CN114325023B - A waveform data detection method, device and storage medium - Google Patents
A waveform data detection method, device and storage medium Download PDFInfo
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- CN114325023B CN114325023B CN202111587861.0A CN202111587861A CN114325023B CN 114325023 B CN114325023 B CN 114325023B CN 202111587861 A CN202111587861 A CN 202111587861A CN 114325023 B CN114325023 B CN 114325023B
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Abstract
The application discloses a waveform data detection method, a waveform data detection device and a storage medium. The method comprises the steps of utilizing a third-party test platform to automatically grab waveform data, carrying out modeling processing on the waveform data to obtain processed waveform data, judging whether the grabbed waveform data is expected waveform data or not according to the processed waveform data, if so, determining the establishment time and the holding time according to the processed waveform data, and taking the establishment time and the holding time as test results to carry out screen capturing. Therefore, the method can replace manual judgment and manual screen capturing operation, greatly reduces the dependence on personal experience, reduces the probability that the test result is not easy to reproduce, and greatly reduces the test time. In addition, since the automated method can collect and analyze waveform data in real time, almost all waveform data meeting the conditions can be captured, and thus, more comprehensive, stable, real and accurate test results can be provided.
Description
Technical Field
The present application relates to the field of signal processing technologies, and in particular, to a method and apparatus for detecting waveform data, and a storage medium.
Background
At present, when an oscilloscope is used for measuring SPI signals of a PC main board, an engineer commonly uses a method that the waveform data of an oscilloscope screen is visually detected, the waveform data of a pen is manually grasped immediately after suspicious waveform data are found, then whether the waveform is the waveform with the expected frequency is observed and calculated through the amplifying waveform of a zoom (zoom) function of the oscilloscope, and if the waveform is not the waveform with the expected frequency, the operation is repeated until the waveform with the expected frequency is grasped. In addition, because most SPI signals are signals in the starting process, if signals with expected frequency are not captured through multiple manual operations, the PC main board to be detected needs to be restarted, and then capturing is repeated again, so that time and labor are wasted.
In addition, due to design reasons or IC material reasons, the signal may have a back hooking phenomenon, so that the signal quality is reduced, the setting of the cursor is particularly important, the cursor is accurately set, the signal quality is higher, and the waveform data of the product quality can be accurately captured.
Under the condition of manually setting the vernier of the oscilloscope, a certain measurement error exists in the setting of the vernier, the accuracy of the setting of the vernier also often depends on personal experience and operation habits, and an operator cannot reach the same accuracy, and cannot obtain the same test result, so that the test result is difficult to reproduce stably.
Therefore, how to automatically and accurately acquire waveform data of a desired frequency is a technical problem to be solved.
Disclosure of Invention
The inventor creatively provides a waveform data detection method, a waveform data detection device and a storage medium.
According to a first aspect of the embodiment of the application, a waveform data detection method is provided, and the method comprises the steps of modeling first waveform data to obtain second waveform data, detecting whether the second waveform data is expected third waveform data, if so, determining cursors for marking establishment time and holding time according to the second waveform data, adding the cursors into the first waveform data to obtain fourth waveform data, and performing screen capturing on the fourth waveform data.
According to one embodiment of the application, detecting whether the second waveform data is the expected third waveform data comprises detecting whether the second waveform data meets the trigger parameters, and if so, further detecting whether the frequency of the second waveform data is the expected frequency.
According to one embodiment of the application, before detecting whether the second waveform data accords with the trigger parameter, if yes, further detecting whether the frequency of the second waveform data is the expected frequency, the method further comprises setting the trigger mode and the trigger parameter, and setting the expected frequency.
According to the embodiment of the application, the modeling processing of the first waveform data is carried out to obtain the second waveform data, and the modeling processing of the first waveform data is carried out to obtain the second waveform data.
According to one embodiment of the application, the cursor for identifying the setup time and the hold time is determined according to the second waveform data, and the cursor comprises a rising edge and a falling edge adjacent to the rising edge according to the second waveform data, and whether the waveform data between the rising edge and the falling edge are continuous clock signals or not is detected, if yes, the setup time and the hold time of the waveform data are calculated according to the rising edge and the falling edge.
