CN114910711B - Uncertainty analysis method and device for test grid introduction in OTA test - Google Patents

Abstract

The present invention discloses a method and device for analyzing uncertainty introduced by a test grid in an OTA test, the method comprising: setting a test grid layout; under the grid layout, simulating a wireless communication device to be tested with a standard dipole antenna, randomly rotating the standard dipole antenna with the test system coordinate origin as the center, and obtaining the TRP value of the standard dipole antenna under each random rotation; statistically analyzing the TRP values obtained by multiple random rotations, and using the obtained statistical distribution parameter values as the measurement uncertainty values introduced by the grid layout; judging whether the uncertainty value is within a preset limit value range, if so, determining that the current grid layout meets the OTA performance test requirements of the wireless communication device; otherwise, not meeting the OTA performance test requirements of the wireless communication device. The present invention can improve the accuracy of the relevant uncertainty analysis, as well as the applicability to different types of devices to be tested, and ultimately improve the OTA test accuracy and test efficiency of the wireless communication device.

Description

Uncertainty analysis method and device introduced by test grid in OTA test

Technical Field

The present invention relates to the technical field of OTA testing, and in particular to a method and a device for analyzing uncertainty introduced by a test grid in OTA testing.

Background technique

This section is intended to provide a background or context to the embodiments of the invention recited in the claims. No description herein is admitted to be prior art by inclusion in this section.

For IoT business scenarios, it is mainly aimed at communication between things and people, and not only involves ordinary individual users, but also covers a large number of different types of industry users. Wi-Fi, Bluetooth, ZigBee, radio frequency identification (RFID), 4G LTE and 5G narrowband wireless communication technologies are typical wireless technologies for IoT business scenarios. Coverage, wireless connection reliability, response speed and security are crucial to user experience and system performance in IoT business scenarios, which in turn depends on agile and high-end precision antennas. Therefore, fast, accurate and rigorous test and measurement of the over-the-air (OTA) performance of IoT devices is an important part of the overall performance evaluation of IoT devices.

Over-the-air (OTA) testing methods have now become standard testing methods for wireless communication devices such as smartphones and laptops by international standardization organizations such as CTIA and 3GPP, providing an objective standard for performance comparison between devices under test. Traditional single-input single-output (SISO) OTA testing includes the measurement of total radiated power (TRP) and total isotropic sensitivity (TIS). For smartphones and laptops, the OTA testing methods specified in the current standards require that the grid resolutions for TRP and TIS measurements be 15° and 30°, respectively.

On the other hand, the types of IoT services are very rich and diverse, and the business characteristics vary greatly. More and more devices are interconnected by installing wireless communication modules. While a large number of device types and test requirements are driving technological progress in the field of wireless testing, they have also brought new technical challenges and opportunities. The traditional test grids with resolutions of 15° and 30° are only effective for wireless communication devices to be tested that are the size of smartphones and laptops. For the emerging large-size device types, the effectiveness and measurement uncertainty of the test grid layout need to be re-evaluated. In addition, for a large number of small, low-power battery-powered wireless communication devices, including watches, parking meters, pet tracking devices, etc., the number of test grids needs to be reduced to reduce the test time. Therefore, the evaluation of the measurement uncertainty introduced by different test grid layouts is crucial for the testing of IoT devices.

At present, the traditional evaluation of the measurement uncertainty introduced by the test grid layout is based on the uncertainty analysis method of a small number of actual measured samples of individual devices under test. That is, several existing smartphone test data are selected, and the TRP and TIS test results at a 15° grid resolution are used as the benchmark. The TRP and TIS values are recalculated by reducing the test grid density, and the difference between this value and the benchmark value is used as the measurement uncertainty value introduced by the relevant test grid layout. By using multiple devices, their TRP/TIS benchmark values and TRP/TIS values under different grid layouts are averaged to improve the accuracy of the analysis results. This method is simple and easy to use, and is the current standard method for CTIA/3GPP to analyze the measurement uncertainty introduced by the test grid layout. However, the analysis data of this method comes from the test data of smartphones. In theory, it is only applicable to wireless communication devices under test with the specifications and sizes of smartphones and laptops, and is not applicable to other types of devices under test. In addition, considering the test time and data processing workload, the number of data samples used for analysis by this method is small and has no statistical significance.

