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CN118130310B - Calibration method of full-detection type surface densimeter - Google Patents

Calibration method of full-detection type surface densimeter Download PDF

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CN118130310B
CN118130310B CN202410543973.3A CN202410543973A CN118130310B CN 118130310 B CN118130310 B CN 118130310B CN 202410543973 A CN202410543973 A CN 202410543973A CN 118130310 B CN118130310 B CN 118130310B
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pixel
value
linear array
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CN118130310A (en
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熊根超
曹国平
朱鹏程
朱非甲
黄群
李继尧
程九鑫
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Changzhou Ruiqi Precision Measurement Technology Co ltd
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Changzhou Ruiqi Precision Measurement Technology Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N9/00Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
    • G01N9/24Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material

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Abstract

The invention relates to the technical field of surface density detection, in particular to a calibration method of a full-detection type surface density meter, which comprises the following steps: all pixels are used for measuring standard plates; updating all pixel zero points before measurement; calibrating the measurement value before measurement; and (5) updating the real-time calibration. In actual measurement work, the target detection object can be calibrated in real time, the influence of changes of environmental equipment and the like on the surface density measurement of the product is reduced, meanwhile, after the measurement of a roll of product is completed, the zero value at the measurement pixel can be updated in real time, the measurement accuracy is further improved, in the actual use process, the measurement can be performed by adopting a smaller standard piece, the radiation source and the linear array detector are not required to be integrally moved out of the measurement area to calibrate the zero value and the measurement value, the equipment space is saved, and the condition of product missing detection is avoided.

Description

Calibration method of full-detection type surface densimeter
Technical Field
The invention relates to the technical field of surface density detection, in particular to a calibration method of a full-detection type surface density meter.
Background
The full detection type surface densimeter adopts a pair of probes of a strip-shaped light spot ray source and a linear array detector (the size of a single pixel detector is smaller), the strip-shaped light spot covers the width of the whole target detection object, the surface density profile detection of the target detection object can be realized without scanning the probe back and forth in the width direction, meanwhile, the target detection object is in a tape running state, and the full-covered line scanning full detection type surface density detection is performed on the target detection object.
After the calibration is completed, the full detection type surface density meter performs line scanning measurement of the surface density of the actual target detection object. And calculating a measured value according to the zero point value in the calibration, substituting the measured value x into a fitting model y=k x+b or y=a x 2+b x+c, and calculating to obtain the surface density value y. In the long-time measurement process, the change of environmental conditions such as temperature, humidity, air density, atmospheric pressure and the like, the change of temperature and humidity of a ray source and a detector, the change of emitted rays caused by the aging of the ray source or the attenuation of the ray source, the change of a response signal value caused by the aging of the detector and the like all cause the change of a zero point value and a measured value, and further the accuracy of the surface density measurement is influenced. Therefore, the zero point and the measured value need to be calibrated in the continuous measurement process.
In a full detection type areal density meter, zero points and measured values of all pixel sensors of a linear detector are required to be calibrated. At present, the adopted method is as follows: the method comprises the steps of moving the whole relative positions of a pair of probes of a radiation source and a linear array detector out of a measuring area, firstly measuring air to update the zero points of all pixel detectors, then measuring a strip-shaped standard sheet, and updating the compensation value of a measured value. In such a calibration mode, there are the following drawbacks:
1. The probe needs to be moved out of the measuring area integrally, so that the width of the calibrating position is increased besides the width of the target detecting object of the measuring position, the width of the calibrating position is equal to the width of the target detecting object, when the width of the target detecting object is larger, the width of the whole equipment is larger, and the whole equipment cannot be used under the condition that the installation space of the equipment is limited;
2. under the condition of non-measurement, the probe can be moved to the calibration position, generally, the probe can be moved out when a coil of material is measured and is subjected to coil replacement or tape splicing, but with the development of production technology, the time interval for carrying out one calibration is long due to longer and longer coil of material, the timeliness cannot be ensured, and even the automatic tape splicing of a machine can be realized, so that the probe cannot be moved out of calibration without the opportunity, unless the probe is moved out of calibration at a set time interval, but the measurement position is provided with product tape, and detection omission can be caused;
3. there is a risk that the zero point of the air measured at the calibration position is inconsistent with the zero point of the air measured at the measurement position, the zero point update instead causes an error, and the risk of such zero point inconsistency comes from a change in the relative position of the probe, even from a difference in the air state of the two positions.
Disclosure of Invention
The invention aims to provide a calibration method of a full-detection type surface densitometer, which aims to solve the problems in the background technology.
In order to achieve the above purpose, the present invention provides the following technical solutions: the calibration method of the full detection type surface density meter is characterized by comprising the following steps of:
S1, all pixel standard measurement sheets: the method comprises the steps that a ray source emits rays to a linear array detector, the ray source forms a strip-shaped light spot on the linear array detector, the strip-shaped light spot covers the width of the linear array detector, a standard sheet moves from one end to the other end of the linear array detector at a uniform speed along the length direction of the linear array detector, the linear array detector comprises a plurality of pixel detectors, and each pixel detector records a measured value of rays penetrating the standard sheet to reach each pixel detector;
S2, updating zero points of all pixels before measurement: the method comprises the steps that a ray source emits rays to a linear array detector, and each pixel detector of the linear array detector detects the primary intensity I 0 of the rays reaching the detector through air and updates a zero value ln (I 0);
S3, calibrating measured values before measurement: dividing a plurality of pixel detectors of a linear array detector into calibration pixels and measurement pixels, wherein the calibration pixels are positioned at the edge of the linear array detector, moving a standard sheet to the positions of the calibration pixels, recording measured values of rays penetrating the standard sheet to reach each calibration pixel, recording variation delta x of the measured values and the measured values in the step S1, and updating the variation delta x into a calibration fitting model of the pixel detector;
S4, real-time calibration and updating: and if no detection object exists between the ray source and the linear array detector, updating the zero point according to the step S2.
Further, the measurement value calculation formula is x=ln (I 0) -ln (I), where x is the measurement value, I 0 is the primary intensity of the ray, and I is the intensity of the ray after penetrating through the material.
Further, the calibration fitting model of the pixel detector in the step S3 is y=k (x- Δx) +b or y=a (x- Δx)/(2+b (x- Δx) +c, where x is a measured value, y is an areal density of the material, and k, b or a, b, c are constants obtained after calibration.
Further, the step S4 of calibrating the zero value and the measured value of the measured pixel in real time by using the calibration pixel includes the following steps:
S41, calibrating zero points: the ray source emits rays to the linear array detector, a target detection object passes through between the ray source and a measurement pixel of the linear array detector at a constant speed, the primary intensity I 0 of the rays passing through the air to reach a calibration pixel of the linear array detector is recorded, the variation value of a zero point value ln (I 0) in the step S2 is calculated, the difference value of the primary intensity I 0 and the zero point value ln is compensated to the zero point value of the measurement pixel, the measurement value of the measurement pixel is calculated by using the zero point value of the calibrated measurement pixel, and the zero point value of the calibration pixel is updated;
s42, calibrating measured values: and (3) moving the standard sheet between the ray source and calibration pixels of the linear array detector, recording the measured value of the rays penetrating the standard sheet to reach each calibration pixel, recording the variation Deltax of the measured value and the measured value in the step (S3), and updating the variation to Deltax in the calibration fitting model.
Further, the linear array detector comprises a plurality of mutually independent modules, the calibration pixels are a plurality of pixel detectors on one module, and the pixels on the other modules are measurement pixels.
Further, the calibration pixels and the measurement pixels on the modules are divided into n areas corresponding to each other, and zero point values and measurement values of the measurement pixels in the corresponding areas on other modules are calibrated by using zero point value average values and measurement value average values of the calibration pixels in the areas.
Further, the width of the standard plate is not smaller than the width of the calibration pixel.
Further, the measured value of the standard chip is in the measured value range of the target detection object.
Compared with the prior art, the invention has the beneficial effects that:
1. The probe is not required to be integrally moved out of the measurement area to calibrate the zero point and the measured value, so that the probe is fixed and does not need a calibration position beyond the measurement position, the equipment space is saved, and compared with the whole equipment, the probe has smaller size and can be used in a common installation position;
2. Zero points and measured values of the pixel sensors at the measuring positions can be corrected in real time, the accuracy of the surface density value of the surface densimeter in the continuous measuring process is improved, and meanwhile zero point updating of each pixel sensor and standard sheet measured value updating of each pixel sensor are matched when no product is detected between probes, so that the accuracy of the surface density in measuring is further ensured;
3. the condition of no missed detection target detection object exists, and the continuous and stable work can be realized for a long time;
4. Only the standard sheet with smaller size is needed to be manufactured, and compared with the long standard sheet with the probe moved out for calibration, the standard sheet is easier to manufacture and more stable and reliable under the condition of long-time use.
Drawings
FIG. 1 is a flow chart of the steps of the present invention;
FIG. 2 is a schematic diagram of the structure of the measuring device of the present invention;
FIG. 3 is a graph showing the mean value of the calibration pixel zero points of the present invention over time;
FIG. 4 is a graph showing the trend of zero values of a 200 th pixel detector of a measurement position over time according to the present invention;
Fig. 5 is a trend chart of zero values obtained by dividing the 1 st board card into 1 area for calibration over time;
fig. 6 is a trend chart of zero values obtained by dividing the 1 st board card into 8 areas for calibration over time;
Fig. 7 is a trend chart of zero values obtained by dividing the 1 st board card into 128 areas for calibration over time;
FIG. 8 is a graph showing the average value of the calibration pixel measurement values over time according to the present invention;
FIG. 9 is a graph showing the trend of the measurement of the 229 th pixel detector according to the present invention;
FIG. 10 is a graph showing the trend of measured values obtained by dividing the 1 st board card into 1 area for calibration over time;
FIG. 11 is a graph showing the trend of measured values obtained by dividing the 1 st board card into 8 areas for calibration over time;
fig. 12 is a graph showing the time-dependent trend of the measured values obtained by dividing the 1 st board card into 128 areas for calibration.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1-2, a calibration method of a full detection type surface densitometer includes the following steps:
S1, all pixel standard measurement sheets: the ray source emits rays to the linear array detector, the ray source forms a strip-shaped light spot on the linear array detector, the strip-shaped light spot covers the width of the linear array detector, the standard sheet moves from one end to the other end of the linear array detector at a uniform speed along the length direction of the linear array detector, the linear array detector comprises a plurality of pixel detectors, each pixel detector records the measured value of rays penetrating the standard sheet to reach each pixel detector, wherein the measured value of the standard sheet is in the measured value range of a target detection object, and the stability of the standard sheet is good;
S2, updating zero points of all pixels before measurement: the ray source emits rays to the linear array detector, each pixel detector of the linear array detector detects the primary intensity of the rays reaching the detector through air and updates a zero value ln (I 0);
S3, calibrating measured values before measurement: dividing a plurality of pixel detectors of a linear array detector into calibration pixels and measurement pixels, wherein the calibration pixels are positioned at the edge of the linear array detector, moving a standard sheet to the positions of the calibration pixels, recording measured values of rays penetrating the standard sheet to reach each calibration pixel, recording the variation Deltax of the measured values and the measured values in the step S1, and updating the variation Deltax into a calibration fitting model of the pixel detector, wherein the width of the standard sheet is not smaller than the width of the calibration pixels, so that the standard sheet can be measured by the calibration pixels;
S4, real-time calibration and updating: if no detection object exists between the ray source and the linear array detector, updating the zero point according to the step S2;
in step S4, the calibration pixels are used to calibrate the zero value and the measured value of the measured pixel in real time, which includes the following steps:
S41, calibrating zero points: the ray source emits rays to the linear array detector, a target detection object passes through between the ray source and a measurement pixel of the linear array detector at a constant speed, the primary intensity I 0 of the rays passing through the air to reach a calibration pixel of the linear array detector is recorded, the variation value of a zero point value ln (I 0) in the step S2 is calculated, the difference value of the primary intensity I 0 and the zero point value ln is compensated to the zero point value of the measurement pixel, the measurement value of the measurement pixel is calculated by using the zero point value of the calibrated measurement pixel, and the zero point value of the calibration pixel is updated;
S42, calibrating measured values: and (3) moving the standard sheet between the ray source and calibration pixels of the linear array detector, recording measured values of rays penetrating the standard sheet to reach each calibration pixel, recording variation delta x of the measured values and the measured values in S3, and updating the variation delta x to the variation delta x in the calibration fitting model.
The calculation formula of the measured value is x=ln (I 0) -ln (I), wherein x is the measured value, I 0 is the primary intensity of the rays, and I is the intensity of the rays after penetrating through the material;
in step S3, the calibration fitting model of the pixel detector is y=k (x- Δx) +b or y=a (x- Δx)/(2+b (x- Δx) +c, where x is a measured value, y is the areal density of the material, and k, b or a, b, c are constants obtained after calibration;
further, calibration is to determine a corresponding relation between the surface density of a known surface density sample and a measurement signal according to the attenuation rule of a ray bundle, and a calibration fitting model is determined, which is not described in detail herein, in this embodiment, calibration is performed in the actual measurement process of a target detection object after calibration is completed.
Further, the linear array detector comprises a plurality of mutually independent modules, which can be specifically a gas linear array detector or a solid linear array detector, the calibration pixels are a plurality of pixel detectors on one module, the pixels on the other modules are measurement pixels, the calibration pixels and the measurement pixels on the modules are divided into n areas corresponding to each other one by one, and zero point value average values and measured value average values of all the areas of the calibration pixels are utilized to correspond to zero point values and measured values of the measurement pixels of the corresponding areas on the other modules.
The following description is made with reference to specific examples.
S1, all pixel standard measurement sheets: the ray source emits rays to the linear array detector, the ray source forms a strip-shaped light spot on the linear array detector, the strip-shaped light spot covers the width of the linear array detector, the standard sheet moves from one end to the other end of the linear array detector at a uniform speed along the length direction of the linear array detector, the linear array detector comprises a plurality of pixel detectors, each pixel detector records the measured value of rays penetrating the standard sheet to reach each pixel detector, wherein the measured value of the standard sheet is in the measured value range of a target detection object, and the stability of the standard sheet is good;
s2, updating zero points of all pixels before measurement: the ray source emits rays to the linear array detector, each pixel detector of the linear array detector detects the primary intensity of the rays reaching the detector through air and updates a zero value ln (I 0);
S3, calibrating measured values before measurement: dividing a plurality of pixel detectors of a linear array detector into calibration pixels and measurement pixels, wherein the calibration pixels are positioned at the edge of the linear array detector, moving a standard sheet to the positions of the calibration pixels, recording the measured values of rays penetrating the standard sheet to reach each calibration pixel, recording the variation delta x of the measured values and the measured values in the step S1, updating the variation delta x into a calibration fitting model of the pixel detectors, wherein the width of the standard sheet is not smaller than the width of the calibration pixels, ensuring that the calibration pixels can be measured by the standard sheet, in the embodiment, the linear array detector is particularly a solid linear array detector, 6 plates are arranged on 1 plate card, 128 pixel detectors are arranged on the 1 plate card, so 768 pixel detectors are all arranged, 128 pixels on the 1 plate card are selected as the calibration pixels, 640 pixels on other 5 plate cards are used as the measurement pixels, and in the embodiment, the 128 pixels of the calibration pixels are respectively divided into 1 area, 8 area and 128 area to calibrate the measured values and zero point measured values of the measurement pixels in the other 5 plate cards;
S4, real-time calibration and updating: if no detection object exists between the ray source and the linear array detector, updating the zero point according to the step S2;
in step S4, the calibration pixels are used to calibrate the zero point and the measured value of the measured pixel in real time, which includes the following steps:
S41, calibrating zero points: referring to fig. 2, a radiation source emits radiation to a linear array detector, a target detection object passes through between measuring pixels of the radiation source and the linear array detector at a constant speed, the width of the target detection object is not larger than that of the measuring pixels, a standard piece is moved to the outer side of a probe, air is arranged between the emitter and the linear array detector, the primary intensity I 0 of the radiation reaching a calibration pixel of the linear array detector through the air is recorded, the change value of a zero value ln (I 0) in the step S2 is calculated, the difference value of the primary intensity I 0 and the primary intensity of the radiation reaching the calibration pixel of the linear array detector is compensated to the zero value of the measuring pixel, the measured value of the measuring pixel is calculated by using the zero value of the calibrated measuring pixel, and I is the radiation intensity of the radiation reaching the measuring pixel through the target detection object and the zero value of the calibration pixel is updated at the same time;
S42, calibrating measured values: referring to fig. 2, the standard film is moved between the calibration pixels of the radiation source and the linear array detector, the measured value of the radiation penetrating the standard film reaching each calibration pixel is recorded, the variation Δx of the measured value and the measured value in step S3 is recorded, the variation Δx is updated to a calibration fitting model y=k (x- Δx) +b or y=a (x- Δx)/(2+b) +c, x in the calibration fitting model is specifically the measured value of the measurement pixel calculated by using the calibrated zero value in step S41, k, b or a, b and c are constants, and the two calibrations obtain the surface density value y of the target detection object, so as to realize real-time surface density calibration and improve the surface density measurement accuracy.
Referring to fig. 3-7, in order to verify the zero calibration method, all pixel detectors are continuously measured for a long time, as shown in fig. 3, which is the average value of the zero points of all 128 pixel detectors of the 1 st board card, and the trend of the zero points is changed along with time. FIG. 4 is a plot of zero value of a 200 th pixel detector of a measurement location over time; FIG. 5 is a graph showing the zero point value trend with time obtained in a calibrated manner by dividing the 1 st board card into 1 area and using the change of the zero point value to compensate the zero point added to the 200 th pixel; FIG. 6 is a graph showing the zero point value of the pixel in the corresponding area on the other board card calibrated by dividing the 1 st board card into 8 areas, wherein the zero point value of the corresponding area on the other board card is changed by the zero point value of the 5 th area to compensate the zero point added to the 200 th pixel, so that the zero point value obtained in a calibrated manner has a time-varying trend; fig. 7 is a diagram showing the division of 1 board card into 128 areas, that is, each pixel is used to calibrate the zero value of the pixel at the corresponding position on the other board card, and the change of the zero value of the 72 th pixel is used to compensate the zero added to the 200 th pixel, so that the change trend of the zero value with time is obtained in a calibrated manner. The graph can be divided into 1,8 and 128 areas, the zero value obtained in a calibration mode is relatively close to the actual zero value, and the calibration effect is relatively good;
Referring to fig. 8-12, in order to verify the measurement value calibration method, an elongated standard sheet is prepared and placed between probes, so that all pixel detectors continuously measure the standard sheet for a long time to obtain measurement values, as shown in fig. 8, the average value of the measurement values of all 128 pixel detectors of the 1 st board card is the trend along with time. FIG. 9 shows the trend of the measurement of the 229 th pixel detector over time, with the purpose of calibrating the measurement to suppress the change in the measurement over time to a level as much as possible over time. Fig. 10, 11 and 12 respectively divide the 1 st board card into 1, 8 and 128 areas as described above, and respectively calibrate the 229 th pixel measured value by using the average value change of the measured value of the corresponding area measurement standard sheet, and as can be obtained from the figure, the 1 st board card is divided into 1 whole area with a calibrating effect but smaller effect, and the 8 or 128 area is divided into 8 or 128 areas with better calibrating effect, so that the expectation that the measured value is leveled with time is basically reached.
In this embodiment, the calibration effect of dividing the 1 st board card into 1 area is relatively poor, the calibration effect of dividing the 1 st board card into 128 areas in a short time is relatively large, dividing the 1 st board card into 8 areas is relatively suitable, the calibration effect is relatively good, not only considering that each area of the board card is somewhat specific and inherent in difference, but also a plurality of pixels are arranged in each area, a zero point average value and a standard chip measurement value average value can be used, and the calibration result with relatively large jitter in a short time is not caused.
It should be noted that the number of the areas is divided into a plurality of areas, and the area is obtained according to the characteristics of the linear array detector and the actual test.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims (8)

1. The calibration method of the full detection type surface density meter is characterized by comprising the following steps of:
S1, all pixel standard measurement sheets: the method comprises the steps that a ray source emits rays to a linear array detector, the ray source forms a strip-shaped light spot on the linear array detector, the strip-shaped light spot covers the width of the linear array detector, a standard sheet moves from one end to the other end of the linear array detector at a uniform speed along the length direction of the linear array detector, the linear array detector comprises a plurality of pixel detectors, and each pixel detector records a measured value of rays penetrating the standard sheet to reach each pixel detector;
S2, updating zero points of all pixels before measurement: the method comprises the steps that a ray source emits rays to a linear array detector, and each pixel detector of the linear array detector detects the primary intensity I 0 of the rays reaching the detector through air and updates a zero value ln (I 0);
S3, calibrating measured values before measurement: dividing a plurality of pixel detectors of a linear array detector into calibration pixels and measurement pixels, wherein the calibration pixels are positioned at the edge of the linear array detector, moving a standard sheet to the positions of the calibration pixels, recording measured values of rays penetrating the standard sheet to reach each calibration pixel, recording variation delta x of the measured values and the measured values in the step S1, and updating the variation delta x into a calibration fitting model of the pixel detector;
S4, real-time calibration and updating: and if no detection object exists between the ray source and the linear array detector, updating the zero point according to the step S2.
2. The method for calibrating a full-detection type surface densitometer according to claim 1, wherein the method comprises the following steps: the measurement value calculation formula is x=ln (I 0) -ln (I), wherein x is the measurement value, I 0 is the primary intensity of the rays, and I is the intensity of the rays after penetrating through the material.
3. The method for calibrating a full-detection type surface densitometer according to claim 2, wherein: the calibration fitting model of the pixel detector in the step S3 is y=k (x- Δx) +b or y=a (x- Δx)/(2+b) (x- Δx) +c, where x is a measured value, y is the areal density of the material, and k, b or a, b, c are constants obtained after calibration.
4. A method of calibrating a full-inspection densitometer according to claim 3, wherein: in the step S4, the calibration pixels are used to calibrate the zero point value and the measured value of the measured pixel in real time, which includes the following steps:
S41, calibrating zero points: the ray source emits rays to the linear array detector, a target detection object passes through between the ray source and a measurement pixel of the linear array detector at a constant speed, the primary intensity I 0 of the rays passing through the air to reach a calibration pixel of the linear array detector is recorded, the variation value of a zero point value ln (I 0) in the step S2 is calculated, the difference value of the primary intensity I 0 and the zero point value ln is compensated to the zero point value of the measurement pixel, the measurement value of the measurement pixel is calculated by using the zero point value of the calibrated measurement pixel, and the zero point value of the calibration pixel is updated;
s42, calibrating measured values: and (3) moving the standard sheet between the ray source and calibration pixels of the linear array detector, recording the measured value of the rays penetrating the standard sheet to reach each calibration pixel, recording the variation Deltax of the measured value and the measured value in the step (S3), and updating the variation to Deltax in the calibration fitting model.
5. The method for calibrating a full-detection type surface densitometer according to claim 1, wherein the method comprises the following steps: the linear array detector comprises a plurality of mutually independent modules, the calibration pixels are a plurality of pixel detectors on one module, and the pixels on the other modules are measurement pixels.
6. The method for calibrating a full-detection type surface densitometer according to claim 5, wherein: dividing the calibration pixels and the measurement pixels on the modules into n areas corresponding to each other, and calibrating the zero values and the measurement values of the measurement pixels of the corresponding areas on the other modules by using the zero value average value and the measurement value average value of each area of the calibration pixels.
7. The method for calibrating a full-detection type surface densitometer according to claim 1, wherein the method comprises the following steps: the width of the standard piece is not smaller than the width of the calibration pixel.
8. The method for calibrating a full-detection type surface densitometer according to claim 1, wherein the method comprises the following steps: the measured value of the standard sheet is in the measured value range of the target detection object.
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