[go: up one dir, main page]

CN116228649A - Method, device, computer equipment and medium for determining cutting path - Google Patents

Method, device, computer equipment and medium for determining cutting path Download PDF

Info

Publication number
CN116228649A
CN116228649A CN202211646091.7A CN202211646091A CN116228649A CN 116228649 A CN116228649 A CN 116228649A CN 202211646091 A CN202211646091 A CN 202211646091A CN 116228649 A CN116228649 A CN 116228649A
Authority
CN
China
Prior art keywords
feature point
distance
determining
point
reference point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202211646091.7A
Other languages
Chinese (zh)
Inventor
戴斌
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Mega Technology Co Ltd
Original Assignee
Suzhou Mega Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Mega Technology Co Ltd filed Critical Suzhou Mega Technology Co Ltd
Priority to CN202211646091.7A priority Critical patent/CN116228649A/en
Publication of CN116228649A publication Critical patent/CN116228649A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/60Analysis of geometric attributes
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/40Extraction of image or video features
    • G06V10/46Descriptors for shape, contour or point-related descriptors, e.g. scale invariant feature transform [SIFT] or bags of words [BoW]; Salient regional features
    • G06V10/462Salient features, e.g. scale invariant feature transforms [SIFT]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10004Still image; Photographic image
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30148Semiconductor; IC; Wafer
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/10Greenhouse gas [GHG] capture, material saving, heat recovery or other energy efficient measures, e.g. motor control, characterised by manufacturing processes, e.g. for rolling metal or metal working

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Multimedia (AREA)
  • Geometry (AREA)
  • Control Of Cutting Processes (AREA)

Abstract

本申请公开了一种确定切割道的方法、装置、计算机设备及介质,其特征在于,所述方法包括:基于待切割芯片行,确定第一特征点与第二特征点,第一特征点与第二特征点之间相距第一距离;基于第一特征点与第二特征点,确定第三特征点,第三特征点与第二特征点之间相距第二距离;基于第一特征点与第三特征点所在的直线,确定切割道。将第一特征点与第三特征点之间的直线作为切割道的方式更加准确。

Figure 202211646091

The present application discloses a method, device, computer equipment and medium for determining a dicing line, wherein the method includes: determining the first feature point and the second feature point based on the row of chips to be cut, the first feature point and the There is a first distance between the second feature points; based on the first feature point and the second feature point, a third feature point is determined, and a second distance is separated between the third feature point and the second feature point; based on the first feature point and the second feature point The straight line where the third feature point is located determines the cutting path. It is more accurate to use the straight line between the first feature point and the third feature point as the cutting line.

Figure 202211646091

Description

一种确定切割道的方法、装置、计算机设备及介质A method, device, computer equipment and medium for determining a cutting line

技术领域technical field

本申请涉及晶圆切割技术领域,特别是涉及一种确定切割道的方法、装置、计算机设备及介质。The present application relates to the technical field of wafer dicing, in particular to a method, device, computer equipment and media for determining dicing lanes.

背景技术Background technique

为了适应设备小型化的趋势,芯片的体积也随之变小,所以对于芯片切割的切割道方向的精度要求更高。In order to adapt to the trend of equipment miniaturization, the size of the chip is also reduced accordingly, so the precision of the direction of the dicing line for chip dicing is required to be higher.

现有技术中的确定切割道的方法如下:首先,确定待切割芯片所在的行;其次,在该行确定第一特征点以及第二特征点;最后,基于第一特征点以及第二特征点的连线确定切割道。由于芯片的晶圆上的分布可能会有所偏差,所以该方法不能保证切割道的精度。The method of determining the dicing lane in the prior art is as follows: first, determine the row where the chip to be cut is located; secondly, determine the first feature point and the second feature point in the row; finally, based on the first feature point and the second feature point The connecting line determines the cutting line. Since the distribution of the chips on the wafer may deviate, this method cannot guarantee the accuracy of the dicing lines.

发明内容Contents of the invention

基于上述问题,本申请提供了一种确定切割道的方法、装置、计算机设备及介质,提高切割道方向的精度。Based on the above problems, the present application provides a method, device, computer equipment and medium for determining a cutting line, so as to improve the accuracy of the direction of the cutting line.

第一方面,本申请提供一种确定切割道的方法,该方法包括:In a first aspect, the present application provides a method for determining a cutting line, the method comprising:

基于待切割芯片行,确定第一特征点与第二特征点,第一特征点与第二特征点之间相距第一距离;Determining a first feature point and a second feature point based on the row of chips to be cut, and a first distance between the first feature point and the second feature point;

基于第一特征点与第二特征点,确定第三特征点,第三特征点与第二特征点之间相距第二距离;determining a third feature point based on the first feature point and the second feature point, and a second distance between the third feature point and the second feature point;

基于第一特征点与第三特征点所在的直线,确定切割道。Based on the straight line where the first feature point and the third feature point are located, the cutting line is determined.

可选地,所述第一特征点与所述第二特征点分别为第一芯片与第二芯片的几何中心。Optionally, the first feature point and the second feature point are geometric centers of the first chip and the second chip, respectively.

可选地,所述基于待切割芯片行,确定第一特征点与第二特征点,包括:Optionally, the determining the first feature point and the second feature point based on the row of chips to be cut includes:

基于待切割芯片行,确定第一参考点与第二参考点,第一参考点与第二参考点之间相距第一距离;Determining a first reference point and a second reference point based on the row of chips to be cut, and a first distance between the first reference point and the second reference point;

基于待切割芯片行的下边界线以及相邻芯片行的上边界线,确定初始切割道;Determining an initial cutting line based on the lower boundary line of the chip row to be cut and the upper boundary line of the adjacent chip row;

基于第一参考点纵坐标所在直线与初始切割道的交点,确定第一特征点;记录第一参考点与切割道之间的第三距离;Determine the first feature point based on the intersection of the straight line where the ordinate of the first reference point is located and the initial cutting line; record the third distance between the first reference point and the cutting line;

基于第二参考点纵坐标所在直线与所述第三距离,确定第二特征点。The second feature point is determined based on the straight line where the ordinate of the second reference point is located and the third distance.

