CN116827343B - A method, device, storage medium and terminal for optimizing drift rate of rubidium atomic clock - Google Patents
A method, device, storage medium and terminal for optimizing drift rate of rubidium atomic clock Download PDFInfo
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- 229910052701 rubidium Inorganic materials 0.000 title claims abstract description 228
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 title claims abstract description 228
- 238000000034 method Methods 0.000 title claims abstract description 74
- 238000003860 storage Methods 0.000 title claims abstract description 12
- 239000013078 crystal Substances 0.000 claims abstract description 45
- 238000012360 testing method Methods 0.000 claims description 10
- 238000004590 computer program Methods 0.000 claims description 5
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 238000013178 mathematical model Methods 0.000 claims description 3
- 230000032683 aging Effects 0.000 abstract description 4
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- 238000004891 communication Methods 0.000 description 5
- 238000011161 development Methods 0.000 description 5
- 230000018109 developmental process Effects 0.000 description 5
- 230000007774 longterm Effects 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
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- 238000002474 experimental method Methods 0.000 description 1
- 238000005429 filling process Methods 0.000 description 1
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/26—Automatic control of frequency or phase; Synchronisation using energy levels of molecules, atoms, or subatomic particles as a frequency reference
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- G—PHYSICS
- G04—HOROLOGY
- G04F—TIME-INTERVAL MEASURING
- G04F5/00—Apparatus for producing preselected time intervals for use as timing standards
- G04F5/14—Apparatus for producing preselected time intervals for use as timing standards using atomic clocks
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Abstract
本申请涉及一种优化铷原子钟漂移率的方法、装置、存储介质及终端。其中，所述方法包括：采集铷原子钟相对于基准信号的频差数据；根据所述频差数据和最小二乘法，建立所述铷原子钟的时间‑频差模型；根据所述时间‑频差模型和电压‑频率拟合关系，调节所述铷原子钟的输出频率。本申请着重研究铷原子钟内部关键器件老化的频率漂移补偿技术，通过分析铷原子钟的漂移率特性，提出了通过调节铷原子钟内部恒温晶振压控电压来调节铷原子钟输出频率的准确度，从而改善铷原子钟的漂移率。
The present application relates to a method, device, storage medium and terminal for optimizing the drift rate of a rubidium atomic clock. The method comprises: collecting frequency difference data of the rubidium atomic clock relative to a reference signal; establishing a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and the least squares method; and adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship. The present application focuses on the frequency drift compensation technology for the aging of key components inside the rubidium atomic clock. By analyzing the drift rate characteristics of the rubidium atomic clock, it is proposed to adjust the accuracy of the output frequency of the rubidium atomic clock by adjusting the voltage-controlled voltage of the constant temperature crystal oscillator inside the rubidium atomic clock, thereby improving the drift rate of the rubidium atomic clock.
Description
Technical Field
The invention relates to the technical field of rubidium atomic clock optimization, in particular to a method, a device, a storage medium and a terminal for optimizing the drift rate of a rubidium atomic clock.
Background
The rubidium atomic clock has three main indexes, namely frequency stability, frequency accuracy and frequency drift rate. The frequency drift rate is calculated by frequency accuracy, is an inherent characteristic of an atomic frequency standard, and has an important influence on the overall performance of the rubidium atomic clock.
The frequency drift rate plays an important role in satellite time synchronization and frequency calibration systems. When the requirements of time synchronization and frequency calibration accuracy are high, the frequency drift rate needs to meet certain requirements. The frequency drift rate is used as one of the most important indexes of the rubidium atomic clock, and the quality of the indexes determines the performance of the rubidium atomic clock. The drift phenomenon of the rubidium atomic clock is a result commonly influenced by various factors, wherein the most important temperature drift and aging drift are temperature drift caused by temperature change of the working environment of the rubidium atomic clock, aging drift is frequency drift caused by aging of devices in the rubidium atomic clock, drift rate is a key index for measuring autonomous navigation duration of the rubidium atomic clock, and therefore adjustment and optimization of the drift rate are core links in the development process of the rubidium atomic clock, and a method for adjusting the index to the minimum as much as possible is needed so as to obtain better comprehensive performance. The main problem of the current drift rate adjustment is that a plurality of steps in the production process of the rubidium atomic clock are manually completed, and factors influencing the drift rate index are various, such as the sizes of rubidium bubbles, absorption bubbles and filter bubbles, so that the absolute value of the drift rate index of the rubidium atomic clock is difficult to be smaller than 5E-14.
