CN114171234A - Ground radiation test parameter evaluation device and method, and radiation resistance reinforcement device - Google Patents
Ground radiation test parameter evaluation device and method, and radiation resistance reinforcement device Download PDFInfo
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- CN114171234A CN114171234A CN202111477654.XA CN202111477654A CN114171234A CN 114171234 A CN114171234 A CN 114171234A CN 202111477654 A CN202111477654 A CN 202111477654A CN 114171234 A CN114171234 A CN 114171234A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
- G01R31/008—Testing of electric installations on transport means on air- or spacecraft, railway rolling stock or sea-going vessels
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
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Abstract
The invention relates to a device and a method for evaluating ground irradiation test parameters and an anti-irradiation reinforcing device, and belongs to the technical field of electronics. This experimental parameter evaluation device of ground irradiation includes: at least one current limiting device and a varistor device; any current limiting device and any rheostat device in the at least one current limiting device are used for being connected with the device to be reinforced, and the power of the device to be reinforced is reduced after the device to be reinforced is irradiated and latch-up occurs. The invention reduces the development cost while expanding the development range of the spacecraft, and the anti-irradiation reinforcing device determined by the ground irradiation test parameter evaluation device reduces the occupied space in the spacecraft and is easy to integrate in the development of electronic equipment of the spacecraft.
Description
Technical Field
The invention relates to the technical field of electronics, in particular to a device and a method for evaluating ground irradiation test parameters and an anti-irradiation reinforcing device.
Background
With the development of electronic technology and aerospace technology, more and more electronic devices are being used by spacecraft. Because the aerospace environment has radiation (e.g., radiation particle rays) that affects the performance of the electronic devices in the spacecraft, radiation protection measures need to be taken for the electronic devices to ensure the normal operation of the spacecraft.
At present, an electronic device in a spacecraft usually adopts an anti-radiation electronic device, and the anti-radiation electronic device has anti-radiation characteristic and cannot be damaged when being irradiated.
But the radiation-resistant electronics are of a lesser variety, resulting in a lesser variety of electronics that can be applied to a spacecraft. And the cost of the anti-radiation electronic device is high, which influences the development of the aerospace technology, especially the commercial aerospace technology with low cost.
Disclosure of Invention
The embodiment of the invention provides a ground irradiation test parameter evaluation device and method and an anti-irradiation reinforcing device, which can expand the development range of a spacecraft and simultaneously reduce the development cost, and the anti-irradiation reinforcing device determined by the ground irradiation test parameter evaluation device can reduce the occupied space inside the spacecraft and is easy to integrate in the development of electronic equipment of the spacecraft. The technical scheme is as follows:
according to a first aspect of embodiments of the present invention, there is provided a ground irradiation test parameter evaluation apparatus, the apparatus including:
at least one current limiting device and a varistor device;
any current limiting device in the at least one current limiting device and the rheostatic device are used for being connected with a device to be reinforced, and the power of the device to be reinforced is reduced after the device to be reinforced is irradiated and latch-up occurs.
Optionally, the number of the current limiting devices is multiple, and the multiple current limiting devices form a current limiting device array, the apparatus further includes: a multi-way switch;
the multi-way switch is used for connecting any current limiting device in the current limiting device array with the device to be reinforced.
Optionally, the current limiting device comprises a positive temperature coefficient PTC fuse.
Optionally, any one of the current limiting device and the varistor device is used for being connected with a device to be reinforced, and reducing the power of the device to be reinforced by reducing the voltage and/or the current of the device to be reinforced after the latch-up effect occurs when the device to be reinforced is irradiated.
Optionally, the apparatus further comprises:
and the power supply unit is connected with the at least one current limiting device and the variable resistance device and is used for providing voltage.
According to a second aspect of the embodiments of the present invention, there is provided a ground irradiation test parameter evaluation method applied to a ground irradiation test parameter evaluation device, where the ground irradiation test parameter evaluation device includes at least one current limiting device and a varistor device; any current limiting device in the at least one current limiting device and the rheostatic device are used for being connected with a device to be reinforced, and the power of the device to be reinforced is reduced after the device to be reinforced is irradiated and latch-up effect occurs; the method comprises the following steps:
when any current limiting device and the rheostat device are connected with the irradiated device to be reinforced and the power of the device to be reinforced is in a power range, determining the model of any current limiting device as a target model and determining the current resistance value of the rheostat as a target resistance value;
the current limiting device of the target type and the resistor device of the target resistance value are used for being connected with the device to be reinforced, and the power of the device to be reinforced is in the power range after the latch-up effect occurs when the device to be reinforced is irradiated.
Optionally, the number of the current limiting devices is multiple, and the multiple current limiting devices form a current limiting device array, the apparatus further includes: a multiway switch, the method further comprising:
and switching the current limiting device connected with the device to be reinforced through the multi-way switch.
According to a third aspect of embodiments of the present invention, there is provided a radiation-resistant reinforcing apparatus, the apparatus including:
a current limiting device and a resistive device;
the current limiting device and the resistor device are used for being connected with a device to be reinforced, and the power of the device to be reinforced is in a power range after the device to be reinforced is irradiated and has latch effect.
In the embodiment of the invention, the ground irradiation test parameter evaluation device comprises at least one current limiting device and a rheostatic device, wherein any one of the current limiting device and the rheostatic device in the at least one current limiting device is used for being connected with a device to be reinforced, and the power of the device to be reinforced is reduced after the latch-up effect occurs when the device to be reinforced is irradiated. The ground irradiation test parameter evaluation device can determine the type (target type) of the current limiting device connected with the device to be reinforced and the current resistance value (target resistance value) of the rheostat when the working current is stable after the device to be reinforced is irradiated and latch effect occurs, and further obtain the current limiting device of the target type and the resistor device of the target resistance value. After the current limiting device of the target type and the resistor device of the target resistance value are connected with the device to be reinforced, the working current of the device to be reinforced is still stable after latch-up effect appears after the device to be reinforced is irradiated. Therefore, the target model and the target resistance value determined by the ground irradiation test parameter evaluation device can realize the irradiation resistance of the device to be reinforced, so that the device to be reinforced has the irradiation resistance similar to that of an irradiation-resistant electronic device when the device to be reinforced is used in the spacecraft, and the device to be reinforced can be a commercial electronic device which has more types and lower cost compared with the irradiation-resistant electronic device, thereby expanding the development range of the spacecraft and reducing the development cost.
In addition, the parameters for realizing the radiation resistance of the device to be reinforced, which are determined by the ground radiation test parameter evaluation device, comprise the target model and the target resistance value of the current limiting device, so that the radiation resistance of the device to be reinforced can be realized through the current limiting device of the target model and the resistor of the target resistance value. The target type current limiting device and the target resistance value resistor device are small in size and simple in manufacturing process, occupied space inside the spacecraft can be reduced, and the current limiting device and the target resistance value resistor device are easy to integrate in development of electronic equipment of the spacecraft.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention, as claimed.
Drawings
In order to illustrate the embodiments of the present invention more clearly, the drawings that are needed in the description of the embodiments will be briefly described below, it being apparent that the drawings in the following description are only some embodiments of the invention, and that other drawings may be derived from those drawings by a person skilled in the art without inventive effort.
Fig. 1 is a schematic application diagram of a ground irradiation test parameter evaluation device according to an embodiment of the present invention;
fig. 2 is a schematic application diagram of another ground irradiation test parameter evaluation device according to an embodiment of the present invention.
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the present invention will be described in further detail with reference to the accompanying drawings, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Radiation harmful to spacecraft that is present in aerospace environments typically includes both natural particle radiation and artificial particle radiation. Sources of natural particle irradiation include: the sources of artificial particle irradiation include the earth radiation zone, the galaxy cosmic ray, the solar cosmic ray, and the like: high altitude nuclear explosion, spacecraft nuclear energy systems, and the like. Natural particle irradiation and artificial particle irradiation include both continuous irradiation and burst irradiation. In order to avoid the influence of radiation on the performance of the electronic devices in the spacecraft, radiation protection measures need to be taken for the electronic devices in the spacecraft.
In the related technology, an anti-irradiation electronic device is adopted in the aerospace device, and the anti-irradiation electronic device has anti-irradiation characteristic and performance is not influenced by irradiation. However, the types of the radiation-resistant electronic devices are relatively few, which results in fewer types of electronic devices that can be applied to the spacecraft, and thus results in a narrower range of options for the radiation-resistant electronic devices. And the cost of the anti-radiation electronic device is higher, so that the development cost of the spacecraft is higher, and the development of the aerospace technology, particularly the low-cost commercial aerospace technology, is influenced. Furthermore, the acquisition of radiation-resistant electronics is also difficult. Therefore, the development of the aerospace technology is influenced, and therefore, an irradiation protection measure is urgently needed at present to reduce the irradiation-resistant cost while realizing the irradiation protection of the electronic device, and the irradiation protection measure can be applied to the types of the electronic devices of the spacecraft, so that the development of the aerospace technology, particularly the commercial aerospace technology, is promoted.
The embodiment of the invention provides a ground irradiation test parameter evaluation device which is used for evaluating parameters of an irradiation-resistant reinforcing device so as to determine the irradiation-resistant reinforcing device based on the parameters and realize irradiation resistance reinforcement of a device to be reinforced. The device to be reinforced may include an electronic device (e.g., a commercial electronic device) applied in the non-aerospace field, that is, the device to be reinforced does not have an anti-irradiation property, and latch-up (e.g., single event latch-up) occurs when the device is irradiated, and the operating current is increased sharply, so that the power of the device to be reinforced may exceed the allowable set power range (e.g., may increase to exceed the allowable set power threshold), and thus the performance may be degraded or may fail.
The irradiation-resistant reinforcement of the device to be reinforced refers to the irradiation-resistant protection of the device to be reinforced, and the power of the device to be reinforced is reduced after latch-up working current of the device to be reinforced is suddenly increased (namely, the performance is poor or the device is invalid) under irradiation, so that the irradiation-resistant capability of the spacecraft adopting the device to be reinforced is improved, and the normal operation of the spacecraft is ensured.
In the embodiment of the invention, the ground irradiation test parameter evaluation device comprises: at least one current limiting device and a varistor device. Any current limiting device and any rheostatic device in the at least one current limiting device are used for being connected with the device to be reinforced, and the power of the device to be reinforced is reduced after the device to be reinforced is irradiated and latch-up occurs. For example, any one of the current limiting device and the varistor device may be used to connect to the device to be reinforced and reduce the power of the device to be reinforced by reducing the voltage and/or current of the device to be reinforced after latch-up of the device to be reinforced upon irradiation.
Alternatively, the current limiting device may comprise a Positive Temperature Coefficient (PTC) fuse, which may be, for example, a PTC self-healing fuse. The varistor device may comprise at least one of: slide varistors, resistor boxes, piezoresistors, and the like.
The ground irradiation test parameter evaluation device may further include: and the power supply unit is connected with the at least one current limiting device and the variable resistance device and is used for supplying voltage. When any current limiting device in the variable resistance device and the at least one current limiting device is connected with the device to be reinforced, the power supply unit provides voltage for the variable resistance device, the any current limiting device and the device to be reinforced. The power supply unit may be determined based on the voltage requirements of the device to be ruggedized, and optionally, the power supply unit may comprise a low voltage power supply unit. For example, the power supply unit may provide 5 volts (V), 3.3V, or 1.8V, etc.
Referring to fig. 1, fig. 1 is a schematic application diagram of a ground irradiation test parameter evaluation apparatus according to an embodiment of the present invention, where fig. 1 shows a ground irradiation test parameter evaluation apparatus 101 and a device 102 to be consolidated connected to the ground irradiation test parameter evaluation apparatus, and the device 102 to be consolidated is irradiated (for example, a heavy ion irradiation test). The ground irradiation test parameter evaluation device 101 comprises at least one current limiting device 1011, a variable resistance device 1012 and a power supply unit 1013. At least one current limiting device 1011, a varistor device 1012 and a power supply unit 1013 are connected to each other. It should be noted that fig. 1 is only an exemplary illustration, and in practice, only one current limiting device of the at least one current limiting device 1011 is connected to the varistor device 1012 and the power supply unit 1013.
Alternatively, the number of the current limiting devices may be plural, and the model of any two current limiting devices may be different. The plurality of current limiting devices may form an array of current limiting devices, and the apparatus may further comprise: and a Multiplexer (MUX) for connecting any one of the current limiting devices in the array of current limiting devices with the device to be hardened. Illustratively, the multiway switch can comprise at least one of: rotary multi-way switches, toggle multi-way switches, lever multi-way switches, etc.
For example, referring to fig. 2, fig. 2 is a schematic application diagram of another ground irradiation test parameter evaluation apparatus provided in an embodiment of the present invention, fig. 2 shows a ground irradiation test parameter evaluation apparatus 101 and a device to be consolidated 102 connected to the ground irradiation test parameter evaluation apparatus 101, and fig. 2 illustrates an example of a current limiter device array in which at least one current limiter device 1011 includes a plurality of current limiter devices (fig. 2 shows 8 current limiter devices a1 to a 8). On the basis of fig. 1, the ground irradiation test parameter evaluation device 101 in fig. 2 further includes a multi-way switch 1014. The multi-way switch 1014 may be connected to any one of the current limiting devices a1 to a8, and fig. 2 exemplifies that the multi-way switch 1014 is connected to the current limiting device a8, that is, in fig. 2, the power supply unit 1013, the current limiting device a8, the varistor device 1012, and the device to be reinforced 102 are connected.
The following describes the operation of the ground irradiation test parameter evaluation device. The ground irradiation test parameter evaluation device is connected with the device to be reinforced, and an operator irradiates the device to be reinforced (such as heavy ion irradiation). And then continuously changing the reinforcement parameters of the ground irradiation test parameter evaluation device, and checking whether the device to be reinforced has the single event latch-up effect of the sudden increase of the working current (namely whether the performance of the device to be reinforced is stable) by an operator while changing the reinforcement parameters each time. And stopping changing the reinforcing parameters when the working current is stable (namely the performance is stable) after the single event latch-up effect occurs on the device to be reinforced. And finally, determining the reinforcing parameters when the working current of the device to be reinforced is stable (namely, the performance is stable) as the target reinforcing parameters. The foregoing process is further illustrated with reference to fig. 2. The operator can change the current limiting device connected to the device to be ruggedized 102 through the multi-way switch 1014.
The reinforcement parameters may include the type of the current limiting device connected to the device to be reinforced and the resistance of the varistor device, and accordingly, the target reinforcement parameters may include a target type and a target resistance. The type of the current limiting device connected to the device to be stiffened and/or the resistance of the varistor device can be changed each time the stiffening parameters are changed.
Alternatively, whether the operating current of the device to be reinforced is stable or not may be determined by the power of the device to be reinforced, or whether the operating current of the device to be reinforced is stable or not may be determined directly by a current detection device (e.g., an ammeter). And when any current limiting device and rheostat device in the at least one current limiting device are connected with the irradiated device to be reinforced, and the power of the device to be reinforced is in the allowable set power range (for example, smaller than the allowable set power threshold) or the working current is in the allowable set working current range (for example, smaller than the allowable set working current threshold), determining the model of the current limiting device as the target model and determining the current resistance value of the rheostat as the target resistance value.
After the target model and the target resistance value are determined through the using process, a current limiting device (also called a target current limiting device) of the target model and a resistance device of the target resistance value can be further obtained. The target current limiting device and the resistor device with the target resistance value are used for being connected with the device to be reinforced, and the power of the device to be reinforced is in the allowed set power range after the latch-up effect occurs when the device to be reinforced is irradiated. Therefore, after the target current limiting device and the resistor device with the target resistance value are connected with the device to be reinforced (namely, the device to be reinforced is subjected to anti-irradiation reinforcement through the target current limiting device and the resistor device with the target resistance value), the working current of the device to be reinforced is still stable when the device to be reinforced is irradiated. Namely, the irradiation resistance of the device to be reinforced can be realized through the target model and the target resistance determined by the ground irradiation test parameter evaluation device.
In summary, the ground irradiation test parameter evaluation apparatus provided in the embodiment of the present invention includes at least one current limiting device and a varistor device, where any one of the current limiting device and the varistor device is used to connect with a device to be reinforced, and reduce the power of the device to be reinforced after latch-up occurs when the device to be reinforced is irradiated. The ground irradiation test parameter evaluation device can determine the type (target type) of the current limiting device connected with the device to be reinforced and the current resistance value (target resistance value) of the rheostat when the working current is stable after the device to be reinforced is irradiated and latch effect occurs, and further obtain the current limiting device of the target type and the resistor device of the target resistance value. After the current limiting device of the target type and the resistor device of the target resistance value are connected with the device to be reinforced, the working current of the device to be reinforced is still stable after latch-up effect appears after the device to be reinforced is irradiated. Therefore, the target model and the target resistance value determined by the ground irradiation test parameter evaluation device can realize the irradiation resistance of the device to be reinforced, so that the device to be reinforced has the irradiation resistance similar to that of an irradiation-resistant electronic device when the device to be reinforced is used in the spacecraft, and the device to be reinforced can be a commercial electronic device which has more types and lower cost compared with the irradiation-resistant electronic device, thereby expanding the development range of the spacecraft and reducing the development cost.
In addition, the parameters for realizing the radiation resistance of the device to be reinforced, which are determined by the ground radiation test parameter evaluation device, comprise the target model and the target resistance value of the current limiting device, so that the radiation resistance of the device to be reinforced can be realized through the current limiting device of the target model and the resistor of the target resistance value. The target type current limiting device and the target resistance value resistor device are small in size and simple in manufacturing process, occupied space inside the spacecraft can be reduced, and the current limiting device and the target resistance value resistor device are easy to integrate in development of electronic equipment of the spacecraft.
It should be noted that the structure of the ground irradiation test parameter evaluation device provided in the embodiment of the present invention may be appropriately adjusted, or may be correspondingly increased or decreased according to the situation, for example, the ground irradiation test parameter evaluation device may not include a power supply unit, and at this time, an external power supply unit may be used to supply power to the ground irradiation test parameter evaluation device and the device to be reinforced. Any structure that can be easily changed by a person skilled in the art within the technical scope of the present disclosure is covered by the protection scope of the present disclosure, and thus, the detailed description thereof is omitted.
The embodiment of the invention provides a ground irradiation test parameter evaluation method, which can be applied to the anti-irradiation reinforcement design of electronic devices in the aerospace field, for example, the ground irradiation test parameter evaluation method can be applied to the ground irradiation test parameter evaluation device, the ground irradiation test parameter evaluation device comprises at least one current limiting device and a rheostatic device, any one of the current limiting device and the rheostatic device is used for being connected with a device to be reinforced, and the power of the device to be reinforced is reduced after the device to be reinforced is irradiated and has latch-up effect. The specific structure of the ground irradiation test parameter evaluation device may refer to the foregoing description, and details are not repeated herein in the embodiments of the present invention.
Optionally, the ground irradiation test parameter evaluation method includes: when any current limiting device and any rheostat device are connected with the irradiated device to be reinforced, and the power of the device to be reinforced is in a power range (namely the power of the device to be reinforced is smaller than a set allowable power threshold), determining any current limiting device as a target current limiting device and determining the current resistance value of the rheostat as a target resistance value. The target current limiting device and the resistor device with the target resistance value are used for being connected with the device to be reinforced, and the power of the device to be reinforced is in a power range (namely the power of the device to be reinforced is smaller than a set allowable power threshold) after the latch effect occurs when the device to be reinforced is irradiated.
Optionally, the number of the current limiting devices is multiple, the multiple current limiting devices form a current limiting device array, and the ground irradiation test parameter evaluation apparatus further includes: a multiway switch, the method can further comprise: and switching the current limiting device connected with the device to be reinforced through a multi-way switch.
The method may specifically refer to the use process of the ground irradiation test parameter evaluation device, and the embodiment of the present invention is not described herein again.
The embodiment of the invention provides an irradiation-resistant reinforcing device, which comprises: a target current limiting device and a resistive device. The target current limiting device and the resistance device are used for being connected with a device to be reinforced, and the power of the device to be reinforced is in a power range (namely the power of the device to be reinforced is smaller than a set allowable power threshold) after the latch-up effect occurs when the device to be reinforced is irradiated. The model of the target current limiting device is the target model determined by the ground irradiation test parameter evaluation device, and the resistance value of the resistor device is the target resistance value determined by the ground irradiation test parameter evaluation device. For example, when the current limiting device comprises a PTC fuse, the target model may comprise 0603 and/or 0402. The resistance device of the target resistance value may include at least one of: 0603. 0402, 0201.
It should be noted that, in the present specification, the embodiments are all described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments may be referred to each other.
Other embodiments of the invention will be apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the invention following, in general, the principles of the invention and including such departures from the present disclosure as come within known or customary practice within the art to which the invention pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the invention being indicated by the following claims.
Finally, it should also be noted that, in this document, relational terms such as first and second, and the like may be used solely to distinguish one entity from another entity without necessarily requiring or implying any actual such relationship or order between such entities. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that an article or terminal apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such article or terminal apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of additional like elements in the article or terminal device comprising the element.
It will be understood that the invention is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the invention is limited only by the appended claims.
Claims (8)
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| US6064555A (en) * | 1997-02-25 | 2000-05-16 | Czajkowski; David | Radiation induced single event latchup protection and recovery of integrated circuits |
| US20050286295A1 (en) * | 2004-06-25 | 2005-12-29 | Kapre Ravindra M | Memory cell array latchup prevention |
| WO2008043225A1 (en) * | 2006-09-30 | 2008-04-17 | Huawei Technologies Co., Ltd. | Protecting circuit and electronic device |
| CN103762558A (en) * | 2014-01-21 | 2014-04-30 | 北京航空航天大学 | Recoverable power interface circuit resistant to single event latchup |
| US20150370274A1 (en) * | 2014-06-20 | 2015-12-24 | Hamilton Sundstrand Corporation | Power delivery system with mitigation for radiation induced single event latch-up in microelectronic devices |
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