| CN102738344A (en) * | 2011-04-15 | 2012-10-17 | 晶元光电股份有限公司 | light emitting device |
| CN102709438A (en) * | 2012-03-22 | 2012-10-03 | 浙江英特来光电科技有限公司 | Wireless packaging structure of high-power ceramic LED (Light-emitting Diode) |
| CN104064634A (en) * | 2013-03-22 | 2014-09-24 | 上海蓝光科技有限公司 | A method for manufacturing a high-brightness GaN-based eutectic welding light-emitting diode |
| CN203434182U (en) * | 2013-08-23 | 2014-02-12 | 严敏 | LED eutectic wafer |
| CN203826419U (en) * | 2014-02-18 | 2014-09-10 | 江苏新广联科技股份有限公司 | Package-free type UVLED chip |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112366265A (en) * | 2020-11-06 | 2021-02-12 | 河源市天和第三代半导体产业技术研究院 | LED purple light whole surface Al reflection light-emitting device |
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Application publication date: 20140521 |