CN112748675A - Singlechip system compatible with multiple slave machines - Google Patents
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Abstract
The invention discloses a singlechip system compatible with multiple types of slave computers, which relates to the technical field of communication and provides the following technical scheme aiming at the problem that the reference voltage output by a power circuit is easy to drift, wherein the singlechip system comprises a test circuit, a sampling circuit, an MCU (microprogrammed control unit) processing unit, an overload simulation comparator and an overload early warning circuit; a sampling resistor is arranged in the sampling circuit, the sampling resistor is connected with the test circuit in parallel, the sampling circuit collects current signals and converts the current signals into sampling voltage, an analog-to-digital converter is arranged in the MCU processing unit, and the MCU processing unit is connected with a data sending end; the MCU processing unit is internally provided with a reference digital-to-analog converter, the MCU processing unit inputs overload reference voltage signals to the reverse input end of the overload analog comparator through the reference digital-to-analog converter, the sampling circuit inputs sampling voltage VOL to the non-inverting input end of the overload analog comparator, and the output end of the overload analog comparator is connected to an overload early warning circuit interface, so that the aim of improving the overload detection accuracy is fulfilled.
Description
Technical Field
The invention relates to the technical field of communication, in particular to a single chip microcomputer system compatible with multiple types of slave machines.
Background
Mbus is a 2-wire bus of European standard, is specially designed for transmitting data information of metering instruments, and is mainly applied to the field of centralized meter reading of metering instruments for water supply, heat supply and the like. The data communication model of the Mbus is designed in a master-multi-slave mode, namely, one communication network is provided with only one host device and a plurality of slave devices, and all the slave devices are connected to the Mbus of the host in parallel. The data information exchange between the host and the slave is in a question-answer mode, the data information exchange is initiated by the host equipment, the called slave answers data to the host, and other slaves do not answer any response.
The Mbus bus standard specifies that each slave device connected to the Mbus bus statically consumes bus current (current consumption when no reply or reply data bit is low) of 1.5mA, and N slaves statically consume bus current of N x 1.5.5 mA. When a certain device has to answer data, the current consumption of a high level in the data needs to be increased by 20mA, the static current consumption of a low level is kept to be 1.5mA, and the host device detects the current signal change and converts the current signal change into usable data. In the Mbus, 36V and 24V voltage signals are used when the host sends data to the slave, and current signals of 1.5mA and 1.5+20mA are used when the slave responds to the data from the host.
The traditional early warning system for external channel short circuit in the Mbus circuit compares the sampling voltage with the reference voltage output by the power circuit, but the temperature of the power circuit can rise during working, and the reference voltage output by the power circuit generates a drift phenomenon due to the change of parameters of a semiconductor device, so that the accuracy of early warning detection is reduced.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a singlechip system compatible with multiple types of slave machines, which has the advantage of reducing the reference voltage drift in communication interaction.
In order to achieve the purpose, the invention provides the following technical scheme:
a single chip microcomputer system compatible with multiple types of slave computers comprises a test circuit, a sampling circuit, an MCU processing unit and an overload simulation comparator CMP0And overload warning circuit ERR0(ii) a A sampling resistor is arranged in the sampling circuit, the sampling resistor is connected with the test circuit in parallel, the sampling circuit collects a current signal and converts the current signal into a sampling voltage VOL, an analog-to-digital converter (ADC) is arranged in the MCU processing unit, and the MCU processing unit is connected with a data transmitting end TXD; a reference digital-to-analog converter DAC is arranged in the MCU processing unit0The MCU processing unit passes through a DAC (digital-to-analog converter)0Overload-oriented analog comparator CMP0Input overload reference voltage signal V at the reverse input end0The sampling circuit is directed to the overload analog comparator CMP0The non-inverting input terminal of the comparator inputs the sampling voltage VOL, and the overload analog comparator CMP0The output end of the power supply is connected with an overload early warning circuit interface ERR0。
By adopting the technical scheme, the sampling circuit collects the current signal of the Mbus and converts the current signal into the sampling voltage VOL, and the sampling voltage VOL is converted into a digital signal which can be read by the MCU processing unit through the analog-to-digital converter ADC; the MCU processing unit passes through the DAC0Generating an overload reference voltage for detecting the test circuit, generating a large voltage drop by the sampling resistor on the sampling circuit when the load of the slave circuit is excessive or the external channel is short-circuited, and inputting the voltage into an overload analog comparator CMP0The sampling voltage VOL is greater than the overload reference voltage V0Overload analog comparator CMP0And outputting a high level to the MCU processing unit, and triggering the MCU processing unit to perform overload early warning.
By setting an overload reference voltage V0When the MCU processing unit receives the voltage signal of the sampling circuit through the analog-to-digital converter ADC, whether the test circuit is overloaded or short-circuited can be detected, overload or short-circuit early warning is realized, and an external slave circuit is protected; the MCU processing unit is utilizing DAC0When the overload reference voltage is generated, the hardware cost is saved due to the on-chip resource and program control of the MCU processing unit, compared with the CMP (programmable logic controller) which directly connects an external power supply to the overload analog comparator0The overload detection reference voltage is input, so that the problem of reference voltage drift in communication interaction is reduced; simultaneous overload reference voltage V0Can pass throughThe MCU processing unit is freely set, the compatibility problem of the slave devices of different manufacturers in the test circuit is reduced according to different resistance values of the slave devices of different manufacturers, the overload monitoring device is suitable for overload monitoring of the test circuit with the slave devices of different types, and the accuracy of the overload monitoring is improved.
Preferably, a response digital-to-analog converter DAC is arranged in the MCU processing unit1And-response analog comparator CMP1The MCU processing unit is provided with a data receiving end RXD, and the sampling circuit outputs sampling voltage VOL to a response analog comparator CMP1Said response digital-to-analog converter DAC1Outputting the data reception reference voltage Vr to the response analog comparator CMP1Said counter analog comparator CMP1The output end of the receiving unit is connected with a data receiving end RXD.
By adopting the technical scheme, the DAC responds to the digital-to-analog converter1Generating a data receiving reference voltage Vr, sampling voltage VOL being connected to an analog comparator CMP1The data receiving reference voltage Vr is connected with the response analog comparator CMP1When the slave has a response current signal, the sampling voltage VOL is greater than the data receiving reference voltage Vr, and the response analog comparator CMP1And outputting a high level, wherein the MCU processing unit receives a signal received by the equipment data, and the data received by the MCU processing unit and converted from the sampling voltage VOL by the analog-to-digital converter ADC is the read data of the MCU processing unit when the slave machine normally responds.
Preferably, the resistance value of the sampling resistor is set to R, and the value of the data reception reference voltage Vr is set to: 1.5R mV < Vr < 1.5+20) R mV.
By adopting the technical scheme, the Mbus standard stipulates that the quiescent consumption bus current of the slave equipment (the current consumption when no response or response data bit is at low level) is 1.5mA, when some equipment needs to respond to data, the current consumption of the high level in the data needs to be increased by the maximum current of 20mA, the quiescent current consumption of the low level is kept to be 1.5mA, according to ohm's law, the voltage of the sampling resistor is 1.5R mV when the slave equipment is in a quiescent state when the resistance value of the sampling resistor is R, the voltage of the sampling resistor is (1.5+20) R mV when one slave machine responds to the host machine, because the data receiving reference voltage Vr is connected with the inverted input end of the data receiving analog comparator, in order to enable the response analog comparator to output high level to the data receiving end RXD when the slave machine responds, the sampling voltage VOL when the slave machine responds is greater than the data receiving reference voltage Vr, therefore, the maximum value of Vr should be less than (1.5+20) R mV; in order to enable the response analog comparator to output a low level to the data receiving end RXD when the slave is in a non-response static state, the sampling voltage VOL of the slave is smaller than the data receiving reference voltage Vr when the slave is in the static state, namely the minimum value of the Vr is larger than 1.5R mV.
Preferably, a conflict digital-to-analog converter DAC is arranged in the MCU processing unit2And collision simulation comparator CMP2The MCU processing unit is provided with a conflict alarm circuit ERR1The sampling circuit outputs a sampling voltage VOL to a collision simulation comparator CMP2The conflict digital-to-analog converter DAC1Outputting the conflict detection reference voltage Ve to the conflict simulation comparator CMP2The inverse input terminal of the collision simulation comparator CMP2Output end of the collision alarm circuit ERR1。
By adopting the technical scheme, the digital-to-analog converter DAC is realized through the conflict2Generating conflict detection reference voltage Ve, sampling voltage VOL connecting with conflict analog comparator CMP2The collision detection reference voltage Ve is connected with the collision analog comparator CMP2When a plurality of slaves answer simultaneously, the sampling voltage VOL is greater than the conflict detection reference voltage Ve, and the conflict simulation comparator CMP2Output high level to collision alarm circuit ERR1The MCU processing unit receives the information from the conflict alarm circuit ERR1Thereby triggering the early warning circuit in the MCU processing unit to send out the early warning signal.
Preferably, the resistance value of the sampling resistor is set to R, and the value of the collision detection reference voltage Ve is set to: (1.5+20) R mV < Ve < 1.5 × 2+20) R mV.
By adopting the technical scheme, the Mbus standard stipulates that one device needs to be usedWhen answering data, the high-level current consumption in the data needs to increase the current of 20mA, namely the current of a sampling circuit is (1.5 multiplied by N) mA when N slave machines are in a static state, the current of the sampling circuit is (1.5 multiplied by N) +20mA when N slave machines answer, the voltage of a sampling resistor is (1.5+20) R mV when one slave machine answers the data to a master machine according to ohm's law, the called slave machine answers the data to the master machine and other slave machines do not answer because the data information interaction between the master machine and the slave machines is a question-answer mode, the called slave machine answers the data to the master machine, when two or more than two equipment answer at the same time, the communication conflict is formed, and the sampling voltage is more than (1.5+20) R mV when the communication conflict occurs; since the conflict detection reference voltage Ve is connected to the inverting input of the conflict analog comparator, the conflict analog comparator sends a conflict alarm signal ERR to the conflict alarm circuit ERR when there is only one slave that responds1Outputting a low level, wherein the sampling voltage VOL is smaller than the conflict detection reference voltage Ve, so that the minimum value of the conflict detection reference voltage Ve is larger than (1.5+20) R mV; when two or more slaves respond, the conflict simulation comparator sends a conflict alarm circuit ERR1When a high level is output, the sampling voltage VOL should be greater than the collision detection reference voltage Ve, so the maximum value of the collision detection reference voltage Ve should be smaller than the sampling voltage VOL of two slave devices responding to each other, i.e., the maximum value of the collision detection reference voltage Ve should be smaller than (1.5 × 2+20) R mV.
Preferably, a filter circuit is arranged between the sampling circuit and the analog-to-digital converter ADC, and the filter circuit is a resistor-capacitor filter circuit.
By adopting the technical scheme, the filter circuit is used for filtering out interference signals in the output signals of the sampling circuit.
Preferably, the test circuit comprises a host communication issuing circuit, the host communication issuing circuit is provided with a plurality of relays, the host communication issuing circuit is physically divided into a plurality of channels through the relays, and the MCU processing unit is also internally provided with an instruction module for controlling the on-off of the relays.
By adopting the technical scheme, the MCU processing unit controls the relay of each channel to be switched on or switched off, the channels are increased or decreased according to actual needs, and when the host machine sends a communication signal to a specific slave machine, the MCU processing unit closes the relay switches of other channels, so that the meter reading capacity of the host machine is improved, the power supply is reduced, and high-capacity centralized meter reading is realized with lower power consumption requirements; when the meter reading is not needed, all channels can be cut off to supply power, so that the consumption of a power supply in a circuit is reduced; physical isolation of each channel reduces the problem of mutual interference between the slave machines among different slave machines, thereby reducing the influence of the channel fault of the slave machine on meter reading readings of other channels.
In conclusion, the invention has the following beneficial effects:
1. by using programs in the MCU processing unit through DAC0Generating an overload reference voltage signal V0Comparing the level of the signal generated by the sampling circuit with that of the overload monitoring reference voltage signal to effectively monitor whether the circuit has overload or short circuit;
2. by using programs in the MCU processing unit through DAC0Generating an overload reference voltage signal V0Make the reference voltage signal V overloaded0The resistance value of each slave in the test circuit is adjusted according to different resistance values, so that the test circuit is suitable for the slaves of different manufacturers, and the compatibility of the system is improved;
3. by using programs in the MCU processing unit through DAC0Generating an overload reference voltage signal V0The condition that the overload reference voltage drifts due to the temperature change of the resistance of the external power supply is reduced, and the accuracy of overload monitoring is improved.
Drawings
Fig. 1 is a schematic diagram of a test circuit in a single chip microcomputer system compatible with multiple types of slaves in the invention.
Fig. 2 is a schematic circuit diagram of a single chip microcomputer system compatible with multiple types of slaves in the invention.
Fig. 3 is a signal spectrogram received by the MCU processing unit in the single chip microcomputer system compatible with multiple types of slaves in the present invention.
Detailed Description
The following is further detailed by way of specific embodiments:
the single chip microcomputer system compatible with the multiple types of slave computers comprises a test circuit and a sampling circuit connected to the test circuit, wherein an RL sampling resistor is arranged in the sampling circuit, the resistance value of the RL sampling resistor is set to be 5 omega, and the RL sampling resistor is connected in parallel with the test circuit. The test circuit comprises a host issuing communication circuit, the host issuing communication circuit is connected with a plurality of relays (K1, K2 and …), and the host issuing communication circuit is physically divided into a plurality of channels (COM0, COM1 and …) through the relays.
The sampling circuit is connected with an MCU processing unit, and the MCU processing unit is connected with an analog-to-digital converter (ADC) and a reference digital-to-analog converter (DAC)0DAC (digital-to-analog converter) response1And conflicting digital-to-analog converter DAC2The sampling circuit collects current signals and converts the current signals into voltage signals, a filter circuit used for filtering out interference signals in output signals of the sampling circuit is further arranged in the sampling circuit, the filter circuit is arranged as an RC circuit, the voltage signals output sampling voltages VOL after passing through the filter circuit, and the sampling circuit is connected with the MCU processing unit through the analog-to-digital converter ADC, so that analog signals of the sampling circuit are converted into digital signals which can be identified by the MCU processing unit.
The MCU processing unit passes through the DAC of the reference digital-to-analog converter according to the resistance value of the slave equipment in the test circuit0Generating an overload reference voltage signal V0The MCU processing unit is internally provided with an overload analog comparator CMP0Reference digital-to-analog converter DAC0Inputting overload reference voltage signal V0To overload analog comparator CMP0The sampling circuit to the overload analog comparator CMP0The same-phase input end inputs a sampling voltage VOL, and an overload early warning circuit interface ERR is arranged in the MCU processing unit0Overload analog comparator CMP when test circuit is overloaded or short-circuited0Output high level, overload analog comparator CMP0Output end of the power supply is connected with the ERR through the overload early warning circuit interface0And sending an overload early warning signal to the MCU processing unit.
As shown in FIG. 3, a response analog comparator CMP is arranged in the MCU processing unit1The MCU processing unit is connected with the DAC through a response digital-to-analog converter1Generating data receiving reference voltage Vr with value range of 7.5mV less than Vr (7.5+100) mV, and responding DAC1Connection ofAnswer-back analog comparator CMP1The sampling circuit outputs the sampling voltage VOL to the response analog comparator CMP1The MCU processing unit is internally provided with a data receiving terminal RXD, and when a slave generates a response signal, the response analog comparator CMP responds1And the output end of the MCU sends a data reading signal to the MCU processing unit through the data receiving end RXD.
The MCU processing unit is internally provided with a conflict simulation comparator CMP2The MCU processing unit is connected with the digital-to-analog converter DAC through the conflict2Generating a data receiving reference voltage Ve whose range is (7.5+100) mV < Ve < 15+100 mV2Connection conflict simulation comparator CMP2The sampling circuit outputs the sampling voltage VOL to the collision analog comparator CMP2The MCU processing unit is internally provided with a conflict alarm circuit ERR1Conflict simulation comparator CMP when a plurality of slaves simultaneously generate response signals2Output end of the relay is connected with the ERR through the conflict alarm circuit1And sending a response data collision signal to the MCU processing unit.
The specific implementation process is as follows:
calculating to obtain an overload reference voltage signal V according to the resistance values of all the slaves in the test circuit0The MCU processing unit passes through the DAC0Generating an overload reference voltage signal V0When the test circuit is overloaded or short-circuited, it passes through the overload simulation comparator CMP0The sampling voltage VOL of the non-inverting input end is higher than the overload reference voltage signal V0Overload analog comparator CMP0Outputting a high level to the MCU processing unit, and triggering an overload early warning circuit to alarm; when the external circuit is working normally, it passes through the overload analog comparator CMP0The sampling voltage VOL of the non-inverting input end is higher than the overload reference voltage signal V0Overload analog comparator CMP2And outputting a low level to the MCU processing unit.
Under the condition that the external circuit normally works, when no slave responds, the current flowing through the sampling resistor is 1.5mV, namely the sampling voltage VOL output by the sampling circuit is 7.5mV, and the sampling voltage VOL is simultaneously smaller than the data receiving reference voltages Vr and VrThe reference voltage Ve and the sampling voltage VOL are detected by the collision detection and analog comparator CMP1And collision simulation comparator CMP2Outputting low level when the MCU processing unit is in use, and generating no response signal in the MCU processing unit; when one slave generates a response signal, the sampling voltage VOL output by the sampling circuit is (7.5+100) mV, and at this time, the sampling voltage VOL is greater than the data receiving reference voltage Vr and less than the collision detection reference voltage Ve, and the response analog comparator CMP1Output high level, conflict analog comparator CMP to data receiving end RXD2Outputting a low level to the conflict alarm circuit ERR, namely converting the sampling voltage VOL output by the sampling circuit into data which can be read by the MCU processing unit through the ADC; when a plurality of slaves respond simultaneously, the sampling voltage VOL output by the sampling circuit is greater than or equal to (15+100) mV, the sampling voltage VOL is greater than the data receiving reference voltage Vr and the conflict detection reference voltage Ve simultaneously, and at the moment, the conflict analog comparator CMP2And outputting a high level to the conflict alarm circuit ERR, and triggering an early warning circuit in the MCU processing unit to send out an early warning signal.
The above description is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above embodiments, and all technical solutions belonging to the idea of the present invention belong to the protection scope of the present invention. It should be noted that several modifications and adaptations to those skilled in the art without departing from the scope of the present invention should be considered as within the scope of the present invention.
Claims (7)
1. Compatible multi-type is from singlechip system of machine, its characterized in that: comprises a test circuit, a sampling circuit, an MCU processing unit, and an overload analog comparator CMP0And overload warning circuit ERR0(ii) a A sampling resistor is arranged in the sampling circuit, the sampling resistor is connected with the test circuit in parallel, the sampling circuit collects a current signal and converts the current signal into a sampling voltage VOL, an analog-to-digital converter (ADC) is arranged in the MCU processing unit, and the MCU processing unit is connected with a data transmitting end TXD; a reference digital-to-analog converter DAC is arranged in the MCU processing unit0The MCU processing unit passes through a DAC (digital-to-analog converter)0To overload simulationComparator CMP0Input overload reference voltage signal V at the reverse input end0The sampling circuit is directed to the overload analog comparator CMP0The non-inverting input terminal of the comparator inputs the sampling voltage VOL, and the overload analog comparator CMP0The output end of the power supply is connected with an overload early warning circuit interface ERR0。
2. The one-chip microcomputer system compatible with multiple types of slaves of claim 1, wherein: a response digital-to-analog converter DAC is arranged in the MCU processing unit1And-response analog comparator CMP1The MCU processing unit is provided with a data receiving end RXD, and the sampling circuit outputs sampling voltage VOL to a response analog comparator CMP1Said response digital-to-analog converter DAC1Outputting the data reception reference voltage Vr to the response analog comparator CMP1Said counter analog comparator CMP1The output end of the receiving unit is connected with a data receiving end RXD.
3. The one-chip microcomputer system compatible with multiple types of slaves of claim 2, wherein: the resistance value of the sampling resistor is set to be R, and the value of the data receiving reference voltage Vr is set to be: 1.5R mV < Vr < 1.5+20) R mV.
4. The one-chip microcomputer system compatible with multiple types of slaves of claim 1, wherein: a conflict digital-to-analog converter DAC is arranged in the MCU processing unit2And collision simulation comparator CMP2The MCU processing unit is provided with a conflict alarm circuit ERR1The sampling circuit outputs a sampling voltage VOL to a collision simulation comparator CMP2The conflict digital-to-analog converter DAC1Outputting the conflict detection reference voltage Ve to the conflict simulation comparator CMP2The inverse input terminal of the collision simulation comparator CMP2Output end of the collision alarm circuit ERR1。
5. The one-chip microcomputer system compatible with multiple types of slaves of claim 4, wherein: the resistance value of the sampling resistor is set to be R, and the value of the conflict detection reference voltage Ve is set to be: (1.5+20) R mV < Ve < 1.5 × 2+20) R mV.
6. The one-chip microcomputer system compatible with multiple types of slaves of claim 1, wherein: and a filter circuit is arranged between the sampling circuit and the ADC and is a resistor-capacitor filter circuit.
7. The one-chip microcomputer system compatible with multiple types of slaves of claim 1, wherein: the test circuit comprises a host communication issuing circuit, the host communication issuing circuit is provided with a plurality of relays, the host communication issuing circuit is physically divided into a plurality of channels through the relays, and an instruction module for controlling the on-off of the relays is further arranged in the MCU processing unit.
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