[go: up one dir, main page]

CN114816834A - Equivalent residence time recovery method and device, storage medium and electronic equipment - Google Patents

Equivalent residence time recovery method and device, storage medium and electronic equipment Download PDF

Info

Publication number
CN114816834A
CN114816834A CN202210732170.3A CN202210732170A CN114816834A CN 114816834 A CN114816834 A CN 114816834A CN 202210732170 A CN202210732170 A CN 202210732170A CN 114816834 A CN114816834 A CN 114816834A
Authority
CN
China
Prior art keywords
memory
residence time
equivalent
compensation value
equivalent residence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202210732170.3A
Other languages
Chinese (zh)
Other versions
CN114816834B (en
Inventor
秦东润
刘晓健
王嵩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Dera Technology Co Ltd
Original Assignee
Beijing Dera Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Dera Technology Co Ltd filed Critical Beijing Dera Technology Co Ltd
Priority to CN202210732170.3A priority Critical patent/CN114816834B/en
Publication of CN114816834A publication Critical patent/CN114816834A/en
Application granted granted Critical
Publication of CN114816834B publication Critical patent/CN114816834B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1068Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
    • G11C16/3495Circuits or methods to detect or delay wearout of nonvolatile EPROM or EEPROM memory devices, e.g. by counting numbers of erase or reprogram cycles, by using multiple memory areas serially or cyclically
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38Response verification devices
    • G11C29/42Response verification devices using error correcting codes [ECC] or parity check
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52Protection of memory contents; Detection of errors in memory contents
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0411Online error correction
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02DCLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00Energy efficient computing, e.g. low power processors, power management or thermal management

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

The invention relates to the technical field of data storage, and provides a method and a device for recovering equivalent residence time, a storage medium and electronic equipment, wherein the method comprises the following steps: grouping memories of a system, judging whether a fault type of a first memory belongs to a preset first fault type set when the first memory has a fault, and if so, sending equivalent residence time request information to a second memory in the group to which the first memory belongs to request the second memory to calculate and record an equivalent residence time compensation value from the current moment; and when the first memory recovers work, acquiring the equivalent residence time compensation value recorded by the second memory and sending the equivalent residence time compensation value to the first memory so that the first memory can update the equivalent residence time of the storage unit in the memory according to the equivalent residence time compensation value. The invention can accurately compensate and recover the equivalent residence time during the failure of the memory, and reduces the original error rate while improving the reading speed of the memory.

Description

Equivalent residence time recovery method and device, storage medium and electronic equipment
Technical Field
The present invention relates to the field of data storage technologies, and in particular, to a method and an apparatus for recovering an equivalent residence time, a storage medium, and an electronic device.
Background
With the increasing degree of the global internet, the global demand for data storage is increasing. The mainstream storage devices of current computer servers are mainly divided into two types: mechanical Hard disks (Hard disks, HD) and Solid State Drives (SSD). Solid state drives and mechanical hard drives are essentially hardware for data storage, differing essentially in their storage media. In the traditional mechanical hard disk, a mechanical magnetic disk is used as a storage medium, and data is stored and read through a mechanical structure between a magnetic arm and a magnetic head as well as between the magnetic disk and the magnetic head; the solid state disk uses a NAND flash memory (a nonvolatile memory) as a storage medium, and reads and writes data by turning on and off a cell, which is the number of charges in the memory, to realize data storage. Due to the performance bottleneck of the mechanical structure, the reading performance of most current mechanical hard disks is poorer than that of solid state hard disks. With the miniaturization of solid state disks and the continuous improvement of cost performance thereof, more and more enterprise consumers and personal consumers adopt solid state disks to store data. Among the indexes measuring the solid state disk, the reading speed is one of the most important indexes. Factors that limit the read speed of a solid state disk include the ability to read data from the storage particles and the ability to store controller firmware algorithms. Therefore, how to accelerate the reading speed of the solid state disk by improving the capability of the firmware, reduce the energy consumption of the chip and prolong the service life of the solid state disk is very important.
At present, there are two main implementation manners for increasing the reading speed of a solid state disk, where the first manner is: setting the memory into a default reading mode after the memory is powered on again, and reading data by adopting a default level in the mode; the predictive decision level mode is re-enabled after the current memory cell (usually at the granularity of a physical block) has written data. The second way is: and after the power is re-electrified, reading the current time and temperature, and predicting the decision level of the current storage unit by recording the state information of the current storage unit, including equivalent residence time, PE temperature, reading temperature, PE times and other information, so that the reading speed of the memory is increased. In the first mode, after the memory is electrified and recovered, when a data writing action does not occur in the current storage unit, because accurate equivalent residence time cannot be obtained, only default level can be adopted to read data, so that the RBER is higher, and the data reading efficiency is influenced; in the second mode, if the ambient temperature fluctuates greatly during the power-down period of the memory, the equivalent residence time compensated by the method has a large error, so that the prediction decision level is inaccurate.
Disclosure of Invention
In view of the above, the present invention has been made to provide a method, an apparatus, a storage medium, and an electronic device for recovering an equivalent residence time that overcome or at least partially solve the above problems.
In one aspect of the present invention, a method for recovering equivalent residence time is provided, the method comprising:
grouping the memories connected with the current Host;
when the first storage is in fault, judging whether the fault category of the first storage belongs to a preset first fault category set, wherein the first fault category set comprises the fault category of an equivalent residence time compensation value of the first storage needing to be recorded by a Host;
if the fault type belongs to the first fault type set, sending equivalent residence time request information to a second memory in a group to which a first memory belongs so as to request the second memory to calculate and record an equivalent residence time compensation value from the current moment;
and when the first memory recovers work, acquiring the equivalent residence time compensation value recorded by the second memory and sending the equivalent residence time compensation value to the first memory so that the first memory can update the equivalent residence time of the storage unit in the memory according to the equivalent residence time compensation value.
Further, the method further comprises:
receiving capability information reported when the first memory is online, wherein the capability information comprises physical characteristic parameters and/or use parameters of the memory;
the grouping of the memories connected with the current Host comprises the following steps:
and grouping the various memories connected with the current Host according to the physical characteristic parameters and/or the use parameters of the memories.
Further, the physical characteristic parameter comprises the manufacturer and/or model of the memory;
the use parameters comprise the physical position of the memory, the slot position of the case where the memory is located, the equivalent temperature of the memory and/or the temperature fluctuation of the memory in the historical use time of the preset duration.
Further, the capability information further comprises identification information ID and a fault category list of the first memory;
and generating a first fault category set of the first memory according to the identity identification information ID and the fault category list.
Further, the capability information further includes equivalent temperature information of the first memory;
when the equivalent temperature information of the second memory is different from the equivalent temperature information of the first memory, the method further comprises sending the equivalent temperature information of the first memory to the second memory for the second memory to calculate an equivalent residence time compensation value according to the equivalent temperature information of the first memory.
In a second aspect, the present invention further provides an apparatus for recovering equivalent residence time, the apparatus comprising:
the grouping module is used for grouping the memories connected with the current Host;
the judging module is used for judging whether the fault category of the first storage belongs to a preset first fault category set when the first storage has a fault, wherein the first fault category set comprises the fault category of an equivalent residence time compensation value of the first storage which needs to be recorded by a Host computer;
