CN110658393A - Comprehensive evaluation method for accelerated life of electronic control device - Google Patents
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Abstract
The invention discloses a comprehensive evaluation method for accelerated life of an electronic control device, which comprises the following steps: determining the type of sensitive stress affecting the electronic control device based on the operating environment and the operating mode of the electronic control device; executing a reliability strengthening test which mainly takes sensitive stress as a main test on the electronic control device, and determining the working limit of the sensitive stress; according to the working limit of the sensitive stress, carrying out a comprehensive stress accelerated life test on the electronic control device, and evaluating the service life of the electronic control device under the comprehensive stress; according to the working limit of the sensitive stress, carrying out a single stress accelerated life test on the electronic control device, and evaluating the service life of the electronic control device under the single stress; and determining the comprehensive service life evaluation result of the electronic control device based on the competition failure model according to the service life evaluation results of the electronic control device under the comprehensive stress and under the single stress.
Description
Technical Field
The invention relates to the technical field of service life evaluation, in particular to a comprehensive evaluation method for the accelerated service life of a rail transit electronic control device based on competition failure.
Background
The rail transit electronic control device is used as a vehicle-mounted device integrating functions of control, network communication, fault diagnosis and the like, and the service life and the reliability of the rail transit electronic control device are important for the stability and the reliability of a train network system. The service life index of the current rail transit electronic control device is mostly estimated according to the subjective experience of designers, and effective test evaluation and verification are lacked. Because the actual service life information of the product is not well known, the establishment of the maintenance period of the product is not reasonable easily, so that the product is overhauled excessively due to the excessively short establishment of the maintenance period, or the field failure rate of the product is overhigh due to the excessively long establishment of the maintenance period.
With the continuous improvement of the rail transit technology level, the service life assessment of the rail transit electronic control device faces a difficult assessment problem with high reliability and long service life. If evaluated according to conventional field life testing techniques, it is difficult to do so in a feasible time. The accelerated life test can be used for extrapolating the product life characteristic under the normal stress level by utilizing the product life characteristic under the high accelerated stress level on the premise of not changing the product failure mechanism, so that the rapid evaluation of the product life is realized. However, the conventional accelerated life test can only realize the product life evaluation of a single environmental stress (such as temperature and the like), and cannot simulate the working conditions of various environmental stresses (such as temperature, vibration, humidity and the like) borne by the rail transit electronic control device on the spot, so that the life evaluation of the rail transit electronic control device under the multi-stress condition cannot be realized.
Therefore, a comprehensive evaluation method for comprehensively evaluating the accelerated life of the electronic control device of the rail transit under various environmental stresses (such as temperature, humidity, vibration and the like) on site is needed.
Disclosure of Invention
Aiming at the problems, the invention provides a comprehensive evaluation method of the accelerated life of an electronic control device based on competition failure, which can be applied to the technical field of rail transit, and mainly comprises the following steps:
s10, determining the type of sensitive stress influencing the reliability and the service life of the electronic control device based on the operating environment and the working mode of the electronic control device;
s20, executing reliability strengthening test mainly based on the sensitive stress on the electronic control device, and determining the working limit of the sensitive stress;
s30, carrying out a comprehensive stress accelerated life test on the electronic control device according to the working limit of the sensitive stress, establishing a comprehensive stress accelerated life evaluation model, and evaluating the service life of the electronic control device under the comprehensive stress;
s40, carrying out a single stress accelerated life test on the electronic control device according to the working limit of the sensitive stress, establishing a single stress accelerated life evaluation model, and evaluating the life of the electronic control device under the single stress according to the single stress accelerated life evaluation model;
and S50, determining the comprehensive service life evaluation result of the electronic control device based on the competitive failure model according to the service life evaluation results of the electronic control device under the comprehensive stress and under the single stress.
According to one embodiment of the invention, the sensitive stresses mainly include temperature, humidity and vibration.
According to an embodiment of the present invention, in the step S20, the reliability enhancement test includes a low temperature step stress test, a high temperature step stress test, a rapid temperature cycle test, a humidity step stress test, and a vibration step stress test, which are sequentially performed and applied to the technical field of rail transit.
According to an embodiment of the present invention, in the step S30, the combined stress is a temperature and humidity combined stress.
According to one embodiment of the present invention, the following Peck model is preferably adopted as the comprehensive stress accelerated life evaluation model:
in the above formula, L is the product life, RH is the relative humidity, T is the thermodynamic absolute temperature, and k is the Boltzmann constant 8.6171 × 10-5eV/K，EaFor activation energy, A and η are constants.
According to one embodiment of the present invention, the parameters of the integrated stress-accelerated life assessment model are determined from experimental data, preferably using maximum likelihood estimation.
According to an embodiment of the present invention, in the step S40, the single stress is a vibration stress.
According to one embodiment of the present invention, the following acceleration model simulating a long-life random vibration pattern scheme in GB/T21563-2008 is preferably employed as the single stress acceleration life evaluation model:
in the above formula, LsFor field working life, LtFailure time under stress for vibration test, AsFor field work acceleration, AtFor the test acceleration, m is a parameter in the model.
According to one embodiment of the invention, the value of the parameter m is determined from empirical data of a model test history of the rail transit rolling stock installation.
According to an embodiment of the invention, the sensitive stress may further comprise electrical stress.
Compared with the prior art, the invention at least has the following advantages:
1. the comprehensive evaluation method for the accelerated life of the rail transit electronic control device under various field environmental stresses (such as temperature, humidity, vibration and the like) based on the competitive failure principle is innovatively provided.
2. And a reliability strengthening test in a research and development stage is used as a pre-test for an accelerated life test to verify the sensitive stress type and the working limit of the product.
3. And aiming at the temperature and humidity acceleration model, linear mathematical processing is adopted, so that the solving difficulty of unknown parameters of the acceleration model is simplified.
4. The test scheme adopts a form of accelerated life test, and can greatly reduce the test time and the cost investment by improving the stress level of the test.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
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The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention.
FIG. 1 is a flow chart of a method for comprehensively evaluating accelerated life of an electronic control device according to an embodiment of the invention;
fig. 2 is a flowchart of a reliability enhancement test item in the accelerated lifetime comprehensive evaluation method for an electronic control device according to an embodiment of the present invention.
Detailed Description
The following detailed description of the embodiments of the present invention will be provided with reference to the drawings and examples, so that how to apply the technical means to solve the technical problems and achieve the technical effects can be fully understood and implemented. It should be noted that, as long as there is no conflict, the embodiments and the features of the embodiments of the present invention may be combined with each other, and the technical solutions formed are within the scope of the present invention.
In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced without some of these specific details or with other methods described herein.
Fig. 1 is a flowchart of a method for comprehensively evaluating accelerated life of an electronic control device according to an embodiment of the present invention, and the operation principle of the present invention is described in detail below with reference to fig. 1.
Firstly, determining sensitive stress types influencing the service life and reliability of a product based on the on-site operating environment and the working mode of an electronic control device; secondly, determining the working limit of the sensitive stress of the electronic control device by using a pre-test (also called a reliability strengthening test); then, respectively determining an acceleration test scheme and a service life evaluation result of the electronic control device based on the temperature and humidity comprehensive stress, and an acceleration test scheme and a service life evaluation result based on the vibration single stress based on a pre-test result, an acceleration model and test data; and finally, obtaining a comprehensive service life evaluation result of the electronic control device under the field operation environment based on a competitive failure model according to the service life evaluation results of the electronic control device under the temperature and humidity comprehensive stress and the vibration single stress.
The specific implementation process is as follows:
the method comprises the following steps: and (5) sensitive stress analysis. According to the information of the electronic control device such as the on-site operation environment, the storage environment, the working mode and the like, the sensitive stress type influencing the service life and the reliability of the electronic control device can be determined through analysis.
Specifically, the rail transit electronic control device experiences the following environment during the life cycle of field work:
1) ground transportation and storage environment: subjected to vibration and impact during ground transportation, and subjected to temperature and humidity during storage.
2) Mechanical environment: vibration, impact, noise and acceleration generated when the train is accelerated to start and decelerated to stop, high-temperature, low-temperature, high-humidity and rapid temperature change environments and the like.
3) Working environment of normal operation: noise generated in the normal and stable running process of the train, electric stress such as surge and pulse in a network control system, vibration and impact of the rail on the train and other environments.
4) And (3) inducing environment: magnetic devices on the train and an induced magnetic field generated by a current loop.
By analyzing the influence of the environmental conditions on the electronic control device, the influence of temperature, electrical stress, vibration and humidity on each component of the electronic control device can be found, and the electronic control device is the service life sensitive stress.
Step two: and determining the working limit. Under the condition that the electronic control device works when being electrified, an accelerated life test pre-test (also called as a reliability strengthening test) mainly comprising temperature stress, vibration stress and humidity stress is applied to the electronic control device, so that potential defects of the electronic control device can be excited, the working limit of life sensitive stress can be determined, and data support is provided for scheme design of a subsequent accelerated life test.
Specifically, in the preliminary test of the electronic control device, the stress application mode is mainly performed by a step stress mode, the test items are divided into 5 test items of a low-temperature step stress test, a high-temperature step stress test, a rapid temperature change cycle test, a humidity step test and a vibration step test, and the mutual relationship among the test items is shown in fig. 2.
Through the implementation of the pre-test items, the results of the working limits of the temperature, the humidity and the vibration stress of the electronic control device can be obtained.
Step three: accelerated life test scheme and life evaluation based on temperature and humidity comprehensive stress. According to the service life sensitive stress analysis and the pre-test result of the electronic control device, the accelerated service life test scheme design and service life evaluation of the temperature and humidity comprehensive stress are carried out aiming at the electronic control device.
In the acceleration test of the temperature and humidity comprehensive stress of the electronic control device, a Peck model is adopted as an acceleration model:
in the above formula, L is the product life, RH is the relative humidity, and T is the heating powerAbsolute temperature, k is Boltzmann constant 8.6171X 10-5eV/K，EaFor activation energy, A and η are constants.
Because each item in the formula (1) is in a multiplication relation, the mathematical computation is relatively complex, therefore, the logarithm can be taken on the left side and the right side of the formula, each item is changed into an addition-subtraction relation, and the parameter computation is convenient. After taking the logarithm of both sides, the results are as follows:
let lnA be alpha0，-η＝α1，
Equation (2) can be converted into:
3 unknown parameters (alpha) according to the estimated acceleration model0、α1、α2) The minimum number of stress levels required requires at least 3 sets of temperature humidity accelerated tests of different stress levels to be performed. Meanwhile, in order to ensure that the failure mechanism of the product is not changed in the accelerated test, the highest value of the test stress needs to be not beyond the working limit of the product.
Specifically, the service life estimated value of the electronic control device under each acceleration stress level i can be obtained through the accelerated service life test implementation of the temperature and humidity comprehensive stressThen, using maximum likelihood estimation, the parameter α can be obtained0，α1，α2Is estimated value of
Finally, a parameterized acceleration model of the electronic control unit is obtained as follows:
substituting the normal working temperature and humidity level of the electronic control device during field operation into the formula (4) to obtain the service life evaluation result L of the electronic control device based on the temperature and humidity comprehensive stressT+RH。
Step four: based on a vibration single stress accelerated life test scheme and life evaluation. According to the service life sensitive stress analysis and the pre-test result of the electronic control device, the design of a vibration single stress accelerated service life test scheme and service life evaluation are carried out aiming at the electronic control device.
The vibration single stress acceleration life test of the electronic control device adopts a simulation long-life random vibration test scheme in GB/T21563-:
in the above formula, LsFor field working life, LtFailure time under stress for vibration test, AsFor field work acceleration, AtThe acceleration was tested. m is a constant in the model (typical value is generally 3 to 9), and m is generally 4 according to a large amount of type test historical empirical data of rail transit locomotive equipment.
Finally, the electronic control unit is tested for acceleration AtFailure time under vibration test stress LtOn-site work acceleration AsSubstituting the formula (5) into the life evaluation result L of the electronic control device based on the vibration single stressS。
Step five: and comprehensively evaluating the accelerated life of the electronic control device based on the competition failure. According to the principle of the competitive failure model, the product is assumed to have n failure modes (n is more than 1), and the failure modes are numbered as 1, … and n respectively. When any one of the n failure modes occurs, the product fails, that is, the various failure modes are in a competitive failure relationship, and the product failure time L is the minimum time for the n failure modes to occur (L in the following formula)(i)Indicating the occurrence time of failure mode i (i ═ 1, …, n):
L＝min(L(1),…,L(n)) (6)
according to step three and step four, LT+RHFor the working life of the electronic control device under in situ temperature humidity stress, LSThe working life of the electronic control device under the field vibration stress is shown as L:
L＝min(LT+RH,LS)。 (7)
it should be noted that, although the embodiment of the present invention is described in detail with respect to the rail transit electronic control device, the method and the process for comprehensively evaluating the accelerated life based on the race failure in the present invention can be also applied to the comprehensive life evaluation of other types of electronic products. In addition, the execution sequence of the third step and the fourth step may not be limited to this, that is, the single stress accelerated life test may be performed first, and then the comprehensive stress accelerated life test may be performed. Moreover, when the sensitive stress type of other types of electronic products is one or more combinations of electrical stress, temperature-humidity stress, vibration stress, etc., the above-mentioned competitive failure model (e.g., equation 6) can also be used to evaluate the lifetime of the electronic product under one or more combinations of stresses.
Although the embodiments of the present invention have been described above, the above description is only for the convenience of understanding the present invention, and is not intended to limit the present invention. It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (10)
1. An accelerated life comprehensive evaluation method for an electronic control device comprises the following steps:
determining the type of sensitive stress influencing the reliability and the service life of the electronic control device based on the operating environment and the working mode of the electronic control device;
executing a reliability strengthening test which mainly takes the sensitive stress as a main test on an electronic control device, and determining the working limit of the sensitive stress;
carrying out a comprehensive stress accelerated life test on the electronic control device according to the working limit of the sensitive stress, establishing a comprehensive stress accelerated life evaluation model, and evaluating the service life of the electronic control device under the comprehensive stress;
according to the working limit of the sensitive stress, carrying out a single stress accelerated life test on the electronic control device, establishing a single stress accelerated life evaluation model, and evaluating the service life of the electronic control device under the single stress;
and determining the comprehensive service life evaluation result of the electronic control device based on the competition failure model according to the service life evaluation results of the electronic control device under the comprehensive stress and under the single stress.
2. The method for comprehensively evaluating accelerated life of an electronic control device according to claim 1, wherein the sensitive stress includes temperature, humidity and vibration.
3. The accelerated lifetime comprehensive evaluation method of an electronic control device according to claim 1, characterized in that: the reliability strengthening test comprises a low-temperature stepping stress test, a high-temperature stepping stress test, a rapid temperature cycle test, a humidity stepping stress test and a vibration stepping stress test which are sequentially executed and applied to the technical field of rail transit.
4. The accelerated lifetime comprehensive evaluation method of an electronic control apparatus according to claim 3, characterized in that: the comprehensive stress is temperature and humidity comprehensive stress.
5. The integrated evaluation method for accelerated life of an electronic control device according to claim 4, characterized in that the following Peck model is adopted as the integrated stress accelerated life evaluation model:
in the above formula, L is the product life, RH is the relative humidity, T is the thermodynamic absolute temperature, and k is the Boltzmann constant 8.6171 × 10-5eV/K，EaFor activation energy, A and η are constants.
6. The accelerated lifetime integrated evaluation method of an electronic control apparatus according to claim 5,
and determining parameters of the comprehensive stress accelerated life evaluation model according to test data by using a maximum likelihood estimation method.
7. The integrated evaluation method for accelerated life of an electronic control device according to claim 3, wherein the single stress is a vibration stress.
8. The integrated evaluation method for accelerated life of an electronic control device according to claim 7, characterized in that an acceleration model simulating a long-life random vibration pattern scheme in the following GB/T21563-2008 is adopted as the single stress accelerated life evaluation model:
in the above formula, LsFor field working life, LtFailure time under stress for vibration test, AsFor field work acceleration, AtFor the test acceleration, m is a parameter in the model.
9. The method for comprehensively evaluating accelerated life of an electronic control unit according to claim 8, wherein the value of the parameter m is determined based on empirical data of a model test history of a rail transit rolling stock facility.
10. The method for comprehensively evaluating accelerated life of an electronic control device according to claim 2, wherein the sensitive stress further includes an electrical stress.
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| CN114323427A (en) * | 2021-12-24 | 2022-04-12 | 中国电子科技集团公司第四十九研究所 | A multi-stress accelerated storage test method based on pressure sensor |
| CN114384365A (en) * | 2022-03-24 | 2022-04-22 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Methods, devices and equipment for determining the test plan for exposed product weaknesses |
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