CN114449258B - A signal verification method for single pixel imaging - Google Patents
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Abstract
The application discloses a signal inspection method for single-pixel imaging, which comprises the following steps: the single-pixel detector designs a sampling matrix according to the size of the detected object and samples the sampled object; dividing the sampling matrix into multiple groups, each group containing C sampling matrices, and dividing the C sampling matrices of each group into r rowsThe columns are arranged, and aiming at C sampling matrixes of each group, the sampling matrixes of each row are integrated to obtain a submatrixIntegrating the sampling matrix of each column to obtain a submatrixAnd by calculating a submatrixAnd submatricesThe respective inspection matrix or projection matrix judges the position of the sampling matrix which specifically generates error signals so as to realize the inspection in the signal acquisition process.
Description
Technical Field
The invention relates to the technical field of imaging, in particular to a signal inspection method for single-pixel imaging.
Background
Single-pixel imaging technology is an emerging imaging technology, which can reconstruct a target image at a lower sampling rate by encoding a light field by using only one single-pixel detector without spatial resolution, and is widely focused in the fields of high-sensitivity imaging, multispectral imaging, terahertz imaging, infrared imaging and the like. However, in the signal acquisition process, sampling timing errors may occur due to circuit delay, counting errors and the like, so that image reconstruction cannot be realized. Therefore, designing a sampling strategy with error detection mechanism has a critical effect on stabilizing system performance.
According to the characteristics of single-pixel sampling signals, the invention designs a set of sampling method of monitoring signals, and judges whether the signals are wrong or not by comparing the difference between the monitoring signals and the sampling signals.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides a signal checking method for single-pixel imaging.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
a signal verification method for single pixel imaging, comprising:
the single-pixel detector designs a sampling matrix according to the size of the detected object and samples the sampled object;
Dividing the sampling matrixes into a plurality of groups, wherein each group comprises C sampling matrixes, the C sampling matrixes of each group are arranged in a mode of r rows and s columns, and the acquisition signal corresponding to each sampling matrix in the corresponding group is y ij, wherein i in the acquisition signal y ij represents the row number of the corresponding sampling matrix, namely the range of i is [1, r ]; j represents the column number of the corresponding sampling matrix, i.e. j ranges from [1, s ];
Accumulating the sampling matrix elements in each row f for the C sampling matrices of each group to obtain a new submatrix A f of each row, wherein the range of f is 1, r; calculating an error signal judgment value T f of the sampling matrix in the corresponding row according to the submatrix A f, and judging whether an error signal exists in the sampling matrix in the corresponding row according to the value of the error signal judgment value T f;
For the C sampling matrixes of each group, accumulating the sampling matrix elements in each column g to obtain a new submatrix A g of each column, wherein the range of g is 1, s; calculating an error signal judgment value T g of the sampling matrix in the corresponding column according to the submatrix A g, and judging whether an error signal exists in the sampling matrix in the corresponding column according to the value of the error signal judgment value T g;
The number of rows of the sampling matrix generating the error signal is determined according to the error signal determination value T f, and the number of columns of the sampling matrix generating the error signal is determined according to the error signal determination value T g, so that the specific position of the error signal is obtained.
In order to optimize the technical scheme, the specific measures adopted further comprise:
Further, the specific content of calculating the error signal determination value T f of the sampling matrix in the corresponding row according to the submatrix a f is:
each element in the submatrix A f is represented by a binary system, the numerical value of the same position in the binary system corresponding to each element is taken out to construct an inspection matrix, and each submatrix A f is provided with k inspection matrices in total; acquiring an acquisition signal t l of a corresponding check matrix by using the check matrix modulation pattern, wherein l in the acquisition signal t l represents any check matrix, namely, the range of l is 0, k-1; and calculates an error signal determination value of the corresponding submatrix A f
Further, according to the value of the error signal determination value T f, it is determined whether the error signal exists in the sampling matrix in the corresponding row, which is as follows:
When T f is less than 1%, determining that an error signal exists in the sub-matrix A f corresponding to T f, and further determining that an error signal exists in the sampling matrix in a row corresponding to the sub-matrix A f; when T f is more than or equal to 1%, determining that the sub-matrix A f corresponding to T f has no error signal, and further determining that the sampling matrix in the row corresponding to the sub-matrix A f has no error signal.
Further, the numerical calculation formula of k in k projection matrices in total of each submatrix a f is:
k＝[log2s]+1
Where [ log 2 s ] represents higher order rounding of the value of log 2 s.
