CN1542937A - Method for testing RFID chip using digital signal and radiofrequency signal transmission/identification circuit - Google Patents
Method for testing RFID chip using digital signal and radiofrequency signal transmission/identification circuit Download PDFInfo
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- CN1542937A CN1542937A CNA2003101085032A CN200310108503A CN1542937A CN 1542937 A CN1542937 A CN 1542937A CN A2003101085032 A CNA2003101085032 A CN A2003101085032A CN 200310108503 A CN200310108503 A CN 200310108503A CN 1542937 A CN1542937 A CN 1542937A
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Abstract
This invention relates to a method for testing RFID chips with digital signal and RF signal emit/identification circuit including that a digital signal generator of a test system generates a digital signal to generate a RF signal in conformity with the ISO standard by the RF signal emit/identification circuit, when the chip receives the said signal, it generates a return signal to be captured by the identification part of the RF signal emit/identification circuit and converted into a digital signal to be sent to the test system for judgment and comparison finally, thus reducing test cost and saving time.
Description
Technical field
The invention belongs to the ic test technique field, be specifically related to a kind of method with digital signal and emission of radio frequency signals/identification circuit testing RFID chip.
Background technology
RFID is the abbreviation of radio-frequency recognition system, compare with the recognition system of other type, have recognition speed fast, good confidentiality, be not vulnerable to outside contamination, advantages such as packing density is big, and readability is good are widely used in public transport, bank, industries such as medical treatment, very universal on America and Europe and other places, typical example is exactly a non-contact IC card.In China, the production of non-contact IC card chip and use also are in the starting stage, have only a few economically developed city at present, and in public transport, industries such as medical insurance have been carried out pilot, have obtained good effect.Along with deepening continuously of country's " Golden Card Program ", and the Chinese residents identity card use non-contact IC card that is about to release, will promote non-contact IC greatly and be stuck in popularizing of China.
At present, influence the widely used factor of non-contact IC card and mainly contain two: the one, the production technology of chip, the 2nd, cost.For the reduction of cost, mainly contain the approach of two aspects, the one, improve production technology significantly; Second is exactly to reduce expending of others, and wherein important is exactly the chip testing that is related to the final finished quality.For the chip of non-contact IC card, because the existence of radio circuit is arranged, it just can not be the totally digital circuit test.People can use the tester of mixed signal to test, but still are the testing time from hardware loss itself that test no matter, all are uneconomic.
Summary of the invention
The objective of the invention is to propose a kind of method of the RFID chip being carried out low cost test.
The method that the RFID chip is tested that the present invention proposes is a kind of digital signal part of detecting of integrated circuit test system and method that emission of radio frequency signals/identification circuit combines utilized, and the RFID chip that meets the design of ISO international standard is tested.
Concrete steps are as follows: the digital signal part of detecting by integrated circuit test system produces a digital signal, produce the radiofrequency signal that (emission) meets the ISO international standard by radio frequency generation/identification circuit, after RFID chip to be tested is received this signal, under normal circumstances can produce an inverse signal, this moment, the identification division (being receiving unit) of emission of radio frequency signals/identification circuit was promptly caught this signal, and convert thereof into and be digital signal corresponding (i.e. decoding), compare by test macro and the expected value of preserving in advance at last, whether the communication function of differentiating chip realizes.
Because test process and signal processing nearly all are to be undertaken and too much other test resource of engaged test instrument by emission of radio frequency signals/identification circuit, thereby have saved greatly testing cost and testing time.
The related circuit of method of testing of the present invention comprises two parts, and promptly the digital signal part of detecting 1 and emission of radio frequency signals/identification circuit 2 of integrated circuit test system are seen shown in Figure 1.The digital signal part of detecting 1 of integrated circuit test system is corrected by digital signal driver 9, precision and diagnostic loop 10, digital signal comparator 11 are formed; Emission of radio frequency signals/identification circuit 2 is made up of reflector and receiver; Wherein, reflector is connected and composed by filter 4, amplifier 5, watch-dog 6 circuit successively, and receiver is connected and composed by detector 7 and demodulator 8 circuit, and the amplifier 5 in the reflector is connected with detector 7 circuit of receiver; Filter 4, watch-dog 6, demodulator 8 are corrected with digital signal driver 9, the precision of integrated circuit test system digital signal part of detecting respectively and are connected with diagnostic loop 10, digital signal comparator 11 circuit, and chip 3 to be measured is connected in the amplifier 5 of reflector.
Utilize foregoing circuit, the detailed process of the RFID chip of test is as follows:
The digital signal driver 9 of the digital signal part of detecting 1 by integrated circuit test system produces digital signals (as shown in the figure), this digital signal is converted to the sine wave signal of same frequency and amplitude by the filter action of filter 4; Amplify the sine wave signal (as shown in the figure) that becomes required amplitude by amplifier 5 again, give core 3 to be measured, meanwhile the front end of amplifier 5 (not amplifying signal) is connected to watch-dog 6, its effect is precision rectification and the diagnostic loop 10 that the sine wave signal of not amplification feeds back to integrated circuit test system digital signal part of detecting 1, adjusts the digital signal that digital signal driver 9 produces in real time; Under the normal condition, the inverse signal of chip is delivered to detector 7 by the signal transmission of amplifier 5.Inverse signal has an initial high or low level to represent its start frame position usually, detector 7 detects this level signal, and further give demodulator 8, its effect is that the inverse signal with chip becomes digital signal (decoding) by analog signal conversion, last demodulator 8 returns the digital code that demodulates the digital signal comparator 11 of digital signal part of detecting, more identical with the standard code of keeping in advance, whether correct with this inverse signal of determining chip.
Each module in the circuit of the present invention comprises filter 4, amplifier 5, watch-dog 6, detector 7, demodulator 8, digital signal driver 9, precision rectification and diagnostic loop 10, digital signal comparator 11 etc., is conventional circuit module.
Description of drawings
Fig. 1 is a test circuit structure block diagram of the present invention.
Number in the figure: 1 is the digital signal part of detecting of integrated circuit test system, 2 is emission of radio frequency signals/identification circuit, 3 is chip to be measured, and 4 is filter, and 5 is amplifier, 6 is watch-dog, 7 is detector, and 8 is demodulator, and 9 is the digital signal driver, 10 are precision rectification and diagnostic loop, and 11 is the digital signal comparator.
Embodiment
Emission of radio frequency signals/identification circuit (Fig. 1) module is carried on testing with circuit board, use the digital channel and the emission of radio frequency signals/identification circuit of integrated circuit test system, produce a sine wave signal that meets the ISO14443 standard, for example:
Voltage peak-to-peak value 15V, the ASK index of modulation 10%, carrier frequency 13.56MHz, the serial data of being be ALOHA (0x05,0x00,0x00+CRC).At this moment, watch-dog partly begin to detect in real time after this decay the stability of sine wave signal.
Wait for that test chip has had response, explorer portion is started working, such as at the top sine wave signal that meets the ISO14443 standard, inverse signal is exactly voltage peak-to-peak value 15V, the BPSK load-modulate, subcarrier frequency is the sine wave signal of 847KHz, and the serial data of being with is 0x50XXXXXXXXXXXXXXXXXXXXXX+CRC
By the demodulator decoding, analog signal is changed into digital signal do further test analysis for test macro.
In addition, the circuit board that also emission of radio frequency signals/identification circuit can be integrated into test macro inside gets on, and makes it to become an option of integrated circuit test system.Testing procedure is the same.
Claims (5)
1, a kind of method that the RFID chip is tested is characterized in that the numerical portion and the emission of radio frequency signals/identification circuit of integrated circuit test system are combined, and the RFID chip that meets the design of ISO international standard is tested.
2, method of testing according to claim 1, it is characterized in that producing a digital signal by the digital signal generator of integrated circuit test system, produce the radiofrequency signal that meets the ISO international standard by radio frequency generation/identification circuit, after RFID chip to be tested is received this signal, under normal circumstances can produce an inverse signal, this moment, the identification division of emission of radio frequency signals/identification circuit was promptly caught this signal, and convert thereof into and be digital signal corresponding, compare by test macro and the expected value of preserving in advance at last, whether the communication function of differentiating chip realizes.
3, method of testing according to claim 1, it is characterized in that corresponding test circuit comprises digital signal generator (1) and the radiofrequency signal generation/identification circuit (2) in the integrated circuit test system, digital signal generator (1) is by data transmitter (9), form from rectifier (10), recipient (11); Emission of radio frequency signals/identification circuit (2) is made up of reflector and receiver; Wherein, reflector is connected and composed by filter (4), amplifier (5), watch-dog (6) circuit successively, and receiver is connected and composed by detector (7) and demodulator (8) circuit, and the amplifier in the reflector (5) is connected with the detector circuit of receiver; Filter (4), watch-dog (6), demodulator (8) are respectively with the data transmitter (9) of digital signal generator, be connected from rectifier (10), recipient (11) circuit, and chip to be measured (3) is connected in the amplifier (5) of reflector.
4, method of testing according to claim 1 is characterized in that the emission of radio frequency signals identification circuit directly carries on test board.
5, method of testing according to claim 1 is characterized in that the emission of radio frequency signals identification circuit is integrated on the circuit board of test macro inside, becomes a test option of integrated circuit test system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2003101085032A CN1542937A (en) | 2003-11-07 | 2003-11-07 | Method for testing RFID chip using digital signal and radiofrequency signal transmission/identification circuit |
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| Application Number | Priority Date | Filing Date | Title |
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| CNA2003101085032A CN1542937A (en) | 2003-11-07 | 2003-11-07 | Method for testing RFID chip using digital signal and radiofrequency signal transmission/identification circuit |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100392420C (en) * | 2005-03-17 | 2008-06-04 | 上海华虹集成电路有限责任公司 | Multi-channel tester for contactless application chips |
| CN100392411C (en) * | 2005-10-11 | 2008-06-04 | 上海华虹集成电路有限责任公司 | Non-contact smart card noise detection method and its detection circuit |
| CN101236595B (en) * | 2007-01-29 | 2010-06-02 | 国际商业机器公司 | Radio frequency identification reader and its test method |
| CN101103361B (en) * | 2004-12-22 | 2011-05-04 | 艾利丹尼森公司 | Method and system for testing RFID devices |
| CN101446621B (en) * | 2007-11-28 | 2012-08-22 | 晨星软件研发(深圳)有限公司 | Loop-back testing method and apparatus for ic |
| US8461967B2 (en) | 2006-01-30 | 2013-06-11 | Voyantic Oy | Device and method for analysing radio-frequency systems |
| CN101672878B (en) * | 2008-09-12 | 2013-07-03 | 晨星软件研发(深圳)有限公司 | Chip testing device and chip testing method |
| US8552756B2 (en) | 2008-08-29 | 2013-10-08 | Mstar Semiconductor, Inc. | Chip testing apparatus and testing method thereof |
| CN103869236A (en) * | 2014-03-31 | 2014-06-18 | 广州华欣电子科技有限公司 | Method and jig for testing infrared touch screen PCBA |
| CN105353297A (en) * | 2015-12-02 | 2016-02-24 | 天津七六四通信导航技术有限公司 | Universal anti-interference digital processing board test platform and test method |
-
2003
- 2003-11-07 CN CNA2003101085032A patent/CN1542937A/en active Pending
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101103361B (en) * | 2004-12-22 | 2011-05-04 | 艾利丹尼森公司 | Method and system for testing RFID devices |
| CN100392420C (en) * | 2005-03-17 | 2008-06-04 | 上海华虹集成电路有限责任公司 | Multi-channel tester for contactless application chips |
| CN100392411C (en) * | 2005-10-11 | 2008-06-04 | 上海华虹集成电路有限责任公司 | Non-contact smart card noise detection method and its detection circuit |
| US8461967B2 (en) | 2006-01-30 | 2013-06-11 | Voyantic Oy | Device and method for analysing radio-frequency systems |
| CN101236595B (en) * | 2007-01-29 | 2010-06-02 | 国际商业机器公司 | Radio frequency identification reader and its test method |
| CN101446621B (en) * | 2007-11-28 | 2012-08-22 | 晨星软件研发(深圳)有限公司 | Loop-back testing method and apparatus for ic |
| US8552756B2 (en) | 2008-08-29 | 2013-10-08 | Mstar Semiconductor, Inc. | Chip testing apparatus and testing method thereof |
| CN101672878B (en) * | 2008-09-12 | 2013-07-03 | 晨星软件研发(深圳)有限公司 | Chip testing device and chip testing method |
| CN103869236A (en) * | 2014-03-31 | 2014-06-18 | 广州华欣电子科技有限公司 | Method and jig for testing infrared touch screen PCBA |
| CN103869236B (en) * | 2014-03-31 | 2016-08-17 | 广州华欣电子科技有限公司 | The method of testing of infrared touch panel PCBA and measurement jig |
| CN105353297A (en) * | 2015-12-02 | 2016-02-24 | 天津七六四通信导航技术有限公司 | Universal anti-interference digital processing board test platform and test method |
| CN105353297B (en) * | 2015-12-02 | 2018-03-16 | 天津七六四通信导航技术有限公司 | Universal anti-interference digital processing board test platform and method of testing |
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