a sending module, configured to send equivalent residence time request information to a second memory in a group to which a first memory belongs when the fault category belongs to the first fault category set, so as to request the second memory to calculate and record an equivalent residence time compensation value from a current time;
and the acquisition module is used for acquiring the equivalent residence time compensation value recorded by the second memory and sending the equivalent residence time compensation value to the first memory when the first memory recovers work, so that the first memory can update the equivalent residence time of the storage unit in the memory according to the equivalent residence time compensation value.
Further, the apparatus further comprises:
the receiving module is used for receiving the capacity information reported when the first memory is online, and the capacity information comprises physical characteristic parameters and/or use parameters of the memory;
and the grouping module is used for grouping the memories connected with the current Host according to the physical characteristic parameters and/or the use parameters of the memories.
Further, the capability information further comprises identification information ID and a fault category list of the first memory;
the device further comprises:
and the configuration module is used for generating a first fault category set of the first memory according to the identity identification information ID and the fault category list.
In a third aspect, the invention also provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, carries out the steps of the method of recovering as equivalent residence time.
In a fourth aspect, the present invention also provides an electronic device, which is characterized by comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the recovery method for equivalent residence time.
The method, the device, the storage medium and the electronic equipment for recovering the equivalent residence time can accurately compensate and recover the equivalent residence time of the storage unit in the fault period of the memory, further accurately predict a decision level, and reduce the original bit error rate (RBER) while improving the reading speed of the memory.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a system architecture diagram of a suitable memory system for use with the present invention;
FIG. 2 is a flowchart of a method for recovering equivalent residence time according to an embodiment of the present invention;
FIG. 3 is a detailed flowchart of an equivalent dwell time recovery method in accordance with a specific example of the present invention;
fig. 4 is a block diagram of an equivalent residence time recovery apparatus according to an embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the prior art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
As shown in fig. 1, the system model of the storage system to which the present invention is applied mainly includes a Host, a storage controller, and storage units, wherein the Host is connected to the plurality of storage controllers, and each storage controller manages the plurality of storage units. Aiming at the storage system, in order to solve the problem that the original bit error rate RBER of read data is higher when the data is read after the storage fault is electrified and recovered again in the prior art, the scheme of the invention provides a recovery method of equivalent residence time.
FIG. 2 schematically illustrates a flow chart of a method for equivalent dwell time recovery in accordance with an embodiment of the present invention. Referring to fig. 2, the data processing method of the SSD according to the embodiment of the present invention specifically includes the following steps:
s11, grouping the memories connected with the current Host;
s12, when the first memory fails, judging whether the fault category of the first memory belongs to a preset first fault category set, wherein the first fault category set comprises the fault category of the first memory needing the Host to record the equivalent residence time compensation value.
In the embodiment of the invention, the first memory represents a memory which has a fault and can be subjected to power-on recovery later.
In the embodiment of the invention, the fault category in the first fault category set represents that when the first memory has a corresponding fault, the Host computer is required to assist in recording the equivalent residence time compensation value of the first memory. And the fault category in the first fault category set is reported to the Host computer by the first memory in advance.
The dwell time is the time interval between the time when the memory grain writes data and the current time. Typically, one physical block typically shares one dwell time. Equivalent residence time: the high-temperature scene has an acceleration effect on the residence time relative to the low-temperature scene, and the equivalent residence time at a certain temperature can be calculated according to an Arrhenius formula.
S13, if the fault category belongs to the first fault category set, sending equivalent residence time request information to a second memory in a group to which the first memory belongs so as to request the second memory to calculate and record an equivalent residence time compensation value from the current moment;
and S14, when the first memory recovers, acquiring the equivalent residence time compensation value recorded by the second memory and sending the equivalent residence time compensation value to the first memory, so that the first memory can update the equivalent residence time of the storage unit in the memory according to the equivalent residence time compensation value.
The application scenario of the embodiment of the invention is a scenario that the disk of the memory is lost due to failure but the Host computer is normal. In this embodiment, the Host groups the memories according to characteristics, and when any memory in the group fails, records and compensates through equivalent residence time of other memories in the same group.
The recovery method of the equivalent residence time provided by the embodiment of the invention can accurately compensate and recover the equivalent residence time of the storage unit in the fault period of the memory, thereby accurately predicting the decision level, and reducing the original bit error rate (RBER) while improving the reading speed of the memory.
In the embodiment of the invention, the first memory controller firstly reports the capacity information to the Host computer after being on line, and the Host computer receives the capacity information reported when the first memory is on line, wherein the capacity information comprises the physical characteristic parameters and/or the use parameters of the memory. Further, a specific implementation manner of grouping the memories connected to the current Host in the embodiment of the present invention is as follows: and grouping the various memories connected with the current Host according to the physical characteristic parameters and/or the use parameters of the memories. The physical characteristic parameters comprise the manufacturer and/or the model of the memory; the use parameters comprise the physical position of the memory, the slot position of the chassis where the memory is located, the equivalent temperature of the memory and/or the temperature fluctuation of the memory in the historical use time of the preset duration.