Summary of the invention

An embodiment of the present invention provides a method for analyzing uncertainty introduced by a test grid in an OTA test, the method comprising:

Set up the test grid layout;

Under the test grid layout, a standard dipole antenna is used to simulate the radiation characteristics of the wireless communication device to be tested, and the standard dipole antenna is randomly rotated with the origin of the test system coordinate system as the center to obtain the TRP value of the standard dipole antenna under each random rotation;

Performing statistical analysis on the TRP values of the standard dipole antenna obtained by multiple random rotations to obtain statistical distribution parameter values of the TRP values obtained by multiple random rotations, and using the statistical distribution parameter values as measurement uncertainty values introduced by the test grid layout;

Determine whether the uncertainty value is within a preset limit value range. When the determination is yes, determine that the test grid layout meets the OTA performance test requirements of the wireless communication device; when the determination is no, determine that the test grid layout cannot meet the OTA performance test requirements of the wireless communication device.

An embodiment of the present invention further provides an uncertainty analysis device introduced by a test grid in an OTA test, the device comprising:

The setting module is used to set the test grid layout;

A TRP value obtaining module, used to simulate the radiation characteristics of the wireless communication device to be tested with a standard dipole antenna under the test grid layout, randomly rotate the standard dipole antenna with the origin of the test system coordinate system as the center, and obtain the TRP value of the standard dipole antenna under each random rotation;

A statistical analysis module, used for performing statistical analysis on the TRP values of the standard dipole antenna obtained by multiple random rotations, obtaining statistical distribution parameter values of the TRP values obtained by multiple random rotations, and using the statistical distribution parameter values as measurement uncertainty values introduced by the test grid layout;

The uncertainty judgment module is used to judge whether the uncertainty value is within a preset limit value range. When the judgment is yes, it is determined that the test grid layout meets the OTA performance test requirements of the wireless communication device; when the judgment is no, it is determined that the test grid layout cannot meet the OTA performance test requirements of the wireless communication device.

An embodiment of the present invention also provides a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the uncertainty analysis method introduced by the test grid in the above-mentioned OTA test is implemented.

An embodiment of the present invention further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the uncertainty analysis method introduced by the test grid in the above-mentioned OTA test is implemented.

An embodiment of the present invention further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the uncertainty analysis method introduced by the test grid in the above-mentioned OTA test is implemented.

In the embodiment of the present invention, compared with the technical solution in the prior art for performing measurement uncertainty analysis based on a small amount of test data of a smartphone at a fixed 15° grid resolution, the present invention sets a test grid layout; under the test grid layout, a standard dipole antenna is used to simulate the radiation characteristics of the wireless communication device to be tested, and the standard dipole antenna is randomly rotated with the origin of the test system coordinate system as the center to obtain the TRP value of the standard dipole antenna under each random rotation; the TRP values of the standard dipole antenna obtained by multiple random rotations are statistically analyzed to obtain statistical distribution parameter values of the TRP values obtained by multiple random rotations, and the statistical distribution parameter values are calculated. The value is used as the measurement uncertainty value introduced by the test grid layout; whether the uncertainty value is within a preset limit value range is determined, and when it is determined to be yes, it is determined that the test grid layout meets the OTA performance test requirements of the wireless communication device; when it is determined to be no, it is determined that the test grid layout cannot meet the OTA performance test requirements of the wireless communication device. The present invention replaces the traditional uncertainty analysis method based on a small number of measured samples of individual devices under test, can ensure the applicability of the analysis results to different wireless communication devices under test, can analyze any test grid layout, improve the uncertainty analysis accuracy, and ultimately improve the OTA test accuracy and test efficiency of wireless communication devices.

BRIEF DESCRIPTION OF THE DRAWINGS

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the prior art descriptions. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:

FIG1 is a flow chart of a method for analyzing uncertainty introduced by a test grid in an OTA test according to an embodiment of the present invention;

FIG2 is a second flow chart of the uncertainty analysis method introduced by the test grid in the OTA test in an embodiment of the present invention;

FIG3 is a flow chart of a method for analyzing uncertainty introduced by a test grid in an OTA test according to an embodiment of the present invention;

FIG4 is a fourth flow chart of the uncertainty analysis method introduced by the test grid in the OTA test in an embodiment of the present invention;

FIG5 is a structural block diagram of an uncertainty analysis device introduced into a test grid in an OTA test according to an embodiment of the present invention;

FIG. 6 is a second structural block diagram of the uncertainty analysis device introduced into the test grid in the OTA test in an embodiment of the present invention.

Detailed ways

To make the purpose, technical solution and advantages of the embodiments of the present invention more clear, the embodiments of the present invention are further described in detail below in conjunction with the accompanying drawings. Here, the exemplary embodiments of the present invention and their descriptions are used to explain the present invention, but are not intended to limit the present invention.

