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CN103811624A - Encapsulation-free type UVLED (Ultraviolet Light-Emitting Diode) chip - Google Patents

Encapsulation-free type UVLED (Ultraviolet Light-Emitting Diode) chip Download PDF

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Publication number
CN103811624A
CN103811624A CN201410053805.2A CN201410053805A CN103811624A CN 103811624 A CN103811624 A CN 103811624A CN 201410053805 A CN201410053805 A CN 201410053805A CN 103811624 A CN103811624 A CN 103811624A
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layer
encapsulation
eutectic
reflective layer
free
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黄慧诗
郭文平
柯志杰
邓群雄
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JIANGSU XINGUANGLIAN TECHNOLOGY Co Ltd
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JIANGSU XINGUANGLIAN TECHNOLOGY Co Ltd
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Priority to CN201410053805.2A priority Critical patent/CN103811624A/en
Publication of CN103811624A publication Critical patent/CN103811624A/en
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/83Electrodes
    • H10H20/831Electrodes characterised by their shape
    • H10H20/8312Electrodes characterised by their shape extending at least partially through the bodies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/013Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
    • H10H20/0133Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/013Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
    • H10H20/0137Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials the light-emitting regions comprising nitride materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/83Electrodes
    • H10H20/832Electrodes characterised by their material
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/032Manufacture or treatment of electrodes

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Abstract

本发明涉及一种免封装型UVLED芯片,包括衬底,在衬底的正面依次设置N-GaN层、发光层、P-GaN层和反射层;其特征是:在所述反射层、P-GaN层和发光层中设置通孔,通孔由反射层延伸至发光层的底部,通孔与N-GaN层连通;在所述通孔中和反射层的表面设置N共晶电极,在反射层表面设置P共晶电极。所述N共晶电极与P共晶电极的上表面平齐。本发明所述免封装型UVLED芯片热阻小、散热好,可以采用免封装技术,减少共晶封装的内应力。

The invention relates to an encapsulation-free UVLED chip, which includes a substrate, and an N-GaN layer, a light-emitting layer, a P-GaN layer and a reflective layer are sequentially arranged on the front of the substrate; it is characterized in that: on the reflective layer, P- Through holes are set in the GaN layer and the light-emitting layer, and the through holes extend from the reflective layer to the bottom of the light-emitting layer, and the through holes communicate with the N-GaN layer; N eutectic electrodes are set in the through holes and on the surface of the reflective layer. P eutectic electrodes are arranged on the surface of the layer. The N eutectic electrode is flush with the upper surface of the P eutectic electrode. The encapsulation-free UVLED chip of the present invention has small thermal resistance and good heat dissipation, and the encapsulation-free technology can be used to reduce the internal stress of eutectic encapsulation.

Description

免封装型UVLED芯片Package-free UVLED chip

技术领域 technical field

本发明涉及一种免封装型UVLED芯片,属于半导体封装技术领域。 The invention relates to an encapsulation-free UVLED chip, which belongs to the technical field of semiconductor encapsulation.

背景技术 Background technique

现有技术中LED芯片的封装方式大多较为复杂,并且封装过程中散热不好。而采用免封装技术大多采用的是植金球方式的倒装封装,现有的LED芯片结构在采用倒装封装时存在一定的难度。 Most of the packaging methods of LED chips in the prior art are relatively complicated, and the heat dissipation during the packaging process is not good. However, most of the non-encapsulation technologies adopt flip-chip packaging in the way of planting gold balls, and there are certain difficulties in using flip-chip packaging for the existing LED chip structure.

发明内容 Contents of the invention

本发明的目的是克服现有技术中存在的不足,提供一种免封装型UVLED芯片,热阻小,散热好,可以采用免封装技术,减少共晶封装的内应力。 The purpose of the present invention is to overcome the deficiencies in the prior art, and provide an encapsulation-free UVLED chip with small thermal resistance and good heat dissipation. Encapsulation-free technology can be used to reduce the internal stress of eutectic encapsulation.

按照本发明提供的技术方案,所述免封装型UVLED芯片,包括衬底,在衬底的正面依次设置N-GaN层、发光层、P-GaN层和反射层;其特征是:在所述反射层、P-GaN层和发光层中设置通孔,通孔由反射层延伸至发光层的底部,通孔与N-GaN层连通;在所述通孔中和反射层的表面设置N共晶电极,在反射层表面设置P共晶电极。 According to the technical solution provided by the present invention, the encapsulation-free UVLED chip includes a substrate, and an N-GaN layer, a light-emitting layer, a P-GaN layer and a reflective layer are sequentially arranged on the front of the substrate; it is characterized in that: A through hole is set in the reflective layer, the P-GaN layer and the light-emitting layer, the through hole extends from the reflective layer to the bottom of the light-emitting layer, and the through hole communicates with the N-GaN layer; N common is set in the through hole and the surface of the reflective layer The crystal electrode is provided with a P eutectic electrode on the surface of the reflective layer.

所述N共晶电极与P共晶电极的上表面平齐。 The N eutectic electrode is flush with the upper surface of the P eutectic electrode.

本发明所述免封装型UVLED芯片热阻小、散热好,可以采用免封装技术,减少共晶封装的内应力。 The encapsulation-free UVLED chip of the present invention has small thermal resistance and good heat dissipation, and the encapsulation-free technology can be used to reduce the internal stress of eutectic encapsulation.

附图说明 Description of drawings

图1为本发明的结构示意图。 Fig. 1 is a structural schematic diagram of the present invention.

图2为本发明的剖面示意图。 Fig. 2 is a schematic cross-sectional view of the present invention.

具体实施方式 Detailed ways

下面结合具体附图对本发明作进一步说明。 The present invention will be further described below in conjunction with specific drawings.

如图1、图2所示:所述免封装型UVLED芯片包括P共晶电极1、N共晶电极2、反射层3、P-GaN层4、发光层5、N-GaN层6、衬底7、通孔8等。 As shown in Figure 1 and Figure 2: the encapsulation-free UVLED chip includes P eutectic electrode 1, N eutectic electrode 2, reflective layer 3, P-GaN layer 4, light emitting layer 5, N-GaN layer 6, lining Bottom 7, through hole 8, etc.

如图1、图2所示,本发明所述免封装型UVLED芯片包括衬底7,衬底7可以采用蓝宝石衬底等,在衬底7的正面依次设置N-GaN层6、发光层5、P-GaN层4和反射层3;在所述反射层3、P-GaN层4和发光层5中设置通孔8,通孔8由反射层3延伸至发光层5的底部,通孔8与N-GaN层6连通;在所述通孔8中和反射层3的表面设置N共晶电极2,在反射层3表面设置P共晶电极1,N共晶电极2与P共晶电极1的上表面平齐; As shown in Figure 1 and Figure 2, the encapsulation-free UVLED chip of the present invention includes a substrate 7, and the substrate 7 can be a sapphire substrate, etc., and an N-GaN layer 6 and a light-emitting layer 5 are sequentially arranged on the front of the substrate 7 , P-GaN layer 4 and reflective layer 3; through holes 8 are set in the reflective layer 3, P-GaN layer 4 and light emitting layer 5, the through holes 8 extend from the reflective layer 3 to the bottom of the light emitting layer 5, the through holes 8 communicates with the N-GaN layer 6; an N eutectic electrode 2 is arranged in the through hole 8 and on the surface of the reflective layer 3, a P eutectic electrode 1 is arranged on the surface of the reflective layer 3, and the N eutectic electrode 2 and the P eutectic The upper surface of electrode 1 is flush;

所述P共晶电极1和N共晶电极2采用Cr/Pt/Au/Sn金属层,Sn金属的厚度不低于3μm;所述反射层3为Al/Ni/Au金属层,反射层3材质主要为Al,反射层3通过Ni/Au金属层与P-GaN层4欧姆接触,在紫光365~420nm波段范围内反射率达到85%以上。 The P eutectic electrode 1 and the N eutectic electrode 2 use a Cr/Pt/Au/Sn metal layer, and the thickness of the Sn metal is not less than 3 μm; the reflective layer 3 is an Al/Ni/Au metal layer, and the reflective layer 3 The material is mainly Al, and the reflective layer 3 is in 4-ohm contact with the P-GaN layer through the Ni/Au metal layer, and the reflectivity in the violet 365-420nm band range reaches more than 85%.

所述免封装型UVLED芯片的制备方法,采用以下步骤: The preparation method of the encapsulation-free UVLED chip adopts the following steps:

步骤1:利用MOCVD设备在蓝宝石衬底7上生长形成N-GaN层6、发光层5和P-GaN层4,通过改变生长过程中温度可以改变发光波长; Step 1: using MOCVD equipment to grow and form N-GaN layer 6, light-emitting layer 5 and P-GaN layer 4 on sapphire substrate 7, and the light-emitting wavelength can be changed by changing the temperature during the growth process;

步骤2:利用ICP设备在发光层5和P-GaN层4上刻蚀出通孔和N共晶电极2的形状; Step 2: using an ICP device to etch the shape of the through hole and the N eutectic electrode 2 on the light emitting layer 5 and the P-GaN layer 4;

步骤3:利用电子束蒸发设备在P-GaN层4制作反射层3,反射层3金属为Al/Ni/Au,反射层3的主体为Al,Ni/Au的厚度为1~5nm,作为欧姆接触层与P-GaN层4接触; Step 3: Make reflective layer 3 on P-GaN layer 4 using electron beam evaporation equipment, the metal of reflective layer 3 is Al/Ni/Au, the main body of reflective layer 3 is Al, the thickness of Ni/Au is 1~5nm, as the ohm The contact layer is in contact with the P-GaN layer 4;

