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CN110246785B - Transfer apparatus and transfer method - Google Patents

Transfer apparatus and transfer method Download PDF

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CN110246785B
CN110246785B CN201910554526.7A CN201910554526A CN110246785B CN 110246785 B CN110246785 B CN 110246785B CN 201910554526 A CN201910554526 A CN 201910554526A CN 110246785 B CN110246785 B CN 110246785B
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transfer
target
heads
track
repair
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CN110246785A (en
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袁广才
李海旭
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BOE Technology Group Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67253Process monitoring, e.g. flow or thickness monitoring
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67276Production flow monitoring, e.g. for increasing throughput
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping

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Abstract

本发明提供一种转印设备和转印方法,该转印设备包括:承载基板;设置于所述承载基板上的多个转印头,所述多个转印头呈阵列方式排布,所述转印头用于抓取待转印的目标器件并将所述待转印的目标器件转印至目标基板。本发明中,可以同时采用多个转印头抓取多个目标器件,并将多个目标器件同时转印至目标基板上,在保证转印精度的同时,可以大幅提高转印效率。

Figure 201910554526

The invention provides a transfer device and a transfer method, the transfer device includes: a carrier substrate; a plurality of transfer heads arranged on the carrier substrate, the plurality of transfer heads are arranged in an array, and the The transfer head is used for grasping the target device to be transferred and transferring the target device to be transferred to the target substrate. In the present invention, multiple transfer heads can be used to grab multiple target devices at the same time, and transfer the multiple target devices to the target substrate at the same time, which can greatly improve the transfer efficiency while ensuring the transfer accuracy.

Figure 201910554526

Description

转印设备和转印方法Transfer equipment and transfer method

技术领域technical field

本发明涉及微转印技术领域,尤其涉及一种转印设备和转印方法。The present invention relates to the technical field of micro-transfer printing, in particular to a transfer device and a transfer method.

背景技术Background technique

微转印技术是一种将目标器件转移到相应基板上的精细化技术,该技术的生产效率和生产质量将直接影响微型LED显示(Micro-LED,也称μLED)等下一代技术的量产性,可以说能对整个显示行业产生变革性影响。Micro transfer technology is a refined technology that transfers target devices to corresponding substrates. The production efficiency and production quality of this technology will directly affect the mass production of next-generation technologies such as Micro-LED display (Micro-LED, also known as μLED). It can be said that it can have a transformative impact on the entire display industry.

在现有技术中,转印技术是将目标器件和目标基板置于同一平面,然后根据设定程序或者人为操作,逐个抓取目标器件并逐个转印至目标基板上。这种逐个“抓取-转印”的方式虽然可以控制很高的精度,但是其转印效率太低,不利于大规模量产。In the prior art, the transfer technology is to place the target device and the target substrate on the same plane, and then, according to a set program or manual operation, grab the target devices one by one and transfer them to the target substrate one by one. Although this one-by-one "grab-transfer" method can control high precision, its transfer efficiency is too low, which is not conducive to mass production.

发明内容SUMMARY OF THE INVENTION

有鉴于此,本发明提供一种转印设备和转印方法,用于解决现有的转印技术中需要逐个抓取并逐个转印目标器件,转印效率低的问题。In view of this, the present invention provides a transfer apparatus and a transfer method, which are used to solve the problem of low transfer efficiency in the existing transfer technology, which needs to be grasped one by one and transferred one by one.

为解决上述技术问题,本发明提供一种转印设备,包括:In order to solve the above-mentioned technical problem, the present invention provides a kind of transfer equipment, including:

承载基板;carrier substrate;

设置于所述承载基板上的多个转印头,所述多个转印头呈阵列方式排布,所述转印头用于抓取待转印的目标器件并将所述待转印的目标器件转印至目标基板。A plurality of transfer heads arranged on the carrier substrate, the plurality of transfer heads are arranged in an array, and the transfer heads are used to grab the target device to be transferred and transfer the target device to be transferred. The target device is transferred to the target substrate.

可选的,所述多个转印头排成至少一排;Optionally, the plurality of transfer heads are arranged in at least one row;

所述转印设备还包括:The transfer device also includes:

至少一条转印轨道,设置于所述承载基板上,每一排所述转印头设置于一条所述转印轨道上,且所述转印头可沿对应的所述转印轨道移动。At least one transfer track is arranged on the carrier substrate, each row of the transfer heads is arranged on one of the transfer tracks, and the transfer heads can move along the corresponding transfer track.

可选的,所述转印设备还包括:Optionally, the transfer device further includes:

变轨轨道,所述变轨轨道的延伸方向与所述转印轨道的延伸方向垂直,所述转印轨道可移动地设置于所述变轨轨道上。A track change track, the extension direction of the track change track is perpendicular to the extension direction of the transfer track, and the transfer track is movably arranged on the track change track.

可选的,所述转印设备还包括:Optionally, the transfer device further includes:

电学测试头,设置于每一所述转印轨道的两端或所述变轨轨道上,用于将外部的电学测试工具和所述目标基板上的测试点连通。An electrical test head is disposed at both ends of each of the transfer tracks or on the track changing track, and is used for connecting an external electrical test tool with a test point on the target substrate.

可选的,所述转印设备还包括:Optionally, the transfer device further includes:

多个光学感应器,设置于所述转印头上,与所述转印头一一对应;a plurality of optical sensors, arranged on the transfer head and corresponding to the transfer head one-to-one;

处理器,与所述光学感应器连接,用于根据所述光学感应器传输的感应信号,确定不良的目标器件的位置。The processor is connected to the optical sensor, and is used for determining the position of the bad target device according to the sensing signal transmitted by the optical sensor.

可选的,所述转印设备还包括:Optionally, the transfer device further includes:

设置于所述承载基板上的多个修复头,所述多个修复头呈阵列方式排布,所述修复头用于对转印至所述目标基板上的不良的目标器件进行修复。A plurality of repair heads disposed on the carrier substrate, the plurality of repair heads are arranged in an array, and the repair heads are used for repairing defective target devices transferred to the target substrate.

可选的,所述多个修复头排成至少一排;Optionally, the plurality of repair heads are arranged in at least one row;

所述转印设备还包括:The transfer device also includes:

至少一条修复轨道,设置于所述变轨轨道上,每一排所述修复头设置于一条所述修复轨道上,且所述修复头可沿对应的所述修复轨道移动。At least one repair track is arranged on the track changing track, each row of the repair heads is arranged on one of the repair tracks, and the repair heads can move along the corresponding repair track.

本发明还提供一种转印方法,应用于上述转印设备,所述转印方法包括:The present invention also provides a transfer method, which is applied to the above transfer device, and the transfer method includes:

从用于放置待转印的目标器件的区域抓取多个待转印的目标器件;Grab a plurality of target devices to be transferred from the area for placing the target devices to be transferred;

将抓取的多个待转印的目标器件同时转印至目标基板。Transfer the grabbed multiple target devices to be transferred to the target substrate at the same time.

可选的,所述转印设备还包括:Optionally, the transfer device further includes:

电学测试头,设置于每一所述转印轨道的两端或所述变轨轨道上,用于将外部的电学测试工具和所述目标基板上的测试点连通。An electrical test head is disposed at both ends of each of the transfer tracks or on the track changing track, and is used for connecting an external electrical test tool with a test point on the target substrate.

所述将抓取的多个待转印的目标器件同时转印至目标基板之后还包括:After transferring the grabbed multiple target devices to be transferred to the target substrate at the same time, the method further includes:

通过电学测试头将外部的电学测试工具和所述目标基板上的测试点连通;Connect an external electrical test tool with the test point on the target substrate through the electrical test head;

通过所述电学测试工具,向转印至所述目标基板的目标器件通电,以确定所述目标器件是否不良。The target device transferred to the target substrate is energized by the electrical test tool to determine whether the target device is defective.

可选的,所述转印设备还包括:Optionally, the transfer device further includes:

设置于所述承载基板上的多个修复头,所述多个修复头呈阵列方式排布,所述修复头用于对转印至所述目标基板上的不良的目标器件进行修复。A plurality of repair heads disposed on the carrier substrate, the plurality of repair heads are arranged in an array, and the repair heads are used for repairing defective target devices transferred to the target substrate.

所述将抓取的多个待转印的目标器件同时转印至目标基板之后还包括:After transferring the grabbed multiple target devices to be transferred to the target substrate at the same time, the method further includes:

将所述修复头移动至不良的目标器件对应的位置;moving the repair head to the position corresponding to the bad target device;

采用所述修复头取下所述不良的目标器件;using the repair head to remove the defective target device;

采用所述修复头抓取待补充的目标器件,并转印至所述不良的目标器件所在位置。The repair head is used to grab the target device to be replenished, and transfer it to the position where the defective target device is located.

本发明的上述技术方案的有益效果如下:The beneficial effects of the above-mentioned technical solutions of the present invention are as follows:

本发明实施例中,转印设备具有多个转印头,因而可以同时采用多个转印头抓取多个目标器件,并将多个目标器件同时转印至目标基板上,在保证转印精度的同时,可以大幅提高转印效率。In the embodiment of the present invention, the transfer device has multiple transfer heads, so multiple transfer heads can be used to grab multiple target devices at the same time, and transfer the multiple target devices to the target substrate at the same time. At the same time, the transfer efficiency can be greatly improved.

附图说明Description of drawings

为了更清楚地说明本发明实施例的技术方案,下面将对本发明实施例的描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动性的前提下,还可以根据这些附图获得其他的附图。In order to illustrate the technical solutions of the embodiments of the present invention more clearly, the following briefly introduces the drawings that are used in the description of the embodiments of the present invention. Obviously, the drawings in the following description are only some embodiments of the present invention. , for those of ordinary skill in the art, other drawings can also be obtained from these drawings without creative labor.

图1为本发明一实施例的转印设备的侧视图;1 is a side view of a transfer device according to an embodiment of the present invention;

图2为本发明一实施例的转印设备的俯视图;2 is a top view of a transfer apparatus according to an embodiment of the present invention;

图3为本发明一实施例的目标基板的俯视图;3 is a top view of a target substrate according to an embodiment of the present invention;

图4为本发明一实施例的修复头的结构示意图;4 is a schematic structural diagram of a repair head according to an embodiment of the present invention;

图5为本发明一实施例的转印设备进行不良的目标器件修复的过程示意图;5 is a schematic diagram of a process of repairing a defective target device by a transfer apparatus according to an embodiment of the present invention;

图6为本发明一实施例的转印设备在转印过程中的状态示意图;6 is a schematic diagram of a state of a transfer device in a transfer process according to an embodiment of the present invention;

图7为本发明一实施例的转印方法的流程示意图。FIG. 7 is a schematic flowchart of a transfer method according to an embodiment of the present invention.

具体实施方式Detailed ways

为使本发明实施例的目的、技术方案和优点更加清楚,下面将结合本发明实施例的附图,对本发明实施例的技术方案进行清楚、完整地描述。显然,所描述的实施例是本发明的一部分实施例,而不是全部的实施例。基于所描述的本发明的实施例,本领域普通技术人员所获得的所有其他实施例,都属于本发明保护的范围。In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are some, but not all, embodiments of the present invention. Based on the described embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art fall within the protection scope of the present invention.

请参考图1和图2,图1为本发明一实施例的转印设备的侧视图,图2为本发明一实施例的转印设备的俯视图,该转印设备包括:Please refer to FIGS. 1 and 2. FIG. 1 is a side view of a transfer device according to an embodiment of the present invention, and FIG. 2 is a top view of a transfer device according to an embodiment of the present invention. The transfer device includes:

承载基板10;carrier substrate 10;

设置于所述承载基板10上的多个转印头20,所述多个转印头20呈阵列方式排布,所述转印头20用于抓取待转印的目标器件并将所述待转印的目标器件转印至目标基板。The plurality of transfer heads 20 disposed on the carrier substrate 10 are arranged in an array. The transfer heads 20 are used to grab the target device to be transferred and transfer the The target device to be transferred is transferred to the target substrate.

本发明实施例中,转印设备具有多个转印头,因而可以同时采用多个转印头抓取多个目标器件,并将多个目标器件同时转印至目标基板上,在保证转印精度的同时,可以大幅提高转印效率。In the embodiment of the present invention, the transfer device has multiple transfer heads, so multiple transfer heads can be used to grab multiple target devices at the same time, and transfer the multiple target devices to the target substrate at the same time. At the same time, the transfer efficiency can be greatly improved.

本发明实施例中,可选的,每一所述转印头20均可以独立控制伸缩。In the embodiment of the present invention, optionally, each of the transfer heads 20 can independently control the expansion and contraction.

本发明实施例中,承载基板10上的多个转印头20排成至少一排,每一排包括多个转印头20。优选地,所述多个转印头20排成多排,从而在进行转印时,可以采用多排转印头20同时对多个目标器件进行抓取和转印,以进一步提高转印效率。In the embodiment of the present invention, the plurality of transfer heads 20 on the carrier substrate 10 are arranged in at least one row, and each row includes a plurality of transfer heads 20 . Preferably, the plurality of transfer heads 20 are arranged in multiple rows, so that during transfer, multiple rows of transfer heads 20 can be used to grab and transfer multiple target devices at the same time, so as to further improve the transfer efficiency .

本发明实施例中,可选的,每一排转印头20都具有独立的对位功能,以提升转印精度,请参考图2,每一片转印头20均具有独立的对位点90能。In the embodiment of the present invention, optionally, each row of transfer heads 20 has an independent alignment function to improve transfer accuracy. Please refer to FIG. 2 , each transfer head 20 has an independent alignment point 90 can.

本发明实施例中,可选的,每一排的相邻两转印头20之间的间距可调,以适用不同位置的转印任务和转印精度控制,从而可以制作目标器件的行间距不同的多种类型的目标基板,或者,制作目标器件呈不规则排布方式的目标基板。如图3所示,图3所示的目标基板100上的目标器件101呈不规则排布方式(相邻的目标器件101链接形成形状后,非矩形,可以称为不规则排布),在转印时,调整每一排的各个转印头20的位置,使得转印头20的排布方式呈对应的不规则排布方式。在转印不规则排布方式的目标器件时,优选地,转印设备包括多排转印头,从而避免适用单排需重复调整转印头之间的间距,重复对位的问题。In the embodiment of the present invention, optionally, the distance between two adjacent transfer heads 20 in each row is adjustable, so as to be suitable for transfer tasks and transfer accuracy control at different positions, so that the line distance of the target device can be produced. Different types of target substrates, or target substrates in which the target devices are arranged in an irregular manner are fabricated. As shown in FIG. 3 , the target devices 101 on the target substrate 100 shown in FIG. 3 are in an irregular arrangement (after the adjacent target devices 101 are linked to form a shape, they are not rectangular and can be called irregular arrangement). During transfer, the positions of the respective transfer heads 20 in each row are adjusted so that the arrangement of the transfer heads 20 is a corresponding irregular arrangement. When transferring target devices in an irregular arrangement, preferably, the transfer device includes multiple rows of transfer heads, so as to avoid the problem of repeated adjustment of the spacing between the transfer heads and repeated alignment when applying a single row.

本发明实施例中,为了实现每一排的相邻两转印头20之间的间距可调,请参考图2,本发明实施例中,可选的,所述转印设备包括:至少一条转印轨道30,设置于所述承载基板10上,每一排所述转印头20设置于一条所述转印轨道30上,且所述转印头20可沿对应的所述转印轨道30移动。也就是说,转印头20与对应的转印轨道30是可移动的连接,所述转印头20上具有与所述转印轨道30配合的部件,以能够固定在所述转印轨道30上,并沿着所述转印轨道30移动。图2所示的实施例中,转印设备包括多条转印轨道30,所述多条转印轨道30平行设置,每一转印轨道30上设置有多个转印头20。In the embodiment of the present invention, in order to realize the adjustable distance between two adjacent transfer heads 20 in each row, please refer to FIG. 2 . In the embodiment of the present invention, optionally, the transfer device includes: at least one The transfer track 30 is disposed on the carrier substrate 10 , each row of the transfer heads 20 is disposed on one of the transfer tracks 30 , and the transfer heads 20 can move along the corresponding transfer track 30 moves. That is to say, the transfer head 20 is movably connected to the corresponding transfer track 30 , and the transfer head 20 has components matched with the transfer track 30 to be able to be fixed on the transfer track 30 . and move along the transfer track 30 . In the embodiment shown in FIG. 2 , the transfer device includes a plurality of transfer tracks 30 , the plurality of transfer tracks 30 are arranged in parallel, and each transfer track 30 is provided with a plurality of transfer heads 20 .

本发明实施例中,请参考图2,可选的,每一所述转印头20设置于转印轨道30上的指定位置,并且能够指定移动范围内移动,指定移动范围可根据转印头20的密度及转印头20的尺寸确定。In the embodiment of the present invention, please refer to FIG. 2. Optionally, each of the transfer heads 20 is arranged at a designated position on the transfer track 30 and can move within a designated movement range. The designated movement range can be determined according to the transfer head. The density of 20 and the size of the transfer head 20 are determined.

当然,在本发明的其他一些实施例中,除了通过转印轨道30实现调节每一排的相邻两转印头20之间的间距之外,还可以通过其他结构实现,在此不再一一描述。Of course, in other embodiments of the present invention, in addition to adjusting the distance between the two adjacent transfer heads 20 in each row through the transfer track 30, other structures can also be used, which will not be described here. a description.

上述实施例中,每一排的相邻两转印头20之间的间距可调,转印头20能够在所处排的延伸方向(即图2的横向方向)上移动,在本发明的其他一些实施例中,可选的,不同排之间的转印头20之间的间距可调,即转印头20还能够在列方向上移动,以适用不同位置的转印任务和转印精度控制。In the above embodiment, the distance between two adjacent transfer heads 20 in each row is adjustable, and the transfer heads 20 can move in the extending direction of the row (ie, the lateral direction in FIG. 2 ). In some other embodiments, optionally, the spacing between the transfer heads 20 in different rows can be adjusted, that is, the transfer heads 20 can also be moved in the column direction, so as to be suitable for transfer tasks and transfer in different positions. Precision control.

为了实现不同排之间的转印头20之间的间距可调,请参考图2,本发明实施例中,可选的,所述转印设备还包括:变轨轨道40,所述变轨轨道40的延伸方向与所述转印轨道30的延伸方向垂直(图2中,转印轨道30沿横向方向延伸,变轨轨道40沿纵向方向延伸),所述转印轨道30可移动地设置于所述变轨轨道40上,通过移动转印轨道30,可以调整不同排的转印头20之间的间距,以制作目标器件的列间距不同的多种类型的目标基板。In order to realize the adjustable spacing between the transfer heads 20 between different rows, please refer to FIG. 2 , in the embodiment of the present invention, optionally, the transfer device further includes: a track change track 40 , the track change track The extension direction of the rail 40 is perpendicular to the extension direction of the transfer rail 30 (in FIG. 2 , the transfer rail 30 extends in the transverse direction, and the track change rail 40 extends in the longitudinal direction), and the transfer rail 30 is movably arranged On the track changing track 40 , by moving the transfer track 30 , the spacing between the transfer heads 20 in different rows can be adjusted to manufacture various types of target substrates with different column spacings of the target devices.

本发明实施例中,如图2所示,可选的,所述转印设备包括两条变轨轨道40,分别位于所述转印轨道30的两端,所述转印轨道30上具有与所述变轨轨道40配合的部件,以能够固定在所述变轨轨道40上,并沿着所述变轨轨道40移动。In the embodiment of the present invention, as shown in FIG. 2 , optionally, the transfer device includes two track-changing rails 40 , which are respectively located at both ends of the transfer rail 30 . The matched components of the track change track 40 can be fixed on the track change track 40 and move along the track change track 40 .

以μLED的LED巨量转移为例,对于转印的良率要求极高,因此如果无法对于转印的目标器件进行及时的测试,将大大影响产品的品质。因而,本发明实施例中,可选的,所述转印设备还包括:电学测试头(图未示出),设置于承载基板10上,用于将外部的电学测试工具和所述目标基板上的目标器件连通。本发明实施例中,可选的,所述电学测试头可以设置于每一所述转印轨道30的两端或所述变轨轨道40上。举例来说,假如电学测试头设置于每一所述转印轨道30的两端,当转印轨道30上的多个转印头20将抓取的目标器件转印至目标基板上时,转印轨道30两端的电学测试头与目标基板上的由该转印轨道30上的转印头20转印的目标器件电连接,此时不撤离所述转印设备,将该转印轨道30上的电学测试头与外部的电学测试工具电连接,从而将外部的电学测试工具和所述目标基板上的测试点连通,测试点与目标基板上的目标器件连接,通过电学测试工具向电学测试头输入电信号,点亮由该转印轨道30上的转印头20转印的目标器件,并查看转印效果,测量出不良的目标器件(即坏点)。该种结构可以在转印完之后立刻对转印的目标器件进行测试,以确保目标器件转移成功率,测试及时,且工序简单。Taking the mass transfer of LEDs of μLED as an example, the yield of transfer printing is extremely high, so if the target device for transfer cannot be tested in time, it will greatly affect the quality of the product. Therefore, in this embodiment of the present invention, optionally, the transfer device further includes: an electrical test head (not shown in the figure) disposed on the carrier substrate 10 for connecting an external electrical test tool to the target substrate connected to the target device on . In the embodiment of the present invention, optionally, the electrical test head may be disposed on both ends of each transfer track 30 or on the track change track 40 . For example, if the electrical test heads are arranged at both ends of each of the transfer tracks 30, when the plurality of transfer heads 20 on the transfer track 30 transfer the captured target device to the target substrate, the The electrical test heads at both ends of the print track 30 are electrically connected to the target device on the target substrate to be transferred by the transfer head 20 on the transfer track 30. The electrical test head is electrically connected with an external electrical test tool, thereby connecting the external electrical test tool with the test point on the target substrate, the test point is connected with the target device on the target substrate, and the electrical test head is connected to the electrical test head through the electrical test tool. An electrical signal is input, the target device transferred by the transfer head 20 on the transfer track 30 is lit, and the transfer effect is checked, and the defective target device (ie, dead pixel) is measured. With this structure, the transferred target device can be tested immediately after the transfer, so as to ensure the transfer success rate of the target device, the test is timely, and the process is simple.

本发明实施例中,可选的,所述转印设备还包括:In the embodiment of the present invention, optionally, the transfer device further includes:

多个光学感应器(图未示出),设置于所述转印头20上,与所述转印头20一一对应,即每一转印头20上具有一个光学感应器;A plurality of optical sensors (not shown) are disposed on the transfer head 20 and correspond to the transfer heads 20 one-to-one, that is, each transfer head 20 has one optical sensor;

处理器(图未示出),与所述光学感应器连接,用于根据所述光学感应器传输的感应信号,确定不良的目标器件的位置。A processor (not shown in the figure), connected to the optical sensor, is used for determining the position of the defective target device according to the sensing signal transmitted by the optical sensor.

本发明实施例中当转印轨道30上的多个转印头20将抓取的目标器件转印至目标基板上时,此时不撤离所述转印设备,对转印的目标器件通电,并通过转印头20上的光学感应器感应目标器件的光信号,光学感应器根据感应结果生成感应信号,并传输给处理器,如果某个目标器件不亮,或者亮度较低,处理器根据光学感应器的感应信号,确定该目标器件为不亮的目标器件,并根据光学感应器的位置,确定不良的目标器件的位置。In the embodiment of the present invention, when the plurality of transfer heads 20 on the transfer track 30 transfer the grabbed target device to the target substrate, the transfer device is not evacuated at this time, and the transferred target device is energized, And the optical sensor on the transfer head 20 senses the light signal of the target device, the optical sensor generates the sensing signal according to the sensing result, and transmits it to the processor, if a target device is not bright, or the brightness is low, the processor will The sensing signal of the optical sensor determines that the target device is a non-lighting target device, and according to the position of the optical sensor, the position of the bad target device is determined.

如果无法对于转印的不良的目标器件进行及时的修复,也将大大影响产品的品质。因而,可选的,请参考图2,本发明实施例中的转印设备还包括:设置于所述承载基板10上的多个修复(Repair)头50,所述多个修复头50呈阵列方式排布,所述修复头50用于对转印至所述目标基板上的不良的目标器件进行修复。If the defective target device cannot be repaired in time, it will greatly affect the quality of the product. Therefore, optionally, please refer to FIG. 2 , the transfer apparatus in the embodiment of the present invention further includes: a plurality of repair heads 50 disposed on the carrier substrate 10 , and the plurality of repair heads 50 are arranged in an array The repairing head 50 is used for repairing the defective target device transferred onto the target substrate.

本发明实施例中,转印设备具有修复头,转印和修复可以连续完成,极大提升了转印的质量。In the embodiment of the present invention, the transfer device has a repair head, and the transfer and repair can be completed continuously, which greatly improves the quality of the transfer.

本发明实施例中,可选的,每一所述修复头50均可以独立控制伸缩。In this embodiment of the present invention, optionally, each repair head 50 can independently control the expansion and contraction.

本发明实施例中,承载基板10上的多个修复头50排成至少一排,每一排包括多个修复头50。优选地,所述多个修复头50排成多排,从而可以采用多排修复头50同时对多个不良的目标器件进行修复,以进一步提高修复效率。In the embodiment of the present invention, the plurality of repair heads 50 on the carrier substrate 10 are arranged in at least one row, and each row includes a plurality of repair heads 50 . Preferably, the multiple repair heads 50 are arranged in multiple rows, so that multiple rows of repair heads 50 can be used to repair multiple defective target devices at the same time, so as to further improve the repair efficiency.

本发明实施例中,可选的,每一排的相邻两修复头50之间的间距可调,以能够修复目标器件的行间距不同的多种类型的目标基板,或者,修复目标器件呈不规则排布方式的目标基板。In the embodiment of the present invention, optionally, the distance between two adjacent repair heads 50 in each row is adjustable, so as to be able to repair various types of target substrates with different row distances of the target device, or, the repair target device is Irregularly arranged target substrates.

本发明实施例中,为了实现每一排的相邻两修复头50之间的间距可调,请参考图2,本发明实施例中,可选的,所述转印设备包括:至少一条修复轨道60,设置于所述承载基板10上,每一排所述修复头50设置于一条所述修复轨道60上,且所述修复头50可沿对应的所述修复轨道60移动。也就是说,修复头50与对应的修复轨道60是可移动的连接,所述修复头50上具有与所述修复轨道60配合的部件,以能够固定在所述修复轨道60上,并沿着所述修复轨道60移动。图2所示的实施例中,转印设备包括一条修复轨道60,每一修复轨道60上设置有多个修复头50,所述修复轨道60与转印轨道30平行设置,并设置于转印轨道30的后方(此处的后方是针对承载基板10在转印时的移动方向而言)。每一修复轨道60上的修复头50的个数可以等于或小于每一转印轨道30上的转印头20的个数。In the embodiment of the present invention, in order to realize the adjustable distance between two adjacent repair heads 50 in each row, please refer to FIG. 2 . In the embodiment of the present invention, optionally, the transfer device includes: at least one repair head The rails 60 are disposed on the carrier substrate 10 , each row of the repair heads 50 is disposed on one of the repair rails 60 , and the repair heads 50 can move along the corresponding repair rails 60 . That is to say, the repair head 50 is movably connected with the corresponding repair track 60 , and the repair head 50 has components matched with the repair track 60 so as to be able to be fixed on the repair track 60 and move along the repair track 60 . The repair track 60 moves. In the embodiment shown in FIG. 2 , the transfer device includes a repair track 60 , each repair track 60 is provided with a plurality of repair heads 50 , the repair track 60 is arranged in parallel with the transfer track 30 and is arranged on the transfer track 60 . The rear of the rail 30 (the rear here refers to the moving direction of the carrier substrate 10 during transfer). The number of repair heads 50 on each repair track 60 may be equal to or less than the number of transfer heads 20 on each transfer track 30 .

本发明实施例中,请参考图2,可选的,每一所述修复头50设置于修复轨道60上的指定位置,并且能够在指定移动范围内移动,指定移动范围可与转印头20指定移动范围一致。In the embodiment of the present invention, please refer to FIG. 2 . Optionally, each repair head 50 is arranged at a designated position on the repair track 60 and can move within a designated movement range, which can be matched with the transfer head 20 The specified movement range is the same.

本发明实施例中,可选的,所述修复轨道60同样可设置于所述变轨轨道40上,以根据需要实现修复头50在纵向上的移动。所述修复轨道60上具有与所述变轨轨道40配合的部件,以能够固定在所述变轨轨道40上,并沿着所述变轨轨道40移动。本发明实施例中,在确认不良的目标器件的位置之后,可以将承载基板10前移(前移是相对承载基板10转印时的移动方向而言),使得修复轨道60正对不良的目标器件的位置上方,然后对不良的目标器件进行修复,对于同一行上的多个不良的目标器件,只要一次就可以完成修复,提高了修复效率。在修复的同时,还可以使用转印轨道30上的转印头20同时进行下一次的转印,以提高工作效率。In the embodiment of the present invention, optionally, the repair track 60 may also be disposed on the track change track 40, so as to realize the longitudinal movement of the repair head 50 as required. The repairing rail 60 has components matched with the rail changing rail 40 to be able to be fixed on the rail changing rail 40 and move along the rail changing rail 40 . In the embodiment of the present invention, after confirming the position of the defective target device, the carrier substrate 10 can be moved forward (the forward movement is relative to the moving direction of the carrier substrate 10 during transfer), so that the repair track 60 is facing the defective target The position of the device is above the position of the device, and then the defective target device is repaired. For multiple defective target devices on the same row, the repair can be completed only once, which improves the repair efficiency. While repairing, the transfer head 20 on the transfer track 30 can also be used to perform the next transfer at the same time, so as to improve the work efficiency.

本发明实施例中,请参考图4,可选的,所述修复头50包括:补充头51和解离头52,所述解离头52用于解离所述目标基板上的不良的目标器件,所述补充头51用于向所述目标基板上的不良的目标器件所在位置补充目标器件。所述解离头51可以通过高温、紫外线或激光等方式处理不良的目标器件,然后采用吸附的方式将处理后的目标器件取走。修复时,可以先采用补充头51抓取待补充的目标器件,控制修复头50移动至不良的目标器件所在位置,通过解离头52解离所述目标基板上的不良的目标器件,最后通过补充头51在相同的位置补充新的目标器件。图4仅是本发明一实施例的修复头的结构,当然,在本发明的其他一些实施例中,修复头也可以为其他结构。例如,所述修复头50只包括解离头52,并不包括补充头51,而是通过转印轨道上的转印头20对解离后的目标器件的位置补充新的目标器件。请参考图5,图5所述的实施例中,对于目标基板100上的不良的目标器件101(虚线圆框框住的目标器件),可以采用转印轨道30上的对应位置的转印头20(虚线圆框框住的转印头)补充新的目标器件。In the embodiment of the present invention, please refer to FIG. 4 , optionally, the repair head 50 includes: a supplementary head 51 and a dissociation head 52 , and the dissociation head 52 is used for dissociating defective target devices on the target substrate , the replenishing head 51 is used to replenish the target device at the position of the defective target device on the target substrate. The dissociation head 51 can process the defective target device by means of high temperature, ultraviolet light or laser, etc., and then remove the processed target device by means of adsorption. When repairing, the replenishing head 51 can be used to grab the target device to be replenished, control the repairing head 50 to move to the position of the defective target device, dissociate the defective target device on the target substrate through the dissociation head 52, and finally pass The replenishment head 51 replenishes a new target device at the same position. FIG. 4 is only the structure of the repair head according to an embodiment of the present invention. Of course, in some other embodiments of the present invention, the repair head may also have other structures. For example, the repair head 50 only includes the dissociation head 52 and does not include the replenishment head 51, but the position of the dissociated target device is supplemented with new target devices by the transfer head 20 on the transfer track. Please refer to FIG. 5 . In the embodiment described in FIG. 5 , for the defective target device 101 on the target substrate 100 (the target device framed by the dotted circle), the transfer head 20 at the corresponding position on the transfer track 30 can be used. (Transfer head framed by dotted circle) Replenish new target device.

本发明实施例中,在进行修复时,可以控制一排修复头同时抓取多个目标器件,然后仅采用个别修复头进行修复,其他不需要修复的位置的目标器件留着后续修复使用,从而可以减少取件次数,提高工作效率。当然,如果修复轨道上抓取的目标器件不足以完成下一次的修复,可以将承载基板移动至用于放置待转印的目标器件的区域,进行目标器件的补充抓取。In the embodiment of the present invention, during repairing, a row of repairing heads can be controlled to grab multiple target devices at the same time, and then only individual repairing heads are used for repairing, and other target devices in positions that do not need repairing are reserved for subsequent repairing, so that It can reduce the number of pickups and improve work efficiency. Of course, if the target device grasped on the repair track is not enough to complete the next repair, the carrier substrate can be moved to the area for placing the target device to be transferred to perform supplementary grasping of the target device.

本发明实施例中,在进行修复时,当具有多排修复头时,可以控制前排的修复头进行目标器件的解离,后排的修复头进行目标器件的补充,从而同时完成两行的解离和补充动作,提高工作效率。In the embodiment of the present invention, when repairing is performed, when there are multiple rows of repairing heads, the repairing heads in the front row can be controlled to dissociate the target device, and the repairing heads in the rear row are used to supplement the target device, so that two rows of repairing heads can be completed at the same time. Dissociate and replenish movements to improve work efficiency.

请参考图6,本发明实施例的转印设备还可以包括:机台基座200,所述基台基座200上包括用于放置待转印的目标器件的第一区域201和用于放置目标基板100的第二区域202。Referring to FIG. 6 , the transfer apparatus according to the embodiment of the present invention may further include: a machine base 200 , and the base base 200 includes a first area 201 for placing the target device to be transferred and a first area 201 for placing the target device to be transferred. The second region 202 of the target substrate 100 .

请参考图1和图6,本发明实施例的转印设备还可以包括:运输轨道70,所述承载基板10设置于所述运输轨道70上,并能够在所述运输轨道70上移动,从而使得承载基板10可以在基台基座200的第一区域201上方以及第二区域202上方来回移动,完成目标器件的抓取和转印。另外,可选的,所述转印设备还包括:伸缩轴80,所述承载基板10通过所述伸缩轴80设置于所述运输轨道70上,所述伸缩轴80能够上下伸缩,从而在进行目标器件的抓取或转印时,控制承载基板10向上或向下移动。Please refer to FIG. 1 and FIG. 6 , the transfer apparatus according to the embodiment of the present invention may further include: a transport rail 70 , and the carrier substrate 10 is disposed on the transport rail 70 and can move on the transport rail 70 , thereby The carrier substrate 10 can be moved back and forth above the first area 201 and the second area 202 of the submount base 200 to complete the grabbing and transfer of the target device. In addition, optionally, the transfer device further includes: a telescopic shaft 80 , the carrier substrate 10 is disposed on the transport track 70 through the telescopic shaft 80 , and the telescopic shaft 80 can be stretched up and down, so that the When the target device is grasped or transferred, the carrier substrate 10 is controlled to move upward or downward.

请参考图7,本发明实施例还提供一种转印方法,应用于上述任一实施例中所述的转印设备,所述转印方法包括:Referring to FIG. 7 , an embodiment of the present invention further provides a transfer method, which is applied to the transfer device described in any of the above embodiments, and the transfer method includes:

步骤701:从用于放置待转印的目标器件的区域抓取多个待转印的目标器件;Step 701: Grab a plurality of target devices to be transferred from the area for placing the target devices to be transferred;

步骤702:将抓取的多个待转印的目标器件同时转印至目标基板。Step 702: Transfer the grabbed multiple target devices to be transferred to the target substrate at the same time.

可选的,本发明实施例中的转印设备包括:电学测试头,设置于每一所述转印轨道的两端或所述变轨轨道上,用于将外部的电学测试工具和所述目标基板上的测试点连通。Optionally, the transfer device in the embodiment of the present invention includes: an electrical test head, which is arranged at both ends of each of the transfer tracks or on the track changing track, and is used to connect an external electrical test tool to the track. The test points on the target substrate are connected.

所述将抓取的多个待转印的目标器件同时转印至目标基板之后还包括:After transferring the grabbed multiple target devices to be transferred to the target substrate at the same time, the method further includes:

步骤703:通过电学测试头将外部的电学测试工具和所述目标基板上的测试点连通;Step 703: Connect an external electrical test tool with the test point on the target substrate through the electrical test head;

步骤704:通过所述电学测试工具,向转印至所述目标基板的目标器件通电,以确定所述目标器件是否不良。Step 704: Power on the target device transferred to the target substrate by using the electrical testing tool to determine whether the target device is defective.

可选的,本发明实施例中的转印设备包括:设置于所述承载基板上的多个修复头,所述多个修复头呈阵列方式排布,所述修复头用于对转印至所述目标基板上的不良的目标器件进行修复。Optionally, the transfer device in the embodiment of the present invention includes: a plurality of repair heads disposed on the carrier substrate, the plurality of repair heads are arranged in an array, and the repair heads are used for Defective target devices on the target substrate are repaired.

所述将抓取的多个待转印的目标器件同时转印至目标基板之后还包括:After transferring the grabbed multiple target devices to be transferred to the target substrate at the same time, the method further includes:

步骤705:将所述修复头移动至不良的目标器件对应的位置;Step 705: Move the repair head to a position corresponding to the defective target device;

步骤706:采用所述修复头取下所述不良的目标器件;Step 706: use the repair head to remove the defective target device;

步骤707:采用所述修复头抓取待补充的目标器件,并转印至所述不良的目标器件所在位置。Step 707: Use the repair head to grab the target device to be replenished, and transfer it to the location where the defective target device is located.

在本发明的其他一些实施例中,也可以采用转印头抓取待补充的目标器件,并转印至所述不良的目标器件所在位置。In some other embodiments of the present invention, the transfer head may also be used to grab the target device to be replenished, and transfer the target device to the location where the defective target device is located.

本发明实施例中,所述转印方法还可以包括:在采用修复头修复目标器件的同时,采用转印头进行下一次的转印,从而提高工作效率。In the embodiment of the present invention, the transfer method may further include: while using the repair head to repair the target device, using the transfer head to perform the next transfer, thereby improving work efficiency.

本发明实施例中,所述采用所述修复头抓取待补充的目标器件,并转印至所述不良的目标器件所在位置可以包括:控制一排修复头同时抓取多个目标器件,然后仅采用个别修复头进行修复,其他不需要修复的位置的目标器件留着后续修复使用,从而可以减少取件次数,提高工作效率。当然,如果修复轨道上抓取的目标器件不足以完成下一次的修复,可以将承载基板移动至用于放置待转印的目标器件的区域,进行目标器件的补充抓取。In the embodiment of the present invention, the step of using the repair head to grab the target device to be replenished and transfer it to the location of the defective target device may include: controlling a row of repair heads to grab a plurality of target devices at the same time, and then Only individual repair heads are used for repair, and other target devices in positions that do not need repair are reserved for subsequent repair, thereby reducing the number of pickups and improving work efficiency. Of course, if the target device grasped on the repair track is not enough to complete the next repair, the carrier substrate can be moved to the area for placing the target device to be transferred to perform supplementary grasping of the target device.

本发明实施例中,所述采用所述修复头取下所述不良的目标器件可以包括:控制前排的修复头进行目标器件的解离,后排的修复头进行目标器件的补充,从而同时完成两行的解离和补充动作,提高工作效率。In the embodiment of the present invention, using the repair head to remove the defective target device may include: controlling the repair head in the front row to dissociate the target device, and the repair head in the rear row to supplement the target device, so that at the same time Complete two lines of dissociation and replenishment actions to improve work efficiency.

本发明的上述实施例中,目标器件可以为Micro-LED或者mini-LED。In the above embodiments of the present invention, the target device may be a Micro-LED or a mini-LED.

除非另作定义,本发明中使用的技术术语或者科学术语应当为本发明所属领域内具有一般技能的人士所理解的通常意义。本发明中使用的“第一”、“第二”以及类似的词语并不表示任何顺序、数量或者重要性,而只是用来区分不同的组成部分。“连接”或者“相连”等类似的词语并非限定于物理的或者机械的连接,而是可以包括电性的连接,不管是直接的还是间接的。“上”、“下”、“左”、“右”等仅用于表示相对位置关系,当被描述对象的绝对位置改变后,则该相对位置关系也相应地改变。Unless otherwise defined, technical or scientific terms used in the present invention should have the ordinary meaning as understood by those of ordinary skill in the art to which the present invention belongs. The terms "first," "second," and similar terms used herein do not denote any order, quantity, or importance, but are merely used to distinguish different components. Words like "connected" or "connected" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "Down", "Left", "Right", etc. are only used to represent the relative positional relationship, and when the absolute position of the described object changes, the relative positional relationship also changes accordingly.

以上所述是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员来说,在不脱离本发明所述原理的前提下,还可以作出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围。The above are the preferred embodiments of the present invention. It should be pointed out that for those skilled in the art, without departing from the principles of the present invention, several improvements and modifications can be made. It should be regarded as the protection scope of the present invention.

Claims (5)

1. A transfer apparatus, characterized by comprising:
a carrier substrate;
the transfer printing heads are arranged in an array mode and used for grabbing target devices to be transferred and transferring the target devices to be transferred to a target substrate;
the plurality of transfer heads are arranged in at least one row;
the transfer apparatus further includes:
at least one transfer printing track arranged on the bearing substrate, wherein each row of transfer printing heads is arranged on one transfer printing track and can move along the corresponding transfer printing track;
the extension direction of the orbital transfer is perpendicular to that of the transfer printing track, and the transfer printing track is movably arranged on the orbital transfer;
the electrical test heads are arranged at two ends of each transfer printing track or on the track transfer tracks and are used for communicating an electrical test tool outside the transfer printing equipment with the test points on the target substrate;
the optical sensors are arranged on the transfer printing heads and correspond to the transfer printing heads one by one;
and the processor is connected with the optical sensor and used for determining the position of a bad target device according to the sensing signal transmitted by the optical sensor, wherein the sensing signal is used for representing the brightness information of the target device.
2. The transfer apparatus according to claim 1, further comprising:
the repair heads are arranged on the bearing substrate in an array mode and used for repairing bad target devices transferred to the target substrate.
3. The transfer apparatus according to claim 2,
the plurality of repair heads are arranged in at least one row;
the transfer apparatus further includes:
at least one repair track is arranged on the orbital transfer track, each row of repair heads is arranged on one repair track, and the repair heads can move along the corresponding repair tracks.
4. A transfer method applied to the transfer apparatus according to any one of claims 1 to 3, the transfer method comprising:
grabbing a plurality of target devices to be transferred from an area for placing the target devices to be transferred;
simultaneously transferring the plurality of grabbed target devices to be transferred to a target substrate;
after the plurality of grabbed target devices to be transferred are transferred to the target substrate at the same time, the method further comprises the following steps:
communicating an external electrical test tool with the test point on the target substrate through an electrical test head;
energizing, by the electrical test tool, a target device transferred to the target substrate to determine whether the target device is defective.
5. The transfer method according to claim 4, applied to the transfer apparatus according to claim 2 or 3, further comprising, after simultaneously transferring the plurality of target devices to be transferred that are grasped to the target substrate:
moving the repairing head to a position corresponding to the bad target device;
removing the bad target device by using the repairing head;
and grabbing a target device to be supplemented by adopting the repairing head, and transferring the target device to the position of the bad target device.
CN201910554526.7A 2019-06-25 2019-06-25 Transfer apparatus and transfer method Active CN110246785B (en)

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