According to one embodiment of the application, determining the rising edge of the signal and the falling edge adjacent to the rising edge according to the second waveform data comprises determining the changing edge of the signal according to the second waveform data and a first order derivative algorithm, and determining the rising edge of the signal and the falling edge adjacent to the rising edge according to the changing edge of the signal and a second order center algorithm.
According to one embodiment of the application, after adding the cursor to the first waveform data to obtain the fourth waveform data, the method further comprises calculating a scaling parameter according to the fourth waveform data, and displaying the fourth waveform data according to the scaling parameter.
According to one embodiment of the application, after the fourth waveform data is subjected to screen capturing, the method further comprises the steps of reading the measurement parameters, generating a test report according to the measurement parameters and the screen capturing, and storing the test report.
According to a second aspect of the embodiment of the application, a waveform data detection device is provided, and the device comprises a waveform reading module, a waveform processing module and a waveform detection module, wherein the waveform reading module is used for reading first waveform data, the waveform processing module is used for carrying out modeling processing on the first waveform data to obtain second waveform data, the waveform detection module is used for detecting whether the second waveform data is expected third waveform data, if so, a cursor used for marking establishment time and holding time is determined according to the second waveform data, the cursor is added into the first waveform data to obtain fourth waveform data, and screen capturing is carried out on the fourth waveform data.
According to a third aspect of embodiments of the present application, there is provided a computer-readable storage medium comprising a set of computer-executable instructions for performing the waveform data detection method of any one of the above when the instructions are executed.
The embodiment of the application provides a waveform data detection method, a waveform data detection device and a storage medium. The method comprises the steps of utilizing a third-party test platform to automatically grab waveform data, carrying out modeling processing on the waveform data to obtain processed waveform data, judging whether the grabbed waveform data is expected waveform data or not according to the processed waveform data, if so, determining the establishment time and the holding time according to the processed waveform data, and taking the establishment time and the holding time as test results to carry out screen capturing. Therefore, the method can replace manual judgment and manual screen capturing operation, greatly reduces the dependence on personal experience, reduces the probability that the test result is not easy to reproduce, and greatly reduces the test time. In addition, since the automated method can collect and analyze waveform data in real time, almost all waveform data meeting the conditions can be captured, and thus, more comprehensive, stable, real and accurate test results can be provided.
It should be understood that the implementation of the present application does not need to achieve all the above advantages, but a specific technical solution may achieve a specific technical effect, and other embodiments of the present application may also achieve the above-mentioned advantages.
Drawings
The above, as well as additional purposes, features, and advantages of exemplary embodiments of the present application will become readily apparent from the following detailed description when read in conjunction with the accompanying drawings. Several embodiments of the present application are illustrated by way of example, and not by way of limitation, in the figures of the accompanying drawings and in which:
in the drawings, the same or corresponding reference numerals indicate the same or corresponding parts.
FIG. 1 is a schematic diagram of an implementation flow of an embodiment of a waveform data detection method according to the present application;
FIG. 2 is a schematic diagram of a waveform data detection method according to another embodiment of the present application;
FIG. 3 is a schematic diagram showing the effects of the embodiment of FIG. 2 before and after the modeling process;
FIG. 4 is a schematic diagram of the display effect of the embodiment shown in FIG. 2 after adding a cursor for identifying the setup time to the waveform data;
FIG. 5 is a schematic diagram of the display effect of the embodiment shown in FIG. 2 after adding a cursor for identifying the hold time to the waveform data;
fig. 6 is a schematic diagram of a waveform data detecting apparatus according to an embodiment of the application.
Detailed Description
In order to make the objects, features and advantages of the present application more comprehensible, the technical solutions according to the embodiments of the present application will be clearly described in the following with reference to the accompanying drawings, and it is obvious that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, the different embodiments or examples described in this specification and the features of the different embodiments or examples may be combined and combined by those skilled in the art without contradiction.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
Fig. 1 shows a main implementation flow of an embodiment of the waveform data detection method of the present application. Referring to fig. 1, the method includes an operation 110 of reading first waveform data, an operation 120 of modeling the first waveform data to obtain second waveform data, and an operation 130 of determining cursors for identifying setup time and hold time according to the second waveform data and adding the cursors to the first waveform data to obtain fourth waveform data, and performing screen capturing on the fourth waveform data.