步骤4:利用电子束蒸发设备和热阻蒸发设备在反射层3上制作P共晶电极1,在N-GaN层6上制作N共晶电极2,P共晶电极1和N共晶电极2彩和金属层Cr/Pt/Au/Sn,其中Sn层厚度不低于3μm;在制作N共晶电极2电时,在步骤2刻蚀成的通孔上蒸镀金属层后,N共晶电极2通孔8与N-GaN层6相连接; Step 4: Make P eutectic electrode 1 on reflective layer 3 by using electron beam evaporation equipment and thermal resistance evaporation equipment, and make N eutectic electrode 2, P eutectic electrode 1 and N eutectic electrode 2 on N-GaN layer 6 Color and metal layer Cr/Pt/Au/Sn, wherein the thickness of the Sn layer is not less than 3 μm; when making the N eutectic electrode 2, after evaporating the metal layer on the through hole etched in step 2, the N eutectic The through hole 8 of the electrode 2 is connected to the N-GaN layer 6;

步骤5:利用减薄、研磨设备将晶圆减薄到100~200um,再利用激光切割机将晶圆上的器件进行分离。 Step 5: Use thinning and grinding equipment to thin the wafer to 100~200um, and then use a laser cutting machine to separate the devices on the wafer.

本发明通过通孔8电极的设计,实现P共晶电极1和N共晶电极2高度相同,有利于提高回流焊时金属层的键合效果,减少共晶封装的内应力;本发明所述的P共晶电极1和N共晶电极2的主要材质为Sn,利用助焊剂固晶,无氧回流焊共晶的方式,在无氧环境中避免Sn氧化问题;可以实现低热阻封装,试验测试封装热阻小于2℃/W,共晶推力大于2000g。 The present invention realizes the same height of the P eutectic electrode 1 and the N eutectic electrode 2 through the design of the through hole 8 electrodes, which is beneficial to improve the bonding effect of the metal layer during reflow soldering and reduce the internal stress of the eutectic package; the present invention The main material of the P eutectic electrode 1 and N eutectic electrode 2 is Sn, and the solder flux is used to solidify the crystal, and the eutectic method of oxygen-free reflow soldering can avoid the problem of Sn oxidation in an oxygen-free environment; it can realize low thermal resistance packaging, test The thermal resistance of the test package is less than 2°C/W, and the eutectic thrust is greater than 2000g.

Claims (2)

1.一种免封装型UVLED芯片,包括衬底(7),在衬底(7)的正面依次设置N-GaN层(6)、发光层(5)、P-GaN层(4)和反射层(3);其特征是:在所述反射层(3)、P-GaN层(4)和发光层(5)中设置通孔(8),通孔(8)由反射层(3)延伸至发光层(5)的底部,通孔(8)与N-GaN层(6)连通;在所述通孔(8)中和反射层(3)的表面设置N共晶电极(2),在反射层(3)表面设置P共晶电极(1)。 1. An encapsulation-free UVLED chip, including a substrate (7), on the front of the substrate (7), an N-GaN layer (6), a light-emitting layer (5), a P-GaN layer (4) and a reflective Layer (3); it is characterized in that: a through hole (8) is set in the reflective layer (3), P-GaN layer (4) and light emitting layer (5), and the through hole (8) is formed by the reflective layer (3) Extending to the bottom of the light emitting layer (5), the through hole (8) communicates with the N-GaN layer (6); an N eutectic electrode (2) is arranged in the through hole (8) and on the surface of the reflective layer (3) , setting a P eutectic electrode (1) on the surface of the reflective layer (3). 2.如权利要求1所述的免封装型UVLED芯片,其特征是:所述N共晶电极(2)与P共晶电极(1)的上表面平齐。 2. The encapsulation-free UVLED chip according to claim 1, characterized in that: the upper surface of the N eutectic electrode (2) is flush with the P eutectic electrode (1).
CN201410053805.2A 2014-02-18 2014-02-18 Encapsulation-free type UVLED (Ultraviolet Light-Emitting Diode) chip Pending CN103811624A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112366265A (en) * 2020-11-06 2021-02-12 河源市天和第三代半导体产业技术研究院 LED purple light whole surface Al reflection light-emitting device

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Publication number Priority date Publication date Assignee Title
US20070228386A1 (en) * 2006-03-30 2007-10-04 Jin-Shown Shie Wire-bonding free packaging structure of light emitted diode
CN101933166A (en) * 2007-11-14 2010-12-29 克利公司 Wafer level light emitting diode without wire bonding
CN102738344A (en) * 2011-04-15 2012-10-17 晶元光电股份有限公司 light emitting device
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112366265A (en) * 2020-11-06 2021-02-12 河源市天和第三代半导体产业技术研究院 LED purple light whole surface Al reflection light-emitting device

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Application publication date: 20140521