CN114528035A - Test instruments and methods - Google Patents

Abstract

The embodiment of the application discloses a test instrument and a method, wherein the test instrument comprises: the first processing unit is used for acquiring configuration information, the configuration information is used for reflecting a target test function required to be completed by a test instrument, determining a target configuration program according to the configuration information, and running an application program of the target test function according to the configuration information; the second processing unit is used for running a target configuration program, configuring part or all of at least one RX link, and/or configuring part or all of at least one TX link, so as to realize transmission of test data generated in the running process of a target application program. The embodiment of the application is beneficial to simultaneously realizing various measuring functions, saves cost and instrument space, and can realize the self-definition of the testing function according to the requirement of a user.

Description

Test instruments and methods

technical field

The present application relates to the technical field of measuring instruments, in particular to a testing instrument and method.

Background technique

With the continuous development of computer technology and measurement and control technology, it is often necessary to measure some parameters of the circuit when developing and producing electronic circuits and instruments. In traditional test instruments, if they are divided from the perspective of sending and receiving, they can be divided into two major Type instruments, one is receiving instruments, such as oscilloscopes, spectrum analyzers, etc.; the other is transmitting instruments, such as AWG signal sources, RF signal sources, AFG signal sources, etc. These instruments have relatively simple functions and are very specific. Strong, but not scalable, users can only purchase specific test functions.

In the prior art, in view of the deficiencies brought by a single-function instrument, the following test methods are often used: one is to use multiple single-function instruments at the same time, in this method, multiple instruments will cause instrument stacking and space squeeze. For users who use the instrument outdoors, carrying a variety of instruments will cause great inconvenience. The second is to integrate a variety of measurement functions into a hardware platform, but it is a mode in which a certain function is the main function and other functions are supplemented. Due to the limitation of performance indicators, the auxiliary functions usually cannot meet the user's test needs. The third type of multi-functional measuring instrument is formed by "standard chassis + modular design". Users can purchase and customize test functions according to their own needs. However, due to the limitations of standardized chassis size and module standardized size, this method makes each The performance index of the test function is generally not too high, and once the purchase is completed, the function of the instrument is fixed, and the subsequent upgradeability is not strong. If you want to upgrade, you must buy a new function module and insert it into the standard chassis.

SUMMARY OF THE INVENTION

The embodiments of the present application provide a test instrument and method, which can realize multiple measurement functions at the same time, save cost and instrument space, and can realize the customization of test functions according to user requirements.

In a first aspect, an embodiment of the present application provides a test instrument, including a first processing unit, a second processing unit, at least one receiving RX link and at least one transmitting TX link, the first processing unit is connected to the first processing unit Two processing units, the second processing unit is respectively connected to the at least one RX link and the at least one TX link;

The first processing unit is configured to acquire configuration information, where the configuration information is used to reflect the target test function that the test instrument needs to complete; and to determine a target configuration program according to the configuration information; The configuration information runs a target application, and the target application is the application of the target test function;

the second processing unit, configured to run the target configuration program, configure part or all of the RX links of the at least one RX link, and/or configure part or all of the TX of the at least one TX link link to realize the transmission of test data generated during the running of the target application.

Based on the first aspect, in some possible embodiments, the configuration information includes a unique identifier of the target configuration program and a unique identifier of the target application program.

Based on the first aspect, in some possible embodiments, in the aspect of acquiring configuration information, the first processing unit is specifically configured to:

displaying a first user interface when an activation operation of the test function is detected, the first user interface including at least one function mode control, the at least one function mode control including a target function mode control;

When a selection operation for the target function mode control is detected, the configuration information corresponding to the target function mode control is acquired.

Based on the first aspect, in some possible embodiments, the second processing unit includes at least one field programmable gate array FPGA chip, and each FPGA chip in the at least one FPGA chip is used to run at least one configuration program.

Based on the first aspect, in some possible embodiments, each of the at least one RX chain includes an analog-to-digital conversion device and an RX analog front-end AFE circuit.

Based on the first aspect, in some possible embodiments, each TX link in the at least one TX link includes a digital-to-analog conversion device and a TXAFE circuit.

