CN112198341A - Thin film metal coating resistance test contact and test system - Google Patents
Thin film metal coating resistance test contact and test system Download PDFInfo
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- CN112198341A CN112198341A CN202011077265.3A CN202011077265A CN112198341A CN 112198341 A CN112198341 A CN 112198341A CN 202011077265 A CN202011077265 A CN 202011077265A CN 112198341 A CN112198341 A CN 112198341A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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Abstract
本发明提供一种薄膜金属镀层电阻测试触头及测试系统，薄膜金属镀层电阻测试触头包括壳体、多个触片、连接线路和通信接口；连接线路设置于壳体内，壳体开设一开口，通信接口设置于开口内，通信接口与连接线路电连接，触片排列设置于壳体的一面，各触片与连接线路电连接，触片的形状为长条形。长条形的触片能够增大测试触点的接触面积，有效提高测试高阻值镀层的稳定性，并且由于触头通过通信接口与主机连接，不同型号的触头的触片之间的间距不同，这样，可根据测试网格尺寸需求更换的测试触头，获得对应型号的测试触头，系统可自动获取该型号的测试触头的电阻计算参数，从而测得当前测试方阻值，使得系统可匹配不同形状的网格安全膜。
The invention provides a thin-film metal coating resistance test contact and a test system. The thin-film metal coating resistance test contact comprises a housing, a plurality of contact pieces, a connection line and a communication interface; the connection line is arranged in the housing, and the housing is provided with an opening The communication interface is arranged in the opening, the communication interface is electrically connected with the connecting line, the contact pieces are arranged on one side of the casing, each contact piece is electrically connected with the connecting line, and the shape of the contact piece is a long strip. The long-shaped contacts can increase the contact area of the test contacts and effectively improve the stability of testing high-resistance coatings. Since the contacts are connected to the host through the communication interface, the distance between the contacts of different types of contacts In this way, the test contacts that can be replaced according to the size of the test grid can obtain the test contacts of the corresponding type, and the system can automatically obtain the resistance calculation parameters of the test contacts of this type, so as to measure the current resistance value of the test square, so that The system can match different shapes of mesh safety film.
Description
Technical Field
The invention relates to the technical field of resistance testing of metal coatings, in particular to a thin-film metal coating resistance testing contact and a testing system.
Background
When testing the resistance (abbreviated as sheet resistance) of a thin film metal coating square, the conventional testing methods generally have two types: two-needle and four-needle. It is common practice in the industry to use a four-probe method for testing. The sheet resistance of the metal coating is generally from a few ohms to tens of ohms, and the four-needle method is adopted for testing more accurately. The square resistance test head adopts 4 cylindrical 1mm copper bars as electric shock contacts for testing. On one hand: the fixed test contact of the standard sheet resistance meter can meet the traditional test of the sheet resistance of the coating with the low resistance value below ten-odd ohm, and when the sheet resistance with the high resistance value of dozens ohm is tested, the coating of the high sheet resistance film is thin and is not stably contacted with the cylindrical small contact, so that the change of the test sheet resistance value is large, and an accurate value cannot be obtained. On the other hand: due to the fixed size of the test contact, when the contact tests the changeable grid safety film, one device cannot be matched with the changeable safety film grid area tests such as triangle, hexagon and square of the safety film. .
Disclosure of Invention
In view of the above, it is desirable to provide a thin film metal plating resistance test contact and a test system.
A thin film metal coated resistance test contact comprising: the device comprises a shell, a plurality of contact pieces, a connecting circuit and a communication interface;
the connecting circuit is arranged in the shell, an opening is formed in the shell, the communication interface is arranged in the opening and electrically connected with the connecting circuit, the contact plates are arranged on one surface of the shell, the contact plates are electrically connected with the connecting circuit, and the contact plates are in a strip shape.
In one embodiment, the contacts are parallel to each other.
In one embodiment, each of the contact pads is a gold red copper plated pad.
In one embodiment, the number of contacts is four.
In one embodiment, the four contacts include a first contact, a second contact, a third contact and a fourth contact which are arranged in sequence, the second contact and the third contact are located between the first contact and the fourth contact, and the distance between the first contact and the second contact is equal to the distance between the third contact and the fourth contact.
In one embodiment, the connector further comprises a trigger button, the trigger button is arranged on the surface of one side of the shell, and the trigger button is electrically connected with the connecting line.
In one embodiment, the communication interface is an RJ45 interface.
A film metal coating resistance test system comprises a host machine and a film metal coating resistance test contact in any embodiment, wherein the host machine is electrically connected with the film metal coating resistance test contact.
In one embodiment, the host includes a resistance tester and a control module, the control module is electrically connected to the resistance tester, and the resistance tester is electrically connected to the communication interface of the thin film metal plated resistance test contact.
In one embodiment, the control module comprises a touch control screen.
Above-mentioned film metallic coating resistance test contact and test system, the contact area of test contact can be increased to the contact blade of rectangular shape, effectively improve the stability of test high resistance cladding material, and because the contact passes through communication interface and is connected with the host computer, the interval between the contact blade of the contact of different models is different, thus, the test contact that can change according to test net size demand, obtain the test contact of corresponding model, the system can acquire the resistance calculation parameter of the test contact of this model automatically, thereby survey the current test side resistance, make the system can match the net safety film of different shapes, make the test more nimble.
Drawings
FIG. 1 is a schematic perspective view of a thin film metal plated resistance test contact according to one embodiment;
FIG. 2 is a schematic diagram of another orientation of a thin film metal plated resistance test contact in one embodiment;
FIG. 3 is a schematic diagram of a connection block of the thin film metallization resistance testing system in one embodiment;
fig. 4 is a schematic perspective view of a thin film metal plating resistance test system in an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.
Example one
In this embodiment, as shown in fig. 1 and 2, a thin film metal plated resistance test contact 100 is provided, which includes: a housing 110, a plurality of contacts 120, a connection line and a communication interface 130; the connecting circuit is disposed in the housing 110, the housing 110 has an opening, the communication interface 130 is disposed in the opening, the communication interface 130 is electrically connected to the connecting circuit, the contacts 120 are disposed on one surface of the housing 110, each contact 120 is electrically connected to the connecting circuit, and the contacts 120 are in a strip shape.
Specifically, the communication interface 130 is used for connecting to a host and communicating with the host. In one embodiment, the communication interface 130 is an RJ45 interface. In this manner, the test contacts 100 may be communicatively coupled to a host via a network cable. In this embodiment, the contact 120 is different from a conventional cylindrical structure, and has an elongated structure, the length direction of the contact 120 is parallel to a plane of one surface of the housing 110, specifically, the housing 110 is a rectangular parallelepiped or a cube structure, the plurality of contacts 120 are disposed on the bottom surface of the housing 110, and the length direction of the contact 120 is parallel to the bottom surface of the housing 110. The opening is opened at the rear end face of the housing 110, and the contact 120 is electrically connected with the communication interface 130 through a connection line in the housing 110, so that the contact 120 can be electrically connected with a host, and thus, the host can be connected with the thin film metal coating through the contact 120 to measure the square resistance of the thin film metal coating.
In one embodiment, the contacts 120 of different models of test contacts 100 are spaced differently. In this embodiment, the test contacts 100 of different models have different pitches of the contact pieces 120 on the test contact 100, and it should be understood that the formula of the sheet resistance test is Rs ═ R × W/L, where Rs is the sheet resistance and unit Ω/port, R is the resistance value tested by the contact pieces 120 on the contact, unit Ω, W is the width of the test material, and L is the pitch between the contact pieces 120. The values of L of different test contacts 100 are different, so that a tester can input the model of the corresponding test contact 100 at the host computer, and the host computer is used for acquiring the distance L between the corresponding contact pieces 120 according to the model of the test contact 100, i.e. calculating to obtain the corresponding sheet resistance.
In this embodiment, an RJ45 interface is used, so that the test contact 100 can be conveniently connected to a host, and the test contact 100 is more convenient to install, use and detach. The strip-shaped contact piece 120 can increase the contact area of the test contact, the stability of testing a high-resistance coating is effectively improved, the contact is connected with a host through the communication interface 130, the distances among the contact pieces 120 of the contact of different types are different, therefore, the test contact 100 which can be replaced according to the size requirement of a test grid can obtain the test contact 100 of a corresponding type, the system can automatically obtain the resistance calculation parameters of the test contact 100 of the type, the current test side resistance can be tested, the system can be matched with grid safety films of different shapes, and the test is more flexible.
In one embodiment, the contacts 120 are parallel to each other. In this embodiment, the length directions of the contact pieces 120 are parallel to each other, which is beneficial to the accurate measurement of the thin film metal coating.
In one embodiment, the number of pads 120 is four. In one embodiment, the four contacts 120 include a first contact 121, a second contact 122, a third contact 123 and a fourth contact 124 arranged in sequence, the second contact 122 and the third contact 123 are located between the first contact 121 and the fourth contact 124, and the distance between the first contact 121 and the second contact 122 is equal to the distance between the third contact 123 and the fourth contact 124. As shown in fig. 1, the first contact 121 is a contact 120A, the second contact 122 is a contact 120B, the third contact 123 is a contact 120C, the fourth contact 124 is a contact 120D, and the distance between the contact 120B and the contact 120C is L in the resistance test tolerance.
In one embodiment, each contact 120 is a gold-plated copper plate. In this embodiment, the contact sheet 120 is made of red copper and the surface thereof is plated with gold, so that the contact sheet 120 has good conductivity and can effectively improve the test precision.
In one embodiment, the test contact 100 further includes a trigger button 140, the trigger button 140 is disposed on a surface of one side of the housing 110, and the trigger button 140 is electrically connected to the connection line. In this embodiment, the trigger button 140 may also be referred to as a trigger button, the trigger button 140 is disposed on a side surface of one side of the housing 110, the trigger button 140 is configured to send a trigger signal to a host, and the host is configured to sample and store the measured resistance value when receiving the trigger signal.
Example two
In this embodiment, as shown in fig. 3, a thin film metal plating resistance testing system 10 is provided, which includes a host 200, and further includes a thin film metal plating resistance testing contact described in any of the above embodiments, where the host 200 is electrically connected to the thin film metal plating resistance testing contact.
In this embodiment, the host 200 is connected to the communication interface of the test contact through a network cable, and the communication interface is an RJ45 interface. The test contact of different models, the interval of the contact blade on the test contact is different, the tester can input the model of the test contact on host computer 200, after the host computer 200 obtains the model of the test contact, obtain the interval of contact blade B and contact blade C on the test contact, and obtain the computational formula parameter of this model contact, after the contact blade contacts with the metallic film, measure the resistance of metallic film and contact blade B and contact blade C contact point, thus can be according to the square resistance test formula for Rs R W/L measures the square resistance of the cladding material of metallic film, wherein, Rs is the square resistance, unit omega/mouth, R is the resistance value that the contact blade on the contact tested, unit omega, W is the test material width, L is the interval between the contact blades.
In this embodiment, because the test contact is removable, like this, can be according to the nimble test contact of changing of test grid size demand, realize that a host computer 200 equipment can satisfy multiple metal film test, reduce customization professional equipment quantity, reduce test equipment and drop into, reduce test cost.
In addition, the contact area of the test contact can be increased by the strip-shaped contact piece, the stability of testing the high-resistance coating is effectively improved, and the contact is connected with the host 200 through the communication interface, the distances among the contact pieces of the contact of different models are different, therefore, the test contact which can be replaced according to the size requirement of the test grid can be obtained, the test contact of the corresponding model can be obtained, the system 10 can automatically obtain the resistance calculation parameters of the test contact of the model, the current test side resistance can be measured, the system 10 can be matched with grid safety films of different shapes, and the test is more flexible.
In one embodiment, as shown in fig. 3 and 4, the host 200 includes a resistance tester 300 and a control module, the control module is electrically connected to the resistance tester 300, and the resistance tester 300 is electrically connected to the communication interface of the thin film metal plated resistance test contact.
In this embodiment, the resistance tester 300 is a high-precision bridge resistance tester. The resistance tester 300 is used for measuring and obtaining the resistance R of the metal film through the contact of the contact piece of the test contact and the metal film, and the control module is used for obtaining the model of the test contact and obtaining the width parameter of the material. In addition, the control module is also used for controlling the operation of the resistance tester 300, reading the measured resistance value from the resistance tester 300, and storing the resistance value in the storage module.
In one embodiment, as shown in fig. 3 and 4, the control module includes a touch control screen 400. The touch control panel 400 is electrically connected to the resistance tester 300, and in this embodiment, the touch control panel 400 is used to input the model number of the test contact and the material width parameter, so that the touch control panel 400 obtains the model number and the material width parameter of the test contact input by the tester, and in addition, the touch control panel 400 is also used to display the test parameters and the historical data.
In this embodiment, as shown in fig. 4, the host 200 has a test port 201 for connecting with the communication interface of the test contact, and the test port is an RJ45 interface, so that the test port of the host 200 can be connected with the communication interface of the test contact through a network cable. The host 200 further has a debugging port 202, which is an RJ45 interface, for connecting with an external computer, so that a tester can connect with the debugging port of the host 200 through the external computer, and then debug and program the touch control screen 400 of the host 200. The host 200 further has a USB (Universal Serial Bus) interface 203 for connecting an external memory, so that the tested resistance value can be derived and stored in the external memory by the operation of the touch control panel 400.
In one embodiment, the host 200 also includes a storage module. In one embodiment, the memory module is a register. In this embodiment, the storage module is configured to pre-store the model number of each test contact and the calculation formula parameter corresponding to each test contact.
In one embodiment, the test contact further comprises a trigger button disposed on a surface of one side of the housing, the trigger button being electrically connected to the connection line. The trigger button is electrically connected to the touch control screen 400 of the host 200 through a connection line. The trigger button is used for sending a sampling signal to the touch control screen 400 when receiving a pressing instruction, and triggering the touch control screen 400 to sample and store the detected resistance value. For example, the resistance tester 300 and the touch control panel 400 have registers, respectively.
In one embodiment, the test procedure is as follows:
the resistance tester 300 is used for measuring a resistance value R through the contact of the contact piece of the test contact with the metal film, sending the resistance value R to a register of the resistance tester 300, the touch control screen 400 is used for reading the register data of the resistance tester 300 to obtain the resistance value R and storing the resistance value R to a register LW1001 of the touch control screen 400, the touch control screen 400 obtains a selection instruction, obtains a contact model according to the selection instruction, obtains a contact spacing value L matched with a contact signal, and stores the contact spacing value L to a register LW1002 of the touch control screen 400, and the touch control screen 400 obtains a measured material width value W manually input by a user and assigns the measured material width value W to the register LW1003 of the touch control screen 400; the touch control screen 400 obtains a pre-programmed program operation formula Rs which is R multiplied by W/L, assigns the Rs to a register LW1004 of the touch control screen 400, the sampling test rate is 100ms, the test frequency is 10 times, the period is 1S, and assigns the Rs to the register LW1005 of the touch control screen 400 after calculating the average value of the Rs; the touch control screen 400 displays an Rs value register LW 1005. After obtaining a confirmation instruction of the user for confirming the input of the test value, the touch control screen 400 obtains a pressing instruction of a trigger button of a contact, obtains a sampling signal, and sends the sampling signal to a register LW2001 of the touch control screen 400, wherein the register LW2001 triggers a sampling program, samples the current date and time and a register LW1005 value, and stores the current date and time and the register LW1005 value Rs. And when the memory of the touch screen is used up, the earliest record can be automatically deleted, and the records are circularly recorded.
EXAMPLE III
In the embodiment, a high-precision direct current/alternating current low-resistance tester (short for: high-precision low-resistance tester) + a touch screen + a test contact is adopted;
the high-precision low-resistance tester is formed by processing and assembling a standard instrument, a touch screen, a standard industrial control touch screen and a test contact.
After the width parameters of the materials are set by the touch screen, the required test contact is selected, the model of the test fixture is input into the touch screen, and the sheet resistance value is automatically converted through an internal program formula and displayed on the touch screen during testing.
1. The sheet resistance test formula is as follows:
Rs＝R×W/L
note: rs is square resistance and unit omega/mouth; r is the resistance value of a four-pin test in unit omega; w: the width of the test material, L, the test probe spacing,
2. testing a contact:
2.1 communication interface: the RJ45 is connected with a host computer by a network cable;
2.2 record trigger button: after the contact is placed in the test area, reading the numerical value, and if electronic data is required to be recorded, pressing a trigger button and automatically and electronically archiving;
2.3 contact A-B-C-D: the contact sheet is a red copper gold-plated sheet, and the BC interval is a formula value L;
2.4 one host machine is matched with contacts with different BC pitches to meet the test of materials with different shapes, and the contact model can be directly selected on the touch screen host machine;
3. testing the host computer:
3.1 communication interface: and the RJ45 interface and the test contact communication interface are connected by a network cable to form a test system.
3.2 debugging port: and an RJ45 interface for programming the touch screen.
3.3USB interface: and when the USB flash disk is inserted, the recorded sheet resistance data can be exported through the operation of the touch screen.
3.4 three-in-one socket: comprises a 220V input pin socket, a fuse tube and a switch.
3.5 touch screen: the device has the advantages of displaying test parameters, displaying historical data, selecting contact types and selecting material width parameters.
3.6 high accuracy low resistance tester: standard instrument, test resistance R.
3.7 switching power supply: and the internal direct current power supply converts 220V into 24V direct current to the touch screen.
In this embodiment, the hardware part is selected and assembled: the high-precision low-resistance tester and the touch screen are provided with serial ports RS 232/Ethernet ports RJ45 interfaces to meet the Modbus TCP/RTU communication protocol.
Hardware connection part: the test contact is connected to a host, and the host is connected with a power supply 220V;
the testing process comprises the following steps: the contact piece of the test contact is contacted with the metal film, the high-precision low-resistance tester tests the resistance R and sends the resistance R to the equipment register, the touch screen reads the high-precision low-resistance tester register data R by adopting serial port communication and places the data in a local register LW1001 of the touch screen, the model of a clamp is selected by the touch screen, the system automatically matches and introduces a contact spacing value L to the local register LW1002, the touch screen manually inputs a width value W of a tested material and assigns the value to an internal register LW1003 of the touch screen; calculating Rs (R multiplied by W/L) through a writing program in the touch screen, assigning the Rs to a touch screen local register LW1004, wherein the sampling test rate is 100ms, the test frequency is 10 times, the period is 1S, and assigning the Rs to the touch screen register LW1005 after calculating the average value of the Rs; the touch screen display window Rs takes a value of the register LW 1005. After the test value is confirmed, a contact trigger button is pressed, a sampling signal is sent to a touch screen register LW2001, the LW2001 triggers a sampling program, the current date and time and the value of a register LW1005 are sampled, and the sampling signal is stored locally. And when the memory of the touch screen is used up, the earliest record can be automatically deleted, and the records are circularly recorded.
Material test mode: testing the measured dimension W value by using a scale magnifier of 10X times, and inputting the measured dimension W value into an internal register LW1004 of the touch screen for assignment;
the touch screen history record can be divided by one key, and an Excle data table is exported to the U disk.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
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| CN115453197A (en) * | 2022-08-17 | 2022-12-09 | 重庆金美新材料科技有限公司 | Conducting film surface resistance test system |
| CN116381345A (en) * | 2022-07-21 | 2023-07-04 | 微龛(广州)半导体有限公司 | Thin film resistor measuring structure, measuring method and measuring system |
| CN117128844A (en) * | 2023-09-01 | 2023-11-28 | 国网甘肃省电力公司电力科学研究院 | A kind of power grid equipment plating detection method and detector |
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| CN113449831A (en) * | 2021-07-30 | 2021-09-28 | 新疆金牛能源物联网科技股份有限公司 | Transmitter configuration device, transmitter and device for transmitter configuration |
| CN116381345A (en) * | 2022-07-21 | 2023-07-04 | 微龛(广州)半导体有限公司 | Thin film resistor measuring structure, measuring method and measuring system |
| CN116381345B (en) * | 2022-07-21 | 2023-10-31 | 微龛(广州)半导体有限公司 | Thin film resistor measuring structure, measuring method and measuring system |
| CN115453197A (en) * | 2022-08-17 | 2022-12-09 | 重庆金美新材料科技有限公司 | Conducting film surface resistance test system |
| CN117128844A (en) * | 2023-09-01 | 2023-11-28 | 国网甘肃省电力公司电力科学研究院 | A kind of power grid equipment plating detection method and detector |
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