CN114864598B - Display panel and mobile terminal - Google Patents
Display panel and mobile terminalInfo
- Publication number
- CN114864598B CN114864598B CN202210378376.0A CN202210378376A CN114864598B CN 114864598 B CN114864598 B CN 114864598B CN 202210378376 A CN202210378376 A CN 202210378376A CN 114864598 B CN114864598 B CN 114864598B
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- test
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- control switch
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/441—Interconnections, e.g. scanning lines
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Automation & Control Theory (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
本申请实施例公开了一种显示面板及移动终端，显示面板包括基板、驱动电路、多个测试端子、多条测试走线、控制端子组以及保护功能层，其中，驱动电路设置于所述基板上，且包括多个绑定端子和多条信号走线，一绑定端子连接有一信号走线；一测试端子通过一测试走线与信号走线连接，测试走线上至少连接有一控制开关；控制端子组的控制端子与控制开关的控制端连接；保护功能层设置于基板、驱动电路和测试走线上，且覆盖驱动电路和控制开关。
An embodiment of the present application discloses a display panel and a mobile terminal, wherein the display panel includes a substrate, a driving circuit, multiple test terminals, multiple test traces, a control terminal group, and a protective function layer, wherein the driving circuit is arranged on the substrate and includes multiple binding terminals and multiple signal traces, a binding terminal is connected to a signal trace; a test terminal is connected to the signal trace through a test trace, and at least one control switch is connected to the test trace; the control terminal of the control terminal group is connected to the control end of the control switch; the protective function layer is arranged on the substrate, the driving circuit, and the test trace, and covers the driving circuit and the control switch.
Description
Technical Field
The application relates to the technical field of display, in particular to a display panel and a mobile terminal.
Background
The display panel comprises a thin film transistor array, metal wires connected with the thin film transistors and a binding structure arranged on one side of the thin film transistor array, wherein the binding structure comprises an array test circuit for electrically testing the thin film transistor array;
The array test circuit is located in the test circuit area, metal wires in the test circuit area are often partially exposed, the traditional packaging adhesive cannot be covered or is not completely covered, and under the high-temperature high-humidity reliability test environment, wire corrosion is easily caused, so that the normal use of the display panel is affected.
Disclosure of Invention
The embodiment of the application provides a display panel and a mobile terminal, which can effectively avoid the technical problem that signal wires cannot be covered or are not completely covered in a test circuit area due to traditional packaging glue, so that the signal wires are corroded under test conditions, and the normal use of the display panel is affected.
An embodiment of the present application provides a display panel including:
a substrate;
the driving circuit is arranged on the substrate and comprises a plurality of binding terminals and a plurality of signal wires, and one binding terminal is connected with one signal wire;
a plurality of test terminals disposed on the substrate;
the test terminal is connected with the signal wire through one test wire, and the test wire is at least connected with a control switch;
The control terminal group is arranged on the substrate and connected with the control end of each control switch;
The protection function layer is arranged on the substrate, the driving circuit and the test wiring and covers the driving circuit and the control switch.
Optionally, the control switch comprises a thin film transistor;
the first connecting end of the thin film transistor is connected with the signal wiring through the test wiring, the second connecting end of the thin film transistor is connected with the test terminal through the test wiring, and the control end of the thin film transistor is connected with the control terminal group.
Optionally, the control terminal group includes a control terminal, and a control end of each control switch is connected with the control terminal.
Optionally, the plurality of test wires include at least two first test wires and at least one second test wire, one end of the first test wire is connected with one signal wire, the other end of the first test wire is connected with one test terminal, one end of the second test wire is connected with one test terminal, and the other end of the second test wire includes a first branch and a second branch which are connected with different signal wires;
the plurality of control switches comprise a first control switch arranged on the first test wiring, a second control switch arranged on the first branch and a third control switch arranged on the second branch, the control terminal group comprises a first control terminal, a second control terminal and a third control terminal, the control end of each first control switch is connected with the first control terminal, the control end of each second control switch is connected with the second control terminal, and the control end of the third control switch is connected with the third control terminal.
Optionally, the number of the test terminals is the same as the number of the signal wires, one test terminal is correspondingly connected with one signal wire through one test wire, and one test wire is provided with one control switch.