Further, the specific content of calculating the error signal determination value T g of the sampling matrix in a corresponding column according to the submatrix a g is:
Each element in the submatrix A g is represented by a binary system, the numerical value of the same position in the binary system corresponding to each element is taken out to construct a projection matrix, and k' projection matrices are counted in each submatrix A g; acquiring acquisition signals t l ' of corresponding projection matrixes by utilizing the projection matrix modulation pattern, wherein l ' in the acquisition signals t l ' represents any one projection matrix, namely the range of l ' is [0, k ' -1]; and calculates an error signal determination value of the corresponding submatrix A g
Further, according to the value of the error signal determination value T g, it is determined whether the error signal exists in the sampling matrix in the corresponding column, which is as follows:
When T g is less than 1%, determining that an error signal exists in the sub-matrix A g corresponding to T g, and further determining that an error signal exists in the sampling matrix in a column corresponding to the sub-matrix A g; when T g is greater than or equal to 1%, determining that the sub-matrix A g corresponding to T g has no error signal, and further determining that the sampling matrix in a column associated with the sub-matrix A g has no error signal.
Further, the numerical calculation formula of k 'in k' projection matrices in total of each submatrix a g is:
k′＝[log2r]+1
where [ log 2 r ] represents higher order rounding of the value of log 2 r.
The beneficial effects of the invention are as follows:
In the conventional signal acquisition process, sampling time sequence errors may occur due to circuit delay, counting errors and the like, so that image reconstruction cannot be realized. The application arranges the sampling matrixes in a row and column mode, integrates the sampling matrixes to obtain the submatrices A f and A g, and judges the position of the sampling matrix which specifically generates error signals by calculating the inspection matrix or the projection matrix of each of the submatrices A f and A g so as to realize the inspection in the signal acquisition process.
Drawings
Fig. 1 is a schematic diagram showing a relationship between a sampling matrix and a submatrix a f and a submatrix a g according to an embodiment of the present invention.
Fig. 2 is a schematic diagram of a corresponding sub-matrix a f obtained by accumulating each row of sampling matrices and a corresponding sub-matrix a g obtained by accumulating each column of sampling matrices according to the present invention.
FIG. 3 is a schematic representation of the construction of a reconstituted test matrix or projection matrix from submatrix A f or submatrix A g of the present invention.
FIG. 4 is a schematic diagram of a relationship between converting elements in a submatrix A f to binary and splitting to construct multiple inspection matrices in accordance with an embodiment of the present invention.
Detailed Description
The invention will now be described in further detail with reference to the accompanying drawings.
The application provides a signal checking method based on the principle of the prior art (single pixel signal acquisition process).
1. First, a process for acquiring single pixel signals (prior art)
The single-pixel imaging uses a single-pixel detector, samples an object to be imaged through a structural illumination light field with specific spatial distribution, feeds back light intensity information after the structural illumination light field is modulated by the object, is collected by the single-pixel detector, continuously changes a modulation pattern on the modulator and synchronously detects the modulation pattern, and can reconstruct a two-dimensional image of the object through a series of detection values and correlation operation of the modulation pattern.
According to the size of the image, a sampling matrix P i(x,y),Pi∈Rm×n is designed, wherein R represents a matrix space, P i represents a matrix of m rows and n columns, and by using the modulation pattern distribution of the sampling matrix on a modulator, the detection value on a corresponding detector is y i, and the detection process can be written as follows:
yi＝∑x∑yPi(x，y)·T(x，y)
Where T (x, y) is the reflectance (transmittance) distribution of the object, x and y in Σ x∑y denote coordinate points of the image x, y, respectively, and y i is used for computational imaging in single-pixel imaging.
The two-dimensional modulation matrix P (sampling matrix P i (x, y)) is rearranged into a one-dimensional row vector, a plurality of modulation patterns are recombined according to the modulation sequence to obtain a two-dimensional measurement matrix, A is marked as A, A E R M×N, N=m×n represents the resolution of structured light coding, and M is the experimental measurement times. Similarly, the object distribution T (x, y) is converted to a column vector denoted as x, x ε R N. The probing process may be written as:
y＝Ax
The ideal reconstruction process can be written as:
Where y represents a vector whose value is composed of the above-mentioned detection value y i, and T represents a matrix transpose.
In practical use, since the image has redundancy of information, the equation y=ax can be a system of underdetermined equations, and the image can be restored by using the compressed sensing algorithm. Therefore, in practical use, when an error occurs in the acquired signal, the adopted matrix and the acquired signal are removed in equation y=ax, without affecting the image.
It should be noted that, according to the size of the image, a sampling matrix is generated, and the matrix elements are only 0,1. Typically, about 50% of each element is 0,1.