In the embodiment of the invention, the reported capability information when the first memory is online also comprises an identity identification information ID and a fault category list of the first memory; and the Host generates a first fault category set of the first storage according to the identity identification information ID and the fault category list.
In the embodiment of the present invention, the reported capability information when the first memory is online further includes equivalent temperature information Te of the first memory. Further, when the equivalent temperature information of the second memory is different from the equivalent temperature information of the first memory, the method further comprises sending the equivalent temperature information of the first memory to the second memory for the second memory to calculate an equivalent residence time compensation value according to the equivalent temperature information of the first memory.
Specifically, the controller reports the capability information to the Host after going online, where the capability information includes, but is not limited to, SSDID information (i.e., identification information ID of the memory) and an Error _ list of the fault category list, where the Error _ list stores multiple fault codes, which indicates that the Host is needed to help the current memory to record time-temperature information when the fault occurs.
In an optional embodiment, the capability information may further include Update _ Cycle information for specifying a temperature acquisition Cycle, and the Update _ Cycle information is used to instruct the second memory to periodically record time-temperature information according to the specified temperature acquisition Cycle, and calculate the equivalent residence time compensation value according to the time-temperature information. When the information is not transmitted, the second memory will use its own default update _ cycle information to record the time-temperature information.
In the embodiment of the present invention, the Host groups the memories according to physical characteristics and/or usage parameters of the memories, and the grouping is based on a combination including, but not limited to, one or more of the following:
a. manufacturer and model of the memory;
b. physical location of memory, or chassis slot location;
c. an equivalent temperature of the memory;
d. temperature fluctuations within the memory history ttime.
It should be noted that, when grouping is performed according to the above d characteristic, it is necessary to periodically request to acquire the historical temperature characteristics of each memory to ensure the timeliness and accuracy of grouping. Host assigns a unique Group _ ID to each Group. When the first memory fails, the Host can confirm the failure type of the memory through active detection, and can also confirm the failure type of the memory through actively reporting an error code by the memory. The Host judges whether the current memory fault belongs to the fault type in the Error _ list reported before. If not, the subsequent processing flow is processed according to the implementation mode of the prior art, which is not described herein again, and if the current memory fault is in the Error _ list, the Host queries other memories in the Group where the first memory is located, and selects one or more memories from the other memories. And the Host sends an equivalent residence time compensation value calculation command to the selected second memory, and the command requests the second memory to record the equivalent residence time compensation value from the current moment. When the equivalent temperature used by the second memory is different from the equivalent temperature used by the first memory, the equivalent temperature of the first memory needs to be issued together.
When the first memory controller relieves the failure and resumes operation, an equivalent dwell time restoration request command is sent to the Host. The Host requests the equivalent residence time command from the second memory and transmits the equivalent residence time compensation value of the time to the first memory. The first memory controller updates the equivalent residence time of all memory cells in the memory.
According to the recovery method of the equivalent residence time provided by the embodiment of the invention, the host can effectively use the computing capacity of the equivalent residence time of other memories which have the same or similar physical characteristic parameters and/or use parameters with the fault memory, and the host can help the fault memory to accurately compensate and recover the equivalent residence time of the storage unit in the fault period, so that the decision level is accurately predicted, and the original bit error rate (RBER) is reduced while the reading speed of the memory is increased.
Fig. 3 schematically shows a detailed flowchart of an equivalent dwell time recovery method of a specific example of the present invention. Referring to fig. 3, the method for recovering equivalent residence time in the embodiment of the present invention specifically includes the following implementation procedures:
reporting capability information including SSD _ ID, Error _ List, Update _ Cycle and Te to Host after the memory controller is online;
the Host groups the memories and assigns a unique Group _ ID to each Group;
detecting that the first memory fails by the Host;
whether the current fault is in the Error _ list or not, if yes, the Host acquires one or more memories under the Group according to the Group to which the SSD _ ID belongs; otherwise, ending;
the Host sends a command of calculating the equivalent residence time to a corresponding second memory;
sending an equivalent residence time recovery request command after the first memory is online;
the Host requests the equivalent residence time compensation value recorded by the second memory to be sent to the first memory;
the first memory updates the equivalent residence time.
In the embodiment of the invention, when the first memory with the fault recovers to work, after the first memory acquires the equivalent residence time compensation value in the fault period, the method further comprises the following step of correcting the equivalent residence time compensation value to obtain the optimal equivalent residence time compensation value, and the equivalent residence time of each storage unit in the memory is recovered according to the optimal equivalent residence time compensation value.
The step of correcting the equivalent residence time compensation value specifically includes: and correcting the equivalent residence time compensation value by adopting a preset correction strategy to obtain a correction value set of the equivalent residence time compensation value. And predicting the optimal decision level of a specified target storage unit in the first storage by adopting each correction value in the correction value set, calculating the bit error rate when the optimal decision level corresponding to each correction value is adopted for data reading, selecting the correction value with the minimum bit error rate as the optimal equivalent residence time compensation value, and recovering the equivalent residence time of each storage unit in the storage according to the optimal equivalent residence time compensation value.
The selection principle of the target storage units is that the storage units are characterized in that:
A. the memory cells have different erase-write PE times, and/or
B. The difference value between the logarithms of the equivalent residence time recorded last time before the fault of any two storage units is larger than a preset first threshold valueThreshold. The equivalent time recorded by the storage unit before the fault for the last time obeys a certain rule, namely the logarithmic interval of the equivalent time of any two storage units is greater than a first threshold value;
Figure DEST_PATH_IMAGE001
wherein abs () represents an absolute value operation, Retention represents an equivalent dwell time, and i and j represent any two storage units.
Further, after the equivalent residence time compensation value in the fault period is obtained, calculating the equivalent residence time of the target storage unit at the current moment in advance according to the equivalent residence time compensation value; predicting an optimal decision level according to the equivalent residence time corresponding to the equivalent residence time compensation value, and reading data of a target storage unit according to the predicted optimal decision level; and correcting the read data by adopting an ECC decoder to obtain a correct target bit sequence.
When calculating the bit error rate when data reading is performed by using the optimal decision levels corresponding to the respective correction values, the following implementation may be adopted: respectively reading data of the target storage unit according to the optimal decision level corresponding to each correction value to obtain read data corresponding to each correction value; and comparing the read data corresponding to each correction value with the target bit sequence respectively to obtain the bit error rate when the optimal decision level corresponding to each correction value is adopted for data reading.
In the embodiment of the invention, the correction of the equivalent residence time compensation value can be realized by two correction strategies to obtain the optimal equivalent residence time compensation value, one is to obtain the more accurate optimal equivalent residence time compensation value by repeated reading operation in a dichotomy mode, and the other is to obtain a balance point between precision and calculation complexity by presetting a compensation table.
In a specific example, the method for correcting the equivalent residence time compensation value by using a preset correction strategy to obtain a correction value set of the equivalent residence time compensation value includes the following specific implementation manners: and constructing an initial correction value set by taking the equivalent residence time compensation value as a middle value and adopting a dichotomy method, wherein the initial correction value set comprises Tmin, Tmed and Tmax, wherein the Tmin = 0, Tmed = delta _ T, Tmax = 2 × delta _ T, and the delta _ T is the equivalent residence time compensation value.
Further, in order to iterate a more accurate optimal equivalent residence time compensation value, the method further includes the following iteration process:
s111, predicting the optimal decision level of the target storage unit according to Tmin, Tmed and Tmax, and respectively calculating bit error rates Emin, Emed and Emax when data reading is carried out by adopting the optimal decision levels corresponding to Tmin, Tmed and Tmax;
s112, judging whether the difference value of Tmax and Tmin is larger than a preset second threshold value or not;
s113, when the difference value of Tmax and Tmin is larger than a preset second threshold value, adopting the following formula to calculate alternative values Ttmp1 and Ttmp2 of Tmin and Tmax;
Ttmp1 = (Tmin+Tmed)/2;
Ttmp2 = (Tmax+Tmed)/2;
s114, predicting the optimal decision level of the target storage unit according to the Ttmp1 and the Ttmp2, and respectively calculating bit error rates Etmp1 and Etmp2 when data are read by adopting the optimal decision levels corresponding to the Ttmp1 and the Ttmp 2;
s115, when Emed < min (Etmp1, Etmp2), updating Tmin = Ttmp1 and Tmax = Ttmp2 to obtain an updated initial correction value set, wherein min (a, b) represents that the smaller value of a and b is taken, and the steps S111-S115 are repeatedly executed on the updated initial correction value set until the difference value between Tmax and Tmin in the updated initial correction value set is smaller than or equal to a preset second threshold value.
S115 ', when Etmp1< min (Emed, Etmp2), updating Tmin = Ttmp1 and Tmax = Ttmp2 to obtain an updated initial correction value set, and repeatedly executing the steps S111-S115' on the updated initial correction value set until the difference value between Tmax and Tmin in the updated initial correction value set is smaller than or equal to a preset second threshold value.
S115 'when Etmp2< min (Emed, Etmp1), updating Tmin = Tmed and Tmed = Ttmp2 to obtain an updated initial correction value set, and repeatedly executing the steps S111-S115' on the updated initial correction value set until the difference value between Tmax and Tmin in the updated initial correction value set is smaller than or equal to a preset second threshold value.
In another specific example, the method for correcting the equivalent residence time compensation value by using a preset correction strategy to obtain a correction value set of the equivalent residence time compensation value specifically includes the following steps:
correcting the equivalent residence time compensation value according to a preset equivalent residence time compensation value correction table;
and correcting the equivalent residence time compensation value according to each equivalent time compensation percentage to obtain a corresponding correction value set, wherein the specific formula is as follows:
correction value = delta _ T (1 + k);
wherein delta _ T is the equivalent dwell time compensation value and k is the equivalent time compensation percentage.
Further, the equivalent dwell time compensation value correction table includes a value 0 and a plurality of preset equivalent time compensation percentages distributed at equal intervals on both sides of the value 0.