Where waveform data refers to waveform data indicative of the voltage or current of a signal under test, typically acquired by operating an electronic device to perform a particular operation after connecting an oscilloscope probe to a corresponding test point of the device under test (Device Under Test, DUT).
In operation 110, the first waveform data is waveform data of a measured signal acquired in real time.
In the actual testing process, the tested signal collected in real time cannot show ideal rectangular wave for various reasons, for example, the signal frequency is relatively high, the tested signal is interfered or the tested signal is indirectly measured. This makes decisions and calculations based on the waveform data acquired in real time subject to some errors and many uncertainties.
To this end, the embodiment of the present application performs modeling processing on the first waveform data in operation 120 to obtain the second waveform data. The modeling process refers to fitting the sampled data through modeling to eliminate or reduce interference of various abnormal factors, so as to obtain a smoother ideal waveform, such as a rectangular wave.
The waveform data obtained through modeling processing, namely the second waveform data is more regular than the first waveform data acquired in real time, so that some unstable data are removed or corrected, more essential characteristics can be reflected, subsequent judging and calculating operations can be greatly simplified, and the judging and calculating results are more accurate.
In operation 130, the third waveform data is the target waveform data that needs to be recorded, i.e., the waveform data that the test is to expect.
When the second waveform obtained after the modeling processing is detected, whether the second waveform data meets the preset condition is mainly judged, if yes, the second waveform data is expected waveform data, and if not, the second waveform data is not expected waveform data.
It should be noted that the second waveform data is only one intermediate data, so as to facilitate analysis and calculation of the actually collected waveform data, but the finally displayed waveform data is still the actually collected first waveform data, and the modeled waveform data is not displayed.
If the second waveform data is the expected waveform data, the establishing time and the maintaining time of the waveform need to be further marked by a cursor, the cursor is added to the first waveform data acquired in real time to obtain fourth waveform data, and then the fourth waveform data is recorded as a test result. Thus, the basis for clearer and easier judgment of the test result can be obtained
The setup time (setup time) refers to the time when the measured signal data is stable and unchanged before the rising edge of the clock signal of the flip-flop arrives. The hold time (hold time) is the time after the rising edge of the clock signal of the flip-flop arrives, and the measured signal data is stable
The set-up time and the hold time can be used for judging the quality and stability of the signal to be tested, and can also be used for analyzing waveform data and positioning problems, and often can be used as a judging basis of a test result.
And a cursor (cursor) of the oscilloscope can read out a horizontal coordinate difference value or a vertical coordinate difference value between two points of the signal diagram, wherein the horizontal coordinate difference value represents a time difference. Therefore, after the corresponding cursors are arranged at the positions where the rising edge of the clock signal arrives and the positions where the data signal changes in the oscilloscope, the establishment time and the holding time of the waveform data can be clearly identified.
In most of the existing schemes, cursors for identifying the setup time and the hold time are manually set through manual observation, often depend on personal experience, different people may obtain different test results, and great deviation exists.
In the embodiment of the application, through the algorithm uniformly defined in the program, the cursor used for marking the establishment time and the holding time can be automatically calculated and marked, so that not only can the manual intervention be greatly reduced, but also the dependence of the test on personal experience can be greatly reduced, and the test result is more objective and easier to reproduce.
In addition, since the second waveform data obtained through modeling processing is more regular than the first waveform data acquired in real time, and some abnormal data are removed or corrected, the cursor for identifying the setup time and the hold time determined according to the second waveform data is more accurate.
Therefore, the waveform data detection method can acquire waveform data in real time through operation 110, then perform modeling processing on the first waveform data through operation 120 to obtain processed waveform data, then judge whether the acquired waveform data is expected waveform data according to the processed waveform data through operation 130, if yes, determine cursors for marking the setup time and the hold time according to the processed waveform data, add cursors into the first waveform data to obtain fourth waveform data, and perform screen capturing to serve as a basis for further judging the test result.
Therefore, manual observation and manual setting can be replaced, the test time is greatly shortened, and the test efficiency is improved. In addition, since the method of automatically analyzing waveforms is used, waveforms can be collected and analyzed in real time, thereby providing more comprehensive, stable and accurate test results.
It should be noted that the embodiment shown in fig. 1 is only one basic embodiment of the waveform data detection method of the present application, and the implementer may further refine and expand the waveform data detection method based thereon.
According to one embodiment of the application, detecting whether the second waveform data is the expected third waveform data comprises detecting whether the second waveform data meets the trigger parameters, and if so, further detecting whether the frequency of the second waveform data is the expected frequency.
The trigger parameters of the oscilloscope mainly refer to parameters used for defining trigger conditions, such as trigger voltage values, pulse width time for triggering high level, pulse width time for triggering low level, and the like.
Waveform data meeting different test requirements can be obtained through different trigger conditions, so that the waveform data required by different test cases can be obtained by detecting whether the second waveform data meets the trigger conditions.
Waveform data satisfying the trigger condition may also be generated at abnormal frequencies, which are often not representative, and not only cannot obtain accurate measurement values, but also interfere with the analysis of the problem.
Therefore, after capturing the specific waveform data by the trigger condition, it is further possible to judge whether or not the waveform data is expected to be valid waveform data generated at the normal frequency, based on the frequency of the waveform data.
Through the implementation mode, only effective waveform data meeting specific triggering conditions and specific frequencies can be captured according to the test case requirements, so that noise is reduced, and system resources and calculation power are greatly saved.
According to one embodiment of the application, before detecting whether the second waveform data accords with the trigger parameter, if yes, further detecting whether the frequency of the second waveform data is the expected frequency, the method further comprises setting the trigger mode and the trigger parameter, and setting the expected frequency.
The trigger mode is mainly divided into a NORMAL mode (NORMAL) and an automatic mode (AUTO). The normal mode refers to a mode in which no graphic is displayed on the screen when a predetermined trigger condition is not present. The automatic mode refers to a mode in which the waveform just acquired is displayed on the display screen when a predetermined trigger condition is not met. The normal mode further includes a single trigger, and the single trigger in the normal mode is displayed only once after waiting for a predetermined trigger condition for the first time. Thereafter, even if a waveform satisfying the predetermined trigger condition appears again, it is not displayed any more.
The trigger mode, the trigger parameters and the expected frequency can be flexibly set according to the test requirements, and are adjusted according to the test results, so that the test efficiency is further improved, and different test requirements are met.
According to the embodiment of the application, the modeling processing of the first waveform data is carried out to obtain the second waveform data, and the modeling processing of the first waveform data is carried out to obtain the second waveform data.
The waveform data is generally periodic and repetitive, wherein the amplitude of the waveform data, particularly the model median determined from the amplitude distribution, is most representative of the waveform characteristics and regularity. And the first waveform data is subjected to modeling processing according to the model median value, so that the calculation and the highlighting of the characteristics can be further simplified on the premise of not losing accuracy, and the second waveform data which can better reflect the waveform characteristics and the rules can be obtained.
According to one embodiment of the application, the cursor for identifying the setup time and the hold time is determined according to the second waveform data, and the cursor comprises a rising edge and a falling edge adjacent to the rising edge according to the second waveform data, and whether the waveform data between the rising edge and the falling edge are continuous clock signals or not is detected, if yes, the setup time and the hold time of the waveform data are calculated according to the rising edge and the falling edge.
According to the definition of the set-up time and the hold time, the time for which the measured signal data is stable is an important reference value. The time for which the measured signal data is stable is often the data after the rising edge or before the falling edge.
Thus, the key to determining the setup time and hold time is often in determining the calculation of the rising and falling edges.
However, in some abnormal cases, the waveform data between the rising edge and the falling edge is not a continuous clock signal, and the rising edge and the falling edge adjacent to the rising edge obtained at this time have no substantial meaning and measurement value, and cannot be used to calculate the setup time and the hold time of the waveform data.
The detection of whether the waveform data between the rising edges and the falling edges is a continuous clock signal can be determined by determining whether the time widths between the rising edges of the clock signal are uniform, if both are relatively average, indicating that the clock signal is continuous, and if the time width between one rising edge is longer than the time width between the other rising edges, indicating that the clock signal is not continuous.
Whether the waveform data between the rising edge and the falling edge are continuous clock signals or not is detected, and only the waveform data with continuous clock signals are processed, so that the test efficiency can be greatly improved, and more accurate establishment time and retention time can be obtained.
According to one embodiment of the application, determining the rising edge of the signal and the falling edge adjacent to the rising edge according to the second waveform data comprises determining the changing edge of the signal according to the second waveform data and a first order derivative algorithm, and determining the rising edge of the signal and the falling edge adjacent to the rising edge according to the changing edge of the signal and a second order center algorithm.
According to one embodiment of the application, after adding the cursor to the first waveform data to obtain the fourth waveform data, the method further comprises calculating a zoom (zoom) parameter according to the fourth waveform data, and displaying the fourth waveform data according to the zoom parameter.
The zoom parameter of the oscilloscope may be used to zoom in and out on the waveform data to display the full waveform and to make the waveform display moderate in size. Therefore, the zoom (zoom) parameter is calculated according to the fourth waveform data, and the oscilloscope is set according to the calculated oscilloscope display parameter, so that the first waveform data can be displayed in a proper size at the middle position of the oscilloscope screen, and the test result can be further judged.
According to one embodiment of the application, after the fourth waveform data is subjected to screen capturing, the method further comprises the steps of reading the measurement parameters, generating a test report according to the measurement parameters and the screen capturing, and storing the test report.
In this embodiment, not only the screen capturing of the fourth waveform data is inserted into the test report, but also various measurement parameters during the screen capturing are read, and these measurement parameters are inserted into the test report, so as to facilitate analysis and positioning of the cause that may cause the problem.
Fig. 2 shows another embodiment of the waveform data detection method of the present application. The embodiment is applied to a scene of measuring SPI signals of a PC main board by using an oscilloscope, specifically, after waveform data is acquired by the oscilloscope, the waveform is amplified by a zoom (zoom) function of the oscilloscope to observe and calculate whether the waveform data is expected waveform data, if so, the oscilloscope is subjected to screen capturing, and the waveform data is recorded.
In this embodiment, the above operations are performed by an automated test program implemented by a LabVIEW test platform, and as shown in fig. 2, the implementation process mainly includes performing after the LabVIEW program is started:
step 2010, placing a probe;
the probe used for testing is placed on the pin of the IC chip of the device under test SPI.
Step 2020, setting an oscilloscope through a VISA instruction;
the setting of the oscilloscope mainly refers to the initialization setting of the oscilloscope according to the test requirement, so as to ensure that the test result is not affected by the previous test each time.
Step 2030, setting a trigger parameter;
In the embodiment, when the full coverage test is operated, the trigger mode is set to be a common mode to capture all waveform data meeting the test requirements, and when the minimum test set is operated, the trigger mode is set to be single trigger in the common mode to further shorten the test time and obtain the test result as soon as possible.
The trigger voltage, the pulse width time for triggering the high level and the pulse width time for triggering the low level are read from the definition of the corresponding test case according to the test requirement.
Step 2040, the device under test is powered on;
step 2050, reading the oscilloscope through the VISA, judging whether waveform data meeting the triggering condition exists, if yes, continuing step 2060, and if not, setting the triggering parameter again until the trigger is overtime;
Step 2060, calculating whether the frequency of the waveform data is the desired frequency? continuing step 2070, if not, setting the trigger parameter again until the trigger is overtime;
And reading the triggered waveform data, calculating whether the waveform data of the clock signal is the set frequency according to a waveform data modeling algorithm, and if not, resetting the trigger and waiting for the next data.
As shown in fig. 3, the waveform data modeling algorithm used in the present embodiment includes:
1) Calculating amplitude distribution of sampled data, dividing the amplitude into 5 intervals (not shown), and counting waveform amplitude distribution from minimum amplitude to maximum amplitude according to 5 equal divisions Taking the element h (0) as V low and h (4) as V high;
2) The model median of the waveform is set to V m＝(Vlow+Vhigh)/2, and points in the waveform data L0 (waveform shown by a solid line) acquired in real time are subjected to modeling processing to obtain V (i) by using the following formula, and finally the waveform data L0' (waveform shown by a line):
step 2070, calculating cursor and scaling parameters conforming to the features;
As shown in fig. 4 and 5, in the present embodiment, waveform data of two signals, i.e., a measured signal L1 and a clock signal L2, are simultaneously accessed. The signal to be tested may be a data (data) signal or a chip select (cs) signal.
Specifically, the feature-compliant cursor and zoom parameters are calculated by the following algorithm:
1) Finding a suitable piece of waveform data, for example, a piece of waveform data shown in fig. 4 and 5;
2) Calculating cursors a and b capable of identifying the establishing time, cursors c and d capable of identifying the maintaining time and corresponding scaling parameters according to the waveform data;
wherein, when calculating a cursor that can identify the setup time and a cursor that can identify the hold time, the following algorithm is sampled:
Performing a first-order derivative algorithm on the modeled waveform data according to the following formula, and finding a change edge of the signal:
Using Y to represent the sampled output sequence dx/dt, an algorithm with a second order center is used to determine the rising edge of the measured signal and the falling edge adjacent to the rising edge.
Specifically, the following calculation formula is used in the present embodiment:
Where i=0, 1,2,..n-1, n is the x (t) sampling depth, x -1 is the initial condition, i.e. the first sampling element, x n is the final condition.
Then sequentially finding the rising edge and the falling edge adjacent to the rising edge of the detected signal according to the index i.
Then, a cursor for identifying the setup time can be set according to the calculated point on the rising edge of the measured signal (a shown in fig. 4) and the point on the rising edge of the clock signal (b shown in fig. 4) which follows the point, and the time width between the point a and the point b is the setup time of the measured signal.
Similarly, a cursor for identifying the setup time may be set according to the point on the falling edge of the measured signal (d as shown in fig. 5) and the point on the rising edge of the clock signal preceding it (c as shown in fig. 5), and the time width between the point c and the point d is the hold time of the measured signal.
Step 2080, VISA writes the cursor and scaling parameters into the oscilloscope;
Through VISA, cursors a and b capable of identifying the establishment time and scaling parameters are written into an oscilloscope, and waveforms shown in FIG. 4 and cursors marked by cross numbers (X) are obtained;
Writing cursors c and d capable of identifying the holding time and the scaling parameters to the oscilloscope through the VISA to obtain waveforms shown in fig. 5 and cursors marked by cross numbers (X);
Note that, L1, L2, a, b, c, d and the cross numbers identified in fig. 4 and 5 are all reference symbols for explaining and explaining waveforms displayed on the oscilloscope, and are not displayed on the oscilloscope, but are not displayed on the oscilloscope.
Step 2090, writing other measurement parameters into the oscilloscope;
the parameters that can be measured by the oscilloscope defined by the test case are mainly referred to herein, such as the frequency, period, rise time, fall time, positive pulse width, negative pulse width, positive duty cycle, negative duty cycle, maximum voltage value, minimum voltage value, voltage peak value, voltage top end value, voltage bottom end value, etc. of the signal under test.
Step 2100, reading parameters and oscilloscope screen shots;
step 2110, generating a test report;
And automatically writing the read measurement parameters and the oscilloscope screen capturing into a predefined test report template to generate a test report.
At step 2120, the test report is written into a database.
Thus, the test result can be called at any time for checking and analysis.
In addition, it should be noted that, due to the automatic analysis of the waveform, when determining the setup time, waveform data may be analyzed segment by segment, and cursor points of all symbol conditions may be captured to obtain a plurality of setup times.
For example, in the waveform data shown in fig. 4, the points of a 'and b' calculated when continuing to scan backwards are also points that can be used to identify the setup time, and then the graph can be moved backwards, and a 'and b' are set as cursors that are used to identify the setup time, so as to obtain another screenshot.
Therefore, more waveform data which can be used as a test basis can be captured, so that the test data is richer and more comprehensive, and the test result is more accurate.
It should be noted that the application shown in fig. 2 is only an exemplary illustration of the waveform data detection method of the present application, and is not a limitation of the embodiment and application scenario of the waveform data detection method of the present application. The implementer may employ any suitable implementation, depending on the particular implementation conditions, for any suitable application scenario.
Further, the embodiment of the application also provides a waveform data detection device. As shown in fig. 6, the apparatus 60 includes a waveform reading module 601 configured to read first waveform data, a waveform processing module 602 configured to perform modeling processing on the first waveform data to obtain second waveform data, and a waveform detecting module 603 configured to detect whether the second waveform data is desired third waveform data, if yes, determine a cursor for identifying an setup time and a hold time according to the second waveform data, and add the cursor to the first waveform data to obtain fourth waveform data, and perform screen capturing on the fourth waveform data.