Based on the first aspect, in some possible embodiments, the functions supported by the test instrument include: oscilloscope function, frequency characteristic analyzer function, digital voltmeter function, protocol analyzer function, vector signal analyzer function, arbitrary waveform generation function of generator, arbitrary function generator, baseband signal transmitter, vector signal source, pattern generator, frequency hopping signal generator, multi-channel clock source, pulse generator, waveform acquisition, processing and playback instrument .

In a second aspect, an embodiment of the present application provides a test method, which is applied to a test instrument, where the test instrument includes at least one receive RX link and at least one transmit TX link, and the method includes:

Obtaining configuration information, the configuration information is used to reflect the target test function that the test instrument needs to complete;

Determine a target configuration program according to the configuration information;

Run a target application program according to the configuration information, the target application program is the application program of the target test function;

running the target configuration program to configure part or all of the RX links of the at least one RX link, and/or configure part or all of the TX links of the at least one TX link to implement the target application Transmission of test data generated during program execution.

Based on the second aspect, in some possible embodiments, the configuration information includes a unique identifier of the target configuration program and a unique identifier of the target application program.

Based on the second aspect, in some possible embodiments, the acquiring configuration information includes:

displaying a first user interface when an activation operation of the test function is detected, the first user interface including at least one function mode control, the at least one function mode control including a target function mode control;

When a selection operation for the target function mode control is detected, the configuration information corresponding to the target function mode control is acquired.

It can be seen that, in the embodiment of the present application, the test instrument includes: a first processing unit, a second processing unit connected to the first processing unit, and at least one receiving RX link and at least one sending TX link connected to the second processing unit , the first processing unit is used to obtain configuration information, the configuration information is used to reflect the target test function that the test instrument needs to complete, and to determine the target configuration program according to the configuration information, and to run the target application program according to the configuration information, and the target application program is the target test an application program of functions; a second processing unit configured to run a target configuration program, configure part or all of the RX links of the at least one RX link, and/or, configure part or all of the TX links of the at least one TX link, In order to realize the transmission of test data generated during the running of the target application. It can be seen that each RX link or TX link of the test instrument supports independent test function definition, that is to say, the user only needs to configure the test function for each channel to realize the corresponding test function. The embodiment is beneficial to realize multiple measurement functions at the same time, saves cost, saves instrument space, and can realize the customization of test functions according to user requirements.

Description of drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only These are some embodiments of the present application. For those of ordinary skill in the art, other drawings can also be obtained based on these drawings without any creative effort.

1 is a schematic diagram of a test instrument provided in an embodiment of the present application;

2 is a schematic structural diagram of another testing instrument provided by an embodiment of the present application;

FIG. 3 is a schematic flowchart of a testing method provided by an embodiment of the present application.

Detailed ways

In order to make those skilled in the art better understand the solutions of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only The embodiments are part of the present application, but not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the scope of protection of the present application.

Each of them will be described in detail below.

The terms "first", "second" and the like in the description and claims of the present application and the drawings are used to distinguish different objects, rather than to describe a specific order. Furthermore, the term "comprising" and any variations thereof are intended to cover non-exclusive inclusion. For example, a system comprising a series of units and devices is not limited to the units and devices listed, but optionally also includes units and devices not listed, or optionally also includes other units and devices inherent to these systems. device.

Reference herein to an "embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the present application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor a separate or alternative embodiment that is mutually exclusive of other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

As shown in FIG. 1 , FIG. 1 is a schematic diagram of a test instrument. The test instrument 100 includes a first processing unit 110 , a second processing unit 120 , at least one receive (Receive, RX) link 130 and at least one transmit (Transmit) link 130 . , TX) link 140, the first processing unit 110 is connected to the second processing unit 120, and the second processing unit 120 is respectively connected to the at least one RX link 130 and the at least one TX link 140; The first processing unit 110 is configured to acquire configuration information, where the configuration information is used to reflect the target test function that the test instrument needs to complete; and to determine a target configuration program according to the configuration information; The configuration information is used to run a target application program, and the target application program is an application program of the target test function; the second processing unit 120 is configured to run the target configuration program to configure the at least one RX link 130. All or part of the RX link, and/or, all or part of the TX link in the at least one TX link 140 is configured to realize the transmission of test data generated during the running of the target application.

The first processing unit 110, that is, the central processing unit (Central Processing Unit, CPU) processing unit, is mainly responsible for software management, configuration and control of the entire instrument, among which the most important aspect is to select the load according to the user's selection of the test function mode. Different Field-Programmable Gate Array (Field-ProgrammableGateArray, FPGA) configuration programs, and configure and start running related applications to achieve user-selected test and measurement functions.

The second processing unit 120 includes at least one FPGA chip, and each FPGA chip in the at least one FPGA chip is used to run at least one configuration program.

It should be noted that the test instrument 100 may include at least one set of RX links and TX links. Specifically, the test instrument 100 may include two groups of RX links and TX links, that is, "2-channel TX link + The test function of "2-channel RX link" can define the instrument, and the test instrument 100 can also include four groups of RX links and TX links, that is, the test function of "4-channel TX link + 4-channel RX link" can be defined. The instrument, the test instrument 100 may also include 8 groups of RX links and TX links, that is, a test function-definable instrument of "8-channel TX link + 8-channel RX link", and so on. It should be noted that, no matter how many channels the test instrument 100 is, each link supports definable test functions, that is, each RX link or TX link can be configured with different test and measurement functions.

The functions supported by the test instrument 100 include at least one of the following functions: oscilloscope function, frequency characteristic analyzer function, digital voltmeter function, protocol analyzer function, vector signal analyzer function, arbitrary waveform generator function, Arbitrary function generator function, baseband signal emission source function, vector signal source function, pattern generator function, frequency hopping signal generator function, multi-channel clock source function, pulse generator function, waveform acquisition, processing and playback instrument function.

The following describes the realization principles of various test functions.

Wherein, each RX link in the at least one RX link 130 includes an analog-to-digital conversion device and an RX analog front-end (Analog Front-End, AFE) circuit. The analog-to-digital conversion device may be an ADC chip.

Please refer to Figure 2. Figure 2 is a schematic diagram of the structure of another test instrument. It can be seen that each RX link includes an RXAFE circuit and an ADC chip with a high sampling rate, that is, an ADC chip and an RXAFE circuit. Implements a one-lane RX link.

The sampling rate of the ADC chip is not specifically limited, and the bandwidth of the RXAFE circuit is not specifically limited. When the test instrument 100 adopts an ADC chip with a higher sampling rate and an RXAFE analog circuit with a wider bandwidth, a higher bandwidth RX chain can be realized. The bandwidth of each RX link may range from DC to 5 GHz, for example.

It should be noted that the RX link supports the acquisition of signals in a wide frequency range, and based on its ultra-wideband signal characteristics, the measurement instrument 100 can implement various measurement functions.

An application program of a test function corresponds to an FPGA configuration program of the test function, and the FPGA configuration program of the test function can realize the configuration of the RX link and/or the TX link of the test function, and finally realize, in the When the application program of the test function is running, the test data is transmitted through the RX link and/or the TX link of the test function, so as to realize the test function.

It can be seen that, in the embodiment of the present application, the test instrument includes: a first processing unit, a second processing unit connected to the first processing unit, and at least one receiving RX link and at least one sending TX link connected to the second processing unit , the first processing unit is used to obtain configuration information, the configuration information is used to reflect the target test function that the test instrument needs to complete, and to determine the target configuration program according to the configuration information, and to run the target application program according to the configuration information, and the target application program is the target test an application program of functions; a second processing unit configured to run a target configuration program, configure part or all of the RX links of the at least one RX link, and/or, configure part or all of the TX links of the at least one TX link, In order to realize the transmission of test data generated during the running of the target application. It can be seen that each RX link or TX link of the test instrument supports independent test function definition, that is to say, the user only needs to configure the test function for each channel to realize the corresponding test function. The embodiment is beneficial to realize multiple measurement functions at the same time, saves cost, saves instrument space, and can realize the customization of test functions according to user requirements.

In the specific implementation, when the application program and FPGA configuration program of the following test instruments are configured, the RX link can be configured to the functions possessed by the following test instruments, but is not limited to the functions possessed by the following test instruments:

(1) High-end oscilloscope: the bandwidth of the oscilloscope can reach 5GHz, and the waveform capture rate is more than 1 million frames;

(2) Frequency characteristic analyzer: It can analyze the signal spectrum characteristics of 5GH bandwidth;

(3) Digital voltmeter: It can measure the voltage signal and analyze the voltage characteristics;

(4) Protocol analyzer: It can collect protocol signals with a bandwidth of 5GHz, and perform decoding and analysis;

(5) Vector signal analyzer: Because its signal bandwidth ranges from DC to 5GHz, it can collect and analyze most of the radio signals.

Wherein, each TX link in the at least one TX link includes a digital-to-analog conversion device and a TXAFE circuit. The digital-to-analog conversion device may be a DAC chip.

Referring to Figure 2, it can be seen that each TX link includes a TXAFE circuit and a DAC chip with a high sampling rate, that is, a DAC chip and a TXAFE circuit can realize a TX link of one channel.

The sampling rate of the DAC chip is not specifically limited, and the bandwidth of the TXAFE circuit is not specifically limited. When the test instrument 100 adopts a DAC chip with a higher sampling rate and a TXAFE analog circuit with a wider bandwidth, a higher bandwidth TX chain can be realized. Road; exemplarily, each TX link bandwidth ranges from DC to 5 GHz.

It should be noted that, since the TX link supports the transmission of signals in the frequency range of DC to 5 GHz, its ultra-wideband signal characteristics can realize multiple signal source functions.

In the specific implementation, in the case of configuring the application program and FPGA configuration program of the following test functions of the test instrument, the TX link can be configured to the following instrument functions, but not limited to the following instrument functions:

(1) AWG signal source: the output frequency range of the signal source is from DC to 5GHz, and the sampling rate can reach more than 12GHz;

(2) AFG signal source: the output frequency range of the signal source is from DC to 5GHz, and the sampling rate can reach more than 12GHz, which can replace all AFG instruments on the market.

(3) IQ baseband signal transmission source: it can output IQ modulated baseband signal with bandwidth up to 2GHz;

(4) Vector signal source: It can output IF intermediate frequency signal or RF radio frequency signal with frequency range from DC to 5GHz, which can cover most radio signal applications;

(5), code generator;

(6), frequency hopping signal generator: frequency hopping frequency range from DC ~ 5GHz;

(7) Multiple clock sources: the clock frequency ranges from DC to 5GHz;

(8), pulse generator.

In addition, since both the RX link and the TX link support the transmission and reception of signals in the frequency range of DC to 5GHz, in the case of configuring the application program and FPGA configuration program of the test function of the following test instruments, the combination of the RX link and the TX link can be used. It can be configured to the functions of the following test instruments, but not limited to the functions of the following test instruments:

(1) Waveform acquisition, processing and playback instrument: The RX link collects the received signal in real time, processes it in real time through the FPGA, and then transmits it through the TX link, which can be used in electronic countermeasures and other fields.

It should be noted that the performance indicators in the functions of the above-mentioned test instruments, such as the bandwidth of 5GHz, the waveform capture rate of 1 million frames, etc., are only exemplary descriptions. In the specific implementation, the performance indicators can also correspond to other values, which are not specifically limited. .

It can be understood that the user can select and configure some or all of the at least one test function application program and FPGA configuration program, at least one receive RX link 130 and at least one transmit TX link 140, to Implement at least one test function expected by the user. In the specific implementation, when the test instrument 100 includes m groups of RX links and TX links, m is a positive integer. After determining the corresponding application program and FPGA configuration program, it can be realized Simultaneously configured as x RX link instrument functions + y RX link instrument functions, where x is an integer greater than or equal to 0 and less than or equal to m, y is an integer greater than or equal to 0 and less than or equal to m, x and y may be equal, and x and y may not be equal, which is not specifically limited.

Wherein, the configuration information includes the unique identifier of the target configuration program and the unique identifier of the target application program. The unique identifier may be the name of the program, which is not specifically limited.

