CN116660302B - Detection method and related device for gamma' -phase of nickel-based single crystal superalloy - Google Patents

Abstract

The invention discloses a method for detecting the γ' phase of nickel-based single crystal high-temperature alloy and related devices, which include: setting the magnification of the area to be detected in the nickel-based single crystal high-temperature alloy sample; obtaining the chromium in the nickel-based single crystal high-temperature alloy sample Original data of elements and aluminum elements; determine the peak position percentage of chromium element and the peak position percentage of aluminum element based on the original data; if the current pixel point in the nickel-based single crystal superalloy sample meets the preset identification conditions, it will be identified as γ′ phase , count the number of γ' phases in the nickel-based single crystal superalloy sample that meet the preset identification conditions, where the preset identification conditions include: the percentage of the current pixel points is less than the peak position percentage of the chromium element and greater than the peak position percentage of the aluminum element; based on This quantity determines the content of γ′ phase in the nickel-based single crystal superalloy sample. In the above process, the component elements of the γ' phase in the area to be detected can be analyzed at the same time, and the content fraction of the γ' phase in the area can be calculated.

Description

A detection method and related devices for the γ′ phase of nickel-based single crystal superalloy

Technical field

The invention relates to the field of data processing technology, and in particular to a detection method and related devices for the γ′ phase of nickel-based single crystal high-temperature alloy.

Background technique

Nickel-based single crystal superalloys have excellent high-temperature strength, fatigue resistance, fracture toughness, and good resistance to oxidation and hot corrosion. The single-crystal structure makes up for the serious segregation and poor hot processing performance of traditional cast and forged superalloys. It is the preferred material for aircraft engine turbine blades. The excellent mechanical properties of single crystal superalloys mainly come from the precipitation of the γ′ strengthening phase in the matrix. The volume fraction, distribution, size, and morphology of this phase are important factors affecting the mechanical properties of nickel-based single crystal superalloys. The characterization and evaluation of the γ′ phase in the microstructure of nickel-based single crystal superalloys is a necessary step in the microscopic examination of this alloy.

The existing γ′ phase detection methods of nickel-based single crystal superalloys mostly use optical microscopes or electron microscopes to detect the γ′ phase through metallographic analysis, or the γ′ phase is separated from the matrix through chemical extraction for detection. In the above process , based on optical microscopy or electron microscopy through metallographic analysis to detect the γ′ phase or to separate the γ′ phase from the matrix for detection through chemical extraction, only the γ′ phase in the nickel-based single crystal superalloy can be distinguished. Further, Separating the γ' phase from the matrix through chemical extraction for detection will cause damage to the nickel-based single crystal superalloy. Therefore, it is necessary to provide a method to determine the composition of the γ' phase in the analysis area while observing the micro-area with a scanning electron microscope. Elemental composition analysis can also count the content fraction of γ' phase in this area without causing damage to the nickel-based single crystal superalloy.

Contents of the invention

In view of this, the present invention provides a method for detecting the γ' phase of nickel-based single crystal superalloy and related devices, which are used to analyze the constituent elements of the γ' phase in the analysis area while observing the micro-area with a scanning electron microscope. It can also count the content fraction of γ' phase in this area without causing damage to the nickel-based single crystal superalloy. The specific plans are as follows:

A method for detecting the γ' phase of nickel-based single crystal superalloy, including:

Set the magnification of the area to be detected in the nickel-based single crystal superalloy sample;

After the setting is completed, obtain the original data of the preset elements in the nickel-based single crystal superalloy sample under the magnification, and save the original data in a preset format, where the preset elements include: chromium. elements and aluminum elements;

Determine the peak position percentage of the chromium element and the peak position percentage of the aluminum element based on the raw data;

If the current pixel point in the nickel-based single crystal superalloy sample meets the preset identification conditions, it is identified as a γ′ phase, and the number of γ′ phases in the nickel-based single crystal superalloy sample that meets the preset identification conditions is counted, where , the preset identification conditions include: the percentage of the current pixel points is less than the peak position percentage of the chromium element and greater than the peak position percentage of the aluminum element;

Based on the quantity, the content of the γ' phase in the nickel-based single crystal superalloy sample was determined.

The above method, optionally, obtains the raw data of the preset elements in the nickel-based single crystal superalloy sample under the magnification, and saves the raw data in a preset format, including:

Obtain the percentage surface distribution map of the preset element contained in the area to be detected under scanning electron microscope and X-ray energy spectrometer conditions;

Obtain the original data in the percentage surface distribution chart;

Store the raw data in csv or tsv file format.

The above method, optionally, determines the peak position percentage of the chromium element and the peak position percentage of the aluminum element based on the original data, including:

Read the original data, and draw a surface distribution frequency histogram of the preset element based on the original data;

Read the peak position percentage of the chromium element and the peak position percentage of the aluminum element in the surface distribution frequency histogram.

For the above method, optionally, drawing a surface distribution frequency histogram of the preset element based on the original data includes:

Convert the raw data into an array;

Draw a surface distribution frequency histogram of the preset element based on the array.

The above method, optionally, based on the quantity, determines the content of the γ' phase in the nickel-based single crystal superalloy sample, including:

Obtain the number of abscissas and ordinates in the percentage surface distribution chart;

Based on the number of abscissas and the number of ordinates, calculate the total pixel amount;

The content of the γ' phase in the nickel-based single crystal superalloy sample is determined based on the ratio of the number to the total pixel amount.

A detection device for the γ′ phase of nickel-based single crystal superalloy, including:

Setting module, used to set the magnification of the area to be detected in the nickel-based single crystal superalloy sample;

The acquisition module is used to obtain the original data of the preset elements in the nickel-based single crystal superalloy sample under the magnification after the setting is completed, and save the original data in a preset format, wherein the preset The elements include: chromium and aluminum;

A first determination module, configured to determine the peak position percentage of the chromium element and the peak position percentage of the aluminum element based on the original data;

A statistical module for identifying the γ′ phase if the current pixel in the nickel-based single crystal superalloy sample meets the preset identification conditions, and counting the γ′ phases of the nickel-based single crystal superalloy sample that meet the preset identification conditions. The number of phases, wherein the preset identification conditions include: the percentage of the current pixel points is less than the peak position percentage of the chromium element and greater than the peak position percentage of the aluminum element;

The second determination module is used to determine the content of the γ' phase in the nickel-based single crystal superalloy sample based on the quantity.

For the above device, optionally, the acquisition module includes:

The first acquisition unit is used to acquire the percentage area distribution map of the area to be detected that contains the preset elements under the conditions of a scanning electron microscope and an X-ray energy spectrometer;

a second acquisition unit, used to acquire the original data in the percentage area distribution map;

A storage unit used to store the original data in csv or tsv file format.

For the above device, optionally, the first determination module includes:

A drawing unit, configured to read the original data and draw a surface distribution frequency histogram of the preset element based on the original data;

A reading unit, configured to read the peak position percentage of the chromium element and the peak position percentage of the aluminum element in the surface distribution frequency histogram.

For the above device, optionally, the rendering unit includes:

A conversion subunit used to convert the original data into an array;

A drawing subunit is used to draw an area distribution frequency histogram of the preset element based on the array.

For the above device, optionally, the second determination module includes:

The third acquisition unit is used to acquire the number of abscissas and the number of ordinates in the percentage surface distribution chart;

A calculation unit configured to calculate the total pixel amount based on the number of abscissas and the number of ordinates;

A determining unit configured to determine the content of the γ′ phase in the nickel-based single crystal superalloy sample based on the ratio of the number to the total pixel amount.

A storage medium, the storage medium includes a stored program, wherein the program executes the above-mentioned detection method of γ′ phase of nickel-based single crystal superalloy.

A processor, the processor is used to run a program, wherein when the program is running, the above-mentioned method for detecting the γ′ phase of nickel-based single crystal superalloy is executed.

Compared with the prior art, the present invention includes the following advantages:

The invention discloses a method for detecting the γ' phase of nickel-based single crystal high-temperature alloy and related devices, which include: setting the magnification of the area to be detected in the nickel-based single crystal high-temperature alloy sample; obtaining the chromium in the nickel-based single crystal high-temperature alloy sample Original data of elements and aluminum elements; determine the peak position percentage of chromium element and the peak position percentage of aluminum element based on the original data; if the current pixel point in the nickel-based single crystal superalloy sample meets the preset identification conditions, it will be identified as γ′ phase , count the number of γ' phases in the nickel-based single crystal superalloy sample that meet the preset identification conditions, where the preset identification conditions include: the percentage of the current pixel points is less than the peak position percentage of the chromium element and greater than the peak position percentage of the aluminum element; based on This quantity determines the content of γ′ phase in the nickel-based single crystal superalloy sample. In the above process, the component elements of the γ' phase in the area to be detected can be analyzed at the same time, and the content fraction of the γ' phase in the area can be calculated.

Description of the drawings

In order to explain the embodiments of the present invention or the technical solutions in the prior art more clearly, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings in the following description are only These are some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without exerting creative efforts.

Figure 1 is a flow chart of a method for detecting the γ' phase of a nickel-based single crystal superalloy disclosed in an embodiment of the present invention;

Figure 2 is a mass percentage surface distribution diagram (left) and a surface distribution frequency histogram (right) of an aluminum element disclosed in an embodiment of the present invention;

Figure 3 is a γ' phase distribution diagram drawn based on element mass percentage in the analysis area of a DD6 nickel-based single crystal superalloy sample to be inspected disclosed in the embodiment of the present invention;

Figure 4 is a structural block diagram of a detection device for the γ' phase of a nickel-based single crystal superalloy disclosed in an embodiment of the present invention;

Figure 5 is a schematic structural diagram of a device disclosed in an embodiment of the present invention.

Detailed ways

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of the present invention.

The invention discloses a method for detecting the γ' phase of nickel-based single crystal superalloy and related devices. The existing detection methods for the γ' phase of nickel-based single crystal superalloy mostly use optical microscopes or electron microscopes to detect γ' through metallographic analysis. Phase detection, or the γ' phase is separated from the matrix through chemical extraction for detection, but does not involve visual non-destructive elemental component detection. In order to solve the above problems, the present invention provides a method that is applied to nickel-based monomers. Detection of the γ′ phase of crystalline superalloy, statistics of the content fraction of the γ′ phase, and composition analysis of the γ′ phase. The execution flow of the method is shown in Figure 1, including the steps:

S101. Set the magnification of the area to be detected in the nickel-based single crystal superalloy sample;

In the embodiment of the present invention, the nickel-based single crystal superalloy sample to be detected is first determined. The nickel-based single crystal superalloy sample to be detected needs to be a sample with a smooth surface without scratches after grinding and polishing. Further, it is determined that the nickel-based single crystal superalloy sample to be detected is The area to be tested of the nickel-based single crystal high-temperature alloy sample, where the selection of the area to be tested can be based on experience or specific circumstances. There is no specific limit in the embodiment of the present invention. After the area to be tested is selected, the selection of the detection area is The magnification factor of the area to be measured, where the magnification factor is generally more than 10,000 times, can be determined based on specific circumstances or experience.

S102. After the setting is completed, obtain the original data of the preset elements in the nickel-based single crystal superalloy sample under the magnification, and save the original data in a preset format, where the preset elements include : Chromium and aluminum elements;

In the embodiment of the present invention, after the magnification setting is completed, the area to be measured is obtained under the magnification, and the percentage surface distribution map containing the preset elements is obtained under the conditions of a scanning electron microscope and an X-ray energy spectrometer. Wherein, the percentage area distribution map may be an element mass percentage or an atomic percentage area distribution map, and the preset elements include: chromium Cr and aluminum Al, and also include: nickel Ni, cobalt Co, molybdenum Mo, rhenium Re, and tungsten W , Tantalum Ta. In the embodiment of the present invention, only chromium elements and aluminum elements have an impact on the γ′ phase detection in the nickel-based single crystal superalloy. Therefore, as long as the percentage area distribution diagram of chromium elements and aluminum elements is obtained, all the The original data in the percentage area distribution chart is stored in a preset format. Preferably, the preset format is a csv or tsv file format.

S103. Determine the peak position percentage of the chromium element and the peak position percentage of the aluminum element based on the original data;

In the embodiment of the present invention, the original data is read, the original data is converted into an array, and the surface distribution frequency histogram of the preset element is drawn based on the array, which is implemented using the Python language. The specific processing process is as follows:

Use the glob module to read the original data csv or tsv format file of the preset element mass percentage or atomic percentage surface distribution map. The specific processing process is as follows:

import glob

mapfiles = [] #Create an empty collection named mapfiles

for file in glob.glob("*.csv"): #Read the original data csv file of the main element mass percentage or atomic percentage area distribution chart. The file must be named after the element symbol. The same applies to tsv files.

mapfiles.append(file) #Add the read csv or tsv file to the mapfiles collection

element = [] #Create an empty collection named element

for i in mapfiles:

element.append(i[:-4]) #Read the default element type

Use the numpy module to convert the values in the csv or tsv format file into an array that can be used to draw images using the matplotlib module. The specific processing process is as follows:

import numpy as np

t={} #Create an empty dictionary named t

for i in range(len(element)):

a = np.genfromtxt(mapfiles[i], delimiter=',')

I=[]

for j in range(len(a)):

I.append(np.asarray(a[j][:-1])/100)

t[element[i]] = np.asarray(I) #Write the preset element mass percentage or atomic percentage array in the t dictionary

Use the imshow function in the matplotlib module to draw the mass percentage or atomic percentage surface distribution map of each element. The specific processing process is as follows:

import matplotlib.pyplot as plt

for e in element:

plt.imshow(t[e], cmap='gray')

plt.show()

Use the hstack function in numpy and the hist function in the matplotlib module to draw the mass percentage or atomic percentage surface distribution frequency histogram. The specific processing process is as follows:

import matplotlib.pyplot as plt

for e in element:

h = np.hstack(t[e])

n, bins, patches = plt.hist(h, 100, color='black')

plt.show()

Traverse the surface distribution frequency histogram, and read the peak position percentage of the chromium element and the peak position percentage of the aluminum element in the surface distribution frequency histogram.

S104. If the current pixel point in the nickel-based single crystal superalloy sample meets the preset identification conditions, it is identified as the γ′ phase, and the number of γ′ phases in the nickel-based single crystal superalloy sample that meets the preset identification conditions is counted. , wherein the preset identification conditions include: the percentage of the current pixel points is less than the peak position percentage of the chromium element and greater than the peak position percentage of the aluminum element;

In the embodiment of the present invention, it is first determined whether the current pixel point in the nickel-based single crystal superalloy sample meets the preset identification conditions. If it meets, the current pixel point is determined to be the γ′ phase. Otherwise, the current pixel point is The substrate, wherein the preset identification conditions include: the percentage of the current pixel points is less than the peak position percentage of the chromium element and greater than the peak position percentage of the aluminum element. The specific identification process is as follows:

Implemented using Python language: Use the imshow function in the matplotlib module to draw the carbide distribution map.

r = np.zeros_like(wt['Co']) #Create the same data matrix as the original element mass percentage or element percentage surface distribution data

y = len(wt['Co'])

x = len(wt['Co'][0]) #The number of horizontal and vertical coordinates of the statistical data matrix

c1 = 0

c1x, c1y = [], []

for i in range(0, y):

for j in range(0, x):

if wt['Cr'][i][j]<= 0.075:

if wt['Al'][i][j]>= 0.06:

r[i][j]= 1 #Perform γ′ phase identification

c1x.append(j)

c1y.append(i)

c1 += 1 #Count the coordinate positions and quantities that meet the γ′ phase identification conditions

img.imshow(r, vmin=0, vmax=1,interpolation='hamming') #Draw the γ′ phase distribution diagram

plt.show()

S105. Based on the quantity, determine the content of the γ' phase in the nickel-based single crystal superalloy sample.

In the embodiment of the present invention, the number of abscissas and the number of ordinates in the percentage area distribution map are obtained, and based on the number of abscissas and the number of ordinates, the total pixel amount is calculated, and based on the number and the total pixel amount The ratio of determines the content of γ' phase in the nickel-based single crystal superalloy sample.

The invention discloses a method for detecting the γ′ phase of nickel-based single crystal high-temperature alloy, which includes: setting the magnification of the area to be detected in the nickel-based single crystal high-temperature alloy sample; obtaining the chromium element and aluminum in the nickel-based single crystal high-temperature alloy sample Original data of elements; determine the peak position percentage of chromium element and the peak position percentage of aluminum element based on the original data; if the current pixel point in the nickel-based single crystal superalloy sample meets the preset identification conditions, it will be identified as γ′ phase, and the statistics of nickel The number of γ' phases in the base single crystal superalloy sample that meets the preset identification conditions, where the preset identification conditions include: the percentage of the current pixel points is less than the peak position percentage of the chromium element and greater than the peak position percentage of the aluminum element; based on this number, Determine the content of γ' phase in nickel-based single crystal superalloy samples. In the above process, the component elements of the γ' phase in the area to be detected can be analyzed at the same time, and the content fraction of the γ' phase in the area can be calculated.

The detection method of the present invention realizes the microscopic detection of the γ' phase of the nickel-based single crystal superalloy. While using the scanning electron microscope for micro-area observation, the energy spectrometer can be used to detect the elemental composition of the γ' phase and the matrix. Realize automatic identification of γ′ phase and calculation of content fraction. An example of the processing process of the detection method is given, which mainly includes the following steps:

1) Determine the area to be tested of the nickel-based single crystal superalloy (DD6) sample to be tested, and select a magnification of 20,000 times;

2) Obtain the mass percentage distribution map of the main elements contained in the area to be measured under the conditions of scanning electron microscope and X-ray energy spectrometer. The sample is a sample with a smooth surface without scratches after grinding and polishing, a DD6 nickel-based single crystal superalloy sample The main constituent elements are nickel Ni, cobalt Co, chromium Cr, aluminum Al, molybdenum Mo, rhenium Re, tungsten W, and tantalum Ta; set the image resolution of the element mass percentage area distribution map to 512*384, and the total number of pixels is 196608 ; Save the original data of the mass percentage surface distribution of each element as a csv format file, namely "Ni.csv", "Co.csv", "Cr.csv", "Al.csv", "Mo.csv", " Re.csv", "W.csv", "Ta.csv".

3) Read the original data file of the surface distribution map of each element's mass percentage, and draw the element surface distribution frequency histogram;

Implemented using Python language, the specific process is: ① Use the glob module to read the original data csv or tsv format file of the mass percentage or atomic percentage surface distribution map of each element; ② Use the numpy module to convert the values in the csv or tsv format file into usable matplotlib The module draws an array of images; ③ Use the imshow function in the matplotlib module to draw the mass percentage or atomic percentage surface distribution map of each element; ④ Use the hstack function in numpy and the hist function in the matplotlib module to draw the mass percentage or atomic percentage surface distribution frequency histogram. In the embodiment of the present invention, the mass percentage area distribution diagram and the area distribution frequency histogram of the Al element are used as examples. As shown in Figure 2, the mass percentage area distribution diagram (left) and the area distribution frequency histogram (right) of the Al element are shown.

4) In the frequency histogram of surface distribution of mass percentage of chromium element and aluminum element, read the mass percentage corresponding to the peak position; the mass percentage corresponding to the peak in the frequency histogram of surface distribution of mass percentage of chromium element: 0.058, surface distribution of mass percentage of aluminum element The mass percentage corresponding to the peak value in the frequency histogram: 0.048;

5) Set the identification conditions for the γ' phase: If the mass percentage of the element at a certain pixel point is both less than the mass percentage of the peak position of the chromium element (0.058) and greater than the mass percentage of the peak position of the aluminum element (0.048), it will be identified as the γ' phase, and draw γ′ phase distribution diagram;

Implemented using Python language, the specific process is:

m = np.zeros_like(wt['Cr'])

y = len(wt['Cr'])

x = len(wt['Cr'][0])

r = 0

rx, ry = [], []

for i in range(0, y):

for j in range(0, x):

if wt['Cr'][i][j]<= 0.0058:

if wt['Al'][i][j]>= 0.048:

m[i][j]= 1

rx.append(j)

ry.append(i)

r += 1

r is the number of pixels that meet the γ′ condition;

Use the imshow function in the matplotlib module to draw the γ′ phase distribution diagram, where the γ′ phase distribution diagram is shown in Figure 3.

6) The number of pixels that meet this condition is 45985. The γ′ phase content score is obtained by calculating the ratio of the number of pixels that meet this condition to the total number of pixels, that is, 45985/196608*100%=23.39%.

Based on the above-mentioned method for detecting the γ′ phase of a nickel-based single crystal superalloy, embodiments of the present invention also provide a device for detecting the γ′ phase of a nickel-based single crystal superalloy. The structural block diagram of the device is shown in Figure 4 shown, including:

Setting module 201, acquisition module 202, first determination module 203, statistics module 204 and second determination module 205.

in,

The setting module 201 is used to set the magnification of the area to be detected in the nickel-based single crystal superalloy sample;

The acquisition module 202 is used to acquire the original data of the preset elements in the nickel-based single crystal superalloy sample under the magnification after the setting is completed, and save the original data in a preset format, where, The preset elements include: chromium elements and aluminum elements;

The first determination module 203 is configured to determine the peak position percentage of the chromium element and the peak position percentage of the aluminum element based on the original data;

The statistical module 204 is used to identify the γ′ phase if the current pixel point in the nickel-based single crystal superalloy sample meets the preset identification conditions, and count the nickel-based single crystal superalloy sample to meet the preset identification conditions. The number of γ' phases, wherein the preset identification conditions include: the percentage of the current pixel points is less than the peak position percentage of the chromium element and greater than the peak position percentage of the aluminum element;

The second determination module 205 is used to determine the content of the γ' phase in the nickel-based single crystal superalloy sample based on the quantity.

The invention discloses a detection device for the γ' phase of nickel-based single crystal high-temperature alloy, which includes: setting the magnification of the area to be detected in the nickel-based single crystal high-temperature alloy sample; obtaining chromium elements and aluminum in the nickel-based single crystal high-temperature alloy sample Original data of elements; determine the peak position percentage of chromium element and the peak position percentage of aluminum element based on the original data; if the current pixel point in the nickel-based single crystal superalloy sample meets the preset identification conditions, it will be identified as γ′ phase, and the statistics of nickel The number of γ' phases in the base single crystal superalloy sample that meets the preset identification conditions, where the preset identification conditions include: the percentage of the current pixel points is less than the peak position percentage of the chromium element and greater than the peak position percentage of the aluminum element; based on this number, Determine the content of γ' phase in nickel-based single crystal superalloy samples. In the above process, the component elements of the γ' phase in the area to be detected can be analyzed at the same time, and the content fraction of the γ' phase in the area can be calculated.

In this embodiment of the present invention, the acquisition module 202 includes:

The first acquisition unit 206 and the second acquisition unit 207.

in,

The first acquisition unit 206 is used to acquire the percentage area distribution map of the area to be detected that contains the preset elements under the conditions of a scanning electron microscope and an X-ray energy spectrometer;

The second acquisition unit 207 is used to acquire the original data in the percentage surface distribution map;

A storage unit used to store the original data in csv or tsv file format.

In this embodiment of the present invention, the first determination module 203 includes:

drawing unit 208 and reading unit 209.

in,

The drawing unit 208 is configured to read the original data and draw a surface distribution frequency histogram of the preset element based on the original data;

The reading unit 209 is configured to read the peak position percentage of the chromium element and the peak position percentage of the aluminum element in the surface distribution frequency histogram.

In this embodiment of the present invention, the rendering unit 208 includes:

Conversion sub-unit 210 and rendering sub-unit 211.

in,

The conversion subunit 210 is used to convert the original data into an array;

The drawing subunit 211 is used to draw the surface distribution frequency histogram of the preset element based on the array.

In this embodiment of the present invention, the second determination module 205 includes:

The third acquisition unit 212, the calculation unit 213 and the determination unit 214.

in,

The third acquisition unit 212 is used to acquire the number of abscissas and the number of ordinates in the percentage area distribution map;

The calculation unit 213 is configured to calculate the total pixel amount based on the number of abscissas and the number of ordinates;

The determination unit 214 is configured to determine the content of the γ′ phase in the nickel-based single crystal superalloy sample based on the ratio of the number to the total pixel amount.

The detection device includes a processor and a memory. The above-mentioned setting module, acquisition module, first determination module, statistical module and second module are all stored in the memory as program units. The processor executes the above-mentioned program units stored in the memory. to implement the corresponding functions.

The processor contains a core, which retrieves the corresponding program unit from the memory. One or more kernels can be set. By adjusting the kernel parameters, the component elements of the γ′ phase in the area to be detected can be analyzed simultaneously, and the content fraction of the γ′ phase in the area can be counted.

Memory may include non-permanent memory in computer-readable media, random access memory (RAM) and/or non-volatile memory, such as read-only memory (ROM) or flash memory (flash RAM). The memory includes at least one memory chip.

An embodiment of the present invention provides a computer storage medium on which a program is stored, and when the program is executed by a processor, the detection method is implemented.

An embodiment of the present invention provides a processor, where the processor is configured to run a program, where the business data pushing method is executed when the program is running.

An embodiment of the present invention provides a device. The structural block diagram of the device is shown in Figure 5. The device includes: a processor 301, a storage medium 302, and a program stored on the storage medium 302 and capable of running on the processor 302. Program, the processor 301 implements the following steps when executing the program:

Set the magnification of the area to be detected in the nickel-based single crystal superalloy sample;

After the setting is completed, obtain the original data of the preset elements in the nickel-based single crystal superalloy sample under the magnification, and save the original data in a preset format, where the preset elements include: chromium. elements and aluminum elements;

Determine the peak position percentage of the chromium element and the peak position percentage of the aluminum element based on the raw data;

If the current pixel point in the nickel-based single crystal superalloy sample meets the preset identification conditions, it is identified as a γ′ phase, and the number of γ′ phases in the nickel-based single crystal superalloy sample that meets the preset identification conditions is counted, where , the preset identification conditions include: the percentage of the current pixel points is less than the peak position percentage of the chromium element and greater than the peak position percentage of the aluminum element;

Based on the quantity, the content of the γ' phase in the nickel-based single crystal superalloy sample was determined.

Those skilled in the art will understand that embodiments of the present application may be provided as methods, systems, or computer program products. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment that combines software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) having computer-usable program code embodied therein.

The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each process and/or block in the flowchart illustrations and/or block diagrams, and combinations of processes and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing device to produce a machine, such that the instructions executed by the processor of the computer or other programmable data processing device produce a use A device for realizing the functions specified in a process or processes in a flowchart and/or a block or blocks in a block diagram.

These computer program instructions may also be stored in a computer-readable memory that causes a computer or other programmable data processing apparatus to operate in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including the instruction means, the instructions The device implements the functions specified in a process or processes in the flowchart and/or in a block or blocks in the block diagram.

These computer program instructions may also be loaded onto a computer or other programmable data processing device, causing a series of operating steps to be performed on the computer or other programmable device to produce computer-implemented processing, thereby executing on the computer or other programmable device. Instructions provide steps for implementing the functions specified in a process or processes of a flowchart diagram and/or a block or blocks of a block diagram.

In a typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.

Memory may include non-volatile memory in computer-readable media, random access memory (RAM), and/or non-volatile memory in the form of read-only memory (ROM) or flash memory (flash RAM). Memory is an example of a computer-readable medium.

Computer-readable media includes both persistent and non-volatile, removable and non-removable media that can be implemented by any method or technology for storage of information. Information may be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), and read-only memory. (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, Magnetic tape cassettes, tape magnetic disk storage or other magnetic storage devices or any other non-transmission medium can be used to store information that can be accessed by a computing device. As defined in this article, computer-readable media does not include transitory media, such as modulated data signals and carrier waves.

It should also be noted that the terms "comprises," "comprises," or any other variation thereof are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that includes a list of elements not only includes those elements, but also includes Other elements are not expressly listed or are inherent to the process, method, article or equipment. Without further limitation, an element qualified by the statement "comprises a..." does not exclude the presence of additional identical elements in the process, method, good, or device that includes the element.

Those skilled in the art will understand that embodiments of the present application may be provided as methods, systems or computer program products. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) having computer-usable program code embodied therein.

The above are only examples of the present application and are not used to limit the present application. To those skilled in the art, various modifications and variations may be made to this application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of this application shall be included in the scope of the claims of this application.

Claims (10)

1. The detection method of the gamma' -phase of the nickel-base single crystal superalloy is characterized by comprising the following steps of:

setting the amplification factor of a region to be detected in a nickel-based single crystal superalloy sample;

after the setting is completed, acquiring original data of preset elements in the nickel-base single crystal superalloy sample under the amplification factor, and storing the original data into a preset format, wherein the preset elements comprise: chromium element and aluminum element;

reading the original data, drawing a surface distribution frequency histogram of the preset element based on the original data, and reading the peak position percentage of the chromium element and the peak position percentage of the aluminum element in the surface distribution frequency histogram;

if the current pixel point in the nickel-based single crystal superalloy sample meets a preset identification condition, identifying the current pixel point as a gamma 'phase, and counting the number of gamma' phases of the nickel-based single crystal superalloy sample meeting the preset identification condition, wherein the preset identification condition comprises: the percentage of the current pixel points is smaller than the peak position percentage of the chromium element and larger than the peak position percentage of the aluminum element;

based on the amounts, the content of gamma prime phase in the nickel-base single crystal superalloy sample is determined.

2. The method of claim 1, wherein obtaining raw data of a predetermined element in the nickel-base single crystal superalloy sample at the magnification and saving the raw data in a predetermined format comprises:

acquiring a percentage surface distribution map of the region to be detected, which contains the preset elements under the conditions of a scanning electron microscope and an X-ray energy spectrometer;

acquiring original data in the percentage face distribution map;

and storing the original data into a csv or tsv file format.

3. The method of claim 1, wherein drawing a face distribution frequency histogram of the preset element based on the raw data comprises:

converting the original data into an array;

and drawing a surface distribution frequency histogram of the preset elements based on the array.

4. The method according to claim 2, wherein determining the content of gamma prime phase in the nickel-base single crystal superalloy sample based on the amount comprises:

acquiring the number of abscissas and the number of ordinates in the percentage face distribution diagram;

calculating a total pixel amount based on the abscissa amount and the ordinate amount;

determining the content of gamma' phase in the nickel-base single crystal superalloy sample based on the ratio of the number to the total pixel amount.

5. A detection device for gamma' -phase of nickel-base single crystal superalloy, comprising:

the setting module is used for setting the amplification factor of the region to be detected in the nickel-based single crystal superalloy sample;

the acquisition module is used for acquiring original data of preset elements in the nickel-based single crystal superalloy sample under the amplification factor after the setting is completed, and storing the original data into a preset format, wherein the preset elements comprise: chromium element and aluminum element;

the reading module is used for reading the original data, drawing a surface distribution frequency histogram of the preset element based on the original data, and reading the peak position percentage of the chromium element and the peak position percentage of the aluminum element in the surface distribution frequency histogram;

the statistics module is used for identifying the nickel-based single crystal superalloy sample as gamma 'phases if the current pixel point in the nickel-based single crystal superalloy sample meets the preset identification conditions, and counting the number of gamma' phases of the nickel-based single crystal superalloy sample meeting the preset identification conditions, wherein the preset identification conditions comprise: the percentage of the current pixel points is smaller than the peak position percentage of the chromium element and larger than the peak position percentage of the aluminum element;

and a determining module for determining the content of gamma' phase in the nickel-base single crystal superalloy sample based on the amount.

6. The apparatus of claim 5, wherein the acquisition module comprises:

the first acquisition unit is used for acquiring a percentage surface distribution diagram of the region to be detected, which contains the preset elements under the conditions of a scanning electron microscope and an X-ray energy spectrometer;

the second acquisition unit is used for acquiring the original data in the percentage face distribution diagram;

and the storage unit is used for storing the original data into a csv or tsv file format.

7. The apparatus of claim 5, wherein the reading module comprises:

the conversion unit is used for converting the original data into an array;

and the drawing unit is used for drawing the surface distribution frequency histogram of the preset elements based on the array.

8. The apparatus of claim 6, wherein the means for determining comprises:

the third acquisition unit is used for acquiring the number of abscissas and the number of ordinates in the percentage face distribution diagram;

a calculation unit configured to calculate a total pixel amount based on the abscissa amount and the ordinate amount;

and a determining unit for determining the content of gamma' phase in the nickel-base single crystal superalloy sample based on the ratio of the number to the total pixel amount.

9. A storage medium comprising a stored program, wherein the program performs the method of detecting a gamma prime phase of a nickel-base single crystal superalloy as defined in any of claims 1-4.

10. A processor for running a program, wherein the program is run to perform the method for detecting a gamma prime phase of a nickel-base single crystal superalloy as defined in any of claims 1 to 4.