CN120490779A - Laser chip adaptive testing device and method based on lightwave component analyzer - Google Patents
Laser chip adaptive testing device and method based on lightwave component analyzerInfo
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- CN120490779A CN120490779A CN202510762102.5A CN202510762102A CN120490779A CN 120490779 A CN120490779 A CN 120490779A CN 202510762102 A CN202510762102 A CN 202510762102A CN 120490779 A CN120490779 A CN 120490779A
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Abstract
The invention discloses a self-adaptive testing device and method for a laser chip based on an optical wave element analyzer, which belong to the technical field of photoelectric testing and comprise a microwave and total control module, wherein the microwave and total control module is connected with a direct current bias device, the direct current bias device is connected with a laser chip, the laser chip is connected with a high-speed optical receiver module, the high-speed optical receiver module is connected with the microwave and total control module, the high-speed optical receiver module comprises an optical coupler, the optical coupler is connected with the laser chip, the optical coupler is connected with an optical power meter and an optical amplifier, the optical power meter and the optical amplifier are both connected with a feedback controller, the feedback controller is connected with the microwave and total control module, and the optical amplifier is connected with the high-speed photoelectric detector and then is connected with the microwave and total control module through an electric output end. The invention realizes the accurate test of the frequency response parameters of the low-power laser chips, and meets the frequency response parameter test requirements of various laser chips in links of research, development, verification, production detection and the like.
Description
Technical Field
The invention relates to the technical field of photoelectric testing, in particular to a self-adaptive testing device and method for a laser chip based on an optical wave element analyzer.
Background
The statements in this section merely provide background information related to the present disclosure and may not necessarily constitute prior art.
The high-speed laser chip is used for outputting high-frequency modulated optical signals and is a core device in a high-speed optical transmission system. The frequency response characteristic parameters such as 3dB bandwidth and response flatness are used as core technical indexes of the high-speed laser, and strict tests are required in product development and production.
In the prior art, the scheme of testing the laser chip by adopting the optical wave element analyzer is most applied, but the photoelectric conversion module of the optical wave element analyzer is limited by the performance of an internal high-speed photoelectric detector, the testing linear area is limited, the input optical power is strictly required, various lasers on the engineering are in various types, the laser chip inevitably causes optical power loss in the coupling process of a chip test board, the actual testing optical power is too low and is lower than the lower limit of the photoelectric conversion module of the optical wave element analyzer, the testing precision is affected, and excessive random noise is introduced.
The existing laser chip test system based on the optical wave element analyzer is characterized in that an electric output port of the optical wave element analyzer is connected with a Biastee (direct current bias) and then connected with a probe and a laser chip, an optical power meter is used for testing the optical output end face of the laser after optical fiber coupling, when the optical power is too low, an external optical amplifier is used for optical amplification, the amplification gain of the optical amplifier is properly adjusted according to the tested value of the optical power meter, and the amplified optical power meter is connected with an optical input interface of the optical wave element analyzer to start testing. After the optical signal output by the laser chip is coupled by the optical fiber, an optical power meter and an optical amplifier are required to be plugged in and plugged out in sequence, the gain of the optical amplifier is required to be manually adjusted according to the power value tested by the optical power meter, the stability of a probe station and an optical path is required to be ensured, the optical coupling efficiency is changed when the probe station and the optical path are slightly dithered or vibrated, the value of the optical power is changed, the gain of the optical amplifier can be reset only by re-switching the optical path, and the operation steps are complicated. And the error brought by the optical amplifier cannot be accurately eliminated, after the optical amplifier amplifies the optical signal power, the amplitude of the transmission parameter measured by the optical wave element analyzer can be increased, and the wavelength response flatness of the optical amplifier can directly influence the shape of the transmission parameter S21 curve, so that the testing precision of the characteristic parameters such as the bandwidth of a laser chip and the like is influenced.
In summary, the existing laser chip test system based on the optical wave element analyzer can realize the frequency response test of the low-power laser chip, but has the defects of complex system structure, unable accurate compensation of the optical amplifier parameters, complicated operation steps and the like, and affects the test precision and efficiency.
Disclosure of Invention
Aiming at the problems, the invention provides a self-adaptive testing device and method for a laser chip based on an optical wave element analyzer, which designs functions and algorithms of automatic detection of optical power, self-adaptive amplification of an optical amplifier, accurate compensation of frequency response parameters and the like, realizes accurate testing of the frequency response parameters of a low-power laser chip, and meets the frequency response parameter testing requirements of various laser chips in links of research, development, verification, production, detection and the like.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
The invention provides a self-adaptive testing device of a laser chip based on an optical wave element analyzer, which comprises a microwave and master control module, wherein the microwave and master control module is connected with the input end of a direct current bias device, the output end of the direct current bias device is connected with the input end of the laser chip, the output end of the laser chip is connected with the optical input end of a high-speed optical receiver module, and the electrical output end of the high-speed optical receiver module is connected to the microwave and master control module;
The high-speed optical receiver module comprises an optical coupler, the input end of the optical coupler is connected with the laser chip, two output ends of the optical coupler are arranged, the first output end of the optical coupler is connected with the optical power meter, the second output end of the optical coupler is connected with the optical amplifier, the optical power meter and the optical amplifier are both connected with the feedback controller, and the feedback controller is connected with the microwave and total control module;
The output end of the optical amplifier is connected with the high-speed photoelectric detector and then connected to the microwave and total control module through the electric output end of the high-speed optical receiver module, and the feedback controller controls the optical amplifier in real time according to the monitoring value of the optical power meter so that the output power of the optical amplifier is in the linear region of the high-speed photoelectric detector.
As a further implementation, the dc-biaser is also connected to a digital source table.
As a further implementation, the light beam at the output end of the laser chip is coupled by an optical fiber and then input into an optical coupler.
As a further implementation, the optocoupler is a 1/99 optocoupler, wherein the first output is 1% end and the second output is 99% end.
As a further implementation manner, the microwave and general control module comprises a microwave signal generating unit, a mixing receiving unit and a general control unit.
As a further implementation manner, the optical power meter monitors an input optical signal in real time, and transmits a monitoring result to the feedback controller, and the feedback controller controls the gain of the optical amplifier in real time according to the monitoring result.
As a further implementation mode, the gain of the optical amplifier is controlled in real time, specifically, the feedback controller adjusts the input current of the optical amplifier, so as to control the gain of the optical amplifier and enable the output power of the optical amplifier to be in the linear region of the high-speed photoelectric detector.
As a further implementation manner, after the setting of the optical amplifier is completed, the feedback control unit feeds back the setting parameters of the optical amplifier to the microwave and master control module of the optical wave element analyzer, and the microwave and master control module performs de-embedding compensation on the frequency response parameters corresponding to the working parameters of the optical amplifier.
According to a second aspect of the present invention, there is provided a laser chip adaptive test method based on a light wave element analyzer, a laser chip adaptive test device based on a light wave element analyzer according to the first aspect of the present invention, comprising the steps of:
Connecting a laser chip testing device and setting testing parameters of an optical wave element analyzer;
the method comprises the steps of utilizing an optical power meter to monitor an input optical signal in real time and transmitting a monitoring result to a feedback controller;
The feedback controller sets the driving current of the optical amplifier according to the monitoring result, realizes the gain adjustment of the optical amplifier, and ensures that the output power of the optical amplifier is in the linear region of the high-speed photoelectric detector;
After the setting of the optical amplifier is completed, the feedback control unit feeds back the setting parameters of the optical amplifier to the microwave and master control module of the optical wave element analyzer, and the microwave and master control module performs de-embedding compensation on the frequency response parameters corresponding to the working parameters of the optical amplifier;
And starting scanning test S21 curves and S11 curves, and finishing the test of the frequency response characteristic parameters such as laser bandwidth, reflection and the like.
As a further implementation manner, the optical wave element analyzer performs calibration and calibration on parameters of an optical amplifier in the high-speed optical receiver module when leaving the factory, and calibration data are stored in the microwave and master control module.
Compared with the prior art, the invention has the beneficial effects that:
According to the self-adaptive testing device and method for the laser chip based on the optical wave element analyzer, aiming at a complex scene of testing the laser chip, the optical power meter unit, the optical amplifier unit, the feedback control unit and the related optical paths are integrated in the high-speed optical receiver module of the optical wave element analyzer, automatic monitoring and control are realized through the feedback control unit, manual setting is not needed, one-key testing of the parameters of the laser chip can be realized, and the testing efficiency is greatly improved. Meanwhile, the method and the device accurately calibrate and compensate errors introduced by the optical amplifier, and avoid the influence on the testing precision of the laser chip due to testing errors introduced by uneven wavelength response of the optical amplifier.
The self-adaptive testing device and method for the laser chip based on the optical wave element analyzer design functions and algorithms of automatic detection of optical power, self-adaptive amplification of an optical amplifier, accurate compensation of frequency response parameters and the like, realize accurate testing of the frequency response parameters of the low-power laser chip, are more suitable for the frequency response parameter testing requirements of various laser chips in links of research, development, verification, production detection and the like, reduce the complexity of a testing system, realize one-key testing of chip bandwidth, and greatly improve the efficiency and the accuracy of the frequency response parameter testing of the laser chip.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention.
FIG. 1 is a schematic diagram of the overall structure of a conventional laser chip testing device based on a light wave element analyzer;
fig. 2 is a schematic diagram of the overall structure of the laser chip adaptive testing device based on the optical wave element analyzer.
Detailed Description
The invention is further described below with reference to the drawings and examples.
It should be noted that the following detailed description is illustrative and is intended to provide further explanation of the invention. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.
Embodiments of the invention and features of the embodiments may be combined with each other without conflict.
Example 1
As shown in fig. 2, the embodiment provides a laser chip self-adaptive testing device based on an optical wave element analyzer, which comprises a microwave and total control module, wherein the microwave and total control module is connected with an input end of a direct current bias device, an output end of the direct current bias device is connected with an input end of the laser chip, an output end of the laser chip is connected with an optical input end of a high-speed optical receiver module, and an electrical output end of the high-speed optical receiver module is connected to the microwave and total control module.
The high-speed optical receiver module comprises an optical coupler, the input end of the optical coupler is connected with the laser chip, two output ends of the optical coupler are arranged, the first output end of the optical coupler is connected with the optical power meter, the second output end of the optical coupler is connected with the optical amplifier, the optical power meter and the optical amplifier are connected with the feedback controller, and the feedback controller is connected with the microwave and total control module.
The output end of the optical amplifier is connected with the high-speed photoelectric detector and then connected to the microwave and total control module through the electric output end of the high-speed optical receiver module, and the feedback controller controls the optical amplifier in real time according to the monitoring value of the optical power meter, so that the output power of the optical amplifier is in the linear region of the high-speed photoelectric detector.
Fig. 1 is a diagram of an existing laser chip test system built based on a light wave element analyzer, which is an improvement of the existing laser chip test system built based on the light wave element analyzer.
The device comprises an optical wave element analyzer, biastee (direct current bias device) and a digital source meter, and has the advantages of simple integral structure, ingenious design and easy operation. The high-speed optical receiver module of the optical wave element analyzer is integrated with a 1/99 optical coupler, an optical power meter unit, a feedback controller unit, an optical amplifier unit, a high-speed photoelectric detector unit and the like, so that low-power self-adaptive amplification and test of optical signals are realized.
In this embodiment, the dc bias is also connected to a digital source meter that is capable of measuring the associated electrical parameter.
The light beam at the output end of the laser chip is coupled by an optical fiber and then input into an optical coupler. The optical coupler in the invention is a 1/99 optical coupler, wherein the first output end is 1% end, and the second output end is 99% end.
The optical power meter monitors an input optical signal in real time, and transmits a monitoring result to the feedback controller, and the feedback controller controls the gain of the optical amplifier in real time according to the monitoring result. The gain of the optical amplifier is controlled in real time, specifically, the feedback controller adjusts the input current of the optical amplifier, so as to control the gain of the optical amplifier and enable the output power of the optical amplifier to be in the linear region of the high-speed photoelectric detector. After the setting of the optical amplifier is completed, the feedback control unit feeds back the setting parameters of the optical amplifier to the microwave and master control module of the optical wave element analyzer, and the microwave and master control module performs de-embedding compensation on the frequency response parameters corresponding to the working parameters of the optical amplifier.
The microwave and master control module comprises a microwave signal generating unit, a mixing receiving unit and a master control unit. The microwave signal generating unit outputs an electric signal, is connected Biastee (direct current bias) and a digital source meter, realizes the bias of the direct current signal and then inputs the electric signal into a radio frequency interface of a laser chip, completes the driving and radio frequency input of the laser chip, after the chip works normally, the output optical signal is coupled through a lens optical fiber and is connected to an optical input interface of a high-speed optical receiver module of the optical wave element analyzer, in the high-speed optical receiver module, the optical signal passes through a 1/99 optical coupler, 99% end is connected with an optical amplifier unit to realize the optical amplification, 1% end is connected with an optical power meter unit to monitor the input optical signal in real time, the optical power meter unit and the optical amplification unit are subjected to data monitoring and real-time control through a feedback controller, and the input current of the optical amplifier is adjusted according to the power value of the input optical power, so that the gain of the optical amplifier is controlled, the output power of the optical amplifier is in a linear region of the high-speed photoelectric detector, and after the optical amplifier is completely set, the feedback control unit of the high-speed optical receiver module feeds back the setting parameters of the optical amplifier to the total control module of the optical amplifier element analyzer, and the total control module carries out the scanning and the test on the frequency compensation corresponding to the working parameters of the optical amplifier.
When the optical power is changed due to slight shake of the replaced chip or the coupling optical fiber, the high-speed optical receiver module feedback controller can automatically adjust the gain of the optical amplifier according to the change of the monitoring value of the optical power meter unit, so that manual test and setting by a tester are not needed, and the test efficiency and the test precision are greatly improved.
Example two
The embodiment provides a laser chip self-adaptive testing method based on a light wave element analyzer, and a laser chip self-adaptive testing device based on the light wave element analyzer is provided. The method comprises the following steps:
Connecting a laser chip testing device and setting testing parameters of an optical wave element analyzer;
the method comprises the steps of utilizing an optical power meter to monitor an input optical signal in real time and transmitting a monitoring result to a feedback controller;
The feedback controller sets the driving current of the optical amplifier according to the monitoring result, realizes the gain adjustment of the optical amplifier, and ensures that the output power of the optical amplifier is in the linear region of the high-speed photoelectric detector;
After the setting of the optical amplifier is completed, the feedback control unit feeds back the setting parameters of the optical amplifier to the microwave and master control module of the optical wave element analyzer, and the microwave and master control module performs de-embedding compensation on the frequency response parameters corresponding to the working parameters of the optical amplifier;
And starting scanning test S21 curves and S11 curves, and finishing the test of the frequency response characteristic parameters such as laser bandwidth, reflection and the like.
As a further implementation manner, the optical wave element analyzer performs calibration and calibration on parameters of an optical amplifier in the high-speed optical receiver module when leaving the factory, and calibration data are stored in the microwave and master control module.
The specific implementation process of the invention is as follows:
The coaxial calibration piece optical wave element analyzer is used, according to the device structure diagram of fig. 2, a Biastee (direct current bias), a digital source meter and a laser chip are connected, after the optical fiber coupling is used for the optical output end face of the laser chip, the optical input port of a high-speed optical receiver module of the optical wave element analyzer is connected, and the electric output port of the high-speed optical receiver module is connected to a microwave and general control module of the optical wave element analyzer by a radio frequency cable.
In the special software of the optical wave element analyzer host computer, after setting the wavelength parameter, clicking is started, and the optical input signal is set(DBm), 1% end is connected with an optical power meter unit through a 1/99 optical coupler, and the signal power detected by the optical power meter unitIs 0.01×Namely, 1% (optical power meter end) insertion loss after passing through a 1/99 optical coupler is as follows:
The unit is dB;
The optical power meter monitors the input optical signal in real time, and the input power of the optical receiver The insertion loss is 20dB after passing through the optical coupler, namely the power actually input into the optical power meter isIn the special software of the optical power meter unit, the compensation factor is added to the actual measurement value of the optical power meter by 20dB, and the power value fed back by the power meter unit is the actual power input by the optical input interface of the high-speed optical receiver module.
The 1/99 optical coupler is connected with the optical amplifier at 99% end, the optical power meter unit feeds back the optical power monitoring value of the optical input interface to the feedback controller, the feedback controller sets the driving current of the optical amplifier according to the monitoring value, realizes gain adjustment of the optical amplifier, sets the specific gain value according to the boundary value of the linear region of the high-speed photoelectric detector, and sets the boundary of the linear region of the high-speed photoelectric detector as、The device of the invention aims at the situation that the optical input signal is weaker, namely, the minimum input optical power and the maximum input optical power of the linear region are respectivelyBy setting the amplification gain of the optical amplifier, the optical power of the input optical signal amplified by the optical amplifier isThe optical power is prevented from changing beyond the linear region due to unstable coupling fiber, and the gain of the optical amplifier is。
Under different gain working conditions of the optical amplifier, the S21 parameter amplitude is different, and the flatness of the wavelength of the optical amplifier also causes the flatness of the S21 curve, so the optical wave element analyzer can calibrate and calibrate the parameters of the optical amplifier in the high-speed optical receiver when leaving the factory, the data are stored in the master control module, and a reference gain value is set when calibrating the parametersS parameter under working conditionsIn the actual test process, the actual working gain of the optical amplifier is as followsAt this time, the actual S parameter of the optical amplifier is,AndAll are in a special S2p file format for the vector network analyzer, and comprise S parameters of each frequency point, because changing the gain of the optical amplifier only affects the amplitude value of S21, the overall curve shape of S21 is not changed,Namely, isOn the basis that the S21 amplitude value of each frequency point is added with a compensation factor, and the compensation factor is set as(dB):
Total control module of light wave element analyzerAs an error term for the optical amplifier.
And starting scanning test S21 and S11 curves, and finishing the test of the frequency response characteristic parameters such as laser bandwidth, reflection and the like.
The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
While the foregoing description of the embodiments of the present invention has been presented in conjunction with the drawings, it should be understood that it is not intended to limit the scope of the invention, but rather, it is intended to cover all modifications or variations within the scope of the invention as defined by the claims of the present invention.
Claims (10)
1. The self-adaptive testing device of the laser chip based on the light wave element analyzer is characterized by comprising a microwave and total control module, wherein the microwave and total control module is connected with the input end of a direct current bias device, the output end of the direct current bias device is connected with the input end of the laser chip, the output end of the laser chip is connected with the optical input end of a high-speed optical receiver module, and the electrical output end of the high-speed optical receiver module is connected to the microwave and total control module;
the high-speed optical receiver module comprises an optical coupler, wherein the input end of the optical coupler is connected with the laser chip, two output ends of the optical coupler are arranged, the first output end of the optical coupler is connected with the optical power meter, the second output end of the optical coupler is connected with the optical amplifier, the optical power meter and the optical amplifier are both connected with the feedback controller, and the feedback controller is connected with the microwave and total control module;
The output end of the optical amplifier is connected with the high-speed photoelectric detector and then connected to the microwave and total control module through the electric output end of the high-speed optical receiver module, and the feedback controller controls the optical amplifier in real time according to the monitoring value of the optical power meter so that the output power of the optical amplifier is in the linear region of the high-speed photoelectric detector.
2. The adaptive testing device for a laser chip based on an optical wave element analyzer according to claim 1, wherein the dc bias device is further connected to a digital source meter.
3. The adaptive testing device for a laser chip based on an optical wave element analyzer according to claim 1, wherein the light beam at the output end of the laser chip is coupled by an optical fiber and then input into an optical coupler.
4. The adaptive testing device for a laser chip based on a light wave element analyzer according to claim 3, wherein the optocoupler is a 1/99 optocoupler, wherein the first output terminal is a 1% terminal and the second output terminal is a 99% terminal.
5. The adaptive testing device for a laser chip based on an optical wave element analyzer according to claim 1, wherein the microwave and master control module comprises a microwave signal generating unit, a mixing receiving unit and a master control unit.
6. The adaptive testing device for a laser chip based on an optical wave element analyzer according to claim 1, wherein the optical power meter monitors an input optical signal in real time and transmits a monitoring result to a feedback controller, and the feedback controller controls the gain of the optical amplifier in real time according to the monitoring result.
7. The adaptive testing device for a laser chip based on an optical wave element analyzer of claim 6, wherein the gain of the optical amplifier is controlled in real time, specifically, the feedback controller adjusts the input current of the optical amplifier, thereby controlling the gain of the optical amplifier so that the output power of the optical amplifier is within the linear region of the high-speed photodetector.
8. The adaptive testing device for a laser chip based on an optical wave element analyzer according to claim 6, wherein the feedback control unit feeds back the setting parameters of the optical amplifier to the microwave and master control module of the optical wave element analyzer after the optical amplifier is set, and the microwave and master control module performs de-embedding compensation on the frequency response parameters corresponding to the working parameters of the optical amplifier.
9. A method for adaptively testing a laser chip based on a light wave element analyzer, characterized in that the device for adaptively testing a laser chip based on a light wave element analyzer according to any one of claims 1 to 8 comprises the steps of:
Connecting a laser chip testing device and setting testing parameters of an optical wave element analyzer;
the method comprises the steps of utilizing an optical power meter to monitor an input optical signal in real time and transmitting a monitoring result to a feedback controller;
The feedback controller sets the driving current of the optical amplifier according to the monitoring result, realizes the gain adjustment of the optical amplifier, and ensures that the output power of the optical amplifier is in the linear region of the high-speed photoelectric detector;
After the setting of the optical amplifier is completed, the feedback control unit feeds back the setting parameters of the optical amplifier to the microwave and master control module of the optical wave element analyzer, and the microwave and master control module performs de-embedding compensation on the frequency response parameters corresponding to the working parameters of the optical amplifier;
And starting scanning test S21 curves and S11 curves, and finishing the test of the frequency response characteristic parameters such as laser bandwidth, reflection and the like.
10. The adaptive testing method of a laser chip based on a light wave element analyzer according to claim 9, wherein the light wave element analyzer calibrates and calibrates parameters of an optical amplifier in a high-speed optical receiver module when leaving a factory, and calibration data is stored in a microwave and master control module.
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