CN115372914B

CN115372914B - A method for processing and analyzing radome electrical thickness data

Info

Publication number: CN115372914B
Application number: CN202210852510.6A
Authority: CN
Inventors: 付启航; 王克先; 柴永伟
Original assignee: AVIC Research Institute Special Structures Aeronautical Composites
Current assignee: AVIC Research Institute Special Structures Aeronautical Composites
Priority date: 2022-07-20
Filing date: 2022-07-20
Publication date: 2025-07-15
Anticipated expiration: 2042-07-20
Also published as: CN115372914A

Abstract

The invention belongs to the field of radome electrical performance test, and discloses a radome electrical thickness data processing and analysis method, comprising the following steps: step one: importing radome electrical thickness test data, and connecting the test data of each radome station into a test data curve; step two: starting data processing and analysis from radome head station a, and initializing n to 1; step three: judging whether the overlap degree between the test data curve of head station a and the test data curve of station a+n reaches the overlap degree threshold; if so, n=n+1, and repeating step three; otherwise, entering step four; step four: taking any test data curve in the station [a, a+n] as a representative, uniformly analyzing the data in the station [a, a+n]; determining an out-of-tolerance curve segment in the test data curve, and determining an out-of-tolerance area of the out-of-tolerance curve segment; step five: determining an out-of-tolerance value of the out-of-tolerance curve segment; step six: outputting radome electrical thickness correction data according to the out-of-tolerance value.

Description

Radome electrical thickness data processing and analyzing method

Technical Field

The invention belongs to the technical field of radome testing, and particularly relates to a radome electric thickness data processing and analyzing method.

Background

The Insertion Phase Delay (IPD), i.e. the electrical thickness, is an important parameter affecting the electrical performance index of the radome, reflecting the integrated effect of parameters such as the dielectric constant, the alidade geometry thickness, etc. of the radome on the electrical performance of the radome. The detection and correction technology of the electric thickness is an important technical means for developing and producing the high-performance radome, so that an accurate and reasonable electric thickness data processing method is a key for testing the electric thickness.

The traditional electric thickness data processing does not form a standard and effective processing analysis flow, and the problems of non-uniform output form of correction data and low identification efficiency are solved.

Disclosure of Invention

The invention aims to solve the technical problems that the traditional electrical thickness data processing does not form a standard and effective processing and analyzing flow, the output form of correction data is not uniform, and the identification efficiency is low. By the method for analyzing the electrical thickness test data of the formation system, the test data can be analyzed and processed to form standard and visual correction data for the correction mark of the radar cover at the later stage.

A radome electrical thickness data processing and analyzing method comprises the following steps:

firstly, importing radar cover electric thickness test data, and respectively connecting the test data of each radar cover station into a test data curve;

step two, data processing analysis is started from a radar cover head station position a, and n is initialized to be 1;

judging whether the coincidence degree of the test data curve of the head station a and the test data curve of the station a+n reaches a coincidence degree threshold value, if so, n=n+1, and repeating the step III, otherwise, entering the step IV;

Step four, uniformly analyzing the data in the station positions [ a, a+n ] by taking any test data curve in the station positions [ a, a+n ] as a representative;

step five: determining an out-of-tolerance value of the out-of-tolerance curve segment;

and step six, outputting radome electric thickness correction data according to the out-of-tolerance value.

Further, in the third step, the overlap ratio threshold is not lower than 90%.

Further, in the fourth step, the out-of-tolerance curve segment refers to a curve segment in the test data curve, which is higher than the upper limit value of the standard curve or lower than the lower limit value of the standard curve.

In the fourth step, the out-of-tolerance area is the union of the angle ranges of the abscissa loop of all out-of-tolerance curve segments.

Further, in the fifth step, each of the out-of-tolerance curve segments corresponds to an out-of-tolerance value, and the out-of-tolerance value is a mode of the test data in each of the out-of-tolerance curve segments.

In the fifth step, if there is a data spike in the out-of-tolerance curve segment, all the test data in the data spike are not considered when determining the out-of-tolerance value;

The data peak refers to that an extremum exists on the test data curve and is at least 2 degrees larger than the average value in the out-of-tolerance range, and then the extremum and the connecting line of the two ends of the extremum are calculated as the data peak on the test data curve.

Further, if the loop angle of the data spike is less than 15 °, all test data in the data spike is normalized to the mode of the test data in the out-of-tolerance curve segment in which the data spike is located when the out-of-tolerance value is determined.

Further, if the loop angle of the data peak is more than or equal to 15 degrees, dividing the data peak into an independent out-of-tolerance curve segment, and independently determining the out-of-tolerance range and the out-of-tolerance value of the data peak, wherein the out-of-tolerance value of the data peak with the loop angle of more than or equal to 15 degrees is the fixed integral average value of the extreme value of the data peak on the test data curve.

The radar cover electrical thickness data processing and analyzing method has the beneficial effects that the data processing and analyzing operation is unified and standardized by designing the processing flow of electrical thickness test data, and the accuracy of data processing is improved. And setting a threshold value of the overlap ratio of the station a curve and the station a+n curve, and setting a threshold value of the data peak range in the test data, so that the efficiency and the quality of data processing analysis can be improved.

Drawings

FIG. 1 is a flow chart of radome electrical thickness data processing analysis;

Fig. 2 is a schematic diagram of radome electrical thickness test data.

Detailed Description

The radome site is defined as the axial distance from the current test location to the radome convergence point. And importing test data, wherein the test data are used for connecting each test data point according to a station position as a unit to generate a corresponding test data curve, each curve can represent the positive circle (0-360 DEG) test data of the station position where the curve is located, the abscissa displayed by the test data curve is the loop angle of the radar cover along the course, and the ordinate is the electrical thickness test value of the test. The purpose of the data processing is to correct the test data curve between the upper and lower standard curve limits. The analysis method is as follows:

Firstly, judging whether the coincidence ratio of the front station test curve and the rear station test curve can reach a set threshold, if so, carrying out unified processing on the curves of the station intervals, and if not, carrying out one-by-one analysis on the station test curves. And then, comparing the trend of the standard curve and the trend of the test data curve, and analyzing to obtain the out-of-tolerance area and the out-of-tolerance value of the station test data curve section. And secondly, judging whether the data peak in the out-of-tolerance area exceeds a set threshold, if so, further refining the out-of-tolerance area and the out-of-tolerance range, and if not, merging and superposing to form correction unit data of the station space or the station. And finally judging whether the current station curve is the last curve, if not, returning the station number +1 to continue to judge, and if so, ending the analysis.

The flow of the radome electrical thickness data processing analysis is shown in fig. 1, the test curve of fig. 2 is taken as an applicable object for analysis, and the specific data processing analysis steps are as follows:

step 101, processing the test data is started.

And 102, importing test data, and connecting each test data point by the test data according to the station position as a unit to generate a corresponding test data curve.

Step 103, data analysis starts with judging from the head station position a of the radome, and n is set to 1.

And 104, judging whether the coincidence degree of the station position a curve and the station position a+n curve can reach 95%.

Step 105, if n=n+1 can be reached, return to step 104 and then judge the curve, and so on until the non-overlapping station curve appears.

And 106, uniformly analyzing and processing the data of the station range of [ a, a+n ]. And analyzing the loop line angle (abscissa) of the out-of-tolerance area in the [ a, a+n ] station bit interval. As shown in fig. 2, the graph is a graph of analysis cases. The difference in electrical thickness between the upper limit of the standard curve and the lower limit of the standard curve is 2 deg.. The 2 parts of the test data curve are higher than the upper limit value of the standard curve, and the out-of-tolerance area of the station data curve is analyzed to be (0-180 DEG) and (312-335 DEG). Considering the error influence of later identification and the identification of angles, rounding the range of the out-of-tolerance area to be a multiple of 5, and analyzing to obtain out-of-tolerance areas (0-180) and (315-330) of the station data curve.

Step 107, analyzing the out-of-tolerance value (ordinate) of the out-of-tolerance value in the [ a, a+n ] station bit interval. The above step has determined the over-run region, this step is to determine the over-run value of each over-run region, to correct the test data curve to be between the upper and lower limits of the standard curve, the over-run region (0-180) needs to be reduced by 1.5 °, and the over-run region (315-330) needs to be reduced by 1 °. Thus, the out-of-tolerance value of each out-of-tolerance region can be obtained.

In step 108, the peak value of the electrical thickness of the data peak is high, but the angle is small, the performance of the whole station is affected due to poor processing, and the existence of the data peak in the out-of-tolerance area is judged.

And 109, if the loop angle of the data peak is more than or equal to 15 degrees, refining the out-of-tolerance region and the out-of-tolerance value, performing secondary analysis on the data peak region, and returning to the step 106. Data spikes are processed as in steps 106 and 107.

Step 110, if the data peak value does not exceed the threshold range of 15 °, merging and classifying to form correction unit data of [ a, a+n ] station, and outputting a corresponding report, wherein the correction unit in fig. 2 is shown in table 1. As the data spike of the test data curve in fig. 2 does not exceed the threshold, merging of correction unit data may be performed.

Step 111, it is determined whether the curve of the current station a+n is the last curve.

Step 112, if it is not the last day curve, the current station +1, i.e. a=n+1, returns to step 104 to make a new station judgment.

In step 113, if the last curve is the last curve, the analysis ends.

Table 1 correction unit data

。

Claims

1. A method for processing and analyzing radome electrical thickness data, characterized in that the method comprises the following steps:

Step 1: Import the radome electrical thickness test data and connect the test data of each radome station into a test data curve;

Step 2: Data processing and analysis starts from the radome head position a, and n is initialized to 1;

Step 3: Determine whether the overlap between the test data curve of the head position a and the test data curve of the position a+n reaches the overlap threshold; if so, n=n+1, and repeat step 3; otherwise, proceed to step 4;

Step 4: Taking any test data curve in the [a, a+n] station as a representative, conduct a unified analysis of the data in the [a, a+n] station; determine the out-of-tolerance curve segment in the test data curve, and determine the out-of-tolerance area of the out-of-tolerance curve segment;

Step 5: Determine the deviation value of the deviation curve segment; each deviation curve segment corresponds to an deviation value, and the deviation value is the mode of the test data in each deviation curve segment. If there is a data peak in the deviation curve segment and the loop angle of the data peak is less than 15°, then when determining the deviation value, all the test data in the data peak are normalized to the mode of the test data in the deviation curve segment where the data peak is located; if there is a data peak in the deviation curve segment and the loop angle of the data peak is ≥15°, then the data peak is divided into a separate deviation curve segment, and the deviation range and deviation value of the data peak are determined separately; the deviation value of the data peak with a loop angle ≥15° is the definite integral average value of the extreme value of the data peak on the test data curve;

Step 6: Output the radome electrical thickness correction data according to the deviation value.

2. The radar cover electrical thickness data processing and analysis method according to claim 1 is characterized in that: in the step three, the overlap threshold is not less than 90%.

3. The radar cover electrical thickness data processing and analysis method according to claim 1 is characterized in that: in the step 4, the out-of-tolerance curve segment refers to a curve segment in the test data curve that is higher than the upper limit value of the standard curve or lower than the lower limit value of the standard curve.

4. The method for processing and analyzing the electrical thickness data of the radome according to claim 3 is characterized in that: in the step 4, the out-of-tolerance area is the union of the angle ranges of the horizontal coordinate loops of all out-of-tolerance curve segments.

5. The method for processing and analyzing the radome electrical thickness data according to claim 4, characterized in that:

The data peak means that: there is an extreme value on the test data curve and the extreme value is at least 2° larger than the mean value within the tolerance range. The extreme value and the part of the line connecting the two ends of the test data curve that is larger than the mean value within the tolerance range are counted as data peaks.