Optionally, the control switch comprises one of a low-temperature polysilicon thin film transistor, a metal oxide thin film transistor and an amorphous silicon thin film transistor.
Optionally, one of the test traces includes a first section and a second section connected to each other, the first section and the second section are both located between the control switch and the test terminal, and in a direction perpendicular to the substrate, a width of the first section is smaller than a width of the second section.
Optionally, in a direction perpendicular to the substrate, a difference between the width of the first section and the width of the second section ranges from 25um to 95um.
Optionally, in a direction perpendicular to the substrate, a width of the first segment is greater than or equal to 5um.
The application also provides a mobile terminal comprising the display panel and the terminal main body, wherein the display panel and the terminal main body are combined into a whole.
The invention has the advantages that the control switch and the test wiring are arranged, the test wiring is adopted to lead out the signal wiring, the test wiring is at least connected with one control switch, the control terminal group is connected with the control end of the control switch, the control switch isolates the normal signal wiring from the test terminal, the protection functional layer covers the driving circuit, the control switch and part of the test wiring, the state of the control switch is changed by inputting the control signal through the control terminal group to carry out factory detection on the driving circuit of the display panel, the problem that the existing signal wiring directly passes through the area where the test terminal is located, the signal wiring is not covered or is not completely covered by the packaging glue, the signal wiring is exposed, the signal wiring is easy to corrode under the reliability test environment of high temperature and high humidity, the problem of normal signal wiring breakage is caused, and the factory yield of the display panel is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a prior art driving circuit connection test terminal;
fig. 2 is a schematic diagram of a wiring structure of a driving circuit near a binding end according to an embodiment of the present application;
FIG. 3 is a schematic diagram of a wiring structure of another driving circuit near a binding end according to an embodiment of the present application;
FIG. 4 is a schematic diagram of a wiring structure of another driving circuit near a binding end according to an embodiment of the present application;
Fig. 5 is a schematic structural diagram of a display panel according to an embodiment of the present application;
Fig. 6 is a schematic structural diagram of a test trace between control switch connection test terminals according to an embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to fall within the scope of the application.
The embodiment of the application provides a display panel and a mobile terminal. The following will describe in detail. The following description of the embodiments is not intended to limit the preferred embodiments. In addition, in the description of the present application, the term "comprising" means "including but not limited to". The terms first, second, third and the like are used merely as labels, and do not impose numerical requirements or on the order of construction. Various embodiments of the application may exist in a range format, it being understood that the description in a range format is merely for convenience and brevity and should not be interpreted as a hard limitation on the scope of the application, as the range format described above specifically disclosing all possible sub-ranges and individual values within the range. For example, it should be considered that a description of a range from 1 to 6 has specifically disclosed sub-ranges, such as from 1 to 3, from 1 to 4, from 1 to 5, from 2 to 4, from 2 to 6, from 3 to 6, etc., as well as single numbers within the ranges, such as 1,2, 3, 4, 5, and 6, wherever applicable. In addition, whenever a numerical range is referred to herein, it is meant to include any reference number (fractional or integer) within the indicated range.
As shown in fig. 1, in the conventional array substrate 50, the signal trace 101 is connected to the binding terminal 40 after passing through the test circuit area, and the signal trace 101 in the test circuit area is often partially exposed, which is not covered or is not completely covered by the conventional packaging adhesive, so that the signal trace 101 is easily corroded under the high-temperature and high-humidity reliability test environment, and the signal trace 101 is disconnected, thereby affecting the normal use of the driving circuit 10.
In order to solve the above technical problems, the present application provides the following technical solutions, and refer to the following embodiments.
The present embodiment provides a display panel, specifically referring to fig. 2 to 6, including:
a substrate 50;
The driving circuit 10 is disposed on the substrate 50 and includes a plurality of bonding terminals 40 and a plurality of signal wires 101, wherein one of the bonding terminals 40 is connected with one of the signal wires 101;
a plurality of test terminals 30 disposed on the substrate 50;
A plurality of test wires 201, wherein one test terminal 30 is connected with the signal wire 101 through one test wire 201, and at least one control switch 202 is connected to the test wire 201;
a control terminal group 301 disposed on the substrate 50 and connected to the control terminal T3 of each control switch 202;
The protection functional layer M1 is disposed on the substrate 50, the driving circuit 10 and the test trace 201, and covers the driving circuit 10 and the control switch 202.
It should be noted that, as shown in fig. 5, the display panel includes a display area AA, a non-display area VA surrounding the display area AA, the non-display area VA includes a binding area A2 and a test area A1, a plurality of binding terminals 40 are located in the binding area A2, and a plurality of test terminals 30 are located in the test area A1;
A grid driving circuit 10 is arranged in a non-display area VA at one side of the display area AA, and pixel units PX arranged in an array manner are arranged in the display area AA, and each pixel unit PX is electrically connected with a corresponding sub-driving circuit 10;
the gate driving circuit 10 and each sub driving circuit 10 constitute the driving circuit 10, the gate driving circuit 10 is connected to the sub driving circuits 10 of each pixel unit PX through a plurality of signal traces 101 in the row direction, each sub driving circuit 10 is also connected to a plurality of signal traces 101 in the column direction, and the pixel unit PX can be driven to emit light by inputting a corresponding signal to each signal trace 101 in the driving circuit 10.
Specifically, as shown in fig. 2 and 5, the plurality of signal traces 101 of the driving circuit 10 extend from the display area AA toward the binding area A2, the ends of the signal traces 101 are connected to the corresponding binding terminals 40, the plurality of test traces 201 are connected to the plurality of signal traces 101 to be detected, the signal traces 101 are led out and connected to the corresponding test terminals 30 in the test area A1, and at least one control switch 202 (not shown in fig. 5) is connected to the test traces 201.
Specifically, the configuration may be performed according to different signals transmitted on the signal traces 101, for example, when the same signal is transmitted on the plurality of signal traces 101, the plurality of signal traces 101 are connected to one test terminal 30 through the test trace 201, and the plurality of signal traces 101 transmitting different signals are respectively connected to the corresponding test terminals 30.
Specifically, the test terminal 30 is used for connecting an external detection circuit or detection device, so as to input a corresponding test signal to the display panel in a test stage, lighten the display panel for testing, and bind the driving chip to the binding terminal 40 when the test is finished and the test result accords with the binding standard, thereby inputting a display signal to the display panel by the driving chip for image display.
Specifically, the control switch 202 includes a control terminal T3, an input terminal and an output terminal, where the control terminal T3 controls the signal of the input terminal to be transmitted to the output terminal, the input terminal is connected to the test terminal 30, and the output terminal is connected to the signal trace 101.
The control terminal 3011 of the control terminal set is connected to the control terminal T3 of the control switch 202 through the control trace 203, and the signal input by the control terminal T3 of the control switch 202 can be turned on only when the voltage difference generated between the signal input by the control terminal T3 and the signal input by the input terminal is greater than the threshold voltage, so that the potential of the test signal input by the test terminal 30 connected to the input terminal of the control switch 202 is different from the potential of the power signal input by the control terminal 3011 connected to the control terminal T3 of the control switch 202.
Specifically, the control terminal group 301 includes at least one control terminal 3011, and the control terminal 3011 may be externally connected to a power source to provide power signals of different potentials.
Specifically, a protective functional layer M1 is disposed on the substrate 50 and the driving circuit 10, the protective functional layer M1 may be a packaging adhesive layer, the packaging adhesive layer may be a UV adhesive, and the driving circuit 10 is packaged by disposing the protective functional layer M1, so that water molecules or oxygen in the testing process can be prevented from corroding the exposed signal trace 101.
Specifically, the protection functional layer M1 may cover the driving circuit 10, the signal trace 101, the control switch 202, and a portion of the test trace 201, where the test terminal 30 and the control terminal set 301 are exposed and not packaged.
Specifically, in the embodiment of the present invention, a plurality of test traces 201 may be disposed on the substrate 50 in the non-display area VA, and by reasonably laying out the test traces 201, the signal traces 101 are led out and connected with the test terminals 30 in the test circuit area, where the protection function layer M1 is not disposed.
Specifically, the test wires 201 are connected with control switches 202, the number of the control switches 202 may be the same as the number of the signal wires 101, and the control switches 202 are used to space the signal wires 101 from the test terminals 30.
It should be noted that, the control switch 202 is configured to respond to a signal input to the signal line from the test terminal 30 (i.e., a test signal generated by an external test circuit or a test device) in a test stage, transmit the test signal input from the test terminal 30 to the signal trace 101, and cut off a signal on the test trace 201 (i.e., a test signal generated by an external test circuit or a test device) in a display stage, and transmit the signal to the signal input terminal of the test circuit.
The signal input by the control terminal T3 of the control switch 202 is controlled by the signal input by the test terminal 30, and the test terminal 30 will only have signal input when the external detection circuit or the detection device is connected to perform the lighting test on the display panel, so the control switch 202 is in the on state only during the test stage, and the test signal can be transmitted from the test terminal 30 to the corresponding signal trace 101 through the control switch 202.
When the test phase is finished, no signal is input to the test terminal 30, and at this time, the control end T3 of the control switch 202 is in a suspended state (the control switch 202 is turned off), and at this time, even if a signal transmitted on the test wire 201 (between the signal wire 101 and the control switch 202) cannot be transmitted to the test terminal 30 through the control switch 202, so that the test terminal 30 is not electrified, so that electrochemical reaction is not generated, and the situation that the test terminal 30 is electrified and corroded is avoided.
It can be understood that, by setting the control switch 202 and the test trace 201, the test trace 201 is used to lead out the signal trace 101, and the test trace 201 is connected with the control switch 202, and the test trace 201 is at least connected with a control switch 202, the control terminal group 301 is connected with the control end T3 of the control switch 202, the control switch 202 isolates the normal signal trace 101 from the test terminal 30, the protection functional layer M1 covers the driving circuit 10, the control switch 202 and part of the test trace 201, and the control terminal group 301 inputs the control signal to change the state of the control switch 202 to perform factory detection on the driving circuit 10 of the display panel, so that the problem that the existing signal trace 101 directly passes through the area where the test terminal 30 is located, the signal trace 101 cannot be covered or is not completely covered due to encapsulation glue, the signal trace 101 is exposed, corrosion of the signal trace 101 is easy to occur under the high-temperature and high-humidity reliability test environment, and the factory yield of the display panel is improved.
In one embodiment, the control switch 202 comprises a thin film transistor, a test wire 201 and the thin film transistor, wherein a first connection terminal T1 of the thin film transistor is connected to the signal wire 101 through the test wire 201, a second connection terminal T2 of the thin film transistor is connected to the test terminal 30 through the test wire 201, and a control terminal T3 of the thin film transistor is connected to the control terminal set 301.
Specifically, the thin film transistor is one of a low-temperature polysilicon thin film transistor, a metal oxide thin film transistor and an amorphous silicon thin film transistor, and can be specifically selected according to actual production requirements.
Specifically, the control terminal T3 of the thin film transistor is connected to the control terminal 3011 of the control terminal group 301, and the control terminals T3 of a plurality of thin film transistors may be connected to one control terminal 3011, or the control terminals T3 of a plurality of thin film transistors may be connected to different control terminals 3011.
For example, when the display panel is an OLED display panel, the power signal input to the control terminal 3011 of the control terminal group 301 may be VGH signal or VSS signal, and in addition to the VGH signal or VSS signal, the control terminal 3011 may also be used to transmit other power signals, and when the display panel is a liquid crystal display panel or other types of display panels, the control terminal 3011 of the control terminal group 301 may also be used to transmit power signals required in the corresponding panels.
Specifically, the thin film transistor can be a thin film transistor with high potential on and low potential off, or can be a thin film transistor with low potential on and high potential off, and can be specifically adjusted according to the actual test requirement.
In one embodiment, as shown in fig. 2, the control terminal set 301 includes a control terminal 3011, and the control terminal 3011 is connected to a control terminal T3 of each of the control switches 202.
Specifically, in the present embodiment, the plurality of signal wirings 101 may include integrated gate driving wirings, data signal lines, scan lines, and the like.
It can be understood that the control terminals T3 of the plurality of control switches 202 are connected to a control terminal 3011 through the control wires 203, so that the test circuit can be synchronously turned on or off, the circuit structure can be simplified, and the space utilization of the display panel can be improved.
In an embodiment, as shown in fig. 3, the plurality of test traces 201 includes at least two first test traces 2020 and at least one second test trace 2030, one end of the first test trace 2020 is connected to the signal trace 101, the other end of the first test trace 2020 is connected to the test terminal 30, one end of the second test trace 2030 is connected to the test terminal 30, and the other end of the second test trace 2030 includes a first branch 2031 and a second branch 2032 connected to different signal traces 101;
As shown in fig. 3, the plurality of control switches 202 includes a first control switch 202F1 disposed on the first test trace 2020, a second control switch 202F2 disposed on the first branch 2031, and a third control switch 202F3 disposed on the second branch 2032, the control terminal group 301 includes a first control terminal, a second control terminal, and a third control terminal, a control end of each of the first control switches 202F1 is connected to the first control terminal, a control end of the second control switch 202F2 is connected to the second control terminal, and a control end of the third control switch 202F3 is connected to the third control terminal.
Specifically, as shown in fig. 3, the two signal wires 101 may be connected to a test terminal 30 through a second test wire 2030, the second test wire 2030 includes a first branch 2031 and a second branch 2032, the first branch 2031 is provided with a second control switch 202F2, the second branch 2032 is provided with a third control switch 202F3, the second control switch 202F2 and the third control switch 202F3 may be turned on at the same time or may not be turned on at the same time, the power signal potentials connected to the second control terminal and the third control terminal may be the same or may be different, specifically may be adjusted according to the actual test situation, in the OLED display panel, the second control terminal 3011 may be connected to an STV signal, the third control terminal may be connected to an RST signal, both the STV signal and the RST signal are signals with high voltage and low voltage switched in a time, the high voltage of the STV signal is in the first frame, and the high voltage of the STV signal is in the last frame, so that the second control switch and the third control switch are turned on at different time periods, thereby simplifying the corresponding circuit structure is achieved.
Specifically, as shown in fig. 4, three signal wires 101 may be connected to a test terminal 30 through a test wire 201, the test wire 201 has three branches, each of which is connected to three signal wires 101, each of the three branches is connected to a control switch 202, and in a specific OLED display panel, control terminals T3 of the three control switches 202 are connected to VGH signals, STV signals and RST signals, respectively.
It can be appreciated that by this arrangement, the circuit structure of the test area A1 can be simplified, and the space utilization of the display panel can be improved.
In an embodiment, as shown in fig. 2, the number of the test terminals 30 is the same as the number of the signal traces 101, one of the test terminals 30 is correspondingly connected to one of the signal traces 101 through one of the test traces 201, and one of the test traces 201 is provided with one of the control switches 202.
It can be appreciated that the number of the test terminals 30 is the same as the number of the signal traces 101, so that the test lines of each signal trace 101 are relatively independent, and the difficulty in removing the fault cause after the fault of the driving circuit 10 is reduced.
In an embodiment, as shown in fig. 6, one of the test traces 201 includes a first section D1 and a second section D2 connected, and the first section D1 and the second section D2 are located between the control switch 202 and the test terminal 30, and in a direction perpendicular to the substrate 50, a width of the first section D1 is smaller than a width of the second section D2.
Specifically, the width of the test trace 201 may be the same as the width of the second section D2, a width-section difference is provided between the first section D1 and the second section D2, the test trace having the first section D1 and the second section D2 is used for connecting the control switch 202 and the test terminal 30, a difference range between the width of the first section D1 and the width of the second section D2 is 25 um-95 um, and the difference range includes an endpoint value, and the difference range may be specifically any one of 25um, 32um, 38um, 40um, 55um, 72um and 95um, and may be specifically adjusted according to an actual production condition.
Specifically, the width of the second segment D2 ranges from 30um to 100um, including the end point value.
Specifically, the arrangement between the control switch 202 and the test terminal 30 is implemented by itself to have a step difference structure, so that the test wire 201 between the test terminal 30 and the control switch 202 is easier to be directly disconnected at the position of the first section D1 after corrosion, and the influence of corrosion of the test wire 201 connected with the test terminal 30 on the control switch 202 is reduced.
It can be appreciated that, since the product is qualified to bind the driving chip after the display panel is tested, and then leaves the factory, whether the test terminal 30 is communicated with the control switch 202 after the test does not affect the normal use of the display panel, therefore, the test trace 201 between the control switch 202 and the test terminal 30 includes a first section D1 and a second section D2, the test trace 201 is easy to corrode and break in the first section D1, the influence of the corrosion of the subsequent test trace 201 on the control switch 202 is reduced, and the normal signal trace 101 is further prevented from being corroded.
In an embodiment, in a direction perpendicular to the substrate 50, a difference between the width of the first section D1 and the width of the second section D2 ranges from 25um to 95um.
Specifically, the width of the first segment D1 and the width of the second segment D2 may be any one of 25um, 32um, 38um, 40um, 55um, 72um, 95 um.
In one embodiment, the width of the first segment D1 is greater than or equal to 5um in a direction perpendicular to the substrate 50.
It can be appreciated that, by setting the width of the first section D1 to be greater than or equal to 5um, the test wire 201 can be broken in time when the test wire 201 is corroded after the display panel is tested while signals are normally transmitted, so that the influence of corrosion of the subsequent test wire 201 on the control switch 202 is reduced, and further, the normal signal wire 101 is prevented from being corroded.
The application also provides a mobile terminal comprising the display panel and the terminal main body, wherein the display panel and the terminal main body are combined into a whole.
In summary, the control switch 202 and the test wire 201 are provided, the test wire 201 is adopted to lead out the signal wire 101, at least one control switch 202 is connected to the test wire 201, the control terminal set 301 is connected to the control end T3 of the control switch 202, the control switch 202 isolates the normal signal wire 101 from the test terminal 30, the protection functional layer M1 covers the driving circuit 10, the control switch 202 and part of the test wire 201, the state of the control switch 202 is changed by inputting a control signal through the control terminal set 301 to perform factory detection on the driving circuit 10 of the display panel, the problem that the signal wire 101 cannot be covered or is not completely covered due to encapsulation glue in the existing signal wire 101 directly passing through the area where the test terminal 30 is located, the signal wire 101 is exposed, the signal wire 101 is easy to corrode in a high-temperature and high-humidity reliability test environment, and the problem of normal signal wire 101 wire breakage is caused, and the factory yield of the display panel is improved.
The foregoing describes a display panel and a mobile terminal provided by embodiments of the present application in detail, and specific examples are used herein to describe the principles and embodiments of the present application, and the above description of the embodiments is only for aiding in understanding the method and core concept of the present application, and meanwhile, for those skilled in the art, according to the concept of the present application, there are variations in the specific embodiments and application ranges, so that the disclosure should not be interpreted as limiting the present application.
Claims (9)
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210378376.0A CN114864598B (en) | 2022-04-12 | 2022-04-12 | Display panel and mobile terminal |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210378376.0A CN114864598B (en) | 2022-04-12 | 2022-04-12 | Display panel and mobile terminal |
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| CN114864598A CN114864598A (en) | 2022-08-05 |
| CN114864598B true CN114864598B (en) | 2025-10-03 |
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| CN110599936A (en) * | 2019-10-31 | 2019-12-20 | 厦门天马微电子有限公司 | Display panel, display detection method thereof and display device |
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| KR101326246B1 (en) * | 2006-12-12 | 2013-11-11 | 삼성디스플레이 주식회사 | Display device |
| CN203300197U (en) * | 2013-06-08 | 2013-11-20 | 北京京东方光电科技有限公司 | Wiring structure of substrate and display device |
| CN109448618B (en) * | 2018-12-25 | 2022-03-25 | 武汉天马微电子有限公司 | A display panel, a display device and a driving method of the display device |
| CN211044987U (en) * | 2019-12-12 | 2020-07-17 | 京东方科技集团股份有限公司 | Display panel and display device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110599936A (en) * | 2019-10-31 | 2019-12-20 | 厦门天马微电子有限公司 | Display panel, display detection method thereof and display device |
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