Specifically, the configuration information may be configuration information corresponding to the functional mode selected by the user, and the corresponding relationship between the configuration information and the functional mode is pre-stored in the test instrument. Based on this, in the aspect of obtaining the configuration information, the first processing unit is specifically configured to: when detecting the startup operation of the test function, display a first user interface, where the first user interface includes at least one function mode control, The at least one functional mode control includes a target functional mode control; when a selection operation for the target functional mode control is detected, the configuration information corresponding to the target functional mode control is acquired.

One functional mode control corresponds to one functional mode, and different functional mode controls correspond to different functional modes. When the user selects the target functional mode control, the corresponding target functional mode is selected.

Among them, the functional mode is associated with the number of groups of RX links and TX links.

Exemplarily, when the test instrument 100 includes two sets of RX links and TX links, the instrument may include the following functional modes when the corresponding application program and FPGA configuration program are configured:

Function mode 1: 1-channel high-end oscilloscope;

Function mode 2: 2-channel high-end oscilloscope;

Function mode three: 1 channel AWG signal source;

Function mode 4: 2-channel AWG signal source;

Function mode five: 1 channel high-end oscilloscope + 1 channel AWG signal source;

Function mode six: 1 channel high-end oscilloscope + 1 channel frequency characteristic analyzer + 1 channel AWG signal source;

Function mode seven: 1 channel frequency characteristic analyzer + 1 channel AFG signal source;

Function mode eight: 1-channel protocol analyzer + 1-channel code generator;

Function mode 9: 1 channel high-end oscilloscope + 1 channel AWG signal source + 1 channel pattern generator;

Function mode ten: 1 channel high-end oscilloscope + 1 channel frequency characteristic analyzer + 1 channel AWG signal source + 1 channel pattern generator; and so on.

No further examples are given here.

Exemplarily, when the test instrument 100 includes four sets of RX links and TX links, the instrument may include the following functional modes when the corresponding application program and FPGA configuration program are configured:

Function mode 1: 1-channel high-end oscilloscope;

Function mode 2: 2-channel high-end oscilloscope;

Function mode three: 3-channel high-end oscilloscope;

Function mode four: 4-channel high-end oscilloscope;

Function mode five: 1 channel AWG signal source;

Function mode six: 2-channel AWG signal source;

Function mode seven: 3-channel AWG signal source;

Function mode eight: 4-channel AWG signal source;

Function mode 9: 3-channel high-end oscilloscope + 1-channel AWG signal source;

Function mode ten: 1-channel high-end oscilloscope + 3-channel frequency characteristic analyzer + 2-channel AWG signal source;

Function mode eleven: 3-channel frequency characteristic analyzer + 4-channel AFG signal source;

Function mode 12: 2-channel protocol analyzer + 3-channel pattern generator;

Function mode 13: 1 channel high-end oscilloscope + 1 channel AWG signal source + 1 channel pattern generator;

Function mode fourteen: 1-channel high-end oscilloscope + 2-channel frequency characteristic analyzer + 2-channel AWG signal source + 1-channel pattern generator; and so on.

No further examples are given here.

Exemplarily, when the test instrument 100 includes eight groups of RX links and TX links, the instrument may include the following functional modes when the corresponding application program and FPGA configuration program are configured:

Function mode 1: 3-channel high-end oscilloscope;

Function mode 2: 4-channel high-end oscilloscope;

Function mode three: 5-channel high-end oscilloscope;

Function mode four: 8-channel high-end oscilloscope;

Function mode five: 4-channel AWG signal source;

Function mode six: 5-channel AWG signal source;

Function mode seven: 7-channel AWG signal source;

Function mode eight: 8-channel AWG signal source;

Function mode 9: 8-channel high-end oscilloscope + 8-channel AFG signal source;

Function mode ten: 5-channel high-end oscilloscope + 3-channel frequency characteristic analyzer + 6-channel AFG signal source;

Function mode eleven: 7-channel frequency characteristic analyzer + 6-channel AFG signal source;

Function mode 12: 5-channel protocol analyzer + 3-channel pattern generator;

Function mode 13: 6-channel high-end oscilloscope + 2-channel AWG signal source + 3-channel pattern generator;

Function mode fourteen: 4-channel high-end oscilloscope + 1-channel frequency characteristic analyzer + 2-channel AWG signal source + 5-channel pattern generator;

Function mode fifteen: 4-channel high-end oscilloscope + 4-channel AWG signal source;

Function mode sixteen: 4-channel high-end oscilloscope + 4-channel clock source;

Function mode seventeen: 2-channel high-end oscilloscope + 1-channel AWG signal source + 3-channel clock source;

Function mode 18: 2-channel high-end oscilloscope + 2-channel AWG signal source + 2-channel clock source;

Function mode nineteen: 1-channel high-end oscilloscope + 2-channel AWG signal source + 2-channel clock source; and so on.

No further examples are given here.

In summary, when the hardware deployment of the test instrument is completed, first of all, by integrating multi-channel TX link and RX link, and each link supports software-defined different test and measurement functions, it can realize a variety of test functions. Combination, secondly, through the application program for configuring the test function and the FPGA configuration program, the corresponding test function is realized, which supports the user to flexibly purchase and upgrade the instrument, supports the user to define the instrument function by software, and highly integrates the instrument function, which is convenient for the user to use and carry. Bring convenience.

Wherein, please refer to FIG. 3. FIG. 3 is a schematic flowchart of a test method provided in an embodiment of the present application, which is applied to the test instrument shown in FIG. 1 and FIG. 2. As shown in FIG. 3, the test method includes:

S201, a test instrument acquires configuration information, where the configuration information is used to reflect a target test function that the test instrument needs to complete.

Specifically, the configuration information includes the unique identifier of the target configuration program and the unique identifier of the target application program.

Specifically, the implementation manner of the test instrument acquiring the configuration information may be as follows: when the test instrument detects the start-up operation of the test function, it displays a first user interface, the first user interface includes at least one function mode control, the The at least one functional mode control includes a target functional mode control; the test instrument acquires the configuration information corresponding to the target functional mode control when detecting a selection operation for the target functional mode control.

S202, the test instrument determines a target configuration program according to the configuration information.

S203, the test instrument runs a target application program according to the configuration information, where the target application program is an application program of the target test function.

S204, the test instrument runs the target configuration program, configures part or all of the RX links in the at least one RX link, and/or configures part or all of the TX links in the at least one TX link, In order to realize the transmission of test data generated during the running of the target application.

It can be seen that, in the embodiment of the present application, the test instrument includes: a first processing unit, a second processing unit connected to the first processing unit, and at least one receiving RX link and at least one sending TX link connected to the second processing unit , the first processing unit is used to obtain configuration information, the configuration information is used to reflect the target test function that the test instrument needs to complete, and to determine the target configuration program according to the configuration information, and to run the target application program according to the configuration information, and the target application program is the target test an application program of functions; a second processing unit configured to run a target configuration program, configure part or all of the RX links of the at least one RX link, and/or, configure part or all of the TX links of the at least one TX link, In order to realize the transmission of test data generated during the running of the target application. It can be seen that each RX link or TX link of the test instrument supports independent test function definition, that is to say, the user only needs to configure the test function for each channel to realize the corresponding test function. The embodiment is beneficial to realize multiple measurement functions at the same time, saves cost, saves instrument space, and can realize the customization of test functions according to user requirements.

It should be noted that, for the sake of simple description, the foregoing method embodiments are all expressed as a series of action combinations, but those skilled in the art should know that the present application is not limited by the described action sequence. Because in accordance with the present application, certain steps may be performed in other orders or concurrently. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the present application.

In the above-mentioned embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.

In the several embodiments provided in this application, it should be understood that the disclosed apparatus may be implemented in other manners. For example, the device embodiments described above are only illustrative. For example, the division of the above-mentioned units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated. to another system, or some features can be ignored, or not implemented. On the other hand, the shown or discussed mutual coupling or direct coupling or communication connection may be through some interfaces, indirect coupling or communication connection of devices or units, and may be in electrical or other forms.

The units described above as separate components may or may not be physically separated, and components shown as units may or may not be physical units, that is, may be located in one place, or may be distributed to multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution in this embodiment.

In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically alone, or two or more units may be integrated into one unit. The above-mentioned integrated units may be implemented in the form of hardware, or may be implemented in the form of software functional units.

The above-mentioned integrated units, if implemented in the form of software functional units and sold or used as independent products, may be stored in a computer-readable memory. Based on this understanding, the technical solution of the present application can be embodied in the form of a software product in essence, or the part that contributes to the prior art, or all or part of the technical solution, and the computer software product is stored in a memory, Several instructions are included to cause a computer apparatus (which may be a personal computer, a server, or a network apparatus, etc.) to execute all or part of the steps of the above-mentioned methods of the various embodiments of the present application. The aforementioned memory includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, magnetic disk or optical disk and other media that can store program codes.

Those skilled in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing relevant hardware through a program, and the program can be stored in a computer-readable memory, and the memory can include: a flash disk , Read-only memory (English: Read-OnlyMemory, referred to as: ROM), random access device (English: RandomAccessMemory, referred to as: RAM), magnetic disk or optical disk, etc.

The embodiments of the present application have been introduced in detail above, and the principles and implementations of the present application are described in this paper by using specific examples. The descriptions of the above embodiments are only used to help understand the methods and core ideas of the present application; at the same time, for Persons of ordinary skill in the art, based on the idea of the present application, will have changes in the specific implementation manner and application scope. In summary, the contents of this specification should not be construed as limitations on the present application.

Claims (10)

1. A testing instrument, characterized in that, comprising a first processing unit, a second processing unit, at least one receiving RX link and at least one transmitting TX link, the first processing unit is connected to the second processing unit, the second processing unit is connected to the at least one RX link and the at least one TX link, respectively; The first processing unit is configured to acquire configuration information, where the configuration information is used to reflect the target test function that the test instrument needs to complete; and to determine a target configuration program according to the configuration information; The configuration information runs a target application, and the target application is the application of the target test function; the second processing unit, configured to run the target configuration program, configure part or all of the RX links of the at least one RX link, and/or configure part or all of the TX of the at least one TX link link to realize the transmission of test data generated during the running of the target application. 2 . The test instrument according to claim 1 , wherein the configuration information includes a unique identifier of the target configuration program and a unique identifier of the target application program. 3 . 3. The test instrument according to claim 1, wherein, in the aspect of acquiring configuration information, the first processing unit is specifically used for: displaying a first user interface when an activation operation of the test function is detected, the first user interface including at least one function mode control, the at least one function mode control including a target function mode control; When a selection operation for the target function mode control is detected, the configuration information corresponding to the target function mode control is acquired. 4. The test instrument according to claim 1, wherein the second processing unit comprises at least one field programmable gate array FPGA chip, and each FPGA chip in the at least one FPGA chip is used to run at least one configuration program. 5. The test instrument of claim 1, wherein each RX link in the at least one RX link comprises an analog-to-digital conversion device and an RX analog front-end AFE circuit. 6. The test instrument of claim 1, wherein each TX link in the at least one TX link comprises a digital-to-analog conversion device and a TXAFE circuit. 7. The test instrument according to any one of claims 1-6, wherein the functions supported by the test instrument include at least one of the following functions: oscilloscope function, frequency characteristic analyzer function, digital voltmeter function , protocol analyzer function, vector signal analyzer function, arbitrary waveform generator function, arbitrary function generator function, baseband signal emission source function, vector signal source function, pattern generator function, frequency hopping signal generator function, multi-channel Clock source function, pulse generator function, waveform acquisition, processing and playback function. 8. A test method, characterized in that, applied to a test instrument, the test instrument comprising at least one receive RX link and at least one transmit TX link, the method comprising: Obtaining configuration information, the configuration information is used to reflect the target test function that the test instrument needs to complete; Determine a target configuration program according to the configuration information; Run a target application program according to the configuration information, the target application program is the application program of the target test function; running the target configuration program to configure part or all of the RX links of the at least one RX link, and/or configure part or all of the TX links of the at least one TX link to implement the target application Transmission of test data generated during program execution. 9. The method according to claim 8, wherein the configuration information comprises a unique identifier of the target configuration program and a unique identifier of the target application program. 10. The method according to claim 8, wherein the acquiring configuration information comprises: displaying a first user interface when an activation operation of the test function is detected, the first user interface including at least one function mode control, the at least one function mode control including a target function mode control; When a selection operation for the target function mode control is detected, the configuration information corresponding to the target function mode control is acquired.

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