CN119178913B - Flip-top cable test fixture and test equipment - Google Patents
Flip-top cable test fixture and test equipment Download PDFInfo
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- CN119178913B CN119178913B CN202411704409.1A CN202411704409A CN119178913B CN 119178913 B CN119178913 B CN 119178913B CN 202411704409 A CN202411704409 A CN 202411704409A CN 119178913 B CN119178913 B CN 119178913B
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- 238000012360 testing method Methods 0.000 title claims abstract description 58
- 239000000523 sample Substances 0.000 claims abstract description 76
- 238000007667 floating Methods 0.000 claims abstract description 48
- 238000006073 displacement reaction Methods 0.000 claims description 3
- 238000004804 winding Methods 0.000 claims description 2
- 238000004513 sizing Methods 0.000 claims 4
- 238000010586 diagram Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 238000007493 shaping process Methods 0.000 description 8
- 230000013011 mating Effects 0.000 description 5
- 238000005452 bending Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 4
- 238000009434 installation Methods 0.000 description 3
- 210000001503 joint Anatomy 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000011900 installation process Methods 0.000 description 1
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- 239000000463 material Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
本发明公开了一种翻盖式排线测试治具及测试设备，包括基座、探针翻盖和快换夹具，基座设置有夹具定位槽和限位锁扣结构，夹具定位槽内设置有第一定位部，探针翻盖包括盖板、浮动板、承载板和探针模组，浮动板与盖板浮动连接，承载板与浮动板连接，探针模组安装在承载板上，承载板上设置有定位导柱，快换夹具可拆卸安装在夹具定位槽内，快换夹具设置有第二定位部和定位导孔，第二定位部和第一定位部配合形成定位结构，定位导孔与定位导柱配合形成定位导向结构。通过浮动板和盖板之间的浮动连接，实现探针模组的位置可调，并通过定位导孔和定位导柱进行定位导向，从而使探针模组的位置适配于快换夹具，进而提高探针与测试点的对位准确性。
The present invention discloses a flip-type cable test fixture and test equipment, including a base, a probe flip cover and a quick-change fixture, the base is provided with a fixture positioning groove and a limit lock structure, a first positioning part is provided in the fixture positioning groove, the probe flip cover includes a cover plate, a floating plate, a bearing plate and a probe module, the floating plate is floatingly connected to the cover plate, the bearing plate is connected to the floating plate, the probe module is mounted on the bearing plate, a positioning guide column is provided on the bearing plate, the quick-change fixture is detachably mounted in the fixture positioning groove, the quick-change fixture is provided with a second positioning part and a positioning guide hole, the second positioning part cooperates with the first positioning part to form a positioning structure, and the positioning guide hole cooperates with the positioning guide column to form a positioning guide structure. Through the floating connection between the floating plate and the cover plate, the position of the probe module is adjustable, and positioning and guiding are performed through the positioning guide hole and the positioning guide column, so that the position of the probe module is adapted to the quick-change fixture, thereby improving the alignment accuracy of the probe and the test point.
Description
Technical Field
The invention relates to the technical field of testing, in particular to a flip type flat cable testing jig and testing equipment.
Background
In the design of rechargeable products, in order to save internal space and improve compactness and portability of the products, the flexible flat cable often needs to be bent. The bending design is not only beneficial to optimizing the internal structure of the product, but also can reduce the use of materials and reduce the cost, and the connection flat cable of the charging product is mostly in a straight structure or tested before being bent in advance. However, the bent flexible flat cable may be affected by stress concentration, abrasion and other factors during long-term use, resulting in performance degradation and even failure. Therefore, performing the bending test is an important means for evaluating the performance stability and the service life of the flexible flat cable in the bent state. The connecting flat cable of the charging product is improved into a bending structure with 180 degrees by a straight structure, the original testing jig is not applicable any more, and the manual testing efficiency is lower. In the research and development process of a new test fixture, the problem that the probe and the test point are not aligned accurately easily is found because the size of the test point on the connection flat cable is small and dense and the probe contacted with the test point is small and dense.
Disclosure of Invention
The present invention aims to solve at least one of the technical problems existing in the prior art. Therefore, the invention provides a flip type flat cable test fixture and test equipment, which are provided with a floating probe structure, and can improve the alignment accuracy of probes and test points.
In one aspect, an embodiment of the present invention provides a flip-type flat cable testing fixture, including:
The base is provided with a clamp positioning groove and a limiting lock catch structure, and a first positioning part is arranged in the clamp positioning groove;
The probe flip cover is provided with a first end and a second end, the first end of the probe flip cover is connected with the base, the second end of the probe flip cover can rotate around the first end relative to the base and is movably connected with the limiting lock catch structure so as to cover the clamp positioning groove, the probe flip cover comprises a cover plate, a floating plate, a bearing plate and a probe module, the floating plate is in floating connection with the cover plate, the bearing plate is connected with the floating plate, the probe module is installed on the bearing plate, and a positioning guide post is arranged on the bearing plate;
quick change anchor clamps, demountable installation is in the anchor clamps constant head tank, quick change anchor clamps are provided with second location portion and location guide hole, second location portion with first location portion cooperation forms location structure, the location guide hole with the cooperation of location guide pillar forms location guide structure.
According to some embodiments of the invention, the cover plate is provided with a plurality of limit posts, the floating plate is provided with a plurality of limit holes, the floating plate is sleeved on the plurality of limit posts of the cover plate through the plurality of limit holes, and a fine adjustment gap is arranged between the inner wall of the limit hole and the limit posts.
According to some embodiments of the invention, limiting frames are arranged on the cover plate and located on two opposite sides of the floating plate, limiting rollers are mounted on two opposite sides of the floating plate, the limiting rollers are located in the limiting frames, and a first elastic piece is connected between the cover plate and the floating plate.
According to some embodiments of the invention, the cover plate comprises a first bearing frame and a second bearing frame which are nested with each other, wherein one side edge of the first bearing frame is used or provided with a fool-proof matching part, a distance difference is formed between the bottom surface of the first bearing frame and the bottom surface of the second bearing frame to form fool-proof avoidance, and the bottom surface of the first bearing frame and the bottom surface of the second bearing frame face the quick-change clamp in the rotation direction of the cover plate.
According to some embodiments of the invention, a second avoidance space is arranged on the base and located on the adjacent side of the clamp positioning groove, and an interface component is installed in the second avoidance space and can move towards the direction approaching or away from the clamp positioning groove.
According to some embodiments of the invention, a locking concave position is formed at the edge of the first bearing frame, a limiting locking member is arranged on the interface assembly, and the limiting locking member can move along with the interface assembly and is clamped in the locking concave position.
According to some embodiments of the invention, the second carrying frame is provided with a pressing rod, and the position of the pressing rod is adapted to the signal interface of the target product.
According to some embodiments of the invention, a sheath is movably mounted on the bearing plate, and a third elastic piece is connected between the bearing plate and the sheath, and the sheath is sleeved on the probe module.
According to some embodiments of the invention, the first end of the first bearing frame and the first end of the second bearing frame are connected to the same rotating shaft, a reset torsion spring is mounted on the rotating shaft, and the second end of the second bearing frame is abutted to the second end of the first bearing frame.
On the other hand, the embodiment of the invention provides test equipment, which comprises the flip type flat cable test fixture.
The embodiment of the invention has at least the following beneficial effects:
The position of the probe module is adjustable through floating connection between the floating plate and the cover plate, and positioning and guiding are carried out through the positioning guide hole and the positioning guide pillar, so that the position of the probe module is adapted to the quick-change clamp, and the alignment accuracy of the probe and the test point is improved.
Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
The foregoing and/or additional aspects and advantages of the invention will become apparent and may be better understood from the following description of embodiments taken in conjunction with the accompanying drawings in which:
FIG. 1 is a schematic diagram of a flip-top flat cable testing fixture (with a quick-change fixture hidden) according to an embodiment of the present invention;
fig. 2 is a second schematic structural diagram of a flip-type flat cable testing fixture according to an embodiment of the present invention (the probe flip is in an open state);
Fig. 3 is a third schematic structural diagram of a flip-type flat cable testing fixture according to an embodiment of the present invention (the probe flip is in a closed state);
FIG. 4 is a schematic diagram of a probe flip cover of the flip-type flat cable testing fixture shown in FIG. 2;
FIG. 5 is a second schematic diagram of a probe flip cover of the flip-type flat cable testing fixture shown in FIG. 2;
FIG. 6 is a schematic structural diagram of a quick-change fixture of the flip-type flat cable testing fixture shown in FIG. 2;
FIG. 7 is a second schematic diagram of a quick-change fixture of the flip-type flat cable testing fixture shown in FIG. 2;
FIG. 8 is a third (top view) schematic structural diagram of a quick-change fixture of the flip-type flat cable testing fixture shown in FIG. 2;
FIG. 9 is a cross-sectional view of the C-C mark position of FIG. 8;
FIG. 10 is a schematic view of the structure of a target workpiece according to an embodiment of the invention;
fig. 11 is a partial enlarged view of the circled position B in fig. 5.
Reference numerals:
The base 100, the fixture positioning groove 101, the first positioning part 102, the first avoidance space 103, the clamping flange 104, the second avoidance space 106, the limiting latch structure 110, the interface component 130, the interface module 131, the connecting piece 132, the driving piece 133, the slide rail module 134, the limiting latch 135, the probe flip 200, the cover plate 210, the first bearing frame 211, the limiting frame 2111, the locking recess 2112, the rotating shaft 2113, the reset torsion spring 2114, the second bearing frame 212, the limiting post 2121, the pressing rod 2122, the floating plate 220, the limiting hole 221, the limiting roller 222, the bearing plate 230, the positioning guide post 231, the sheath 232, the probe module 240, the quick-change fixture 300, the bottom plate 310, the guide hole 311, the second positioning part 312, the positioning plate 320, the positioning guide hole 321, the pressing piece 330, the fool-proof slider 340, the fool-proof boss 341, the first pressing part 342, and the clamping part 343.
Detailed Description
Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative only and are not to be construed as limiting the invention.
In the description of the present invention, it should be understood that references to orientation descriptions such as upper, lower, front, rear, left, right, etc. are based on the orientation or positional relationship shown in the drawings, are merely for convenience of description of the present invention and to simplify the description, and do not indicate or imply that the apparatus or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention.
In the description of the present invention, the meaning of "a number" means one or more, the meaning of "a plurality" means two or more, and greater than, less than, exceeding, etc. are understood to not include the present number, and "above", "below", "within", etc. are understood to include the present number. If any, the terms "first," "second," etc. are used for distinguishing between technical features only, and should not be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless explicitly defined otherwise, terms such as "disposed," "mounted," "connected," and the like are to be construed broadly and the specific meaning of the terms in the present invention can be reasonably determined by those skilled in the art in combination with the specific contents of the technical solutions.
The embodiment discloses test equipment which comprises a flip type flat cable test fixture. Referring to fig. 1 and 2, the flip-type flat cable testing fixture includes a base 100, a probe flip 200, and a quick-change fixture 300. The base 100 is provided with a fixture positioning groove 101 and a limiting latch structure 110, and a first positioning part 102 is arranged in the fixture positioning groove 101. Referring to fig. 1, 2 and 3, the probe flip 200 has a first end and a second end, the first end of the probe flip 200 is connected with the base 100, the second end of the probe flip 200 can rotate around the first end relative to the base 100 and is movably connected with the limiting latch structure 110 to cover the fixture positioning slot 101, wherein the limiting latch structure 110 can be designed according to practical application, for example, the limiting latch structure 110 can be a buckle element, when the probe flip 200 covers the fixture positioning slot 101, the buckle element can be clamped to the edge of the probe flip 200 to be connected with the buckle element, for example, the limiting latch structure 110 is a turnbuckle element (not shown), when the probe flip 200 covers the fixture positioning slot 101, the turnbuckle element rotates by a certain angle to limit the edge of the probe flip 200, for example, the limiting latch structure 110 is a lock hole (not shown) arranged on the base 100, and when the probe flip 200 covers the fixture positioning slot 101, the corresponding buckle element or turnbuckle element on the probe flip 200 is inserted into the lock hole and is matched with the lock hole to limit. It is conceivable that when the probe cover 200 is covered on the clip positioning groove 101, the first end and the second end of the probe cover 200 are located on opposite sides of the clip positioning groove 101, respectively, for example, in a first direction (right-left direction as indicated in fig. 1) with respect to the length direction of the clip positioning groove 101, and in a second direction (front-rear direction as indicated in fig. 1) with respect to the width direction of the clip positioning groove 101, respectively, the first end and the second end of the probe cover 200 are located on opposite sides of the second direction of the clip positioning groove 101. Referring to fig. 2, 4 and 5, the probe flip 200 includes a cover plate 210, a floating plate 220, a carrier plate 230 and a probe module 240, the floating plate 220 is in floating connection with the cover plate 210, the carrier plate 230 is connected with the floating plate 220, the probe module 240 is mounted on the carrier plate 230, and a positioning guide post 231 is disposed on the carrier plate 230.
Referring to fig. 1 and 2, the quick-change fixture 300 is detachably mounted in the fixture positioning groove 101, referring to fig. 1, 6 and 7, the quick-change fixture 300 is provided with a second positioning portion 312 and a positioning guide hole 321, the second positioning portion 312 and the first positioning portion 102 cooperate to form a positioning structure, and illustratively, the first positioning portion 102 and the second positioning portion 312 are mutually matched protrusions and recesses, for example, the first positioning portion 102 is a protruding column disposed on the base 100, the second positioning portion 312 is a recess disposed at the bottom of the quick-change fixture 300, for example, the first positioning portion 102 is a recess disposed on the base 100, and the second positioning portion 312 is a protruding block disposed at the bottom of the quick-change fixture 300. Referring to fig. 2, the positioning guide hole 321 and the positioning guide post 231 cooperate to form a positioning guide structure.
Before testing the target product, the target product is preloaded into the quick-change fixture 300, please refer to fig. 10, the target product is a flat cable with a 180-degree bending structure, the target product is preloaded through the quick-change fixture 300, please refer to fig. 1 and 7, when the test is required, the quick-change fixture 300 preloaded with the target product is installed into the fixture positioning groove 101 of the base 100, and in the installation process, the quick-change fixture 300 and the base 100 are positioned through the second positioning part 312 and the first positioning part 102, so that the installation convenience and accuracy are improved, and the test point of the target product is located at or near the expected position. Then, cover the probe flip 200 in the fixture positioning slot 101, in the process of covering, the positioning guide hole 321 positions and guides the positioning guide post 231, so that the positioning guide post 231 drives the floating plate 220 to carry out position fine adjustment, the position of the probe module 240 can be well adapted to the position of the quick-change fixture 300, thereby ensuring that the probe module 240 is accurately aligned with the test point of the target product, and the limiting lock catch structure 110 on the base 100 is matched and fixed with the probe flip 200, so that the probe flip 200 is prevented from displacing in the test process and can keep good contact between the probe and the test point, thereby being beneficial to improving the reliability of the test.
Therefore, through the floating connection between the floating plate 220 and the cover plate 210, the position of the probe module 240 is adjustable, and the positioning guide hole 321 and the positioning guide post 231 are used for positioning and guiding, so that the position of the probe module 240 is adapted to the quick-change fixture 300, and the alignment accuracy of the probe and the test point is improved.
Referring to fig. 5 and 11, the cover 210 is provided with a plurality of limit posts 2121, the floating plate 220 is provided with a plurality of limit holes 221, the floating plate 220 is sleeved on the plurality of limit posts 2121 of the cover 210 through the plurality of limit holes 221, and a fine adjustment gap is provided between an inner wall of the limit hole 221 and the limit posts 2121. The floating plate 220 is in a rectangular structure, and the four corners of the floating plate 220 are respectively provided with a limiting hole 221, and correspondingly, the cover plate 210 is provided with four limiting posts 2121, wherein the limiting posts 2121 adopt fasteners such as screws or bolts, and the aperture of the limiting holes 221 is slightly larger than the diameter of the limiting posts 2121, so that fine adjustment gaps are formed between the inner walls of the limiting holes 221 and the limiting posts 2121, and the floating plate 220 can move relative to the cover plate 210 in different directions.
Referring to fig. 4 and 5, limiting frames 2111 are disposed on the cover plate 210 and located on opposite sides of the floating plate 220, limiting rollers 222 are mounted on opposite sides of the floating plate 220, the limiting rollers 222 are located in the limiting frames 2111, a first elastic member is connected between the cover plate 210 and the floating plate 220, the first elastic member adopts a spring, the first elastic member can apply elastic force to the floating plate 220, so that the floating plate 220 has a trend of keeping away from the cover plate 210, the limiting rollers 222 and the limiting frames 2111 are matched, the floating plate 220 and the cover plate 210 can be kept within a certain distance, the end portions of limiting posts 2121 can be prevented from directly limiting the floating plate 220, friction between the limiting rollers 222 and the limiting frames 2111 is rolling friction, friction force is small, friction force born by the floating plate 220 is reduced, relative movement between the floating plate 220 and the cover plate 210 is easier, and position fine adjustment of the probe module 240 is facilitated.
With continued reference to fig. 4 and 5, the cover 210 includes a first carrying frame 211 and a second carrying frame 212 that are nested with each other, where one side edge of the first carrying frame 211 is used as or provided with a foolproof mating portion (as indicated by a reference P1 in fig. 2), and a distance difference (as indicated by a reference D in fig. 4) is provided between a bottom surface of the first carrying frame 211 and a bottom surface of the second carrying frame 212 to form a foolproof avoidance position, and the bottom surfaces of the first carrying frame 211 and the second carrying frame 212 are both oriented to the quick-change fixture 300 in a rotation direction of the cover 210. Illustratively, the cover 210 can rotate counterclockwise to cover the fixture positioning slot 101, and the bottom surface of the first carrying frame 211 and the bottom surface of the second carrying frame 212 face the quick-change fixture 300 when viewed in the rotation direction (indicated by the arc-shaped double-headed arrow in fig. 4) of the cover 210. The first bearing frame 211 and the second bearing frame 212 are both in cuboid structures, the middle of the first bearing frame 211 is hollowed to leave a frame, the second bearing frame 212 is sleeved at the middle of the first bearing frame 211, and in the rotating process, one side edge of the first bearing frame 211 is used or provided with a foolproof matching part.
Referring to fig. 1, a first avoidance space 103 is disposed in a fixture positioning groove 101 of a base 100, a clamping flange 104 is disposed on an inner wall of the first avoidance space 103, referring to fig. 6 to 9, a quick-change fixture 300 includes a bottom plate 310, a positioning plate 320, a pressing member 330 and a foolproof slider 340, the bottom plate 310 is provided with a guide hole 311 and a second positioning portion 312, the positioning plate 320 is mounted on the bottom plate 310, at least one of the bottom plate 310 and the positioning plate 320 is provided with a positioning guide hole 321, for example, the bottom plate 310 is provided with the positioning guide hole 321, for example, the positioning plate 320 is provided with the positioning guide hole 321, or, for example, the bottom plate 310 and the positioning plate 320 are both provided with the positioning guide hole 321, the positioning guide hole 321 is matched with the positioning guide post 231 to form a positioning guide structure, the positioning plate 320 is used for shaping a target product, wherein the pressing member 330 is movably mounted on the bottom plate 310 and can be matched with a first product limiting structure on a first side of the positioning plate 320, referring to fig. 1, fig. 8 and 9, the foolproof slider 340 is slidably mounted on the guide hole 311 and is partially penetrated into the first avoidance slider 103, for example, the positioning guide hole 321 is provided with the positioning guide hole 321, for example, for the positioning guide hole 321 is provided with the positioning guide hole 321, for the positioning guide 320 is matched with the first guide rail 320 is provided with the first guide rail 320 with a second guide rail, and has a second guide rail, and the pressing member is movably mounted with a positioning guide rail. When the target product needs to be loaded into the quick-change fixture 300, a first product gap (shown as a reference P2 in fig. 6 or 9) formed between the shaping plate 320 and the bottom plate 310 is suitable for placing a first portion (shown as a reference L1 in fig. 10) of the target product, the shaping plate 320 is suitable for placing a second portion (shown as a reference L2 in fig. 10) of the target product, during the placing process, the first portion of the target product is inserted into the first product gap from front to back, and the second portion of the target product is folded and placed around the shaping plate 320 from the side edge of the shaping plate 320 (the portion shown as a reference L3 is inserted into a position shown as a reference P3 in fig. 6 or 9), that is, the shaping plate 320 is located between the first portion and the second portion of the target product for supporting and shaping the target product. In order to prevent rebound or loosening of the target product, the pressing member 330 cooperates with the first side of the molding plate 320 to form a first product limiting structure, so that the target product can be limited and fixed.
Referring to fig. 4, a distance difference (shown as a reference D in fig. 4) is formed between the bottom surface of the first carrying frame 211 and the bottom surface of the second carrying frame 212, that is, the bottom surface of the first carrying frame 211 and the bottom surface of the second carrying frame 212 are not flush, when the fool-proof slider 340 is in the first working position, the fool-proof slider 340 can interfere with the edge of the first carrying frame 211, thereby playing a fool-proof role, when the fool-proof slider 340 is switched to the second working position, the fool-proof slider 340 is staggered from the edge of the first carrying frame 211, the position of the fool-proof slider 340 is adapted to the second carrying frame 212, and because a distance difference is formed between the bottom surface of the first carrying frame 211 and the bottom surface of the second carrying frame 212, the fool-proof slider 340 cannot abut against the bottom surface of the second carrying frame 212, that is, the second carrying frame 212 cannot interfere with the fool-proof slider 340, and the probe flip 200 can cover smoothly. The edge of one side of the first carrying frame 211 may be used as a fool-proof mating portion, that is, the fool-proof slider 340 may interfere with the edge of the first carrying frame 211 in the first working position, or the edge of one side of the first carrying frame 211 is provided with a fool-proof mating portion, for example, the edge of the first carrying frame 211 is provided with a fool-proof protrusion (not shown) serving as a fool-proof mating portion, and the fool-proof slider 340 may interfere with the fool-proof protrusion. The limit post 2121 is mounted on the second carrying frame 212 and the limit frame 2111 is mounted on the first carrying frame 211.
Referring to fig. 6 to 9, the fool-proof slider 340 is provided with a fool-proof protrusion 341, a first press-connection portion 342 and a clamping portion 343, wherein the fool-proof protrusion 341 and the first press-connection portion 342 are both located on the upper side of the bottom plate 310, the clamping portion 343 is located on the lower side of the bottom plate 310, the fool-proof protrusion 341 and the fool-proof mating portion form a fool-proof structure in the first working position, and the clamping portion 343 and the bottom plate 310 are respectively located on two opposite sides (upper and lower sides as shown in fig. 1) of the clamping flange 104 in order to be clamped to the clamping flange 104 in the second working position, and the first press-connection portion 342 is matched with the second side of the positioning plate 320 to form a second product limiting structure. The fool-proof slider 340 has a simple structure, but can realize fool-proof function, prevent misoperation from damaging the probe module 240, can realize clamping fixation between the quick-change clamp 300 and the base 100, prevent misoperation from causing displacement of the quick-change clamp 300 to damage the probe module 240 or poor contact, and can be matched with the shaping plate 320 to clamp and fix the target product, so that the target product can be shaped.
Referring to fig. 2 and 3, a second avoidance space 106 is provided on the base 100 and located on the adjacent side of the fixture positioning slot 101, and an interface component 130 is installed in the second avoidance space 106, where the interface component 130 can move towards a direction approaching or separating from the fixture positioning slot 101. The interface assembly 130 is adapted to interface with a signal on a target product, and after the quick-change fixture 300 is installed in the fixture positioning slot 101, the probe flip 200 is closed and the interface assembly 130 is moved toward the direction approaching the fixture positioning slot 101 to interface with the signal interface on the target product. Wherein the second clearance space 106 is configured to provide space for installation and movement of the interface assembly 130.
With continued reference to fig. 2 and 3, a locking recess 2112 is formed at an edge of the first carrying frame 211, and the interface assembly 130 is provided with a limiting locking member 135, where the limiting locking member 135 can move along with the interface assembly 130 and is clamped in the locking recess 2112. Illustratively, the locking recess 2112 is a circular arc notch recess, the limiting locking member 135 is a cylindrical structure with a flange at its end, and when the interface assembly 130 moves reversely towards the fixture positioning slot 101, the limiting locking member 135 moves along with the interface assembly 130 and is clamped in the locking recess 2112, so as to prevent the first carrying frame 211 from being opened during the testing process. It should be noted that, the cooperation between the limiting locking member 135 and the locking recess 2112 can prevent the operator from triggering the limiting locking structure 110 on the base 100 to open the first carrying frame 211 during the testing process, which is beneficial to improving the reliability of the testing.
For example, referring to fig. 2, the interface assembly 130 includes an interface module 131, a connecting member 132, a driving member 133 and a sliding rail module 134, the interface module 131 is mounted on the connecting member 132, the sliding rail module 134 is mounted on the base 100 and located at one side of the second avoidance space 106, and the connecting member 132 is respectively connected with the driving member 133 and the sliding rail module 134. The driving piece 133 adopts an air cylinder or a motor, the sliding rail module 134 comprises a sliding rail and a sliding block arranged on the sliding rail, the sliding rail is arranged on the base 100, and the driving piece 133 is used for driving the connecting piece 132 to move under the guiding action of the sliding rail module 134 so as to enable the interface module 131 to be in butt joint with a signal interface of a target product. The interface module 131 includes a circuit board and an interface device connected to the circuit board. A limit lock 135 is mounted on the connector 132.
Referring to fig. 2 and fig. 4, a pressing rod 2122 is disposed on the second carrying frame 212, a position of the pressing rod 2122 is adapted to a signal interface of a target product, and the pressing rod 2122 is used for fixing the signal interface of the target product in an abutting manner. After the probe flip 200 is covered, the pressing rod 2122 can abut against the signal interface of the target product from the upper part, so that the signal interface of the target product is fixed, the interface assembly 130 is ensured to smoothly butt against the signal interface of the target product, and the signal interface of the target product is ensured not to displace in the butt joint process, so that the butt joint reliability is improved.
Referring to fig. 4, a sheath 232 is movably mounted on the carrier 230, and a third elastic member is connected between the carrier 230 and the sheath 232, and the sheath 232 is sleeved on the probe module 240. Before the probe flip 200 is not connected with the limiting latch structure 110, the sheath 232 is sleeved on the outer side of the probe module 240 to protect the probe module 240, when the probe flip 200 is in a complete covering state and is connected with the limiting latch structure 110, the end of the sheath 232 is abutted against a target product, and under the reaction force of the target product, the sheath 232 moves reversely and compresses the third elastic piece to expose the probe module 240, so that the probe module 240 can be in contact with a test point of the target product. Thus, the probe module 240 can be protected by the sheath 232, so that the probability of damage of the probe module 240 due to misoperation is reduced. Wherein, the third elastic element adopts a spring.
With continued reference to fig. 4, the first end of the first carrying frame 211 and the first end of the second carrying frame 212 are connected to the same rotation shaft 2113, a return torsion spring 2114 is mounted on the rotation shaft 2113, and the second end of the second carrying frame 212 abuts against the second end of the first carrying frame 211. The reset torsion spring 2114 is configured to provide a reset spring force for the second carrying frame 212, when the locking restriction between the limiting latch structure 110 and the probe flip 200 is released, the second carrying frame 212 reversely rotates under the action of the reset torsion spring 2114, and since the second end of the second carrying frame 212 abuts against the second end of the first carrying frame 211, the second carrying frame 212 can drive the first carrying frame 211 to synchronously rotate, thereby realizing automatic opening of the probe flip 200. Wherein the rotation shaft 2113 is directly or indirectly installed on the base 100, so that the first and second loading frames 211 and 212 can rotate with respect to the base 100.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of one of ordinary skill in the art without departing from the spirit of the present invention.
Claims (10)
1. Flip formula winding displacement test fixture, its characterized in that includes:
The base (100) is provided with a clamp positioning groove (101) and a limiting lock catch structure (110), and a first positioning part (102) and a first avoidance space (103) are arranged in the clamp positioning groove (101);
the probe flip (200) is provided with a first end and a second end, the first end of the probe flip (200) is connected with the base (100), the second end of the probe flip (200) can rotate around the first end relative to the base (100) and is movably connected with the limiting lock catch structure (110) so as to cover the clamp positioning groove (101), the probe flip (200) comprises a cover plate (210), a floating plate (220), a bearing plate (230) and a probe module (240), the floating plate (220) is in floating connection with the cover plate (210), the bearing plate (230) is connected with the floating plate (220), the probe module (240) is installed on the bearing plate (230), and a positioning guide pillar (231) is arranged on the bearing plate (230);
quick-change anchor clamps (300) are detachably installed in anchor clamps constant head tank (101), quick-change anchor clamps (300) include bottom plate (310), sizing board (320), compress tightly piece (330) and prevent slow-witted slider (340), bottom plate (310) are provided with guiding hole (311) and second location portion (312), second location portion (312) with first location portion (102) cooperation forms location structure, sizing board (320) are installed on bottom plate (310), bottom plate (310) with at least one of sizing board (320) is provided with location guide hole (321), location guide hole (321) with location guide pillar (231) cooperation forms location guide structure, compress tightly piece (330) movable mounting be in on bottom plate (310) and can cooperate first side of sizing board (320) forms first product limit structure, prevent slow-witted slider (340) slidable mounting in guiding hole (311) and part wear to first vacancy (103).
2. The flip type flat cable testing jig according to claim 1, wherein the cover plate (210) is provided with a plurality of limit posts (2121), the floating plate (220) is provided with a plurality of limit holes (221), the floating plate (220) is sleeved on the plurality of limit posts (2121) of the cover plate (210) through the plurality of limit holes (221), and fine adjustment gaps are arranged between inner walls of the limit holes (221) and the limit posts (2121).
3. The flip type flat cable testing jig according to claim 2, wherein a limit frame (2111) is provided on the cover plate (210) and located on two opposite sides of the floating plate (220), limit rollers (222) are mounted on two opposite sides of the floating plate (220), the limit rollers (222) are located in the limit frame (2111), and a first elastic element is connected between the cover plate (210) and the floating plate (220).
4. A flip-type flat bar testing jig according to claim 1,2 or 3, wherein the cover plate (210) comprises a first carrying frame (211) and a second carrying frame (212) which are mutually nested, one side edge of the first carrying frame (211) is used or provided with a fool-proof matching part, a distance difference is formed between the bottom surface of the first carrying frame (211) and the bottom surface of the second carrying frame (212) to form fool-proof avoidance, and the bottom surfaces of the first carrying frame (211) and the second carrying frame (212) face the quick-change clamp (300) in the rotation direction of the cover plate (210).
5. The flip type flat cable testing jig according to claim 4, wherein a second avoidance space (106) is formed on the base (100) and located on the adjacent side of the fixture positioning groove (101), an interface component (130) is mounted in the second avoidance space (106), and the interface component (130) can move towards a direction approaching or separating from the fixture positioning groove (101).
6. The flip type flat cable testing jig according to claim 5, wherein a locking concave position (2112) is provided at an edge of the first carrying frame (211), a limiting locking member (135) is provided on the interface assembly (130), and the limiting locking member (135) can move along with the interface assembly (130) and is clamped in the locking concave position (2112).
7. The flip type flat cable testing jig according to claim 5 or 6, wherein a pressing rod (2122) is disposed on the second carrying frame (212), and the position of the pressing rod (2122) is adapted to the signal interface of the target product.
8. The flip-type flat cable testing jig according to any one of claims 1 to 3,5 or 6, wherein a sheath (232) is movably mounted on the carrier plate (230), a third elastic member is connected between the carrier plate (230) and the sheath (232), and the sheath (232) is sleeved on the probe module (240).
9. The flip type flat cable testing jig according to claim 4, wherein a first end of the first carrying frame (211) and a first end of the second carrying frame (212) are connected to a same rotation shaft (2113), a reset torsion spring (2114) is mounted on the rotation shaft (2113), and a second end of the second carrying frame (212) is abutted to a second end of the first carrying frame (211).
10. A test apparatus comprising a flip-top flat cable test fixture as claimed in any one of claims 1 to 9.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202411704409.1A CN119178913B (en) | 2024-11-26 | 2024-11-26 | Flip-top cable test fixture and test equipment |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202411704409.1A CN119178913B (en) | 2024-11-26 | 2024-11-26 | Flip-top cable test fixture and test equipment |
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| Publication Number | Publication Date |
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| CN119178913A CN119178913A (en) | 2024-12-24 |
| CN119178913B true CN119178913B (en) | 2025-03-25 |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN207164100U (en) * | 2017-08-31 | 2018-03-30 | 苏州欧立通自动化科技有限公司 | A kind of micropin test device |
| CN111880086A (en) * | 2020-09-03 | 2020-11-03 | 广东金龙东创智能装备有限公司 | A wiring test device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020003242A (en) * | 2018-06-26 | 2020-01-09 | 日置電機株式会社 | Measuring instrument protection case |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN207164100U (en) * | 2017-08-31 | 2018-03-30 | 苏州欧立通自动化科技有限公司 | A kind of micropin test device |
| CN111880086A (en) * | 2020-09-03 | 2020-11-03 | 广东金龙东创智能装备有限公司 | A wiring test device |
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| CN119178913A (en) | 2024-12-24 |
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