According to an embodiment of the present application, the waveform detection module 603 is specifically configured to detect whether the second waveform data meets the triggering parameter, and if yes, further detect whether the frequency of the second waveform data is the expected frequency.
According to an embodiment of the present application, the apparatus 60 further includes a trigger setting module for setting a trigger mode and a trigger parameter, and a desired frequency setting module for setting a desired frequency.
According to an embodiment of the application, the waveform processing module 602 includes an amplitude distribution determining sub-module for determining an amplitude distribution according to the first waveform data, a median determining sub-module for determining a model median of the waveform according to the amplitude distribution, and a modeling processing sub-module for modeling the first waveform data according to the model median to obtain the second waveform data.
The waveform detecting module 603 includes a change edge determining submodule for determining a rising edge and a falling edge adjacent to the rising edge according to the second waveform data, and a clock signal detecting submodule for detecting whether the waveform data between the rising edge and the falling edge is a continuous clock signal, if so, calculating the setup time and the hold time of the waveform data according to the rising edge and the falling edge.
According to one embodiment of the application, the change edge determining submodule comprises a change edge calculating unit, a rising edge determining unit and a falling edge determining unit, wherein the change edge calculating unit is used for determining the change edge of a signal according to second waveform data and a first-order derivative algorithm, and the rising edge determining unit is used for determining the rising edge of the signal and the falling edge adjacent to the rising edge according to the change edge of the signal and a second-order center algorithm.
According to an embodiment of the present application, the apparatus 60 further includes a scaling parameter calculating module for calculating a scaling parameter according to the fourth waveform data, and a waveform data displaying module for displaying the fourth waveform data according to the scaling parameter.
According to an embodiment of the present application, the apparatus 60 further includes a measurement parameter reading module for reading measurement parameters, a test report generating module for generating a test report according to the measurement parameters and the screen capturing, and a test report storing module for storing the test report.
According to a third aspect of embodiments of the present application, there is provided a computer storage medium comprising a set of computer executable instructions for performing any one of the above-described information processing methods applied to a recommendation system when the instructions are executed.
It should be noted that the above description of the embodiment of the waveform data detection apparatus and the above description of the embodiment of the computer storage medium are similar to those of the embodiment of the method, and have similar advantageous effects as those of the embodiment of the method, and thus are not repeated. For technical details that have not been disclosed in the description of the embodiments of the waveform data detection apparatus and the description of the embodiments of the computer storage medium, please refer to the description of the foregoing method embodiments of the present application for economy of description, and thus will not be repeated.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
In the several embodiments provided by the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above-described apparatus embodiments are merely illustrative, e.g., the division of elements is merely a logical division of functionality, and may be implemented in other manners, e.g., multiple elements or components may be combined or integrated into another device, or some features may be omitted, or not performed. In addition, the various components shown or discussed may be coupled or directly coupled or communicatively coupled to each other via some interface, whether indirectly coupled or communicatively coupled to devices or units, whether electrically, mechanically, or otherwise.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place or may be distributed on a plurality of network units, and may select some or all units according to actual needs to achieve the purpose of the embodiment.
In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may be separately provided as one unit, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of hardware plus a form of software functional unit.
It will be appreciated by those of ordinary skill in the art that implementing all or part of the steps of the above method embodiments may be implemented by hardware associated with program instructions, where the above program may be stored in a computer readable storage medium, where the program when executed performs the steps comprising the above method embodiments, where the above storage medium includes a removable storage medium, a Read Only Memory (ROM), a magnetic disk or an optical disk, or other various media in which program code may be stored.
Or the above-described integrated units of the application may be stored in a computer-readable storage medium if implemented in the form of software functional modules and provided for sale or use as a stand-alone product. Based on such understanding, the technical solutions of the embodiments of the present application may be embodied in essence or a part contributing to the prior art in the form of a software product stored in a storage medium, including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the methods of the embodiments of the present application. The storage medium includes a removable storage medium, a ROM, a magnetic disk, or an optical disk, etc., and various media capable of storing program codes.
The foregoing is merely illustrative embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily think about variations or substitutions within the technical scope of the present application, and the application should be covered. Therefore, the protection scope of the application is subject to the protection scope of the claims.
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