CN111624473A - Radio frequency circuit testing method and system based on group delay - Google Patents
Radio frequency circuit testing method and system based on group delay Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 66
- 238000001514 detection method Methods 0.000 claims abstract description 94
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
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Abstract
The invention relates to the technical field of radio frequency circuit detection, in particular to a radio frequency circuit testing method and system based on group delay. The original detection signal and the detection signal passing through the radio frequency circuit are respectively captured, the processing module respectively calculates the trigger time delay of the original detection signal and the signal time delay passing through the radio frequency circuit, and the processing operation can judge whether the circuit to be detected is normal; the invention can save the repeated work of the tester on the test, can replace a large amount of manual experiments, improve the reliability and stability of the test, reduce the test threshold of the tester at the same time, and improve the working efficiency; the invention can also carry out long-time test, and can obtain the relation between the group delay of the radio frequency board and the working time by utilizing the collected test data, thereby ensuring the use reliability of the radio frequency board.
Description
Technical Field
The invention relates to the technical field of radio frequency circuit detection, in particular to a radio frequency circuit testing method and system based on group delay.
Background
At present, in the production and research and development processes of a mobile phone integrated tester, a radio frequency board link in the mobile phone integrated tester generally needs to be tested, mainly time delay testing of radio frequency signals in the transmission process is carried out, the existing radio frequency circuit testing cannot be carried out for a long time, and meanwhile, the circuit is complex and the cost is relatively high.
Disclosure of Invention
The invention aims to provide a radio frequency circuit testing method and system based on group delay, which can carry out long-time testing and increase the reliability of radio frequency circuit testing.
In order to solve the technical problems, the technical scheme adopted by the invention for solving the technical problems is as follows:
a radio frequency circuit test method based on group delay specifically comprises the following steps:
the signal output module outputs two detection signals, wherein one detection signal is output to the processing module to be used as a trigger signal, and the other detection signal is input to the tested radio frequency circuit for time delay, so that the detection signal generates transmission time delay; and inputting the trigger signal and the delayed detection signal into a processing module for processing operation, and judging whether the tested radio frequency circuit is normal.
Furthermore, the two detection signals are signals which are simultaneously output by the signal output module and have the same frequency and power.
Furthermore, each point of the trigger signal and the corresponding time on the test curve of the delayed detection signal is acquired, and each data type is stored in a key value pair mode for each point in the program.
Further, the processing and calculating the trigger signal and the delayed detection signal specifically includes:
and analyzing the waveform data of the trigger signal and the delayed detection signal to obtain a time stamp T1 of the trigger signal and a time stamp T2 of the delayed detection signal, comparing the result time delay TDelay = | T1-T2 | with a preset standard time delay.
Further, when the trigger signal or the delayed detection signal uses a digital channel test, the timestamp T1 when the transition from 0 to 1 is resolved;
when the trigger signal or the delayed detection signal uses an analog channel test, the timestamp T2 at which the rising edge is 80% is resolved.
The invention also includes a group delay-based radio frequency circuit testing system, comprising:
the signal output module is used for outputting two detection signals, wherein one detection signal is transmitted to the processing module to be used as a trigger signal, and the other detection signal is input to the tested radio frequency circuit;
the tested radio frequency circuit is used for receiving the detection signal, delaying the transmission of the detection signal and outputting the delayed detection signal to the processing module;
and the processing module is used for receiving the triggered signal and the delayed detection signal, performing processing operation on the triggered signal and the delayed detection signal and judging whether the radio frequency circuit to be detected is normal.
Furthermore, the two detection signals output by the signal output module are signals which are output at the same time and have the same frequency and power.
Further, the processing module processes the trigger signal and the delayed detection signal to obtain waveform data, and obtains a timestamp T1 of the trigger signal and a timestamp T2 of the delayed detection signal according to the waveform data, so that the result delay TDelay = | T1-T2 |, and the result delay TDelay is compared with a predetermined standard delay in the processing module.
Further, when the trigger signal or the delayed detection signal passes through the digital channel test of the processing module, the timestamp T1 when the transition from 0 to 1 is resolved;
the time stamp T2 at 80% of the rising edge is resolved when the trigger signal or the delayed detection signal passes the processing module's using analog channel testing.
Further, the processing module obtains each point of the trigger signal and the delayed detection signal corresponding to the time on the test curve, and stores the data type of each obtained point.
The invention has the beneficial effects that:
the original detection signal and the detection signal passing through the radio frequency circuit are respectively captured, the processing module respectively calculates the trigger time delay of the original detection signal and the signal time delay passing through the radio frequency circuit, and the processing operation can judge whether the circuit to be detected is normal; the invention can save the repeated work of the tester on the test, can replace a large amount of manual experiments, improve the reliability and stability of the test, reduce the test threshold of the tester at the same time, and improve the working efficiency; the invention can also carry out long-time test, and can obtain the relation between the group delay of the radio frequency board and the working time by utilizing the collected test data, thereby ensuring the use reliability of the radio frequency board.
Drawings
FIG. 1 is a schematic diagram of a group delay-based RF circuit testing system according to the present invention.
FIG. 2 is a schematic diagram of the RF test circuit of the present invention.
Detailed Description
The present invention is further described below in conjunction with the following figures and specific examples so that those skilled in the art may better understand the present invention and practice it, but the examples are not intended to limit the present invention.
Referring to fig. 1, a group delay-based radio frequency circuit testing method includes the following specific steps:
the signal output module outputs two detection signals, wherein one detection signal is output to the processing module to be used as a trigger signal, and the other detection signal is input to the tested radio frequency circuit for time delay, so that the detection signal generates transmission time delay; and inputting the trigger signal and the delayed detection signal into a processing module for processing operation, and judging whether the tested radio frequency circuit is normal.
The original detection signal and the detection signal passing through the radio frequency circuit are respectively captured, the processing module respectively calculates the trigger time delay of the original detection signal and the signal time delay passing through the radio frequency circuit, and the processing operation can judge whether the circuit to be detected is normal; the invention can save the repeated work of the tester on the test, can replace a large amount of manual experiments, improve the reliability and stability of the test, reduce the test threshold of the tester at the same time, and improve the working efficiency; the invention can also carry out long-time test, and can obtain the relation between the group delay of the radio frequency board and the working time by utilizing the collected test data, thereby ensuring the use reliability of the radio frequency board.
The two detection signals are signals which are simultaneously output by the signal output module and have the same frequency and power.
The processing module sets a corresponding sampling rate, a corresponding sampling depth and a corresponding time width according to the actual detection signal; the signal output module simultaneously outputs signals with the same frequency and proper power.
And acquiring each point of the trigger signal and the delayed detection signal corresponding to time on the test curve, and storing each data type by using a key value pair mode for each point in a program.
The processing and operation of the trigger signal and the delayed detection signal specifically includes:
and analyzing the waveform data of the trigger signal and the delayed detection signal to obtain a time stamp T1 of the trigger signal and a time stamp T2 of the delayed detection signal, comparing the result time delay TDelay = | T1-T2 | with a preset standard time delay.
When the trigger signal or the delayed detection signal uses the digital channel test, the timestamp T1 when the jump from 0 to 1 is analyzed;
when the trigger signal or the delayed detection signal uses an analog channel test, the timestamp T2 at which the rising edge is 80% is resolved.
A group delay based radio frequency circuit test system, comprising:
the signal output module is used for outputting two detection signals, wherein one detection signal is transmitted to the processing module to be used as a trigger signal, and the other detection signal is input to the tested radio frequency circuit;
the tested radio frequency circuit is used for receiving the detection signal, delaying the transmission of the detection signal and outputting the delayed detection signal to the processing module;
and the processing module is used for receiving the triggered signal and the delayed detection signal, performing processing operation on the triggered signal and the delayed detection signal and judging whether the radio frequency circuit to be detected is normal.
The signal output module is a signal source, the processing module is an oscilloscope or a PC, the radio frequency circuit to be detected is a radio frequency board, the signal source is provided with an output port 1 and an output port 2, the output port 2 of the signal source transmits one detection signal to the input port 1 of the oscilloscope as a trigger signal, the output port 1 of the signal source transmits the other detection signal to the input port of the radio frequency board, and the output port of the radio frequency board outputs the delayed detection signal to the input port 2 of the oscilloscope; the oscilloscope is set to average N pieces of data.
The two detection signals output by the signal output module are signals which are output at the same time and have the same frequency and power.
The processing module processes the trigger signal and the delayed detection signal to obtain waveform data, obtains a timestamp T1 of the trigger signal and a timestamp T2 of the delayed detection signal according to the waveform data, compares the result delay TDelay with a preset standard delay in the processing module, and stores a test result, wherein the result delay TDelay = | T1-T2 |.
When the trigger signal or the delayed detection signal passes through the digital channel test of the processing module, analyzing a timestamp T1 when the jump from 0 to 1 occurs;
the time stamp T2 at 80% of the rising edge is resolved when the trigger signal or the delayed detection signal passes the processing module's using analog channel testing.
The processing module obtains each point of the trigger signal and the delayed detection signal corresponding time on the test curve, and stores the data type of each obtained point.
Specifically, each point of the processing module input port 1 and input port 2 test curves corresponding to time is obtained, and for each point, each data type is stored in a key value pair mode in a program.
When the delay index does not meet the test requirement, the test fails, and the program continues to record the total test times and the failure times so that the user can observe the statistical test result more conveniently.
The processing module also comprises a storage module which is used for storing the test information of the detection signal, and simultaneously recording the test result of each point and the finish time of the complete measurement corresponding to one stability as the test basis for the test result of each time and recording the test result and the finish time in a file so as to facilitate later inquiry and later statistics; the probability of problems of the instrument can be counted, and the test result can be stored more finely according to the requirement.
Workflow process
1. Connecting a computer with test software with a signal source and an oscilloscope, and connecting a radio frequency board;
2. averaging 16 pieces of data set by the oscilloscope, respectively setting a signal of an input port 1 of the oscilloscope as a trigger signal, and simultaneously outputting signals with the same frequency and proper power from an output port 1 and an output port 2 of a signal source;
3. acquiring each point of the corresponding time on the test curves of the input port 1 and the input port 2 of the oscilloscope, and storing each data type in a key value pair mode in a program for each point;
4. analyzing a waveform data file of an input port 1 of the oscilloscope, analyzing a time stamp when jumping from 0 to 1 when a digital channel test is used, and analyzing a time stamp T1 of which the rising edge is at 80% when an analog channel is used;
analyzing a waveform data file of an input port 2 of the oscilloscope, analyzing a time stamp when jumping from 0 to 1 when a digital channel test is used, and analyzing a time stamp T2 of which the rising edge is at 80% when an analog channel is used;
the result of the subtraction is the result time delay TDelay = | T1-T2 | required for measurement, the calculation result is compared with the predetermined standard time delay, and the test result is stored.
The above-mentioned embodiments are merely preferred embodiments for fully illustrating the present invention, and the scope of the present invention is not limited thereto. The equivalent substitution or change made by the technical personnel in the technical field on the basis of the invention is all within the protection scope of the invention. The protection scope of the invention is subject to the claims.
Claims (6)
1. A radio frequency circuit test method based on group delay is characterized by comprising the following specific steps:
the signal output module outputs two detection signals, wherein one detection signal is output to the processing module to be used as a trigger signal, and the other detection signal is input to the tested radio frequency circuit for time delay, so that the detection signal generates transmission time delay; inputting the trigger signal and the delayed detection signal into a processing module for processing operation, and judging whether the tested radio frequency circuit is normal;
the processing and operation of the trigger signal and the delayed detection signal specifically includes:
when the trigger signal or the delayed detection signal uses the digital channel test, the timestamp T1 when the jump from 0 to 1 is analyzed;
when the trigger signal or the delayed detection signal uses an analog channel test, the timestamp T2 of which the rising edge is at 80% is analyzed;
and analyzing the waveform data of the trigger signal and the delayed detection signal to obtain a time stamp T1 of the trigger signal and a time stamp T2 of the delayed detection signal, comparing the result time delay TDelay = | T1-T2 | with a preset standard time delay.
2. The method of claim 1, wherein the two detection signals are signals that are output by the signal output module at the same time and have the same frequency and power.
3. The group delay-based radio frequency circuit testing method of claim 1, wherein each point of the test curve of the trigger signal and the delayed detection signal corresponding to a time is obtained, and each data type is stored for each point in a key-value pair manner in a program.
4. A group delay based rf circuit test system, comprising:
the signal output module is used for outputting two detection signals, wherein one detection signal is transmitted to the processing module to be used as a trigger signal, and the other detection signal is input to the tested radio frequency circuit;
the tested radio frequency circuit is used for receiving the detection signal, delaying the transmission of the detection signal and outputting the delayed detection signal to the processing module;
the processing module is used for receiving the triggered signal and the delayed detection signal, performing processing operation on the triggered signal and the delayed detection signal and judging whether the radio frequency circuit to be detected is normal or not;
the processing module processes the trigger signal and the delayed detection signal to obtain waveform data, and analyzes a timestamp T1 when the trigger signal or the delayed detection signal jumps from 0 to 1 through a digital channel test of the processing module;
when the trigger signal or the delayed detection signal passes through the using simulation channel test of the processing module, analyzing a timestamp T2 of which the rising edge is at 80%;
and obtaining the time stamp T1 of the trigger signal and the time stamp T2 of the delayed detection signal according to the waveform data, comparing the result time delay TDelay = | T1-T2 | with a preset standard time delay in the processing module.
5. The group delay based radio frequency circuit test system of claim 4, wherein the two detection signals outputted by the signal output module are signals outputted simultaneously and having the same frequency and power.
6. The group delay based rf circuit testing system of claim 4, wherein the processing module obtains each point of the test curve of the trigger signal and the delayed detection signal at a corresponding time, and stores the data type of each obtained point.
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Application publication date: 20200904 |