可选地,所述基于第一特征点与第二特征点,确定第三特征点,包括:Optionally, the determining the third feature point based on the first feature point and the second feature point includes:

基于第一参考点与第二参考点,确定第三参考点,所述第三参考点与第二参考点之间相距第二距离;determining a third reference point based on the first reference point and the second reference point, and a second distance between the third reference point and the second reference point;

基于第三参考点纵坐标所在直线与所述第三距离,确定第三特征点。The third feature point is determined based on the straight line where the ordinate of the third reference point is located and the third distance.

可选地,所述第二距离大于所述第一距离。Optionally, the second distance is greater than the first distance.

第二方面,本申请提供一种确定切割道的装置,该装置包括:第一确定模块、第二确定模块以及第三确定模块;In a second aspect, the present application provides a device for determining a cutting line, the device comprising: a first determination module, a second determination module, and a third determination module;

所述第一确定模块,用于基于待切割芯片行,确定第一特征点与第二特征点,第一特征点与第二特征点之间相距第一距离;The first determination module is configured to determine a first feature point and a second feature point based on the row of chips to be cut, and a first distance between the first feature point and the second feature point;

所述第二确定模块,用于基于第一特征点与第二特征点,确定第三特征点,第三特征点与第二特征点之间相距第二距离;The second determination module is configured to determine a third feature point based on the first feature point and the second feature point, and the distance between the third feature point and the second feature point is a second distance;

所述第三确定模块,用于基于第一特征点与第三特征点所在的直线,确定切割道。The third determination module is configured to determine the cutting line based on the straight line where the first feature point and the third feature point are located.

可选地,所述第一特征点与所述第二特征点分别为第一芯片与第二芯片的几何中心。Optionally, the first feature point and the second feature point are geometric centers of the first chip and the second chip, respectively.

可选地,所述第一确定单元,具体用于:Optionally, the first determination unit is specifically configured to:

基于待切割芯片行,确定第一参考点与第二参考点,第一参考点与第二参考点之间相距第一距离;Determining a first reference point and a second reference point based on the row of chips to be cut, and a first distance between the first reference point and the second reference point;

基于待切割芯片行的下边界线以及相邻芯片行的上边界线,确定初始切割道;Determining an initial cutting line based on the lower boundary line of the chip row to be cut and the upper boundary line of the adjacent chip row;

基于第一参考点纵坐标所在直线与初始切割道的交点,确定第一特征点;记录第一参考点与切割道之间的第三距离;Determine the first feature point based on the intersection of the straight line where the ordinate of the first reference point is located and the initial cutting line; record the third distance between the first reference point and the cutting line;

基于第二参考点纵坐标所在直线与所述第三距离,确定第二特征点。The second feature point is determined based on the straight line where the ordinate of the second reference point is located and the third distance.

可选地,第二确定单元,具体用于:Optionally, the second determining unit is specifically used for:

基于第一参考点与第二参考点,确定第三参考点,所述第三参考点与第二参考点之间相距第二距离;determining a third reference point based on the first reference point and the second reference point, and a second distance between the third reference point and the second reference point;

基于第三参考点纵坐标所在直线与所述第三距离,确定第三特征点。The third feature point is determined based on the straight line where the ordinate of the third reference point is located and the third distance.

第三方面,本申请提供一种计算机设备,包括:存储器,处理器,及存储在所述存储器上并可在所述处理器上运行的计算机程序,所述处理器执行所述计算机程序时,实现如第一方面任一项所述的确定切割道的方法。In a third aspect, the present application provides a computer device, including: a memory, a processor, and a computer program stored on the memory and operable on the processor. When the processor executes the computer program, The method for determining a cutting line as described in any one of the first aspect is realized.

第四方面,本申请提供一种计算机可读存储介质,所述计算机可读存储介质中存储有指令,当所述指令在终端设备上运行时,使得所述终端设备执行如第一方面任一项所述的确定切割道的方法。In a fourth aspect, the present application provides a computer-readable storage medium, where instructions are stored in the computer-readable storage medium, and when the instructions are run on a terminal device, the terminal device executes any one of the above aspects of the first aspect. The method of determining the cutting line described in the item.

首先,基于待切割芯片行,确定第一特征点与第二特征点,第一特征点与第二特征点之间相距第一距离;然后,基于第一特征点与第二特征点,确定第三特征点,第三特征点与第二特征点之间相距第二距离;最后,基于第一特征点与第三特征点所在的直线,确定切割道。First, based on the row of chips to be cut, determine the first feature point and the second feature point, and the first distance between the first feature point and the second feature point; then, based on the first feature point and the second feature point, determine the first feature point Three feature points, a second distance between the third feature point and the second feature point; finally, the cutting line is determined based on the straight line where the first feature point and the third feature point are located.

相较于传统的确定切割道的方法,即直接利用第一特征点以及第二特征点确定切割道。本申请通过利用第一特征点以及第二特征点确定第三特征点,再将第一特征点与第三特征点之间的连线方向作为切割道的方法,包含了对切割道的调整过程,即如果第一特征点与第三特征点确定的直线相较于第一特征点与第二特征点确定的直线存在夹角,将第一特征点与第三特征点之间的直线作为切割道的方式更加准确。Compared with the traditional method of determining the cutting line, the first feature point and the second feature point are directly used to determine the cutting line. This application uses the first feature point and the second feature point to determine the third feature point, and then uses the connection direction between the first feature point and the third feature point as the method of the cutting line, which includes the adjustment process of the cutting line , that is, if the line determined by the first feature point and the third feature point has an included angle compared with the line determined by the first feature point and the second feature point, the line between the first feature point and the third feature point is used as the cut way is more accurate.

