CN119246022A - A photoelectric simulator characteristic parameter testing device and method - Google Patents
A photoelectric simulator characteristic parameter testing device and method Download PDFInfo
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- CN119246022A CN119246022A CN202411579771.0A CN202411579771A CN119246022A CN 119246022 A CN119246022 A CN 119246022A CN 202411579771 A CN202411579771 A CN 202411579771A CN 119246022 A CN119246022 A CN 119246022A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4413—Type
- G01J2001/442—Single-photon detection or photon counting
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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Abstract
The invention belongs to the technical field of testing of characteristic parameters of photoelectric simulators, and particularly relates to a device and a method for testing the characteristic parameters of a photoelectric simulator. The laser emission module and the photoelectric detection module are respectively connected with a control computer through signals, the laser coding control system codes laser signals according to a specified coding sequence, the laser device realizes 980nm laser stable output in a main oscillation power amplification mode, the single-electron detector converts the received coded laser signals or the received heavy-frequency laser signals into ultra-narrow electric pulse signals, and the laser decoding measurement system processes the pulse current signals of the detector to obtain voltage signals corresponding to optical power density. Compared with the prior art, the invention adopts the single photon detector, improves the accuracy of power density measurement, realizes quick response, increases a temperature control module, improves environmental adaptability and measurement stability, compresses input into a vector of potential space by adopting step convolution, reduces the requirement on calculation resources, and effectively improves the operation performance.
Description
Technical Field
The invention belongs to the technical field of testing of characteristic parameters of photoelectric simulators, and particularly relates to a device and a method for testing the characteristic parameters of a photoelectric simulator.
Background
Along with the rapid development of the photoelectric technology, the photoelectric simulator has more and more mature technology, reaches the level of large-scale output, is widely applied to training, and achieves obvious effect. The photoelectric simulator has the problems that the receiving sensitivity of a certain probability is reduced, the indication state is inaccurate and the like after the photoelectric simulator is used for a period of time, and the photoelectric simulator can be effectively and normally used in a high-efficiency mode through regular calibration. The simulator has large usage amount, the optimal solution is field calibration, and a great deal of time and labor are avoided during factory return calibration, so that the characteristic parameter calibration technology of the photoelectric simulator is more and more widely focused. At present, the calibration test of photoelectric basic parameters is solved in China, but the field calibration of characteristic parameters of a photoelectric simulator is not yet completed, and the problem is solved.
The photoelectric simulator has the core of a laser transmitter at a transmitting end and a photoelectric detector at a receiving end, and has the basic working principle that the coded laser transmitter transmits invisible laser to human eyes, the coded laser contains various effective information, and the photoelectric detector performs intensity inversion and information decoding after receiving the laser and judges the final effect by comparing the information with database information.
The laser transmitter in the photoelectric simulator system is usually a semiconductor laser, the output wavelength is 980nm +/-10 nm, the pulse width is 2 mu s-3 mu s, the modulation frequency is 48kHz +/-0.15%, and the working wavelength range of the photoelectric receiver is 980nm +/-20 nm according to the standard requirements. Because the design rules of the photoelectric simulator system are not uniform, early products developed by partial units work near the wavelengths of 940nm and 1064nm, and are not in accordance with the standard requirements, and the products need to be improved to adapt to new requirements. The current photoelectric simulator calibration and test technology is not complete enough, each unit establishes an indoor calibration device which is suitable for own needs, and the photoelectric simulator is mainly used for product delivery and improved test, and is not developed for on-site calibration technology research in most cases. The photoelectric simulator system needs to carry out test calibration work of parameters such as error rate, detection sensitivity, detection power and the like.
The bit error rate, i.e., symbol error rate, refers to the proportion of the number of erroneous symbols received by the receiving end in the total number of symbols transmitted, and may also be referred to as the probability that the symbols are transmitted in the transmission system. In a communication system, signals are transmitted from a transmitting end to a receiving end along respective channels. Some of these channels are analog channels and others are digital channels. In analog channels, the transmitting and receiving ends typically require modulators and demodulators to effect the interconversion between digital and analog signals on the transmitted signals. The signal change and attenuation will occur in the signal conversion and transmission process, so that the signal judgment error will generate error code. In digital channels, errors may also occur due to symbol synchronization, inter-symbol interference, and the like. Therefore, reliability problems of communication channels in communication systems are receiving a great deal of attention when information is transferred. When the quality of the communication channel of the data transmission equipment is detected, the error rate is a main index for evaluating the working performance of the data transmission equipment. The level of the error rate directly determines whether a communication channel is available. The error rate tester can carry out corresponding acceptance and maintenance on optical communication, communication access network and other systems, and sends a sequence generated by the error rate tester to a tested channel, and then compares received data with local data at a receiving end to obtain the error rate of the channel. The process comprises test sequence generation, error code comparison, statistics and the like.
The detection sensitivity is an important index of laser detection of the photoelectric simulator, and the physical meaning is that the minimum light power received by the detector is that the detection system can distinguish weaker light pulse signals, for example, in a pulse laser ranging system, the detection sensitivity can be greatly reduced due to the influence of atmospheric attenuation, background light interference and self thermal noise of the detection system, so that in order to increase the detection distance, besides the increase of the emission power of the laser, various noises are required to be restrained, and meanwhile, weak light signals are extracted from the noises, so that a design scheme of the high-sensitivity pulse detection system is required to be provided, and the indexes such as the detection distance, the detection precision and the like are met.
The existing technical scheme aiming at the detection sensitivity of the photoelectric simulator generally adopts a combination mode of a laser matched with a laser attenuation sheet. The optical component of the laser detection equipment mainly comprises a forward cut-off filter and a field diaphragm, the detection window is generally larger, the actual effective clear aperture is the diameter of the photosensitive surface of the photoelectric detector, and the diameter is generally less than 1mm, so that the stability of the power and the uniformity of the energy density distribution of the test laser for detecting the laser detection sensitivity are the main factors for determining the detection accuracy. The energy distribution of the main light spot of the fundamental mode laser of a general laser is quasi-Gaussian distribution, the light spot energy is larger in random fluctuation and uneven in distribution, the energy density distribution fluctuates about 5 times, random deviation of a plurality of times can be generated when the laser detection sensitivity is measured, the sensitivity minimum value can not be accurately measured quantitatively, and the dynamic range of the sensitivity is difficult to calibrate. In addition, the test scheme for the bit error rate at home and abroad usually adopts a mode of generating a dithering signal by quadrature modulation, but the bit error rate test equipment usually has the defects of low channel rate, low response speed, single output signal code pattern mode and the like. All the factors bring certain influence to the detection sensitivity of the photoelectric simulator, the measurement accuracy of the error rate and the response speed, and an accurate measurement result cannot be obtained.
The prior art scheme mainly has the following defects of 1 and low measurement accuracy. The optical component of the laser detection equipment cannot meet the detection requirement, the energy of a laser spot is expressed in a random fluctuation mode, so that the random deviation of the laser detection sensitivity is large, the calculation is inaccurate, and the final measurement accuracy is affected. 2. The environmental adaptability is poor. The existing photoelectric simulator measuring equipment does not have a temperature control module, and the current technical scheme does not carry out temperature control design on the detector and the laser module, so that the environmental adaptability of the system is poor. 3. The existing test scheme has high data redundancy rate, occupies more calculation resources, and has low response speed.
Disclosure of Invention
In order to solve the problems in the prior art, the invention provides a device and a method for testing characteristic parameters of a photoelectric simulator.
The technical scheme includes that the photoelectric simulator characteristic parameter testing device comprises a laser emitting module, a photoelectric detection module and a control computer, wherein the laser emitting module and the photoelectric detection module are respectively connected with the control computer through signals, the laser emitting module comprises a laser and a laser coding control system, the laser is connected with the laser coding control system, the laser coding control system codes laser signals according to a specified coding sequence, the laser realizes 980nm laser stable output in a main oscillation power amplification mode, the photoelectric detection module comprises a single-electron detector and a laser decoding measurement system, the single-electron detector converts received coded laser signals or heavy-frequency laser signals into ultra-narrow electrical pulse signals, and the laser decoding measurement system processes detector pulse current signals to obtain voltage signals corresponding to optical power density.
The photoelectric detection module further comprises a second optical component, wherein the second optical component is positioned at the front side of the receiving end of the single-electron detector, and the second optical component is used for converging and transmitting the received laser coding signals and laser repetition frequency signals to the single-electron detector.
The first optical component comprises a beam expander and a first diaphragm, the input end of the beam expander is close to the laser, the first diaphragm is located on one side of the output end of the beam expander, the second optical component comprises an integrating sphere and a second diaphragm, the light entrance of the integrating sphere is aligned with the light entrance hole of the photoelectric detection module, and the second diaphragm is located between the integrating sphere and the single-electron detector.
Further, the laser emission module is arranged in the first shielding cage, and the photoelectric detection module is arranged in the second shielding cage.
Further, the laser emission module is internally provided with a first temperature control module, and the photoelectric detection module is internally provided with a second temperature control module.
Further, a main control program module and a laser coding database are arranged in the control computer, and the main control program module is in signal connection with the laser coding database.
Further, the control computer is used for controlling the system and data acquisition processing, and the stepping convolution is adopted to compress the input into a vector of potential space.
The method for testing the characteristic parameters of the photoelectric simulator is applied to the device for testing the characteristic parameters of the photoelectric simulator and comprises the following steps:
S1, turning on a characteristic parameter testing device of a photoelectric simulator and equipment to be tested to a specified state;
S2, adjusting an optical axis, and connecting the output of the optical axis with a main control computer;
s3, collecting data and calculating detection power;
s4, calculating detection sensitivity indexes, wherein the detection sensitivity indexes comprise but are not limited to power density;
S5, decoding the laser code and calculating the error rate.
Compared with the prior art, the invention has the beneficial effects that:
1. The detector adopts a single photon detector, so that the power density measurement accuracy is improved and the quick response is realized compared with the traditional test method;
2. The temperature control module is added, so that the environmental adaptability and the measurement stability can be improved;
3. The invention adopts stepping convolution instead of maximum pooling in the traditional convolution method to compress the input into a vector of potential space, thereby reducing the demand on computing resources and effectively improving the operation performance.
Drawings
FIG. 1 is a diagram of a device for testing characteristic parameters of a photoelectric simulator;
FIG. 2 is a schematic diagram of an integrating sphere detector;
FIG. 3 is a software framework diagram of a device for testing characteristic parameters of a photoelectric simulator;
FIG. 4 is a test flow chart;
Wherein,
1. A laser emitting module, 2, a photoelectric detecting module, 3, a control computer,
101. A laser 102, a beam expander 103, a first diaphragm 104, a first shielding cage, 105, a first temperature control module, 106, a laser coding control system,
201. Integrating sphere 202, second diaphragm 203, single electron detector 204, second shielding cage 205, second temperature control module 206, laser decoding measuring system,
301. And the main control program module 302 is a laser coding database.
Detailed Description
In order that the invention may be readily understood, a more particular description thereof will be rendered by reference to specific embodiments that are illustrated in the appended drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
A photoelectric simulator characteristic parameter testing device comprises a laser emitting module 1, a photoelectric detection module 2 and a control computer 3, wherein the laser emitting module 1 and the photoelectric detection module 2 are respectively connected with the control computer 3 in a signal mode, the laser emitting module 1 comprises a laser 101 and a laser coding control system 106, the laser 101 is connected with the laser coding control system 106, the laser coding control system 106 codes laser signals according to a specified coding sequence, the laser 101 adopts a main oscillation power amplification mode to realize 980nm laser stable output, the photoelectric detection module 2 comprises a single-electron detector 203 and a laser decoding measurement system 206, the single-electron detector 203 converts received coded laser signals or heavy-frequency laser signals into ultra-narrow electric pulse signals, and the laser decoding measurement system 206 processes the detector pulse current signals to obtain voltage signals corresponding to optical power density.
In one embodiment, the laser emitting module 1 further comprises a first optical component 107, the first optical component 107 is located at the rear of the emitting end of the laser 101, the laser 101 is used for coupling seed signal light and pump light with high beam quality into a double-clad optical fiber to amplify through the first optical component 107 so as to achieve stable output of laser with specific wavelength, the photoelectric detection module 2 further comprises a second optical component 207, the second optical component 207 is located at the front side of the receiving end of the single-electron detector 203, and the second optical component 207 is used for converging and transmitting received laser coding signals and laser repetition frequency signals to the single-electron detector 203.
In one embodiment, the first optical assembly 107 comprises a beam expander 102 and a first diaphragm 103, wherein the input end of the beam expander 102 is close to the laser 101, the first diaphragm 103 is positioned at one side of the output end of the beam expander 102, the second optical assembly 207 comprises an integrating sphere 201 and a second diaphragm 202, the light entrance of the integrating sphere 201 is aligned with the light entrance hole of the photoelectric detection module 2, and the second diaphragm 202 is positioned between the integrating sphere 201 and the single electron detector 203, as will be understood in connection with fig. 1 and 2.
In one embodiment, the laser emitting module 1 is disposed within the first shielding cage 104 and the photodetection module 2 is disposed within the second shielding cage 204. The shielding cage is mainly used for shielding environmental radiation interference.
In one embodiment, the laser emitting module 1 is built in with a first temperature control module 105 and the photo detection module 2 is built in with a second temperature control module 205.
In one embodiment, the control computer 3 is built with a main control program module 301 and a laser coding database 302, and the main control program module 301 is in signal connection with the laser coding database 302.
In one embodiment, control computer 3 is used for control of the system and data acquisition processing, employing step convolution to compress the input into a vector of potential space.
The method for testing the characteristic parameters of the photoelectric simulator is applied to the device for testing the characteristic parameters of the photoelectric simulator and comprises the following steps:
S1, turning on a characteristic parameter testing device of a photoelectric simulator and equipment to be tested to a specified state;
S2, adjusting an optical axis, and connecting the output of the optical axis with a main control computer;
s3, collecting data and calculating detection power;
s4, calculating detection sensitivity indexes, wherein the detection sensitivity indexes comprise but are not limited to power density;
S5, decoding the laser code and calculating the error rate.
In the embodiment 1, aiming at the characteristic parameter calibration requirement of the photoelectric simulator, the research of the parameter on-site calibration technology such as detection power, detection sensitivity, coding frequency and the like is developed, and the laser coding and decoding calibration piece is developed. The receiving channel of the calibration piece can realize the calibration of the characteristic parameters such as the code sequence, the frequency, the pulse width and the like of the laser signal emitted by the photoelectric simulator. The photoelectric detector calibration piece is developed, the calibration piece can realize the calibration of laser power density, and the photoelectric detector and standard diaphragm scheme are utilized to realize the calibration of the power density and the sensitivity of the photoelectric detector.
The device for testing the characteristic parameters of the photoelectric simulator mainly comprises a laser emitting module 1, a photoelectric detection module 2 and a main control program module 301, wherein the laser emitting module comprises a laser 101, a single-electron detector 203, a first optical component 107, a second optical component 207, a control computer 3 and other devices, and the device is shown in fig. 1.
The laser emitting module 1 comprises a laser 101, a laser coding control system 106 and a first optical assembly 107.
The laser 101 adopts a main oscillation power amplification mode, namely, seed signal light and pump light with high beam quality are coupled into a double-clad optical fiber to be amplified in a certain mode, so that the high power amplification of a seed light source is realized, and the stable output of 980nm laser is realized.
The first optical component 107 located behind the laser 101 mainly comprises a beam expander 102 and a first diaphragm 103, and adjusts the spot size of the laser output to match with the detection module at the rear end.
The laser encoding control system 106 encodes the laser signal in accordance with an encoding sequence specified by the specification.
The photo-detection module 2 comprises a single electron detector 203, a laser decoding measurement system 206 and a second optical assembly 207.
The single-electron detector 203 mainly converts a received coded laser signal or a repetition frequency laser signal into an ultra-narrow electrical pulse signal. The responsivity of the photoelectric detector based on the Si material at the wavelength 980nm is in the optimal response range of the detector, and the requirements of laser coding and decoding detection are met.
The second optical component 207, which is located in front of the single electron detector 203, mainly receives the laser code signal and the laser repetition frequency signal, and transmits the signals to the single electron detector 203 in a converging manner, and includes an integrating sphere 201 and a second diaphragm 202.
The laser decoding measurement system 206 realizes the integration processing of the pulse current signal of the detector to obtain a voltage signal corresponding to the optical power density, and the signal processing circuit realizes the acquisition and processing of the voltage signal and sends the voltage signal to the computer end through the output port to realize the reading and display of measurement data. The incident laser signal passes through the standard diaphragm aperture of the second diaphragm 202 to reach the detector of the integrating sphere 201, the uniform light attenuation characteristic of the integrating sphere 201 is utilized to realize the high-power density measurement of laser, the photoelectric conversion circuit realizes the integration processing of the pulse current signal of the detector to obtain a voltage signal corresponding to the optical power density, the signal processing circuit realizes the acquisition and processing of the voltage signal, and the voltage signal is sent to a computer end through an output port to realize the reading and display of measurement data. Experiments prove that the power density measuring range can reach 2X 10 -8W/mm2~0.5W/mm2, and the laser coding and decoding measuring range is 1 Hz-100 kHz.
The control computer 3 is used for controlling the system and collecting and processing data, and the software framework is shown in fig. 3. By adopting step convolution, the input is compressed into a vector of potential space, the requirement on computing resources is reduced, and the computing performance is effectively improved. The data throughput is compared, the target data volume is 324900, namely 570×570, and the effective data volume is 84300, which only accounts for 26% of the whole data volume. After the step convolution processing, the total data amount is 1092, namely 28×39, and the effective data amount is 878, accounting for 80% of the total. The compression rate of the stepping convolution mode to redundant data is 3 times that of the traditional mode, which is beneficial to reducing the data processing bandwidth and improving the processing efficiency.
The first temperature control module 105 can provide a stable temperature range for the laser 101, when the temperature drifts, the temperature of the laser 101 is adjusted through the TEC, the laser 101 can work normally at different temperatures, when the power of the laser 101 changes, the change amount of the laser 101 is monitored, the stable power output of the laser 101 is realized through current adjustment, and the measurement stability and accuracy of the system are improved. Similarly, the second temperature control module 205 improves the operational stability and accuracy of the single electron detector 203.
The method for testing the characteristic parameters of the photoelectric simulator is understood by combining fig. 3-4, and is applied to the device for testing the characteristic parameters of the photoelectric simulator, and comprises the following steps:
S1, starting a test;
s2, opening equipment and adjusting the equipment to a specified state, wherein the equipment comprises a photoelectric simulator characteristic parameter testing device and a photoelectric simulator to be tested;
S3, adjusting an optical axis, wherein the output of the optical axis is connected with a main control computer, after adjustment, a laser emitting module 1, a photoelectric detection module 2, a laser emitter of a photoelectric simulator and a photoelectric detector have a common optical axis, and simultaneously, a laser 101, a beam expander 102, a first diaphragm 103, a single electron detector 203, an integrating sphere 201 and a second diaphragm 202 are all arranged on the optical axis;
S4, collecting data and calculating detection power;
s5, calculating detection sensitivity indexes such as power density and the like;
s6, decoding the laser code and calculating the error rate;
and S7, finishing the test.
The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
Claims (8)
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