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CN111403329B - A transfer method of micro-light-emitting diode, display panel and preparation method thereof - Google Patents

A transfer method of micro-light-emitting diode, display panel and preparation method thereof Download PDF

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CN111403329B
CN111403329B CN202010223663.5A CN202010223663A CN111403329B CN 111403329 B CN111403329 B CN 111403329B CN 202010223663 A CN202010223663 A CN 202010223663A CN 111403329 B CN111403329 B CN 111403329B
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CN111403329A (en
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孟虎
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BOE Technology Group Co Ltd
Beijing BOE Technology Development Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09FDISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • G09F9/33Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements being semiconductor devices, e.g. diodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H29/00Integrated devices, or assemblies of multiple devices, comprising at least one light-emitting semiconductor element covered by group H10H20/00
    • H10H29/10Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00
    • H10H29/14Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00 comprising multiple light-emitting semiconductor components
    • H10H29/142Two-dimensional arrangements, e.g. asymmetric LED layout
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68368Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used in a transfer process involving at least two transfer steps, i.e. including an intermediate handle substrate

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Abstract

The application discloses a micro light-emitting diode transfer method, a display panel and a preparation method of the display panel, which are used for improving the transfer efficiency of micro light-emitting diodes and avoiding damaging the micro light-emitting diodes. The embodiment of the application provides a micro light emitting diode transfer method, which comprises the following steps: forming a micro light emitting diode array on a substrate and forming a hydrogenated amorphous layer over the micro light emitting diodes; attaching the hydrogenated amorphous layer to a transfer substrate, and peeling the micro light-emitting diode array from the substrate; aligning and attaching the micro light emitting diode array of the transfer substrate with a target substrate; and adopting an annealing process to the hydrogenated amorphous layer so that the hydrogenated amorphous layer releases hydrogen and the transfer substrate is stripped.

Description

一种微发光二极管的转移方法、显示面板及其制备方法A transfer method of micro-light-emitting diode, display panel and preparation method thereof

技术领域technical field

本申请涉及显示技术领域,尤其涉及一种微发光二极管的转移方法、显示面板及其制备方法。The present application relates to the field of display technology, in particular to a method for transferring micro-light emitting diodes, a display panel and a preparation method thereof.

背景技术Background technique

近年来,微型发光二极管(Micro LED)作为一种新型的自发光型显示技术,获得了研究者的广泛关注。Micro LED显示与液晶显示(Liquid CrystalDisplay,LCD)相比,MicroLED结构更为简单,并且作为自发光技术,MicroLED显示在显示对比度、响应速度、色域、视角等方面优于LCD;Micro LED显示与有机发光二极管(OLED)显示相比,Micro led在亮度、效率、寿命方面具备一定优势。In recent years, micro light-emitting diodes (Micro LEDs), as a new type of self-illuminating display technology, have attracted extensive attention from researchers. Compared with Liquid Crystal Display (LCD), Micro LED display has a simpler structure, and as a self-luminous technology, Micro LED display is superior to LCD in terms of display contrast, response speed, color gamut, viewing angle, etc.; Micro LED display and Compared with organic light-emitting diode (OLED) display, Micro led has certain advantages in terms of brightness, efficiency, and lifespan.

目前的Micro LED技术中,关键的步骤是将Micro LED芯片从临时衬底转移到目标衬底上。现有技术中典型的工艺方法包括以下两种:一、利用传送设备对Micro LED进行拾取和放置;二、利用激光光束照射Micro LED进行剥离转移。第一种工艺需要通过调控传送设备与Micro LED之间的作用力的大小,进行Micro LED芯片的拾取和放置动作。第二中工艺则是利用激光束照射在释放层材料上,使得该材料与Micro LED之间的作用力减弱,实现剥离和转移的目的。但是,上述两种方法均存在一定的局限性,第一种方法的剥离和转移效率较低,且受到拾取设备的尺寸大小限制;第二种方法则存在激光光斑较大以及局部热量过高损伤Micro LED有源层,影响Micro LED发光效率的问题。In the current Micro LED technology, the key step is to transfer the Micro LED chip from the temporary substrate to the target substrate. Typical process methods in the prior art include the following two methods: 1. Micro LEDs are picked up and placed by transfer equipment; 2. Micro LEDs are irradiated with laser beams for peeling and transfer. The first process requires the pick-up and placement of Micro LED chips by adjusting the magnitude of the force between the transfer device and the Micro LED. The second process is to irradiate the release layer material with a laser beam, so that the force between the material and the Micro LED is weakened, and the purpose of peeling and transfer is achieved. However, the above two methods have certain limitations. The first method has low peeling and transfer efficiency, and is limited by the size of the pick-up equipment; the second method has a large laser spot and excessive local heat damage. The active layer of Micro LED affects the luminous efficiency of Micro LED.

综上,现有技术Micro LED转移工艺转移效率低,容易损伤Micro LED影响MicroLED发光效率。To sum up, the transfer efficiency of the existing Micro LED transfer process is low, and it is easy to damage the Micro LED and affect the luminous efficiency of the Micro LED.

发明内容Contents of the invention

本申请实施例提供了一种微发光二极管的转移方法、显示面板及其制备方法,用以提高微发光二极管的转移效率,同时避免损伤微发光二极管。The embodiments of the present application provide a method for transferring micro-light emitting diodes, a display panel and a preparation method thereof, so as to improve the transfer efficiency of micro-light-emitting diodes and avoid damage to the micro-light-emitting diodes.