附图说明Description of drawings

为了更清楚地说明本申请实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动性的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present application. Those skilled in the art can also obtain other drawings based on these drawings without any creative effort.

图1为本申请实施例提供的一种确定切割道的方法的流程图;FIG. 1 is a flowchart of a method for determining a cutting line provided in an embodiment of the present application;

图2为本申请实施例提供的一种确定切割道的方法对应的示意图;FIG. 2 is a schematic diagram corresponding to a method for determining a cutting line provided in an embodiment of the present application;

图3为本申请实施例提供的另一种确定切割道的方法对应的示意图;FIG. 3 is a schematic diagram corresponding to another method for determining a cutting line provided in the embodiment of the present application;

图4为本申请实施例提供的一种确定切割道的装置的结构示意图。Fig. 4 is a schematic structural diagram of a device for determining a cutting line provided by an embodiment of the present application.

具体实施方式Detailed ways

本申请说明书和权利要求书及附图说明中的术语“第一”、“第二”和“第三”等是用于区别不同对象,而不是用于限定特定顺序。The terms "first", "second" and "third" in the specification, claims and description of the drawings of this application are used to distinguish different objects, rather than to limit a specific order.

在本申请实施例中,“示例性的”或者“例如”等词用于表示作例子、例证或说明。本申请实施例中被描述为“示例性的”或者“例如”的任何实施例或设计方案不应被解释为比其它实施例或设计方案更优选或更具优势。确切而言,使用“示例性的”或者“例如”等词旨在以具体方式呈现相关概念。In the embodiments of the present application, words such as "exemplary" or "for example" are used as examples, illustrations or illustrations. Any embodiment or design scheme described as "exemplary" or "for example" in the embodiments of the present application shall not be interpreted as being more preferred or more advantageous than other embodiments or design schemes. Rather, the use of words such as "exemplary" or "such as" is intended to present related concepts in a concrete manner.

正如前文描述,目前确定切割道的方法是通过直接利用待切割芯片所在的行上的第一特征点以及第二特征点确定切割道。但是,晶圆上芯片的布局存在一定的偏差,若直接将第一特征点与第二特征点所在的直线确定为切割道,会导致切割道出现偏差进而有可能导致芯片被切坏。经过研究,若芯片在晶圆上的排布存在偏差时,可以对切割道进行调整以避免因切割道的不准确而导致的芯片损坏。As described above, the current method for determining the dicing lane is to determine the dicing lane by directly using the first feature point and the second feature point on the row where the chip to be diced is located. However, there is a certain deviation in the layout of the chip on the wafer. If the straight line where the first feature point and the second feature point are located is directly determined as the dicing line, deviations in the dicing line will occur and the chip may be cut. After research, if there is a deviation in the arrangement of the chips on the wafer, the dicing lines can be adjusted to avoid chip damage caused by inaccurate dicing lines.

有鉴于此,本申请提供一种确定切割道的方法,首先,基于待切割芯片行,确定第一特征点与第二特征点,第一特征点与第二特征点之间相距第一距离;然后,基于第一特征点与第二特征点,确定第三特征点,第三特征点与第二特征点之间相距第二距离;最后,基于第一特征点与第三特征点所在的直线,确定切割道。In view of this, the present application provides a method for determining a dicing line. First, based on the row of chips to be cut, determine a first feature point and a second feature point, and a first distance between the first feature point and the second feature point; Then, based on the first feature point and the second feature point, determine the third feature point, the second distance between the third feature point and the second feature point; finally, based on the straight line where the first feature point and the third feature point are located , to determine the cutting path.

上述方法可以应用于划片机中,划片机是以强力磨削为手段The above method can be applied to the dicing machine, which uses strong grinding as a means

为了使本技术领域的人员更好地理解本申请方案,下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅是本申请一部分实施例,而不是全部的实施例。基于本申请中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。In order to enable those skilled in the art to better understand the solution of the application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the drawings in the embodiment of the application. Obviously, the described embodiment is only It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

参见图1,该图为本申请实施例提供的一种确定切割道的方法的流程图。Referring to FIG. 1 , this figure is a flow chart of a method for determining a cutting line provided by an embodiment of the present application.

如图1所示,该方法包括:As shown in Figure 1, the method includes:

S101:基于待切割芯片行,确定第一特征点与第二特征点,第一特征点与第二特征点之间相距第一距离。S101: Determine a first feature point and a second feature point based on a row of chips to be cut, and a first distance between the first feature point and the second feature point.

芯片在晶圆上是规则排布的,在切割之前可以先确定想要切割的芯片所位于的芯片行,如第一芯片行、第二芯片行或第三芯片行等。The chips are regularly arranged on the wafer, and the chip row where the chip to be cut is located can be determined before cutting, such as the first chip row, the second chip row or the third chip row, etc.

作为一种可能的实现方式,第一特征点以及第二特征点可以是待切割芯片行上第一芯片的几何中心与第二芯片的几何中心。其中,第一特征点与第二特征点之间的距离为第一距离。As a possible implementation manner, the first feature point and the second feature point may be the geometric center of the first chip and the geometric center of the second chip on the row of chips to be cut. Wherein, the distance between the first feature point and the second feature point is the first distance.

优选地,第一距离可以为芯片宽度的一倍或两倍。Preferably, the first distance can be one or two times the chip width.

通过上述实现方式确定第一特征点与第二特征点,可以直接通过芯片的几何中心位置确定出切割道的方向,可以快速确定出切割道的方向并且该方式可操作性强。By determining the first feature point and the second feature point in the above implementation manner, the direction of the cutting line can be determined directly through the geometric center position of the chip, and the direction of the cutting line can be quickly determined, and this method is highly operable.

作为一种可能的实现方式,第一特征点以及第二特征点可以是与待切割芯片行上第一芯片的几何中心与第二芯片的几何中心平行的点。具体地,基于待切割芯片行,确定第一参考点与第二参考点,第一参考点与第二参考点之间相距第一距离;基于待切割芯片行的下边界线以及相邻芯片行的上边界线,确定初始切割道;基于第一参考点纵坐标所在直线与初始切割道的交点,确定第一特征点;记录第一参考点与切割道之间的第三距离;基于第二参考点纵坐标所在直线与所述第三距离,确定第二特征点。As a possible implementation manner, the first feature point and the second feature point may be points parallel to the geometric center of the first chip and the geometric center of the second chip on the row of chips to be cut. Specifically, based on the row of chips to be cut, the first reference point and the second reference point are determined, and the distance between the first reference point and the second reference point is a first distance; based on the lower boundary line of the row of chips to be cut and the Determine the initial cutting line on the upper boundary line; determine the first feature point based on the intersection of the straight line where the ordinate of the first reference point is located and the initial cutting line; record the third distance between the first reference point and the cutting line; Determine the second feature point from the straight line where the ordinate of the point is located and the third distance.

通过上述实现方式,不仅仅局限于确定出切割道的方向,是一种快速确定切割道的方式。除此之外,该方式确由于直接通过特征点确定出切割道,相较于通过切割道方向确定切割道的方式而言,由于省略了基于切割道方向进行平移的步骤,该方式确定出的切割道更加的准确。Through the above implementation, it is not limited to determining the direction of the cutting line, but it is a way to quickly determine the cutting line. In addition, this method does determine the cutting line directly through the feature points. Compared with the method of determining the cutting line through the direction of the cutting line, because the step of translation based on the direction of the cutting line is omitted, the determined line Cutting lanes are more accurate.

S102:基于第一特征点与第二特征点,确定第三特征点,第三特征点与第二特征点之间相距第二距离。S102: Determine a third feature point based on the first feature point and the second feature point, where a second distance is between the third feature point and the second feature point.

作为一种可能的实现方式,第三特征点可以是第三芯片的几何中心。其中,第三芯片可以与第一芯片以及第二芯片均位于待切割芯片行,其中,第一特征点与第二特征点之间的距离为第二距离。As a possible implementation manner, the third feature point may be the geometric center of the third chip. Wherein, the third chip may be located in a row of chips to be cut together with the first chip and the second chip, wherein the distance between the first feature point and the second feature point is the second distance.

作为一种可能的实现方式,第三特征点可以是与待切割芯片行上第三芯片的平行的点。具体地,基于第一参考点与第二参考点,确定第三参考点,第三参考点与第二参考点之间相距第二距离;基于第三参考点纵坐标所在直线与所述第三距离,确定第三特征点。As a possible implementation manner, the third feature point may be a point parallel to the third chip on the row of chips to be cut. Specifically, based on the first reference point and the second reference point, determine the third reference point, and the second distance between the third reference point and the second reference point; distance to determine the third feature point.

需要注意的是,第二距离大于第一距离。也就是说,第二距离至少为芯片宽度的三倍以上,具体值可以根据用户的实际需求自行设定。It should be noted that the second distance is greater than the first distance. That is to say, the second distance is at least three times the width of the chip, and the specific value can be set according to the actual needs of the user.

S103:基于第一特征点与第三特征点所在的直线,确定切割道。S103: Determine the cutting line based on the straight line where the first feature point and the third feature point are located.

作为一种可能的实现方式,可以通过将第一特征点与第三特征点所在的直线确定为切割道的方向,基于该方向确定切割道。As a possible implementation manner, the straight line where the first feature point and the third feature point are located may be determined as the direction of the cutting line, and the cutting line is determined based on the direction.

作为一种可能的实现方式,第一特征点与第三特征点所在的之间即为切割道。As a possible implementation manner, the cutting line is located between the first feature point and the third feature point.

将第一特征点与第三特征点之间的连线方向作为切割道的方法,包含了对切割道的调整过程,即如果第一特征点与第三特征点确定的直线相较于第一特征点与第二特征点确定的直线存在夹角,将第一特征点与第三特征点之间的直线作为切割道的方式更加准确。The method of using the direction of the line between the first feature point and the third feature point as the cutting line includes the adjustment process of the cutting line, that is, if the straight line determined by the first feature point and the third feature point is compared with the first There is an angle between the line defined by the feature point and the second feature point, and it is more accurate to use the line between the first feature point and the third feature point as the cutting line.

首先,基于待切割芯片行,确定第一特征点与第二特征点,第一特征点与第二特征点之间相距第一距离;然后,基于第一特征点与第二特征点,确定第三特征点,第三特征点与第二特征点之间相距第二距离;最后,基于第一特征点与第三特征点所在的直线,确定切割道。First, based on the row of chips to be cut, determine the first feature point and the second feature point, and the first distance between the first feature point and the second feature point; then, based on the first feature point and the second feature point, determine the first feature point Three feature points, a second distance between the third feature point and the second feature point; finally, the cutting line is determined based on the straight line where the first feature point and the third feature point are located.

相较于传统的确定切割道的方法,即直接利用第一特征点以及第二特征点确定切割道。本申请通过利用第一特征点以及第二特征点确定第三特征点,再将第一特征点与第三特征点之间的连线方向作为切割道的方法,包含了对切割道的调整过程,即如果第一特征点与第三特征点确定的直线相较于第一特征点与第二特征点确定的直线存在夹角,将第一特征点与第三特征点之间的直线作为切割道的方式更加准确。Compared with the traditional method of determining the cutting line, the first feature point and the second feature point are directly used to determine the cutting line. This application uses the first feature point and the second feature point to determine the third feature point, and then uses the connection direction between the first feature point and the third feature point as the method of the cutting line, which includes the adjustment process of the cutting line , that is, if the line determined by the first feature point and the third feature point has an included angle compared with the line determined by the first feature point and the second feature point, the line between the first feature point and the third feature point is used as the cut way is more accurate.

参见图2,该图为本申请实施例提供的一种确定切割道的方法的示意图。Referring to FIG. 2 , this figure is a schematic diagram of a method for determining a cutting line provided by an embodiment of the present application.

在该图中,第一特征点、第二特征点以及第三特征点均位于待切割芯片所在行。其中,第一特征点与第二特征点之间相距第一距离,第二特征点与第三特征点之间相距第二距离,第二距离大于第一距离。In this figure, the first feature point, the second feature point and the third feature point are all located in the row where the chips to be cut are located. Wherein, there is a first distance between the first feature point and the second feature point, a second distance between the second feature point and the third feature point, and the second distance is greater than the first distance.

第一特征点与第三特征点之间的连线为切割道的方向,切割道位于与该方向平行的直线上。The line connecting the first feature point and the third feature point is the direction of the cutting line, and the cutting line is located on a straight line parallel to the direction.

可选地,与该方向平行的直线可以为上下两行芯片间隙的中线,即上面一行芯片下边界线与下面一行芯片上边界线的中线。Optionally, the straight line parallel to this direction may be the midline of the upper and lower rows of chip gaps, that is, the midline of the lower boundary line of the upper row of chips and the upper boundary line of the lower row of chips.

通过采用上述方式确定切割道的方法主要有以下有益效果:其一,通过利用第一特征点以及第二特征点确定第三特征点,再将第一特征点与第三特征点之间的连线方向作为切割道的方法,包含了对切割道的调整过程,即如果第一特征点与第三特征点确定的直线相较于第一特征点与第二特征点确定的直线存在夹角,将第一特征点与第三特征点之间的直线作为切割道的方式更加准确;其二,提供了一种快速确定切割道方向的方法,并且确定出来的切割道方向准确度高。The method of determining the cutting line by using the above method mainly has the following beneficial effects: First, by using the first feature point and the second feature point to determine the third feature point, and then the connection between the first feature point and the third feature point The method of using the line direction as the cutting line includes the adjustment process of the cutting line, that is, if there is an angle between the straight line determined by the first feature point and the third feature point compared with the straight line determined by the first feature point and the second feature point, It is more accurate to use the straight line between the first feature point and the third feature point as the cutting line; secondly, it provides a method for quickly determining the direction of the cutting line, and the determined direction of the cutting line is highly accurate.

参见图3,该图为本申请实施例提供的另一种确定切割道的方法的示意图。Referring to FIG. 3 , this figure is a schematic diagram of another method for determining a cutting line provided by an embodiment of the present application.

在该图中,第一特征点、第二特征点以及第三特征点是与待切割芯片行上第一芯片的几何中心、第二芯片的几何中心以及第三芯片的几何中心平行的点。其具体实现方式为:In this figure, the first feature point, the second feature point, and the third feature point are points parallel to the geometric center of the first chip, the geometric center of the second chip, and the geometric center of the third chip on the row of chips to be cut. Its specific implementation is as follows:

首先,在待切割芯片行确定第一芯片的几何中心(第一参考点)、第二芯片的几何中心(第二参考点)以及第三芯片的几何中心(第三参考点),其中第一参考点与第二参考点之间的相距第一距离,第二参考点与第三参考点之间相距第二距离;First, determine the geometric center (first reference point) of the first chip, the geometric center (second reference point) of the second chip and the geometric center (third reference point) of the third chip in the row of chips to be cut, wherein the first a first distance between the reference point and the second reference point, and a second distance between the second reference point and the third reference point;

然后,将第一参考点在纵坐标方向的延长线与初始切割道的交点确定为第一特征点并记录第一特征点与第一参考点之间的第三距离,将第二参考点在纵坐标方向的延长线上与第二参考点相距第三距离的点作为第二特征点,将第三参考点在纵坐标方向的延长线上与第三参考点相距第三距离的点作为第三特征点;Then, determine the intersection point of the extension line of the first reference point in the ordinate direction and the initial cutting line as the first feature point and record the third distance between the first feature point and the first reference point, and set the second reference point at The point on the extension line in the direction of the ordinate that is the third distance from the second reference point is used as the second feature point, and the point on the extension line in the direction of the ordinate that is the third distance from the third reference point is the point that is the second feature point. Three feature points;

最后,将第一参考点与第三参考点之间的直线确定为切割道。Finally, the straight line between the first reference point and the third reference point is determined as the cutting line.

本方式可以直接将第一特征点与第三特征点所在的直线确定为切割道。相较于图2所对应的方式,本方式可以有效避免因平移所带来的误差。In this manner, the straight line where the first feature point and the third feature point are located can be directly determined as the cutting line. Compared with the method corresponding to FIG. 2 , this method can effectively avoid errors caused by translation.

需要注意的是,本申请说明书附图2以及附图3给出的方式适用于椭圆形的晶圆,但是本申请所提出的确定切割道的方法同样适用于长条状的晶圆,本申请所提供的确定切割道的方法不受晶圆形状的限制。It should be noted that the method given in Figure 2 and Figure 3 of this application specification is applicable to oval wafers, but the method for determining the scribe line proposed in this application is also applicable to strip-shaped wafers. The provided method for determining the scribe line is not limited by the shape of the wafer.

参见图4,该图为本申请实施例提供的一种确定切割道的装置的结构示意图。Referring to FIG. 4 , this figure is a schematic structural diagram of a device for determining a cutting line provided by an embodiment of the present application.

如图4所示,装置包括:第一确定模块401、第二确定模块402以及第三确定模块403;As shown in FIG. 4, the device includes: a first determination module 401, a second determination module 402, and a third determination module 403;

第一确定模块401,用于基于待切割芯片行,确定第一特征点与第二特征点,第一特征点与第二特征点之间相距第一距离;The first determination module 401 is configured to determine a first feature point and a second feature point based on the row of chips to be cut, and a first distance between the first feature point and the second feature point;

第二确定模块402,用于基于第一特征点与第二特征点,确定第三特征点,第三特征点与第二特征点之间相距第二距离;The second determination module 402 is configured to determine a third feature point based on the first feature point and the second feature point, and the second distance between the third feature point and the second feature point;

第三确定模块403,用于基于第一特征点与第三特征点所在的直线,确定切割道。The third determining module 403 is configured to determine the cutting line based on the straight line where the first feature point and the third feature point are located.

可选地,第一确定模块401,具体用于:Optionally, the first determining module 401 is specifically configured to:

基于待切割芯片行,确定第一参考点与第二参考点,第一参考点与第二参考点之间相距第一距离;Determining a first reference point and a second reference point based on the row of chips to be cut, and a first distance between the first reference point and the second reference point;

基于待切割芯片行的下边界线以及相邻芯片行的上边界线,确定初始切割道;Determining an initial cutting line based on the lower boundary line of the chip row to be cut and the upper boundary line of the adjacent chip row;

基于第一参考点纵坐标所在直线与初始切割道的交点,确定第一特征点;记录第一参考点与切割道之间的第三距离;Determine the first feature point based on the intersection of the straight line where the ordinate of the first reference point is located and the initial cutting line; record the third distance between the first reference point and the cutting line;

基于第二参考点纵坐标所在直线与第三距离,确定第二特征点。The second feature point is determined based on the straight line where the ordinate of the second reference point is located and the third distance.

可选地,第一确定模块402,具体用于:Optionally, the first determining module 402 is specifically configured to:

基于第一参考点与第二参考点,确定第三参考点,第三参考点与第二参考点之间相距第二距离;determining a third reference point based on the first reference point and the second reference point, and a second distance between the third reference point and the second reference point;

基于第三参考点纵坐标所在直线与第三距离,确定第三特征点。The third feature point is determined based on the straight line where the ordinate of the third reference point is located and the third distance.

本申请实施例提供一种计算机可读存储介质,其上存储有计算机程序,该程序被处理器执行时实现本申请实施例所述的确定切割道的方法。An embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored, and when the program is executed by a processor, the method for determining a cutting line described in the embodiment of the present application is implemented.

在实际应用中,所述计算机可读存储介质可以采用一个或多个计算机可读的介质的任意组合。计算机可读介质可以是计算机可读信号介质或者计算机可读存储介质。计算机可读存储介质例如可以是但不限于电、磁、光、电磁、红外线、或半导体的系统、装置或器件,或者任意以上的组合。计算机可读存储介质的更具体的例子(非穷举的列表)包括:具有一个或多个导线的电连接、便携式计算机磁盘、硬盘、随机存取存储器(RAM)、只读存储器(ROM)、可擦式可编程只读存储器(EPROM或闪存)、光纤、便携式紧凑磁盘只读存储器(CD-ROM)、光存储器件、磁存储器件、或者上述的任意合适的组合。在本实施例中,计算机可读存储介质可以是任何包含或存储程序的有形介质,该程序可以被指令执行系统、装置或者器件使用或者与其结合使用。In practical applications, the computer-readable storage medium may use any combination of one or more computer-readable media. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. A computer-readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device, or device, or any combination thereof. More specific examples (non-exhaustive list) of computer readable storage media include: electrical connections with one or more leads, portable computer disks, hard disks, random access memory (RAM), read only memory (ROM), Erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination of the above. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program, and the program may be used by or in combination with an instruction execution system, apparatus or device.

计算机可读的信号介质可以包括在基带中或者作为载波一部分传播的数据信号,其中承载了计算机可读的程序代码。这种传播的数据信号可以采用多种形式,包括但不限于电磁信号、光信号或上述的任意合适的组合。计算机可读的信号介质还可以是计算机可读存储介质以外的任何计算机可读介质,该计算机可读介质可以发送、传播或者传输用于由指令执行系统、装置或者器件使用或者与其结合使用的程序。A computer readable signal medium may include a data signal carrying computer readable program code in baseband or as part of a carrier wave. Such propagated data signals may take many forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the foregoing. A computer-readable signal medium may also be any computer-readable medium other than a computer-readable storage medium, which can send, propagate, or transmit a program for use by or in conjunction with an instruction execution system, apparatus, or device. .

计算机可读介质上包含的程序代码可以用任何适当的介质传输,包括但不限于无线、电线、光缆、RF等等,或者上述的任意合适的组合。Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.

可以以一种或多种程序设计语言或其组合来编写用于执行本发明操作的计算机程序代码,所述程序设计语言包括面向对象的程序设计语言—诸如Java、Smalltalk、C++,还包括常规的过程式程序设计语言—诸如“C”语言或类似的程序设计语言。程序代码可以完全地在用户计算机上执行、部分地在用户计算机上执行、作为一个独立的软件包执行、部分在用户计算机上部分在远程计算机上执行、或者完全在远程计算机或服务器上执行。在涉及远程计算机的情形中,远程计算机可以通过任意种类的网络——包括局域网(LAN)或广域网(WAN)—连接到用户计算机,或者,可以连接到外部计算机(例如利用因特网服务提供商来通过因特网连接)。Computer program code for carrying out the operations of the present invention may be written in one or more programming languages, or combinations thereof, including object-oriented programming languages—such as Java, Smalltalk, C++, and conventional Procedural Programming Language - such as "C" or a similar programming language. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In cases involving a remote computer, the remote computer can be connected to the user computer through any kind of network, including a local area network (LAN) or a wide area network (WAN), or it can be connected to an external computer (such as through an Internet service provider). Internet connection).

需要说明的是,本说明书中的各个实施例均采用递进的方式描述,各个实施例之间相同相似的部分互相参见即可,每个实施例重点说明的都是与其他实施例的不同之处。尤其,对于装置实施例而言,由于其基本相似于方法实施例,所以描述得比较简单,相关之处参见方法实施例的部分说明即可。以上所描述的装置实施例仅仅是示意性的,其中作为分离部件说明的单元可以是或者也可以不是物理上分开的,作为单元提示的部件可以是或者也可以不是物理单元,即可以位于一个地方,或者也可以分布到多个网络单元上。可以根据实际的需要选择其中的部分或者全部模块来实现本实施例方案的目的。本领域普通技术人员在不付出创造性劳动的情况下,即可以理解并实施。It should be noted that each embodiment in this specification is described in a progressive manner, the same and similar parts of each embodiment can be referred to each other, and each embodiment focuses on the differences from other embodiments. place. In particular, as for the device embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and for relevant parts, please refer to part of the description of the method embodiment. The device embodiments described above are only illustrative, and the units described as separate components may or may not be physically separated, and the components indicated as units may or may not be physical units, that is, they may be located in one place , or can also be distributed to multiple network elements. Part or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment. It can be understood and implemented by those skilled in the art without creative effort.

以上所述,仅为本申请的一种具体实施方式,但本申请的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本申请揭露的技术范围内,可轻易想到的变化或替换,都应涵盖在本申请的保护范围之内。因此,本申请的保护范围应该以权利要求的保护范围为准。The above is only a specific embodiment of the present application, but the protection scope of the present application is not limited thereto. Any person familiar with the technical field can easily think of changes or Replacement should be covered within the protection scope of this application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims (10)

1.一种确定切割道的方法,其特征在于,所述方法包括:1. A method for determining a cutting path, characterized in that the method comprises: 基于待切割芯片行,确定第一特征点与第二特征点,第一特征点与第二特征点之间相距第一距离;Determining a first feature point and a second feature point based on the row of chips to be cut, and a first distance between the first feature point and the second feature point; 基于第一特征点与第二特征点,确定第三特征点,第三特征点与第二特征点之间相距第二距离;determining a third feature point based on the first feature point and the second feature point, and a second distance between the third feature point and the second feature point; 基于第一特征点与第三特征点所在的直线,确定切割道。Based on the straight line where the first feature point and the third feature point are located, the cutting line is determined. 2.如权利要求1所述的方法,其特征在于,所述第一特征点与所述第二特征点分别为第一芯片与第二芯片的几何中心。2. The method according to claim 1, wherein the first feature point and the second feature point are geometric centers of the first chip and the second chip, respectively. 3.如权利要求1所述的方法,其特征在于,所述基于待切割芯片行,确定第一特征点与第二特征点,包括:3. The method according to claim 1, wherein said determining the first feature point and the second feature point based on the row of chips to be cut comprises: 基于待切割芯片行,确定第一参考点与第二参考点,第一参考点与第二参考点之间相距第一距离;Determining a first reference point and a second reference point based on the row of chips to be cut, and a first distance between the first reference point and the second reference point; 基于待切割芯片行的下边界线以及相邻芯片行的上边界线,确定初始切割道;Determining an initial cutting line based on the lower boundary line of the chip row to be cut and the upper boundary line of the adjacent chip row; 基于第一参考点纵坐标所在直线与初始切割道的交点,确定第一特征点;记录第一参考点与切割道之间的第三距离;Determine the first feature point based on the intersection of the straight line where the ordinate of the first reference point is located and the initial cutting line; record the third distance between the first reference point and the cutting line; 基于第二参考点纵坐标所在直线与所述第三距离,确定第二特征点。The second feature point is determined based on the straight line where the ordinate of the second reference point is located and the third distance. 4.如权利要求3所述的方法,其特征在于,所述基于第一特征点与第二特征点,确定第三特征点,包括:4. The method according to claim 3, wherein said determining a third feature point based on the first feature point and the second feature point comprises: 基于第一参考点与第二参考点,确定第三参考点,所述第三参考点与第二参考点之间相距第二距离;determining a third reference point based on the first reference point and the second reference point, and a second distance between the third reference point and the second reference point; 基于第三参考点纵坐标所在直线与所述第三距离,确定第三特征点。The third feature point is determined based on the straight line where the ordinate of the third reference point is located and the third distance. 5.如权利要求1至4任一项所述的方法,其特征在于,所述第二距离大于所述第一距离。5. The method according to any one of claims 1 to 4, wherein the second distance is greater than the first distance. 6.一种确定切割道的装置,其特征在于,所述装置包括:第一确定模块、第二确定模块以及第三确定模块;6. A device for determining a cutting line, characterized in that the device comprises: a first determining module, a second determining module and a third determining module; 所述第一确定模块,用于基于待切割芯片行,确定第一特征点与第二特征点,第一特征点与第二特征点之间相距第一距离;The first determination module is configured to determine a first feature point and a second feature point based on the row of chips to be cut, and a first distance between the first feature point and the second feature point; 所述第二确定模块,用于基于第一特征点与第二特征点,确定第三特征点,第三特征点与第二特征点之间相距第二距离;The second determination module is configured to determine a third feature point based on the first feature point and the second feature point, and the distance between the third feature point and the second feature point is a second distance; 所述第三确定模块,用于基于第一特征点与第三特征点所在的直线,确定切割道。The third determination module is configured to determine the cutting line based on the straight line where the first feature point and the third feature point are located. 7.如权利要求6所述的装置,其特征在于,所述第一特征点与所述第二特征点分别为第一芯片与第二芯片的几何中心。7. The device according to claim 6, wherein the first feature point and the second feature point are geometric centers of the first chip and the second chip, respectively. 8.如权利要求6所述的装置,其特征在于,所述第一确定单元,具体用于:8. The device according to claim 6, wherein the first determining unit is specifically configured to: 基于待切割芯片行,确定第一参考点与第二参考点,第一参考点与第二参考点之间相距第一距离;Determining a first reference point and a second reference point based on the row of chips to be cut, and a first distance between the first reference point and the second reference point; 基于待切割芯片行的下边界线以及相邻芯片行的上边界线,确定初始切割道;Determining an initial cutting line based on the lower boundary line of the chip row to be cut and the upper boundary line of the adjacent chip row; 基于第一参考点纵坐标所在直线与初始切割道的交点,确定第一特征点;记录第一参考点与切割道之间的第三距离;Determine the first feature point based on the intersection of the straight line where the ordinate of the first reference point is located and the initial cutting line; record the third distance between the first reference point and the cutting line; 基于第二参考点纵坐标所在直线与所述第三距离,确定第二特征点。The second feature point is determined based on the straight line where the ordinate of the second reference point is located and the third distance. 9.一种计算机设备,其特征在于,包括:存储器,处理器,及存储在所述存储器上并可在所述处理器上运行的计算机程序,所述处理器执行所述计算机程序时,实现如权利要求1至5任一项所述的确定切割道的方法。9. A computer device, characterized in that it comprises: a memory, a processor, and a computer program stored on the memory and operable on the processor, when the processor executes the computer program, the The method for determining a cutting line according to any one of claims 1 to 5. 10.一种计算机可读存储介质,其特征在于,所述计算机可读存储介质中存储有指令,当所述指令在终端设备上运行时,使得所述终端设备执行如权利要求1至5任一项所述的确定切割道的方法。10. A computer-readable storage medium, characterized in that instructions are stored in the computer-readable storage medium, and when the instructions are run on a terminal device, the terminal device is made to execute any of claims 1-5. A method of determining a cutting lane as described.
CN202211646091.7A 2022-12-20 2022-12-20 Method, device, computer equipment and medium for determining cutting path Pending CN116228649A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202211646091.7A CN116228649A (en) 2022-12-20 2022-12-20 Method, device, computer equipment and medium for determining cutting path

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202211646091.7A CN116228649A (en) 2022-12-20 2022-12-20 Method, device, computer equipment and medium for determining cutting path

Publications (1)

Publication Number Publication Date
CN116228649A true CN116228649A (en) 2023-06-06

Family

ID=86590062

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202211646091.7A Pending CN116228649A (en) 2022-12-20 2022-12-20 Method, device, computer equipment and medium for determining cutting path

Country Status (1)

Country Link
CN (1) CN116228649A (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015063655A1 (en) * 2013-10-29 2015-05-07 Koninklijke Philips N.V. Separating a wafer of light emitting devices
CN106783738A (en) * 2016-12-23 2017-05-31 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) Wafer cutting method for irregularly distributed chips
CN108054110A (en) * 2017-12-11 2018-05-18 德淮半导体有限公司 Cutting Road width defines method, bare chip scan method and bare chip scanning device
CN110416143A (en) * 2019-08-01 2019-11-05 德淮半导体有限公司 Cut channel positioning method and Defect Scanning equipment
CN110828344A (en) * 2019-11-14 2020-02-21 江苏京创先进电子科技有限公司 Automatic alignment control method for cutting channel of semiconductor device
CN115053690A (en) * 2022-07-01 2022-09-16 松灵机器人(深圳)有限公司 Mowing method, mowing device, mowing robot and storage medium
CN115194290A (en) * 2022-09-16 2022-10-18 南通宝丽金属科技有限公司 A kind of numerical control flame cutting machine parameter control method

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015063655A1 (en) * 2013-10-29 2015-05-07 Koninklijke Philips N.V. Separating a wafer of light emitting devices
CN106783738A (en) * 2016-12-23 2017-05-31 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) Wafer cutting method for irregularly distributed chips
CN108054110A (en) * 2017-12-11 2018-05-18 德淮半导体有限公司 Cutting Road width defines method, bare chip scan method and bare chip scanning device
CN110416143A (en) * 2019-08-01 2019-11-05 德淮半导体有限公司 Cut channel positioning method and Defect Scanning equipment
CN110828344A (en) * 2019-11-14 2020-02-21 江苏京创先进电子科技有限公司 Automatic alignment control method for cutting channel of semiconductor device
CN115053690A (en) * 2022-07-01 2022-09-16 松灵机器人(深圳)有限公司 Mowing method, mowing device, mowing robot and storage medium
CN115194290A (en) * 2022-09-16 2022-10-18 南通宝丽金属科技有限公司 A kind of numerical control flame cutting machine parameter control method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
杜媛;: "基于自适应分割与直线拟合的芯片连接器针脚缺陷检测算法", 系统仿真技术, no. 03, 28 July 2016 (2016-07-28) *

Similar Documents

Publication Publication Date Title
TWI737818B (en) Business processing method and device
CN107464108A (en) The method and apparatus for automatically selecting channel of disbursement
WO2022052565A1 (en) Wafer chip layout calculation method, apparatus, medium, and device
CN109376758A (en) A kind of Identify chip method, system, device and storage medium based on figure
US9147030B2 (en) Multiple-instantiated-module (mim) aware pin assignment
WO2020024898A1 (en) Method and apparatus for searching blockchain data, and storage medium
WO2023206706A1 (en) Design rule check method and device
US8234594B2 (en) Redundant micro-loop structure for use in an integrated circuit physical design process and method of forming the same
CN116302659B (en) GPU video memory error processing method and device, electronic equipment and storage medium
US10453829B2 (en) Method and apparatus for reducing capacitance of input/output pins of memory device
CN116228649A (en) Method, device, computer equipment and medium for determining cutting path
US20190266305A1 (en) Placement-driven generation of error detecting structures in integrated circuits
CN114330207A (en) Chip pad information extraction method, system and electronic device
CN108399128A (en) A kind of generation method of user data, device, server and storage medium
US10565341B2 (en) Constrained cell placement
CN117558682A (en) Battery piece cutting method and system and electronic equipment
CN105222800A (en) Air navigation aid and navigational system
US20190163862A1 (en) Placement and timing aware wire tagging
US20130117493A1 (en) Reliable Memory Mapping In A Computing System
CN114741992A (en) Method and device for setting identification, electronic equipment and storage medium
CN116028420A (en) Data transmission circuit and data transmission method
US10394992B2 (en) Wire lineend to via overlap optimization
US10527932B2 (en) Structure design generation for fixing metal tip-to-tip across cell boundary
US20240429266A1 (en) Semiconductor circuit, memory system, and information processing device
CN110263114B (en) Road section description method, device, equipment and medium

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination