CN110186925A - Detection device - Google Patents

Abstract

The invention discloses a kind of detection devices, to detect a determinand.Detection device includes a spectroscope, a pattern beam generator, a video capture device and a processor.Pattern beam generator is located at spectroscopical phase heteropleural with video capture device and pattern beam generator and video capture device are in conjugation configuration.Pattern beam generator is irradiated in determinand to issue a predetermined pattern, and by spectroscope.Video capture device captures predetermined pattern by spectroscope and is presented in the actual pattern on determinand.Processor is to compare predetermined pattern and actual pattern, using the foundation as the quality for judging determinand.

Description

Detection device

technical field

The present invention relates to a detection device, in particular to a conjugate configuration detection device.

Background technique

Due to the increasing use of smart phones, such as browsing news, social networking sites and playing games, consumers cannot live without smart phones. Smartphone batteries are roughly divided into two types: built-in and replaceable. The built-in battery design means that the mobile phone case does not have a removable battery back cover to facilitate the thinning of the smartphone. The replaceable battery design is that the mobile phone casing is provided with a detachable battery back cover to facilitate battery replacement.

Regardless of whether it is a built-in type or a replaceable type, the battery needs to be tested before leaving the factory to eliminate defective batteries. In detail, during the production of the battery, the outer skin is used to cover the battery core by vacuum technology, but if the battery swells or the battery outer skin is damaged, the appearance will be uneven. Conversely, if the appearance of the battery is uneven, it means that the battery is defective and will affect the quality of the battery. However, at present, the appearance of the battery is inspected by means of coaxial or ring lighting, which will cause problems such as low image contrast and unstable inspection quality.

Contents of the invention

The present invention is to provide a detection device to improve the conventional appearance detection of batteries by means of coaxial or ring lighting to detect the appearance of the battery, resulting in low image contrast and unstable detection quality.

A detecting device disclosed in an embodiment of the present invention is used for detecting an object to be tested. The detection device includes a beam splitter, a pattern beam generator, an image picker and a processor. The pattern beam generator and the image picker are respectively located on different sides of the beam splitter, and the pattern beam generator and the image picker are in a conjugate configuration. The pattern beam generator is used to emit a preset pattern and irradiate the object under test through the beam splitter. The image capture device captures an actual pattern presented by the preset pattern on the object to be measured through the spectroscope. The processor is used for comparing the preset pattern and the actual pattern as a basis for judging the quality of the object to be tested.

According to the detection device of the above-mentioned embodiment, since the pattern beam generator and the image capture device are configured in a conjugate manner, the ratio and contrast of the actual pattern are less distorted compared with the ratio and contrast of the preset pattern. In this way, the image contrast of the actual image can be improved, and the stability of detecting the object under test can be improved, thereby improving the detection quality of the detection device.

In addition, since the distance from the pattern beam generator to the beam splitter is equal to the distance from the imaging surface of the image capture device to the beam splitter, the variables affecting the detection stability can be further reduced, thereby further improving the detection quality of the detection device.

The above description of the content of the present invention and the following description of the implementation are used to demonstrate and explain the spirit and principle of the present invention, and to provide further explanation of the protection scope of the patent application claims of the present invention.

Description of drawings

Fig. 1 is a plan view of a detection device according to a first embodiment of the present invention.

FIG. 2 is a plan view of the grating of FIG. 1. FIG.

FIG. 3 is a plan view of a preset pattern emitted by the pattern beam generator of FIG. 1 .

FIG. 4 is a plan view of an actual pattern captured by the image capture device of FIG. 1 .

FIG. 5 is a plan view of the vectorized preset pattern and the vectorized actual pattern of FIG. 1 .

Fig. 6 is a plan view of a grating according to a second embodiment of the present invention.

Among them, reference signs:

10 detection device

20 DUT

100 beam splitters

110 First side

120 Second side

200 pattern beam generator

210 light source

220 grating

221 Blackout strip

222 Light-transmitting port

220’ grating

221’ first blackout strip

222’ second blackout strip

223’ light port

300 image grabber

310 imaging surface

410 first lens

420 second lens

430 third lens

500 processors

a, b direction

P Preset pattern

A actual pattern

Preset patterns for V1 vectorization

Actual patterns for V2 vectorization

D1～D4 distance

F lighting range

C capture range

Detailed ways

Please refer to Figure 1 to Figure 2. Fig. 1 is a plan view of a detection device according to a first embodiment of the present invention. FIG. 2 is a plan view of the grating of FIG. 1. FIG.

The detection device 10 of this embodiment is used to detect a test object 20 . The test object 20 is, for example, a lithium battery. When lithium batteries are manufactured, vacuum technology is used to make the outer skin cover the battery core. Normally, if the battery core does not expand and the battery skin is not damaged, the skin of the lithium battery is flat. Conversely, if the battery core is not swollen and the battery skin is not damaged, the skin will be damaged or deformed.

The detection device 10 includes a beam splitter 100 , a pattern beam generator 200 , an image capture device 300 and a processor 500 .

The beam splitter 100 has a first surface 110 and a second surface 120 opposite to each other. The first surface 110 and the second surface 120 are arranged obliquely, and the first surface 110 faces to the right, for example, and the second surface 120 faces upward, for example. If the light passes through the first surface 110 or the second surface 120 along the direction a, the light will pass through the first surface 110 or the second surface 120 . If the light passes through the first surface 110 or the second surface 120 along the direction b, the light will be reflected by the first surface 110 or the second surface 120 .

The pattern beam generator 200 and the image capture device 300 are respectively located on different sides of the beam splitter 100 and the pattern beam generator 200 and the image capture device 300 are configured in a conjugate configuration. In detail, the pattern beam generator 200 is located on the right side of the beam splitter 100 , for example, and the first surface 110 of the beam splitter 100 faces the pattern beam generator 200 . For example, the image capture device 300 is located on the upper side of the beam splitter 100 , and the second surface 120 of the beam splitter mirror 100 faces the image capture device 300 . The so-called conjugate configuration of the pattern beam generator 200 and the image capture device 300 means that the illumination range F of the pattern beam generator 200 and the image capture range C of the image capture device 300 after passing through the beam splitter 100 completely overlap, Its effect will be explained later.

The pattern beam generator 200 includes a light source 210 and a grating 220 . The light source 210 is, for example, a surface light source. The grating 220 is interposed between the light source 210 and the beam splitter 100 . The grating 220 has a plurality of light-shielding strips 221 in the shape of straight strips. These light-shielding strips 221 separate a plurality of light-transmitting openings 222, so that the light source 210 emits a preset pattern P (please refer to FIG. It is assumed that the pattern P is irradiated on the object under test 20 through the beam splitter 100 . In this embodiment, the preset pattern P is a periodic pattern of multiple white rectangular patterns, but it is not limited thereto. In other embodiments, the preset pattern can also be an aperiodic pattern.

In addition, in this embodiment, the pattern beam generator 200 is composed of a light source 210 and a grating 220 , but it is not limited thereto. In other embodiments, the shape of the preset pattern can also be arranged solely by the light source, so as to directly emit the preset pattern.

The image capture unit 300 is used for capturing an actual pattern A (please refer to FIG. 4 ) of the preset pattern P presented on the object 20 through the spectroscope 100 . The image capture device 300 has an imaging surface 310 . The image captured by the image capture device 300 is imaged on the imaging surface 310 . In this embodiment, the distance D1 from the imaging surface 310 to the beamsplitter 100 is equal to the distance D2 from the grating 220 to the beamsplitter 100 , so as to reduce the variables affecting the detection stability, thereby increasing the detection accuracy of the detection device 10 .

The processor 500 is, for example, a personal computer, and is used to compare the preset pattern P with the actual pattern A as a basis for judging the quality of the object under test 20 .

In this embodiment, the detection device 10 further includes a first lens 410 , a second lens 420 and a third lens 430 . The first lens 410 , the second lens 420 and the third lens 430 are, for example, convex lenses. The first lens 410 is located between the pattern beam generator 200 and the beam splitter 100 to project the preset pattern P emitted by the pattern beam generator 200 to the beam splitter 100 . The second lens 420 is located between the image capture device 300 and the beam splitter 100 , so that the actual pattern A of the preset pattern P displayed on the object 20 is projected onto the imaging surface 310 of the image capture device 300 . In addition, the first lens 410 is the same as the second lens 420, and the distance D3 from the first lens 410 to the beam splitter 100 is equal to the distance D4 from the second lens 420 to the beam splitter 100, so as to further reduce the detection variables and further increase the number of detection devices. 10 detection accuracy. The third lens 430 and the second lens 420 are respectively located on opposite sides of the beam splitter 100 , that is, the beam splitter 100 is located between the image capture device 300 and the third lens 430 to focus the predetermined pattern P on the object 20 to be tested.

Please refer to FIGS. 3 to 5 . FIG. 3 is a plan view of a preset pattern emitted by the pattern beam generator in FIG. 1 . FIG. 4 is a plan view of an actual pattern captured by the image capture device of FIG. 1 . FIG. 5 is a plan view of the vectorized preset pattern and the vectorized actual pattern of FIG. 1 .

The detection is performed with the object under test 20 having defects, that is, the outer surface of the object under test 20 is concave-convex. When the preset pattern P (as shown in FIG. 3 ) with a plurality of white rectangular patterns emitted by the pattern beam generator 200 is projected on the first surface 110 of the beam splitter 100 along the direction b, the first surface 110 of the beam splitter 100 The preset pattern P is reflected to the concave-convex surface of the object under test 20 . Since the predetermined pattern P is affected by the uneven surface of the object under test 20 , the original white rectangular pattern becomes an irregular distorted pattern. That is to say, the actual pattern A (as shown in FIG. 4 ) presented on the object under test 20 becomes a plurality of irregular distorted patterns. Then, the actual pattern A is projected on the imaging surface 310 of the image capture device 300 along the direction a through the first surface 110 of the beam splitter 100 . Next, as shown in FIG. 5 , the processor 500 vectorizes the actual pattern A and the preset pattern P, and then overlaps and compares the vectorized actual pattern V2 with the vectorized preset pattern V1 . Specifically, each curve in the vectorized actual pattern V2 will be compared with the nearest straight lines in the vectorized preset pattern V1, and, for example, by means of the least square method, the vectorized actual pattern V2 and the vector The difference amount of the pre-set pattern V1. Since the difference exceeds a preset value, it is determined to be unqualified. On the contrary, if the error amount between the curve and the straight line is less than the preset value, it is determined to be qualified.

In this embodiment, since the pattern beam generator 200 and the image capture device 300 are configured in a conjugate manner, compared with the ratio and contrast of the preset pattern P, the ratio and contrast of the actual pattern A are less distorted. In this way, the image contrast of the actual image A can be improved, and the detection stability of the object under test 20 can be improved, thereby improving the detection quality of the detection device 10 .

In the embodiment of FIG. 1 , the grating 220 is exemplified by a plurality of light shielding strips 221 having a straight strip shape, but it is not limited thereto. See Figure 6. Fig. 6 is a plan view of a grating according to a second embodiment of the present invention.

The grating 220' of this embodiment has a plurality of first light-shielding strips 221' and a plurality of second light-shielding strips 222' which form a grid. A light-transmitting port 223'. Since the grating 220' of this embodiment has a two-dimensional pattern, the detection accuracy of the detection device can be further improved.

According to the detection device of the above-mentioned embodiment, since the pattern beam generator and the image capture device are configured in a conjugate manner, the ratio and contrast of the actual pattern are less distorted compared with the ratio and contrast of the preset pattern. In this way, the image contrast of the actual image can be improved, and the stability of detecting the object under test can be improved, thereby improving the detection quality of the detection device.

In addition, since the distance from the pattern beam generator to the beam splitter is equal to the distance from the imaging surface of the image capture device to the beam splitter, the variables affecting the detection stability can be further reduced, thereby further improving the detection quality of the detection device.

Claims (10)

1. a kind of detection device, to detect a determinand, which is characterized in that the detection device includes:

One spectroscope；

One pattern beam generator and a video capture device, the pattern beam generator and the video capture device are located at this point The phase heteropleural of light microscopic and the pattern beam generator and the video capture device are in conjugation configuration, and the pattern beam generator is to send out A predetermined pattern out, and the determinand is irradiated in by the spectroscope, which should to be captured by the spectroscope Predetermined pattern is presented in the actual pattern on the determinand；

One processor, to compare the predetermined pattern and the actual pattern, using the foundation as the quality for judging the determinand.

2. detection device as described in claim 1, which is characterized in that pass through the pattern beam generator after the spectroscope Illumination zone and the video capture device image capture range it is completely overlapped.

3. detection device as described in claim 1, which is characterized in that the pattern beam generator is spectroscopical apart from phase to this Equal to the video capture device an imaging surface to spectroscopical distance.

4. detection device as claimed in claim 3, which is characterized in that the pattern beam generator includes a light source and a light Grid, for the grating between the light source and the spectroscope, which issues the predetermined pattern by the grating.

5. detection device as claimed in claim 4, which is characterized in that the light source is area source.

6. detection device as claimed in claim 4, which is characterized in that the grating has multiple shading strips of vertical bar shape, those Shading strip is separated out a plurality of light-transmitting opening.

7. detection device as claimed in claim 4, which is characterized in that the grating, which has, constitutes grid-like multiple first shadings Item and multiple second shading strips, those first shading strips and those second shading strips are separated out multiple light-transmitting openings jointly.

8. detection device as described in claim 1, which is characterized in that further include one first lens and one second lens, this One lens are located between the pattern beam generator and the spectroscope, which is located at the video capture device and the spectroscope Between.

9. detection device as claimed in claim 8, which is characterized in that first lens are identical to second lens, and this One lens to spectroscopical distance is equal to second lens to spectroscopical distance.

10. detection device as claimed in claim 9, which is characterized in that further include a third lens, which is located at the shadow As between acquisition device and the third lens.