CN111551463B - High-temperature pulse dynamic strain calibration device - Google Patents
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Abstract
The invention discloses a high-temperature pulse dynamic strain calibration device, and belongs to the technical field of strain measurement and test. The invention mainly comprises a dynamic strain excitation system, a high-temperature environment test system, a corrected strain measurement system, a laser measurement system and a base support. According to the invention, the projectile body accelerated by the push of compressed gas impacts the incident rod at a high speed to generate the pulse strain as the dynamic strain excitation source, namely, the pulse strain is generated by using a double Hopkinson separating rod based impact mode, so that the pulse strain with a large measuring range and a long duration can be realized. According to the invention, the strain value measured by the laser Doppler measurement system is used as a standard value, and a local semi-closed heating scheme is adopted by combining a high-temperature environment test system, so that the dynamic calibration of the strain at high temperature is realized. The invention expands the strain measurement calibration from the static characteristic to the dynamic characteristic, and can simultaneously realize the strain dynamic calibration under the normal temperature and high temperature environment.
Description
Technical Field
The invention relates to a high-temperature pulse dynamic strain calibration device, and belongs to the technical field of strain measurement and test equipment.
Background
The strain refers to the deformation behavior of the solid and the structure caused by the load such as bearing force, moment, pressure and the like, and the deformation behavior of expansion with heat and contraction with cold caused by the environmental change such as temperature and the like. The strain is a physical quantity for quantitatively measuring the strain. For strain measurement, there are various principles and methods, from classical resistive strain measurement, capacitive strain measurement, inductive strain measurement, magnetostrictive strain measurement, to semiconductor strain measurement, suspended strain measurement, fiber grating strain measurement, and the like.
Due to the difficulty in realizing and measuring the dynamic strain, the problem of calibrating the dynamic strain measurement is not broken through, and a better means for calibrating the dynamic strain measurement under the high-temperature condition is not provided at present.
Disclosure of Invention
In order to solve the problems of tracing of dynamic strain measurement and incapability of performing dynamic strain calibration in a high-temperature environment, the invention aims to provide a high-temperature pulse dynamic strain calibration device which can realize high-temperature dynamic strain calibration in a temperature range (25-600) DEG C aiming at pulse strain with a strain range (300-2000) mu epsilon and a duration (50-100) mu s. The invention expands the strain measurement calibration from the static characteristic to the dynamic characteristic, and can simultaneously realize the strain dynamic calibration under the normal temperature and high temperature environment.
The purpose of the invention is realized by the following technical scheme.
The invention discloses a high-temperature pulse dynamic strain calibration device which mainly comprises a dynamic strain excitation system, a high-temperature environment test system, a calibrated strain measurement system, a laser measurement system and a base support.
The dynamic strain excitation system comprises a high-pressure air chamber, an elastic body, an air pipe, an anvil body, an incidence rod and a transmission rod.
The high-temperature environment test system comprises a high-temperature heating box, a high-temperature strain gauge, a sample piece and a coaxial sleeve.
The calibrated strain measurement system comprises a dynamic strain measuring instrument, a high-speed data acquisition system, an analysis system, a strain gauge and a strain gauge.
The laser measurement system comprises a lateral laser velocimeter, an axial laser velocimeter, a high-speed data acquisition system and an analysis system.
The base support comprises a fixed rack, a synchronous push rod mechanism and a platform base.
The high-temperature dynamic strain calibration range refers to a temperature range of 25-600 ℃, a strain range of 300-2000 mu epsilon and a pulse strain duration of 50-100 mu s.
The incident rod and the transmission rod are coaxially arranged on the platform base through the fixed rack, the sample piece is arranged in the middle of the coaxial sleeve, two ends of the coaxial sleeve are sleeved on the incident rod and the transmission rod, the high-pressure air chamber compresses air, the projectile body is accelerated to a required speed range in the air pipe, and the speed value of the projectile body is adjusted by controlling the air pressure in the high-pressure air chamber.
The anvil body is used for generating different pulse strain durations according to different materials and different size thicknesses; according to the strain duration. Preferably, the anvil body material is an aluminum alloy material.
The projectile body axially impacts the anvil body to generate elastic stress waves, the elastic stress waves are transmitted to the incident rod through the anvil body, when the elastic stress waves entering the incident rod reach the interface between the incident rod and the sample piece, due to different impedances, a part of stress waves are emitted at the interface, the rest stress waves enter the sample piece, and the stress waves are reflected and transmitted at the interface between the sample piece and the transmission rod.
The elastic stress wave generates pulse strain when propagating in the incident rod and the transmission rod, is sensed by a strain gauge arranged on the transmission rod, acquires each strain voltage value through a dynamic strain measuring instrument, and obtains a normal temperature strain measurement value through an analysis system.
The high-temperature heating box is heated to the required temperature, only the sample piece is positioned in the high-temperature heating box during high-temperature heating, when the temperature meets the requirement, the synchronous push rod mechanism pushes the incident rod and the transmission rod to be in contact with the sample piece, the sample piece is compressed through elastic stress waves, the high-temperature strain gauge arranged on the sample piece senses stress wave compression pulses, a strain voltage value is collected through the dynamic strain measuring instrument, and a high-temperature strain measured value is obtained through the analysis system.
The axial laser velocimeter measures the transmission speed of stress waves, the high-speed data acquisition system acquires speed values, and the normal-temperature standard strain value is obtained through the analysis system, so that the tracing of the normal-temperature pulse strain value is realized.
The speed difference measured by the lateral laser velocimeter and the axial laser velocimeter is analyzed by an analysis system to obtain the deformation of the sample piece, so that a high-temperature strain standard value is obtained by calculation, and the tracing of the high-temperature pulse strain value is realized.
And comparing the strain measurement value of the strain gauge with the standard strain value measured by the axial laser velocimeter to realize the dynamic calibration of different strains at normal temperature.
And comparing the strain measurement value of the strain gauge with the standard strain values measured by the lateral laser velocimeter and the axial laser velocimeter to realize the dynamic calibration of the strain at high temperature.
The invention discloses a working method of a high-temperature pulse dynamic strain calibration device, which comprises the following steps: the high-pressure air chamber compresses air to accelerate the projectile body to the required energy in the air pipe; the anvil body is used for generating different pulse strain durations; the elastic stress wave is transmitted to the incident rod through the anvil body, and when the elastic stress wave entering the incident rod reaches the interface between the incident rod and the sample piece, part of the stress wave is emitted at the interface due to different impedances, the rest stress wave enters the sample piece, and the stress wave is reflected and transmitted at the interface between the sample piece and the transmission rod. The lateral laser velocimeter and the axial laser velocimeter measure the stress wave transmission speed, the high-speed data acquisition system acquires a speed value and a strain voltage value, and a standard strain value and a corrected strain value are obtained through the analysis system.
When high-temperature dynamic strain is calibrated, the high-temperature strain gauge is attached to a sample piece, the high-temperature heating box is heated to the required temperature, only the sample piece is positioned in the high-temperature heating box during high-temperature heating, and the incident rod and the transmission rod are not positioned in the high-temperature heating box. When the temperature meets the requirement, the synchronous push rod mechanism pushes the transmission rod and the incidence rod to contact with the sample piece, and meanwhile, a loading signal is applied to the column body, so that the problems of low heating speed, difficulty in maintaining the heating temperature and non-uniform temperature distribution caused by direct heating are solved.
When elastic stress waves are transmitted in the incident rod and the transmission rod, the deformation of the sample piece generated by compression cannot be directly measured, and the deformation of the sample piece is obtained through the speed difference measured by the lateral laser velocimeter and the axial laser velocimeter and an analysis system, so that a high-temperature strain standard value is solved, and the high-temperature pulse strain value tracing is realized.
The high-temperature strain gauge is characterized in that a sample piece is compressed by elastic stress waves, a strain gauge arranged on the sample piece senses stress wave compression pulses, a high-temperature strain measurement value is obtained by measuring through a dynamic strain measuring instrument, and the high-temperature strain amount is calibrated by comparing high-temperature dynamic strain standard values.
When normal temperature strain is calibrated, when stress waves enter the transmission rod for transmission, the axial laser velocimeter measures the speed of the normal temperature stress waves, and calculates a corresponding normal temperature standard strain value, so as to realize the tracing of the normal temperature pulse strain value, and the calibration of the normal temperature strain quantity is realized by comparing the normal temperature standard strain value obtained by the axial laser velocimeter with a normal temperature strain measurement value directly measured by the strain gauge.
Has the beneficial effects that:
1. according to the high-temperature pulse dynamic strain calibration device disclosed by the invention, the pulse strain generated by the fact that the projectile body accelerated by the pushing of the compressed gas impacts the incident rod at a high speed is used as a dynamic strain excitation source, namely the pulse strain is generated by using a double Hopkinson separation rod based impact mode, and the pulse strain with a large range and a long duration can be realized. By adopting the strain value measured by the laser Doppler measurement system as a standard value, combining a high-temperature environment test system and adopting a local semi-closed heating scheme, the strain dynamic calibration at normal temperature and high temperature is realized, and an effective technical means is provided for the dynamic strain calibration of large-amplitude strain values.
2. When the high-temperature pulse dynamic strain calibration device disclosed by the invention is used for high-temperature dynamic strain calibration, the high-temperature strain gauge is attached to a sample piece, the high-temperature heating box is heated to the required temperature, only the sample piece is positioned in the high-temperature heating box during high-temperature heating, and the incident rod and the transmission rod are not positioned in the high-temperature heating box. When the temperature meets the requirement, the synchronous push rod mechanism pushes the transmission rod and the incidence rod to contact with the sample piece, and meanwhile, a loading signal is applied to the column body, so that the problems of low heating speed, difficulty in maintaining the heating temperature and non-uniform temperature distribution caused by direct heating can be solved.
Drawings
Fig. 1 is a schematic diagram of a high-temperature pulse dynamic strain calibration device disclosed in the present invention.
FIG. 2 is a diagram of a loading scheme for a high temperature environment test system.
Wherein: 1-high pressure air chamber, 2-elastomer, 3-air pipe, 4-anvil body, 5-lateral laser velocimeter, 6-incident rod, 7-dynamic strain measuring instrument, 8-high speed data acquisition system, 9-analysis system, 10-high temperature heating box, 11-sample piece, 12-high temperature strain gauge, 13-coaxial sleeve, 14-strain gauge, 15-transmission rod, 16-fixed frame, 17-axial laser velocimeter, 18-synchronous push rod mechanism and 19-platform base.
Detailed Description
For a better understanding of the objects and advantages of the present invention, reference should be made to the following detailed description taken in conjunction with the accompanying drawings and examples.
Example 1:
as shown in fig. 1 and 2, the high-temperature pulse dynamic strain calibration device disclosed in this embodiment is composed of a dynamic strain excitation system, a high-temperature environment test system, a calibrated strain measurement system, a laser measurement system, and a base support.
The dynamic strain excitation system comprises a high-pressure air chamber 1, an elastomer 2, an air pipe 3, an anvil 4, an incident rod 6 and a transmission rod 15.
The high-temperature environment test system comprises a high-temperature heating box 10, a high-temperature strain gauge 12, a sample piece 11 and a coaxial sleeve 13.
The calibrated strain measurement system comprises a dynamic strain measuring instrument 7, a high-speed data acquisition system 8, an analysis system 9, a strain gauge 12 and a strain gauge 14.
The laser measuring system comprises a lateral laser velocimeter 5, an axial laser velocimeter 17, a high-speed data acquisition system 8 and an analysis system 9.
The base support comprises a fixed frame 16, a synchronous push rod mechanism 18 and a platform base 19.
Before the bullet 2 impacts the incident rod 6, the sample piece 11 and the transmission rod 15 are not contacted, only the sample piece 11 is in the high-temperature heating box 10, and after the sample piece 11 is heated to a specified temperature, the synchronous push rod mechanism 18 pushes the transmission rod 15 to be contacted with the incident rod 6 and the sample piece 11. Starting the high-pressure gas chamber 1 for loading, when the projectile body 2 accelerated by the compressed gas impacts the end of the incident rod 6 at a high speed, and the compression stress wave generated by the impact is transmitted to the interface with the sample piece 11 along the incident rod 6, one part of the compression stress wave is reflected, the other part of the compression stress wave penetrates through the sample piece and is transmitted to the transmission rod 15 to be continuously transmitted, because the stress wave is reflected for multiple times at two ends of the sample piece, an almost uniform stress strain state can be quickly established in the sample piece 11, the deformation of the sample piece 11 is obtained through the analysis system 9 according to the speed difference of the stress wave on the incident rod 6 and the transmission rod 15, which is measured by the lateral laser velocimeter 5 and the axial laser velocimeter 17, so that the high-temperature standard strain value on the sample piece 11 is solved, the normal-temperature stress wave speed on the transmission rod is measured by the axial laser velocimeter 17, and the normal-temperature standard strain value is obtained through the analysis system 9. The high-temperature strain gauge 12 and the strain gauge 14 which are adhered to the sample piece 11 and the transmission rod 15 measure the corrected dynamic strain value through the dynamic strain measuring instrument 7, and the measured corrected dynamic strain value is respectively compared with the standard strain value measured by the laser measuring system, so that the dynamic calibration of the pulse strain under the high-temperature and normal-temperature environments is completed.
The working method of the high-temperature pulse dynamic strain calibration device disclosed by the embodiment comprises the following steps:
when normal temperature dynamic strain calibration is carried out, the high-pressure air chamber 1 is connected with the air pipe 3, when air pressure is released, the projectile body 2 accelerates to a certain speed in the air pipe 3 to impact the anvil body 4, the anvil body 4 is adsorbed in the incident rod 6 through materials such as silicone grease in a high vacuum mode, the incident rod 6 and the transmission rod 15 are coaxially installed on the platform base 19 through the adjusting and fixing rack 16 and the air pipe 3, the synchronous push rod mechanism 18 is connected with the high-pressure air chamber 1, and after the incident rod 6, the sample piece 11 and the transmission rod 15 are completely contacted through the coaxial sleeve 13, the high-pressure air chamber 1 releases the projectile body 2. And adjusting an axial laser velocimeter 17, connecting the output end of a strain gauge 14 adhered on the transmission rod 15 to the input end of the dynamic strain measuring instrument 7, connecting the output end of the dynamic strain measuring instrument 7 to the high-speed data acquisition system 8, and obtaining a strain measurement value of the strain gauge 14 to be calibrated through an analysis system 9. The output end of the axial laser velocimeter 17 is connected to the high-speed data acquisition system 8, and the acquired speed signal is analyzed by the analysis system to obtain a standard strain value.
The high temperature heating box 10 provides temperature conditions for high temperature dynamic strain calibration when performing high temperature dynamic strain calibration. The temperature of the high-temperature heating box 10 is set to the temperature required by calibration, before the projectile body 2 impacts the anvil body 4, the incident rod 6, the sample piece 11 and the transmission rod 15 are not in contact, and the high-temperature heating box 10 only heats the sample piece 11, so that the phenomenon that the temperature on the rod is uneven due to the fact that the temperature is transmitted between the incident rod 6 and the transmission rod 15, and the transmission of stress waves is influenced is avoided. After the incident rod 6, the sample piece 11 and the transmission rod 15 are completely contacted, the elastic body 2 impacts the anvil body 4, stress waves are transmitted in the sample piece 11, the output end of the high-temperature strain gauge 12 which is adhered to the sample piece 11 is connected to the input end of the dynamic strain measuring instrument 7, the output end of the dynamic strain measuring instrument 7 is connected to the high-speed data acquisition system 8, and the high-temperature strain measured value of the strain gauge 12 to be corrected is obtained through the analysis system 9. When the stress wave is transmitted to the tail end of the transmission rod 15, the output ends of the lateral laser velocimeter 5 and the axial laser velocimeter 17 are connected to the high-speed data acquisition system 8, and the acquired speed signals are analyzed by the analysis system 9 to obtain standard strain values.
Therefore, the measured dynamic strain value is compared with the standard strain value, and the normal-temperature and high-temperature dynamic calibration of the strain gauge is completed. The high-temperature pulse dynamic strain calibration device can generate a pulse strain value with a strain range (300-2000) mu epsilon and a pulse strain duration (50-100) mu s, and realizes high-temperature dynamic calibration of strain within a temperature range (25-600) DEG C.
The above detailed description is intended to illustrate the objects, aspects and advantages of the present invention, and it should be understood that the above detailed description is only exemplary of the present invention and is not intended to limit the scope of the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (7)
1. The high-temperature pulse dynamic strain calibration device is characterized in that: the device mainly comprises a dynamic strain excitation system, a high-temperature environment test system, a corrected strain measurement system, a laser measurement system and a base support;
the dynamic strain excitation system comprises a high-pressure air chamber (1), an elastomer (2), an air pipe (3), an anvil body (4), an incidence rod (6) and a transmission rod (15);
the high-temperature environment test system comprises a high-temperature heating box (10), a high-temperature strain gauge (12), a sample piece (11) and a coaxial sleeve (13);
the calibrated strain measurement system comprises a dynamic strain measuring instrument (7), a high-speed data acquisition system (8), an analysis system (9), a high-temperature strain gauge (12) and a strain gauge (14);
the laser measurement system comprises a lateral laser velocimeter (5), an axial laser velocimeter (17), a high-speed data acquisition system (8) and an analysis system (9);
the base support comprises a fixed rack (16), a synchronous push rod mechanism (18) and a platform base (19);
the high-temperature dynamic strain calibration range refers to a temperature range of 25-600 ℃, a strain range of 300-2000 mu epsilon and a pulse strain duration of 50-100 mu s;
the incident rod (6) and the transmission rod (15) are coaxially arranged on the platform base (19) through the fixing rack (16), two ends of the coaxial sleeve (13) are sleeved on the incident rod (6) and the transmission rod (15), the high-pressure air chamber (1) compresses air, the projectile body (2) is accelerated to a required speed range in the air pipe (3), and the speed value of the projectile body (2) is adjusted by controlling the air pressure in the high-pressure air chamber (1);
the anvil body (4) is used for generating different pulse strain durations according to different materials and different size thicknesses; according to the strain duration;
the projectile body (2) axially impacts the anvil body (4) to generate elastic stress waves, the elastic stress waves are transmitted to the incident rod (6) through the anvil body (4), when the elastic stress waves entering the incident rod (6) reach the interface of the incident rod (6) and the sample piece (11), due to different impedances, a part of the stress waves are reflected at the interface, the rest of the stress waves enter the sample piece (11), and the stress waves are reflected and transmitted at the interface of the sample piece (11) and the transmission rod (15);
the elastic stress wave generates pulse strain when propagating in the incident rod (6) and the transmission rod (15), is sensed by a strain gauge (14) arranged on the transmission rod (15), acquires each strain voltage value through a dynamic strain measuring instrument (7), and obtains a normal temperature strain measurement value through an analysis system (9);
the high-temperature heating box (10) is heated to a required temperature, only the sample piece (11) is positioned in the high-temperature heating box (10) during high-temperature heating, when the temperature meets the requirement, the synchronous push rod mechanism pushes the incident rod (6) and the transmission rod (15) to be in contact with the sample piece (11), the sample piece (11) is compressed through elastic stress waves, the high-temperature strain gauge (12) arranged on the sample piece (11) senses stress wave compression pulses, a strain voltage value is collected through the dynamic strain measuring instrument (7), and a high-temperature strain measured value is obtained through the analysis system (9);
the axial laser velocimeter (17) measures the transmission speed of stress waves, the high-speed data acquisition system (8) acquires speed values, and a normal-temperature standard strain value is obtained through the analysis system (9), so that the tracing of the normal-temperature pulse strain value is realized;
the deformation of the sample piece (11) is obtained through the analysis system (9) according to the speed difference measured by the lateral laser velocimeter (5) and the axial laser velocimeter (17), so that a high-temperature strain standard value is obtained through calculation, and the tracing of the high-temperature pulse strain variable value is realized;
comparing the strain measurement value of the strain gauge (14) with the standard strain value measured by the axial laser velocimeter (17), and realizing dynamic calibration of different strains at normal temperature;
and comparing the strain measurement value of the high-temperature strain gauge (12) with the standard strain values measured by the lateral laser velocimeter (5) and the axial laser velocimeter (17), thereby realizing the dynamic calibration of the strain at high temperature.
2. The high temperature pulsed dynamic strain calibration device of claim 1, wherein: the working method is that the high-pressure air chamber (1) compresses air to accelerate the projectile body (2) to the required energy in the air pipe (3); the anvil body (4) is used for generating different pulse strain durations; the projectile body (2) axially impacts the anvil body (4) to generate elastic stress waves, the elastic stress waves are transmitted to the incident rod (6) through the anvil body (4), when the elastic stress waves entering the incident rod (6) reach the interface of the incident rod (6) and the sample piece (11), due to different impedances, a part of the stress waves are reflected at the interface, the rest of the stress waves enter the sample piece (11), and the stress waves are reflected and transmitted at the interface of the sample piece (11) and the transmission rod (15); the lateral laser velocimeter (5) and the axial laser velocimeter (17) measure the stress wave transmission speed, the high-speed data acquisition system (8) acquires a speed value and a strain voltage value, and a standard strain value and a corrected strain value are obtained through the analysis system (9).
3. A high temperature pulse dynamic strain calibration device as defined in claim 2, wherein: when high-temperature dynamic strain is calibrated, the high-temperature strain gauge (12) is attached to the sample piece (11), the high-temperature heating box (10) is heated to the required temperature, only the sample piece (11) is positioned in the high-temperature heating box (10) during high-temperature heating, and the incident rod (6) and the transmission rod (15) are not positioned in the high-temperature heating box (10); when the temperature meets the requirement, the synchronous push rod mechanism (18) pushes the transmission rod (15) and the incidence rod (6) to be in contact with the sample piece (11), and meanwhile, a loading signal is applied to the column body, so that the problems of low heating speed, difficulty in maintaining the heating temperature and non-uniform temperature distribution caused by direct heating are solved.
4. A high temperature pulse dynamic strain calibration device as defined in claim 2, wherein: when the elastic stress waves are transmitted in the incident rod (6) and the transmission rod (15), the deformation of the sample piece (11) generated by compression cannot be directly measured, and the deformation of the sample piece (11) is obtained through a speed difference measured by the lateral laser velocimeter (5) and the axial laser velocimeter (17) by an analysis system (9), so that a high-temperature strain standard value is solved, and the high-temperature pulse strain value tracing is realized.
5. A high temperature pulsed dynamic strain calibration device as defined in claim 2, wherein: the stress wave compression pulse is sensed by a high-temperature strain gauge (12) arranged on the sample piece (11) through the compression of the sample piece (11) by the elastic stress wave.
6. A high temperature pulse dynamic strain calibration device as defined in claim 2, wherein: when normal temperature strain is calibrated, when stress waves enter the transmission rod (15) for transmission, the axial laser velocimeter (17) measures the speed of the normal temperature stress waves, and calculates the corresponding normal temperature standard strain value, thereby realizing the tracing of the normal temperature pulse strain value.
7. A high temperature pulsed dynamic strain calibration device as defined in claim 2, wherein: the anvil body (4) is made of aluminum alloy materials.
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| CN113049420B (en) * | 2021-03-30 | 2024-08-30 | 西北工业大学 | Device and method for realizing pull/press impact fatigue test based on Hopkinson pull rod |
| CN114966114B (en) * | 2022-04-19 | 2023-05-05 | 北京理工大学 | Multi-component impact calibration device and continuous multi-loading synchronous calibration method |
| CN117074216B (en) * | 2023-07-24 | 2025-08-22 | 山东大学 | Implantable multiple transient high strain rate dynamic load application device and method |
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