After the first memory obtains the equivalent time compensation value of the fault time which is collected by the aid of other memories in the same attribute group, the equivalent time compensation value is further verified and corrected in the dichotomy mode or the mode of presetting the compensation table to obtain more accurate equivalent time compensation.
For simplicity of explanation, the method embodiments are described as a series of acts or combinations, but those skilled in the art will appreciate that the embodiments are not limited by the order of acts described, as some steps may occur in other orders or concurrently with other steps in accordance with the embodiments of the invention. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred and that no particular act is required to implement the invention.
Fig. 4 schematically shows a schematic structural diagram of an equivalent residence time recovery apparatus according to an embodiment of the present invention. Referring to fig. 4, the apparatus for recovering equivalent residence time in the embodiment of the present invention specifically includes a grouping module 401, a determining module 402, a sending module 403, and an obtaining module 404, where:
a grouping module 401, configured to group the memories connected to the current Host;
a determining module 402, configured to determine, when a failure occurs in the first storage, whether a failure category of the first storage belongs to a preset first failure category set, where the first failure category set includes a failure category that requires the Host to record an equivalent residence time compensation value of the first storage;
a sending module 403, configured to send equivalent residence time request information to a second memory in a group to which a first memory belongs when the fault category belongs to the first fault category set, so as to request the second memory to calculate and record an equivalent residence time compensation value from a current time;
an obtaining module 404, configured to obtain an equivalent residence time compensation value recorded by the second memory and send the equivalent residence time compensation value to the first memory when the first memory recovers to work, so that the first memory updates the equivalent residence time of the storage unit in the memory according to the equivalent residence time compensation value.
In this embodiment of the present invention, the apparatus further includes a receiving module, not shown in the drawings, where the receiving module is configured to receive capability information reported when the first memory is online, and the capability information includes physical characteristic parameters and/or usage parameters of the memory. The physical characteristic parameters comprise the manufacturer and/or the model of the memory; the use parameters comprise the physical position of the memory, the slot position of the case where the memory is located, the equivalent temperature of the memory and/or the temperature fluctuation of the memory in the historical use time of the preset duration.
Further, the grouping module 401 is configured to group the memories connected to the current Host according to the physical characteristic parameters and/or the usage parameters of the memories.
In this embodiment, the capability information further includes an identification information ID of the first storage and a fault category list. Further, the apparatus further includes a configuration module, not shown in the figure, configured to generate a first failure category set of the first storage according to the identification information ID and the failure category list.
In the embodiment of the invention, the capability information further comprises equivalent temperature information of the first memory.
Further, the sending module 403 is further configured to send the equivalent temperature information of the first memory to the second memory when the equivalent temperature information of the second memory is different from that of the first memory, so that the second memory calculates an equivalent residence time compensation value according to the equivalent temperature information of the first memory.
For the device embodiment, since it is basically similar to the method embodiment, the description is simple, and for the relevant points, refer to the partial description of the method embodiment.
Furthermore, an embodiment of the present invention also provides a computer-readable storage medium, on which a computer program is stored, which, when executed by a processor, implements the steps of the recovery method as equivalent residence time.
In this embodiment, the method for recovering equivalent residence time may be stored in a computer-readable storage medium if it is implemented in the form of a software functional unit and sold or used as an independent product. Based on such understanding, all or part of the flow of the method according to the embodiments of the present invention may also be implemented by a computer program, which may be stored in a computer-readable storage medium, and when the computer program is executed by a processor, the steps of the method embodiments may be implemented. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, usb disk, removable hard disk, magnetic disk, optical disk, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), electrical carrier wave signals, telecommunications signals, software distribution medium, and the like. It should be noted that the computer readable medium may contain content that is subject to appropriate increase or decrease as required by legislation and patent practice in jurisdictions, for example, in some jurisdictions, computer readable media does not include electrical carrier signals and telecommunications signals as is required by legislation and patent practice.
Furthermore, an electronic device is provided in an embodiment of the present invention, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the steps of the method for recovering the equivalent residence time when executing the computer program. Such as steps S11-S14 shown in FIG. 2. Alternatively, the processor, when executing the computer program, implements the functions of each module/unit in the above-mentioned recovery apparatus embodiment of equivalent residence time, for example, the grouping module 401, the determining module 402, the sending module 403, and the obtaining module 404 shown in fig. 4.
In a particular embodiment, the electronic device may be a Host in a storage system.
The method, the device, the storage medium and the electronic equipment for recovering the equivalent residence time can accurately compensate and recover the equivalent residence time of the storage unit in the fault period of the memory, further accurately predict a decision level, and reduce the original bit error rate (RBER) while improving the reading speed of the memory.
Furthermore, those skilled in the art will appreciate that while some embodiments herein include some features included in other embodiments, rather than other features, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, any of the claimed embodiments may be used in any combination.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.