The acquisition, storage, use, and processing of data in the technical solution of this application comply with the relevant provisions of national laws and regulations.

Based on the problems existing in the prior art, the present invention proposes a method for analyzing the uncertainty introduced by the test grid in OTA testing. The method evaluates the measurement uncertainty introduced by the test grid layout based on the statistical distribution of a large number of TRP test results under a specific test grid layout. The specific method flow is shown in Figures 1 to 4.

FIG. 1 is a flow chart of a method for analyzing uncertainty introduced by a test grid in an OTA test according to an embodiment of the present invention. As shown in FIG. 1 , the method includes:

Set up the test grid layout;

Under the test grid layout, a standard dipole antenna is used to simulate the radiation characteristics of the wireless communication device to be tested, and the standard dipole antenna is randomly rotated with the origin of the test system coordinate system as the center to obtain the TRP value of the standard dipole antenna under each random rotation;

Performing statistical analysis on the TRP values of the standard dipole antenna obtained by multiple random rotations to obtain statistical distribution parameter values of the TRP values obtained by multiple random rotations, and using the statistical distribution parameter values as measurement uncertainty values introduced by the test grid layout;

Determine whether the uncertainty value is within a preset limit value range. When the determination is yes, determine that the test grid layout meets the OTA performance test requirements of the wireless communication device; when the determination is no, determine that the test grid layout cannot meet the OTA performance test requirements of the wireless communication device.

Specifically, an arbitrary test grid layout is set, wherein setting the test grid layout refers to setting the grid resolution, for example, 15°, 30°, 45°, etc., which can be set arbitrarily.

Specifically, each random rotation of the standard dipole antenna is to change the relative angle relationship between the standard dipole antenna and the set test grid layout, so as to obtain a corresponding TRP value.

The above analysis can be based on actual test results or simulation analysis. That is, the acquisition of TRP test samples can be obtained through testing or simulation.

The measurement uncertainty value obtained based on the statistical analysis results of TRP is also applicable to TIS testing.

In an embodiment of the present invention, as shown in FIG2 , it further includes:

Set the upper limit of the number of random rotations (i.e. the number of TRP analysis samples);

Before each rotation, determine whether the current number of rotations reaches the upper limit of the random rotation number. If not, continue to randomly rotate the standard dipole antenna and record the TRP value of the standard dipole antenna. If reached, perform statistical analysis on the TRP values of the standard dipole antenna that has been randomly rotated multiple times.

Specifically, the number of random rotations is sufficient to generate sufficient TRP samples so that the analysis of the TRP test results is statistically significant. The number of random rotations shall not be less than 10,000, including but not limited to 10,000, 20,000, 30,000, but need not exceed 50,000, that is, the upper limit of the number of random rotations is limited to between 10,000 and 50,000.

In an embodiment of the present invention, as shown in FIG3 , statistical analysis is performed on the TRP values of the standard dipole antenna obtained by multiple random rotations to obtain statistical distribution parameter values, including:

The TRP value of the standard dipole antenna obtained by multiple random rotations at a preset cumulative distribution function CDF value is calculated as a statistical distribution parameter value.

In an embodiment of the present invention, as shown in FIG4 , it further includes:

If the judgment is no, increase the density of the test grid and repeat the uncertainty analysis introduced by the test grid in the OTA test.

The embodiment of the present invention also provides an uncertainty analysis device introduced by the test grid in the OTA test, as described in the following embodiment. Since the principle of solving the problem by the device is similar to the uncertainty analysis method introduced by the test grid in the OTA test, the implementation of the device can refer to the implementation of the uncertainty analysis method introduced by the test grid in the OTA test, and the repeated parts will not be repeated.

FIG5 is a structural block diagram of an uncertainty analysis device introduced into a test grid in an OTA test in an embodiment of the present invention. As shown in FIG5 , the device includes:

Setting module 02, used to set the test grid layout;

A TRP value obtaining module 04 is used to simulate the radiation characteristics of the wireless communication device to be tested with a standard dipole antenna under the test grid layout, randomly rotate the standard dipole antenna with the origin of the test system coordinate system as the center, and obtain the TRP value of the standard dipole antenna under each random rotation;

A statistical analysis module 06 is used to perform statistical analysis on the TRP values of the standard dipole antenna obtained by multiple random rotations, obtain statistical distribution parameter values of the TRP values obtained by multiple random rotations, and use the statistical distribution parameter values as measurement uncertainty values introduced by the test grid layout;

The uncertainty judgment module 08 is used to judge whether the uncertainty value is within a preset limit value range. When the judgment is yes, it is determined that the test grid layout meets the OTA performance test requirements of the wireless communication device; when the judgment is no, it is determined that the test grid layout cannot meet the OTA performance test requirements of the wireless communication device.

In the embodiment of the present invention, the setting module is further used to: set an upper limit of the number of random rotations;

As shown in FIG6 , it also includes: a random rotation number judgment module 10, which is used to judge whether the current rotation number reaches the upper limit of the random rotation number before each rotation. If not, the standard dipole antenna is continuously randomly rotated and its TRP value is recorded; if reached, the TRP values of the standard dipole antenna that has been randomly rotated multiple times are statistically analyzed.

In the embodiment of the present invention, the upper limit of the number of random rotations is limited to between 10,000 and 50,000 times.

In the embodiment of the present invention, the random rotation is a rotation method of randomly changing the relative angle relationship between the standard dipole antenna and the test grid layout.

In the embodiment of the present invention, the statistical analysis module is specifically used for:

The TRP value of the standard dipole antenna obtained by multiple random rotations at a preset cumulative distribution function CDF value is calculated as a statistical distribution parameter value.

In the embodiment of the present invention, the setting module is further used for:

If the judgment is no, increase the density of the test grid and repeat the uncertainty analysis introduced by the test grid in the OTA test.

An embodiment of the present invention also provides a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the uncertainty analysis method introduced by the test grid in the above-mentioned OTA test is implemented.

An embodiment of the present invention further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the uncertainty analysis method introduced by the test grid in the above-mentioned OTA test is implemented.

An embodiment of the present invention further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the uncertainty analysis method introduced by the test grid in the above-mentioned OTA test is implemented.

In the embodiment of the present invention, compared with the technical solution in the prior art for performing measurement uncertainty analysis based on a small amount of test data of a smartphone at a fixed 15° grid resolution, the present invention sets a test grid layout; under the test grid layout, a standard dipole antenna is used to simulate the radiation characteristics of the wireless communication device to be tested, and the standard dipole antenna is randomly rotated with the origin of the test system coordinate system as the center to obtain the TRP value of the standard dipole antenna under each random rotation; the TRP values of the standard dipole antenna obtained by multiple random rotations are statistically analyzed to obtain statistical distribution parameter values of the TRP values obtained by multiple random rotations, and the statistical distribution parameter values are calculated. The value is used as the measurement uncertainty value introduced by the test grid layout; whether the uncertainty value is within a preset limit value range is determined, and when it is determined to be yes, it is determined that the test grid layout meets the OTA performance test requirements of the wireless communication device; when it is determined to be no, it is determined that the test grid layout cannot meet the OTA performance test requirements of the wireless communication device. The present invention replaces the traditional uncertainty analysis method based on a small number of measured samples of individual devices under test, can ensure the applicability of the analysis results to different wireless communication devices under test, can analyze any test grid layout, improve the uncertainty analysis accuracy, and ultimately improve the OTA test accuracy and test efficiency of wireless communication devices.

Those skilled in the art will appreciate that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

The present invention is described with reference to the flowchart and/or block diagram of the method, device (system), and computer program product according to the embodiment of the present invention. It should be understood that each process and/or box in the flowchart and/or block diagram, as well as the combination of the process and/or box in the flowchart and/or block diagram can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device produce a device for implementing the functions specified in one or more processes in the flowchart and/or one or more boxes in the block diagram.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer-readable memory produce a manufactured product including an instruction device that implements the functions specified in one or more processes in the flowchart and/or one or more boxes in the block diagram.

These computer program instructions may also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, whereby the instructions executed on the computer or other programmable device provide steps for implementing the functions specified in one or more processes in the flowchart and/or one or more boxes in the block diagram.

The specific embodiments described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims (15)

1. A method for analyzing uncertainty introduced by a test grid in an OTA test, comprising:

Setting a test grid layout;

Under the test grid layout, simulating the radiation characteristic of the wireless communication equipment to be tested by using a standard dipole antenna, and randomly rotating the standard dipole antenna by taking the origin of a test system coordinate system as the center to obtain the TRP value of the standard dipole antenna under each random rotation;

Carrying out statistical analysis on the TRP values of the standard dipole antenna obtained by multiple random rotations to obtain statistical distribution parameter values of the TRP values obtained by multiple random rotations, and taking the statistical distribution parameter values as measurement uncertainty values introduced by a test grid layout;

Judging whether the uncertainty value is in a preset limit value range, and when the uncertainty value is in the preset limit value range, determining that the test grid layout meets the OTA performance test requirement of the wireless communication equipment; and when the test grid layout is judged to be not met, determining that the test grid layout cannot meet the OTA performance test requirement of the wireless communication equipment.

2. The method of uncertainty introduced by a test grid in OTA testing of claim 1 further comprising:

Setting an upper limit of random rotation times;

before each rotation, judging whether the current rotation times reach the upper limit of the random rotation times, if not, continuing to randomly rotate the standard dipole antenna, and recording the TRP value of the standard dipole antenna; and if so, carrying out statistical analysis on the TRP value of the standard dipole antenna obtained by multiple random rotations.

3. The method of claim 2, wherein the upper limit of random rotation is defined between 10000 times and 50000 times.

4. The method of claim 1, wherein the random rotation is a rotation that randomly changes the relative angular relationship of the standard dipole antenna to the test grid layout.

5. The method for analyzing uncertainty introduced by a test grid in an OTA test of claim 1 wherein statistically analyzing TRP values of said standard dipole antenna obtained by a plurality of random rotations to obtain statistically distributed parameter values comprises:

Calculating the TRP value of the standard dipole antenna, which is obtained through multiple random rotations, at a preset cumulative distribution function CDF value, and taking the TRP value as a statistical distribution parameter value.

6. The method of uncertainty introduced by a test grid in OTA testing of claim 1 further comprising:

If not, increasing the density of the test grid, and repeating the uncertainty analysis introduced by the test grid in the OTA test.

7. An uncertainty analysis device introduced by a test grid in an OTA test, comprising:

The setting module is used for setting the test grid layout;

The TRP value obtaining module is used for simulating the radiation characteristic of the wireless communication equipment to be tested by using the standard dipole antenna under the test grid layout, randomly rotating the standard dipole antenna by taking the origin of a test system coordinate system as the center, and obtaining the TRP value of the standard dipole antenna under each random rotation;

The statistical analysis module is used for carrying out statistical analysis on the TRP values of the standard dipole antenna obtained by multiple random rotations, obtaining statistical distribution parameter values of the TRP values obtained by multiple random rotations, and taking the statistical distribution parameter values as measurement uncertainty values introduced by a test grid layout;

The uncertainty judging module is used for judging whether the uncertainty value is in a preset limit value range, and when the uncertainty value is in the preset limit value range, determining that the test grid layout meets the OTA performance test requirement of the wireless communication equipment; and when the test grid layout is judged to be not met, determining that the test grid layout cannot meet the OTA performance test requirement of the wireless communication equipment.

8. The apparatus for uncertainty introduced by a test grid in an OTA test of claim 7 wherein the configuration module is further configured to: setting an upper limit of random rotation times;

Further comprises: the random rotation number judging module is used for judging whether the current rotation number reaches the upper limit of the random rotation number before each rotation, if not, continuing to rotate the standard dipole antenna randomly, and recording the TRP value of the standard dipole antenna; and if so, carrying out statistical analysis on the TRP value of the standard dipole antenna obtained by multiple random rotations.

9. The apparatus for uncertainty introduced by the test grid in OTA testing of claim 8 wherein the upper limit of random rotation is defined between 10000 times and 50000 times.

10. The apparatus for analyzing uncertainty introduced by a test grid in an OTA test of claim 7 wherein said random rotation is a rotation that randomly changes the relative angular relationship of said standard dipole antenna to said test grid layout.

11. The apparatus for uncertainty introduced by a test grid in an OTA test of claim 7 wherein the statistical analysis module is specifically configured to:

Calculating the TRP value of the standard dipole antenna, which is obtained through multiple random rotations, at a preset cumulative distribution function CDF value, and taking the TRP value as a statistical distribution parameter value.

12. The apparatus for uncertainty introduced by a test grid in an OTA test of claim 7 wherein the configuration module is further configured to:

If not, increasing the density of the test grid, and repeating the uncertainty analysis introduced by the test grid in the OTA test.

13. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the method of uncertainty analysis introduced by the test grid in any of claims 1 to 6 when the computer program is executed by the processor.

14. A computer readable storage medium, wherein the computer readable storage medium stores a computer program which, when executed by a processor, implements the method of uncertainty analysis introduced by a test grid in an OTA test of any one of claims 1 to 6.

15. A computer program product, characterized in that it comprises a computer program which, when executed by a processor, implements the method of uncertainty analysis of test grid introduction in an OTA test according to any one of claims 1 to 6.