2. Inspection method (innovation point of the application)
Reference is made to fig. 1. The sampling matrix is divided into a plurality of groups (the sampling matrix can be a plurality of sampling matrices, and the sampling times are the sampling times to generate a plurality of sampling matrices, for example, M is the experimental measurement times, namely M times are represented by sampling), and each group is C sampling matrices. The C sampling matrices are arranged in a manner of r x s (4 rows and 4 columns of 16 sampling matrices in the embodiment of fig. 1). The acquisition signal corresponding to each sampling matrix is y ij, wherein i in the acquisition signal y ij represents the number of rows where the corresponding sampling matrix is located, i.e. the range of i is 1, r; j represents the number of columns in which the corresponding sampling matrix is located, i.e., j ranges from [1, s ] (e.g., y 11 for the 1 st row and 1 st column of sampling matrices, y 12 for the 1 st row and 2 nd column of sampling matrices, and y 21, for the 2 nd row and 1 st column of sampling matrices).
Reference is made to fig. 1,2 and 3. The sampling matrices of each row are accumulated to obtain a new submatrix a f (f=1..r), (wherein f in the submatrix a f represents the submatrix a f, specifically, which row of the sampling matrix corresponds to, for example, a f＝1 corresponds to the submatrix of the sampling matrix of the 1 st row, 4 submatrices a f are in total in fig. 1 and 2), each element value in the submatrix a f is represented by a binary system, and a new test matrix series is constructed according to the same bit of each element, k= [ log 2 s ] +1 in total, and the test matrix is a f0、Af1、、、Afk-1 according to the binary bit from low to high. With the inspection matrices, the pattern is modulated, and signals t l (l=0..k-1) are acquired (where l in the acquisition signals t l represents any one of the inspection matrices, e.g., t 0 corresponds to the acquisition signal of inspection matrix a f0, and t 1 corresponds to the acquisition signal of inspection matrix a f1).
Calculation ofAs a basis for the determination, when T f < 1% may consider that there is an error signal in the signals collected by the row of the collection matrix, otherwise, there is no error (where T f is an error signal determination value, and when f=1, that is, the error signal determination value is T 1, which indicates that the determination is made on the collection matrix in row 1, corresponding to the submatrix a f＝1).
Similarly, the sampling matrices of each column are accumulated to obtain a new submatrix a g (g=1..s), (where g in the submatrix a g represents the submatrix a g specifically corresponding to which column of the sampling matrix, for example, a g＝1 corresponds to the submatrix of the sampling matrix of the 1 st column, and there are 4 submatrices a g in fig. 1 and 2), each element value in the submatrix a g is represented by a binary system, and a new projection matrix series is constructed according to the same bit of each element, and k' in total = [ log 2 r ] +1, where the projection matrix is a g0、Ag1、、、Agk′-1 from low to high. With the new projection matrix, the pattern is modulated, and the signals t l ' (l ' =0..k ' -1) are acquired (where l ' in the acquisition signals t l ' represents any one of the projection matrices, e.g., t 0 ' corresponds to the acquisition signals of projection matrix a g0, and t 1 ' corresponds to the acquisition signals of projection matrix a g1).
Calculation ofAs a basis for the determination, when T g < 1% may consider that there is an error signal in the signals collected by the column of the collection matrix, otherwise, there is no error (where T g is an error signal determination value, and when g=1, that is, the error signal determination value is T 1, which indicates that the determination is performed on the collection matrix in column 1, corresponding to the submatrix a g＝1).
By calculating the T f of each row of the submatrix and the T g of each column of the submatrix according to the above scheme, it is possible to know which row and which column of the submatrix is wrong in the signal, and the submatrix corresponds to the sampling matrix of each row or the sampling matrix of each column, so that the location of the error signal of the specific sampling matrix can be known.
The following is a supplementary explanation of the relevant content concepts:
1. For each element value in the submatrix a f or the submatrix a g, a binary representation is used and a new conceptual interpretation of the inspection matrix series or projection matrix series is constructed with the same bits of each element.
Referring to fig. 3 and 4, an example of a sub-matrix a f is illustrated. For matrix a f, its elements are respectively: 84. 61, 127, 214, 87, 62, 17, 194, 152; the element values are represented by binary values, and the values at the same positions of the binary values are taken out, for example, the values at the lowest order (0 th order) are recombined into a check matrix, and 8 check matrices are taken out from the lowest order to the highest order. The same applies to the submatrix a g.
2. From the above point 1, it can be seen that the number of reconstructed check matrices actually depends on the total number of bits after the binary system, and the calculation formula for k (i.e., k= [ log 2 s ] +1) is actually to calculate the total number of bits of the binary system. The same applies to the number of reconstructed projection matrices.
3. In accumulating the sampling matrix of each row or each column, the concept of "accumulation" is concerned
The size of the sampling matrix is the same, and matrix accumulation is to add elements (each element is initially 0 or 1, which is also mentioned in the above description) at the same position of the matrix, so as to obtain a sub-matrix (the values of the elements are different) with the same size.
It should be noted that the terms like "upper", "lower", "left", "right", "front", "rear", and the like are also used for descriptive purposes only and are not intended to limit the scope of the invention in which the invention may be practiced, but rather the relative relationship of the terms may be altered or modified without materially altering the teachings of the invention.
The above is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above examples, and all technical solutions belonging to the concept of the present invention belong to the protection scope of the present invention. It should be noted that modifications and adaptations to the invention without departing from the principles thereof are intended to be within the scope of the invention as set forth in the following claims.
Claims (3)
1. A signal inspection method for single pixel imaging, comprising:
the single-pixel detector designs a sampling matrix according to the size of the detected object and samples the sampled object;
Dividing the sampling matrixes into a plurality of groups, wherein each group comprises C sampling matrixes, the C sampling matrixes of each group are arranged in a mode of r rows and s columns, and the acquisition signal corresponding to each sampling matrix in the corresponding group is y ij, wherein i in the acquisition signal y ij represents the row number of the corresponding sampling matrix, namely the range of i is [1, r ]; j represents the column number of the corresponding sampling matrix, i.e. j ranges from [1, s ];
Accumulating the sampling matrix elements in each row f for the C sampling matrices of each group to obtain a new submatrix A f of each row, wherein the range of f is 1, r; calculating an error signal judgment value T f of the sampling matrix in the corresponding row according to the submatrix A f, and judging whether an error signal exists in the sampling matrix in the corresponding row according to the value of the error signal judgment value Tf; the specific content of calculating the error signal determination value T f of the sampling matrix in the corresponding row according to the submatrix a f is as follows:
Each element in the submatrix A f is represented by a binary system, the numerical value of the same position in the binary system corresponding to each element is taken out to construct an inspection matrix, and each submatrix A f is provided with k inspection matrices in total; acquiring an acquisition signal t l of a corresponding check matrix by using the check matrix modulation pattern, wherein l in the acquisition signal t l represents any check matrix, namely, the range of l is 0, k-1; and calculates an error signal determination value j of the corresponding submatrix A f
The specific content for judging whether the error signal exists in the sampling matrix in the corresponding row according to the value of the error signal judgment value T f is as follows:
When T f is less than 1%, determining that an error signal exists in the sub-matrix A f corresponding to T f, and further determining that an error signal exists in the sampling matrix in a row corresponding to the sub-matrix A f; when T f is more than or equal to 1%, judging that the submatrix A f corresponding to the T f has no error signal, and further judging that the sampling matrix in the row corresponding to the submatrix A f is associated with no error signal;
For the C sampling matrixes of each group, accumulating the sampling matrix elements in each column g to obtain a new submatrix A g of each column, wherein the range of g is 1, s; calculating an error signal judgment value T g of the sampling matrix in the corresponding column according to the submatrix A g, and judging whether an error signal exists in the sampling matrix in the corresponding column according to the value of the error signal judgment value T g;
The specific contents of calculating the error signal determination value T g of the sampling matrix in a corresponding column according to the submatrix a g are as follows:
Each element in the submatrix A g is represented by a binary system, the numerical value of the same position in the binary system corresponding to each element is taken out to construct a projection matrix, and k' projection matrices are counted in each submatrix A g; acquiring acquisition signals t l ' of corresponding projection matrixes by utilizing the projection matrix modulation pattern, wherein l ' in the acquisition signals t l ' represents any one projection matrix, namely the range of l ' is [0, k ' -1]; and calculates an error signal determination value of the corresponding submatrix A g
The specific content of judging whether the error signal exists in the sampling matrix in the corresponding column according to the value of the error signal judgment value T g is as follows:
when T g is less than 1%, determining that an error signal exists in the sub-matrix A g corresponding to T g, and further determining that an error signal exists in the sampling matrix in a column corresponding to the sub-matrix A g; when T g is more than or equal to 1%, judging that the submatrix A g corresponding to T g has no error signal, and further judging that the sampling matrix in a column corresponding to the submatrix A g is associated with no error signal;
The number of rows of the sampling matrix generating the error signal is determined according to the error signal determination value T f, and the number of columns of the sampling matrix generating the error signal is determined according to the error signal determination value T g, so that the specific position of the error signal is obtained.
2. The signal inspection method for single pixel imaging according to claim 1, wherein the numerical calculation formula of k in k projection matrices in total of each submatrix a f is:
k＝[log2s]+1
Where [ log 2 s ] represents higher order rounding of the value of log 2 s.
3. The signal inspection method for single pixel imaging according to claim 1, wherein the numerical calculation formula of k 'in k' projection matrices in total of each submatrix a g is:
k′＝[log2r]+1
where [ log 2 r ] represents higher order rounding of the value of log 2 r.
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| CN108895985A (en) * | 2018-06-19 | 2018-11-27 | 中国科学院合肥物质科学研究院 | A kind of object positioning method based on single pixel detector |
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| CN112839143B (en) * | 2020-12-30 | 2023-02-03 | 南京工程学院 | Method and device for verifying acquired signals in single-pixel imaging process |
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