CN1314517C - Manufacturing method of integrally formed PU polishing pad - Google Patents
Manufacturing method of integrally formed PU polishing pad Download PDFInfo
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- CN1314517C CN1314517C CNB021538867A CN02153886A CN1314517C CN 1314517 C CN1314517 C CN 1314517C CN B021538867 A CNB021538867 A CN B021538867A CN 02153886 A CN02153886 A CN 02153886A CN 1314517 C CN1314517 C CN 1314517C
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- 238000004519 manufacturing process Methods 0.000 title claims description 39
- 238000005498 polishing Methods 0.000 title description 54
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- 239000011347 resin Substances 0.000 claims abstract description 52
- 238000000227 grinding Methods 0.000 claims abstract description 35
- 239000012948 isocyanate Substances 0.000 claims abstract description 20
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- 239000007789 gas Substances 0.000 claims abstract description 13
- 239000000203 mixture Substances 0.000 claims abstract description 13
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- 238000005187 foaming Methods 0.000 claims abstract description 8
- 229920000768 polyamine Polymers 0.000 claims abstract description 7
- 238000000034 method Methods 0.000 claims description 43
- 239000004814 polyurethane Substances 0.000 claims description 26
- 125000000524 functional group Chemical group 0.000 claims description 16
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- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims description 6
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- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 claims description 4
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- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 4
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- YFMFNYKEUDLDTL-UHFFFAOYSA-N 1,1,1,2,3,3,3-heptafluoropropane Chemical compound FC(F)(F)C(F)C(F)(F)F YFMFNYKEUDLDTL-UHFFFAOYSA-N 0.000 claims description 2
- LVGUZGTVOIAKKC-UHFFFAOYSA-N 1,1,1,2-tetrafluoroethane Chemical compound FCC(F)(F)F LVGUZGTVOIAKKC-UHFFFAOYSA-N 0.000 claims description 2
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- FRCHKSNAZZFGCA-UHFFFAOYSA-N 1,1-dichloro-1-fluoroethane Chemical compound CC(F)(Cl)Cl FRCHKSNAZZFGCA-UHFFFAOYSA-N 0.000 claims description 2
- VOPWNXZWBYDODV-UHFFFAOYSA-N Chlorodifluoromethane Chemical compound FC(F)Cl VOPWNXZWBYDODV-UHFFFAOYSA-N 0.000 claims description 2
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- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 7
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- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 4
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- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
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- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
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- DKJBREHOVWISMR-UHFFFAOYSA-N 1-chloro-2,3-diisocyanatobenzene Chemical compound ClC1=CC=CC(N=C=O)=C1N=C=O DKJBREHOVWISMR-UHFFFAOYSA-N 0.000 description 2
- 239000005057 Hexamethylene diisocyanate Substances 0.000 description 2
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- RRAMGCGOFNQTLD-UHFFFAOYSA-N hexamethylene diisocyanate Chemical compound O=C=NCCCCCCN=C=O RRAMGCGOFNQTLD-UHFFFAOYSA-N 0.000 description 2
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- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 2
- 239000008096 xylene Substances 0.000 description 2
- JECYNCQXXKQDJN-UHFFFAOYSA-N 2-(2-methylhexan-2-yloxymethyl)oxirane Chemical compound CCCCC(C)(C)OCC1CO1 JECYNCQXXKQDJN-UHFFFAOYSA-N 0.000 description 1
- MLPVBIWIRCKMJV-UHFFFAOYSA-N 2-ethylaniline Chemical compound CCC1=CC=CC=C1N MLPVBIWIRCKMJV-UHFFFAOYSA-N 0.000 description 1
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- SLINHMUFWFWBMU-UHFFFAOYSA-N Triisopropanolamine Chemical compound CC(O)CN(CC(C)O)CC(C)O SLINHMUFWFWBMU-UHFFFAOYSA-N 0.000 description 1
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- KORSJDCBLAPZEQ-UHFFFAOYSA-N dicyclohexylmethane-4,4'-diisocyanate Chemical compound C1CC(N=C=O)CCC1CC1CCC(N=C=O)CC1 KORSJDCBLAPZEQ-UHFFFAOYSA-N 0.000 description 1
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- UAEPNZWRGJTJPN-UHFFFAOYSA-N methylcyclohexane Chemical compound CC1CCCCC1 UAEPNZWRGJTJPN-UHFFFAOYSA-N 0.000 description 1
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- Polyurethanes Or Polyureas (AREA)
Abstract
Description
技术领域technical field
本发明有关制造具有可研磨晶圆(wafers)及光学镜片(TFT-LCD,......)等相关产品的PU发泡研磨垫的方法,及由该方法所获得一体成型的发泡PU研磨垫产品。The present invention relates to the method for manufacturing the PU foaming polishing pad that can grind wafers (wafers) and optical lenses (TFT-LCD, ...) and other related products, and the integrally formed foaming pad obtained by the method PU abrasive pad products.
背景技术Background technique
半导体内存(Memory)与逻辑元件(Logic device)的发展过程中,为了提高电子元件密度与降低生产成本,在元件制作工艺上有提升深宽比(Aspect ratio)及增加导线层数的趋势。但在形成这样的多层导线结构时,随着堆栈层数的增加,芯片的表面高低差及扭曲程度也会变大,因此为了形成更多层的导线结构并确保其良率,能在元件制作工艺中将表面的微细凹凸消除并达到所谓的完全平坦化(Global planarity)的技术成为众所瞩目的焦点。最早提出这个方法的是美国的IBM公司。IBM公司不但开发出化学机械研磨法(CMP,Chemical Mechnical Polishing)的精密研磨方法,并提出应用化学机械研磨法来制作埋入导线的金属镶嵌法(Damascene)。基本上化学机械研磨是凭借悬浊细小粒子的研磨液与具有弹性、硬度适当的研磨垫的相对运动、作用在芯片表面来进行平坦化的。研磨垫在芯片表面移动时,接触点粒子被压在芯片表面,凭借芯片表面与粒子之间的摩擦滑动而有磨耗的作用。研磨垫的柔软度、硬度、粗糙度等物性,会影响研磨液中研磨粒的相互作用在水平方向与垂直方向出现不规则关系。在一定的压力之下,研磨垫水平方向上的施力是决定平坦化好坏的重要因素。由于化学机械研磨制作工艺中,研磨垫需承受来自研磨头的压力并传送至被研磨表面,以维持研磨时的平坦度,且研磨液粒子的均匀分散为影响研磨后表面均匀度的重要因素。因此,研磨垫必须具有能提供研磨作用的足够硬度与足以容纳研磨液的微孔。一般而言,越大的微孔越能促使研磨液中的细小粒子均匀分散,同时较能容纳研磨所移除的残渣和失效的研磨浆液,但是过大的微孔则无法维持一致的研磨压力,而导致被研磨表面的平坦度降低。During the development of semiconductor memory (Memory) and logic devices (Logic device), in order to increase the density of electronic components and reduce production costs, there is a tendency to increase the aspect ratio (Aspect ratio) and increase the number of wire layers in the component manufacturing process. However, when forming such a multi-layer wire structure, as the number of stacked layers increases, the surface height difference and twist of the chip will also increase. Therefore, in order to form more layers of wire structure and ensure its yield, it is possible to In the manufacturing process, the technology of eliminating the fine unevenness of the surface and achieving the so-called global planarity has become the focus of attention. The first to propose this method was the IBM Corporation of the United States. IBM has not only developed a chemical mechanical polishing (CMP, Chemical Mechnical Polishing) precision grinding method, but also proposed a metal damascene method (Damascene) that uses chemical mechanical polishing to make embedded wires. Basically, chemical mechanical polishing is planarized by means of the relative movement between the slurry of suspended fine particles and the polishing pad with elasticity and appropriate hardness, acting on the surface of the chip. When the polishing pad moves on the surface of the chip, the particles at the contact point are pressed against the surface of the chip, and the friction and sliding between the surface of the chip and the particles has the effect of abrasion. The softness, hardness, roughness and other physical properties of the polishing pad will affect the interaction of the abrasive particles in the polishing liquid, and the irregular relationship between the horizontal direction and the vertical direction will appear. Under a certain pressure, the force exerted in the horizontal direction of the polishing pad is an important factor in determining whether the planarization is good or bad. In the chemical mechanical polishing process, the polishing pad needs to withstand the pressure from the polishing head and transmit it to the surface to be polished to maintain the flatness during polishing, and the uniform dispersion of the polishing liquid particles is an important factor affecting the uniformity of the surface after polishing. Therefore, the grinding pad must have enough hardness to provide grinding effect and micropores enough to hold the grinding liquid. Generally speaking, the larger the micropores, the more uniformly dispersed the fine particles in the grinding liquid can be. At the same time, it is more able to accommodate the residue removed by grinding and the invalid grinding slurry, but the excessively large micropores cannot maintain a consistent grinding pressure. , resulting in a decrease in the flatness of the polished surface.
当研磨垫使用一段时间之后,由于研磨残渣和研磨粒子累积在研磨垫的微孔中,需凭借刮去或刷净研磨垫的调整(conditioning)步骤以清除研磨垫的沉积物。然而,当研磨垫产生玻璃化时,而无法由调整步骤使其恢复研磨功效,亦即该研磨垫已到达使用寿命终点。因此,基于降低成本与提升产率的考虑,改善研磨垫的使用寿命也极为令业界所期待。After the polishing pad has been used for a period of time, since the grinding residue and abrasive particles are accumulated in the micropores of the polishing pad, it is necessary to scrape or brush the polishing pad for conditioning to remove the deposits on the polishing pad. However, when the polishing pad is vitrified, the polishing function cannot be restored through the adjustment steps, that is, the polishing pad has reached the end of its service life. Therefore, based on the consideration of cost reduction and productivity improvement, improving the service life of the polishing pad is highly anticipated by the industry.
过去曾使用如美国专利第3,284,274号案所记载的多孔性材料作为研磨材料。Porous materials such as those described in US Pat. No. 3,284,274 have been used as abrasive materials in the past.
随后,美国专利第4,841,680号案揭示具有上下倒置微孔的湿式PU研磨垫。该研磨垫以公知的溶剂/非溶剂聚合物凝结技术(polymercoagulation technology)制作而成,其制作工艺是先以聚醇类与异氰酸酯在80℃下先行反应,然后溶于二甲基甲醯胺(DMF)形成聚合物溶液,将此聚合物溶液涂覆在基材上之后,浸入水浴中使该聚合物完全/充分凝结,接着以另一溶剂(例如水)将原来溶剂(例如DMF)置换出来,再凭借高温、干燥并使聚合物中残留的溶剂挥发,以形成不规则形状的孔洞。美国专利第6,095,902号案使用共聚合反应的聚醚多元醇与聚酯多元醇,或使用含三种以上的多元醇,以制造多孔弹性的湿式PU研磨垫的方法。此两件专利均利用另一溶剂置换或高温使残余溶剂挥发的方法,以形成内部具有不均匀微孔的聚合物,然后将此聚合物以刀片或转动研磨柱面去除表层使其下方的孔洞外露,再与底衬基材贴合制成研磨垫,或是于模具中使聚合物发泡形成圆柱状(cake),经裁切成单片,再黏贴至基材上制成研磨垫。由于上述方法所得的研磨垫须凭借形成PU发泡聚合物、去除表层/切成单片及黏合等步骤才能完成,其制作工艺十分耗工,且因去除表层/切成单片的过程中不易控制,致使微孔有细致度不均匀、表面开口较小、工作表面中的孔壁比例增加及表面开口直径小于底部直径等不利于研磨稳定性(例如使用寿命难以预料、研磨液粒子与被研磨表面接触不均匀)的问题容易发生。Subsequently, US Patent No. 4,841,680 disclosed a wet PU polishing pad with upside-down micropores. The polishing pad is made by the known solvent/non-solvent polymer coagulation technology (polymercoagulation technology). The manufacturing process is to first react polyalcohols and isocyanates at 80°C, and then dissolve them in dimethylformamide ( DMF) to form a polymer solution. After coating the polymer solution on the substrate, immerse it in a water bath to completely/fully coagulate the polymer, and then replace the original solvent (such as DMF) with another solvent (such as water) , and then rely on high temperature, drying and volatilization of the residual solvent in the polymer to form irregularly shaped holes. US Patent No. 6,095,902 uses copolymerized polyether polyol and polyester polyol, or uses polyols containing more than three kinds, to produce a porous elastic wet PU polishing pad. Both of these two patents use another method of solvent replacement or high temperature to volatilize the residual solvent to form a polymer with uneven micropores inside, and then use a blade or rotating grinding cylinder to remove the surface layer of the polymer to make the pores below it Exposed, and then laminated with the backing substrate to make a polishing pad, or foam the polymer in a mold to form a cake, cut into single pieces, and then stick it to the substrate to make a polishing pad . Since the polishing pad obtained by the above method has to be completed by forming PU foam polymer, removing the surface layer/cutting into single pieces and bonding, the manufacturing process is very labor-intensive, and it is not easy to remove the surface layer/cut into single pieces. Control, resulting in uneven fineness of micropores, small surface openings, increased hole wall ratio in the working surface, and surface opening diameters smaller than bottom diameters, which are not conducive to grinding stability (such as unpredictable service life, abrasive particles and ground The problem of uneven surface contact) is prone to occur.
此外,美国专利第5,578,362号案中揭示一种包括以多数中空、具可挠性、有机聚合微单元(polymeric microelement)所浸渍的聚合基质的研磨垫,该研磨垫具有工作表面及接近该工作表面的次表面(subsurface)。在工作表面的一部份聚合微单元暴露于工作环境并且容纳研磨液,而埋在次表面内的另一部分聚合微单元不暴露在工作环境中。由于在工作表面的一部份聚合微单元暴露在工作环境中,因此使该工作表面比该次表面相对较软。当研磨垫磨耗而该聚合微单元暴露于工作环境时,该次表面则成为相对较软的工作表面,借此自行再生具有一致研磨特性的新的工作表面。然而此专利的方法需经过混合聚合基质、掺合中空弹性聚合微球、将混合物馈入模具、在相对高于常温的温度下熟化该混合物、冷却及表面处理或改质等步骤以完成研磨垫制作,不仅费时且不易维持稳定的操作条件,故大幅降低了该方法的产业上可利用性。美国专利第6,022,268号案揭示一种由本身不具有吸收或输送多数浆液粒子能力的亲水性研磨层所构成的研磨垫,该研磨层的研磨表面具有凭借使可流动材料固化制成不规则的表面形状及大型纹路。此专利不由较大材料裁切研磨垫而利用固化方式制造研磨层,并且不以裁切或切削研磨表面,而将至少一部份的大型纹路施加在该研磨表面上。由此专利的实施例可明了除了利用射出成型至具有所要求研磨垫的最终尺寸及沟槽设计的模具外,其余所用配方及成型条件均与美国专利第5,578,362号案相同,因此,尽管此专利有效改善研磨表面因裁切所造成的大型缺陷(macro-defcts)及研磨效能,但仍旧存在着制作费时等缺点。而美国专利第6,239,188号案揭示在特定范围的重量比例将10至50μm与80至100μm两种大小的经膨胀的微气球物(microballon)加入末端为异氰酸酯的聚脲酯预聚物及活性含氢化合物,再熟化该混合物,得到具有更佳研磨平坦度与更佳研磨速率的研磨垫用聚脲酯酯模制产物。此专利虽能改进公知技艺中仅使用一种微气球物所不能获致的研磨物的平坦度,然而如同美国专利第5,578,362号案与美国专利第6,022,268号案,此专利同样存在需要高于常温的加热温度,以及较长的熟化时间的不利于产业上应用的问题。In addition, U.S. Patent No. 5,578,362 discloses a polishing pad comprising a polymeric matrix impregnated with a plurality of hollow, flexible, organic polymeric microelements, the polishing pad having a working surface and a surface close to the working surface. subsurface. A portion of the polymeric microunits on the working surface is exposed to the working environment and contains the slurry, while another portion of the polymeric microunits buried in the subsurface is not exposed to the working environment. Since a portion of the polymeric microunits on the working surface is exposed to the working environment, the working surface is made relatively softer than the subsurface. As the pad wears and the polymeric microunits are exposed to the working environment, the subsurface becomes a relatively soft working surface, thereby self-regenerating a new working surface with consistent abrasive properties. However, the method of this patent needs to go through the steps of mixing the polymer matrix, blending the hollow elastic polymer microspheres, feeding the mixture into a mold, aging the mixture at a temperature relatively higher than normal temperature, cooling and surface treatment or modification to complete the polishing pad. The production is not only time-consuming but also difficult to maintain stable operating conditions, thus greatly reducing the industrial applicability of the method. U.S. Patent No. 6,022,268 discloses a polishing pad composed of a hydrophilic abrasive layer that itself does not have the ability to absorb or transport many slurry particles. Surface shape and large texture. This patent does not cut the polishing pad from larger materials, but uses solidification to make the polishing layer, and does not cut or chip the polishing surface, but at least a part of the large texture is applied to the polishing surface. From the embodiments of this patent, it can be seen that except for utilizing injection molding to have the final size and groove design of the required abrasive pad, the other formulations and molding conditions are the same as those of U.S. Patent No. 5,578,362. Therefore, although this patent Effectively improve the large defects (macro-defcts) and grinding performance caused by cutting on the grinding surface, but there are still disadvantages such as time-consuming production. U.S. Patent No. 6,239,188 discloses adding expanded microballoons (microballons) with two sizes of 10 to 50 μm and 80 to 100 μm in a specific range of weight ratios to polyurea ester prepolymers terminated with isocyanate and active hydrogen-containing compound, and aging the mixture to obtain a polyurethane molded product for polishing pads with better polishing flatness and better polishing rate. Although this patent can improve the flatness of the ground material that cannot be obtained by using only one kind of microballoon in the known art, but like the US Patent No. 5,578,362 and the US Patent No. 6,022,268, this patent also needs to be higher than normal temperature. Heating temperature and long curing time are unfavorable for industrial application.
因此,业界对于能提供具有稳定及优异研磨特性且能快速制造的研磨垫仍存有迫切需求性。Therefore, there is still an urgent need in the industry to provide a polishing pad with stable and excellent polishing properties that can be manufactured quickly.
发明内容Contents of the invention
本发明的目的提供在高压下,以反应射出模压成型方式获得高度平坦、微孔均匀的一体成型PU研磨垫的快速制造方法。The object of the present invention is to provide a rapid manufacturing method for obtaining a highly flat, uniform microporous integrated PU polishing pad by means of reaction injection molding under high pressure.
本发明的另一目的提供一种可用于研磨半导体晶圆、冶金样品、存储盘片表面、光学元件、镜片或晶圆光罩等高精密度物体的PU研磨垫。Another object of the present invention is to provide a PU grinding pad that can be used for grinding high-precision objects such as semiconductor wafers, metallurgical samples, storage disk surfaces, optical elements, lenses or wafer masks.
为达成上述目的,本发明在含活性氢官能基的树脂中加入特定范围体积比例的辅助气体量,并凭借无机或有机的化学或物理发泡剂与含-NCO官能基的树脂特定组成混合,在常温及高压下,将上述混合物以反应射出模压成形方式而制得平坦度优异且均匀微孔的一体成型PU研磨垫。In order to achieve the above-mentioned purpose, the present invention adds the auxiliary gas amount of specific range volume ratio in the resin containing active hydrogen functional group, and by virtue of inorganic or organic chemical or physical blowing agent mixed with the specific composition of the resin containing -NCO functional group, Under normal temperature and high pressure, the above mixture is formed by reaction injection molding to obtain an integrally formed PU polishing pad with excellent flatness and uniform micropores.
附图说明Description of drawings
图1为利用扫描式电子显微镜(SEM)放大100倍时,观察实施例2其气泡的连续性及均匀性。Fig. 1 shows the continuity and uniformity of bubbles in Example 2 when magnified by a scanning electron microscope (SEM) at 100 times.
图2为利用扫描式电子显微镜(SEM)放大100倍时,观察实施例3其气泡的连续性及均匀性。Figure 2 shows the continuity and uniformity of bubbles observed in Example 3 when magnified by a scanning electron microscope (SEM) at 100 times.
具体实施方式Detailed ways
本发明的制造方法,使用含活性氢官能基的树脂(选自含-OH官能基的聚醇类树脂、含-NH官能基的聚胺类树脂、-SH官能基的聚硫醇类树脂);加入添加剂(选自链延长剂、发泡剂、整泡剂、触媒)及辅助气体(选自空气、氮气、惰性气体);并加入含-NCO官能基的树脂(选自脂肪族异氰酸树脂、芳香族异氰酸树脂),将以上成份均匀混合。然后注入模具内,予以形成具微孔发泡的PU研磨垫。The manufacture method of the present invention uses the resin containing active hydrogen functional groups (selected from polyalcohol resins containing -OH functional groups, polyamine resins containing -NH functional groups, polythiol resins containing -SH functional groups) ; add additives (selected from chain extenders, blowing agents, foam regulators, catalysts) and auxiliary gases (selected from air, nitrogen, inert gases); and add resins containing -NCO functional groups (selected from aliphatic isocyanates Acid resin, aromatic isocyanate resin), mix the above ingredients evenly. Then pour it into the mold to form a microporous foamed PU polishing pad.
由上述方法在辅助气体协助下反应物可快速均匀地分布于模具内,而制得的PU研磨垫具有快速脱模的特性。并具有适当的强度、可挠性,发泡后有效研磨部位的孔洞大小分布均匀,大部分的孔洞经表面加工后,都属于开放式(open cell)孔洞,有利于研磨液的分散与传送。With the help of the auxiliary gas, the reactants can be quickly and evenly distributed in the mold by the above method, and the prepared PU polishing pad has the characteristics of rapid demoulding. And it has appropriate strength and flexibility. After foaming, the size of the holes in the effective grinding part is evenly distributed. After surface processing, most of the holes are open cells, which is beneficial to the dispersion and transmission of the grinding liquid.
本发明的制造方法较佳实施例中反应程序先在含-OH官能机的树脂,如聚醇类树脂中加入5至30重量%的链延长剂(较佳为10至20重量%)、0.1至10重量%的发泡剂、0.1至10重量%的整泡剂、0.1至1.0重量%的触媒等添加剂,前述的重量%是以含-OH官能基的树脂(如聚醇类树脂)与链延长剂的总重量为基础计算;及加入5至30体积%(较佳为10至15体积%)的辅助气体量予以混合,此辅助气体选自空气、氮气及惰性气体;并加入含-NCO官能机的树脂,如预聚合型的异氰酸酯树脂;并调整含-NCO官能机的树脂与含-OH官能机的树脂含量使其-NCO与-OH的比例(index)在0.6至1.5,较佳为0.95至1.1之间;然后在20至100℃的温度,较佳为20至60℃,并在2至20Mpa的压力下,较佳为5至20MPa,将上述步骤的混合物反应射出于模具内,并迅速发泡形成具有聚脲酯(polyurethane)结构的PU研磨垫。本发明所制造的研磨垫经重复性验证于3至5分钟内即可脱模成型。In the preferred embodiment of the production method of the present invention, the reaction procedure first adds 5 to 30% by weight of a chain extender (preferably 10 to 20% by weight), 0.1 10% by weight of blowing agent, 0.1 to 10% by weight of foam stabilizer, 0.1 to 1.0% by weight of additives such as catalysts, the aforementioned weight % is based on the resin (such as polyalcohol resin) containing -OH functional group and Calculate based on the total weight of the chain extender; and add 5 to 30% by volume (preferably 10 to 15% by volume) of auxiliary gas to be mixed, and this auxiliary gas is selected from air, nitrogen and inert gas; and add - The resin of NCO functional machine, such as the isocyanate resin of pre-polymerization type; And adjust the resin content that contains-NCO functional machine and the resin content that contains-OH functional machine so that the ratio (index) of -NCO and -OH is at 0.6 to 1.5, relatively Preferably between 0.95 and 1.1; then at a temperature of 20 to 100°C, preferably 20 to 60°C, and under a pressure of 2 to 20Mpa, preferably 5 to 20MPa, the reaction mixture of the above steps is injected out of the mold Inner, and rapidly foamed to form a PU polishing pad with a polyurethane structure. The grinding pad manufactured by the present invention can be demoulded within 3 to 5 minutes through repeated verification.
本发明方法中,可视产品的需要而调整聚醇树脂的结构及配方,进而获得不同硬度、密度、伸长率及强度的均匀连续开放孔洞的可挠性PU研磨垫。除此之外,凭借模具的设计及聚醇树脂配方的改变,本发明方法中亦可制得单片对称式的一体成型(即接近模具的表面层不发泡,而远离表面层,则渐次对称形成微细的连续孔洞)PU微孔发泡产品。上述单片对称式的一体成型PU微孔发泡产品可再由中间对称切割而得二片具有双层结构(亦即,较硬的表面层及位于表面层下方较软的缓冲层)的产品。本发明的发泡产品的表面层硬度较高,类似双层研磨垫的较硬层,它可维持研磨晶圆时,能有较好的平坦度(planarity),此外凭借发泡剂及辅助气体的帮助,该研磨垫的较软层,它可提供研磨时,拥有较好的均匀度(umiformity)。In the method of the present invention, the structure and formula of the polyalcohol resin can be adjusted according to the needs of the product, and then flexible PU polishing pads with uniform and continuous open pores of different hardness, density, elongation and strength can be obtained. In addition, by virtue of the design of the mold and the change of the polyalcohol resin formula, the method of the present invention can also produce monolithic symmetrical integral molding (that is, the surface layer close to the mold does not foam, and the surface layer away from the surface layer gradually Symmetrical formation of fine continuous holes) PU microcellular foaming products. The above-mentioned one-piece symmetrical PU microcellular foamed product can be cut symmetrically in the middle to obtain two pieces with a double-layer structure (that is, a harder surface layer and a softer buffer layer below the surface layer) . The surface layer of the foamed product of the present invention has a higher hardness, similar to the harder layer of a double-layer polishing pad, which can maintain a better planarity when grinding wafers. In addition, by virtue of foaming agent and auxiliary gas With the help of the softer layer of the grinding pad, it can provide better uniformity (umiformity) when grinding.
本发明方法中凭借高压、反应射出成型获得的单片式一体成型PU研磨垫,予以表面做微细的处理,然后制得单层式(PU发泡产品+感压胶带)。此类研磨垫表面有适当的刚性(硬度),可确保平坦化较好及较高的品质,此外研磨垫表面也能随着芯片表面图案的高低起伏而变形,因而获得较好的均匀度。In the method of the present invention, the single-piece integrated PU polishing pad obtained by high pressure and reaction injection molding is subjected to fine treatment on the surface, and then a single-layer type (PU foam product+pressure-sensitive adhesive tape) is obtained. The surface of this type of polishing pad has appropriate rigidity (hardness), which can ensure better planarization and higher quality. In addition, the surface of the polishing pad can also be deformed with the ups and downs of the surface pattern of the chip, thus obtaining better uniformity.
本发明适合的聚异氰酸预聚合物包括脂肪族、芳香族的异氰酸树脂单体及4,4’和2’,4不同混合比例、不同官能基的聚氰酸酯类树脂,上述异氰酸酯单体的具体实例,可例举甲苯二异氰酸酯(toluene diisocyanate)、三苯基甲烷-4,4’,4”-三异氰酸酯(triphenylmethane-4,4’,4”-triisocyanate)、苯-1,3,5-三异氰酸酯(benzene-1,3,5-trisocyanate)、六甲撑二异氰酸酯(hexamethylene diisocyanate)、苯撑二甲基二异氰酸酯(xylenediisocyanate)、氯苯撑二异氰酸酯(chlorophenylene diisocyanate)、二环己基甲烷4,4’二异氰酸酯(dicyclohexylmethane 4,4’diisocyanate)及甲撑双二苯基二异氰酸酯(methylenebisdiphenyl diisocyanate)。Suitable polyisocyanate prepolymers of the present invention include aliphatic and aromatic isocyanate resin monomers and 4, 4' and 2', 4 polycyanate resins with different mixing ratios and different functional groups, the above-mentioned Specific examples of isocyanate monomers include toluene diisocyanate (toluene diisocyanate), triphenylmethane-4, 4', 4"-triisocyanate (triphenylmethane-4, 4', 4"-triisocyanate), benzene-1 , 3,5-triisocyanate (benzene-1,3,5-trisocyanate), hexamethylene diisocyanate (hexamethylene diisocyanate), xylene dimethyl diisocyanate (xylene diisocyanate), chlorophenylene diisocyanate (chlorophenylene diisocyanate), di Cyclohexylmethane 4,4'diisocyanate (dicyclohexylmethane 4,4'diisocyanate) and methylenebisdiphenyl diisocyanate (methylenebisdiphenyl diisocyanate).
本发明适合的聚醇类树脂选自聚醚醇类、聚酯醇类、聚己内酯系列、聚胺类树脂、聚硫醇类树脂及其组合,其具体实例可例举聚氧化丙烯醚多元醇(PPG)、聚合物多元醇(聚苯乙烯及丙烯腈的共聚物)、聚烯烃多元醇(由聚丁二烯合成)、共聚醚多元醇、聚醚多元胺及聚四氢呋喃多元醇(PTMEG)。Suitable polyalcohol resins in the present invention are selected from polyether alcohols, polyester alcohols, polycaprolactone series, polyamine resins, polythiol resins and combinations thereof, and its specific examples can be exemplified by polyoxypropylene ether Polyol (PPG), polymer polyol (copolymer of polystyrene and acrylonitrile), polyolefin polyol (synthesized from polybutadiene), copolyether polyol, polyether polyamine and polytetrahydrofuran polyol ( PTMEG).
本发明适合的链延长剂具体实例包括1,4-丁二醇、乙二醇、丙二醇、甘油、4,4’-亚甲基双(3-氯-2,6-乙苯胺)、三乙醇胺、三异丙醇胺及芳香族、脂肪族的多元胺。上述链延长剂的添加量通常为5至30重量%,较佳为10至20重量%。Specific examples of chain extenders suitable for the present invention include 1,4-butanediol, ethylene glycol, propylene glycol, glycerol, 4,4'-methylenebis(3-chloro-2,6-ethylaniline), triethanolamine , Triisopropanolamine and aromatic and aliphatic polyamines. The added amount of the above-mentioned chain extender is usually 5 to 30% by weight, preferably 10 to 20% by weight.
本发明适合的发泡剂包括无机发泡剂及有机发泡剂,无机发泡剂的具体实例为水及二氧化碳;有机发泡剂的具体实例可例举丙烷、丁烷、戊烷、丙酮、二氯甲烷、氢化氟氯碳化合物(例如HCFC-22、HCFC-141b等)或氢化氟碳化合物(例如HFC-134a、HFC-365mfc、HFC-227ea及HFC-245fa)等。Suitable blowing agents of the present invention include inorganic blowing agents and organic blowing agents. The specific examples of inorganic blowing agents are water and carbon dioxide; the specific examples of organic blowing agents can be exemplified by propane, butane, pentane, acetone, Dichloromethane, hydrogenated chlorofluorocarbons (such as HCFC-22, HCFC-141b, etc.) or hydrogenated fluorocarbons (such as HFC-134a, HFC-365mfc, HFC-227ea, and HFC-245fa), etc.
本发明适合的整泡剂包括硅氧烷化合物、环氧乙烷化的聚醇类或其混合物,其具体实例可例举环氧乙烷化聚多元醇、硅氧烷化的环氧乙烷、丙烷的共接枝化合物。Foam stabilizers suitable for the present invention include silicone compounds, oxiraneated polyalcohols or mixtures thereof, specific examples of which may be exemplified by oxiraneated polypolyols, siloxanated oxirane , Co-grafted compounds of propane.
本发明将以下列实施例进一步加以说明,但不应以此限制本发明的范围。The present invention will be further illustrated with the following examples, but the scope of the present invention should not be limited thereto.
实施例1
实施例1的原料使用温度为32℃,空气的混入量为8体积%,模具温度为50℃,反应射出成型的机台使用压力为15MPa。凭借上述的配方及条件,所测得的物性如下:
实施例2
实施例2的原料使用温度为55℃,空气的混入量为12体积%,模具温度为60℃,反应射出成型的机台使用压力15MPa。利用扫描式电子显微镜(SEM)的观察,可看出其气泡的连续性及均匀度良好,如图1所示。凭借上述的配方及条件,所测得的物性如下:
实施例3
实施例3的原料使用温度为50℃,模具温度为60℃,反应射出成型的机台使用压力也是15MPa。其气泡的连续性及均匀度,如图2所示。凭借上述的配方及条件,所测得的物性如下:The use temperature of the raw materials in Example 3 is 50° C., the mold temperature is 60° C., and the use pressure of the reaction injection molding machine is also 15 MPa. The continuity and uniformity of the bubbles are shown in Figure 2. With the above formula and conditions, the measured physical properties are as follows:
上述的实施例中,其密度的调整主要是凭借不同的链延长剂、发泡剂量及射入金属模具的注入量,来获得不同的密度及硬度值并更进一步地去改变和调整PU研磨垫的各项物理特性及参数。In the above-mentioned embodiments, the adjustment of the density is mainly based on different chain extenders, foaming doses and injection volumes injected into the metal mold to obtain different densities and hardness values and to further change and adjust the PU polishing pad various physical properties and parameters.
虽然本发明已以较佳实施例公开如上,然其并非用以限定本发明,任何熟悉此技术者,在不脱离本发明的精神和范围内,当可作些许之更动与润饰,因此本发明的保护范围当视权利要求书所界定者为准。Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Any person familiar with the art can make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, this The scope of protection of the invention should be defined by the claims.
Claims (28)
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| CNB021538867A CN1314517C (en) | 2002-12-04 | 2002-12-04 | Manufacturing method of integrally formed PU polishing pad |
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| CNB021538867A CN1314517C (en) | 2002-12-04 | 2002-12-04 | Manufacturing method of integrally formed PU polishing pad |
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| CN1314517C true CN1314517C (en) | 2007-05-09 |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US7396497B2 (en) * | 2004-09-30 | 2008-07-08 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Method of forming a polishing pad having reduced striations |
| US7947098B2 (en) * | 2009-04-27 | 2011-05-24 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Method for manufacturing chemical mechanical polishing pad polishing layers having reduced gas inclusion defects |
| CN103878707B (en) * | 2014-03-31 | 2016-04-13 | 湖北鼎龙化学股份有限公司 | Polishing pad of chemically mechanical polishing and preparation method thereof |
| US20200203146A1 (en) * | 2018-12-18 | 2020-06-25 | Xia Tai Xin Semiconductor (Qing Dao) Ltd. | Module and system for trimming wafer edge |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001225259A (en) * | 2000-02-10 | 2001-08-21 | Toray Ind Inc | Chemical mechanical polishing method |
| WO2002046283A1 (en) * | 2000-12-08 | 2002-06-13 | Kuraray. Co., Ltd. | Thermoplastic polyurethane foam, process for production thereof and polishing pads made of the foam |
| JP2002261054A (en) * | 2001-03-06 | 2002-09-13 | Dow Corning Toray Silicone Co Ltd | Grinding pad and rubber composition for forming the same |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001225259A (en) * | 2000-02-10 | 2001-08-21 | Toray Ind Inc | Chemical mechanical polishing method |
| WO2002046283A1 (en) * | 2000-12-08 | 2002-06-13 | Kuraray. Co., Ltd. | Thermoplastic polyurethane foam, process for production thereof and polishing pads made of the foam |
| JP2002261054A (en) * | 2001-03-06 | 2002-09-13 | Dow Corning Toray Silicone Co Ltd | Grinding pad and rubber composition for forming the same |
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