本申请实施例提供的一种微发光二极管的转移方法,所述方法包括:A method for transferring micro-light emitting diodes provided in an embodiment of the present application, the method comprising:

在衬底基板上形成微发光二极管阵列并在所述微发光二极管之上形成氢化非晶层;forming an array of micro light emitting diodes on the base substrate and forming a hydrogenated amorphous layer on the micro light emitting diodes;

将所述氢化非晶层与转移基板贴合,并将所述微发光二极管阵列从所述衬底基板剥离;bonding the hydrogenated amorphous layer to the transfer substrate, and peeling off the micro-LED array from the base substrate;

将所述转移基板的所述微发光二极管阵列与目标基板对准贴合;Aligning and attaching the micro-LED array on the transfer substrate to the target substrate;

对所述氢化非晶层采用退火工艺,以使所述氢化非晶层释放氢气,将所述转移基板剥离。An annealing process is applied to the hydrogenated amorphous layer, so that the hydrogenated amorphous layer releases hydrogen gas, and the transfer substrate is peeled off.

本申请实施例提供的微发光二极管的转移方法,在对微发光二极管进行第一次转移的过程中,转移基板不会受到衬底基板上的微发光二极管的尺寸、间距的限制,可以提高微发光二极管的转移效率,由于转移基板可以对任何尺寸的微发光二极管进行转移,从而转移基板可以反复多次利用,可以节省成本。并且,本申请实施例提供的微发光二极管的转移方法中,还在微发光二极管上设置有氢化非晶层,在对微发光二极管进行第一次转移的过程中,氢化非晶层与转移基板贴合,在将微发光二极管阵列与目标基板对准贴合之后,采用退火工艺便可以使得氢化非晶层释放氢气,以使氢化非晶层与转移基板分离,以实现微发光二极管从转移基板剥离,采用退火工艺而不是激光光束照射工艺从而可以避免激光光束对微发光二极管阵列造成损伤,可以保证微发光二极管的良率,从而提高微发光二极管的发光效率。In the transfer method of micro-light emitting diodes provided in the embodiment of the present application, in the process of transferring micro-light-emitting diodes for the first time, the transfer substrate will not be limited by the size and spacing of micro-light-emitting diodes on the base substrate, and the micro-light-emitting diodes can be improved. The transfer efficiency of light-emitting diodes, because the transfer substrate can transfer micro-light-emitting diodes of any size, so the transfer substrate can be used repeatedly, which can save costs. Moreover, in the transfer method of micro-light emitting diodes provided in the embodiment of the present application, a hydrogenated amorphous layer is also provided on the micro-light-emitting diodes. During the first transfer process of the micro-light-emitting diodes, the hydrogenated amorphous layer and the transfer substrate Bonding, after the micro-LED array is aligned and bonded to the target substrate, the hydrogenated amorphous layer can be released by annealing process to separate the hydrogenated amorphous layer from the transfer substrate, so that the micro-LEDs can be separated from the transfer substrate. For stripping, the annealing process is adopted instead of the laser beam irradiation process, so as to avoid the damage of the laser beam to the micro-LED array, ensure the yield rate of the micro-light-emitting diode, and thereby improve the luminous efficiency of the micro-light-emitting diode.

可选地,在衬底基板上形成微发光二极管阵列并在所述微发光二极管所述发光二极管之上形成氢化非晶层,具体包括:Optionally, forming an array of micro-light emitting diodes on the base substrate and forming a hydrogenated amorphous layer on the micro-light-emitting diodes and the light-emitting diodes, specifically includes:

在所述衬底基板之上形成所述微发光二极管各膜层;Forming each film layer of the micro light emitting diode on the base substrate;

在所述微发光二极管上采用等离子体增强化学气相沉积工艺沉积无机非晶材料,形成氢化非晶层;Depositing an inorganic amorphous material on the micro-light emitting diode by using a plasma-enhanced chemical vapor deposition process to form a hydrogenated amorphous layer;

对所述微发光二极管各膜层以及所述氢化非晶层采用图形化工艺,形成所述微发光二极管阵列以及所述氢化非晶层的图案。A patterning process is adopted for each film layer of the micro-light emitting diode and the hydrogenated amorphous layer to form patterns of the micro-light-emitting diode array and the hydrogenated amorphous layer.

可选地,在下列气体之一或其组合的环境采用等离子体增强化学气相沉积工艺沉积无机非晶材料:硅烷、氨气、氢气;Optionally, the inorganic amorphous material is deposited by a plasma-enhanced chemical vapor deposition process in an environment of one or a combination of the following gases: silane, ammonia, hydrogen;

所述无机非晶材料包括下列之一或其组合:氮化硅、氧化硅、氮氧化硅。The inorganic amorphous material includes one or a combination of the following: silicon nitride, silicon oxide, silicon oxynitride.

可选地,在衬底基板之上形成微发光二极管各膜层之前,所述方法还包括:Optionally, before forming each film layer of the micro-light-emitting diode on the base substrate, the method further includes:

在所述衬底基板之上形成缓冲层。A buffer layer is formed on the base substrate.

本申请实施例提供的微发光二极管转移方法,在微发光二极管各膜层与衬底基板之间设置有缓冲层,从而可以避免直接在衬底基板上外延生长微发光二极管各膜层出现的晶格失配的问题。In the micro-LED transfer method provided in the embodiment of the present application, a buffer layer is provided between the film layers of the micro-light-emitting diode and the base substrate, so as to avoid the crystallization of each film layer of the micro-light-emitting diode directly on the substrate. The problem of mismatch.

可选地,将所述氢化非晶层与所述转移基板贴合之前,所述方法还包括:Optionally, before attaching the hydrogenated amorphous layer to the transfer substrate, the method further includes:

在所述转移基板上形成键合层。A bonding layer is formed on the transfer substrate.

本申请实施例提供的微发光二极管转移方法,在转移基板上设置键合层,更有利于氢化非晶层与转移基板贴合。In the micro-LED transfer method provided in the embodiment of the present application, a bonding layer is provided on the transfer substrate, which is more conducive to bonding the hydrogenated amorphous layer to the transfer substrate.

可选地,将所述微发光二极管阵列从所述衬底基板剥离,具体包括:Optionally, peeling the micro-LED array from the base substrate specifically includes:

采用激光剥离工艺将所述衬底基板与所述微发光二极管剥离。The base substrate and the micro light emitting diodes are separated by a laser lift-off process.

可选地,将所述转移基板上的所述微发光二极管阵列与目标基板对准贴合之前,所述方法还包括:Optionally, before aligning and bonding the micro-LED array on the transfer substrate to the target substrate, the method further includes:

在所述目标基板上形成键合电极的图案;forming a pattern of bonding electrodes on the target substrate;

将所述转移基板上的所述微发光二极管阵列与所述目标基板对准贴合之后,所述方法还包括:After aligning and bonding the micro-LED array on the transfer substrate to the target substrate, the method further includes:

将所述微发光二极管阵列与所述键合电极焊接。Welding the micro light emitting diode array and the bonding electrodes.

可选地,对所述氢化非晶层采用退火工艺,具体包括:Optionally, an annealing process is used for the hydrogenated amorphous layer, which specifically includes:

在大于500℃的温度环境对所述氢化非晶层采用快速退火工艺。A rapid annealing process is adopted for the hydrogenated amorphous layer in a temperature environment greater than 500°C.

本申请实施例提供的一种显示面板的制备方法,所述方法包括:A method for preparing a display panel provided in an embodiment of the present application, the method comprising:

制备阵列基板;所述阵列基板包括多种颜色的子像素区;Prepare an array substrate; the array substrate includes sub-pixel regions of multiple colors;

采用本申请实施例提供的微发光二极管的转移方法将与所述子像素区颜色相对应的微发光二极管依次转移到所述阵列基板的所述子像素区。The micro-light-emitting diodes corresponding to the color of the sub-pixel area are sequentially transferred to the sub-pixel area of the array substrate by using the micro-light-emitting diode transfer method provided in the embodiment of the present application.

本申请实施例提供的一种显示面板,所述显示面板采用本申请实施例提供的显示面板制备方法制得。The embodiment of the present application provides a display panel, which is manufactured by using the method for preparing a display panel provided in the embodiment of the present application.

附图说明Description of drawings

为了更清楚地说明本申请实施例中的技术方案,下面将对实施例描述中所需要使用的附图作简要介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域的普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings that need to be used in the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For Those of ordinary skill in the art can also obtain other drawings based on these drawings without making creative efforts.

图1为本申请实施例提供的一种微发光二极管的转移方法的示意图;FIG. 1 is a schematic diagram of a method for transferring a micro-light emitting diode provided in an embodiment of the present application;

图2为本申请实施例提供的在500℃的温度环境进行退火的微发光二极管电流-电压曲线图;Fig. 2 is the current-voltage curve diagram of the micro light-emitting diode annealed in the temperature environment of 500 ℃ provided by the embodiment of the present application;

图3为本申请实施例提供的另一种微发光二极管的转移方法的示意图;FIG. 3 is a schematic diagram of another method for transferring micro-light emitting diodes provided in the embodiment of the present application;

图4为本申请实施例提供的一种显示面板制备方法的示意图。FIG. 4 is a schematic diagram of a method for manufacturing a display panel provided in an embodiment of the present application.

具体实施方式Detailed ways

本申请实施例提供了一种微发光二极管的转移方法,如图1所示,所述方法包括:The embodiment of the present application provides a method for transferring micro-light emitting diodes, as shown in Figure 1, the method includes:

S101、在衬底基板上形成微发光二极管阵列并在所述微发光二极管之上形成氢化非晶层;S101, forming an array of micro light emitting diodes on a base substrate and forming a hydrogenated amorphous layer on the micro light emitting diodes;

S102、将所述氢化非晶层与转移基板贴合,并将所述微发光二极管阵列从所述衬底基板剥离;S102, attaching the hydrogenated amorphous layer to the transfer substrate, and peeling off the micro light emitting diode array from the base substrate;

S103、将所述转移基板的所述微发光二极管阵列与目标基板对准贴合;S103. Align and attach the micro-LED array on the transfer substrate to the target substrate;

S104、对所述氢化非晶层采用退火工艺,以使所述氢化非晶层释放氢气,将所述转移基板剥离。S104. Using an annealing process on the hydrogenated amorphous layer, so that the hydrogenated amorphous layer releases hydrogen gas, and peels off the transfer substrate.

本申请实施例提供的微发光二极管的转移方法,除生长微发光二极管的衬底基板以及微发光二极管转移的目标基板外,还利用转移基板作为临时基板对衬底基板上的微发光二极管进行第一次转移,剥离衬底基板之后,对微发光二极管进行第二次转移,将微发光二极管阵列与目标基板对准贴合,再将微发光二极管从转移基板剥离。In the micro-LED transfer method provided in the embodiment of the present application, in addition to the base substrate for growing the micro-light-emitting diode and the target substrate for micro-light-emitting diode transfer, the transfer substrate is also used as a temporary substrate to carry out the first micro-light-emitting diode on the base substrate. In one transfer, after peeling off the base substrate, a second transfer is performed on the micro-light emitting diodes, aligning and bonding the micro-light-emitting diode arrays to the target substrate, and then peeling off the micro-light-emitting diodes from the transfer substrate.

本申请实施例提供的微发光二极管的转移方法,在对微发光二极管进行第一次转移的过程中,转移基板不会受到衬底基板上的微发光二极管的尺寸、间距的限制,可以提高微发光二极管的转移效率,由于转移基板可以对任何尺寸的微发光二极管进行转移,从而转移基板可以反复多次利用,可以节省成本。并且,本申请实施例提供的微发光二极管的转移方法中,还在微发光二极管上设置有氢化非晶层,在对微发光二极管进行第一次转移的过程中,氢化非晶层与转移基板贴合,在将微发光二极管阵列与目标基板对准贴合之后,采用退火工艺便可以使得氢化非晶层释放氢气,以使氢化非晶层与转移基板分离,以实现微发光二极管从转移基板剥离,采用退火工艺而不是激光光束照射工艺从而可以避免激光光束对微发光二极管阵列造成损伤,可以保证微发光二极管的良率,从而提高微发光二极管的发光效率。In the transfer method of micro-light emitting diodes provided in the embodiment of the present application, in the process of transferring micro-light-emitting diodes for the first time, the transfer substrate will not be limited by the size and spacing of micro-light-emitting diodes on the base substrate, and the micro-light-emitting diodes can be improved. The transfer efficiency of light-emitting diodes, because the transfer substrate can transfer micro-light-emitting diodes of any size, so the transfer substrate can be used repeatedly, which can save costs. Moreover, in the transfer method of micro-light emitting diodes provided in the embodiment of the present application, a hydrogenated amorphous layer is also provided on the micro-light-emitting diodes. During the first transfer process of the micro-light-emitting diodes, the hydrogenated amorphous layer and the transfer substrate Bonding, after the micro-LED array is aligned and bonded to the target substrate, the hydrogenated amorphous layer can be released by annealing process to separate the hydrogenated amorphous layer from the transfer substrate, so that the micro-LEDs can be separated from the transfer substrate. For stripping, the annealing process is adopted instead of the laser beam irradiation process, so as to avoid the damage of the laser beam to the micro-LED array, ensure the yield rate of the micro-light-emitting diode, and thereby improve the luminous efficiency of the micro-light-emitting diode.

可选地,步骤S101在衬底基板上形成微发光二极管阵列并在所述微发光二极管所述发光二极管之上形成氢化非晶层,具体包括:Optionally, step S101 forms a micro-LED array on the base substrate and forms a hydrogenated amorphous layer on the micro-LEDs and the light-emitting diodes, specifically including:

S1011、在所述衬底基板之上形成所述微发光二极管各膜层;S1011, forming each film layer of the micro light emitting diode on the base substrate;

S1012、在所述微发光二极管上采用等离子体增强化学气相沉积(PlasmaEnhancedChemical Vapor Deposition,PECVD)工艺沉积无机非晶材料,形成氢化非晶层;S1012. Depositing an inorganic amorphous material on the micro-LED by using a plasma enhanced chemical vapor deposition (PlasmaEnhanced Chemical Vapor Deposition, PECVD) process to form a hydrogenated amorphous layer;

S1013、对所述微发光二极管各膜层以及所述氢化非晶层采用图形化工艺,形成所述微发光二极管阵列以及所述氢化非晶层的图案。S1013. Using a patterning process on each film layer of the micro-LEDs and the hydrogenated amorphous layer to form a pattern of the micro-LED array and the hydrogenated amorphous layer.

可选地,在所述衬底基板之上形成所述微发光二极管各膜层具体包括:Optionally, forming each film layer of the micro light emitting diode on the base substrate specifically includes:

在衬底基板之上依次形成第一半导体层、有源层、第二半导体层以及第二电极层。A first semiconductor layer, an active layer, a second semiconductor layer and a second electrode layer are sequentially formed on the base substrate.

衬底基板例如可以是蓝宝石外延片。第二电极层的材料例如可以包括下列之一或其组合:镍(Ni)、金(Au)。有源层的材料例如可以包括多量子阱(MultipleQuantum Well,MQW)。此外,第一半导体层的材料例如可以包括n型氮化镓(n-GaN),第二半导体层的材料例如可以包括p型氮化镓(p-GaN)。The base substrate may be, for example, a sapphire epitaxial wafer. The material of the second electrode layer may include, for example, one of the following or a combination thereof: nickel (Ni), gold (Au). The material of the active layer may include multiple quantum wells (Multiple Quantum Well, MQW), for example. In addition, the material of the first semiconductor layer may include, for example, n-type gallium nitride (n-GaN), and the material of the second semiconductor layer may include, for example, p-type gallium nitride (p-GaN).

可选地,对所述微发光二极管各膜层以及所述氢化非晶层采用图形化工艺,形成所述微发光二极管阵列以及所述氢化非晶层的图案,具体包括:Optionally, a patterning process is used for each film layer of the micro-light emitting diodes and the hydrogenated amorphous layer to form the pattern of the micro-light-emitting diode array and the hydrogenated amorphous layer, which specifically includes:

在氢化非晶层上涂覆光刻胶,进行曝光、显影、刻蚀工艺,形成微发光二极管阵列以及氢化非晶层的图案;Coating photoresist on the hydrogenated amorphous layer, performing exposure, development, and etching processes to form micro-light-emitting diode arrays and patterns of the hydrogenated amorphous layer;

去除光刻胶。Remove photoresist.

可选地,在将氢化非晶从与转移基板贴合之前,所述方法还包括:Optionally, before attaching the hydrogenated amorphous material to the transfer substrate, the method further includes:

通过激光剥离工艺,对待转移微发光二极管之外区域的微发光二极管进行定点照射,去除待转移微发光二极管之外区域的微发光二极管。Through the laser lift-off process, the micro light emitting diodes in the area other than the micro light emitting diodes to be transferred are irradiated at fixed points, and the micro light emitting diodes in the area other than the micro light emitting diodes to be transferred are removed.

可选地,在下列气体之一或其组合的环境采用PECVD工艺沉积无机非晶材料:硅烷(SiH4)、氨气(NH3)、氢气(H2);Optionally, the inorganic amorphous material is deposited by PECVD in an environment of one or a combination of the following gases: silane (SiH 4 ), ammonia (NH 3 ), hydrogen (H 2 );

所述无机非晶材料包括下列之一或其组合:氮化硅(SiNx)、氧化硅(SiOx)、氮氧化硅(SiOxNy)。The inorganic amorphous material includes one or a combination of the following: silicon nitride (SiN x ), silicon oxide (SiO x ), silicon oxynitride (SiO x N y ).

在具体实施时,SiNx中的x的范围例如可以是1~1.3,SiOx中x的范围例如可以是1~2,SiOxNy中x的范围例如可以是1~2,y的范围例如可以是1~1.3。In specific implementation, the range of x in SiN x can be, for example, 1 to 1.3, the range of x in SiO x can be, for example, 1 to 2, the range of x in SiO x N y can be, for example, 1 to 2, and the range of y For example, it may be 1 to 1.3.

需要说明的是,采用PECVD工艺沉积的薄膜即为氢化非晶薄膜,本申请实施例形成的氢化非晶层例如可以是:氢化非晶氮化硅(a-SiNx:H),氢化非晶氧化硅(a-SiOx:H),氢化非晶氮氧化硅(a-SiON:H)。氢化的作用是钝化非晶材料中的悬挂键,使得其缺陷密度大大降低。以非晶材料为SiNx为例,PECVD工艺中的气体可以采用SiH4、NH3以及H2的混合气体,具体实施时可以通过改变H2在混合气体中的比例来调控H含量。例如,当需要沉积300纳米(nm)厚度的a-SiNx:H时,H2在混合气体中的比例范围可以是10%-30%。It should be noted that the film deposited by the PECVD process is a hydrogenated amorphous film. The hydrogenated amorphous layer formed in the embodiment of the present application can be, for example: hydrogenated amorphous silicon nitride (a-SiNx: H), hydrogenated amorphous oxide Silicon (a- SiOx :H), hydrogenated amorphous silicon oxynitride (a-SiON:H). The function of hydrogenation is to passivate the dangling bonds in the amorphous material, so that its defect density is greatly reduced. Taking the amorphous material as SiN x as an example, the gas in the PECVD process can be a mixed gas of SiH 4 , NH 3 and H 2 , and the H content can be regulated by changing the proportion of H 2 in the mixed gas during specific implementation. For example, when it is necessary to deposit a-SiN x :H with a thickness of 300 nanometers (nm), the ratio of H 2 in the mixed gas may range from 10% to 30%.

可选地,在衬底基板之上形成微发光二极管各膜层之前,所述方法还包括:Optionally, before forming each film layer of the micro-light-emitting diode on the base substrate, the method further includes:

在所述衬底基板之上形成缓冲层。A buffer layer is formed on the base substrate.

即缓冲层设置在衬底基板和第一电极之间。That is, the buffer layer is disposed between the base substrate and the first electrode.

本申请实施例提供的微发光二极管转移方法,在微发光二极管各膜层与衬底基板之间设置有缓冲层,从而可以避免直接在衬底基板上外延生长微发光二极管各膜层出现的晶格失配的问题。In the micro-LED transfer method provided in the embodiment of the present application, a buffer layer is provided between the film layers of the micro-light-emitting diode and the base substrate, so as to avoid the crystallization of each film layer of the micro-light-emitting diode directly on the substrate. The problem of mismatch.

在具体实施时,例如可以在蓝宝石衬底上外延生长微发光二极管各层之前,先低温生长的一层材料,例如可以生长厚度为20nm的GaN,或者生长厚度为50nm的氮化铝(AlN),之后进行退火工艺,形成缓冲层。也可以在蓝宝石衬底上通过磁控溅射工艺制备Ni/Au电极,经500度高温退火形成缓冲层;Ni的厚度例如可以是15nm,Au的厚度例如可以是1000nm。然后再在缓冲层上外延生长微发光二极管各膜层,从而可以避免微发光二极管各层的生长产生大的位错密度,可以获得较高晶格质量的微发光二极管器件的膜层。In specific implementation, for example, before each layer of the micro-light emitting diode is epitaxially grown on the sapphire substrate, a layer of material grown at low temperature, for example, GaN with a thickness of 20nm can be grown, or aluminum nitride (AlN) with a thickness of 50nm can be grown. , followed by an annealing process to form a buffer layer. Ni/Au electrodes can also be prepared on a sapphire substrate by a magnetron sputtering process, and a buffer layer can be formed by annealing at a high temperature of 500 degrees; the thickness of Ni can be, for example, 15nm, and the thickness of Au can be, for example, 1000nm. Then, each film layer of the micro-light emitting diode is epitaxially grown on the buffer layer, thereby avoiding a large dislocation density generated by the growth of each layer of the micro-light-emitting diode, and obtaining a film layer of a micro-light-emitting diode device with higher lattice quality.

可选地,步骤S103将所述氢化非晶层与所述转移基板贴合之前,所述方法还包括:Optionally, before step S103 bonding the hydrogenated amorphous layer to the transfer substrate, the method further includes:

在所述转移基板上形成键合层。A bonding layer is formed on the transfer substrate.

本申请实施例提供的微发光二极管转移方法,在转移基板上设置键合层,更有利于氢化非晶层与转移基板贴合。In the micro-LED transfer method provided in the embodiment of the present application, a bonding layer is provided on the transfer substrate, which is more conducive to bonding the hydrogenated amorphous layer to the transfer substrate.

具体实施时,转移基板例如可以是玻璃基板,键合层的材料例如可以是金属、聚酰亚胺(Polyimide,PI),异方性导电胶膜(Anisotropic Conductive Film,ACF),聚二甲基硅氧烷(Polydimethylsiloxane,PDMS)等材料,键合层优选耐高温材料。During specific implementation, the transfer substrate can be, for example, a glass substrate, and the material of the bonding layer can be, for example, metal, polyimide (Polyimide, PI), anisotropic conductive film (Anisotropic Conductive Film, ACF), polydimethyl Silicone (Polydimethylsiloxane, PDMS) and other materials, the bonding layer is preferably a high temperature resistant material.

本申请实施例提供的微发光二极管转移方法,转移基板上的键合层也无需进行图形化,这样转移基板不会受到衬底基板上的微发光二极管的尺寸、间距的限制,无需进行对位,可以提高微发光二极管的转移效率,并且,转移基板可以对任何尺寸的微发光二极管进行转移,即转移基板可以反复多次利用,从而可以节省成本。In the micro-LED transfer method provided in the embodiment of the present application, the bonding layer on the transfer substrate does not need to be patterned, so that the transfer substrate is not limited by the size and spacing of the micro-LEDs on the base substrate, and alignment is not required. , can improve the transfer efficiency of micro-light emitting diodes, and the transfer substrate can transfer micro-light-emitting diodes of any size, that is, the transfer substrate can be used repeatedly, thereby saving costs.

可选地,将所述微发光二极管阵列从所述衬底基板剥离,具体包括:Optionally, peeling the micro-LED array from the base substrate specifically includes:

采用激光剥离工艺将所述衬底基板与所述微发光二极管剥离。The base substrate and the micro light emitting diodes are separated by a laser lift-off process.

可选地,将所述转移基板上的所述微发光二极管阵列与目标基板对准贴合之前,所述方法还包括:Optionally, before aligning and bonding the micro-LED array on the transfer substrate to the target substrate, the method further includes:

在所述目标基板上形成键合电极的图案;forming a pattern of bonding electrodes on the target substrate;

将所述转移基板上的所述微发光二极管阵列与所述目标基板对准贴合之后,所述方法还包括:After aligning and bonding the micro-LED array on the transfer substrate to the target substrate, the method further includes:

将所述微发光二极管阵列与所述键合电极焊接。Welding the micro light emitting diode array and the bonding electrodes.

在具体实施时,可以在目标基板上沉积金(Au)薄膜或金锡合金(AuSn)薄膜,之后在进行图形化工艺,形成键合电极的图案。In a specific implementation, a gold (Au) thin film or a gold-tin alloy (AuSn) thin film may be deposited on the target substrate, and then a patterning process is performed to form a pattern of bonding electrodes.

可选地,对所述氢化非晶层采用退火工艺,具体包括:Optionally, an annealing process is used for the hydrogenated amorphous layer, which specifically includes:

在大于500℃的温度环境对所述氢化非晶层采用快速退火工艺。A rapid annealing process is adopted for the hydrogenated amorphous layer in a temperature environment greater than 500°C.

在500℃的温度环境进行退火的微发光二极管电流-电压曲线如图2所示。The current-voltage curve of the micro-LED annealed in a temperature environment of 500° C. is shown in FIG. 2 .

接下来,以为例,对本申请实施例提供的微发光二极管转移方法进行举例说明,如图3所示,微发光二极管转移方法包括如下步骤:Next, take an example to illustrate the transfer method of the micro light emitting diode provided in the embodiment of the present application. As shown in FIG. 3, the transfer method of the micro light emitting diode includes the following steps:

S201、在蓝宝石衬底基板1上依次形成缓冲层2、n-GaN 3、MQW4、p-GaN5以及第二电极11;S201, sequentially forming a buffer layer 2, n-GaN 3, MQW4, p-GaN5 and a second electrode 11 on the sapphire substrate 1;

其中,第二电极11作为阳极,第二电极例如可以是Ni/Au电极;Wherein, the second electrode 11 is used as an anode, and the second electrode may be, for example, a Ni/Au electrode;

S202、采用PECVD工艺在第二电极层11上沉积无机非晶材料,形成氢化非晶层6;S202. Deposit an inorganic amorphous material on the second electrode layer 11 by using a PECVD process to form a hydrogenated amorphous layer 6;

氢化非晶层的厚度例如可以是300nm;The thickness of the hydrogenated amorphous layer may be, for example, 300 nm;

S203、采用图形化工艺处理氢化非晶层6、第二电极层11、p-GaN 5、MQW4、n-GaN 3以及缓冲层2,形成微发光二极管阵列、氢化非晶层的图案以及缓冲层的图案,并通过激光剥离工艺,对待转移微发光二极管之外区域的微发光二极管进行定点照射,去除待转移微发光二极管之外区域的微发光二极管;S203, process the hydrogenated amorphous layer 6, the second electrode layer 11, p-GaN 5, MQW4, n-GaN 3 and the buffer layer 2 by a patterning process to form a micro-light emitting diode array, a pattern of the hydrogenated amorphous layer and a buffer layer pattern, and through the laser lift-off process, the micro light emitting diodes in the area outside the micro light emitting diode to be transferred are irradiated at fixed points, and the micro light emitting diodes in the area other than the micro light emitting diode to be transferred are removed;

S204、将蓝宝石衬底1之上的氢化非晶层6与设置有键合层8的转移基板7贴合;S204, bonding the hydrogenated amorphous layer 6 on the sapphire substrate 1 to the transfer substrate 7 provided with the bonding layer 8;

S205、通过激光剥离工艺,剥离蓝宝石衬底1;S205, peeling off the sapphire substrate 1 through a laser lift-off process;

S206、利用转移基板将缓冲层2与设置有键合电极10的目标基板9对位贴合;S206, using the transfer substrate to align and bond the buffer layer 2 to the target substrate 9 provided with the bonding electrode 10;

S207、采用高温快速退火工艺,使得氢化非晶层6释放氢气与键合层8分离,以及使得缓冲层2与键合电极10焊接;S207, using a high-temperature rapid annealing process, so that the hydrogenated amorphous layer 6 releases hydrogen and separates from the bonding layer 8, and makes the buffer layer 2 and the bonding electrode 10 welded;

S208、采用干法刻蚀工艺,露出部分n-GaN 3,并采用镀膜、图案化工艺在n-GaN 3上形成欧姆接触电极12,作为阴极。S208 , using a dry etching process to expose part of the n-GaN 3 , and using a coating and patterning process to form an ohmic contact electrode 12 on the n-GaN 3 as a cathode.

本申请实施例提供的一种显示面板的制备方法,如图4所示,所述方法包括:A method for preparing a display panel provided in an embodiment of the present application, as shown in FIG. 4 , includes:

S301、制备阵列基板;所述阵列基板包括多种颜色的子像素区;S301. Prepare an array substrate; the array substrate includes sub-pixel regions of multiple colors;

S302、采用本申请实施例提供的微发光二极管的转移方法将与所述子像素区颜色相对应的微发光二极管依次转移到所述阵列基板的所述子像素区。S302. Using the micro light emitting diode transfer method provided in the embodiment of the present application, sequentially transfer the micro light emitting diodes corresponding to the color of the sub pixel area to the sub pixel area of the array substrate.

以显示面板包括红色子像素、蓝色子像素以及绿色子像素为例,具体实施时,采用本申请实施例提供的上述为发光二极管转移方法,分别生长红光微发光二极管、蓝光微发光二极管、绿光微发光二极管,并分别将红光微发光二极管、蓝光微发光二极管、绿光微发光二极管转移到红色子像素区、蓝色子像素区、绿色子像素区。Taking a display panel including red sub-pixels, blue sub-pixels, and green sub-pixels as an example, during specific implementation, the above-mentioned light-emitting diode transfer method provided by the embodiment of the present application is used to grow red micro-light emitting diodes, blue light micro-emitting diodes, green light emitting diodes, and transfer the red light emitting diodes, blue light emitting diodes and green light emitting diodes to the red sub-pixel area, the blue sub-pixel area and the green sub-pixel area respectively.

本申请实施例提供的一种显示面板,所述显示面板采用本申请实施例提供的显示面板制备方法制得。The embodiment of the present application provides a display panel, which is manufactured by using the display panel preparation method provided in the embodiment of the present application.

综上所述,本申请实施例提供的微发光二极管的转移方法、显示面板的制备方法,以及显示面板,在对微发光二极管进行第一次转移的过程中,转移基板不会受到衬底基板上的微发光二极管的尺寸、间距的限制,可以提高微发光二极管的转移效率,由于转移基板可以对任何尺寸的微发光二极管进行转移,从而转移基板可以反复多次利用,可以节省成本。并且,本申请实施例提供的微发光二极管的转移方法中,还在微发光二极管上设置有氢化非晶层,在对微发光二极管进行第一次转移的过程中,氢化非晶层与转移基板贴合,在将微发光二极管阵列与目标基板对准贴合之后,采用退火工艺便可以使得氢化非晶层释放氢气,以使氢化非晶层与转移基板分离,以实现微发光二极管从转移基板剥离,采用退火工艺而不是激光光束照射工艺从而可以避免激光光束对微发光二极管阵列造成损伤,可以保证微发光二极管的良率,从而提高微发光二极管的发光效率。To sum up, in the transfer method of the micro light emitting diode, the preparation method of the display panel, and the display panel provided in the embodiment of the present application, the transfer substrate will not be affected by the substrate substrate during the first transfer process of the micro light emitting diode. The limitation of the size and spacing of the micro-light emitting diodes on the micro-light-emitting diode can improve the transfer efficiency of the micro-light-emitting diode. Since the transfer substrate can transfer micro-light-emitting diodes of any size, the transfer substrate can be used repeatedly, which can save costs. Moreover, in the transfer method of micro-light emitting diodes provided in the embodiment of the present application, a hydrogenated amorphous layer is also provided on the micro-light-emitting diodes. During the first transfer process of the micro-light-emitting diodes, the hydrogenated amorphous layer and the transfer substrate Bonding, after the micro-LED array is aligned and bonded to the target substrate, the hydrogenated amorphous layer can release hydrogen gas by using an annealing process, so that the hydrogenated amorphous layer is separated from the transfer substrate, so that the micro-LEDs can be separated from the transfer substrate. For stripping, the annealing process is adopted instead of the laser beam irradiation process, so as to avoid the damage of the laser beam to the micro-LED array, ensure the yield rate of the micro-light-emitting diode, and thereby improve the luminous efficiency of the micro-light-emitting diode.

显然,本领域的技术人员可以对本申请进行各种改动和变型而不脱离本申请的精神和范围。这样,倘若本申请的这些修改和变型属于本申请权利要求及其等同技术的范围之内,则本申请也意图包含这些改动和变型在内。Obviously, those skilled in the art can make various changes and modifications to the application without departing from the spirit and scope of the application. In this way, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalent technologies, the present application is also intended to include these modifications and variations.

Claims (9)

1.一种微发光二极管的转移方法,其特征在于,所述方法包括:1. A transfer method of micro-light-emitting diode, is characterized in that, described method comprises: 在衬底基板上形成微发光二极管阵列并在所述微发光二极管之上采用等离子体增强化学气相沉积工艺沉积无机非晶材料,形成氢化非晶层;Forming an array of micro-light emitting diodes on the base substrate and depositing an inorganic amorphous material on the micro-light-emitting diodes by using a plasma-enhanced chemical vapor deposition process to form a hydrogenated amorphous layer; 将所述氢化非晶层与转移基板贴合,并将所述微发光二极管阵列从所述衬底基板剥离;bonding the hydrogenated amorphous layer to the transfer substrate, and peeling off the micro-LED array from the base substrate; 将所述转移基板的所述微发光二极管阵列与目标基板对准贴合;Aligning and attaching the micro-LED array on the transfer substrate to the target substrate; 对所述氢化非晶层采用退火工艺,以使所述氢化非晶层释放氢气,将所述转移基板剥离;Using an annealing process on the hydrogenated amorphous layer, so that the hydrogenated amorphous layer releases hydrogen gas, and peels off the transfer substrate; 将所述氢化非晶层与所述转移基板贴合之前,所述方法还包括:Before attaching the hydrogenated amorphous layer to the transfer substrate, the method further includes: 在所述转移基板上形成键合层;所述键合层在所述转移基板和所述氢化非晶层之间。A bonding layer is formed on the transfer substrate; the bonding layer is between the transfer substrate and the hydrogenated amorphous layer. 2.根据权利要求1所述的方法,其特征在于,在衬底基板上形成微发光二极管阵列并在所述微发光二极管所述发光二极管之上形成氢化非晶层,具体包括:2. The method according to claim 1, characterized in that, forming an array of micro-light-emitting diodes on the base substrate and forming a hydrogenated amorphous layer on the micro-light-emitting diodes above the light-emitting diodes, specifically comprising: 在所述衬底基板之上形成所述微发光二极管各膜层;Forming each film layer of the micro light emitting diode on the base substrate; 在所述微发光二极管上采用等离子体增强化学气相沉积工艺沉积无机非晶材料,形成氢化非晶层;Depositing an inorganic amorphous material on the micro-light emitting diode by using a plasma-enhanced chemical vapor deposition process to form a hydrogenated amorphous layer; 对所述微发光二极管各膜层以及所述氢化非晶层采用图形化工艺,形成所述微发光二极管阵列以及所述氢化非晶层的图案。A patterning process is adopted for each film layer of the micro-light emitting diode and the hydrogenated amorphous layer to form patterns of the micro-light-emitting diode array and the hydrogenated amorphous layer. 3.根据权利要求2所述的方法,其特征在于,在下列气体之一或其组合的环境采用等离子体增强化学气相沉积工艺沉积无机非晶材料:硅烷、氨气、氢气;3. The method according to claim 2, wherein the inorganic amorphous material is deposited by plasma-enhanced chemical vapor deposition in an environment of one of the following gases or a combination thereof: silane, ammonia, hydrogen; 所述无机非晶材料包括下列之一或其组合:氮化硅、氧化硅、氮氧化硅。The inorganic amorphous material includes one or a combination of the following: silicon nitride, silicon oxide, silicon oxynitride. 4.根据权利要求2所述的方法,其特征在于,在衬底基板之上形成微发光二极管各膜层之前,所述方法还包括:4. The method according to claim 2, characterized in that, before each film layer of the micro-light emitting diode is formed on the base substrate, the method also includes: 在所述衬底基板之上形成缓冲层。A buffer layer is formed on the base substrate. 5.根据权利要求1所述的方法,其特征在于,将所述微发光二极管阵列从所述衬底基板剥离,具体包括:5. The method according to claim 1, wherein the micro-LED array is peeled off from the base substrate, specifically comprising: 采用激光剥离工艺将所述衬底基板与所述微发光二极管剥离。The base substrate and the micro light emitting diodes are separated by a laser lift-off process. 6.根据权利要求1所述的方法,其特征在于,将所述转移基板上的所述微发光二极管阵列与目标基板对准贴合之前,所述方法还包括:6. The method according to claim 1, wherein, before aligning and bonding the micro-LED array on the transfer substrate with the target substrate, the method further comprises: 在所述目标基板上形成键合电极的图案;forming a pattern of bonding electrodes on the target substrate; 将所述转移基板上的所述微发光二极管阵列与所述目标基板对准贴合之后,所述方法还包括:After aligning and bonding the micro-LED array on the transfer substrate to the target substrate, the method further includes: 将所述微发光二极管阵列与所述键合电极焊接。Welding the micro light emitting diode array and the bonding electrodes. 7.根据权利要求1所述的方法,其特征在于,对所述氢化非晶层采用退火工艺,具体包括:7. The method according to claim 1, wherein an annealing process is used for the hydrogenated amorphous layer, specifically comprising: 在大于500℃的温度环境对所述氢化非晶层采用快速退火工艺。A rapid annealing process is adopted for the hydrogenated amorphous layer in a temperature environment greater than 500°C. 8.一种显示面板的制备方法,其特征在于,所述方法包括:8. A method for preparing a display panel, characterized in that the method comprises: 制备阵列基板;所述阵列基板包括多种颜色的子像素区;Prepare an array substrate; the array substrate includes sub-pixel regions of multiple colors; 采用根据权利要求1~7任一项所述的微发光二极管的转移方法将与所述子像素区颜色相对应的微发光二极管依次转移到所述阵列基板的所述子像素区。Using the method for transferring micro-light emitting diodes according to any one of claims 1 to 7, the micro-light-emitting diodes corresponding to the colors of the sub-pixel regions are sequentially transferred to the sub-pixel regions of the array substrate. 9.一种显示面板,其特征在于,所述显示面板采用根据权利要求8所述的方法制得。9. A display panel, characterized in that the display panel is manufactured by the method according to claim 8.
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