In order to improve the drift rate, the frequency drift characteristic of the rubidium atomic clock is generally optimized by the following two methods, namely, 1, firstly, a drift rate model is built according to frequency drift test data of the rubidium atomic clock, then, the purpose of optimizing the frequency drift rate of the rubidium atomic clock is achieved by adjusting the DDS, and 2, the temperature of a lamp chamber and a chamber of a physical part of the rubidium atomic clock is adjusted, wherein the basic principle of the method is that the purpose of optimizing the frequency drift rate characteristic of the rubidium atomic clock is achieved by reducing optical frequency shift. The two methods require a large amount of theoretical analysis and test data, including measurement of the startup characteristics of the rubidium atomic clocks, buffer gas pressure frequency shift, influence of lamp temperature and cavity temperature accuracy, microwave power frequency shift and the like, and consider that many links in the production process of each rubidium atomic clock need to be completed manually, such as rubidium bubbles, absorption cannon and filter bubble filling processes, debugging of a microwave cavity, assembly of a cavity bubble system and the like. This results in each rubidium atomic clock potentially having a different frequency drift rate indicator, and therefore it is difficult to effectively optimize the frequency drift rate of the rubidium atomic clock.
Disclosure of Invention
The embodiment of the application provides a method, a device, a storage medium and a terminal for optimizing the drift rate of a rubidium atomic clock. The following presents a simplified summary in order to provide a basic understanding of some aspects of the disclosed embodiments. This summary is not an extensive overview and is intended to neither identify key/critical elements nor delineate the scope of such embodiments. Its sole purpose is to present some concepts in a simplified form as a prelude to the more detailed description that is presented later.
In a first aspect, an embodiment of the present application provides a method for optimizing a drift rate of a rubidium atomic clock, the method comprising:
Collecting frequency difference data of a rubidium atomic clock relative to a reference signal;
Establishing a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and a least square method;
And adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relation.
According to a preferred embodiment, the collecting frequency difference data of the rubidium atomic clock relative to the reference signal comprises:
And collecting the frequency difference data in a first preset time range.
According to a preferred embodiment, the acquiring the frequency difference data within a first preset time range includes:
collecting the output frequency and the reference frequency of the rubidium atomic clock within a first preset time range;
and obtaining the frequency difference data according to the output frequency and the reference frequency.
According to a preferred embodiment, said adjusting the output frequency of said rubidium atomic clock according to said time-frequency difference model and voltage-frequency fit relationship comprises:
predicting the frequency adjustment quantity of the rubidium atomic clock according to the time-frequency difference model;
converting the frequency adjustment amount into a voltage variation amount of the rubidium atomic clock;
and adjusting the output frequency in a second preset time range according to the voltage variation and the voltage-frequency fitting relation.
According to a preferred embodiment, before said adjusting the output frequency of said rubidium atomic clock according to said time-frequency difference model and voltage-frequency fit relationship, further comprising:
testing the constant-temperature crystal oscillator voltage-controlled voltage and the output frequency of the rubidium atomic clock;
And fitting the constant-temperature crystal oscillator voltage-controlled voltage and the output frequency to obtain the voltage-frequency fitting relation.
According to a preferred embodiment, further comprising:
And updating the time-frequency difference model according to the frequency difference data and the output frequency.
According to another aspect of a preferred embodiment, an embodiment of the present application provides an apparatus for optimizing a drift rate of a rubidium atomic clock, the apparatus comprising:
the data acquisition module is used for acquiring frequency difference data of the rubidium atomic clock relative to the reference signal;
The model building module is used for building a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and a least square method;
and the adjusting module is used for adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relation.
According to a preferred embodiment, the adjustment module comprises:
the prediction unit is used for predicting the frequency adjustment quantity of the rubidium atomic clock according to the time-frequency difference model;
A conversion unit for converting the frequency adjustment amount into a voltage variation amount of the rubidium atomic clock;
and the frequency adjusting unit is used for adjusting the output frequency of the rubidium atomic clock within a second preset time range according to the voltage variation and the voltage-frequency fitting relation.
According to another aspect of a preferred embodiment, the present embodiment provides a computer storage medium storing a plurality of instructions adapted to be loaded by a processor and to perform the above-described method steps.
According to another aspect of a preferred embodiment, an embodiment of the present application provides a terminal, which may comprise a processor and a memory, wherein the memory stores a computer program adapted to be loaded by the processor and to perform the above-mentioned method steps.
The technical scheme provided by the embodiment of the application can have the following beneficial effects:
In the embodiment of the application, the method for optimizing the drift rate of the rubidium atomic clock collects frequency difference data of the rubidium atomic clock relative to a reference signal, establishes a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and a least square method, and adjusts the output frequency of the rubidium atomic clock according to the time-frequency difference model and a voltage-frequency fitting relation. The application combines the time-frequency difference model of the rubidium atomic clock, the voltage-controlled voltage of the constant-temperature crystal oscillator and the output frequency of the rubidium atomic clock, when the rubidium atomic clock operates normally, the output frequency of the rubidium atomic clock is regulated by utilizing the crystal oscillator voltage-controlled voltage in the rubidium atomic clock, so that the optimization of the frequency drift rate characteristic of the rubidium atomic clock is realized, the frequency drift rate of the rubidium atomic clock can be automatically regulated, the regulation range of the frequency drift rate of the rubidium atomic clock is widened, the long-term stability and accuracy of the output frequency of the rubidium atomic clock are improved, and the application is used for optimizing the drift rate index of the rubidium atomic clock, improving the performance index and the yield of the rubidium atomic clock and has positive significance for reducing the development cost of the rubidium atomic clock and improving the drift rate of the rubidium atomic clock.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention as claimed.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
FIG. 1 is a schematic flow chart of a method for optimizing rubidium atomic clock drift rate according to an embodiment of the present application;
Fig. 2 is a schematic diagram of a constant-temperature crystal oscillator voltage-frequency data fitting curve of a rubidium atomic clock a in a test laboratory according to a method for optimizing a rubidium atomic clock drift rate provided by the embodiment of the application;
FIG. 3 is a graph showing a constant temperature crystal oscillator voltage-frequency data fitting curve of a rubidium atomic clock B in a test laboratory according to the method for optimizing the drift rate of the rubidium atomic clock provided by the embodiment of the application;
Fig. 4 is a schematic diagram of a rubidium atomic clock optimization principle of a method for optimizing a rubidium atomic clock drift rate according to an embodiment of the present application;
FIG. 5 is a schematic diagram of an apparatus for optimizing the drift rate of a rubidium atomic clock according to an embodiment of the present application;
Fig. 6 is a schematic diagram of an adjustment module of an apparatus for optimizing a drift rate of a rubidium atomic clock according to an embodiment of the present application;
Fig. 7 is a schematic diagram of a terminal according to an embodiment of the present application.
Detailed Description
The following description and the drawings sufficiently illustrate specific embodiments of the invention to enable those skilled in the art to practice them.
It should be understood that the described embodiments are merely some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the invention. Rather, they are merely examples of systems and methods that are consistent with aspects of the invention as detailed in the accompanying claims.
In the description of the present invention, it should be understood that the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art. Furthermore, in the description of the present invention, unless otherwise indicated, "a plurality" means two or more. "and/or" describes an association relationship of an association object, and indicates that there may be three relationships, for example, a and/or B, and may indicate that there are three cases of a alone, a and B together, and B alone. The character "/" generally indicates that the context-dependent object is an "or" relationship.
The following describes in detail a method for optimizing the drift rate of a rubidium atomic clock according to an embodiment of the present application with reference to fig. 1-4.
Referring to fig. 1-4, a flow chart of a method for optimizing a drift rate of a rubidium atomic clock is provided in an embodiment of the present application. As shown in fig. 1-4, the method according to the embodiment of the present application may include the following steps:
In the traditional rubidium atomic clock, along with the completion of the assembly of the rubidium atomic clock, the drift rate is basically in a fixed state, at the moment, the drift rate can only slowly decrease along with the increase of the running time, but theoretical analysis and experiments prove that a certain relationship exists between the voltage control voltage of the constant-temperature crystal oscillator in the rubidium atomic clock and the output frequency, and when the voltage control voltage changes, the output frequency also changes correspondingly. Therefore, the output frequency accuracy of the rubidium atomic clock can be adjusted by adjusting the voltage control terminal voltage of the constant-temperature crystal oscillator.
Aiming at the problem of larger rubidium atomic clock drift rate, the embodiment of the application provides a method for optimizing the rubidium atomic clock drift rate. The system block diagram of the whole design is shown in fig. 4, and specifically comprises a frequency difference measuring module, an MCU control module, a D/A converter and a rubidium atomic clock, wherein the frequency difference measuring module is respectively connected with a constant-temperature crystal oscillator in the rubidium atomic clock, a reference signal and the MCU control module, the MCU control module is connected to a voltage-controlled end of the constant-temperature crystal oscillator in the rubidium atomic clock through the D/A converter, the reference signal can represent signals of the reference frequency, and the rubidium atomic clock signal can represent signals of the output frequency of the rubidium atomic clock.
And step 1, collecting frequency difference data of the rubidium atomic clock relative to a reference signal. In step 1, it includes:
collecting the frequency difference data in a first preset time range, including:
And acquiring the output frequency and the reference frequency of the rubidium atomic clock within the first preset time range, and obtaining the frequency difference data according to the output frequency and the reference frequency.
After a certain determined rubidium atomic clock is started stably, measuring frequency difference data between a 10MHz signal output by the rubidium atomic clock and a reference 10MHz signal in a first preset time range through a frequency difference measuring module, wherein the output frequency can be the output 10MHz signal, and the reference frequency can be the reference 10MHz signal. The first preset time range represents a frequency difference measurement duration range, and the frequency difference measurement duration can be dynamically adjusted according to frequency difference data, so that the embodiment of the application can obtain the latest time-frequency difference model of the rubidium atomic clock, and the frequency drift rate characteristic of the rubidium atomic clock can be rapidly optimized. And the frequency difference measurement module sends the frequency difference data to the MCU control module.
And 2, establishing a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and a least square method.
In the embodiment of the application, after the MCU control module receives the frequency difference data, the MCU control module fits the frequency difference data through a linear fitting method based on a least square method principle, wherein a fitting model is y=ax+b, so that the square sum of deviation between each actual data point and a fitting curve is the smallest, and finally the values of a and b are obtained, thereby modeling the time-frequency difference relation of the rubidium atomic clock and obtaining the time-frequency difference model of the rubidium atomic clock. The time-frequency difference model is also called a frequency difference change model and represents the change trend of the frequency difference.
Before step 3, the method further comprises:
testing the constant-temperature crystal oscillator voltage-controlled voltage and the output frequency of the rubidium atomic clock;
and fitting the constant-temperature crystal oscillator voltage-controlled voltage and the output frequency to obtain the voltage-frequency fitting relation. The constant-temperature crystal oscillator voltage-controlled voltage can be 10MHz constant-temperature crystal oscillator voltage-controlled voltage.
In the embodiment of the application, the data between the voltage control voltage of the constant-temperature crystal oscillator in the specific rubidium atomic clock and the accuracy of the output frequency are measured, and a mathematical model between the voltage control voltage of the constant-temperature crystal oscillator in the rubidium atomic clock and the output frequency is established by the method based on the least square method, so that the fitting relation between the voltage control voltage of the constant-temperature crystal oscillator in the rubidium atomic clock and the output frequency is determined, and the fitting relation between the voltage control voltage of the constant-temperature crystal oscillator in the rubidium atomic clock and the output frequency is the voltage-frequency fitting relation of the rubidium atomic clock.
The embodiment of the application fits the constant-temperature crystal oscillator voltage-controlled voltage and output frequency in two known rubidium atomic clocks in a test laboratory, and a fitting curve between the constant-temperature crystal oscillator voltage-controlled voltage and output frequency in the rubidium atomic clock which is analyzed and tested by theory is shown in figures 2 and 3. As can be seen from the graph, the relationship between the voltage control terminal voltage and the output frequency of the crystal oscillator in the rubidium atomic clock a is:
y=1.45617x+9.99999E6
the relation between the voltage control terminal voltage and the output frequency of the crystal oscillator in the rubidium atomic clock B is as follows:
y=1.31097x+1E7
Therefore, the voltage and the output frequency of the constant-temperature crystal oscillator are basically in a linear relation, and the voltage-controlled terminal voltage and the output frequency of the constant-temperature crystal oscillator can be established through linear fitting.
And 3, adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relation. In step 3, it includes:
predicting the frequency adjustment quantity of the rubidium atomic clock according to the time-frequency difference model;
converting the frequency adjustment amount into a voltage variation amount of the rubidium atomic clock;
and adjusting the output frequency in a second preset time range according to the voltage variation and the voltage-frequency fitting relation.
In the embodiment of the application, the MCU control module can predict the DAC compensation output parameter of the rubidium atomic clock in the second prediction time range according to the time frequency difference model, convert the DAC compensation output parameter of the rubidium atomic clock into the voltage variation of the constant-temperature crystal oscillator voltage control end, and finally adjust the output frequency of the rubidium atomic clock according to the mode of adjusting the voltage variation in the voltage-frequency fitting relation, thereby improving the accuracy of the output frequency, optimizing the frequency drift rate of the rubidium atomic clock and improving the overall performance of the rubidium atomic clock. The rubidium atomic clock DAC compensation output parameter may refer to a frequency adjustment amount of the rubidium atomic clock.
The embodiment of the application can sequentially circulate the operations of the step 1, the step 2 and the step 3, thereby realizing the optimization of the frequency drift rate of the rubidium atomic clock. The second preset time range may be referred to as a compensation time or a frequency adjustment time range, and may be dynamically and flexibly adjusted according to the frequency difference data, so as to achieve the best frequency drift rate optimization effect.
For example, since the frequency drift rate of the rubidium atomic clock is large and the frequency difference data is large just after the rubidium atomic clock is powered up and stabilized, the second preset time range may be relatively small, and when the rubidium atomic clock is operated for a period of time, the frequency drift rate of the rubidium atomic clock is small and the frequency difference data is small, at this time, the second preset time range may be increased appropriately.
In an embodiment of the present application, the method further includes:
and updating the time-frequency difference model according to the frequency difference data and the output frequency.
The MCU control module comprises an MCU processing unit in which a software algorithm is embedded, namely, the time-frequency difference model of the rubidium atomic clock is updated every second preset time, so that the authenticity of the time-frequency difference model of the rubidium atomic clock is ensured. The first preset time range is before the second preset time range.
When no external reference signal exists, the MCU processing unit can complete modeling of a drift rate simplified model, namely a time-frequency difference model, according to the earlier-stage frequency difference data, and then optimize the drift rate according to the new time-frequency difference model.
In summary, according to the method for optimizing the drift rate of the rubidium atomic clock, after the rubidium atomic clock is started and stabilized, a time-frequency difference model of the rubidium atomic clock is built according to frequency difference data between the output frequency and the reference frequency of the rubidium atomic clock in a first preset time range, and the tested constant-temperature crystal oscillator voltage-controlled voltage and the output frequency of the rubidium atomic clock are fitted to obtain the voltage-frequency fitting relation of the rubidium atomic clock. And predicting a frequency adjustment amount in a second preset time range according to the time-frequency difference model, converting the frequency adjustment amount into a voltage change amount, and determining DAC compensation output parameters of the rubidium atomic clock according to the voltage change amount and the voltage-frequency fitting relation to realize the adjustment of the output frequency of the atomic clock. The embodiment of the application is simple, practical and designed and optimized, combines a time-frequency difference model of the rubidium atomic clock, voltage-controlled voltage of the constant-temperature crystal oscillator and output frequency of the rubidium atomic clock, adjusts the output frequency of the rubidium atomic clock by utilizing the crystal oscillator voltage-controlled voltage in the rubidium atomic clock when the rubidium atomic clock normally operates, realizes the optimization of the frequency drift rate characteristic of the rubidium atomic clock, not only can automatically adjust the frequency drift rate of the rubidium atomic clock, but also widens the adjustment range of the frequency drift rate of the rubidium atomic clock, improves the long-term stability and accuracy of the output frequency of the rubidium atomic clock, is used for optimizing the index of the rubidium atomic clock drift rate, improves the performance index and the yield of the rubidium atomic clock, and has positive significance for reducing the development cost of the rubidium atomic clock and improving the drift rate of the rubidium atomic clock.
The following are examples of the apparatus of the present invention that may be used to perform the method embodiments of the present invention. For details not disclosed in the embodiments of the apparatus of the present invention, please refer to the embodiments of the method of the present invention.
Referring to fig. 5 and 6, a schematic structural diagram of an apparatus for optimizing a rubidium atomic clock drift rate according to an exemplary embodiment of the present invention is shown. The device comprises a data acquisition module 1, a model building module 2 and an adjusting module 3. Wherein the adjusting module 3 comprises a prediction unit 4, a conversion unit 5 and a frequency adjusting unit 6.
The data acquisition module 1 is used for acquiring frequency difference data of the rubidium atomic clock relative to a reference signal;
the model building module 2 is used for building a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and a least square method;
And the adjusting module 3 is used for adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relation.
According to a preferred embodiment, the adjustment module 3 comprises:
A prediction unit 4, configured to predict a frequency adjustment amount of the rubidium atomic clock according to the time-frequency difference model;
a conversion unit 5 for converting the frequency adjustment amount into a voltage variation amount of the rubidium atomic clock;
And the frequency adjusting unit 6 is used for adjusting the output frequency of the rubidium atomic clock within a second preset time range according to the voltage variation and the voltage-frequency fitting relation.
It should be noted that, when the above embodiment provides a device for optimizing a drift rate of a rubidium atomic clock, only the division of the above functional modules is used for illustration, in practical application, the above functional allocation may be performed by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules, so as to complete all or part of the functions described above. In addition, the device for optimizing the drift rate of the rubidium atomic clock provided in the above embodiment and the method embodiment for optimizing the drift rate of the rubidium atomic clock belong to the same concept, which embody the detailed implementation process and are detailed in the method embodiment, and are not described herein again.
The foregoing embodiment numbers of the present application are merely for the purpose of description, and do not represent the advantages or disadvantages of the embodiments.
The device for optimizing the rubidium atomic clock drift rate acquires frequency difference data of the rubidium atomic clock relative to a reference signal, establishes a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and a least square method, and adjusts output frequency of the rubidium atomic clock according to the time-frequency difference model and a voltage-frequency fitting relation. The embodiment of the application combines the time-frequency difference model of the rubidium atomic clock, the voltage-controlled voltage of the constant-temperature crystal oscillator and the output frequency of the rubidium atomic clock, when the rubidium atomic clock operates normally, the output frequency of the rubidium atomic clock is regulated by utilizing the voltage-controlled voltage of the crystal oscillator in the rubidium atomic clock, so that the optimization of the frequency drift rate characteristic of the rubidium atomic clock is realized, the frequency drift rate of the rubidium atomic clock can be automatically regulated, the regulation range of the frequency drift rate of the rubidium atomic clock is widened, the long-term stability and accuracy of the output frequency of the rubidium atomic clock are improved, and the method is used for optimizing the drift rate index of the rubidium atomic clock, improving the performance index and the yield of the rubidium atomic clock and has positive significance for reducing the development cost of the rubidium atomic clock and improving the drift rate of the rubidium atomic clock.
The invention also provides a computer readable medium having stored thereon program instructions which, when executed by a processor, implement the method for optimizing the drift rate of a rubidium atomic clock provided by the various method embodiments described above.
The invention also provides a computer program product comprising instructions which, when run on a computer, cause the computer to perform the method of optimizing the drift rate of a rubidium atomic clock of the various method embodiments described above.
Referring to fig. 7, a schematic structural diagram of a terminal is provided in an embodiment of the present application. As shown in fig. 7, terminal 1000 can include at least one processor 1001, at least one network interface 1004, a user interface 1003, a memory 1005, and at least one communication bus 1002.
Wherein the communication bus 1002 is used to enable connected communication between these components.
The user interface 1003 may include a display (Di overlay), a Camera (Camera), and the optional user interface 1003 may further include a standard wired interface, a wireless interface, among others.
The network interface 1004 may include, among other things, a standard wired interface, a wireless interface (e.g., WI-FI interface) according to a preferred embodiment.
Wherein the processor 1001 may include one or more processing cores. The processor 1001 connects various parts within the entire electronic device 1000 using various interfaces and lines, and performs various functions of the electronic device 1000 and processes data by executing or executing instructions, programs, code sets, or instruction sets stored in the memory 1005, and invoking data stored in the memory 1005. According to a preferred embodiment, the processor 1001 may be implemented in at least one of a digital signal Processing (DIGITAL SIGNAL Processing, DSP), a Field-Programmable gate array (Field-Programmable GATE ARRAY, FPGA), a Programmable logic array (Programmable Logic Array, PLA) hardware form. The processor 1001 may integrate one or a combination of several of a central processing unit (Central Processing Unit, CPU), an image processor (Graphics Processing Unit, GPU), and a modem, etc. The CPU mainly processes an operating system, a user interface, an application program and the like, the GPU is used for rendering and drawing contents required to be displayed by the display screen, and the modem is used for processing wireless communication. It will be appreciated that the modem may not be integrated into the processor 1001 and may be implemented by a single chip.
The Memory 1005 may include a random access Memory (Random Access Memory, RAM) or a Read-Only Memory (Read-Only Memory). According to a preferred embodiment, the memory 1005 includes a non-transitory computer readable medium (non-transitory computer-readable storage medium). The memory 1005 may be used to store instructions, programs, code, sets of codes, or sets of instructions. The memory 1005 may include a stored program area that may store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playing function, an image playing function, etc.), instructions for implementing the above-described respective method embodiments, etc., and a stored data area that may store data, etc., referred to in the above-described respective method embodiments. The memory 1005 may also be at least one memory device located remotely from the aforementioned processor 1001 according to a preferred embodiment. As shown in fig. 7, an operating system, a network communication module, a user interface module, and a rubidium atomic clock drift rate optimization application may be included in memory 1005, which is a computer storage medium.
In terminal 1000 shown in fig. 7, user interface 1003 is mainly used for providing input interface for user to obtain user input data, while processor 1001 may be used for calling rubidium atomic clock drift rate optimizing application program stored in memory 1005, and specifically performing the following operations:
Collecting frequency difference data of a rubidium atomic clock relative to a reference signal;
Establishing a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and a least square method;
And adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relation.
And updating the time-frequency difference model according to the frequency difference data and the output frequency.
In one embodiment, the processor 1001 performs the following operations in detail when collecting the frequency difference data of the rubidium atomic clock relative to the reference signal:
The frequency difference data in a first preset time range is collected, specifically, the frequency difference data in the first preset time range is collected, and a time-frequency difference model of the rubidium atomic clock is built according to the frequency difference data and a least square method.
In one embodiment, the processor 1001 specifically performs the following operations before performing the adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship:
testing the constant-temperature crystal oscillator voltage-controlled voltage and the output frequency of the rubidium atomic clock;
And fitting the constant-temperature crystal oscillator voltage-controlled voltage and the output frequency to obtain the voltage-frequency fitting relation.
In one embodiment, the processor 1001, when executing the adjusting the output frequency of the rubidium atomic clock according to the time-frequency difference model and the voltage-frequency fitting relationship, specifically executes the following operations:
predicting the frequency adjustment quantity of the rubidium atomic clock according to the time-frequency difference model;
converting the frequency adjustment amount into a voltage variation amount of the rubidium atomic clock;
and adjusting the output frequency in a second preset time range according to the voltage variation and the voltage-frequency fitting relation.
The method and the device for optimizing the drift rate of the rubidium atomic clock,
The method comprises the steps of collecting frequency difference data of a rubidium atomic clock relative to a reference signal, establishing a time-frequency difference model of the rubidium atomic clock according to the frequency difference data and a least square method, and adjusting output frequency of the rubidium atomic clock according to a fitting relation of the time-frequency difference model and voltage-frequency. The embodiment of the application combines a time-frequency difference model of the rubidium atomic clock, the voltage-controlled voltage of the constant-temperature crystal oscillator and the output frequency of the rubidium atomic clock, when the rubidium atomic clock operates normally, the output frequency of the rubidium atomic clock is regulated by utilizing the voltage-controlled voltage of the crystal oscillator in the rubidium atomic clock, so that the optimization of the frequency drift rate characteristic of the rubidium atomic clock is realized, the frequency drift rate of the rubidium atomic clock can be automatically regulated, the regulation range of the frequency drift rate of the rubidium atomic clock is widened, the long-term stability and accuracy of the output frequency of the rubidium atomic clock are improved, and the device is used for optimizing the drift rate index of the rubidium atomic clock, improving the performance index and the yield of the rubidium atomic clock, and has positive significance for reducing the development cost of the rubidium atomic clock and improving the drift rate of the rubidium atomic clock.
Those skilled in the art will appreciate that a program implementing all or part of the above-described embodiment method, which is implemented by means of hardware related to instructions of a computer program, may be stored in a computer readable storage medium, and the program, when executed, may include the above-described embodiment method flow. The storage medium may be a magnetic disk, an optical disk, a read-only memory, a random access memory, or the like.
The foregoing disclosure is illustrative of the present application and is not to be construed as limiting the scope of the application, which is defined by the appended claims.
Claims (7)
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102122958A (en) * | 2011-02-21 | 2011-07-13 | 江汉大学 | device and method for automatically repairing rubidium atom frequency-standard frequency drift |
| CN104199274A (en) * | 2014-09-24 | 2014-12-10 | 北京市计量检测科学研究院 | Pre-estimating method for frequency modification value of rubidium clock |
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| US6614321B2 (en) * | 2002-02-04 | 2003-09-02 | Accubeat Ltd. | Atomic frequency standard and system having improved long term aging |
| CN204465512U (en) * | 2014-04-17 | 2015-07-08 | 江汉大学 | A Rubidium Atomic Frequency Standard Drift Correction System |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102122958A (en) * | 2011-02-21 | 2011-07-13 | 江汉大学 | device and method for automatically repairing rubidium atom frequency-standard frequency drift |
| CN104199274A (en) * | 2014-09-24 | 2014-12-10 | 北京市计量检测科学研究院 | Pre-estimating method for frequency modification value of rubidium clock |
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