[go: up one dir, main page]

CN114975755A - Infrared detector for non-dispersive infrared gas sensor - Google Patents

Infrared detector for non-dispersive infrared gas sensor Download PDF

Info

Publication number
CN114975755A
CN114975755A CN202210593000.1A CN202210593000A CN114975755A CN 114975755 A CN114975755 A CN 114975755A CN 202210593000 A CN202210593000 A CN 202210593000A CN 114975755 A CN114975755 A CN 114975755A
Authority
CN
China
Prior art keywords
thermopile
thermocouple
hot end
infrared
gas sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202210593000.1A
Other languages
Chinese (zh)
Inventor
于虹
马寅晨
李肖婷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Southeast University
Original Assignee
Southeast University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Southeast University filed Critical Southeast University
Priority to CN202210593000.1A priority Critical patent/CN114975755A/en
Publication of CN114975755A publication Critical patent/CN114975755A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N10/00Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
    • H10N10/80Constructional details
    • H10N10/82Interconnections
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N19/00Integrated devices, or assemblies of multiple devices, comprising at least one thermoelectric or thermomagnetic element covered by groups H10N10/00 - H10N15/00
    • H10N19/101Multiple thermocouples connected in a cascade arrangement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • G01J2005/126Thermoelectric black plate and thermocouple
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

本发明提供了一种用于非分光红外气体传感器内的红外探测器。红外探测器包括基底和设于基底上的热电堆,热电堆由多对热电偶串联而成,热电偶具有冷端和热端,冷端与基底贴合,热端底部基底从背面刻蚀,形成悬浮结构,热端上部绝缘层开设导热通孔连接顶部红外吸收区。热端上部通孔结构,可以直接连接热端和吸收区,将吸收区的大部分热量传送至热电堆的热端。热端形成悬浮结构,可以减少热端向基底的热传导损失,冷端直接连接基底实现导热,使得冷热端具有较大温差。热电堆的尺寸、连接结构、排布方式等,使探测器输出电压增大。最终满足非分光红外气体传感器内红外探测的要求,并且通孔、背面刻蚀及热电堆结构均结构简单,工艺可实现。

Figure 202210593000

The present invention provides an infrared detector for use in a non-split infrared gas sensor. The infrared detector includes a base and a thermopile arranged on the base. The thermopile is formed by connecting multiple pairs of thermocouples in series. The thermocouple has a cold end and a hot end. The cold end is attached to the base. A suspension structure is formed, and a thermally conductive through hole is opened on the upper insulating layer of the hot end to connect the top infrared absorption area. The upper through hole structure of the hot end can directly connect the hot end and the absorption area, and transfer most of the heat in the absorption area to the hot end of the thermopile. The hot end forms a suspended structure, which can reduce the heat conduction loss from the hot end to the substrate, and the cold end is directly connected to the substrate to achieve heat conduction, so that the cold and hot ends have a large temperature difference. The size, connection structure and arrangement of the thermopile increase the output voltage of the detector. Finally, the requirement of infrared detection in the non-spectroscopic infrared gas sensor is satisfied, and the structure of the through hole, the back etching and the thermopile structure is simple, and the process can be realized.

Figure 202210593000

Description

一种用于非分光红外气体传感器的红外探测器An infrared detector for non-split infrared gas sensor

技术领域technical field

本发明属于一种热电堆红外探测器结构领域,尤其涉及一种用于非分光红外气体传感 器的红外探测器。The invention belongs to the field of the structure of a thermopile infrared detector, in particular to an infrared detector used for a non-spectrometric infrared gas sensor.

背景技术Background technique

非分光红外(NDIR)技术进行气体浓度测量,其原理为:根据Lambert-Beer定律,一束单色光在经过某种吸收介质时,会被介质吸收一部分的光能,透射光强度会因此而下降,被吸收的比例与被测气体的浓度值,从红外光源到探测器之间红外光与被测气体之间有交互作用的长度,以及吸收系数有关。The principle of non-dispersive infrared (NDIR) technology for gas concentration measurement is as follows: according to the Lambert-Beer law, when a beam of monochromatic light passes through a certain absorbing medium, a part of the light energy will be absorbed by the medium, and the transmitted light intensity will be changed accordingly. The proportion that is absorbed is related to the concentration value of the measured gas, the length of interaction between the infrared light and the measured gas from the infrared light source to the detector, and the absorption coefficient.

入射出射光强度变化关系式:The relationship between the intensity of incident and outgoing light:

I=I0e-KCL I=I 0 e -KCL

I0——入射光强,红外线经过被测气体前的光强;I 0 ——incident light intensity, the light intensity before infrared rays pass through the gas to be measured;

I——出射光强,红外线经过被测气体后的光强;I——Intensity of outgoing light, the light intensity of infrared rays after passing through the gas to be measured;

C——浓度,被测气体的浓度值;C——concentration, the concentration value of the measured gas;

L——光程长,从红外光源到探测器之间红外光与被测气体之间有交互作用的长度;L——Optical path length, from the infrared light source to the detector, the length of the interaction between the infrared light and the measured gas;

K——吸收系数,该系数取决于被测物体的吸收谱线。K - absorption coefficient, the coefficient depends on the absorption spectrum of the measured object.

因此,气体传感器内部需要设置红外探测器,通过测量红外辐射强度,实现对光强度 的测量。Therefore, an infrared detector needs to be installed inside the gas sensor to measure the light intensity by measuring the intensity of infrared radiation.

红外探测器基于探测机理的不同,一般分为光子探测器和热探测器两大类。光子探测 器是基于光电效应作用的,在探测过程中,其温度基本维持稳定;热探测器则是依靠吸收 红外辐射使得温度升高继而转化为电能。由于红外线的热效应非常显著,且相比之下热探 测器的灵敏度优于光子探测器,故而使用红外探测器时,一般会选择热探测器。惯用的热 探测器又包括了热电阻探测器、热释电探测器、热电堆探测器几大类。其中热电阻探测器 是依靠电阻的温度变化进行相关参数的测量,一般选择铂、铜等具有电阻温度系数大、电 阻率大、热容量小、线性好、性能稳定等特性的材料用作热电阻,使用这些材料制成的热 电阻测温范围广,且结构较为简易,但性能较差。热释电探测器的运作机理是探测器内部 的一些晶体遇高温而产生等量异号的电荷,这种通过温度的变化而形成的电极化现象,就 是热释电效应,这种探测器具有效率高、体积小、稳定性高、寿命长等特点,但热释电效 应要求探测器内温度始终变化,不适用于气体传感器内静态的温度环境。而热电堆红外探 测器的运作原理是根据塞贝克效应,半导体材料两端的温度差会转为热电势,同时输出热 电势与半导体材料的塞贝克系数α有关。使用半导体材料制成热电偶,串联组成热电堆后 可以实现电压叠加。Based on different detection mechanisms, infrared detectors are generally divided into two categories: photon detectors and thermal detectors. The photon detector is based on the photoelectric effect, and its temperature is basically kept stable during the detection process; the thermal detector relies on the absorption of infrared radiation to make the temperature rise and then convert it into electrical energy. Since the thermal effect of infrared rays is very significant, and the sensitivity of thermal detectors is better than that of photon detectors, thermal detectors are generally selected when infrared detectors are used. The commonly used heat detectors include thermal resistance detectors, pyroelectric detectors, and thermopile detectors. Among them, thermal resistance detectors rely on the temperature change of resistance to measure related parameters. Generally, materials such as platinum and copper with large temperature coefficient of resistance, large resistivity, small heat capacity, good linearity and stable performance are used as thermal resistances. The thermal resistance made of these materials has a wide temperature measurement range, and the structure is relatively simple, but the performance is poor. The operating mechanism of the pyroelectric detector is that some crystals inside the detector generate equal and different charges when exposed to high temperature. This electric polarization phenomenon formed by the change of temperature is the pyroelectric effect. This kind of detector has It has the characteristics of high efficiency, small size, high stability and long life, but the pyroelectric effect requires the temperature in the detector to change all the time, which is not suitable for the static temperature environment in the gas sensor. The operating principle of the thermopile infrared detector is based on the Seebeck effect, the temperature difference between the two ends of the semiconductor material will be converted into thermoelectric potential, and the output thermoelectric potential is related to the Seebeck coefficient α of the semiconductor material. Thermocouples made of semiconductor materials can be connected in series to form a thermopile to achieve voltage superposition.

因此当热电堆红外探测器吸收层吸收红外辐射后,热端的温度上升,与冷端之间产生 温度差,就可以将这个温度差直接转换为电压输出。最后通过测量电压及其变化得到红外 辐射强度。Therefore, after the absorption layer of the thermopile infrared detector absorbs infrared radiation, the temperature of the hot end rises, and a temperature difference is generated between the hot end and the cold end, and this temperature difference can be directly converted into a voltage output. Finally, the infrared radiation intensity is obtained by measuring the voltage and its change.

输出电压关系式:Output voltage relationship:

Vout=ΔT(αAB)。V out = ΔT(α A −α B ).

热电堆红外探测器由于其测量精度高、范围广、响应灵敏且极耐高温等特点,被广泛 使用于红外探测领域。Thermopile infrared detectors are widely used in the field of infrared detection due to their high measurement accuracy, wide range, sensitive response and extremely high temperature resistance.

由于硅具有良好的导热性,目前现有的热电堆红外探测器吸收的红外辐射能量会通过 硅基体大量散失,导致热电堆的热短路,同时由于热电堆结构布局设计不合理,制备的热 电堆红外探测器冷热断温度差不明显,导致探测器输出电压太低,使得整个气体传感器的 性能降低甚至无法使用。Due to the good thermal conductivity of silicon, the infrared radiation energy absorbed by the existing thermopile infrared detectors will be dissipated in a large amount through the silicon substrate, resulting in thermal short circuit of the thermopile. The temperature difference between the hot and cold temperature of the infrared detector is not obvious, which leads to the low output voltage of the detector, which reduces the performance of the entire gas sensor or even cannot be used.

发明内容SUMMARY OF THE INVENTION

本发明目的在于提供一种用于非分光红外气体传感器的红外探测器,以解决用于非分 光红外气体传感器的热电堆红外探测器冷热端温差不明显,红外探测器输出电压太低,影 响整个非分光红外气体传感器性能的技术问题。The purpose of the present invention is to provide an infrared detector for a non-split infrared gas sensor, so as to solve the problem that the temperature difference between the hot and cold ends of the thermopile infrared detector used for the non-split infrared gas sensor is not obvious, and the output voltage of the infrared detector is too low, which affects the Technical aspects of the entire non-split infrared gas sensor performance.

为解决上述技术问题,本发明的具体技术方案如下:For solving the above-mentioned technical problems, the concrete technical scheme of the present invention is as follows:

一种用于非分光红外气体传感器内的红外探测器,包括基底、设于基底上的热电堆、 支撑层组件以及吸收层;An infrared detector used in a non-split infrared gas sensor, comprising a substrate, a thermopile arranged on the substrate, a support layer assembly and an absorption layer;

热电堆包括热电堆的冷端和热电堆的热端,热电堆的冷端与基底贴合,热电堆的热端 上开设导热通孔,导热通孔连接热端和吸收层,热电堆的热端底部背面刻蚀形成背腔,形 成悬浮结构;The thermopile includes the cold end of the thermopile and the hot end of the thermopile, the cold end of the thermopile is attached to the substrate, the hot end of the thermopile is provided with a thermally conductive through hole, and the thermally conductive through hole connects the hot end and the absorption layer. The back side of the end bottom is etched to form a back cavity, forming a suspended structure;

热电堆包括多对热电偶;The thermopile includes multiple pairs of thermocouples;

多对热电偶采用双层堆叠排布,热电偶包括依次设于基底上的第一热偶条和设于第一 热偶条上的第二热偶条;The multiple pairs of thermocouples are arranged in a double-layer stack, and the thermocouples include a first thermocouple bar arranged on the base in turn and a second thermocouple bar arranged on the first thermocouple bar;

导热通孔设于第二热偶条上部氧化硅层中;The thermal conduction through hole is arranged in the silicon oxide layer on the upper part of the second thermocouple strip;

支撑层组件设于所述基底和热电堆之间;a support layer assembly is arranged between the substrate and the thermopile;

吸收层设于热电堆上部。The absorption layer is arranged on the upper part of the thermopile.

进一步的,第一热偶条包括第一热偶条的热端和第一热偶条的冷端,第二热偶条包括 第二热偶条的热端和第二热偶条的冷端;第一热偶条的热端与第二热偶条的热端连接,第 一热偶条的冷端与相邻第二热偶条的冷端连接,从而将第一热电偶和第二热电偶串联,将 相邻热偶条也串联。Further, the first thermocouple bar includes a hot end of the first thermocouple bar and a cold end of the first thermocouple bar, and the second thermocouple bar includes a hot end of the second thermocouple bar and a cold end of the second thermocouple bar ; The hot end of the first thermocouple bar is connected with the hot end of the second thermocouple bar, and the cold end of the first thermocouple bar is connected with the cold end of the adjacent second thermocouple bar, thereby connecting the first thermocouple and the second thermocouple bar. The thermocouples are connected in series, and the adjacent thermocouple bars are also connected in series.

进一步的,第一热偶条和第二热偶条之间,相邻热电偶之间都填充有第一氧化硅层。Further, a first silicon oxide layer is filled between the first thermocouple bar and the second thermocouple bar and between adjacent thermocouples.

进一步的,支撑层组件包括依次设置的第一氧化硅层、氮化硅层和第二氧化硅层。Further, the support layer assembly includes a first silicon oxide layer, a silicon nitride layer and a second silicon dioxide layer which are arranged in sequence.

进一步的,导热通孔和所述吸收层材料采用氮化硅。Further, the thermal conductive via and the material of the absorption layer are made of silicon nitride.

进一步的,基底上通过对角线分割划分为四个区域,且每个区域内45°布设多个互相平行串联的热电偶,且所述对角线分割的中心区为吸收区。Further, the substrate is divided into four regions by diagonal division, and a plurality of thermocouples connected in parallel with each other in series are arranged at 45° in each region, and the central region of the diagonal division is an absorption region.

进一步的,热电堆的冷端和热电堆的热端分别位于热电堆的相对两端部,第一热偶条 为N型掺杂的硅材质,第二热偶条为P型掺杂的硅材质。Further, the cold end of the thermopile and the hot end of the thermopile are respectively located at opposite ends of the thermopile, the first thermocouple bar is made of N-type doped silicon material, and the second thermocouple bar is made of P-type doped silicon material. material.

本发明的一种用于非分光红外气体传感器的红外探测器,具有以下优点:An infrared detector for a non-spectrometric infrared gas sensor of the present invention has the following advantages:

1、本发明通过在第二热电偶的热端开设导热通孔实现和红外探测器中心的吸收区连 接,可以将吸收区的绝大部分热量传送至热电堆的热端,热电堆的冷端直接连接基底1, 保持冷端与环境温度一致,热电堆的热端的底部基底背面刻蚀形成悬浮结构,减少热电堆 的热端向基底的热量传导,使热电堆的冷端和热电堆的热端具有较大的温差,从而实现输 出信号的增大,并且导热通孔以及背面刻蚀结构简单,工艺可实现,能达到良好的效果;1. The present invention realizes the connection with the absorption area in the center of the infrared detector by opening a heat conduction through hole at the hot end of the second thermocouple, so that most of the heat in the absorption area can be transferred to the hot end of the thermopile and the cold end of the thermopile. Directly connect the substrate 1, keep the cold end consistent with the ambient temperature, and etch the back of the bottom substrate of the hot end of the thermopile to form a suspension structure, reduce the heat conduction from the hot end of the thermopile to the substrate, and make the cold end of the thermopile and the heat of the thermopile. There is a large temperature difference between the ends, so as to increase the output signal, and the thermal conduction through hole and the backside etching structure are simple, the process can be realized, and good results can be achieved;

2、本发明的热电堆内热偶条采用双层堆叠排布,能够节省器件空间,使整个基底上 能尽可能排布更多组热电偶,同时控制红外探测器尺寸,以适用于非分光红外气体传感器 内部。通过设计热电偶6的长宽高、连接结构、排布方式等,优化热电堆结构,使热电堆的冷端21和热电堆的热端22具有较大的温差,从而实现输出信号的增大。2. The thermocouple strips in the thermopile of the present invention are arranged in a double-layer stack, which can save the space of the device, so that more groups of thermocouples can be arranged on the entire substrate as much as possible, and the size of the infrared detector is controlled at the same time, so as to be suitable for non-split infrared Inside the gas sensor. By designing the length, width, height, connection structure, arrangement, etc. of the thermocouple 6, the structure of the thermopile is optimized, so that the cold end 21 of the thermopile and the hot end 22 of the thermopile have a large temperature difference, thereby realizing the increase of the output signal. .

附图说明Description of drawings

图1为本发明实施方式提供的热电堆红外探测器的结构示意图;1 is a schematic structural diagram of a thermopile infrared detector provided by an embodiment of the present invention;

图2为本发明实施方式提供的热电堆红外探测器单根热电偶纵截面(截面一)的结构 示意图;Fig. 2 is the structural schematic diagram of the single thermocouple longitudinal section (section one) of the thermopile infrared detector provided by the embodiment of the present invention;

图3为本发明实施方式提供的热电堆红外探测器相邻热电偶间连接处横截面(截面二) 的结构示意图。3 is a schematic structural diagram of a cross-section (section 2) of a connection between adjacent thermocouples of a thermopile infrared detector according to an embodiment of the present invention.

图中标记说明:1、基底;2、热电堆;21、热电堆的冷端;22、热电堆的热端;3、 支撑膜组件;31、第一氧化硅层;32、氮化硅层;33、第二氧化硅层;4、吸收层;5、背 腔;6、热电偶;61、第一热偶条;62、第二热偶条;7、导热通孔;8、吸收区;9、电极。Description of symbols in the figure: 1. Substrate; 2. Thermopile; 21. Cold end of thermopile; 22. Hot end of thermopile; 3. Supporting membrane module; 31. First silicon oxide layer; 32. Silicon nitride layer 33, the second silicon dioxide layer; 4, the absorption layer; 5, the back cavity; 6, the thermocouple; 61, the first thermocouple bar; 62, the second thermocouple bar; 9. Electrodes.

具体实施方式Detailed ways

为了更好地了解本发明的目的、结构及功能,下面结合附图,对本发明一种用于非分 光红外气体传感器的红外探测器做进一步详细的描述。In order to better understand the purpose, structure and function of the present invention, an infrared detector for a non-spectrographic infrared gas sensor of the present invention will be described in further detail below with reference to the accompanying drawings.

如图1至图3所示,现对本发明提供的红外探测器进行说明。红外探测器内包括基底 1、设于基底1上的热电堆2、支撑层组件3以及吸收层4;As shown in FIG. 1 to FIG. 3 , the infrared detector provided by the present invention will now be described. The infrared detector includes a substrate 1, a thermopile 2 arranged on the substrate 1, a support layer assembly 3 and an absorption layer 4;

热电堆2包括热电堆的冷端21和热电堆的热端22,热电堆的冷端21与基底1贴合,热电堆的热端22上开设导热通孔7,导热通孔7连接热端22和吸收层4,热电堆的热端 22底部背面刻蚀形成背腔5,形成悬浮结构。The thermopile 2 includes a cold end 21 of the thermopile and a hot end 22 of the thermopile. The cold end 21 of the thermopile is attached to the substrate 1 , and the hot end 22 of the thermopile is provided with a thermally conductive through hole 7 , and the thermally conductive through hole 7 is connected to the hot end 22 and the absorption layer 4, the bottom back of the hot end 22 of the thermopile is etched to form a back cavity 5 to form a suspension structure.

热电堆2包括多对热电偶6;The thermopile 2 includes multiple pairs of thermocouples 6;

多对热电偶6采用双层堆叠排布,所述热电偶6包括依次设于基底1上的第一热偶条 61和设于所述第一热偶条61上的第二热偶条62;A plurality of pairs of thermocouples 6 are arranged in a double-layer stack, and the thermocouples 6 include a first thermocouple bar 61 arranged on the substrate 1 in sequence and a second thermocouple bar 62 arranged on the first thermocouple bar 61. ;

导热通孔7设于第二热偶条62上部氧化硅层中;The thermally conductive via 7 is arranged in the silicon oxide layer on the upper part of the second thermocouple bar 62;

支撑层组件3设于所述基底1和热电堆2之间;The support layer assembly 3 is arranged between the substrate 1 and the thermopile 2;

吸收层4设于红外探测器顶层。The absorption layer 4 is arranged on the top layer of the infrared detector.

本发明提供的红外探测器,与现有技术相比,其通过在第二热电偶62的热端22开设 导热通孔7实现和红外探测器中心的吸收区8连接,可以将吸收区8的绝大部分热量传送至热电堆的热端22,热电堆的冷端21直接连接基底1,保持冷端与环境温度一致,热电 堆的热端22的底部基底1背面刻蚀形成悬浮结构,减少热电堆的热端22向基底1的热量 传导,使热电堆的冷端21和热电堆的热端22具有较大的温差,从而实现输出信号的增大, 并且导热通孔7以及背面刻蚀结构简单,工艺可实现,能达到良好的效果。同时,热电堆 2内热偶条采用双层堆叠排布,能够节省器件空间,使整个基底1上能尽可能排布更多组 热电偶。通过设计热电偶6的长宽高、连接结构、排布方式等,优化热电堆结构,使得热 电2堆得输出电压增大,从而满足该红外探测器在NDIR气体传感器内测量的精准性。Compared with the prior art, the infrared detector provided by the present invention is connected with the absorption area 8 in the center of the infrared detector by opening a thermal conduction through hole 7 in the hot end 22 of the second thermocouple 62, so that the absorption area 8 of the absorption area 8 can be connected. Most of the heat is transferred to the hot end 22 of the thermopile, and the cold end 21 of the thermopile is directly connected to the substrate 1 to keep the cold end consistent with the ambient temperature. The hot end 22 of the thermopile conducts heat to the substrate 1, so that the cold end 21 of the thermopile and the hot end 22 of the thermopile have a large temperature difference, thereby increasing the output signal, and the thermally conductive vias 7 and the backside are etched The structure is simple, the process can be realized, and good effects can be achieved. At the same time, the thermocouple strips in the thermopile 2 are arranged in a double-layer stack, which can save the space of the device, so that more groups of thermocouples can be arranged on the entire substrate 1 as much as possible. By designing the length, width, height, connection structure, arrangement, etc. of the thermocouple 6, the structure of the thermopile is optimized, so that the output voltage of the thermopile 2 is increased, thereby satisfying the measurement accuracy of the infrared detector in the NDIR gas sensor.

基底1一般为硅材质。热电堆的冷端22和热电堆的热端21分别位于热电堆2的相对两端部,第一热偶条61一般为N型掺杂的硅材质,第二热偶条62一般为P型掺杂的硅材 质,吸收层4和通孔7采用光吸收性和导热性较强的材料氮化硅。The substrate 1 is generally made of silicon. The cold end 22 of the thermopile and the hot end 21 of the thermopile are located at opposite ends of the thermopile 2 respectively. The first thermocouple bar 61 is generally made of N-type doped silicon material, and the second thermocouple bar 62 is generally P-type. Doped silicon material, the absorption layer 4 and the through hole 7 are made of silicon nitride, a material with strong light absorption and thermal conductivity.

如图1至图3,是本发明提供的红外探测器的一种具体实施方式,支撑层组件3包括依次叠设的第一氧化硅层31、氮化硅层32和第二氧化硅层33,可以将吸收层4与基底1 隔绝,通过支撑层组件3的第一氧化硅层31可以将第一热电偶62和第二热电偶61隔绝, 可以将相邻热电偶6隔绝,支撑层组件3稳定性较好,可以防止各材料之间的相互腐蚀, 从而对红外探测器进行保护。FIG. 1 to FIG. 3 are a specific embodiment of the infrared detector provided by the present invention. The support layer assembly 3 includes a first silicon oxide layer 31 , a silicon nitride layer 32 and a second silicon dioxide layer 33 stacked in sequence. , the absorption layer 4 can be isolated from the substrate 1, the first thermocouple 62 and the second thermocouple 61 can be isolated by the first silicon oxide layer 31 of the support layer assembly 3, the adjacent thermocouples 6 can be isolated, and the support layer assembly 3. It has good stability and can prevent mutual corrosion between materials, so as to protect the infrared detector.

如图1至图3,作为本发明提供的红外探测器的一种具体实施方式,在热电堆的热端 22,单根热电偶6的第一热电偶62和第二热电偶61相连接,而在冷端21,第一热偶条 62与相邻第二热偶条61连接,从而将第一热电偶62和第二热电偶61串联,将相邻热偶 条6也串联,整体实现串联组成热电堆。1 to 3, as a specific embodiment of the infrared detector provided by the present invention, at the hot end 22 of the thermopile, the first thermocouple 62 and the second thermocouple 61 of the single thermocouple 6 are connected, At the cold end 21 , the first thermocouple bar 62 is connected to the adjacent second thermocouple bar 61 , so that the first thermocouple 62 and the second thermocouple 61 are connected in series, and the adjacent thermocouple bars 6 are also connected in series. connected in series to form a thermopile.

如图1所示,作为本发明提供的红外探测器的一种具体实施方式,基底1上通过对角 线分割划为四个区域,且每个区域内45°布设多个互相平行串联的热电偶6,所有的热电偶6的排布为中心对称,热电偶的冷端连接有线路,四个区域的热电偶6也连接有线路, 且线路连接至电极9。热电堆2的中心区域即为吸收区8,吸收区8能够吸收热量并通过 通孔7将热量传递给热电堆2热端22。As shown in FIG. 1 , as a specific embodiment of the infrared detector provided by the present invention, the substrate 1 is divided into four regions by diagonal division, and each region is arranged with a plurality of thermoelectric devices parallel to each other in series at 45°. For the pair 6 , all the thermocouples 6 are arranged symmetrically in the center, the cold end of the thermocouples is connected with wires, the thermocouples 6 in the four regions are also connected with wires, and the wires are connected to the electrodes 9 . The central area of the thermopile 2 is the absorption area 8, and the absorption area 8 can absorb heat and transfer the heat to the hot end 22 of the thermopile 2 through the through holes 7.

作为本发明提供的红外探测器的一种具体实施方式,该红外探测器响应率、内阻、尺 寸等参数,特殊根据气体传感器对红外探测的需要进行尽可能地优化调整。As a specific embodiment of the infrared detector provided by the present invention, parameters such as the responsivity, internal resistance, and size of the infrared detector are optimized and adjusted as much as possible according to the needs of the gas sensor for infrared detection.

可以理解,本发明是通过一些实施例进行描述的,本领域技术人员知悉的,在不脱离 本发明的精神和范围的情况下,可以对这些特征和实施例进行各种改变或等效替换。另外, 在本发明的教导下,可以对这些特征和实施例进行修改以适应具体的情况及材料而不会脱 离本发明的精神和范围。因此,本发明不受此处所公开的具体实施例的限制,所有落入本 申请的权利要求范围内的实施例都属于本发明所保护的范围内。It can be understood that the present invention is described by some embodiments, and those skilled in the art know that various changes or equivalent substitutions can be made to these features and embodiments without departing from the spirit and scope of the present invention. In addition, in the teachings of this invention, these features and embodiments may be modified to adapt a particular situation and material without departing from the spirit and scope of the invention. Therefore, the present invention is not limited by the specific embodiments disclosed herein, and all embodiments falling within the scope of the claims of the present application fall within the protection scope of the present invention.

Claims (7)

1. An infrared detector used in a non-spectroscopic infrared gas sensor is characterized by comprising a substrate (1), a thermopile (2) arranged on the substrate (1), a supporting layer assembly (3) and an absorption layer (4);
the thermopile (2) comprises a cold end (21) of the thermopile and a hot end (22) of the thermopile, the cold end (21) of the thermopile is attached to the substrate (1), a heat conduction through hole (7) is formed in the hot end (22) of the thermopile, the heat conduction through hole (7) is connected with the hot end (22) and the absorption layer (4), and the back of the bottom of the hot end (22) of the thermopile is etched to form a back cavity (5) to form a suspension structure;
the thermopile (2) comprises a plurality of pairs of thermocouples (6);
the multiple pairs of thermocouples (6) are arranged in a double-layer stacking mode, and each thermocouple (6) comprises a first thermocouple strip (61) and a second thermocouple strip (62), wherein the first thermocouple strips (61) are sequentially arranged on the substrate (1), and the second thermocouple strips (62) are arranged on the first thermocouple strips (61);
the heat conduction through hole (7) is arranged in the silicon oxide layer on the upper part of the second thermocouple strip (62);
the support layer assembly (3) is arranged between the substrate (1) and the thermopile (2);
the absorption layer (4) is arranged on the upper part of the thermopile (2).
2. The infrared detector of claim 1, wherein said first thermocouple strip (61) comprises a hot end of the first thermocouple strip (61) and a cold end of the first thermocouple strip (61), and said second thermocouple strip (62) comprises a hot end of the second thermocouple strip (62) and a cold end of the second thermocouple strip (62); the hot end of the first thermocouple strip (61) is connected with the hot end of the second thermocouple strip (62), and the cold end of the first thermocouple strip (61) is connected with the cold end of the adjacent second thermocouple strip (62), so that the first thermocouple (62) and the second thermocouple (61) are connected in series, and the adjacent thermocouple strips (6) are also connected in series.
3. The infrared detector for use in a non-spectroscopic infrared gas sensor according to claim 2 wherein a first silicon oxide layer (31) is filled between the first thermocouple strip (61) and the second thermocouple strip (62), and between the adjacent thermocouples (6).
4. The infrared detector for use in a non-spectroscopic infrared gas sensor according to claim 1 wherein the support layer assembly (3) comprises a first silicon oxide layer (31), a silicon nitride layer (32) and a second silicon oxide layer (33) arranged in that order.
5. The infrared detector for use in a non-spectroscopic infrared gas sensor according to claim 1 wherein the material of the thermal via (7) and the absorbing layer (4) is silicon nitride.
6. The infrared detector for use in a non-spectroscopic infrared gas sensor as set forth in claim 1, wherein the substrate (1) is divided into four regions by diagonal division, and a plurality of thermocouples (6) connected in series in parallel to each other are arranged at 45 ° in each region, and the central region of the diagonal division is an absorption region (8).
7. An infrared detector as used in a non-spectroscopic infrared gas sensor in accordance with claim 1 wherein the cold end (22) of the thermopile and the hot end (21) of the thermopile are respectively located at opposite ends of the thermopile (2), the first thermocouple strip (61) being of N-doped silicon and the second thermocouple strip (62) being of P-doped silicon.
CN202210593000.1A 2022-05-27 2022-05-27 Infrared detector for non-dispersive infrared gas sensor Pending CN114975755A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210593000.1A CN114975755A (en) 2022-05-27 2022-05-27 Infrared detector for non-dispersive infrared gas sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210593000.1A CN114975755A (en) 2022-05-27 2022-05-27 Infrared detector for non-dispersive infrared gas sensor

Publications (1)

Publication Number Publication Date
CN114975755A true CN114975755A (en) 2022-08-30

Family

ID=82957984

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210593000.1A Pending CN114975755A (en) 2022-05-27 2022-05-27 Infrared detector for non-dispersive infrared gas sensor

Country Status (1)

Country Link
CN (1) CN114975755A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116963574A (en) * 2023-09-18 2023-10-27 上海芯龙半导体技术股份有限公司 Infrared thermopile sensor and manufacturing method thereof

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130026366A1 (en) * 2010-04-14 2013-01-31 Excelitas Canada Inc. Vertically stacked thermopile
US20150168221A1 (en) * 2012-08-23 2015-06-18 Jiangsu R&D Center For Internet Of Things Black silicon-based high-performance mems thermopile ir detector and fabrication method
CN111412996A (en) * 2020-04-15 2020-07-14 无锡物联网创新中心有限公司 Thermopile infrared detector and heat conduction structure thereof
CN112670397A (en) * 2020-12-18 2021-04-16 江苏物联网研究发展中心 Thermopile infrared detector and manufacturing method thereof

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130026366A1 (en) * 2010-04-14 2013-01-31 Excelitas Canada Inc. Vertically stacked thermopile
US20150168221A1 (en) * 2012-08-23 2015-06-18 Jiangsu R&D Center For Internet Of Things Black silicon-based high-performance mems thermopile ir detector and fabrication method
CN111412996A (en) * 2020-04-15 2020-07-14 无锡物联网创新中心有限公司 Thermopile infrared detector and heat conduction structure thereof
CN112670397A (en) * 2020-12-18 2021-04-16 江苏物联网研究发展中心 Thermopile infrared detector and manufacturing method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116963574A (en) * 2023-09-18 2023-10-27 上海芯龙半导体技术股份有限公司 Infrared thermopile sensor and manufacturing method thereof
CN116963574B (en) * 2023-09-18 2023-12-15 上海芯龙半导体技术股份有限公司 Infrared thermopile sensor and manufacturing method thereof
WO2025060930A1 (en) * 2023-09-18 2025-03-27 上海芯龙半导体技术股份有限公司 Infrared thermopile sensor and manufacturing method therefor

Similar Documents

Publication Publication Date Title
KR0135119B1 (en) Infrared detector
CN1104634C (en) Thermopile sensor and radiation thermometer with a thermopile sensor
US6690014B1 (en) Microbolometer and method for forming
JP2019518960A (en) Thermopile infrared single sensor for temperature measurement or gas detection
TWI510766B (en) Shared membrane thermopile sensor array
KR100313909B1 (en) IR sensor and method for fabricating the same
CN111174908A (en) Laser detector and corresponding laser power meter
US20130206989A1 (en) Radiation Sensor
EP3060891A1 (en) Thermally shorted bolometer
CN114975755A (en) Infrared detector for non-dispersive infrared gas sensor
KR101072290B1 (en) thermoelectric sensor using Ge material
US9658110B1 (en) Thermal sensor combination
Hiromoto et al. Room-temperature THz antenna-coupled microbolometer with a Joule-heating resistor at the center of a half-wave antenna
JP3303786B2 (en) Bolometer type infrared sensor
KR20170024456A (en) Infrared detector and infrared thermal sensor having thereof
KR101383918B1 (en) Microbolometer type wide range vaccum sensor and ir sensor including the same
CN114459603B (en) High-power laser sensor and laser power meter
RU2456559C1 (en) Thermal radiation receiver
KR20150108058A (en) The MEMS thermopile sensor and Method of fabricating the same
CN211717619U (en) Laser detector and corresponding laser power meter
JP3775830B2 (en) Infrared detector
KR101734080B1 (en) Thermopile device with thermoshiled hole, and thereof temperature sensor
CN111239479A (en) Integrated self-calibration radiation power sensor chip and radiation power measurement method
RU2258207C1 (en) Bolometric resistive element
JP2001091364A (en) Thermoelectric sensor device and method of manufacturing the same

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination