CN115373010A - Intelligent X-ray optical system based on magnetic deformation material - Google Patents

Abstract

The invention belongs to the technical fields of X-ray optical analysis, optical design and optical simulation, and provides an intelligent X-ray optical system based on magneto-deformable materials, which includes an X-ray focusing system, an X-ray detector, an X-ray image analysis system, Magnetic field generation and control device. The self-correcting X-ray optical system based on the magneto-deformable material of the present invention can correct the processing error, assembly error and thermal deformation error of the optical system in real time, and can well improve the resolution and environmental adaptability of the optical system. This system can generate a rapidly changing X-ray focusing path, which can reduce the axial size of the optical system. At the same time, compared with the traditional adaptive optics, the system does not contain wavefront sensors and wavefront correctors, nor does it contain the surface shape of the participating optical system. The adjusted sensor saves the complicated driving device for changing the surface shape, and can make the X-ray optical system more miniaturized and integrated.

Description

An intelligent X-ray optical system based on magneto-deformable materials

technical field

The invention belongs to the technical fields of X-ray optical analysis, optical design, optical simulation and the like, and in particular relates to an intelligent X-ray optical system based on magneto-deformable materials.

Background technique

X-ray optical system plays an important role in space X-ray detection, space X-ray imaging detection, space X-ray communication and other fields. It can focus and image the weak X-ray photons in space, and then use the processing circuit to process them. Analysis, in order to achieve the purpose of X-ray detection.

In the X-ray band, there is absorption in the refractive index of the medium in the X-ray wavelength region, and its refractive index is 1-δ+iβ. Compared with the optical constants in the visible light band, δ occupies a more important position, where both δ and β are functions of wavelength. δ is relatively small, usually between 10 ^-5 -10 ^-7 , so 1-δ is very close to 1, causing its phase change to be extremely slow, often requiring a long path or a rapidly changing path to cause phase delay of X-rays , so that it is focused on the image. At present, the commonly used soft X-ray focusing method is mainly to focus it through a long path, and the grazing incidence type (Wolter, KB) belongs to this method.

However, when using this method to focus X-rays, due to the existence of factors such as optical system processing errors, assembly errors, and thermal deformation errors, large detection errors occur, and it is often necessary to configure wavefront sensors, wavefront correctors, and optical systems. The sensor for adjusting the surface shape and the complex driving device for changing the surface shape make the whole system large in size and weight, which cannot meet the needs of future lightweight X-ray detection.

Contents of the invention

In order to solve the problems existing in the background technology, the present invention provides an intelligent X-ray optical system based on magneto-deformable materials. Through the corresponding wavefront correction technology and the rapid change of the mirror surface shape, the X-ray can obtain a rapidly changing path, thereby The volume and weight of the corresponding optical system can be reduced. And through the self-calibration technology of the optical system, the system can adapt to the complex application environment changes on the orbit and meet the application requirements of the future self-correction high-resolution X-ray imaging system. Its specific technical scheme is as follows:

An intelligent X-ray optical system based on magneto-deformable materials, which includes an X-ray focusing system, an X-ray detector, an X-ray image analysis system, and a magnetic field generation and control device, wherein:

The X-ray focusing system is provided with a magneto-deformable material, and during the process of focusing and imaging the X-ray photons in space, the focusing parameters can be corrected through the change of the surface shape of the magneto-deformable material;

The X-ray detector is used to receive the X-ray signal focused by the X-ray focusing system and convert it into an electrical signal;

The X-ray image analysis system is used to analyze the X-ray images collected by the X-ray detector to generate deformation parameters and feed them back to the magnetic field generation and control device;

The magnetic field generation and control device is used to generate a specific magnetic field according to the received deformation parameters of the X-ray image analysis system to correct the surface shape change of the X-ray focusing system.

Further, the X-ray focusing system includes four parts: a focusing system substrate, a deposition layer, a magneto-deformable material, and an X-ray high-reflection film, wherein the focusing system substrate is the main support structure of the X-ray focusing system; the deposition layer will focus The system substrate and the magneto-deformable material are combined; the magneto-deformable material is a deformable material that can produce corresponding surface changes; the X-ray high-reflection film is coated on the surface of the magneto-deformable material to improve the reflectivity of X-ray photons .

In a preferred solution, the focusing system substrate is made of metal material or glass material.

Further, the X-ray image analysis system analyzes the X-ray images collected by the X-ray detector, determines the change of the wavefront shape of the system, and fits the wavefront deformation, generates corresponding deformation parameters, and feeds back to the magnetic field generation and control device.

Further, the magnetic field generation and control device sets different bias voltages for the electromagnetic field according to the surface shape change information fed back by the X-ray image analysis system, so that the electromagnetic field produces a corresponding magnetic field change, and controls the magnetostrictive material to produce corresponding deformation through the magnetic field change .

Further, the deformation amount of the magnetostrictive material is calculated by the following formula:

where h _f and h _s are the thicknesses of the substrate and the magnetostrictive material, E _s and V _s are the Young's modulus and Poisson's ratio of the magnetostrictive material, respectively, and b is the strength of the applied magnetic field. By applying different Magnetic field causes it to deform accordingly.

The beneficial effects achieved by the present invention are:

First, the self-correcting X-ray optical system based on magneto-deformable materials of the present invention can correct the processing error, assembly error and thermal deformation error of the optical system in real time, and can improve the resolution and environment of the optical system very well. adaptability.

Second, the present invention can produce a rapidly changing X-ray focusing path, thereby reducing the axial size of the optical system. At the same time, compared with traditional adaptive optics, the system does not contain wavefront sensors and wavefront correctors, nor does it contain participating optics The sensor for adjusting the surface shape of the system eliminates the need for a complex driving device for changing the surface shape, which can make the X-ray optical system more miniaturized and integrated.

Third, in the field of large area array X-ray detection, this system can effectively improve the ratio of mass/effective area, and can effectively increase the X-ray detection area. Applying this system to light and miniaturized pulsar X-ray detection and space-based high-resolution X-ray detection will have important scientific and engineering application value.

Description of drawings

Figure 1 is a system schematic diagram of an intelligent X-ray optical system based on magneto-deformable materials;

Fig. 2 is a schematic structural diagram of an X-ray focusing system.

Labels in the figure:

1. X-ray focusing system; 1-1. Focusing system substrate; 1-2. Deposition layer; 1-3. Magneto-deformable material; 1-4. X-ray high reflection film; 2. X-ray detector; 3. X-ray image analysis system; 4. Magnetic field generation and control device.

Detailed ways

In order to make it easier for those skilled in the art to understand the present invention, the specific implementation manners of the present invention will be described below with reference to the accompanying drawings.

Referring to Figures 1-2, an intelligent X-ray optical system based on magneto-deformable materials includes an X-ray focusing system, an X-ray detector, an X-ray image analysis system, a magnetic field generation and control device, wherein the X-ray focusing The system is equipped with a magneto-deformable material, and during the process of focusing and imaging the X-ray photons in space, the focusing parameters can be corrected through the change of the surface shape of the magneto-deformable material. The X-ray focusing system preferably includes four parts: a focusing system substrate, a deposition layer, a magneto-deformable material, and an X-ray high-reflection film, wherein the focusing system substrate is the main support structure of the X-ray focusing system, and the focusing system substrate is a metal material or glass material. The deposition layer combines the focusing system substrate and the magneto-deformable material; the magneto-deformable material is a deformable material that can produce corresponding surface changes; the X-ray high-reflection film is coated on the surface of the magneto-deformable material to improve the X-ray Photon reflectivity.

The X-ray detector is used to receive the X-ray signal focused by the X-ray focusing system and convert it into an electrical signal; the X-ray image analysis system is used to analyze the X-ray image collected by the X-ray detector to generate deformation parameters and feed back To the magnetic field generation and control device; the magnetic field generation and control device is used to generate a specific magnetic field according to the received deformation parameters of the X-ray image analysis system, and correct the surface shape change of the X-ray focusing system.

The X-ray image analysis system analyzes the X-ray images collected by the X-ray detector, determines the change of the wavefront shape of the system, and fits the wavefront deformation, generates corresponding deformation parameters, and feeds back to the magnetic field generation and control device. The magnetic field generation and control device sets different bias voltages on the electromagnetic field according to the surface shape change information fed back by the X-ray image analysis system, so that the electromagnetic field produces a corresponding magnetic field change, and controls the magnetostrictive material to produce corresponding deformation through the magnetic field change.

The deformation of the magnetostrictive material is calculated by the following formula:

where h _f and h _s are the thicknesses of the substrate and the magnetostrictive material, E _s and V _s are the Young's modulus and Poisson's ratio of the magnetostrictive material, respectively, and b is the strength of the applied magnetic field. By applying different Magnetic field causes it to deform accordingly.

The working process of the whole system is as follows: the X-ray focusing system collects the X-ray signals in space, and the X-ray detector detects the focused X-ray signals and converts them into corresponding image information; the X-ray image analysis system analyzes the X-ray signals. The X-ray images collected by the ray detector are analyzed to determine the change of the wavefront shape of the system, and the Zernike polynomial method is used to fit the wavefront deformation. The Zernike polynomial is a polynomial complete set of infinite terms that are continuous and orthogonal inside the unit circle. Corresponding to optical aberration, since the optical wavefront is a comprehensive change produced by various aberrations of the optical system, Zernike polynomials are used for optical wavefront fitting. According to the X-ray image information collected by the image analysis system, using the corresponding relationship between Zernike coefficients and aberrations, the Zernike coefficients are analyzed and obtained, and then converted into and generated corresponding deformation parameters, which are fed back to the magnetic field generation and control device; The magnetic field generation and control device generates a specific magnetic field according to the corresponding deformation parameters, so that the X-ray optical system produces the required surface parameter changes, so as to achieve the purpose of correcting the surface change of the X-ray optical system itself.

The above embodiments of the present invention are not intended to limit the protection scope of the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principle of the present invention shall be included in the protection scope of the claims of the present invention.

Claims (6)

1. An intelligent X-ray optical system based on a magnetically deformable material, comprising: x ray focusing system, X ray detector, X ray image analysis system, magnetic field produce and controlling means, wherein:

the X-ray focusing system is provided with a magneto-deformation material, and can correct focusing parameters through the surface shape change of the magneto-deformation material in the process of focusing and imaging X-ray photons in a space;

the X-ray detector is used for receiving the X-ray signals focused by the X-ray focusing system and converting the X-ray signals into electric signals;

the X-ray image analysis system is used for analyzing the X-ray image collected by the X-ray detector to generate deformation parameters and feeding the deformation parameters back to the magnetic field generation and control device;

the magnetic field generating and controlling device is used for generating a specific magnetic field according to the deformation parameters of the received X-ray image analysis system and correcting the surface shape change of the X-ray focusing system.

2. The intelligent magnetically deformable material-based X-ray optical system of claim 1, wherein: the X-ray focusing system comprises a focusing system substrate, a deposition layer, a magnetic deformation material and an X-ray high-reflection film, wherein:

the focusing system base is a main support structure of an X-ray focusing system;

the deposition layer combines the focusing system substrate and the magnetically deformable material together;

the magnetic deformation material is a deformation material which can generate corresponding surface type change;

the high-reflectivity X-ray film is plated on the surface of the magnetic deformation material and used for improving the reflectivity of X-ray photons.

3. An intelligent X-ray optical system based on a magnetically deformable material, as claimed in claim 2, wherein: the focusing system substrate is made of metal materials or glass materials.

4. An intelligent X-ray optical system based on a magnetically deformable material, as claimed in claim 1, wherein: the X-ray image analysis system analyzes the X-ray image collected by the X-ray detector, determines the change of the wavefront surface of the system, fits the wavefront deformation, generates corresponding deformation parameters and feeds back the deformation parameters to the magnetic field generation and control device.

5. An intelligent X-ray optical system based on a magnetically deformable material, as claimed in claim 1, wherein:

the magnetic field generating and controlling device sets different bias voltages for the electromagnetic field according to the surface type change information fed back by the X-ray image analysis system, so that the electromagnetic field generates corresponding magnetic field change, and the magnetic deformation material is controlled to generate corresponding deformation through the magnetic field change.

6. An intelligent X-ray optical system based on a magnetically deformable material, as claimed in claim 1, wherein: the deformation amount of the magnetically deformable material is calculated by the following formula:

wherein h is _f And h _s Thickness of the substrate and of the magnetically deformable material, respectively, E _s And V _s Respectively the Young modulus and Poisson ratio of the magneto-deformation material, and b is the external magnetic field intensity, and the magneto-deformation material is correspondingly deformed by applying different magnetic fields.

Images