Claims (10)

1. A method for recovering equivalent residence time, the method comprising:
grouping the memories connected with the current Host;
when the first storage is in fault, judging whether the fault category of the first storage belongs to a preset first fault category set, wherein the first fault category set comprises the fault category of an equivalent residence time compensation value of the first storage needing to be recorded by a Host;
if the fault type belongs to the first fault type set, sending equivalent residence time request information to a second memory in a group to which a first memory belongs so as to request the second memory to calculate and record an equivalent residence time compensation value from the current moment;
and when the first memory recovers work, acquiring the equivalent residence time compensation value recorded by the second memory and sending the equivalent residence time compensation value to the first memory so that the first memory can update the equivalent residence time of the storage unit in the memory according to the equivalent residence time compensation value.
2. The method of claim 1, further comprising:
receiving capability information reported when the first memory is online, wherein the capability information comprises physical characteristic parameters and/or use parameters of the memory;
the grouping of the memories connected with the current Host comprises the following steps:
and grouping the various memories connected with the current Host according to the physical characteristic parameters and/or the use parameters of the memories.
3. The method of claim 2, wherein the physical characteristic parameters include a manufacturer and/or model of the memory;
the use parameters comprise the physical position of the memory, the slot position of the case where the memory is located, the equivalent temperature of the memory and/or the temperature fluctuation of the memory in the historical use time of the preset duration.
4. The method of claim 2, wherein the capability information further comprises identification information ID of the first memory and a failure category list;
and generating a first fault category set of the first memory according to the identity identification information ID and the fault category list.
5. The method of claim 2, wherein the capability information further comprises equivalent temperature information of the first memory;
when the equivalent temperature information of the second memory is different from the equivalent temperature information of the first memory, the method further comprises sending the equivalent temperature information of the first memory to the second memory for the second memory to calculate an equivalent residence time compensation value according to the equivalent temperature information of the first memory.
6. An apparatus for recovering equivalent dwell time, the apparatus comprising:
the grouping module is used for grouping the memories connected with the current Host;
the judging module is used for judging whether the fault category of the first storage belongs to a preset first fault category set when the first storage has a fault, wherein the first fault category set comprises the fault category of an equivalent residence time compensation value of the first storage which needs to be recorded by a Host computer;
a sending module, configured to send equivalent residence time request information to a second memory in a group to which a first memory belongs when the fault category belongs to the first fault category set, so as to request the second memory to calculate and record an equivalent residence time compensation value from a current time;
and the acquisition module is used for acquiring the equivalent residence time compensation value recorded by the second memory and sending the equivalent residence time compensation value to the first memory when the first memory recovers work, so that the first memory can update the equivalent residence time of the storage unit in the memory according to the equivalent residence time compensation value.
7. The apparatus of claim 6, further comprising:
the receiving module is used for receiving the capacity information reported when the first memory is online, and the capacity information comprises physical characteristic parameters and/or use parameters of the memory;
and the grouping module is used for grouping the memories connected with the current Host according to the physical characteristic parameters and/or the use parameters of the memories.
8. The apparatus of claim 7, wherein the capability information further comprises an identification information ID of the first memory and a failure category list;
the device further comprises: and the configuration module is used for generating a first fault category set of the first memory according to the identity identification information ID and the fault category list.
9. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 5.
10. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the method according to any of claims 1-5 when executing the computer program.
CN202210732170.3A 2022-06-27 2022-06-27 Equivalent residence time recovery method and device, storage medium and electronic equipment Active CN114816834B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210732170.3A CN114816834B (en) 2022-06-27 2022-06-27 Equivalent residence time recovery method and device, storage medium and electronic equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210732170.3A CN114816834B (en) 2022-06-27 2022-06-27 Equivalent residence time recovery method and device, storage medium and electronic equipment

Publications (2)

Publication Number Publication Date
CN114816834A true CN114816834A (en) 2022-07-29
CN114816834B CN114816834B (en) 2022-09-02

Family

ID=82520811

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210732170.3A Active CN114816834B (en) 2022-06-27 2022-06-27 Equivalent residence time recovery method and device, storage medium and electronic equipment

Country Status (1)

Country Link
CN (1) CN114816834B (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6205065B1 (en) * 1999-01-26 2001-03-20 Nec Corporation Semiconductor memory device having redundancy memory circuit
US9612896B1 (en) * 2015-08-24 2017-04-04 EMC IP Holding Company LLC Prediction of disk failure
CN109582224A (en) * 2018-11-12 2019-04-05 哈尔滨工业大学 A kind of NAND Flash memory reliability optimization method based on self- recoverage effect
CN111736765A (en) * 2020-05-28 2020-10-02 苏州浪潮智能科技有限公司 A method, device and medium for monitoring data block status
CN114118439A (en) * 2021-11-09 2022-03-01 北京得瑞领新科技有限公司 Training data generation method, system and storage medium of decision level prediction model

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6205065B1 (en) * 1999-01-26 2001-03-20 Nec Corporation Semiconductor memory device having redundancy memory circuit
US9612896B1 (en) * 2015-08-24 2017-04-04 EMC IP Holding Company LLC Prediction of disk failure
CN109582224A (en) * 2018-11-12 2019-04-05 哈尔滨工业大学 A kind of NAND Flash memory reliability optimization method based on self- recoverage effect
CN111736765A (en) * 2020-05-28 2020-10-02 苏州浪潮智能科技有限公司 A method, device and medium for monitoring data block status
CN114118439A (en) * 2021-11-09 2022-03-01 北京得瑞领新科技有限公司 Training data generation method, system and storage medium of decision level prediction model

Also Published As

Publication number Publication date
CN114816834B (en) 2022-09-02

Similar Documents

Publication Publication Date Title
JP5629391B2 (en) Semiconductor memory device and method for controlling semiconductor memory device
US9135112B2 (en) Policy for read operations addressing on-the-fly decoding failure in non-volatile memory
US8560922B2 (en) Bad block management for flash memory
US9799405B1 (en) Nonvolatile memory system with read circuit for performing reads using threshold voltage shift read instruction
US20220044737A1 (en) Coarse Calibration based on Signal and Noise Characteristics of Memory Cells Collected in Prior Calibration Operations
JP2022508320A (en) Hard disk failure prediction method, device and storage medium
US11107543B2 (en) Adjustment of read and write voltages using a space between threshold voltage distributions
CN102682841A (en) Using temperature sensors with a memory device
CN112908399B (en) Flash memory abnormality detection method and device, computer equipment and storage medium
CN114118439B (en) Training data generation method, system and storage medium of decision level prediction model
US20190189239A1 (en) Flash memory module, storage system, and method of controlling flash memory
CN108829358B (en) Bad block management method of solid-state hard disk and solid-state hard disk
WO2020053743A1 (en) Pool-level storage management
US12073899B2 (en) Track charge loss based on signal and noise characteristics of memory cells collected in calibration operations
CN109658975A (en) A kind of active data restorative procedure and system towards correcting and eleting codes
CN114816836B (en) Recovery method and device of equivalent residence time, storage medium and electronic equipment
CN108564981B (en) Dynamic monitoring method for data security of storage device
KR20170101367A (en) Data storage device and operating method thereof
CN114816834B (en) Equivalent residence time recovery method and device, storage medium and electronic equipment
US12373111B2 (en) Monitoring memory device health according to data storage metrics
CN114816835B (en) Recovery method and device of equivalent residence time, storage medium and electronic equipment
US20110271052A1 (en) Raid system including semiconductor storage unit and control method of the same
CN111767165B (en) Data processing method, device and control equipment
US12260305B2 (en) Battery learn cycle management
TWI692691B (en) Memory control device and memory control method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant