[go: up one dir, main page]

CN119246965B - Loss test circuit and device for isolated switching power supply transformer - Google Patents

Loss test circuit and device for isolated switching power supply transformer Download PDF

Info

Publication number
CN119246965B
CN119246965B CN202411356871.7A CN202411356871A CN119246965B CN 119246965 B CN119246965 B CN 119246965B CN 202411356871 A CN202411356871 A CN 202411356871A CN 119246965 B CN119246965 B CN 119246965B
Authority
CN
China
Prior art keywords
circuit
topology
primary side
parameter
delay
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202411356871.7A
Other languages
Chinese (zh)
Other versions
CN119246965A (en
Inventor
蔡兆奇
徐文博
陈明刚
陈顺
汪日锦
魏进
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanjing Jiexinyuan Technology Co ltd
Original Assignee
Nanjing Jiexinyuan Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanjing Jiexinyuan Technology Co ltd filed Critical Nanjing Jiexinyuan Technology Co ltd
Priority to CN202411356871.7A priority Critical patent/CN119246965B/en
Publication of CN119246965A publication Critical patent/CN119246965A/en
Application granted granted Critical
Publication of CN119246965B publication Critical patent/CN119246965B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B70/00—Technologies for an efficient end-user side electric power management and consumption
    • Y02B70/10—Technologies improving the efficiency by using switched-mode power supplies [SMPS], i.e. efficient power electronics conversion e.g. power factor correction or reduction of losses in power supplies or efficient standby modes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Dc-Dc Converters (AREA)

Abstract

The invention relates to a loss test circuit and equipment for an isolated switching power supply transformer, wherein the circuit comprises a topology and parameter variable primary side circuit, a topology and parameter variable secondary side circuit, a primary side variable topology parameter and power measuring circuit, a secondary side variable topology parameter and power measuring circuit, a control test module and a control test module, wherein the topology and parameter variable primary side circuit outputs primary side voltage, primary side current sampling signals and two bridge arm voltage sampling signals, the topology and parameter variable secondary side circuit outputs secondary side voltage and secondary side current sampling signals, the primary side variable topology parameter and power measuring circuit selects primary side voltage and primary side current signals of an external transformer to be tested according to the sampled bridge arm voltage signals to conduct sectional integration to obtain primary side power signals, the secondary side variable topology parameter and power measuring circuit selects secondary side voltage and secondary side current signals of the external transformer to conduct sectional integration according to the sampled bridge arm voltage signals to obtain secondary side power signals, and the control test module is used for collecting power measuring results, the circuit simulates real working conditions of the isolated switching power supply transformer, and provides guarantee for power online test calculation.

Description

Loss test circuit and device for isolated switching power supply transformer
Technical Field
The invention relates to the technical field of power electronics, in particular to a loss testing circuit and device for an isolated switching power supply transformer.
Background
The isolating type switching power supply is continuously developed towards the high power density direction, the loss of the transformer is large in the power loss ratio, and the isolating type switching power supply is one of main factors for restricting the power density improvement of the isolating type switching power supply. Loss testing of the isolated switching power supply transformer has important guiding significance and reference value for design improvement of the transformer.
The traditional thermal indirect test method has the problems that the loss of the transformer can not be measured independently or the accuracy is not high, and the electrical quantity calculation loss of the measured transformer is limited by multiple factors, so that the measurement range and the accuracy are difficult to be considered. The current design of the high-power density power supply is usually only estimated, but the estimation method lacks actual measurement data comparison, the voltage and the current of the isolated switching power supply transformer are not sinusoidal, and errors which are difficult to test exist in the estimation of the magnetic loss by a magnetic core loss curve and the estimation of the copper loss by a dowell method.
Therefore, there is a need for an implementation circuit that can accurately test the transformer loss of an isolated switching power supply according to the actual topology and operating conditions of the isolated switching power supply.
Disclosure of Invention
Based on this, it is necessary to provide an isolated switching power supply transformer loss test circuit capable of accurately testing the transformer loss according to the actual topology and working conditions of the isolated switching power supply.
In a first aspect, the present application provides an isolated switching power supply transformer loss test circuit, the circuit comprising:
The topology and parameter variable primary circuit is used for simulating the primary circuit topology structure and parameters of the external transformer to be tested, and outputting primary voltage sampling signals, primary current sampling signals and two bridge arm voltage sampling signals of the external transformer to be tested with two measuring ranges;
the secondary circuit with variable topology and parameters is used for simulating the secondary circuit topology structure and parameters of the external transformer to be tested, and outputting secondary voltage sampling signals and secondary current sampling signals of the external transformer to be tested with two measuring ranges;
The primary side variable topology variable parameter and power measuring and calculating circuit is connected with the topology and parameter variable primary side circuit and the control testing module and is used for changing the structure and parameters of the topology and parameter variable primary side circuit, selecting primary side voltage signals and primary side current signals of external transformers to be tested with different measuring ranges according to the sampled bridge arm voltage signals, and carrying out sectional integration to obtain primary side power signals;
The secondary side variable topology variable parameter and power measuring and calculating circuit is connected with the topology and parameter variable secondary side circuit and the control testing module and is used for changing the structure and parameters of the topology and parameter variable secondary side circuit, selecting secondary side voltage signals and secondary side current signals of external tested transformers with different measuring ranges according to the sampled bridge arm voltage signals, and carrying out sectional integration to obtain secondary side power signals;
The control test module is used for controlling the connected topology and parameter variable primary side circuit, the topology and parameter variable secondary side circuit, the primary side topology variable parameter and power measuring circuit and the secondary side topology variable parameter and power measuring circuit, and collecting primary side power signals of the primary side topology variable parameter and power measuring circuit and secondary side power signals of the secondary side topology variable parameter and power measuring circuit.
In one embodiment, the topology and parameter variable primary side circuit comprises a variable parameter direct current input interface, a topology and parameter variable primary side bridge arm, a shorted resonant interface, a small-range adjustable same-delay primary side current sampling circuit, a large-range adjustable same-delay primary side current sampling circuit, a small-range adjustable same-delay primary side voltage sampling circuit, a large-range adjustable same-delay primary side voltage sampling circuit, a same-delay first bridge arm voltage sampling circuit, a primary side low parasitic parameter bridge arm leading-out terminal and a primary side low parasitic parameter bridge arm leading-out terminal, wherein:
The variable-parameter direct-current input interface is connected with an external input direct-current voltage, a topology and parameter variable primary side bridge arm, the topology and parameter variable primary side bridge arm is connected with a short-circuit resonance interface, a small-range adjustable same-delay primary side voltage sampling circuit, a same-delay first bridge arm voltage sampling circuit, a same-delay second bridge arm voltage sampling circuit, a primary side low parasitic parameter bridge arm leading-out terminal, a primary side variable-topology parameter and power measuring circuit, the short-circuit resonance interface is connected with an external resonance inductance, a small-range adjustable same-delay primary side current sampling circuit, a small-range adjustable same-delay primary side voltage sampling circuit, a large-range adjustable same-delay primary side voltage sampling circuit, a same-range adjustable-delay primary side current sampling circuit is connected with a large-range adjustable same-delay primary side current sampling circuit for outputting a small-range sampling primary side current, the small-range adjustable same-delay primary side current sampling circuit is connected with a primary side low parasitic parameter leading-out terminal for outputting a large sampling primary side current, the small-range adjustable same-delay primary side voltage sampling circuit is connected with the same-delay second bridge arm voltage sampling circuit, the small-range adjustable same-delay primary side voltage sampling terminal is connected with the same-delay primary side voltage sampling circuit, the small-range adjustable-delay primary side voltage sampling circuit is connected with the small-side output primary side voltage sampling terminal, and the small-side variable-side primary side output voltage sampling circuit is connected with the small-side primary side output device is connected with the small-side primary side voltage sampling circuit, and the variable-side primary side voltage sampling circuit is connected with the small-phase primary side output voltage sampling circuit.
In one embodiment, the first target current flows out from the shorted resonant interface, respectively reaches the external transformer to be tested through the small-range adjustable same-delay primary side current sampling circuit, the large-range adjustable same-delay primary side current sampling circuit and the primary side low parasitic parameter bridge arm leading-out terminal, and flows out from the external transformer to be tested through the primary side low parasitic parameter bridge arm leading-out terminal, the same-delay second bridge arm voltage sampling circuit, the small-range adjustable same-delay primary side voltage sampling circuit and the topology and parameter variable primary side bridge arm.
In one embodiment, the topology and parameter variable secondary side circuit comprises a secondary side low parasitic parameter rectification lead-in terminal, a topology and parameter variable rectification circuit, a short-circuit filtering inductance interface and current sampling circuit, a load interface and output voltage sampling circuit, a small-range adjustable same-delay secondary side voltage sampling circuit, a large-range adjustable same-delay secondary side voltage sampling circuit, a small-range adjustable same-delay secondary side current sampling circuit and a large-range adjustable same-delay secondary side current sampling circuit, wherein:
The secondary side low-parameter rectification lead-in terminal is connected with an external transformer to be tested, a topology and parameter variable rectification circuit, a small-range adjustable same-time delay secondary side voltage sampling circuit, a large-range adjustable same-time delay secondary side voltage sampling circuit and a large-range adjustable same-time delay secondary side current sampling circuit, the topology and parameter variable rectification circuit is connected with a short-circuit filter inductance interface and current sampling circuit, a load interface and output voltage sampling circuit, a small-range adjustable same-time delay secondary side voltage sampling circuit, a large-range adjustable same-time delay secondary side current sampling circuit and a small-range adjustable same-time delay secondary side current sampling circuit, the small-range adjustable same-time delay secondary side current sampling circuit is connected with an external filter inductance, the load interface and output voltage sampling circuit is connected with the large-range adjustable same-time delay secondary side voltage sampling circuit and the large-range adjustable same-time delay secondary side current sampling circuit for outputting small-time delay secondary side voltage, the large-range adjustable same-time delay secondary side voltage sampling circuit is connected with the large-range adjustable same-time delay secondary side current sampling circuit for outputting the small-range current sampling circuit, and the small-time delay adjustable same-time delay secondary side current sampling circuit is connected with the external load.
In one embodiment, the second target current flows out of the topology and parameter variable rectifying circuit, respectively passes through the small-range adjustable synchronous delay secondary side current sampling circuit, the large-range adjustable synchronous delay secondary side current sampling circuit and the secondary side low parasitic parameter rectifying lead-in terminal, flows out of the topology and parameter variable rectifying circuit, passes through the load interface and the output voltage sampling circuit to reach an external load, and returns to the topology and parameter variable rectifying circuit through the load interface and the output voltage sampling circuit.
In one embodiment, the primary side topology variable parameter and power measuring and calculating circuit comprises a bridge arm power tube driving circuit, a primary side topology change-over switch driving circuit and a primary side power segmentation integrating circuit of the transformer based on a power supply mode, wherein:
The transformer primary power sectional integrating circuit based on the power supply mode is used for carrying out integral operation on the small-range sampling primary side current, the large-range sampling primary side current, the small-range sampling primary side voltage, the large-range sampling primary side voltage, the first bridge arm sampling voltage and the second bridge arm sampling voltage in the topology and parameter variable primary side circuit.
In one embodiment, the secondary side topology variable parameter and power measuring and calculating circuit comprises a rectifying tube synchronous rectification selectable driving circuit, a secondary side topology switching switch driving circuit and a transformer secondary side power segmentation integrating circuit based on a power supply mode, wherein:
The transformer secondary side power subsection integrating circuit based on the power supply mode is used for carrying out integral operation on a first bridge arm sampling voltage, a second bridge arm sampling voltage, a small-range sampling secondary side voltage, a large-range sampling secondary side voltage, a small-range sampling secondary side current and a large-range sampling secondary side current in the topology and parameter variable primary side circuit and the topology and parameter variable secondary side circuit.
In a second aspect, the application further provides an isolated switching power supply transformer loss test device, which comprises the isolated switching power supply transformer loss test circuit provided in the first aspect.
According to the loss testing circuit of the isolated switching power supply transformer, the system formed by the primary side circuit, the secondary side circuit, the external tested transformer and the peripheral circuit is similar to the actual working power supply structure and parameters of the external tested transformer through the topology changing parameter of the primary side circuit and the topology changing parameter of the secondary side circuit, so that the actual working condition of the external tested transformer can be simulated, and the loss of the external tested transformer can be tested on line. The voltage and current sampling delay is the same, so that the power operation accuracy can be improved, and meanwhile, the voltage and current double-range sampling of the transformer can obtain more accurate primary and secondary side power calculated values of the transformer according to the sectional integration of the working modes of the circuit. The application not only can solve the difficult problem that the transformer loss of the isolated switching power supply is difficult to accurately measure, but also can be suitable for transformer loss test of various isolated switching power supplies.
Drawings
FIG. 1 is a general block diagram of an isolated switching power supply transformer loss test circuit according to one embodiment;
FIG. 2 is a schematic diagram illustrating the operation of the transformer loss test circuit of the isolated switching power supply according to one embodiment to simulate the primary circuit of various isolated switching power supplies;
Fig. 3 is a schematic diagram of a primary circuit of single-tube flyback and a schematic diagram of a primary circuit of single-tube forward flyback of an isolated switching power supply according to an embodiment;
Fig. 4 is a schematic diagram of a primary circuit of a dual-tube flyback and a schematic diagram of a primary circuit of a dual-tube forward of an isolated switching power supply according to an embodiment;
FIG. 5 is a schematic diagram of a primary side circuit of an active clamp forward of an isolated switching power supply according to an embodiment;
FIG. 6 is a schematic diagram of a primary side circuit of a full bridge circuit of an isolated switching power supply according to an embodiment;
FIG. 7 is a schematic diagram of a primary side circuit of an isolated switching power supply half-bridge circuit according to an embodiment;
FIG. 8 is a schematic diagram of a primary side circuit of an isolated switching power supply LLC according to an embodiment;
FIG. 9 is a schematic diagram illustrating the operation of the transformer loss test circuit for an embodiment of the isolated switching power supply to simulate secondary side circuits of various isolated switching power supplies;
FIG. 10 is a schematic diagram of a secondary side circuit of half-wave rectification of an isolated switching power supply according to an embodiment;
FIG. 11 is a schematic diagram of a secondary side circuit of a full-wave rectifier of an isolated switching power supply according to an embodiment;
FIG. 12 is a schematic diagram of a secondary side circuit of a full bridge rectifier of an isolated switching power supply according to an embodiment;
FIG. 13 is a schematic diagram of a current sampling circuit in an isolated switching power supply transformer loss test circuit according to an embodiment;
FIG. 14 is a schematic diagram of a voltage sampling circuit in an isolated switching power supply transformer loss test circuit according to an embodiment;
FIG. 15 is a schematic diagram of a voltage determination circuit in an isolated switching power supply transformer loss test circuit according to an embodiment;
FIG. 16 is a schematic diagram illustrating a current determination circuit in an isolated switching power supply transformer loss test circuit according to an embodiment;
Fig. 17 is a schematic diagram of a power mode-based segment integration circuit in an isolated switching power supply transformer loss test circuit according to an embodiment.
Detailed Description
The isolated switching power supply is continuously developed towards the direction of high power density, and the loss of the transformer of the isolated switching power supply has a large proportion in the power loss, so that the transformer is one of the main factors for restricting the power density improvement of the isolated switching power supply. Loss testing of the isolated switching power supply transformer has important guiding significance and reference value for design improvement of the transformer.
The method of thermal indirect testing cannot measure the loss of the transformer alone or with low accuracy. The electrical quantity calculation loss of the measuring transformer is limited by the following factors that firstly, the proper topology of the isolated switching power supply is changed according to different application occasions, the working states of magnetic parts of different topologies are different, the transformer loss is suitable for online test under the working state of the power supply, but the high-power density power supply is difficult to online test the electrical quantity, secondly, the traditional voltage and current sampling delay time is different, thirdly, the electrical quantity is switched between large voltage and large current and zero due to the switching working state of the power supply, and the contradiction exists between the measuring range and the small-voltage and small-current test precision.
The current design of high power density power supplies usually only estimates, i.e. the core loss is estimated according to the manufacturer core loss curve and the switching frequency, and the estimated copper loss is calculated according to dowell method analysis. However, the estimation lacks the comparison of measured data, the voltage and the current of the isolated switching power supply transformer are not sinusoidal, and the magnetic core loss curve estimation magnetic loss and the dowell method estimation copper loss have errors which are difficult to test.
In summary, there is no method and implementation circuit for accurately testing transformer loss according to the actual topology and working condition of an isolated switching power supply.
In order that the application may be readily understood, a more complete description of the application will be rendered by reference to the appended drawings. Embodiments of the application are illustrated in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein.
The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It will be understood that the terms first, second, etc. as used herein may be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another element. In the following embodiments, "connected" is understood to mean "electrically connected", "communicatively connected", and the like, if the connected circuits, modules, units, and the like have electrical or data transferred therebetween. The singular forms "a", "an" and "the" may include plural referents unless the context clearly dictates otherwise. The terms "comprises/comprising" or "having" and the like, specify the presence of stated features, integers, steps, operations, elements, components, or groups thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, or groups thereof.
In an exemplary embodiment, the loss test circuit of the isolated switching power supply transformer is shown in fig. 1, and comprises a topology and parameter variable primary side circuit 100, a topology and parameter variable secondary side circuit 200, a primary side topology variable parameter and power measuring circuit 300, a secondary side topology variable parameter and power measuring circuit 400 and a control test module 500.
Specifically, the topology and parameter variable primary circuit 100 is connected to an external electrical device, where the external electrical device includes an external transformer to be tested, an external input dc voltage, and an external resonant inductor, and is configured to simulate a primary circuit topology and parameters of an isolated switching power supply where the external transformer to be tested works, output primary voltage sampling signals and primary current sampling signals of the external transformer to be tested with two ranges, and output two bridge arm voltage sampling signals, where the output sampling signals have the same delay with respect to the actual electrical quantity of the sampled circuit.
Specifically, the topology and parameter variable secondary circuit 200 is connected to an external electrical device, where the external electrical device includes an external transformer to be tested, an external load, and an external filter inductor, and is configured to simulate a secondary circuit topology and parameters of an isolated switching power supply where the external transformer to be tested works, output secondary voltage sampling signals and secondary current sampling signals of the external transformer to be tested with two ranges, where the output sampling signals have the same delay with respect to the actual electrical quantity of the sampled circuit.
Specifically, the primary side variable topology parameter and power measurement circuit 300 is connected to a topology and parameter variable primary side bridge arm and control test module 500 in the topology and parameter variable primary side circuit 100, and is used for changing the structure and parameters of the topology and parameter variable primary side circuit 100 in comparison with an actual primary side circuit of an isolated switching power supply where a simulated external transformer is operated, driving a primary side bridge arm power tube in the topology and parameter variable primary side circuit 100 in comparison with an actual working condition of the isolated switching power supply where the simulated external transformer is operated, and selecting primary side voltage signals and primary side current signals of external transformers with different ranges for segment integration according to collected bridge arm voltage signals to obtain accurate primary side power signals.
Specifically, the secondary side variable topology variable parameter and power measuring and calculating circuit 400 is connected with a topology and parameter variable rectifying circuit and a control testing module 500 in the topology and parameter variable secondary side circuit 200, and is used for changing the structure and parameters of the topology and parameter variable secondary side circuit 200 in comparison with an actual secondary side circuit of an isolated switching power supply where a simulated external transformer to be tested works, driving a synchronous rectifying tube in the topology and parameter variable secondary side circuit 200 in comparison with an actual working condition of the isolated switching power supply where the simulated external transformer to be tested works, and selecting secondary side voltages and secondary side current signals of external transformers with different measuring ranges to perform sectional integration according to collected bridge arm voltage signals, so as to obtain an accurate secondary side power signal.
Specifically, the control test module 500 includes a topology-changing, power closed-loop control, and test integrated controller, and is connected to the topology-changing and parameter-changing primary side circuit 100, the topology-changing and parameter-changing secondary side circuit 200, the primary-side-changing topology-changing parameter and power measuring and calculating circuit 300, and the secondary-side-changing topology-changing parameter and power measuring and calculating circuit 400, and is configured to control the isolated switching power transformer loss test circuit, i.e., the isolated switching power transformer loss test circuit simulates the operation of the isolated switching power, according to the actual situation of the isolated switching power source where the simulated external transformer is operated, by changing the structure and parameters of the topology-changing and parameter-changing primary side circuit 100, the topology-changing and parameter-changing secondary side circuit 200, and collecting the power results of the primary-side-changing topology-changing parameter and power measuring and calculating circuit 300, and the secondary-side-changing topology-changing parameter and 400.
Illustratively, as shown in fig. 1, P2, N1, N2 respectively represent nodes for current input and output between an external transformer under test and an isolated switching power supply transformer loss test circuit.
The embodiment provides the transformer loss test circuit of the isolated switching power supply, which can simulate the actual working conditions of transformers in various isolated switching power supplies, so that the voltage and current waveforms and the values of the transformers are the same as those of the transformers when the transformers actually work on the power supply, and meanwhile, the voltage and current sampling is the same in time delay and the sectional integration mode based on the circuit mode, so that the transformer loss test circuit of the isolated switching power supply in the embodiment can accurately acquire the power of the transformers and accurately calculate the power of primary and secondary sides.
In an exemplary embodiment, as shown in fig. 1, the topology and parameter variable primary side circuit 100 includes a variable parameter dc input interface 102, a topology and parameter variable primary side bridge arm 104, a shorted resonant interface 106, a small-scale adjustable co-delay primary side current sampling circuit 108, a large-scale adjustable co-delay primary side current sampling circuit 110, a small-scale adjustable co-delay primary side voltage sampling circuit 112, a large-scale adjustable co-delay primary side voltage sampling circuit 114, a co-delay first bridge arm voltage sampling circuit 116, a co-delay second bridge arm voltage sampling circuit 118, and a primary side low parasitic parameter bridge arm extraction terminal 120 for simulating the primary side circuit topology and parameters of an isolated switching power supply on which an external transformer is operated, outputting primary side voltages and primary side current sampling signals of external transformers of two scales, and outputting two voltage sampling signals, wherein the output sampling signals have the same delay relative to the actual electrical power of the sampled circuits.
Further, the variable parameter DC input interface 102 is connected to an external input DC voltage, a topology and parameter variable primary side bridge arm 104 in an external electrical device, the topology and parameter variable primary side bridge arm 104 is connected to the variable parameter DC input interface 102, the shorted resonant interface 106, the small-scale adjustable and time-lapse primary side voltage sampling circuit 112, the first and second bridge arm voltage sampling circuits 116 and 116, the same-time-lapse secondary bridge voltage sampling circuit 118, the primary side low parameter bridge arm lead-out terminal 120, the primary side topology variable parameter and power measuring circuit 300 bridge power tube driving circuit 302 and the primary side topology switching switch driving circuit 304, the shorted resonant interface 106 is connected to an external resonant inductance, the topology and parameter variable primary side bridge arm 104, the small-scale adjustable and time-lapse primary side current sampling circuit 108, the small-scale adjustable and time-lapse primary side voltage sampling circuit 112, the large-scale adjustable and time-lapse primary side voltage sampling circuit 114, the same-lapse primary side voltage sampling circuit 116, the small-scale adjustable and time-lapse primary side current sampling circuit 108 is connected to the shorted resonant interface 106, the large-scale adjustable and the primary side topology variable parameter variable and parameter variable primary side current sampling circuit 110, the small-scale adjustable and time-lapse primary side current sampling circuit 110, the small-scale adjustable and the same-bridge voltage sampling circuit 116 are connected to the open-scale variable primary side current sampling circuit 110, the small-scale adjustable and the same time-bridge voltage sampling circuit 110 The primary side low parasitic parameter bridge arm leading-out terminal 120 is connected with the short-circuit resonance interface 106, the small-range adjustable same-delay primary side current sampling circuit 108 and the small-range adjustable same-delay primary side voltage sampling circuit 112, the same-delay first bridge arm voltage sampling circuit 116 is connected with the topology and parameter variable primary side bridge arm 104 and the short-circuit resonance interface 106 and is connected with the node A, the same-delay second bridge arm voltage sampling module 118 is connected with the topology and parameter variable primary side bridge arm 104 and the small-range adjustable same-delay primary side voltage sampling module 112 and the primary side low parasitic parameter bridge arm leading-out terminal 120, the primary side low parasitic parameter bridge arm leading-out terminal 120 is connected with an external transformer, the topology and parameter variable primary side bridge arm 104, the large-range adjustable same-delay primary side current sampling circuit 110, the small-range adjustable same-delay primary side voltage sampling circuit 112 and the same-delay second voltage sampling circuit 118, and the primary side low parasitic parameter leading-out terminal 120 is connected with the topology and parameter variable primary side 104, the small-range adjustable same-delay primary side voltage sampling module 112 and the second delay bridge arm sampling module 118 are connected with the node B.
In the embodiment, the composition structure of the topology and parameter variable primary side circuit is further defined, and the function of the isolated switching power supply transformer loss test circuit can be realized.
In an exemplary embodiment, as shown in fig. 1, the first target current i p flows from the shorted resonant interface 106, respectively passes through the small-range adjustable same-delay primary side current sampling circuit 108, the large-range adjustable same-delay primary side current sampling circuit 110, the primary low parasitic parameter bridge arm leading-out terminal 120 to reach the external transformer to be tested, and flows from the external transformer to be tested, and passes through the primary low parasitic parameter bridge arm leading-out terminal 120, the same-delay second bridge arm voltage sampling circuit 118, the small-range adjustable same-delay primary side voltage sampling circuit 112, and the topology and parameter variable primary side bridge arm 104. The small-range sampled primary current obtained by the small-range adjustable same-delay primary current sampling circuit 108 is denoted as i p1, the large-range sampled primary current obtained by the large-range adjustable same-delay primary current sampling circuit 110 is denoted as i p2, the small-range sampled primary voltage obtained by the small-range adjustable same-delay primary voltage sampling circuit 112 is denoted as v p1, the large-range sampled primary voltage obtained by the large-range adjustable same-delay primary voltage sampling circuit 114 is denoted as v p2, the first bridge arm sampled voltage obtained by the same-delay first bridge arm voltage sampling circuit 116 is denoted as v A1, and the second bridge arm sampled voltage obtained by the same-delay second bridge arm voltage sampling circuit 118 is denoted as v B1.
In the embodiment, the current flow direction and the voltage of the topology and parameter variable primary side circuit are further defined, and the accuracy of the result of the loss test circuit of the isolated switching power supply transformer is ensured.
In an exemplary embodiment, as shown in fig. 1, the topology and parameter variable secondary circuit 200 includes a secondary low parasitic parameter rectification lead-in terminal 202, a topology and parameter variable rectification circuit 204, a short-circuited filter inductance interface and current sampling circuit 206, a load interface and output voltage sampling circuit 208, a small-scale adjustable co-delay secondary voltage sampling circuit 210, a large-scale adjustable co-delay secondary voltage sampling circuit 212, a small-scale adjustable co-delay secondary current sampling circuit 214, and a large-scale adjustable co-delay secondary current sampling circuit 216 for simulating the secondary circuit topology and parameters of an isolated switching power supply in which an external transformer is operating, and outputting secondary voltages and secondary current sampling signals of the external transformers of two scales, the output sampling signals having the same delay relative to the actual electrical quantity of the sampled circuits.
Further, the secondary low parameter rectifier lead-in terminal 202 is connected to an external transformer under test, the topology and parameter variable rectifier circuit 204, the small-scale adjustable co-delay secondary voltage sampling circuit 210, the large-scale adjustable co-delay secondary voltage sampling circuit 212, the large-scale adjustable co-delay secondary current sampling circuit 216, the topology and parameter variable rectifier circuit 204 is connected to the secondary low parameter rectifier lead-in terminal 202, the shorted filter interface and current sampling circuit 206, the load interface and output voltage sampling circuit 208, the small-scale adjustable co-delay secondary voltage sampling circuit 210, the large-scale adjustable co-delay secondary voltage sampling circuit 212, the small-scale adjustable co-delay secondary current sampling circuit 214, the small-scale adjustable co-delay secondary current sampling circuit 212, the small-scale synchronous rectifier variable drive circuit 402 in the secondary side topology switching drive circuit 404, the shorted filter interface and current sampling circuit 206 is connected to the external filter inductor, the topology and parameter variable rectifier circuit 204 in the external electrical device, the load interface and output voltage sampling circuit 206 is connected to the current sampling circuit 208, the load interface and output voltage sampling circuit 208 is connected to the external voltage sampling circuit 202, the load interface and the small-delay variable rectifier circuit 208 is connected to the input voltage sampling circuit 204, the input voltage sampling circuit 204 is connected to the power circuit 400, the input voltage sampling circuit is connected to the input voltage sampling circuit 204 is connected to the electrical circuit, the topology and parameter variable rectifier circuit 204, the small-range adjustable co-delay secondary voltage sampling circuit 210 and the large-range adjustable co-delay secondary voltage sampling circuit 212 are connected to a node C, the small-range adjustable co-delay secondary current sampling circuit 214 is connected with the topology and parameter variable rectifier circuit 204 and the large-range adjustable co-delay secondary current sampling circuit 216, the large-range adjustable co-delay secondary current sampling circuit 216 is connected with the secondary low parasitic parameter rectification leading-in terminal 202, the small-range adjustable co-delay secondary voltage sampling circuit 210, the large-range adjustable co-delay secondary voltage sampling circuit 212 and the small-range adjustable co-delay secondary current sampling circuit 214, and the large-range adjustable co-delay secondary current sampling circuit 216 is connected with the secondary low parasitic parameter rectification leading-in terminal 202, the small-range adjustable co-delay secondary voltage sampling circuit 210 and the large-range adjustable co-delay secondary voltage sampling circuit 212 are connected to the node D.
In the embodiment, the composition structure of the secondary side circuit with variable topology and parameters is further defined, so that the function of the loss test circuit of the isolated switching power supply transformer can be realized.
In an exemplary embodiment, as still shown in fig. 1, the second target current i s flows from the topology and parameter variable rectifier 204, through the small-scale adjustable co-delay secondary current sampling circuit 214, the large-scale adjustable co-delay secondary current sampling circuit 216, and the secondary low parasitic parameter rectification lead-in terminal 202, respectively, the third target current i o flows from the topology and parameter variable rectifier 204, through the load interface and output voltage sampling circuit 208, to the external load, and returns to the topology and parameter variable rectifier 204 through the load interface and output voltage sampling circuit 208, the current between the topology and parameter variable rectifier 204 and the shorted filter inductor interface and current sampling circuit 206 is recorded as i L, the small-scale sampled secondary voltage obtained by the small-scale adjustable co-delay secondary voltage sampling circuit 210 is recorded as v s1, the large-scale sampled secondary voltage obtained by the large-scale adjustable co-delay secondary voltage sampling circuit 212 is recorded as v s2, the small-scale sampled secondary current sampling circuit 214 is obtained by the small-scale adjustable co-delay secondary current sampling circuit s1, and the large-scale sampled secondary voltage obtained by the small-scale adjustable co-delay secondary voltage sampling circuit 216 is recorded as v s2.
In the embodiment, the current flow direction and the voltage of the secondary side circuit with variable topology and parameters are further defined, and the accuracy of the result of the loss test circuit of the isolated switching power supply transformer is ensured.
In an exemplary embodiment, as shown in fig. 1, the primary-side topology-variable parameter and power measurement circuit 300 includes a bridge arm power tube driving circuit 302, a primary-side topology switch driving circuit 304, and a primary-side power segment integrating circuit 306 of the transformer based on a power source mode, for changing the structure and parameters of the topology-variable primary-side circuit against the actual primary-side circuit of the isolated switching power supply where the simulated external transformer is working, driving the primary-side bridge arm power tube of the topology-variable primary-side circuit against the actual working conditions of the isolated switching power supply where the simulated external transformer is working, and selecting the primary-side voltage and primary-side current signals of the external transformer with different ranges for segment integration according to the collected bridge arm voltage signals, so as to obtain an accurate primary-side power signal.
Further, the bridge arm power tube driving circuit 302 is connected with the topology and parameter variable primary side bridge arm 104, the primary side topology change-over switch driving circuit 304 is connected with the topology and parameter variable primary side bridge arm 104, and the primary side power segment integrating circuit 306 of the transformer based on the power supply mode performs an integrating operation on the data i p1、ip2、vp1、vp2、vA1、vB1 measured by the topology and parameter variable primary side circuit 100.
In the embodiment, the composition structure of the primary side variable topology variable parameter and power measuring and calculating circuit is further defined, and the function of the isolated switching power supply transformer loss test circuit can be guaranteed.
In an exemplary embodiment, as shown in fig. 1, the secondary topology variable parameter and power measuring and calculating circuit 400 includes a rectifying tube synchronous rectifying selectable driving circuit 402, a secondary topology switching switch driving circuit 404, and a transformer secondary power sectional integration circuit 406 based on power modes, which is used for changing the structure and parameters of the topology and parameter variable secondary circuit in comparison with the actual secondary circuit of the isolated switching power supply where the simulated external transformer is operated, driving the topology and parameter variable secondary circuit synchronous rectifying tube in comparison with the actual working condition of the isolated switching power supply where the simulated external transformer is operated, and selecting secondary voltage and secondary current signals of external transformers with different ranges to perform sectional integration according to the acquired bridge arm voltage signals, so as to obtain an accurate secondary power signal.
Further, the rectifier tube synchronous rectification selectable driving circuit 402 is connected with the topology and parameter variable rectifying circuit 204, the secondary side topology change-over switch driving circuit 404 is connected with the topology and parameter variable rectifying circuit 204, and the transformer secondary side power segmentation integrating circuit 406 based on the power supply mode carries out integration operation on data i s1、is2、vs1、vs2、vA1、vB1 measured by the topology and parameter variable primary side circuit 100 and the topology and parameter variable secondary side circuit 200.
In the embodiment, the composition structure of the secondary side variable topology variable parameter and the power measuring and calculating circuit is further defined, so that the function of the loss testing circuit of the isolated switching power supply transformer can be realized.
In an exemplary embodiment, the principle of operation of the primary side circuit of the analog isolated switching power supply of various types is shown in fig. 2. wherein, the variable parameter dc input interface 102 includes n (n=1) 2......n) column circuit units, wherein each column circuit unit sequentially comprises a switch S i(2n-1), a capacitor C i(2n-1), a switch S i2n, A capacitor C i2n, a first end of the switch S i(2n-1) is an upper end node of the column circuit unit, a second end of the switch S i(2n-1) is connected with a first end of the capacitor C i(2n-1), a second end of the capacitor C i(2n-1) is connected with a middle end node of the column circuit unit, The first end of the switch S i2n is connected, the second end of the switch S i2n is connected with the first end of the capacitor C i2n, the second end of the capacitor C i2n is the grounding node of each column circuit unit, the upper end node of each column circuit unit, the intermediate node and the ground node are respectively connected to each other. The topology and parameter variable primary leg 104 includes n (n=1) 2......n) column circuit units a plurality of sub-circuit units and a circuit combination unit, wherein each column circuit unit sequentially comprises a switch S c(2n-1), a capacitor C c(2n-1), a switch S c2n, A capacitor C c2n, a first end of the switch S c(2n-1) is an upper end node of the column circuit unit, a second end of the switch S c(2n-1) is connected with a first end of the capacitor C c(2n-1), a second end of the capacitor C c(2n-1) is connected with a middle end node of the column circuit unit, The first end of the switch S c2n is connected, the second end of the switch S c2n is connected with the first end of the capacitor C c2n, the second end of the capacitor C c2n is the grounding node of each column circuit unit, the upper end node of each column circuit unit, The intermediate node and the grounding node are respectively connected with each other, and the kth (k=1, 2, 3, 4) sub-circuit unit comprises a switch S bQk, a MOS tube Q bk, a switch S bDk, a diode D bk and n (n=1), 2....n.) combinations of circuits, wherein each circuit combination includes a switch S bCkn and a capacitor C bCkn, the first terminal of the switch S bCkn is the first terminal of the circuit assembly, the second terminal of the switch S bCkn is connected to the first terminal of the capacitor C bCkn, the second end of the capacitor C bCkn is the second end of the circuit combination, the second end of the switch S bQk is connected with the first end of the MOS transistor Q bk, the second end of the switch S bDk is connected with the cathode of the diode D bk, the first end of the switch S bQk is connected with the first end of the switch S bDk, The first end of the circuit combination is connected with the second end of the MOS tube Q bk, the anode of the diode D bk and the second end of the circuit combination, and further, the second end of the MOS tube Q b1 and the anode of the diode D b1, The second end of the corresponding circuit combination is connected with the node A, the second end of the MOS tube Q b3 is connected with the positive electrode of the diode D b3, the second end of the corresponding circuit combination is connected with the node B, the first end of the switch S bQ2 and the first end of the switch S bD2, The first end of the corresponding circuit combination is connected with the node A, the first end of the switch S bQ4, the first end of the switch S bD4 and the first end of the corresponding circuit combination are connected with the node B, the second end of the MOS tube Q b2 and the anode of the diode D b2, The second end of the MOS tube Q b4 and the second end of the diode D b4 corresponding to the circuit combination are connected with a grounding node, and the circuit combination unit comprises a switch S c1, a switch S c2, Switch S c3, diode D c1, and diode D c2, wherein the first end of switch S c1, the first end of switch S c2, A first end of the switch S c3 is connected with the node B, a second end of the switch S c1 is connected with the positive electrode of the diode D c1, a second end of the switch S c2 is connected with the negative electrode of the diode D c2, the negative electrode of the diode D c1 is connected with the positive electrode of the diode D c2, A second terminal of the switch S c3 is connected to the middle terminal node of the column circuit unit. the shorted resonator interface 106 includes n (n=1) 2. N) number a circuit assembly, Switch S r1L and switch S r1S, wherein each circuit combination includes a capacitor C rn and a switch S r1Cn, the first end of capacitor C rn is the first end of the circuit combination, the second end of capacitor C rn is connected to the first end of switch S r1Cn, the second end of S r1Cn is the second end of the circuit combination, the first end of each circuit combination is connected to each other and to the first end of switch S r1S, the second end of each circuit combination is connected to each other and to the first end of switch S r1L, and the second end of switch S r1L is connected to the second end of switch S r1S.
Illustratively, as shown in fig. 3, the primary side circuit of the single-tube flyback of the isolated switching power supply is obtained by closing the switch S bQ4 in the primary side circuit of the analog various isolated switching power supplies of fig. 2.
Illustratively, as shown in fig. 4, the primary side circuit of the dual-tube flyback of the isolated-type switching power supply is obtained by closing the switch S bQ1, the switch S bQ4, the switch S bD2 and the switch S bD3 in the primary side circuit of the analog various isolated-type switching power supplies of fig. 2.
Illustratively, as shown in fig. 3, the primary side circuit of the single tube forward of the isolated switching power supply is obtained by closing the switch S bQ4 in the primary side circuit of the analog various isolated switching power supplies of fig. 2.
Illustratively, as shown in fig. 4, the primary side circuit of the dual-tube forward of the isolated switching power supply is obtained by closing the switch S bQ1, the switch S bQ4, the switch S bD2 and the switch S bD3 in the primary side circuit of the analog various isolated switching power supplies of fig. 2.
Illustratively, as shown in fig. 5, the primary side circuit of the active clamp forward of the isolated switching power supply is obtained by closing the switch S bQ3 and the switch S bQ4 in the primary side circuit of the analog various isolated switching power supplies of fig. 2.
Illustratively, as shown in fig. 6, the primary side circuit of the full bridge circuit of the isolated switching power supply is obtained by closing the switch S bQ1, the switch S bQ2, the switch S bQ3, and the switch S bQ4 in the primary side circuit of the analog various isolated switching power supplies of fig. 2.
Illustratively, as shown in fig. 7, the primary side circuit of the half-bridge circuit of the isolated switching power supply is obtained by closing the switches S bQ1 and S bQ2 in the primary side circuit of the analog various isolated switching power supplies of fig. 2.
Illustratively, as shown in fig. 8, the primary side circuit of the isolated LLC power supply (Inductor-Inductor-Capacitor Resonant Converters) is formed by closing the switches S bQ1, S bQ2, S r1S, and S r1C1 in the primary side circuit of the analog isolated switching power supply of fig. 2, and by forming the primary side circuit of the isolated LLC power supply with an external resonant inductance.
In an exemplary embodiment, a schematic diagram of the operation of the secondary side circuit of the analog isolated switching power supply of various types is shown in fig. 9.
Illustratively, as shown in fig. 10, by closing the switch S f1 in the secondary side circuit of the analog various types of the isolated switching power supply, a half-wave rectified secondary side circuit of the isolated switching power supply is obtained.
Illustratively, as shown in fig. 11, by closing the switch S f1 and the switch S f3 in the secondary side circuit of the analog various types of the isolated switching power supply, a secondary side circuit of the isolated switching power supply full-wave rectification is obtained.
Illustratively, as shown in fig. 12, the secondary side circuit of the full-bridge rectification of the isolated switching power supply is obtained by closing the switch S f1, the switch S f2, the switch S f3 and the switch S f4 in the secondary side circuit of the analog various isolated switching power supplies of fig. 9.
In an exemplary embodiment, as shown in fig. 13, a current sampling circuit module in an isolated switching power supply transformer loss test circuit is provided, for a small-scale adjustable co-delay primary side current sampling circuit 108, a large-scale adjustable co-delay primary side current sampling circuit 110, a small-scale adjustable co-delay secondary side current sampling circuit 214, and a large-scale adjustable co-delay secondary side current sampling circuit 216, which includes:
The delay circuit is formed by combining a plurality of groups of capacitors (Ci 1, ci 2..Cin) and switches (Si 1, si 2..sin) in parallel, and different capacitor combinations are obtained by closing and closing the switches, so that different delays are realized, and the aim of delaying is fulfilled;
the amplifier U1 is provided with a positive input end, a negative input end and an output end, wherein the output end of the amplifier U1 is connected with the resistor R8 and connected with the positive input end of the amplifier U2;
The bias circuit is connected with the positive electrode input end of the amplifier U1 and comprises a resistor R5, a resistor R6 and a capacitor C2, wherein the first end of the resistor R5 is connected with the power supply end, the first end of the resistor R6 and the first end of the capacitor C2 are grounded, and the second end of the resistor R5, the second end of the resistor R6 and the second end of the capacitor C2 are connected to the positive electrode input end of the amplifier U1;
The current sampling circuit is respectively connected with the positive input end of the amplifier U1 and the negative input end of the amplifier U1 and is used for detecting the current of the isolated switching power supply transformer loss test circuit, and the current sampling circuit comprises a resistor R1, a resistor R2, a resistor R3, a resistor R4, a resistor R7, a capacitor C1 and a capacitor group used for delaying. The first end of the capacitor C1 is connected with the first end of the resistor R3 to be connected to the positive electrode input end of the amplifier U1, the second end of the capacitor C1 and the negative electrode input end of the amplifier U1 are connected to the common ground through the first end of the resistor R4, the second end of the resistor R4 is connected with the first end of the resistor R2 to be connected with the second end of the resistor R3, the second end of the resistor R1 and the first end of the capacitor group for delay, the first end of the resistor R1 is connected with the sampling current input for detecting the loss test circuit of the isolated switching power supply transformer, the second end of the capacitor group for delay is connected to the common ground, the first end of the resistor R7 is connected with the negative electrode input end of the amplifier U1, and the second end of the resistor R7 is connected with the output end of the amplifier U1;
the amplifier U2 is provided with a positive electrode input end, a negative electrode input end and an output end, and the output end of the amplifier U2 is connected with the measurement current output;
The voltage follower comprises an amplifier U2, a resistor R8 and a resistor R9, wherein the first end of the resistor R8 is connected with the output end of the upper-stage amplifier U1, the second end of the resistor R8 is connected with the positive input end of the amplifier U2, the first end of the resistor R9 is connected with the negative input end of the amplifier U2, the second end of the resistor R9 is connected with the output end of the amplifier U2, and the voltage follower aims at keeping the stability of a sampling circuit signal;
the first end of the resistor R10 is connected with the second end of the resistor R9 and the output end of the amplifier U2, the second end of the resistor R10 is connected with the first end of the capacitor C3, the second end of the capacitor C3 is connected to the common ground, the output end of the voltage follower filters clutters through the resistor R10 and the capacitor C3 and outputs the clutters as a current sampling result in the isolated switching power supply transformer loss test circuit through ADC (Analog-to-digital converter) operation.
In an exemplary embodiment, as shown in fig. 14, a voltage sampling circuit module in an isolated switching power supply transformer loss test circuit is provided, for a small-scale adjustable co-delay primary side voltage sampling circuit 112, a large-scale adjustable co-delay primary side voltage sampling circuit 114, a small-scale adjustable co-delay secondary side voltage sampling circuit 210, and a large-scale adjustable co-delay secondary side voltage sampling circuit 212, including:
The delay circuit is used for obtaining different delays according to different delays of the sensor, and the sampling circuit can set parameters so that the total delay time of the collected transformer voltage, current and bridge arm voltage is the same. The delay circuit is formed by combining a plurality of groups of capacitors (Ci 1, ci 2..Cin) and switches (Si 1, si 2..sin) in parallel, and different capacitor combinations are obtained by closing and closing the switches, so that different delays are realized, and the purpose of delay is achieved;
the amplifier U1 is provided with a positive input end, a negative input end and an output end, wherein the output end of the amplifier U1 is connected with a resistor R6 and connected with the positive input end of the amplifier U2;
And the voltage sampling circuit is connected with the positive input end of the amplifier U1 and is used for detecting the voltage in the loss testing circuit of the isolated switching power supply transformer. The voltage sampling circuit comprises a resistor R1, a sliding rheostat R2, a resistor R3, a resistor R4, a capacitor C1 and a capacitor group for time delay, wherein the first end of the resistor R4 is connected with the positive input end of the amplifier U1, the second end of the resistor R4 is connected with a sliding sheet of the sliding rheostat R2, the first end of the resistor R3 and the first end of the capacitor C1, the second end of the capacitor C1 is connected with the second end of the resistor R3 to be connected with a common ground, the second end of the sliding rheostat R2 is connected with the second end of the resistor R1 and the first end of the capacitor group of the time delay circuit, the second end of the capacitor group of the time delay circuit is connected with the common ground, and the first end of the resistor R1 is connected with a sampling voltage input in the transformer loss testing circuit for detecting an isolated switching power supply;
the amplifier U2 is provided with a positive input end, a negative input end and an output end, and the output end of the amplifier U2 is connected with the measurement voltage output;
The voltage follower comprises an amplifier U2, a resistor R6 and a resistor R7, wherein the first end of the resistor R6 is connected with the output end of the upper-stage amplifier U1, the second end of the resistor R6 is connected with the positive input end of the amplifier U2, the first end of the resistor R7 is connected with the negative input end of the amplifier U2, the second end of the resistor R7 is connected with the output end of the amplifier U2, and the voltage follower aims at keeping the stability of a sampling circuit signal;
The first end of the resistor R8 is connected with the second end of the resistor R7 and the output end of the amplifier U2, the second end of the resistor R8 is connected with the first end of the capacitor C2, the second end of the capacitor C2 is connected to the common ground, and the output end of the voltage follower filters clutter through the resistor R8 and the capacitor C2 and outputs the clutter as a voltage sampling result in the isolated switching power supply transformer loss test circuit through ADC operation.
In an exemplary embodiment, as shown in fig. 15, a voltage determining circuit in an isolated switching power supply transformer loss test circuit is provided, which determines to use a wide-range or a small-range voltage sampling result by a voltage difference between a co-delayed first leg voltage sampling circuit 116 and a co-delayed second leg voltage sampling module 118, and includes:
the amplifier U1 is provided with a positive input end, a negative input end and an output end, wherein the output end of the amplifier U1 is connected with the resistor R5 and connected with the negative input end of the amplifier U2;
The subtracting circuit comprises an amplifier U1, a resistor R2, a resistor R3 and a resistor R4, wherein a first end of the resistor R1 is connected with a bridge arm 2 sampling voltage, namely a same-delay second bridge arm voltage sampling module 118, a second end of the resistor R1 is connected with a first end of the resistor R4 to be connected with a negative electrode input end of the amplifier U1, a second end of the resistor R4 is connected with an output end of the amplifier U1, a first end of the resistor R2 is connected with the bridge arm 1 sampling voltage, namely a same-delay first bridge arm voltage sampling circuit 116, a second end of the resistor R2 is connected with a first end of the resistor R3 to be connected with a positive electrode input end of the amplifier U1, and a second end of the resistor R3 is connected with ground;
The amplifier U2 is provided with a positive input end, a negative input end and an output end, wherein the output end of the amplifier U2 is connected with the resistor R9 and connected to the negative input end of the amplifier U3, and is connected to the grid electrode of the switching tube Q1 through the resistor R11;
The first voltage comparison circuit comprises an amplifier U2, a resistor R5, a resistor R6, a resistor R7 and a resistor R8, wherein a first end of the resistor R5 is connected with an output end of the subtraction circuit, a second end of the resistor R5 is connected with a negative electrode input end of the amplifier U2, a first end of the resistor R6 is connected with a voltage input of a discrimination voltage which is used for comparing with a voltage difference of the same-delay first bridge arm voltage sampling circuit 116 and the same-delay second bridge arm voltage sampling module 118, a second end of the resistor R6 is connected with a first end of the resistor R7 and a first end of the resistor R8 to an positive electrode input end of the amplifier U2, a second end of the resistor R7 is connected with ground, and a second end of the resistor R8 is connected with an output end of the amplifier U2;
The amplifier U3 is provided with a positive input end, a negative input end and an output end, wherein the output end of the amplifier U3 is connected with the resistor R12 and connected with the grid electrode of the switching tube Q2;
The second voltage comparison circuit comprises an amplifier U3, a resistor R9 and a resistor R10, wherein the first end of the resistor R9 is connected with the output end of the first voltage comparison circuit, the second end of the resistor R9 is connected with the negative electrode input end of the amplifier U3, the second end of the resistor R10 is connected with the ground, and the first end of the resistor R10 is connected with the positive electrode input end of the amplifier U3;
The voltage range selection circuit comprises a switching tube Q1, a switching tube Q2, a resistor R11 and a resistor R12, wherein the drain electrode of the switching tube Q1 is connected with the output voltage of a small range sampling voltage, the small range sampling voltage comprises a small range adjustable same-delay primary side voltage sampling circuit 112 and a small range adjustable same-delay secondary side voltage sampling circuit 210, the source electrode of the switching tube Q1 is connected with the voltage input of an integrating circuit, the integrating circuit comprises a transformer primary side power segmentation integrating circuit 306 based on a power supply mode and a transformer secondary side power segmentation integrating circuit 406 based on the power supply mode, the grid electrode of the switching tube Q1 is connected with the first end of the resistor R11, the first end of the resistor R11 is connected with the grid electrode of a switching tube Q5 and Q9 of a follow-up integrating circuit, the second end of the resistor R11 is connected with the output of a first voltage comparison circuit, the drain electrode of the switching tube Q2 is connected with the output voltage of a large range sampling voltage, the large range sampling voltage comprises a large range adjustable same-delay primary side voltage sampling circuit 114 and a large range adjustable same-delay secondary side voltage sampling circuit 212, the grid electrode of the switching tube Q2 is connected with the first end of the resistor R11 and the first end of the resistor R12 connected with the grid electrode of the second end of the resistor R11.
In an exemplary embodiment, as shown in fig. 16, a current determination circuit in an isolated switching power supply transformer loss test circuit is provided, and a decision to use a wide-range or a small-range current sampling result is made according to the result, which includes:
The amplifier U1 is provided with a positive input end, a negative input end and an output end, wherein the output end of the amplifier U1 is connected with a resistor R5 and connected with the negative input end of the amplifier U2, and is connected to the grid electrode of the switching tube Q1 through a resistor R7;
The first voltage comparison circuit comprises an amplifier U1, a resistor R2, a resistor R3 and a resistor R4, wherein the first end of the resistor R1 is connected with a current sampling result output, the second end of the resistor R1 is connected with a negative electrode input end of the amplifier U1, the first end of the resistor R2 is connected with a voltage input in a small-range current range, the voltage input in the small-range current range is used for comparing with the current sampling result output, the second end of the resistor R2 is connected with the first end of the resistor R3, the first end of the resistor R4 is connected to an anode input end of the amplifier U1, the second end of the resistor R3 is connected with the ground, and the second end of the resistor R4 is connected with an output end of the amplifier U1;
the amplifier U2 is provided with a positive input end, a negative input end and an output end, and the output end of the amplifier U2 is connected to the grid electrode of the switch tube Q2 through a resistor R8;
The second voltage comparison circuit comprises an amplifier U2, a resistor R5 and a resistor R6, wherein the first end of the resistor R5 is connected with the output of the first voltage comparison circuit, the second end of the resistor R5 is connected with the negative input end of the amplifier U2, the first end of the resistor R6 is connected with the positive input end of the amplifier U2, and the second end of the resistor R6 is connected with the ground;
The voltage range selection circuit comprises a switching tube Q1, a switching tube Q2, a resistor R7 and a resistor R8, wherein the drain electrode of the switching tube Q1 is connected with the output of a small-range sampling current, the small-range sampling current comprises a small-range adjustable same-delay primary side current sampling circuit 108 and a small-range adjustable same-delay secondary side current sampling circuit 214, the source electrode of the switching tube Q1 is connected with the current input of an integrating circuit, the grid electrode of the switching tube Q1 is connected with the first end of the resistor R7, meanwhile, the first end of the resistor R7 is connected with the grid electrodes of switching tubes Q4 and Q8 of a subsequent integrating circuit, the second end of the resistor R7 is connected with the output of a first voltage comparison circuit, the drain electrode of the switching tube Q2 is connected with the output of a large-range sampling current, the large-range sampling current comprises a large-range adjustable same-delay primary side current sampling circuit 110 and a large-range adjustable same-delay secondary side current sampling circuit 216, the source electrode of the switching tube Q2 is connected with the current input of the integrating circuit, the grid electrode of the switching tube Q2 is connected with the first end of the resistor R8, meanwhile, the first end of the resistor R8 is connected with the grid electrode of the second end of the resistor R8 is connected with the output of the second end of the subsequent integrating circuit, and the second end of the resistor Q8 is connected with the output of the second end of the resistor Q6 and the resistor is connected with the output of the resistor Q8.
In an exemplary embodiment, as shown in fig. 17, a power mode based segmented integration circuit in an isolated switching power supply transformer loss test circuit, where the power mode based segmented integration circuit includes a power mode based transformer primary side power segmented integration circuit 306 and a power mode based transformer secondary side power segmented integration circuit 406, comprising:
The amplifier U1 is provided with a positive input end, a negative input end and an output end, wherein the output end of the amplifier U1 is connected with the resistor R3 and connected with the negative input end of the amplifier U3;
The first logarithmic operation circuit comprises an amplifier U1, a resistor R2 and a triode Q1, wherein the first end of the resistor R1 is connected with a measuring current input, the measuring current comprises a topology and parameter variable primary side circuit 100 and a topology and parameter variable secondary side circuit 200, the measuring current comprises a second end of the resistor R1 and a collector electrode of the triode Q1, the second end of the resistor R1 is connected with a negative electrode input end of the amplifier U1, an emitter electrode of the triode Q1 is connected with an output end of the amplifier U1, a base level of the triode Q1 is connected with ground, the first end of the resistor R2 is connected with an positive electrode input end of the amplifier U1, and the second end of the resistor R2 is connected with ground;
the amplifier U2 is provided with a positive input end, a negative input end and an output end, wherein the output end of the amplifier U2 is connected with the resistor R6 and connected with the negative input end of the amplifier U3;
The second logarithmic operation circuit comprises an amplifier U2, a resistor R4, a resistor R5 and a triode Q2, wherein the first end of the resistor R4 is connected with a measurement voltage input, the measurement voltage comprises a topology and parameter variable primary side circuit 100 and a topology and parameter variable secondary side circuit 200, the second end of the resistor R4 is connected with the collector of the triode Q2 to the negative electrode input end of the amplifier U2, the emitter of the triode Q2 is connected with the output end of the amplifier U2, the base of the triode Q2 is connected with the ground, the first end of the resistor R5 is connected with the positive electrode input end of the amplifier U2, and the second end of the resistor R2 is connected with the ground;
The amplifier U3 is provided with a positive input end, a negative input end and an output end, and the output end of the amplifier U3 is connected with the input of a subsequent exponential operation circuit through a resistor R9;
The addition operation circuit comprises an amplifier U3, a resistor R6, a resistor R7 and a resistor R8, wherein the first end of the resistor R3 is connected with the output of the first logarithmic operation circuit, the first end of the resistor R6 is connected with the output of the second logarithmic operation circuit, the second end of the resistor R3 is connected with the second end of the resistor R6, the second end of the resistor R7 is connected with the negative electrode input end of the value amplifier U3, the second end of the resistor R7 is connected with the output end of the amplifier U3, the first end of the resistor R8 is connected with the positive electrode input end of the amplifier U3, and the second end of the resistor R8 is connected with ground;
the amplifier U4 is provided with a positive input end, a negative input end and an output end, and the output end of the amplifier U4 is connected to the negative input end of the amplifier U5 through a resistor R12;
The exponential operation circuit comprises an amplifier U4, a resistor R9, a resistor R10, a resistor R11 and a triode Q3, wherein the first end of the resistor R9 is connected with the output of the addition operation circuit, the second end of the resistor R9 is connected with the base stage of the triode Q3 to the collector of the triode Q3, the emitter of the triode Q3 is connected with the first end of the resistor R11 to the negative electrode input end of the amplifier U4, the second end of the resistor R11 is connected with the output end of the amplifier U4, the first end of the resistor R10 is connected with the positive electrode input end of the amplifier U4, and the second end of the resistor R10 is connected with the ground;
The amplifier U5 is provided with a positive input end, a negative input end and an output end, and the output end of the amplifier U5 is connected to the negative input end of the amplifier U6 through a resistor R15;
The integrating operation circuit comprises an amplifier U5, a resistor R12, a resistor R13, a resistor R14 and a capacitor C1, wherein the first end of the resistor R12 is connected with the output of the exponential operation circuit, the second end of the resistor R12 is connected with the first end of the resistor R13, the first end of the capacitor C1 is connected to the negative electrode input end of the amplifier U5, the second end of the resistor R13 is connected with the second end of the capacitor C1 to the output end of the amplifier U5, the first end of the resistor R14 is connected with the positive electrode input end of the amplifier U5, and the second end of the resistor R14 is connected with the ground;
The amplifier U6 is provided with a positive input end, a negative input end and an output end, wherein the output end of the amplifier U6 is connected to the negative input end of the amplifier U7 through a resistor R21 and is connected to the drain electrode of the switching tube Q12;
The proportional operation circuit comprises an amplifier U6, a resistor R15, a resistor R16, a resistor R17, a resistor R18, a resistor R19 and a resistor R20, a switch tube Q4, a switch tube Q5, a switch tube Q6, a switch tube Q7, a switch tube Q8, a switch tube Q9, a switch tube Q10 and a switch tube Q11, wherein the first end of the resistor R15 is connected with the output of the integral operation circuit, the second end of the resistor R15 is connected with the first end of the resistor R17, the first end of the resistor R18, the first end of the resistor R19 and the first end of the resistor R20 are connected to the negative electrode input end of the amplifier U6, the second end of the resistor R17 is connected with the drain electrode of the switch tube Q4, the source electrode of the switch tube Q4 is connected with the drain electrode of the switch tube Q5, the gate electrode of the switch tube Q4 is connected with the small-range current conducting signal of the current range judgment circuit, the gate electrode of the switch tube Q5 is connected with the small-range voltage conducting signal of the voltage range judgment circuit, the second end of the resistor R18 is connected with the drain electrode of the switch tube Q6, the source electrode of the switch tube Q6 is connected with the drain electrode of the switch tube Q7, the grid electrode of the switch tube Q6 is connected with a small-range current conduction signal of the current range judging circuit, the grid electrode of the switch tube Q7 is connected with a large-range voltage conduction signal of the voltage range judging circuit, the second end of the resistor R19 is connected with the drain electrode of the switch tube Q8, the source electrode of the switch tube Q8 is connected with the drain electrode of the switch tube Q9, the grid electrode of the switch tube Q8 is connected with a large-range current conduction signal of the current range judging circuit, the grid electrode of the switch tube Q9 is connected with a small-range voltage conduction signal of the voltage range judging circuit, the second end of the resistor R20 is connected with the drain electrode of the switch tube Q10, the source electrode of the switch tube Q10 is connected with a large-range voltage conduction signal of the current range judging circuit, the grid electrode of the switch tube Q11 is connected with a large-range voltage conduction signal of the voltage range judging circuit, the source of the switching tube Q5 is connected with the source of the switching tube Q7, the source of the switching tube Q9 and the source of the switching tube Q11 to the output end of the amplifier U6, the first end of the resistor R16 is connected with the positive input end of the amplifier U6, and the second end of the resistor R16 is connected with the ground. The proportional operation circuits with different proportions are obtained through the selection of the current range judging circuit and the voltage range of the voltage range judging circuit, so that the numerical ranges of the integration results of the voltage and current combinations of any range are the same;
the amplifier U7 is provided with a positive input end, a negative input end and an output end, and the output end of the amplifier U7 is an integration result of a sectional integration circuit based on a power mode in the isolated switching power supply transformer loss test circuit;
The subtracting operation circuit comprises an amplifier U7, a resistor R21, a resistor R22, a resistor R23, a resistor R24 and a switch tube Q12, wherein the first end of the resistor R21 and the drain electrode of the switch tube Q12 are connected to the output end of the amplifier U6, the second end of the resistor R21 and the first end of the resistor R24 are connected to the negative electrode input end of the amplifier U7, the second end of the resistor R24 is connected to the output end of the amplifier U7, the source electrode of the switch tube Q12 is connected with the first end of the resistor R22, the second end of the resistor R22 and the first end of the resistor R23 are connected to the positive electrode input end of the amplifier U26, the second end of the resistor R23 is connected with the ground, the grid electrode of the switch tube Q12 is connected with a variable topology, a power closed loop control and a test integrated controller in the control test module 500, the variable topology, the power closed loop control and the test integrated controller in the test integrated controller give the grid electrode signal of the switch tube Q12 to the switch tube Q12 after every several switch cycles, the time the output result of the circuit is zero to be subtracted once to reach the integral time, namely the integral time is zero and the integral time is reset to the integral time is zero.
The loss test circuit of the isolated switching power supply transformer provided by the embodiment can simulate the real working condition of the isolated switching power supply transformer, adapt to various isolated power supply topological structures and specific parameters thereof, provide guarantee for power online test calculation, enable the signal source on which the power calculation is based to be more reliable due to sampling signal and time delay, and solve the contradiction between the range and the small signal accuracy for a specific object of the power supply transformer based on a sectional integration mode of a circuit mode. Based on the above aspects, the loss test circuit of the isolated switching power supply transformer can realize accurate analysis of the loss of various isolated switching power supply transformers.
It will be appreciated that the above-mentioned loss test circuit for an isolated switching power supply transformer may take other forms, and is not limited to the forms already mentioned in the above-mentioned embodiments, as long as it can achieve the function of accurately analyzing the loss of various isolated switching power supplies.
In the description of the present specification, reference to the terms "some embodiments," "other embodiments," "desired embodiments," and the like, means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, schematic descriptions of the above terms do not necessarily refer to the same embodiment or example, and like-numbered circuit elements in different embodiments do not necessarily refer to the same circuit elements.
The above examples illustrate only a few embodiments of the invention, which are described in detail and are not to be construed as limiting the scope of the invention. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the invention, which are all within the scope of the invention. Accordingly, the scope of protection of the present invention is to be determined by the appended claims.

Claims (8)

1. An isolated switching power supply transformer loss test circuit, comprising:
The topology and parameter variable primary circuit is used for simulating the primary circuit topology structure and parameters of the external transformer to be tested, and outputting primary voltage sampling signals, primary current sampling signals and two bridge arm voltage sampling signals of the external transformer to be tested with two measuring ranges;
the secondary circuit with variable topology and parameters is used for simulating the secondary circuit topology structure and parameters of the external transformer to be tested, and outputting secondary voltage sampling signals and secondary current sampling signals of the external transformer to be tested with two measuring ranges;
The primary side variable topology variable parameter and power measuring and calculating circuit is connected with the topology and parameter variable primary side circuit and the control testing module and is used for changing the structure and parameters of the topology and parameter variable primary side circuit, selecting primary side voltage signals and primary side current signals of external transformers to be tested with different measuring ranges according to the sampled bridge arm voltage signals, and carrying out sectional integration to obtain primary side power signals;
The secondary side variable topology variable parameter and power measuring and calculating circuit is connected with the topology and parameter variable secondary side circuit and the control testing module and is used for changing the structure and parameters of the topology and parameter variable secondary side circuit, selecting secondary side voltage signals and secondary side current signals of external tested transformers with different measuring ranges according to the sampled bridge arm voltage signals, and carrying out sectional integration to obtain secondary side power signals;
The control test module is used for controlling the connected topology and parameter variable primary side circuit, the topology and parameter variable secondary side circuit, the primary side topology variable parameter and power measuring and calculating circuit and the secondary side topology variable parameter and power measuring and calculating circuit, and collecting primary side power signals of the primary side topology variable parameter and power measuring and calculating circuit and secondary side power signals of the secondary side topology variable parameter and power measuring and calculating circuit.
2. The isolated switching power supply transformer loss test circuit of claim 1, wherein the topology and parameter variable primary circuit comprises a variable parameter dc input interface, a topology and parameter variable primary leg, a shorted resonant interface, a small-scale adjustable same-delay primary current sampling circuit, a large-scale adjustable same-delay primary current sampling circuit, a small-scale adjustable same-delay primary voltage sampling circuit, a large-scale adjustable same-delay primary voltage sampling circuit, a same-delay first leg voltage sampling circuit, a primary low parasitic parameter leg extraction terminal, and a primary low parasitic parameter leg extraction terminal, wherein:
The variable-parameter direct-current input interface is connected with an external input direct-current voltage, a topology and parameter variable primary side bridge arm, the topology and parameter variable primary side bridge arm is connected with a short-circuit resonance interface, a small-range adjustable same-delay primary side voltage sampling circuit, a same-delay first bridge arm voltage sampling circuit, a same-delay second bridge arm voltage sampling circuit, a primary side low parasitic parameter bridge arm leading-out terminal, a primary side variable-topology parameter and power measuring circuit, the short-circuit resonance interface is connected with an external resonance inductance, a small-range adjustable same-delay primary side current sampling circuit, a small-range adjustable same-delay primary side voltage sampling circuit, a large-range adjustable same-delay primary side voltage sampling circuit, a same-range adjustable-delay primary side current sampling circuit is connected with a large-range adjustable same-delay primary side current sampling circuit for outputting a small-range sampling primary side current, the small-range adjustable same-delay primary side current sampling circuit is connected with a primary side low parasitic parameter leading-out terminal for outputting a large sampling primary side current, the small-range adjustable same-delay primary side voltage sampling circuit is connected with the same-delay second bridge arm voltage sampling circuit, the small-range adjustable same-delay primary side voltage sampling terminal is connected with the same-delay primary side voltage sampling circuit, the small-range adjustable-delay primary side voltage sampling circuit is connected with the small-side output primary side parasitic voltage sampling terminal, and the small-side variable-side output primary side voltage sampling circuit is connected with the small-side variable-side primary side voltage sampling circuit.
3. The isolated switching power supply transformer loss test circuit according to claim 2, wherein a first target current flows out of the shorted resonant interface, respectively passes through the small-range adjustable same-delay primary side current sampling circuit, the large-range adjustable same-delay primary side current sampling circuit and the primary side low parasitic parameter bridge arm leading-out terminal to reach an external transformer to be tested, and then flows out of the external transformer to be tested, passes through the primary side low parasitic parameter bridge arm leading-out terminal, the same-delay second bridge arm voltage sampling circuit, the small-range adjustable same-delay primary side voltage sampling circuit and the topology and parameter variable primary side bridge arm.
4. The isolated switching power supply transformer loss test circuit of claim 2, wherein the topology and parameter variable secondary side circuit comprises a secondary side low parasitic parameter rectification lead-in terminal, a topology and parameter variable rectification circuit, a shorted filter inductance interface and current sampling circuit, a load interface and output voltage sampling circuit, a small-range adjustable co-delay secondary side voltage sampling circuit, a large-range adjustable co-delay secondary side voltage sampling circuit, a small-range adjustable co-delay secondary side current sampling circuit, and a large-range adjustable co-delay secondary side current sampling circuit, wherein:
The secondary side low-parameter rectification lead-in terminal is connected with an external transformer to be tested, a topology and parameter variable rectification circuit, a small-range adjustable same-time delay secondary side voltage sampling circuit, a large-range adjustable same-time delay secondary side voltage sampling circuit and a large-range adjustable same-time delay secondary side current sampling circuit, the topology and parameter variable rectification circuit is connected with a short-circuit filter inductance interface and current sampling circuit, a load interface and output voltage sampling circuit, a small-range adjustable same-time delay secondary side voltage sampling circuit, a large-range adjustable same-time delay secondary side current sampling circuit and a small-range adjustable same-time delay secondary side current sampling circuit, the small-range adjustable same-time delay secondary side current sampling circuit is connected with an external filter inductance, the load interface and output voltage sampling circuit is connected with the large-range adjustable same-time delay secondary side voltage sampling circuit and the large-range adjustable same-time delay secondary side current sampling circuit for outputting small-time delay secondary side voltage, the large-range adjustable same-time delay secondary side voltage sampling circuit is connected with the large-range adjustable same-time delay secondary side current sampling circuit for outputting the small-range current sampling circuit, and the small-time delay adjustable same-time delay secondary side current sampling circuit is connected with the external load.
5. The isolated switching power supply transformer loss test circuit according to claim 4, wherein the second target current flows out of the topology and parameter variable rectifying circuit, respectively through the small-range adjustable synchronous delay secondary side current sampling circuit, the large-range adjustable synchronous delay secondary side current sampling circuit and the secondary side low parasitic parameter rectifying lead-in terminal, and the third target current flows out of the topology and parameter variable rectifying circuit, reaches the external load through the load interface and the output voltage sampling circuit, and returns to the topology and parameter variable rectifying circuit through the load interface and the output voltage sampling circuit.
6. The isolated switching power supply transformer loss test circuit of claim 2, wherein the primary side topology change parameter and power measurement circuit comprises a bridge arm power tube driving circuit, a primary side topology change-over switch driving circuit and a transformer primary side power segmentation integration circuit based on a power supply mode, wherein:
the transformer primary power subsection integrating circuit based on the power supply mode is used for carrying out integral operation on the small-range sampling primary side current, the large-range sampling primary side current, the small-range sampling primary side voltage, the large-range sampling primary side voltage, the first bridge arm sampling voltage and the second bridge arm sampling voltage in the topology and parameter variable primary side circuit.
7. The isolated switching power supply transformer loss test circuit of claim 4, wherein the secondary side topology variable parameter and power measurement circuit comprises a rectifier tube synchronous rectification selectable driving circuit, a secondary side topology switch driving circuit and a transformer secondary side power segmentation integrating circuit based on a power supply mode, wherein:
And the transformer secondary side power segmentation integrating circuit based on the power supply mode is used for carrying out integral operation on a first bridge arm sampling voltage, a second bridge arm sampling voltage, a small-range sampling secondary side voltage, a large-range sampling secondary side voltage, a small-range sampling secondary side current and a large-range sampling secondary side current in the topology and parameter variable primary side circuit and the topology and parameter variable secondary side circuit.
8. An isolated switching power supply transformer loss test apparatus comprising an isolated switching power supply transformer loss test circuit according to any one of claims 1 to 7.
CN202411356871.7A 2024-09-27 2024-09-27 Loss test circuit and device for isolated switching power supply transformer Active CN119246965B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202411356871.7A CN119246965B (en) 2024-09-27 2024-09-27 Loss test circuit and device for isolated switching power supply transformer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202411356871.7A CN119246965B (en) 2024-09-27 2024-09-27 Loss test circuit and device for isolated switching power supply transformer

Publications (2)

Publication Number Publication Date
CN119246965A CN119246965A (en) 2025-01-03
CN119246965B true CN119246965B (en) 2025-04-25

Family

ID=94015854

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202411356871.7A Active CN119246965B (en) 2024-09-27 2024-09-27 Loss test circuit and device for isolated switching power supply transformer

Country Status (1)

Country Link
CN (1) CN119246965B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113890376A (en) * 2021-10-14 2022-01-04 东南大学 Isolated DC-DC converter topology with wide input voltage and control method thereof
CN114755612A (en) * 2022-04-21 2022-07-15 华北电力大学 A method for measuring the equivalent resistance value of iron loss under low voltage and high frequency of transformers

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7969167B2 (en) * 2009-01-28 2011-06-28 Freescale Semiconductor, Inc. Capacitance-to-voltage interface circuit with shared capacitor bank for offsetting and analog-to-digital conversion
CN211531009U (en) * 2019-12-31 2020-09-18 深圳科士达科技股份有限公司 Isolated DC-DC converter current reconstruction circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113890376A (en) * 2021-10-14 2022-01-04 东南大学 Isolated DC-DC converter topology with wide input voltage and control method thereof
CN114755612A (en) * 2022-04-21 2022-07-15 华北电力大学 A method for measuring the equivalent resistance value of iron loss under low voltage and high frequency of transformers

Also Published As

Publication number Publication date
CN119246965A (en) 2025-01-03

Similar Documents

Publication Publication Date Title
TWI384736B (en) Bridgeless pfc circuit system having current sensing circuit and method thereof
WO2020135703A1 (en) Insulation detection system based on full-bridge insulation detection circuit and electric automobile
CN103701303B (en) There is Switching Power Supply and the method for testing of measurability function
CN111077471A (en) NPC three-level inverter open-circuit fault diagnosis method based on instantaneous frequency
CN105738706A (en) A method and device for detecting insulation resistance to ground of a photovoltaic inverter
CN107219402A (en) A kind of circuit for quick measurement of DC resistance for power module port
CN107402324A (en) Power supply sample circuit, method and its low-voltage circuit breaker based on single electric current transformer
CN108333428A (en) Insulation resistance measuring apparatus and method
CN109490606B (en) Isolation voltage detection device
CN111722069B (en) Insulation detection circuit sampling resistor selection method, device, medium and equipment
CN218630071U (en) Power semiconductor device resistance and capacitance integrated stand-alone tester
CN119246965B (en) Loss test circuit and device for isolated switching power supply transformer
CN106053954A (en) DC bus capacitor online monitoring method
Mitrovic et al. Phase current reconstruction, DC link voltage and R DS-ON measurement using sensors integrated on gate drivers for SiC MOSFET
CN111308232A (en) System and method for measuring stray parameters of current loop of high-power converter module
CN117330951B (en) SOA (service oriented architecture) test system and test method for MOS (metal oxide semiconductor) switch device
CN219434979U (en) Avalanche energy measuring circuit and measuring equipment
CN117783672A (en) Vehicle insulation testing devices and new energy vehicles
CN111693888A (en) Power performance detection device
CN115902412A (en) Detection circuit and method for double-voltage-level direct-current insulation resistance based on dynamic difference method
Yao et al. High step-up tapped inductor SEPIC converter with charge pump cell
KR101654785B1 (en) Buck-converter bcm control apparatus and method thereof
CN111505524B (en) On-line monitoring method of cascade converter and applicable cascade converter
CN113375186A (en) Ion flame detection circuit and method
CN112769314A (en) Inverter PWM voltage sampling pretreatment device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant