CN205015387U - Anti-interference low-voltage detection chip - Google Patents
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Abstract
Description
技术领域technical field
本实用新型涉及集成电路技术领域,尤其是一种抗干扰低电压检测芯片。The utility model relates to the technical field of integrated circuits, in particular to an anti-interference low-voltage detection chip.
背景技术Background technique
众所周知,电压检测电路用于检测供给电压,当该电压变化到某一设定值时,电压检测电路输出控制信号;当我们设定这一标准电压值时,希望电路能准确检测出并输出相应的控制信号,现有的电压检测电路很容易做到这一点。As we all know, the voltage detection circuit is used to detect the supply voltage. When the voltage changes to a certain set value, the voltage detection circuit outputs a control signal; when we set this standard voltage value, we hope that the circuit can accurately detect and output the corresponding The control signal, the existing voltage detection circuit can easily do this.
图1示出了现有的一种电压检测电路的电原理图,在该电路中,VIN端的输入电压经过电阻R1、电阻R2和电阻R3的分压得到电压V1,与比较器的正极相接,比较器的负极与基准电压电路的VREF端脚相接,反相器的输入接比较器的输出,反相器的输出接输出电路中MOS管M2的栅极,MOS管M2的源极和衬底接地、漏极为输出信号,与此同时,MOS管M2与MOS管M1的栅极相连,MOS管M1的源极和衬底接地、漏极接在电阻R2与电阻R3之间。当设定VIN端的电压使得V1低于VREF时(此时的VIN为开启电压),VOUT为高阻态;当设定VIN端的电压使得V1高于VREF时,VOUT为低电平,然而,一旦VOUT为低电平(即:反相器的输出为高电平),再次设定VIN端的电压使得V1低于VREF时,由于MOS管M1的开启电压比第一种情况时电压变高了,这一新的电压值叫恢复电压;在此过程中,基准电压电路输出的VREF不会随VIN变化而变化,从而根据VOUT的输出变化实现电压检测功能。Figure 1 shows the electrical schematic diagram of an existing voltage detection circuit. In this circuit, the input voltage at the VIN terminal is divided by the resistors R1, R2 and R3 to obtain a voltage V1, which is connected to the positive pole of the comparator. , the negative pole of the comparator is connected to the VREF terminal pin of the reference voltage circuit, the input of the inverter is connected to the output of the comparator, the output of the inverter is connected to the gate of the MOS transistor M2 in the output circuit, the source of the MOS transistor M2 and The substrate is grounded, and the drain is the output signal. At the same time, the MOS transistor M2 is connected to the gate of the MOS transistor M1. The source and substrate of the MOS transistor M1 are grounded, and the drain is connected between the resistors R2 and R3. When the voltage at the VIN terminal is set so that V1 is lower than VREF (VIN is the turn-on voltage at this time), VOUT is in a high-impedance state; when the voltage at the VIN terminal is set so that V1 is higher than VREF, VOUT is at a low level. However, once When VOUT is low level (that is, the output of the inverter is high level), and the voltage at the VIN terminal is set again so that V1 is lower than VREF, since the turn-on voltage of the MOS transistor M1 is higher than that in the first case, This new voltage value is called the recovery voltage; during this process, the VREF output by the reference voltage circuit will not change with the change of VIN, so that the voltage detection function is realized according to the output change of VOUT.
然而,诸如图1所示的电压检测电路虽然能在供给电压变化到设定值时产生输出控制信号,也能设定恢复电压值,但是在实际应用中却普遍存在如下缺陷:However, although the voltage detection circuit shown in Figure 1 can generate an output control signal when the supply voltage changes to a set value, and can also set the recovery voltage value, it generally has the following defects in practical applications:
1、抗干扰性弱,由于外界的干扰信号的存在,使得检测结果不够准确;1. The anti-interference is weak. Due to the existence of external interference signals, the detection results are not accurate enough;
2、恢复电压与原来开启电压的比值与电阻R1、电阻R2和电阻R3都有关系,变动起来不方便也不够精确;2. The ratio of the recovery voltage to the original turn-on voltage is related to the resistance R1, resistance R2 and resistance R3, which is inconvenient and not accurate enough to change;
3、由于是对输入电压瞬时值的检测,从而导致输出信号极不稳定。3. Due to the detection of the instantaneous value of the input voltage, the output signal is extremely unstable.
因此,如何改进现有的电压检测电路,是相关行业亟待解决的技术问题。Therefore, how to improve the existing voltage detection circuit is a technical problem to be solved urgently in related industries.
实用新型内容Utility model content
针对上述现有技术存在的不足,本实用新型的目的在于一种电路结构简单、抗干扰性强、检测精度高、信号输出稳定的抗干扰低电压检测芯片。In view of the deficiencies in the prior art above, the utility model aims at an anti-interference low-voltage detection chip with simple circuit structure, strong anti-interference, high detection accuracy and stable signal output.
为了实现上述目的,本实用新型采用如下技术方案:In order to achieve the above object, the utility model adopts the following technical solutions:
一种抗干扰低电压检测芯片,它包括:An anti-interference low-voltage detection chip, which includes:
用于通过电容的充放电实现电压输出的电容充放电电路,所述电容充放电电路上设置有电源输入端;A capacitor charging and discharging circuit for realizing voltage output through charging and discharging of a capacitor, the capacitor charging and discharging circuit is provided with a power input terminal;
用于控制电容充放电电路启闭的逻辑组合电路,所述逻辑组合电路的输出端连接于电容充放电电路的输入端;A logic combination circuit for controlling the opening and closing of the capacitor charging and discharging circuit, the output terminal of the logic combination circuit is connected to the input terminal of the capacitor charging and discharging circuit;
用于向逻辑组合电路提供基准电压的基准电压产生电路,所述基准电压产生电路的输出端连接于逻辑组合电路的输入端;A reference voltage generation circuit for providing a reference voltage to the logic combination circuit, the output end of the reference voltage generation circuit is connected to the input end of the logic combination circuit;
用于设定输入至逻辑组合电路中的电压值的电阻分压电路,所述电阻分压电路连接于逻辑组合电路的输入端,所述电阻分压电路上设置有电压设定端;A resistor divider circuit for setting the voltage value input to the logic combination circuit, the resistor divider circuit is connected to the input terminal of the logic combination circuit, and the resistor divider circuit is provided with a voltage setting terminal;
用于对电容充放电电路输出的电压进行整形处理后实现检测信号输出的施密特整形电路,所述施密特整形电路连接于电容充放电电路的输出端,所述施密特整形电路上设置有检测信号输出端;A Schmidt shaping circuit for outputting the detection signal after shaping the voltage output by the capacitor charging and discharging circuit, the Schmidt shaping circuit is connected to the output end of the capacitor charging and discharging circuit, and the Schmidt shaping circuit A detection signal output terminal is provided;
和and
用于根据施密特整形电路输出的电压值来设定电阻分压电路的比值的恢复电压设定电路,所述恢复电压设定电路连接于施密特整形电路的输出端与电阻分压电路之间。A recovery voltage setting circuit for setting the ratio of the resistance voltage divider circuit according to the voltage value output by the Schmidt shaping circuit, and the recovery voltage setting circuit is connected to the output terminal of the Schmidt shaping circuit and the resistance voltage divider circuit between.
优选地,所述电容充放电电路包括第三MOS管、第四MOS管、充放电电容和第五电阻,所述第三MOS管的栅极和第四MOS管的栅极同时连接逻辑组合电路的输出端,所述第三MOS管的漏极和第四MOS管的漏极分别连接于第五电阻的两端,所述第三MOS管的源极和衬底同时连接电源输入端,所述第四MOS管的源极和衬底同时接地,所述充放电电容的一端接地、另一端连接于施密特整形电路的输入端。Preferably, the capacitor charging and discharging circuit includes a third MOS transistor, a fourth MOS transistor, a charging and discharging capacitor, and a fifth resistor, and the gate of the third MOS transistor and the gate of the fourth MOS transistor are simultaneously connected to a logic combination circuit The output terminal of the third MOS transistor and the drain electrode of the fourth MOS transistor are respectively connected to both ends of the fifth resistor, and the source and substrate of the third MOS transistor are connected to the power supply input terminal at the same time, so The source and the substrate of the fourth MOS transistor are grounded at the same time, one end of the charging and discharging capacitor is grounded, and the other end is connected to the input end of the Schmidt shaping circuit.
优选地,所述恢复电压设定电路包括第一MOS管和第二MOS管,所述第一MOS管的栅极和第二MOS管的栅极同时连接施密特整形电路的输出端,所述第一MOS管的源极和衬底同时连接电压设定端,所述第二MOS管的源极和衬底同时接地,所述第一MOS管的漏极和第二MOS管的漏极分别连接电阻分压电路。Preferably, the recovery voltage setting circuit includes a first MOS transistor and a second MOS transistor, the gate of the first MOS transistor and the gate of the second MOS transistor are simultaneously connected to the output terminal of the Schmidt shaping circuit, so The source and the substrate of the first MOS transistor are connected to the voltage setting terminal at the same time, the source and the substrate of the second MOS transistor are connected to the ground at the same time, the drain of the first MOS transistor and the drain of the second MOS transistor Connect the resistor divider circuit respectively.
优选地,所述施密特整形电路包括顺序连接的施密特整形单元和第二反相器,所述施密特整形单元的输入端连接于电容充放电电路的输出端,所述第二反相器的输出端作为检测信号输出端,所述第一MOS管的栅极和第二MOS管的栅极同时连接于第二反相器的输入端与施密特整形单元的输出端之间。Preferably, the Schmidt shaping circuit includes a sequentially connected Schmidt shaping unit and a second inverter, the input end of the Schmidt shaping unit is connected to the output end of the capacitor charging and discharging circuit, and the second inverter The output terminal of the inverter is used as the detection signal output terminal, and the gate of the first MOS transistor and the gate of the second MOS transistor are simultaneously connected between the input terminal of the second inverter and the output terminal of the Schmidt shaping unit between.
优选地,所述电阻分压电路包括顺序串联于电压设定端与接地端之间的第一电阻、第二电阻、第三电阻和第四电阻;Preferably, the resistor divider circuit includes a first resistor, a second resistor, a third resistor and a fourth resistor serially connected in series between the voltage setting terminal and the ground terminal;
所述逻辑组合电路的输入端连接于第二电阻和第三电阻之间,所述第一MOS管的漏极连接于第一电阻和第二电阻之间,所述第二MOS管的漏极连接于第三电阻和第四电阻之间。The input terminal of the logic combination circuit is connected between the second resistor and the third resistor, the drain of the first MOS transistor is connected between the first resistor and the second resistor, and the drain of the second MOS transistor Connected between the third resistor and the fourth resistor.
优选地,所述第一电阻的阻值等于第四电阻的阻值。Preferably, the resistance value of the first resistor is equal to the resistance value of the fourth resistor.
优选地,所述逻辑组合电路包括比较器和第一反相器,所述比较器的正极连接于第一电阻和第二电阻之间、负极连接基准电压产生电路的输出端、输出端连接第一反相器的输入端,所述第一反相器的输出端连接电容充放电电路的输入端。Preferably, the logic combination circuit includes a comparator and a first inverter, the anode of the comparator is connected between the first resistor and the second resistor, the cathode is connected to the output terminal of the reference voltage generating circuit, and the output terminal is connected to the second resistor. An input terminal of an inverter, the output terminal of the first inverter is connected to the input terminal of the capacitor charging and discharging circuit.
由于采用了上述方案,本实用新型通过设置的施密特整形电路可使得整个芯片输出的波形更为稳定;利用电容充放电电路虽然在整个芯片运行时会有一定的延时,但增强了芯片的抗干扰性,使其受到外界的干扰很小,从而使得电压检测的结果更为准确;通过设置的恢复电压设定电路可极大地削弱的恢复电压及启动电压与电阻分压电路之间的关系,增强了输入电压的变动性,提高检测精度;其电路结构简单、抗干扰性强、检测精度高、检测结果准确其易于调整,具有很强的实用价值和市场推广价值。Due to the adoption of the above scheme, the utility model can make the waveform output by the whole chip more stable by setting the Schmidt shaping circuit; although there will be a certain delay when the whole chip is running by using the capacitor charging and discharging circuit, it strengthens the chip. Excellent anti-interference, so that it is less disturbed by the outside world, so that the result of voltage detection is more accurate; through the recovery voltage setting circuit, it can greatly weaken the recovery voltage and the relationship between the starting voltage and the resistance divider circuit. relationship, which enhances the variability of the input voltage and improves the detection accuracy; the circuit structure is simple, the anti-interference is strong, the detection accuracy is high, the detection result is accurate, and it is easy to adjust, which has strong practical value and market promotion value.
附图说明Description of drawings
图1为现有技术中的一种电压检测电路的原理图;Fig. 1 is a schematic diagram of a voltage detection circuit in the prior art;
图2为本实用新型实施例的原理图;Fig. 2 is the schematic diagram of the utility model embodiment;
图3为本实用新型实施例的电路结构图。Fig. 3 is a circuit structure diagram of an embodiment of the utility model.
具体实施方式detailed description
以下结合附图对本实用新型的实施例进行详细说明,但是本实用新型可以有权利要求限定和覆盖的多种不同方式实施。The embodiments of the utility model will be described in detail below in conjunction with the accompanying drawings, but the utility model can be implemented in many different ways defined and covered by the claims.
如图2和图3所示,本实用新型实施例提供的一种抗干扰低电压检测芯片,它包括:As shown in Figure 2 and Figure 3, an anti-interference low-voltage detection chip provided by the embodiment of the present invention includes:
电容充放电电路1,主要用于通过电容的充放电来实现电压的输出,在电容充放电电路1上设置有电源输入端VDD;Capacitor charging and discharging circuit 1 is mainly used to realize voltage output through charging and discharging of capacitor, and a power input terminal VDD is provided on capacitor charging and discharging circuit 1;
逻辑组合电路2,主要用于控制电容充放电电路1启闭状态,从而控制电容充放电电路1的电容的充放电状态,其输出端连接于电容充放电电路1的输入端;The logic combination circuit 2 is mainly used to control the opening and closing state of the capacitor charging and discharging circuit 1, thereby controlling the charging and discharging state of the capacitor of the capacitor charging and discharging circuit 1, and its output terminal is connected to the input terminal of the capacitor charging and discharging circuit 1;
基准电压产生电路3,主要用于向逻辑组合电路2提供基准电压Vref,其输出端连接于逻辑组合电路2的输入端;The reference voltage generating circuit 3 is mainly used to provide the reference voltage Vref to the logic combination circuit 2, and its output terminal is connected to the input terminal of the logic combination circuit 2;
电阻分压电路4,主要用于设定输入至逻辑组合电路2中的电压值,从而使逻辑组合电路2通过比较基准电压Vref与设定输入的电压来控制电容充放电电路1的电容的充放电状态,电阻分压电路4连接于逻辑组合电路2的输入端,同时在电阻分压电路4上设置有电压设定端Vin;The resistor divider circuit 4 is mainly used to set the voltage value input to the logic combination circuit 2, so that the logic combination circuit 2 controls the charging of the capacitor of the capacitor charging and discharging circuit 1 by comparing the reference voltage Vref with the set input voltage. In the discharge state, the resistance voltage divider circuit 4 is connected to the input terminal of the logic combination circuit 2, and a voltage setting terminal Vin is provided on the resistance voltage divider circuit 4;
施密特整形电路5,主要用于对电容充放电电路1输出的电压进行整形处理后实现检测信号的输出,其连接于电容充放电电路1的输出端,同时在施密特整形电路5上设置有检测信号输出端Vout;The Schmidt shaping circuit 5 is mainly used for shaping the output voltage of the capacitor charging and discharging circuit 1 to realize the output of the detection signal. A detection signal output terminal Vout is provided;
和and
恢复电压设定电路6,主要用于根据施密特整形电路5输出的电压值来设定电阻分压电路4的比值,其连接于施密特整形电路5的输出端与电阻分压电路4之间,在运行时,通过施密特整形电路5输出的检测信号的电压值来控制恢复电压设定电路6的开关状态,从而通过恢复电压设定电路6来设定启动电压和恢复电压。The recovery voltage setting circuit 6 is mainly used to set the ratio of the resistance voltage divider circuit 4 according to the voltage value output by the Schmidt shaping circuit 5, which is connected to the output terminal of the Schmidt shaping circuit 5 and the resistance voltage divider circuit 4 During operation, the switch state of the recovery voltage setting circuit 6 is controlled by the voltage value of the detection signal output by the Schmidt shaping circuit 5 , so that the startup voltage and the recovery voltage are set by the recovery voltage setting circuit 6 .
如此,通过设置的施密特整形电路5可使得整个芯片输出的波形更为稳定;利用电容充放电电路1虽然在整个芯片运行时会有一定的延时,但增强了芯片的抗干扰性,使其受到外界的干扰很小,从而使得电压检测的结果更为准确;通过设置的恢复电压设定电路6可极大地削弱的恢复电压及启动电压与电阻分压电路4之间的关系,增强了输入电压的变动性。In this way, the Schmidt shaping circuit 5 provided can make the waveform output by the whole chip more stable; although the capacitor charging and discharging circuit 1 has a certain delay when the whole chip is running, it enhances the anti-interference performance of the chip, It is less disturbed by the outside world, so that the result of voltage detection is more accurate; the relationship between the recovery voltage and the starting voltage and the resistance voltage divider circuit 4 can be greatly weakened by setting the recovery voltage setting circuit 6, and the the variability of the input voltage.
为优化整个芯片的电路结构,保证整个芯片的性能,本实施例的电容充放电电路1包括第三MOS管M3、第四MOS管M4、充放电电容C1和第五电阻R5;其中,第三MOS管M3为增强P沟道MOS晶体管、第四MOS管M4为增强型N沟道MOS晶体管,第三MOS管M3的栅极和第四MOS管M4的栅极同时连接逻辑组合电路2的输出端,第三MOS管M3的漏极和第四MOS管M4的漏极分别连接于第五电阻R5的两端,第三MOS管M3的源极和衬底同时连接电源输入端VDD,第四MOS管M4的源极和衬底同时接地,充放电电容C1的一端接地、另一端连接于施密特整形电路5的输入端。In order to optimize the circuit structure of the entire chip and ensure the performance of the entire chip, the capacitor charging and discharging circuit 1 of this embodiment includes a third MOS transistor M3, a fourth MOS transistor M4, a charging and discharging capacitor C1, and a fifth resistor R5; wherein, the third The MOS transistor M3 is an enhanced P-channel MOS transistor, the fourth MOS transistor M4 is an enhanced N-channel MOS transistor, and the gate of the third MOS transistor M3 and the gate of the fourth MOS transistor M4 are simultaneously connected to the output of the logic combination circuit 2 terminal, the drain of the third MOS transistor M3 and the drain of the fourth MOS transistor M4 are respectively connected to both ends of the fifth resistor R5, the source and the substrate of the third MOS transistor M3 are connected to the power input terminal VDD at the same time, and the fourth The source and the substrate of the MOS transistor M4 are grounded at the same time, one end of the charging and discharging capacitor C1 is grounded, and the other end is connected to the input end of the Schmidt shaping circuit 5 .
本实施例的恢复电压设定电路6包括第一MOS管M1和第二MOS管M2;其中,第一MOS管M1为增强P沟道MOS晶体管、第二MOS管M2为增强N沟道MOS晶体管,第一MOS管M1的栅极和第二MOS管M2的栅极同时连接施密特整形电路5的输出端,而第一MOS管M1的源极和衬底同时连接电压设定端Vin,第二MOS管M2的源极和衬底同时接地,第一MOS管M1的漏极和第二MOS管M1的漏极分别连接电阻分压电路4。The recovery voltage setting circuit 6 of this embodiment includes a first MOS transistor M1 and a second MOS transistor M2; wherein, the first MOS transistor M1 is an enhanced P-channel MOS transistor, and the second MOS transistor M2 is an enhanced N-channel MOS transistor. The gate of the first MOS transistor M1 and the gate of the second MOS transistor M2 are simultaneously connected to the output terminal of the Schmidt shaping circuit 5, and the source and substrate of the first MOS transistor M1 are simultaneously connected to the voltage setting terminal Vin, The source and the substrate of the second MOS transistor M2 are grounded at the same time, and the drains of the first MOS transistor M1 and the second MOS transistor M1 are respectively connected to the resistor divider circuit 4 .
本实施例的施密特整形电路5包括顺序连接的施密特整形单元51和第二反相器A2,施密特整形单元51的输入端连接于电容充放电电路1的输出端,第二反相器A2的输出端作为检测信号输出端Vout,第一MOS管M1的栅极和第二MOS管M2的栅极同时连接于第二反相器A2的输入端与施密特整形单元51的输出端之间。The Schmidt shaping circuit 5 of the present embodiment includes a sequentially connected Schmidt shaping unit 51 and a second inverter A2, the input end of the Schmidt shaping unit 51 is connected to the output end of the capacitor charging and discharging circuit 1, and the second inverter A2 The output terminal of the inverter A2 is used as the detection signal output terminal Vout, and the gate of the first MOS transistor M1 and the gate of the second MOS transistor M2 are simultaneously connected to the input terminal of the second inverter A2 and the Schmidt shaping unit 51 between the output terminals.
本实施例的电阻分压电路4包括顺序串联于电压设定端Vin与接地端之间的第一电阻R1、第二电阻R2、第三电阻R3和第四电阻R4;其中,逻辑组合电路2的输入端连接于第二电阻R2和第三电阻R3之间,第一MOS管M1的漏极连接于第一电阻R1和第二电阻R2之间,第二MOS管M2的漏极连接于第三电阻R3和第四电阻R4之间。为提高输入电压的可变动性,削弱恢复电压和开启电压与各电阻之间的关系,以提高电压检测的精度,本实施例的第一电阻R1和第四电阻R4的阻值相等。The resistor divider circuit 4 of this embodiment includes a first resistor R1, a second resistor R2, a third resistor R3 and a fourth resistor R4 connected in series between the voltage setting terminal Vin and the ground terminal; wherein, the logic combination circuit 2 The input terminal of the first MOS transistor M1 is connected between the second resistor R2 and the third resistor R3, the drain of the first MOS transistor M1 is connected between the first resistor R1 and the second resistor R2, and the drain of the second MOS transistor M2 is connected to the first between the third resistor R3 and the fourth resistor R4. In order to increase the variability of the input voltage, weaken the relationship between the recovery voltage and the turn-on voltage and each resistor, and improve the accuracy of voltage detection, the resistance values of the first resistor R1 and the fourth resistor R4 in this embodiment are equal.
进一步地,本实施例的逻辑组合电路2包括比较器Q和第一反相器A1,比较器Q的正极连接于第一电阻R1和第二电阻R2之间、负极连接基准电压产生电路3的输出端、输出端连接第一反相器A1的输入端,而第一反相器A1的输出端则连接电容充放电电路1的输入端(即第三MOS管M3的栅极和第四MOS管M4的栅极)。Further, the logic combination circuit 2 of this embodiment includes a comparator Q and a first inverter A1, the positive pole of the comparator Q is connected between the first resistor R1 and the second resistor R2, and the negative pole is connected to the reference voltage generation circuit 3 The output terminal and the output terminal are connected to the input terminal of the first inverter A1, and the output terminal of the first inverter A1 is connected to the input terminal of the capacitor charging and discharging circuit 1 (that is, the gate of the third MOS transistor M3 and the fourth MOS transistor M3 Gate of tube M4).
为能够清楚的表现本实施例的检测芯片的优越性,其工作原理如下:电阻分压电路4用来产生输入比较器Q的电压V1、逻辑组合电路2中的第一反相器A1的输出用来控制充放电电容C1的充放电状态,在充放电电容C1的两端所产生的电压经过施密特整形电路5进行整形后通过检测信号输出端Vout输出控制信号,与此同时,施密特整形电路5所输出的电压同时控制恢复电压设定电路6中的第一MOS管M1和第二MOS管M2的开启,以便设定恢复电压。当设定电压设定端Vin的电压使V1低于Verf时,电源输入端VDD通过第三MOS管M3和第五电阻R5对充放电电容C1进行充电,若在规定的时间内,当电压设定端Vin的电压升高使得V1高于Verf时,充放电电容C1马上放电,时间重新计算;若在规定的时间内,当电压设定端Vin的电压升高没能使V1高于Verf时,检测信号输出端Vout处于低电平且充放电电容C1继续充电直至电压设定端Vin的电压升高到恢复电压后,检测信号输出端Vout恢复高电平,充放电电容C1放电,时间重新计算;在此过程中,检测信号输出端Vout为高电平时,第一MOS管M1开启,第二MOS管M2关闭,第一电阻R1被短路,第四电阻R4参与分压;当检测信号输出端Vout为低电平时,第一MOS管M1关闭,第二MOS管M2开启,第一电阻R1参与分压,第四电阻R4被短路。In order to clearly show the superiority of the detection chip of this embodiment, its working principle is as follows: the resistance divider circuit 4 is used to generate the voltage V1 input to the comparator Q, the output of the first inverter A1 in the logic combination circuit 2 It is used to control the charging and discharging state of the charging and discharging capacitor C1. The voltage generated at both ends of the charging and discharging capacitor C1 is shaped by the Schmidt shaping circuit 5, and then the control signal is output through the detection signal output terminal Vout. At the same time, the Schmidt The voltage output by the special shaping circuit 5 controls the turn-on of the first MOS transistor M1 and the second MOS transistor M2 in the recovery voltage setting circuit 6 at the same time, so as to set the recovery voltage. When the voltage of the voltage setting terminal Vin is set so that V1 is lower than Verf, the power supply input terminal VDD charges the charging and discharging capacitor C1 through the third MOS transistor M3 and the fifth resistor R5. If within the specified time, when the voltage setting When the voltage of the fixed terminal Vin rises so that V1 is higher than Verf, the charging and discharging capacitor C1 is discharged immediately, and the time is recalculated; if within the specified time, when the voltage of the voltage setting terminal Vin does not rise to make V1 higher than Verf , the detection signal output terminal Vout is at a low level and the charging and discharging capacitor C1 continues to charge until the voltage at the voltage setting terminal Vin rises to the recovery voltage, the detection signal output terminal Vout returns to a high level, the charging and discharging capacitor C1 is discharged, and the time is reset calculation; during this process, when the detection signal output terminal Vout is at a high level, the first MOS transistor M1 is turned on, the second MOS transistor M2 is turned off, the first resistor R1 is short-circuited, and the fourth resistor R4 participates in voltage division; when the detection signal output When the terminal Vout is at a low level, the first MOS transistor M1 is turned off, the second MOS transistor M2 is turned on, the first resistor R1 participates in voltage division, and the fourth resistor R4 is short-circuited.
另外,由于第一电阻R1和第四电阻R4的阻值相等,当检测信号输出端Vout的电压Vout=1时(即处于高电平时),分压电压V1等于基准电压Verf所需的开启电压:In addition, since the resistance values of the first resistor R1 and the fourth resistor R4 are equal, when the voltage Vout of the detection signal output terminal Vout=1 (that is, at a high level), the divided voltage V1 is equal to the turn-on voltage required by the reference voltage Verf :
当检测信号输出端Vout的电压Vout=0时(即处于低电平时),分压电压V1等于基准电压Verf所需的恢复电压:When the voltage Vout of the detection signal output terminal Vout=0 (that is, when it is at a low level), the divided voltage V1 is equal to the recovery voltage required by the reference voltage Verf:
而开启电压和恢复电压的比值:And the ratio of turn-on voltage to recovery voltage:
以上所述仅为本实用新型的优选实施例,并非因此限制本实用新型的专利范围,凡是利用本实用新型说明书及附图内容所作的等效结构或等效流程变换,或直接或间接运用在其他相关的技术领域,均同理包括在本实用新型的专利保护范围内。The above is only a preferred embodiment of the utility model, and does not limit the patent scope of the utility model. Any equivalent structure or equivalent process conversion made by using the specification of the utility model and the contents of the accompanying drawings may be directly or indirectly used in Other relevant technical fields are all included in the patent protection scope of the present utility model in the same way.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109981083A (en) * | 2019-03-19 | 2019-07-05 | 上海林果实业股份有限公司 | Waveform shaping circuit and electronic equipment |
| CN110320957A (en) * | 2019-08-05 | 2019-10-11 | 北京中科银河芯科技有限公司 | A kind of voltage selecting circuit |
| WO2020142956A1 (en) * | 2019-01-09 | 2020-07-16 | 深圳市大疆创新科技有限公司 | Discharge circuit for distance measuring device, distributed radar system and mobile platform |
| CN112947660A (en) * | 2021-02-20 | 2021-06-11 | 上海韦玏微电子有限公司 | Preprocessing circuit and preprocessing method for power supply voltage |
| CN113484589A (en) * | 2021-06-30 | 2021-10-08 | 杭州加速科技有限公司 | Power-off detection circuit with hysteresis function and control system |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| WO2020142956A1 (en) * | 2019-01-09 | 2020-07-16 | 深圳市大疆创新科技有限公司 | Discharge circuit for distance measuring device, distributed radar system and mobile platform |
| CN111670527A (en) * | 2019-01-09 | 2020-09-15 | 深圳市大疆创新科技有限公司 | Discharging circuit for distance measuring device, distributed radar system and movable platform |
| CN111670527B (en) * | 2019-01-09 | 2024-06-11 | 深圳市大疆创新科技有限公司 | Discharge circuit for distance measuring device, distributed radar system and movable platform |
| CN109981083A (en) * | 2019-03-19 | 2019-07-05 | 上海林果实业股份有限公司 | Waveform shaping circuit and electronic equipment |
| CN110320957A (en) * | 2019-08-05 | 2019-10-11 | 北京中科银河芯科技有限公司 | A kind of voltage selecting circuit |
| CN112947660A (en) * | 2021-02-20 | 2021-06-11 | 上海韦玏微电子有限公司 | Preprocessing circuit and preprocessing method for power supply voltage |
| CN112947660B (en) * | 2021-02-20 | 2024-03-19 | 上海韦玏微电子有限公司 | Pretreatment circuit and pretreatment method for power supply voltage |
| CN113484589A (en) * | 2021-06-30 | 2021-10-08 | 杭州加速科技有限公司 | Power-off detection circuit with hysteresis function and control system |
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