CN112214366A - Test methods, devices, systems, equipment and media - Google Patents

Abstract

The present application is applicable to the field of testing technology, and provides a testing method, including: obtaining a configuration file; parsing the configuration file to obtain a scene configuration parameter set in the configuration file, and sending the parsed scene configuration parameter set to the device under test and the reference The device, the scenario configuration parameter set is used to select the ith scenario from N scenarios, where 1≤i≤N; receive the test result of the device under test based on the scenario configuration parameter set, and receive the reference device based on the scenario configuration parameter Set the test results for testing; determine the device status of the device under test in the i-th scenario according to the test results of the device under test and the test results of the reference device. The present application selects the scene through the scene configuration parameter set, which helps to improve the test efficiency of the device to be tested.

Description

Test methods, devices, systems, equipment and media

technical field

The present application belongs to the technical field of testing, and in particular, relates to a testing method, device, system, equipment and medium.

Background technique

Before a device (eg, a processor) is put into use, it is usually necessary to test the device to find out the problems existing in the device, so that the problems existing in the device can be corrected in time.

In the related art, it is necessary to improve the test efficiency for testing equipment.

SUMMARY OF THE INVENTION

The embodiments of the present application provide a testing method, apparatus, system, equipment and medium, which aim to solve the problem of insufficient testing efficiency for testing equipment in the related art.

In a first aspect, the embodiments of the present application provide a testing method, the method comprising:

get the configuration file;

Parse the configuration file to obtain the scene configuration parameter set in the configuration file, and send the parsed scene configuration parameter set to the device under test and the reference device respectively, the scene configuration parameter set is used to select the ith scene from the N scenes, Among them, 1≤i≤N;

Receive the test results of the device under test based on the scenario configuration parameter set, and receive the test results of the reference device based on the scenario configuration parameter set;

According to the test result of the device under test and the test result of the reference device, determine the device state of the device under test in the ith scenario.

Further, obtaining the configuration file includes any one or more of the following:

Generate a configuration file according to the preset configuration file generation steps;

Receive the configuration file entered by the user;

Extract configuration files from the preset storage area.

Further, the configuration file is generated according to the preset configuration file generation steps, including:

obtaining a preset scene configuration parameter set, and assigning values to each scene configuration parameter in the scene configuration parameter set, wherein different values of the scene configuration parameters correspond to different scenarios;

A configuration file is generated according to each scenario configuration parameter in the scenario configuration parameter set and the value of the corresponding scenario configuration parameter.

Further, according to the test result of the device under test and the test result of the reference device, determine the device state of the device under test in the i-th scenario, including:

If the difference between the test result of the device under test and the test result of the reference device is greater than the preset difference threshold, it is determined that the device state of the device under test in the ith scenario is an abnormal state.

Further, obtaining the configuration file includes:

When the test conditions are met, the configuration file is generated according to the preset configuration file generation steps.

Further, the test conditions include any one or more of the following:

Receive the test start information input by the user;

The test result is received and the current number of generated configuration files is less than the preset number of thresholds;

The test result is received and the total test duration currently used for the test is less than the preset duration threshold.

Further, the method also includes:

If the device state of the device to be tested in the i-th scenario is abnormal, the configuration file is stored.

Further, the format of the configuration file is JSON format.

In a second aspect, an embodiment of the present application provides a test system, the system includes: a test server, a device to be tested, and a reference device, wherein,

The test server is used to obtain the configuration file; parse the configuration file to obtain the scene configuration parameter set in the configuration file, and send the parsed scene configuration parameter set to the device under test and the reference device respectively. Select the ith scene from the scenes, where 1≤i≤N;

The device to be tested is used for testing based on the scene configuration parameter set and sending the test results to the test server;

Reference equipment for testing based on the scene configuration parameter set and sending the test results to the test server;

The test server is further configured to receive the test results of the device under test based on the scenario configuration parameter set, and receive the test results of the reference device based on the scenario configuration parameter set; according to the test results of the device under test and the test results of the reference device, Determine the device status of the device under test in the i-th scenario.

Further, the system also includes a hardware parsing device, and the hardware parsing device is respectively connected to the test server and the device to be tested in communication; and

In the test server, the configuration file is parsed to obtain the scene configuration parameter set in the configuration file, and the parsed scene configuration parameter set is sent to the device under test and the reference device, including:

Parse the configuration file through the preset parsing program, and send the parsed scene configuration parameter set to the reference device:

The configuration file is sent to the hardware parsing device connected in communication, so that the hardware parsing device parses the configuration file, encapsulates the parsed scene configuration parameter set into an instruction program, and sends the scene configuration parameter set in the form of an instruction program to the device under test.

Further, the device under test includes a program memory, a control unit, an external input data direct storage accessor, an external output data direct storage accessor, a double rate synchronous dynamic random access memory, a multiplex data selector and a data memory; and

If the scene configuration parameter set sent to the device under test is a scene configuration parameter set in the form of an instruction program, and the scene configuration parameter set includes a first parameter used to indicate read data or write data, a first parameter used to indicate source address information The second parameter and the third parameter used to indicate the target address information, in the device under test, the test is performed based on the scene configuration parameter set, including:

The program memory receives and stores the instruction program;

The control unit reads the instruction program from the program memory, and if the first parameter indicates writing data, sends the instruction program to the external input data direct storage accessor; if the first parameter indicates reading data, sends the instruction program to the external Output data direct storage accessor;

The external input data direct storage accessor stores the data at the address corresponding to the source address information in the double-rate synchronous dynamic random access memory according to the source address information and target address information corresponding to the received instruction program through the multiplex data selector. at the address corresponding to the target address information in the memory;

The data storage sends the stored data and the address of the stored data to the test server;

The external output data direct storage accessor stores the data at the address corresponding to the source address information in the data memory to the double-rate synchronous dynamic random access device through the multiplex data selector according to the source address information and target address information corresponding to the received instruction program. at the address corresponding to the target address information in the memory;

The double rate synchronous DRAM sends the stored data and the address of the stored data to the test server.

In a third aspect, an embodiment of the present application provides a test device, the device comprising:

File acquisition unit, used to acquire configuration files;

The file parsing unit is used to parse the configuration file to obtain the scene configuration parameter set in the configuration file, and send the parsed scene configuration parameter set to the device under test and the reference device respectively. Select the ith scene, where 1≤i≤N;

a result receiving unit, configured to receive the test result of the device to be tested based on the scenario configuration parameter set, and the test result of the reference device's test based on the scenario configuration parameter set;

The abnormality judgment unit is used to determine the device state of the device under test in the i-th scenario according to the test result of the device under test and the test result of the reference device.

In a fourth aspect, an embodiment of the present application provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor implements the steps of the above testing method when the computer program is executed.

In a fifth aspect, an embodiment of the present application provides a computer-readable storage medium, where the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the test method are implemented.

In a sixth aspect, an embodiment of the present application provides a computer program product, which, when the computer program product runs on an electronic device, enables the electronic device to perform the test method of any one of the above-mentioned first aspects.

The beneficial effects of the embodiments of the present application are: selecting a scene through the scene configuration parameter set can make the scene selection simple and easy to implement. The scene for testing the device under test can be conveniently and quickly selected, thereby accelerating the test speed and helping to improve the test efficiency of testing the device under test.

It can be understood that, for the beneficial effects of the foregoing second aspect to the sixth aspect, reference may be made to the relevant descriptions in the foregoing first aspect, and details are not described herein again.

Description of drawings

In order to illustrate the technical solutions in the embodiments of the present application more clearly, the following briefly introduces the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only for the present application. In some embodiments, for those of ordinary skill in the art, other drawings can also be obtained according to these drawings without any creative effort.

1 is a schematic flowchart of a testing method provided by an embodiment of the present application;

2 is a schematic flowchart of a testing method provided by another embodiment of the present application;

3 is a schematic diagram of a test system provided by an embodiment of the present application;

4 is a schematic flowchart of a device under test performing a test based on a scene configuration parameter set provided by an embodiment of the present application;

5 is a schematic diagram of a test system provided by another embodiment of the present application;

6 is a schematic structural diagram of a test device provided by an embodiment of the present application;

FIG. 7 is a schematic structural diagram of an electronic device provided by an embodiment of the present application.

Detailed ways

In the following description, for the purpose of illustration rather than limitation, specific details such as a specific system structure and technology are set forth in order to provide a thorough understanding of the embodiments of the present application. However, it will be apparent to those skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

It is to be understood that, when used in this specification and the appended claims, the term "comprising" indicates the presence of the described feature, integer, step, operation, element and/or component, but does not exclude one or more other The presence or addition of features, integers, steps, operations, elements, components and/or sets thereof.

It will also be understood that, as used in this specification and the appended claims, the term "and/or" refers to and including any and all possible combinations of one or more of the associated listed items.

As used in the specification of this application and the appended claims, the term "if" may be contextually interpreted as "when" or "once" or "in response to determining" or "in response to detecting ". Similarly, the phrases "if it is determined" or "if the [described condition or event] is detected" may be interpreted, depending on the context, to mean "once it is determined" or "in response to the determination" or "once the [described condition or event] is detected. ]" or "in response to detection of the [described condition or event]".

In addition, in the description of the specification of the present application and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the description, and should not be construed as indicating or implying relative importance.

References in this specification to "one embodiment" or "some embodiments" and the like mean that a particular feature, structure or characteristic described in connection with the embodiment is included in one or more embodiments of the present application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in other embodiments," etc. in various places in this specification are not necessarily All refer to the same embodiment, but mean "one or more but not all embodiments" unless specifically emphasized otherwise. The terms "including", "including", "having" and their variants mean "including but not limited to" unless specifically emphasized otherwise.

The test method provided by the embodiment of the present application can be applied to a test server. The above-mentioned test server may be hardware or software. When the test server is hardware, it can be implemented as a distributed server cluster providing test services, or it can be implemented as a single server. When the test server is software, it can be installed in the servers listed above. It may be implemented as multiple software or software modules, or may be implemented as a single software or software module, which is not specifically limited here.

In order to illustrate the technical solutions of the present application, the following examples are used to illustrate.

Example 1

Please refer to FIG. 1, the embodiment of the present application provides a test method, including:

Step 101, obtaining a configuration file.

Among them, the configuration file usually refers to a file that configures the parameters of the test.

In this embodiment, the execution body of the above test method may be a test server. The above executive body can obtain the configuration file in various ways. For example, the above-mentioned execution body may acquire the configuration file by reading data from a setting device (eg, a U disk). For another example, the above-mentioned execution body may also obtain the configuration file by directly obtaining the information input by the user.

Step 102 , parse the configuration file to obtain a scene configuration parameter set in the configuration file, and send the parsed scene configuration parameter set to the device under test and the reference device, respectively.

The scene configuration parameter set is used to select the ith scene from the N scenes. Among them, 1≤i≤N.

The scene configuration parameters in the scene configuration parameter set may be various parameters used to describe the scene. For example, the scene configuration parameter may be a parameter used to describe the starting address of the read data, or may be a parameter used to describe the end address of the read data. Can also be a parameter describing how the data is read. Each scenario configuration parameter in the scenario configuration parameter set may describe a part of the scenario, and the combination of all scenario configuration parameters in the scenario configuration parameter set may describe a complete scenario.

In practical applications, the scene configuration parameters in the scene configuration parameter set may include, but are not limited to: parameters used to describe the data format, parameters used to describe the start address of the data memory, parameters used to describe the end address of the data memory, Parameters used to describe the address of the double-rate synchronous dynamic random access memory, etc. The value of the parameter used to describe the data format may be 1, 2, or 3. As an example, if the value of the parameter used to describe the data format is 1, it can be used to indicate that the data format is 16-bit data. If the value of the parameter used to describe the data format is 2, it can be used to indicate that the data format is 8-bit data. The value of the parameter used to describe the starting address of the data memory can be 0 to 100000. The value of the parameter used to describe the end address of the data memory can be 0 to 100000. The value of the parameter used to describe the address of the double-rate synchronous dynamic random access memory can be 0-100000.

The above scenario usually refers to a simulated scenario when the device is applied. For example, the above scenario may be: writing data in address A of storage unit A in the device to address B of storage unit B. The above scenario may also be: writing the data in the B address of the B storage unit in the device to the A address of the A storage unit. The above scenario can also be: write the data in the A storage unit in the equipment with the A1 address as the starting address and the A2 address as the ending address, and write the data in the B storage unit with the B1 address as the starting address. address.

The above-mentioned device to be tested may be various devices that need to be tested, such as a smart phone, a desktop computer, and the like. It should be pointed out that the above-mentioned device to be tested may be hardware or software.

In practice, the above-mentioned device to be tested may be a neural network processor (Neural Network ProcessorNNP). A neural network processor is usually a processor that uses a neural network method to process data. The neural network processor can be hardware or software. As an example, when the neural network processor is hardware, it may be implemented as a chip. As another example, when the neural network processor is software, it may be implemented as multiple software or software modules, or may be implemented as a single software or software module.

Among them, the above-mentioned reference equipment is usually used as a test control equipment. It should be noted that the above reference device may be hardware or software. In practice, the above reference device is usually a software device pre-built by the test server with the same or similar structure as the device under test.

Here, configuring the same configuration parameters for the device under test and the reference device can make the device under test and the reference device have exactly the same test input. In this way, the above-mentioned executive body can timely and accurately capture possible problems of the device under test by comparing the test outputs of the two, which helps to improve the test accuracy.

In this embodiment, since the configuration file usually has a certain format, the above-mentioned execution body can parse the configuration file according to the format of the configuration file, so as to obtain the scene configuration parameters in the configuration file, and the parameters of all the scene configuration parameters obtained by parsing are Set, that is, configure the parameter set for the above scenario. After obtaining the scene configuration parameter set, the above-mentioned executing subject may send the obtained scene configuration parameter set to the device under test and the reference device through a wired connection or a wireless connection. In this way, the above-mentioned device under test and the above-mentioned reference device can each perform testing based on the scene configuration parameter set.

The above-mentioned device under test can usually assign the parameter values of the configuration parameters of each scenario to the corresponding operating parameters in the device under test, so that the device under test can perform an operation test, thereby realizing the test of the device under test.

Similarly, the above-mentioned reference device can usually assign parameter values of configuration parameters of each scenario to corresponding operating parameters in the reference device, so that the reference device can perform a running test, thereby realizing the test of the reference device.

It should be pointed out that the specific process of testing the device under test and the reference device in this embodiment is not specifically limited.

Step 103: Receive a test result of the device under test performing the test based on the scenario configuration parameter set, and receive the test result of the reference device performing the test based on the scenario configuration parameter set.

In this embodiment, the above-mentioned execution body may receive the test result of the device under test and the test result of the reference device through wired connection or wireless connection.

Step 104, according to the test result of the device under test and the test result of the reference device, determine the device state of the device under test in the ith scenario.

The above-mentioned device state is usually a state used to indicate whether the device under test is abnormal. The above-mentioned device states may include normal states and abnormal states.

In this embodiment, the above-mentioned execution body may compare the test result of the device under test with the test result of the reference device, and determine the device state of the device under test by the result of the comparison between the two. As an example, when the test result of the device under test is the same as the test result of the reference device, the executive body may consider that the device under test is not abnormal and the device state is normal. Conversely, if the test result of the device under test is different from the test result of the reference device, it is considered that the device under test is currently abnormal, and the device state is abnormal.

In this embodiment, when the scene selected by the scene configuration parameter set is the ith scene, it is possible to test whether the device under test is abnormal in the ith scene. Testing the device under test in units of scenarios helps to timely and accurately discover the abnormality of the device under test for one or several specific scenarios, so as to solve the problem of the device under test in a targeted manner. Helps to improve the overall test efficiency of testing the device under test.

In this embodiment, selecting a scene through the scene configuration parameter set can make the scene selection simple and easy to implement. The scene for testing the device under test can be conveniently and quickly selected, thereby accelerating the test speed and helping to improve the test efficiency of testing the device under test. In addition, the reference device is used as the test comparison of the device under test, and the device under test and the reference device have exactly the same test input by configuring the same configuration parameters for the device under test and the reference device. The reference device and the device under test are tested in the same test environment. By comparing the test outputs of the two, it is possible to timely and accurately capture the possible problems of the device under test, which helps to improve the test accuracy.

In some optional implementation manners of this embodiment, the foregoing acquisition of the configuration file may be implemented in any one or more of the following manners:

First, a configuration file is generated according to a preset configuration file generation step.

Second, receive the configuration file entered by the user.

Third, extract the configuration file from the preset storage area.

Wherein, the above-mentioned preset storage area may be local to the test server, or may be a storage device communicatively connected to the test server.

In this implementation manner, the above-mentioned execution body can obtain the configuration file in three optional ways. Specifically, the above-mentioned execution body can obtain the configuration file by generating the configuration file by itself. The above execution body may also obtain the configuration file by receiving the configuration file input by the user. The above-mentioned execution body may also obtain the configuration file by extracting the configuration file from the preset storage area.

It should be pointed out that, if the configuration file is obtained by generating the configuration file by itself, the above-mentioned execution subject may use the preset configuration file generation steps to generate the configuration file. The above-mentioned preset configuration file generating steps may be various preset steps for generating a configuration file. As an example, the above-mentioned preset configuration file generating step may include: first, assigning parameter values to the scene configuration parameters in the preset scene configuration parameter set. Then, compile all scene configuration parameters and parameter values of scene configuration parameters into text. Finally, use the compiled text as a configuration file. As another example, the above-mentioned preset configuration file generating step may also include: first, assigning parameter values to the scene configuration parameters in the preset scene configuration parameter set. Then, compile all scene configuration parameters and parameter values of scene configuration parameters into text. After that, the compiled text is further compiled into a JSON file. Finally, use the resulting JSON file as a configuration file.

The test method in this implementation can support multiple ways of obtaining configuration files, and is more flexible and practical. In practice, the configuration file obtained by receiving the configuration file input by the user or by extracting the configuration file from the preset storage area is usually the configuration file concerned by the user. Using user-focused configuration files for testing can achieve targeted testing and help improve testing efficiency. In addition, the configuration file obtained by generating the configuration file by itself is generally representative and does not require manual intervention, which can speed up the test and save the test time. Therefore, for the test of a certain device under test, if the configuration files are obtained in multiple ways among the above three methods for testing the device under test, it will help to improve the overall test of the device under test. test efficiency.

In an optional implementation manner of each embodiment of the present application, the above-mentioned determination of the device state of the device under test in the i-th scenario according to the test result of the device under test and the test result of the reference device includes:

If the difference between the test result of the device under test and the test result of the reference device is greater than the preset difference threshold, it is determined that the device state of the device under test in the ith scenario is an abnormal state.

Wherein, the above-mentioned difference threshold may be a preset value for describing the difference. As an example, the above gap threshold may be 0.1, 0.6, etc.

Here, the executive body may compare the difference between the test results corresponding to the two devices with the difference threshold. If the difference is greater than the difference threshold, it can be considered that the device under test is currently abnormal. On the contrary, if the above-mentioned difference is less than or equal to the difference threshold, it can be considered that the above-mentioned device under test is not abnormal at present, that is, the above-mentioned device under test is currently normal. This implementation method introduces a gap threshold, and compares the difference between the test results corresponding to the two devices with the gap threshold, which can avoid misjudgments caused by errors within the test accuracy range, and can ensure timely and accurate capture of the device to be tested. It saves test time in case of possible problems and helps to further improve test efficiency.

In an optional implementation manner of each embodiment of the present application, the above test method may further include the following steps: if the device state of the device under test in the i-th scenario is an abnormal state, storing a configuration file.

Here, when the device under test is currently abnormal, the above-mentioned execution body may store the current configuration file. In this way, after the device under test is improved, the above-mentioned executive body can continue to use the configuration file for re-testing. Targeted testing can be achieved, which helps to further improve testing efficiency.

In an optional implementation manner of each embodiment of the present application, the format of the configuration file is JSON format.

Among them, JSON (JavaScript Object Notation) is a lightweight data exchange format, which is easy to read and write, and also easy to parse and generate by machine. Here, since the file in JSON format is easy to parse and generate, the configuration file in this implementation is in JSON format, which can further improve the accuracy of parsing the configuration file and help to further improve the test efficiency of the device under test. .

Embodiment 2

This embodiment of the present application provides a testing method. This embodiment is a further description of the first embodiment. For the same or similar places as the first embodiment, reference may be made to the relevant description of the first embodiment, which will not be repeated here. Please refer to Fig. 2, the test method in this embodiment includes:

Step 201: Generate a configuration file according to a preset configuration file generation step.

In this embodiment, the configuration file may be obtained by generating the configuration file. At this time, the above-mentioned execution body may generate a configuration file by executing steps 2011-2012.

Step 2011: Acquire a preset scene configuration parameter set, and assign a value to each scene configuration parameter in the scene configuration parameter set.

Wherein, different values of the scene configuration parameters correspond to different scenes.

The scene configuration parameters in the scene configuration parameter set may be various parameters used to describe the scene. For example, the scene configuration parameter may be a parameter used to describe the starting address of the read data, or may be a parameter used to describe the end address of the read data. Can also be a parameter describing how the data is read. Each scenario configuration parameter in the scenario configuration parameter set may describe a part of the scenario, and the combination of all scenario configuration parameters in the scenario configuration parameter set may describe a complete scenario.

In practical applications, the scene configuration parameters in the scene configuration parameter set may include, but are not limited to: parameters used to describe the data format, parameters used to describe the start address of the data memory, parameters used to describe the end address of the data memory, Parameters used to describe the address of the double-rate synchronous dynamic random access memory, etc. The value of the parameter used to describe the data format may be 1, 2, or 3. As an example, if the value of the parameter used to describe the data format is 1, it can be used to indicate that the data format is 16-bit data. If the value of the parameter used to describe the data format is 2, it can be used to indicate that the data format is 8-bit data. The value of the parameter used to describe the starting address of the data memory can be 0 to 100000. The value of the parameter used to describe the end address of the data memory can be 0 to 100000. The value of the parameter used to describe the address of the double-rate synchronous dynamic random access memory can be 0-100000.

In this embodiment, the above-mentioned execution body may preset a plurality of scene configuration parameters and set the value range of each scene configuration parameter. In practice, the preset scene configuration parameters are usually variables. In this way, it is possible to assign values to each scene configuration parameter by assigning values to each variable. In this embodiment, the above-mentioned execution subject may assign a value to each scene configuration parameter according to a preset assignment method. Wherein, the above allocation manner may be a preset allocation manner. As an example, the above allocation manner may be random allocation. As another example, the above allocation manner may also be incremental allocation according to the value. For example, if the value assigned to a scene configuration parameter last time is 1, the value assigned to the scene configuration parameter this time may be 2.

In practice, since the situations faced by the device in real use are usually random, the above allocation method is usually random in order to test the versatility and stability of the device.

Step 2012: Generate a configuration file according to each scenario configuration parameter in the scenario configuration parameter set and the value of the corresponding scenario configuration parameter.

As an example, the above-mentioned execution body may generate the configuration file in the following manner: directly compiling the scene configuration parameters and the values of the scene configuration parameters into text in the form of key-value pairs. Then, use the compiled text as a configuration file. For further example, if there are two scene configuration parameters in the scene configuration parameter set, they are parameter 1 and parameter 2 respectively. If the value of parameter 1 is 10, the value of parameter 2 is 20. Then, the scene configuration parameters and the values of the scene configuration parameters are compiled into text in the form of key-value pairs, and the obtained text is {(parameter 1, 10), (parameter 2, 20)}.

As another example, the above-mentioned execution body may also generate a configuration file in the following manner: First, the scene configuration parameters and the values of the scene configuration parameters are compiled into text in the form of key-value pairs. Then, the compiled text is compiled into a JSON format file using a scripting language (eg, Python). Finally, use the resulting JSON format file as a configuration file.

Step 202 , parse the configuration file to obtain a scene configuration parameter set in the configuration file, and send the parsed scene configuration parameter set to the device under test and the reference device, respectively.

The scene configuration parameter set is used to select the ith scene from the N scenes, where 1≤i≤N.

Step 203: Receive a test result of the device under test performing the test based on the scenario configuration parameter set, and receive the test result of the reference device performing the test based on the scenario configuration parameter set.

Step 204 , according to the test result of the device under test and the test result of the reference device, determine the device state of the device under test in the ith scenario.

The above-mentioned device state is usually a state used to indicate whether the device under test is abnormal. The above-mentioned device states may include normal states and abnormal states.

In this embodiment, the specific operations of steps 202 to 204 are basically the same as the operations of steps 102 to 104 in the embodiment shown in FIG. 1 , and details are not repeated here.

In this embodiment, by assigning values to each scenario configuration parameter in the scenario configuration parameter set, the device under test and the reference device can be tested in the selected scenario. It should be pointed out that, in this embodiment, the test scenarios of the device under test and the reference device can be switched by changing the value of the scenario configuration parameter, the operation is simple and easy to implement, and the test efficiency is improved.

It should be pointed out that, because the device under test usually needs to deal with different scenarios and needs to switch between different scenarios in the real use situation, this embodiment switches the under test by changing the value of the scene configuration parameter. The test scenarios of the device and the reference device can effectively test the stability of the device under test against scene changes, and help to fully test the device under test.

In some optional implementations of this embodiment, when the test conditions are met, a configuration file is generated according to a preset configuration file generation step.

Wherein, the above-mentioned test conditions may be various preset conditions.

In this implementation manner, the generation of the configuration file is performed only when the current situation meets the test conditions. It can be implemented to generate configuration files only when the test conditions are met. It can reduce the consumption of unnecessary computing resources and help save computing resources.

Optionally, the above test conditions may include any one or more of the following:

Condition 1: The test start information input by the user is received.

Wherein, the above-mentioned test start information may be information used to instruct to start the test. As an example, the above test start information may be "open" or "start". This application does not specifically limit the specific form of the test initiation information.

Condition 2: The test result is received and the number of times the configuration file is currently generated is less than the preset number of times threshold.

Wherein, the above-mentioned threshold of times may be a preset numerical value used to describe the times. For example, 20 times.

Condition 3: The test result is received and the total test duration currently used for the test is less than the preset duration threshold.

Wherein, the above-mentioned duration threshold may be a preset numerical value used to describe the duration. For example, 2 hours.

In practice, receipt of a test result usually indicates the end of the current test. At this time, the above-mentioned execution body can judge whether it is currently necessary to continue the test according to the test conditions, and if necessary, execute the step of generating a configuration file. This implementation manner can realize automatic testing, which is helpful for saving testing time and improving testing efficiency. In addition, in the process of automatic testing, the test scenarios of the device under test and the reference device can be switched by changing the values of the scene configuration parameters, which can effectively test the stability of the device under test against the scene changes, which is helpful for Enables adequate testing of the device under test.

Embodiment 3

Continuing to refer to FIG. 3 , it is a schematic structural diagram of a testing system provided by an embodiment of the present application. As shown in FIG. 3 , the test system may include a test server 301 , a device under test 302 and a reference device 303 . in,

The test server 301 is used to obtain a configuration file; parse the configuration file to obtain a scene configuration parameter set in the configuration file, and send the parsed scene configuration parameter set to the device under test and the reference device respectively, and the scene configuration parameter set is used to obtain the scene configuration parameter set from the device under test and the reference device. Select the ith scene from the N scenes, where 1≤i≤N;

The device under test 302 is configured to perform a test based on the scene configuration parameter set, and send the test result to the test server;

Reference device 303, configured to perform a test based on the scenario configuration parameter set, and send the test result to the test server;

The test server 304 is further configured to receive the test result of the device under test based on the scenario configuration parameter set, and receive the test result of the reference device based on the scenario configuration parameter set; according to the test result of the device under test and the test result of the reference device , to determine the device state of the device under test in the i-th scenario.

In the system provided in this embodiment, the scene is selected through the scene configuration parameter set, which can make the selection of the scene simple and easy to implement. The scene for testing the device under test can be conveniently and quickly selected, thereby accelerating the test speed and helping to improve the test efficiency of testing the device under test.

It should be noted that the information exchange, execution process and other contents between the above-mentioned test server, the device under test and the reference device are based on the same concept as the method embodiments of the present application, and the specific functions and technical effects brought by them can be specifically Refer to the method embodiment section, which will not be repeated here.

In some optional implementations of this embodiment, the system further includes a hardware parsing device, wherein the hardware parsing device is connected in communication with the test server and the device to be tested, respectively. At this time, in the test server, parsing the configuration file to obtain the scene configuration parameter set in the configuration file, and sending the parsed scene configuration parameter set to the device under test and the reference device respectively, may include the following steps 1 and 2.

In step 1, the configuration file is parsed by a preset parsing program, and the scene configuration parameter set obtained by the analysis is sent to the reference device.

The above-mentioned preset parsing program may be a preset program for parsing the configuration file.

Here, the test server may directly use a preset parsing program stored by itself to parse the configuration file to obtain the scene configuration parameter set in the configuration file. Then, the scene configuration parameter set obtained by parsing is sent to the reference device. So that the reference device can be tested based on the scenario configuration parameter set.

Step 2: Send a configuration file to the hardware parsing device connected in communication, so that the hardware parsing device parses the configuration file, encapsulates the parsed scene configuration parameter set into an instruction program, and sends the scene configuration parameter set in the form of an instruction program to the under-test. equipment.

Wherein, the above-mentioned hardware parsing device is usually a hardware device for parsing a configuration file. As an example, the above hardware parsing device may be a JSON parser for parsing a configuration file in JSON format.

Here, the test server can send the configuration file to the hardware parsing device. In this way, the hardware parsing device can parse the configuration file to obtain the scene configuration parameter set in the configuration file. Then, the scene configuration parameter set obtained by parsing is encapsulated into an instruction program. Finally, send the command program to the device under test. In practice, the hardware parsing device can encapsulate the scene configuration parameter set into an instruction program by writing each scene configuration parameter in the scene configuration parameter set into a preset template. The preset template may be a preset file template, and the file template may include multiple variables. The hardware parsing device may assign each scene configuration parameter in the scene configuration parameter set to each variable of the file template, so as to encapsulate the scene configuration parameter set into an instruction program. In practical applications, the instruction program can usually be implemented as a binary file that is easy to read by a machine.

In this implementation manner, the test server parses the configuration file through software parsing, and sends the parsed scene configuration parameter set to the reference device, so that the reference device can perform testing based on the software parsed scene configuration parameter set. In addition, the test server parses the configuration file through the hardware parsing device, and sends the parsed scene configuration parameter set to the device under test in the form of an instruction program through the hardware parsing device, so that the device under test can be based on the scene in the form of an instruction program. Configure the parameter set for testing. Using different parsing methods to parse the same configuration file can usually obtain the same parsing result.

In this implementation manner, the test server sends the configuration file to the hardware parsing device for parsing, so as to send the scene configuration parameter set in the form of an instruction program to the device under test through the hardware parsing device, which can reduce the amount of calculation of the test server and thus speed up the processing The test speed of the test equipment is helpful to improve the test efficiency. In addition, if the device state of the device under test determined by the test server is always in an abnormal state, it is very likely that there is a problem with the hardware parsing device. Therefore, this implementation is helpful to realize the timely discovery of the problems existing in the hardware analysis device while ensuring the test accuracy.

In some optional implementations of this embodiment, the device to be tested may include a program memory (Program Memory, PM), a control unit (Control Unit, CU), an external input data direct memory access device (External Input data Direct Memory Access, EIDMA) ), External Output Data Direct Memory Access (EODMA), Double DataRate synchronous dynamic random access memory (DDR), multiplex data selector (crossbar, XBAR) and data memory (Data Memory, DM).

If the scene configuration parameter set sent to the device under test is a scene configuration parameter set in the form of an instruction program, and the scene configuration parameter set includes a first parameter used to indicate read data or write data, a first parameter used to indicate source address information A second parameter and a third parameter for indicating target address information. Wherein, the above-mentioned first parameter may be used to indicate reading data or writing data. As an example, the value of the first parameter may be "1", which is used to indicate reading data, or "2", which is used to indicate writing data.

At this time, in the device under test, the test is performed based on the scene configuration parameter set, which may include steps 401-406.

FIG. 4 is a schematic flowchart of a device under test performing a test based on a scene configuration parameter set provided by an embodiment of the present application.

Step 401, the PM receives and stores the instruction program.

Step 402, the CU reads the instruction program from the PM, and if the first parameter indicates writing data, sends the instruction program to EIDMA; if the first parameter indicates reading data, sends the instruction program to EODMA.

Step 403, EIDMA stores the data at the address corresponding to the source address information in the DDR to the address corresponding to the target address information in the DM through the XBAR according to the source address information and the target address information corresponding to the received instruction program.

Among them, the function of XBAR is to provide multiple data channels, which can realize the parallel access of multiple data channels, which helps to improve the fast access of data.

Step 404, the DM sends the stored data and the address of the stored data to the test server.

For example, if data 100 is stored in address A in DM. Then data 100 and address A can be sent to the test server. For example, the content sent by DM to the test server can be: the data in address A is 100.

Step 405, EODMA stores the data at the address corresponding to the source address information in the DM to the address corresponding to the target address information in the DDR through XBAR according to the source address information and target address information corresponding to the received instruction program.

Step 406, the DDR sends the stored data and the address of the stored data to the test server.

It should be noted that the scene configuration parameter set includes a first parameter for indicating read data or write data, a second parameter for indicating source address information, and a third parameter for indicating target address information. In practical applications, the scene configuration parameter set may further include other parameters, for example, may also include parameters for describing the reading method. As an example, the reading method may be to use the address corresponding to the source address information as the starting address, and sequentially read 5 bytes of data. The reading method can also be that the address corresponding to the source address information is used as the starting address, and one data is read every 1 byte until 5 bytes of data are read.

In this implementation manner, it is possible to compare whether the changed address in the memory of the device under test is the same as the changed address in the memory of the reference device. It is also possible to further compare whether the data in the address where the data change occurs in the device under test is the same as the data in the address where the data change occurs in the reference device. If the above two are the same, it can be considered that there is no abnormality in the memory of the device under test. On the contrary, if one or both of the above two are different, it can be considered that there is an abnormality in the memory of the device under test. This implementation manner can timely and accurately capture possible problems in the memory of the device under test, which helps to improve the test accuracy.

Embodiment 4

Continue to refer to FIG. 5 , which is a schematic structural diagram of the testing system provided by the embodiment of the present application. As shown in Figure 5, the test server can directly obtain the JSON file or generate a random JSON file through random configuration. Here, the JSON file is the above configuration file. Test servers can obtain configuration files in several ways. The resulting configuration file includes a set of scene configuration parameters. The scene configuration parameter set may include a first parameter for indicating read data or write data, a second parameter for indicating source address information, and a third parameter for indicating destination address information.

The test server can use a JSON parsing program to perform software parsing on the JSON file, obtain a scene configuration parameter set, and transmit the scene configuration parameter set to the reference device, so that the reference device can perform testing based on the scene configuration parameter set obtained by software analysis. Here, the reference device is a software device pre-built by the test server with the same or similar structure as the device under test.

The reference device can write test results to the test server's scoreboard.

The test server can send JSON files to the hardware JSON parser of the communication connection. Here, the hardware JSON parser is the above-mentioned hardware parsing device.

The hardware JSON parser parses the JSON file to get the binary file. Here, the hardware JSON parser parses the JSON file to obtain the scene configuration parameter set. Then, the scene configuration parameter set is encapsulated into an instruction program. Finally, the scene configuration parameter set in the form of an instruction program is sent to the device under test. The obtained binary file is the carrier of the above instruction program.

The hardware JSON parser sends the binary to the PM of the device under test.

Devices under test include PM, CU, EIDMA, EODMA, DDR, XBAR and DM. Among them, PM receives and stores binary files. Here, the PM can get the instruction program. The device under test can be tested based on binary files.

The test process of the device under test based on the binary file is as follows: CU reads the instruction program from the PM, and if the first parameter indicates to write data, the instruction program is sent to EIDMA; if the first parameter indicates to read data, the instruction program is sent to Program is sent to EODMA. According to the source address information and target address information corresponding to the received command program, EIDMA stores the data at the address corresponding to the source address information in the DDR to the address corresponding to the target address information in the DM through XBAR. Among them, the function of XBAR is to provide multiple data channels, which can realize the parallel access of multiple data channels, which helps to improve the fast access of data. The DM sends the stored data and the address of the stored data to the monitor of the test server. EODMA stores the data at the address corresponding to the source address information in the DM to the address corresponding to the target address information in the DDR through XBAR according to the source address information and target address information corresponding to the received instruction program. The DDR sends the stored data and the address of the stored data to the monitor of the test server.

The monitor of the test server can acquire the data information of each component of the device under test, and can record the acquired data information on the scoreboard.

The scoreboard of the test server is used to record the test results of the device under test and the reference device, and prompt the device status of the device under test for the test results of the reference device and the device under test. For example, if the test result of the device under test is consistent with the test result of the reference device, the scoreboard may prompt "OK".

Embodiment 5

Corresponding to the test method of the first embodiment above, FIG. 6 shows a structural block diagram of the test apparatus 600 provided by the embodiment of the present application. For convenience of description, only the part related to the embodiment of the present application is shown.

Referring to Figure 6, the device includes:

a file obtaining unit 601, configured to obtain a configuration file;

The file parsing unit 602 is configured to parse the configuration file to obtain a scene configuration parameter set in the configuration file, and send the parsed scene configuration parameter set to the device under test and the reference device, respectively, where the scene configuration parameter set is used to select from N scenarios Select the i-th scene from , where 1≤i≤N;

A result receiving unit 603, configured to receive a test result of the device under test performing the test based on the scenario configuration parameter set, and receiving the test result of the reference device performing the test based on the scenario configuration parameter set;

The abnormality determination unit 604 is configured to determine the device state of the device under test in the i-th scenario according to the test result of the device under test and the test result of the reference device.

In one embodiment, in the file obtaining unit 601, obtaining the configuration file includes any one or more of the following:

Generate a configuration file according to the preset configuration file generation steps;

Receive the configuration file entered by the user;

Extract configuration files from the preset storage area.

In one embodiment, the configuration file is generated according to a preset configuration file generation step, including:

obtaining a preset scene configuration parameter set, and assigning values to each scene configuration parameter in the scene configuration parameter set, wherein different values of the scene configuration parameters correspond to different scenarios;

A configuration file is generated according to each scenario configuration parameter in the scenario configuration parameter set and the value of the corresponding scenario configuration parameter.

In one embodiment, the abnormality judging unit 604 determines the device state of the device under test in the i-th scenario according to the test result of the device under test and the test result of the reference device, including:

If the difference between the test result of the device under test and the test result of the reference device is greater than the preset difference threshold, it is determined that the device state of the device under test in the ith scenario is an abnormal state.

In one embodiment, the apparatus further includes an execution judging unit, configured to: when the test condition is satisfied, generate a configuration file according to a preset configuration file generating step.

In one embodiment, the test conditions include any one or more of the following:

Receive the test start information input by the user;

The test result is received and the current number of generated configuration files is less than the preset number of thresholds;

The test result is received and the total test duration currently used for the test is less than the preset duration threshold.

In one embodiment, the apparatus further includes a file storage unit, configured to: if the device state of the device under test in the i-th scenario is an abnormal state, store the configuration file.

In the apparatus provided in this embodiment, the scene is selected through the scene configuration parameter set, which can make the selection of the scene simple and easy to implement. The scene for testing the device under test can be conveniently and quickly selected, thereby accelerating the test speed and helping to improve the test efficiency of testing the device under test.

It should be noted that the information exchange, execution process, etc. between the above-mentioned devices/units are based on the same concept as the method in the first embodiment of the present application, and the specific functions and technical effects brought by it can refer to the part of the embodiments for details. It is not repeated here.

Embodiment 6

FIG. 7 is a schematic structural diagram of an electronic device 700 according to an embodiment of the present application. As shown in FIG. 7 , the electronic device 700 of this embodiment includes: at least one processor 701 (only one processor is shown in FIG. 7 ), a memory 702 , and is stored in the memory 702 and can run on the at least one processor 701 703 of a computer program, such as a test program. When the processor 701 executes the computer program 703, the steps in any of the foregoing method embodiments are implemented. When the processor 701 executes the computer program 703, the steps in the above embodiments of the respective testing methods are implemented. When the processor 701 executes the computer program 703, the functions of the modules/units in the above device embodiments are realized, for example, the functions of the units 601 to 604 shown in FIG. 6 .

Exemplarily, the computer program 703 may be divided into one or more modules/units, and the one or more modules/units are stored in the memory 702 and executed by the processor 701 to complete the present application. One or more modules/units may be a series of computer program instruction segments capable of performing specific functions, and the instruction segments are used to describe the execution process of the computer program 703 in the electronic device 700 . For example, the computer program 703 can be divided into a file obtaining unit, a file parsing unit, a result receiving unit, and an abnormality judging unit. The specific functions of each unit have been described in the above embodiments, and will not be repeated here.

The electronic device 700 may be a computing device such as a server, a desktop computer, a tablet computer, a cloud server, and a mobile terminal. The electronic device 700 may include, but is not limited to, a processor 701 and a memory 702 . Those skilled in the art can understand that FIG. 7 is only an example of the electronic device 700, and does not constitute a limitation to the electronic device 700, and may include more or less components than the one shown, or combine some components, or different components For example, the electronic device may also include an input and output device, a network access device, a bus, and the like.

The so-called processor 701 may be a central processing unit (Central Processing Unit, CPU), and may also be other general-purpose processors, digital signal processors (Digital Signal Processors, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), Field-Programmable Gate Array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.

The memory 702 may be an internal storage unit of the electronic device 700 , such as a hard disk or a memory of the electronic device 700 . The memory 702 may also be an external storage device of the electronic device 700, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a Secure Digital (SD) card, a flash memory card (Flash Card) equipped on the electronic device 700 )Wait. Further, the memory 702 may also include both an internal storage unit of the electronic device 700 and an external storage device. The memory 702 is used to store computer programs and other programs and data required by the electronic device. The memory 702 may also be used to temporarily store data that has been or will be output.

Those skilled in the art can clearly understand that, for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example. Module completion means dividing the internal structure of the device into different functional units or modules to complete all or part of the functions described above. Each functional unit and module in the embodiment may be integrated in one processing unit, or each unit may exist physically alone, or two or more units may be integrated in one unit, and the above-mentioned integrated units may adopt hardware. It can also be realized in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing from each other, and are not used to limit the protection scope of the present application. For the specific working processes of the units and modules in the above-mentioned system, reference may be made to the corresponding processes in the foregoing method embodiments, which will not be repeated here.

In the foregoing embodiments, the description of each embodiment has its own emphasis. For parts that are not described or described in detail in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.

Those of ordinary skill in the art can realize that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Skilled artisans may implement the described functionality using different methods for each particular application, but such implementations should not be considered beyond the scope of this application.

In the embodiments provided in this application, it should be understood that the disclosed apparatus/electronic device and method may be implemented in other manners. For example, the apparatus/electronic device embodiments described above are only illustrative, for example, the division of modules or units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components May be combined or may be integrated into another system, or some features may be omitted, or not implemented. On the other hand, the shown or discussed mutual coupling or direct coupling or communication connection may be through some interfaces, indirect coupling or communication connection of devices or units, and may be in electrical, mechanical or other forms.

Units described as separate components may or may not be physically separated, and components shown as units may or may not be physical units, that is, may be located in one place, or may be distributed to multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution in this embodiment.

In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically alone, or two or more units may be integrated into one unit. The above-mentioned integrated units may be implemented in the form of hardware, or may be implemented in the form of software functional units.

The integrated modules, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer-readable storage medium. Based on this understanding, the present application realizes all or part of the processes in the methods of the above embodiments, and can also be completed by instructing relevant hardware through a computer program, and the computer program can be stored in a computer-readable storage medium, and the computer program is in When executed by a processor, the steps of each of the above method embodiments can be implemented. Wherein, the computer program includes computer program code, and the computer program code may be in the form of source code, object code, executable file or some intermediate forms, and the like. The computer-readable medium may include: any entity or device capable of carrying computer program code, recording medium, U disk, removable hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), electric carrier signal, telecommunication signal, and software distribution medium, etc. It should be noted that the content contained in computer-readable media may be appropriately increased or decreased in accordance with the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media does not include Electrical carrier signals and telecommunication signals.

The above embodiments are only used to illustrate the technical solutions of the present application, but not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: The recorded technical solutions are modified, or some technical features thereof are equivalently replaced; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the application, and should be included in the application. within the scope of protection.

Claims (10)

1. a test method, is characterized in that, described method comprises: get the configuration file; Parse the configuration file to obtain a scene configuration parameter set in the configuration file, and send the parsed scene configuration parameter set to the device under test and the reference device, respectively, where the scene configuration parameter set is used to select from N scenarios Select the ith scene, where 1≤i≤N; receiving a test result of the device under test performing a test based on the scenario configuration parameter set, and receiving a test result of the reference device performing a test based on the scenario configuration parameter set; According to the test result of the device under test and the test result of the reference device, the device state of the device under test in the i-th scenario is determined. 2. The method according to claim 1, wherein the obtaining the configuration file comprises any one or more of the following: Generate a configuration file according to the preset configuration file generation steps; Receive the configuration file entered by the user; Extract configuration files from the preset storage area. 3. The method according to claim 2, wherein the generating a configuration file according to a preset configuration file generating step comprises: obtaining a preset scene configuration parameter set, and assigning a value to each scene configuration parameter in the scene configuration parameter set, wherein different values of the scene configuration parameter correspond to different scenes; A configuration file is generated according to each scenario configuration parameter in the scenario configuration parameter set and the value of the corresponding scenario configuration parameter. 4. The method according to any one of claims 1-3, wherein, according to the test result of the device under test and the test result of the reference device, it is determined that the device under test is in the i-th Device status in each scenario, including: If the difference between the test result of the device under test and the test result of the reference device is greater than a preset difference threshold, it is determined that the device state of the device under test in the i-th scenario is an abnormal state. 5. A test system, characterized in that the system comprises a test server, a device under test and a reference device, wherein, The test server is used to obtain a configuration file; parse the configuration file to obtain a scene configuration parameter set in the configuration file, and send the parsed scene configuration parameter set to the device under test and the reference device, respectively, the The scene configuration parameter set is used to select the ith scene from N scenes, where 1≤i≤N; the device under test, configured to perform a test based on the scene configuration parameter set, and send the test result to the test server; the reference device, configured to perform a test based on the scene configuration parameter set, and send the test result to the test server; The test server is further configured to receive a test result of the device under test based on the scenario configuration parameter set, and receive a test result of the reference device based on the scenario configuration parameter set; The test result of the device under test and the test result of the reference device are used to determine the device state of the device under test in the ith scenario. 6. The system according to claim 5, wherein the system further comprises a hardware parsing device, and the hardware parsing device is respectively connected in communication with the test server and the device under test; and In the test server, parsing the configuration file to obtain the scene configuration parameter set in the configuration file, and sending the parsed scene configuration parameter set to the device under test and the reference device respectively, including: Parse the configuration file through a preset parsing program, and send the parsed scene configuration parameter set to the reference device; Send the configuration file to the hardware parsing device connected in communication, so that the hardware parsing device parses the configuration file, encapsulates the parsed scene configuration parameter set into an instruction program, and sends the scene configuration parameter set in the form of an instruction program to the device under test. 7. The system according to claim 5 or 6, wherein the device under test comprises a program memory, a control unit, an external input data direct storage accessor, an external output data direct storage accessor, a double-rate synchronous dynamic random access memories, multiplexers and data memories; and If the scene configuration parameter set sent to the device under test is a scene configuration parameter set in the form of an instruction program, and the scene configuration parameter set includes a first parameter used to indicate read data or write data, a first parameter used to indicate source address information two parameters and a third parameter used to indicate target address information, in the device under test, the testing based on the scenario configuration parameter set includes: the program memory receives and stores the instruction program; The control unit reads the instruction program from the program memory, and if the first parameter indicates writing data, sends the instruction program to the external input data direct storage accessor; A parameter indicates reading data, then sending the instruction program to the external output data direct storage accessor; The external input data direct storage accessor passes the data at the address corresponding to the source address information in the double-rate synchronous dynamic random access memory through the multiplexer according to the source address information and target address information corresponding to the received instruction program. The data selector is stored at the address corresponding to the target address information in the data memory; The data storage sends the stored data and the address of the stored data to the test server; The external output data direct storage accessor stores the data at the address corresponding to the source address information in the data memory through the multiplex data selector according to the source address information and target address information corresponding to the received instruction program. at the address corresponding to the target address information in the double-rate synchronous dynamic random access memory; The double rate synchronous DRAM sends the stored data and the address of the stored data to the test server. 8. A test device, characterized in that the device comprises: File acquisition unit, used to acquire configuration files; A file parsing unit, configured to parse the configuration file to obtain the scene configuration parameter set in the configuration file, and send the parsed scene configuration parameter set to the device under test and the reference device respectively, and the scene configuration parameter set is used for to select the ith scene from N scenes, where 1≤i≤N; a result receiving unit, configured to receive a test result of the device under test performing a test based on the scenario configuration parameter set, and receiving a test result of the reference device performing a test based on the scenario configuration parameter set; An abnormality judging unit, configured to determine the device state of the device under test in the i-th scenario according to the test result of the device under test and the test result of the reference device. 9. An electronic device comprising a memory, a processor and a computer program stored in the memory and running on the processor, wherein the processor implements the computer program as claimed in the claims when executing the computer program The method of any one of 1 to 4. 10. A computer-readable storage medium storing a computer program, wherein the computer program implements the method according to any one of claims 1 to 4 when the computer program is executed by a processor.

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