CN112067880B - Grouping matching method of iron cakes for self-saturable reactor iron cores of silicon rectifying devices - Google Patents
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- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 title claims abstract description 51
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 25
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 25
- 239000010703 silicon Substances 0.000 title claims abstract description 25
- 238000000034 method Methods 0.000 title claims abstract description 24
- 229910052742 iron Inorganic materials 0.000 title claims abstract description 14
- 241000950638 Symphysodon discus Species 0.000 claims abstract description 108
- HOQADATXFBOEGG-UHFFFAOYSA-N isofenphos Chemical compound CCOP(=S)(NC(C)C)OC1=CC=CC=C1C(=O)OC(C)C HOQADATXFBOEGG-UHFFFAOYSA-N 0.000 claims abstract description 62
- 230000005291 magnetic effect Effects 0.000 claims abstract description 11
- 238000004804 winding Methods 0.000 claims description 16
- 238000004364 calculation method Methods 0.000 claims description 12
- 238000000137 annealing Methods 0.000 claims description 6
- 230000006698 induction Effects 0.000 claims description 6
- 238000012935 Averaging Methods 0.000 claims description 4
- 238000004832 voltammetry Methods 0.000 claims description 3
- 230000002035 prolonged effect Effects 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000033228 biological regulation Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910000976 Electrical steel Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/30—Measuring the maximum or the minimum value of current or voltage reached in a time interval
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
A grouping and matching method of iron cakes for a self-saturation reactor iron core of a silicon rectifying device comprises the following steps: numbering and carrying out a volt-ampere characteristic test; arranging and grouping the idle load currents from large to small; the arranged discus is from the first component to the p group according to the positive sequence, then from the p component to the first group according to the reverse sequence, then from the first component to the p group according to the positive sequence, and the circulation is carried out until all the n discus are put into the p group, and each group has m discus; calculating the no-load current of the discus to determine the matching result: and calculating the sum of the current of each group of discus and the current sum difference D1 of the current of each group of discus, and if the D1 is less than the deviation control value D, determining that the grouping meets the set requirement and the grouping is the matching result. When the method is used for grouping and selecting, the difference between the current sum of each group of discus can be minimized or set requirements can be met, the magnetic conductivity of the iron cores of each branch circuit is ensured to be close to the same, the output voltage of each branch circuit in the silicon rectifying device is balanced, the alternating current power output of the corresponding branch circuit in the rectifying transformer is consistent, the loss is reduced, and the service life is prolonged.
Description
Technical Field
The invention relates to a matching method of silicon rectifier device components, in particular to a grouping matching method of discuss for a self-saturation reactor iron core of a silicon rectifier device.
Background
In order to obtain a fine adjustment function within the range of the level difference of an on-load switch or to realize continuous smooth voltage regulation within a larger range and reduce the action times of the on-load switch so as to prolong the service life and the overhaul period of the on-load switch in a silicon rectifying device, a self-saturable reactor is often added into the rectifying device, the self-saturable reactor generally comprises an iron core, a working winding, a control winding, an offset winding, a bracket and the like, the silicon rectifying device generally comprises a plurality of branches, the corresponding self-saturable reactor also comprises a plurality of branches, and for the convenience of production and manufacture, the iron core of the self-saturable reactor of each branch is generally formed by overlapping a plurality of annular iron cakes, and the working winding, the control winding and the offset winding penetrate through the iron core; there are problems in that:
(1) The single discus is manufactured by processes of winding, annealing and the like, in the manufacturing process of the discus, the condition is inconsistent when the crystal lattices of silicon steel sheets are restored due to the influence of factors such as an annealing process and the like, the magnetic conductivity of each discus can be changed, so that the magnetic conductivity of the iron core stacked on each branch circuit is different, (the basic principle of the self-saturation reactor is that the characteristic that the effective alternating current magnetic permeability of a ferromagnetic material is changed along with the size of a direct current magnetic field is utilized to change the reactance value of an alternating current winding, thereby realizing the purpose of voltage regulation), therefore, when the magnetic conductivities of the iron cores of different branch circuits are inconsistent, the reactance values regulated by the different branch circuits are also inconsistent, the voltage output by each branch circuit in a silicon rectifying device is also unbalanced, thereby influencing the performance of the whole rectifying system, causing the inconsistent alternating current power output of the corresponding branch circuit in a rectifying transformer, and the loss is increased;
(2) The output voltage of each branch of the silicon rectifying device is inconsistent, so that the circulating current loss is increased, and the service lives of a transformer winding and a rectifying element corresponding to the branch with high power output are shortened;
(3) The existing solution is to approach the performance of the annealed single discus by continuously improving the performance of the annealing furnace, but it is still difficult to ensure the voltage imbalance of each branch output in the silicon rectifying device.
Disclosure of Invention
The invention provides a grouping matching method of iron cakes for iron cores of a self-saturation reactor of a silicon rectifying device, aiming at solving the problem that direct current output is unbalanced after the self-saturation reactor is adopted to regulate voltage in the silicon rectifying device, so as to overcome the defects in the prior art.
In order to solve the technical problems, the invention adopts the technical scheme that:
a grouping matching method of iron cakes for a self-saturation reactor iron core of a silicon rectifying device is characterized by comprising the following steps: the method comprises the following steps:
s1. Test of serial number
S11, numbering the iron cakes for the iron cores of the self-saturation reactors qualified in annealing;
s12, carrying out volt-ampere characteristic test on each discus, and measuring and recording the no-load current of the corresponding discus;
s2, grouping
S21, arranging n discuses meeting the requirements from large to small according to the no-load current: t1, T2 and T3 \8230andTn, wherein T1 represents the discus with the largest no-load current, and Tn represents the discus with the smallest no-load current;
s22, dividing n discuses into p groups, and averaging m discuses in each group;
s23, distribution principle: according to the sequence of the no-load current from large to small, each group is distributed one time;
s24, specific distribution step:
s241, taking the first batch (1 st to p th) of discuses from the first component to the p th component in the positive sequence: t1 is divided into a first group, T2 is divided into a second group, \ 8230, tp-1 is divided into a p-1 group, and Tp is divided into a p-group;
s242, taking a second batch of (p +1 st to 2p nd) discuses from the p component to the first component in reverse order: tp +1 is divided into the p group, tp +2 is divided into the p-1 group, \8230, T2p-1 is divided into the second group, and T2p is divided into the first group;
s243, taking a third batch of (2p +1 to 3 p) discuses from the first component to the p group in positive sequence: t2p +1 is divided into a first group, T2p +2 is divided into a second group, \8230, T3p-1 is divided into a p-1 group, and T3p is divided into a p-group; \8230 \ 8230
The process is circulated until all the n discuses are distributed;
s3, calculating the no-load current of the discus and determining a matching result;
s31, setting a deviation control value D, wherein the D is a positive number which is not more than 10% of the average value of all discus currents;
s32, calculating the sum of the current of each group of discuses: adding the no-load currents of m discuses in a group to obtain the current sum of the discuses in the group, wherein p groups of discuses have p current sums;
s33, marking the current sum maximum value and the current sum minimum value in the p current sums, and calculating the current sum difference D1 of the p current sums;
s331, if the difference value D1 is smaller than the deviation control value D, the grouping meets the set requirement, and the grouping is the matching result;
s332, if the difference value D1 is larger than the deviation control value D, entering the next step;
s34, exchanging the discus of the maximum current in the current and maximum value group with the discus of the minimum current in the current and minimum value group, calculating the no-load current sum of each group of discus, and calculating the difference D2 between the current sum maximum value and the current sum minimum value;
s341, if the difference D2 between the current after the exchange and the maximum value and the minimum value is smaller than the deviation control value D, interrupting the calculation, and taking the grouping result of this time;
s342, if the difference D2 between the adjusted current and the maximum value and the minimum value is larger than the deviation control value D, entering the next step;
s35, repeating S34, and calculating differences D3, D4, D5, 8230, 8230between the maximum value and the minimum value of each group of currents after each exchangeDN；
S351, stopping calculation until D3, D4 and D5 \8230 \8230andDN meet the condition that the DN is smaller than a deviation control value D, and taking the current grouping result;
s352, for example, D3, D4, D5, \8230, wherein DN and D (N + 1) are not less than the deviation control value D, but D (N + 1) is greater than or equal to DN, the calculation is interrupted, and the grouping result when the difference value between the current and the maximum value and the minimum value is DN is taken;
DN is the difference value between the current after the (N-1) th exchange and the maximum value and the minimum value, and D (N + 1) is the difference value between the current after the N-th exchange and the maximum value and the minimum value;
n is the total number of the discuses meeting the requirement, p is the number of groups, and m is the number of the discuses in each group; generally, n is an arbitrary number between 4 and 4608, p is an arbitrary integer between 2 and 96, and m is an arbitrary integer between 2 and 48.
The further technical scheme is as follows: the "performing a voltammetry test on each discus" in step S12 means:
connecting a winding in the discus, applying induction voltage, and measuring the no-load current I;
the test principle is as follows:
the induction voltage calculation formula is as follows: e = 4.44\402wb m A z ；
Wherein:
402: power frequency (Hz);
w: the number of winding turns;
B m : core average magnetic density (t);
A z : effective area of single discus (m) 2 ）。
Due to the adoption of the technical scheme, compared with the prior art, the grouping and matching method of the discus for the iron core of the self-saturation reactor of the silicon rectifying device has the following beneficial effects:
1. when the invention is selected in groups, the difference value D1 is controlled to be smaller than the deviation control value D by calculating the sum of the discus currents of each group and the difference value D1 of the current sum of the maximum value and the current sum of the minimum value, so that the difference of the discus currents of each group is minimum or meets the set requirement, the magnetic conductivity of the iron cores of each branch is close to the same, the output voltage of each branch in the silicon rectifying device is balanced, the alternating current power output of the corresponding branch in the rectifying transformer is consistent, the loss of the rectifying device is reduced, and the service life of the device is prolonged;
2. because the output voltage of each branch of the silicon rectifying device is consistent, the circulating current loss can be reduced, and the service life of a transformer winding and a rectifying element corresponding to the branch with high power output is prolonged;
3. because the output voltage of each branch circuit is balanced, the direct current output by the rectifying device is more stable, the stability of the whole rectifying system is favorably improved, and the performance of the electric equipment is improved;
4. the grouping matching method of the iron cakes for the iron cores of the self-saturation reactor is also suitable for other transformers adopting the self-saturation reactor to regulate voltage, such as electric furnace transformers and the like, when the self-saturation reactor is applied to regulate voltage, the technology of the invention is applied, the inconsistent output voltage caused by the inconsistent magnetic conductivity of each phase and each branch of the saturation reactor can not be generated, and the output of each phase and each branch is balanced.
The technical features of a method for grouping and matching iron cakes for a self-saturable reactor core of a silicon rectifier device according to the present invention will be further described with reference to the accompanying drawings and examples.
Drawings
FIG. 1 is a schematic diagram of a current-voltage characteristic test circuit;
FIG. 2 is a diagram illustrating the grouping order of the second discus.
Description of the preferred embodiment
Example one
A grouping and matching method of discus for a self-saturation reactor iron core of a silicon rectifying device comprises the following steps:
s1. Test of serial number
S11, numbering the iron cakes for the iron cores of the self-saturation reactors qualified in annealing;
s12, carrying out volt-ampere characteristic test on each discus, and measuring and recording the no-load current of the corresponding discus;
s2, grouping
S21, arranging n discuses meeting the requirements from large to small according to the no-load current: t1, T2 and T3 \8230Tn, wherein T1 represents the discus with the largest no-load current, T2 represents the discus with the second largest no-load current, and \8230Tnrepresents the discus with the smallest no-load current;
s22, dividing n discuss into p groups, and averaging m discuss in each group;
s23, a distribution principle: according to the sequence of the no-load current from large to small, each group is distributed one time;
s24, specific distribution step:
s241, taking the first batch (1 st to p th) of discuses from the first component to the p th component in the positive sequence: t1 is divided into a first group, T2 is divided into a second group, \ 8230, tp-1 is divided into a p-1 group, and Tp is divided into a p-group;
s242, taking a second batch of (p +1 st to 2p nd) discuses from the p component to the first component in reverse order: tp +1 is divided into the p group, tp +2 is divided into the p-1 group, \8230, T2p-1 is divided into the second group, and T2p is divided into the first group;
s243, taking a third batch of (2p +1 to 3 p) discuses from the first component to the p group in positive sequence: t2p +1 is divided into a first group, T2p +2 is divided into a second group, \8230, T3p-1 is divided into a p-1 group, and T3p is divided into a p-group; \8230 \ 8230
The process is circulated until all the n discuses are distributed;
s3, calculating the no-load current of the discus and determining a matching result;
s31, setting a deviation control value D, wherein the D is a positive number which is not more than 10% of the average value of all discus currents;
s32, calculating the sum of the current of each group of discus: adding the no-load currents of m discuss in a group to obtain the current sum of the discus in the group, wherein p groups of discuss have p current sums;
s33, marking the current and the maximum value and the current and the minimum value in the p current sums, and calculating the current sum difference D1 of the p current sums;
s331, if the difference value D1 is smaller than the deviation control value D, the grouping meets the set requirement, and the grouping is the matching result;
s332, if the difference value D1 is larger than the deviation control value D, entering the next step;
s34, exchanging the discus of the maximum current in the current and maximum value group with the discus of the minimum current in the current and minimum value group, calculating the no-load current sum of each group of discus, and calculating the difference D2 between the current sum maximum value and the current sum minimum value;
s341, if the difference D2 between the current after the exchange and the maximum value and the minimum value is smaller than the deviation control value D, interrupting the calculation, and taking the grouping result of this time;
s342, if the difference D2 between the adjusted current and the maximum value and the minimum value is larger than the deviation control value D, entering the next step;
s35, repeating S34, and calculating differences D3, D4, D5, 8230, 8230between the maximum value and the minimum value of each group of currents after each exchangeDN；
S351, stopping calculation until D3, D4 and D5 \8230, wherein DN meets the condition of being less than a deviation control value D, and taking the current grouping result;
s352, for example, D3, D4, D5, \8230, wherein DN and D (N + 1) are not less than the deviation control value D, but D (N + 1) is greater than or equal to DN, the calculation is interrupted, and the grouping result when the difference value between the current and the maximum value and the minimum value is DN is taken;
DN is the difference value between the current after the (N-1) th exchange and the maximum value and the minimum value, and D (N + 1) is the difference value between the current after the N-th exchange and the maximum value and the minimum value;
n is the total number of the discuses meeting the requirement, p is the number of groups, and m is the number of the discuses in each group; generally, n is an arbitrary number between 4 and 4608, p is an arbitrary integer between 2 and 96, and m is an arbitrary integer between 2 and 48.
The "voltammetry test for each discus" described in the above step S12 means:
connecting a winding in the discus, applying induction voltage, and measuring the no-load current I;
the test principle is as follows:
the induction voltage calculation formula is as follows: e =4.44 402wb m A z ；
Wherein:
402: power frequency (Hz);
w: the number of winding turns;
B m : core average magnetic density (t);
A z : effective area of single discus (m) 2 ）。
Example two
A grouping and matching method of iron cakes for a self-saturable reactor iron core of a silicon rectifying device comprises the following steps: the method comprises the following steps that a certain silicon rectifying device is provided with 6 branches, a corresponding self-saturation reactor is also provided with 6 branches, a self-saturation reactor iron core of each branch is formed by stacking 4 annular discuses, the steps are basically the same as those of the first embodiment, the total number n of the discuses meeting the requirements is 24, the number p of groups is 6, the number m of the discuses in each group is 4, 24 discuses are divided into 6 groups during selection, and each group is provided with 4 discuses on average;
s21, firstly, arranging 24 discuses meeting the requirements from large to small according to the no-load current: t1, T2 and T3 \8230andT 24, wherein T1 represents a discus with the largest no-load current, T2 represents a discus with the second largest no-load current, \8230, and T24 represents a discus with the smallest no-load current;
s22, dividing 24 discuses into 6 groups, and averaging 4 discuses in each group;
s23, a distribution principle: according to the sequence of the no-load current from large to small, each group is distributed one by one;
s24, specific distribution step:
s241, taking the first batch (1 st to 6 th) of discus in positive sequence from the first component to the sixth component: t1 is divided into a first group, T2 is divided into a second group, T3 is divided into a third group, T4 is divided into a fourth group, T5 is divided into a fifth group, and T6 is divided into a sixth group;
s242, the second batch of 6 (7 th to 12 th) discuses is divided into a first group from a sixth group in a reverse order: t7 is divided into a sixth group, T8 is divided into a fifth group, T9 is divided into a fourth group, T10 is divided into a third group, T11 is divided into a second group, and T12 is divided into a first group;
s243, the third 6 (13 th to 18 th) discuses are sequentially divided into a first group and a sixth group according to the positive sequence: t13 to the first group, T14 to the second group, T15 to the third group, T16 to the fourth group, T17 to the fifth group, T18 to the sixth group;
s244, a fourth batch of 6 (19 th to 24 th) discuses is prepared from a sixth component to a first component in a reverse order: t19 to the sixth group, T20 to the fifth group, T21 to the fourth group, T22 to the third group, T23 to the second group, T24 to the first group; (see FIG. 2 for groupings above)
Step S3 is the same as in the first embodiment.
EXAMPLE III
A grouping and matching method of iron cakes for a self-saturable reactor iron core of a silicon rectifying device comprises the following steps: the steps of a certain silicon rectifying device are basically the same as those of the first embodiment, except that the total number n of the required discuses is 288, the number p of the grouped groups is 24, the number m of the discuses in each group is 12, the 288 discuses are divided into 24 groups during selection, and each group has 12 discuses on average.
Claims (2)
1. A grouping matching method of iron cakes for a self-saturation reactor iron core of a silicon rectifying device is characterized by comprising the following steps: the method comprises the following steps:
s1. Test of serial number
S11, numbering the iron cakes for the iron cores of the self-saturation reactors qualified in annealing;
s12, performing volt-ampere characteristic test on each discus, and measuring and recording the no-load current of the corresponding discus;
s2, grouping
S21, arranging n discuses meeting the requirements from large to small according to the no-load current: t1, T2 and T3 \8230andTn, wherein T1 represents the discus with the largest no-load current, and Tn represents the discus with the smallest no-load current;
s22, dividing n discuses into p groups, and averaging m discuses in each group;
s23, a distribution principle: according to the sequence of the no-load current from large to small, each group is distributed one time;
s24, specific distribution step:
s241, taking the first batch of p discuses from the first component to the p group in the positive sequence: t1 is divided into a first group, T2 is divided into a second group, \ 8230, tp-1 is divided into a p-1 group, and Tp is divided into a p-group;
s242, taking a second batch of p discuses from the p component to the first group in reverse order: tp +1 is divided into the p group, tp +2 is divided into the p-1 group, \8230, T2p-1 is divided into the second group, and T2p is divided into the first group;
s243, taking a third batch of 3p discuses from the first component to the pth group in a positive sequence: t2p +1 is divided into a first group, T2p +2 is divided into a second group, \8230, T3p-1 is divided into a p-1 group, and T3p is divided into a p-group; \8230 \ 8230
The process is circulated until all the n discuses are distributed;
s3, calculating the no-load current of the discus and determining a matching result;
s31, setting a deviation control value D, wherein the D is a positive number which is not more than 10% of the average value of all discus currents;
s32, calculating the sum of the current of each group of discuses: adding the no-load currents of m discuses in a group to obtain the current sum of the discuses in the group, wherein p groups of discuses have p current sums;
s33, marking the current sum maximum value and the current sum minimum value in the p current sums, and calculating the current sum difference D1 of the p current sums;
s331, if the difference value D1 is smaller than the deviation control value D, the grouping meets the set requirement, and the grouping is the matching result;
s332, if the difference value D1 is larger than the deviation control value D, entering the next step;
s34, exchanging the discus of the maximum current in the current and maximum value group with the discus of the minimum current in the current and minimum value group, calculating the no-load current sum of each group of discus, and calculating the difference D2 between the current sum maximum value and the current sum minimum value;
s341, if the difference D2 between the modulated current and the maximum value and the minimum value is smaller than the deviation control value D, interrupting the calculation and taking the grouping result of this time;
s342, if the difference D2 between the adjusted current and the maximum value and the minimum value is larger than the deviation control value D, entering the next step;
s35, repeating S34, and calculating differences D3, D4, D5, 8230, 8230between the maximum value and the minimum value of each group of currents after each exchangeDN；
S351, stopping calculation until D3, D4 and D5 \8230 \8230andDN meet the condition that the DN is smaller than a deviation control value D, and taking the current grouping result;
s352, for example, D3, D4, D5, \8230, wherein DN and D (N + 1) are not less than the deviation control value D, but D (N + 1) is greater than or equal to DN, the calculation is interrupted, and the grouping result when the difference value between the current and the maximum value and the minimum value is DN is taken;
DN is the difference value between the current after the (N-1) th exchange and the maximum value and the minimum value, and D (N + 1) is the difference value between the current after the N-th exchange and the maximum value and the minimum value;
n is the total number of the discuses meeting the requirement, p is the number of groups, and m is the number of the discuses in each group; generally, n is an arbitrary number between 4 and 4608, p is an arbitrary integer between 2 and 96, and m is an arbitrary integer between 2 and 48.
2. The method for grouping and matching the discus used for the self-saturable reactor core of the silicon rectifying device according to claim 1, characterized in that: the "performing a voltammetry test on each discus" in step S12 means:
connecting a winding in the discus, applying induction voltage, and measuring the no-load current I;
the test principle is as follows:
the induction voltage calculation formula is as follows: e =4.44 402wb m A z ；
Wherein:
402: power frequency (Hz);
w: the number of winding turns;
B m : core average magnetic density (t);
A z : effective cross-sectional area (m) of single discus 2 ）。
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