CN218331852U - Fool-proof device for integrated circuit test - Google Patents
Fool-proof device for integrated circuit test Download PDFInfo
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- CN218331852U CN218331852U CN202222315378.3U CN202222315378U CN218331852U CN 218331852 U CN218331852 U CN 218331852U CN 202222315378 U CN202222315378 U CN 202222315378U CN 218331852 U CN218331852 U CN 218331852U
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Abstract
A fool-proof device for integrated circuit testing relates to the field of integrated circuit testing. The fool-proofing device comprises a test system and a test board, wherein at least one power supply module is integrally installed on the test system and provides different voltages, and each power supply module is provided with a power supply connecting socket; the test board is provided with at least one singlechip and at least one test socket, the test sockets are connected with the singlechips in a one-to-one correspondence manner, and the test sockets are connected with the power supply connecting sockets through channel flat cables. Through the device, whether the flat cable is inserted wrongly or not can be directly confirmed after the test system is connected with the test board through the flat cable, and the test system is directly clear. The device prevents the channel wire arrangement between the test system and the test board from being misconnected, thereby avoiding the defective circuit from mixing into the good circuit.
Description
Technical Field
The utility model relates to an integrated circuit test field especially relates to a prevent slow-witted device for integrated circuit test.
Background
In the field of current integrated circuit testing, chips need to be tested, usually, a testing system providing different power supplies is manually connected with a sorting machine through channel flat cables, a plurality of channel flat cables and a testing board are required to be connected in a multi-station mode, the flat cables are easy to make errors if no precautionary measures are taken, and then the testing system sends wrong BIN dividing signals to the sorting machine according to testing results, so that defective circuits are mixed into good circuits.
SUMMERY OF THE UTILITY MODEL
In order to avoid test system and survey winding displacement mistake in the test panel in the integrated circuit test to lead to test result output mistake, the utility model discloses a following technical scheme: the device mainly judges whether the connection flat cable between the test system and the test board is misconnected or not by combining the voltage acquisition function of the single chip microcomputer through the power supply module of the test system
A fool-proof device for integrated circuit test comprises a test system and a test board, wherein at least one power supply module is integrally installed on the test system and provides different voltages, and each power supply module is provided with a power supply connecting socket; the testing board is provided with at least one single chip microcomputer, at least one testing socket is further formed in the testing board, the testing sockets are connected with the single chip microcomputers in a one-to-one correspondence mode, and the testing sockets are connected with the power supply connecting sockets through channel flat cables.
Specifically, the single chip microcomputer is the single chip microcomputer of which the model is XC8P8600, and comprises 8 pins, the 1 st pin of the single chip microcomputer is externally connected with a 5V power supply, the 3 rd pin is electrically connected with the test socket and receives the test voltage corresponding to the power supply module, the 5 th pin is connected with the first light-emitting diode, the 6 th pin is connected with the second light-emitting diode, and the 8 th pin is grounded. When the 1 st pin of the single chip microcomputer is provided with 5V voltage, the 3 rd pin continuously collects the voltage provided by the voltage module and compares the voltage with the preset value in the single chip microcomputer, if the voltage is consistent with the preset value in the single chip microcomputer, the 6 th pin of the single chip microcomputer outputs high level, the second light emitting diode is lightened, and green light is emitted; if the winding displacement connects wrongly, the voltage collected by the 3 rd pin of the single chip microcomputer is inconsistent with the voltage preset in the single chip microcomputer, the 5 th pin of the single chip microcomputer outputs high level, the first light emitting diode is lightened, and red light is emitted. By the aid of the light emitting color of the light emitting diodes, an operator can judge whether the flat cable is connected in a wrong mode at a glance.
Specifically, the test board is a PCB.
The device can directly confirm whether the flat cable is inserted wrongly or not after the test system is connected with the test board through the flat cable, and is direct and clear. The device prevents the channel wire arrangement between the test system and the test board from connecting wrongly, thereby avoiding the defective circuit from mixing into the good circuit.
Drawings
FIG. 1 is a schematic diagram of a fool-proof device for integrated circuit testing;
FIG. 2 is a schematic diagram of a chip in the fool-proof apparatus for testing an integrated circuit;
Detailed Description
The present invention will be further described with reference to fig. 1 to 2.
A fool-proof device for testing an integrated circuit comprises a testing system and a testing board, wherein the testing board is a PCB (printed Circuit Board), the testing system mainly provides different testing voltages for testing the integrated circuit, 4 power modules are integrally installed on the testing system and comprise a power module 1, a power module 2, a power module 3 and a power module 4, the 4 power modules can respectively provide voltages of 1V, 2V, 3V and 4V according to testing requirements, and each power module is provided with a power connection socket.
In order to realize the fool-proof function, 4 singlechips are installed on the test board, and each singlechip is a singlechip with the model of XC8P 8600. Each power module is distinguished through the singlechip, prevents that power module from being inserted by mistake after connecting the passageway winding displacement. The testing board is also provided with 4 testing sockets, each testing socket is electrically connected with each singlechip in a one-to-one correspondence manner, and the power supply connecting socket and the testing socket are connected through a channel flat cable.
After the connection is realized through the channel flat cable, the 1 st pin of the single chip microcomputer is externally connected with a 5V power supply, and the 8 th pin is grounded. The power module provides a test voltage for a 3 rd pin of the singlechip. A 5 th pin of the singlechip is connected with a first light-emitting diode, and the first light-emitting diode is red when being lightened; the 6 th pin is connected with the second light-emitting diode, and the second light-emitting diode is green when being lightened. After the 1 st pin of the single chip microcomputer is provided with 5V voltage, the 3 rd pin can continuously acquire the voltage provided by the voltage module and compare the voltage with the preset value in the single chip microcomputer, if the comparison is consistent, the 6 th pin of the single chip microcomputer can output high level, a second light emitting diode is lightened, and green light is emitted; if the flat cable is connected in a wrong way, the voltage collected by the 3 rd pin of the single chip microcomputer is inconsistent with the voltage preset in the single chip microcomputer, the 5 th pin of the single chip microcomputer outputs high level, the first light emitting diode is lightened, and red light is emitted. By the aid of the light emitting color of the light emitting diodes, an operator can judge whether the flat cable is connected wrongly or not at a glance.
The device has the following advantages: after the test system is connected with the test board through the flat cable, whether the flat cable is inserted wrongly or not can be directly confirmed, and the test system is directly clear. The device prevents the channel wire arrangement between the test system and the test board from connecting wrongly, thereby avoiding the defective circuit from mixing into the good circuit.
It should be understood that the above detailed description of the present invention is only for illustrative purposes and is not limited to the technical solutions described in the embodiments of the present invention. It will be understood by those skilled in the art that the present invention may be modified and equivalents may be substituted to achieve the same technical effects; as long as satisfy the operation needs, all be in the protection scope of the utility model.
Claims (3)
1. A fool-proof device for integrated circuit testing is characterized by comprising a testing system and a testing board, wherein at least one power supply module is integrally installed on the testing system and provides different voltages, and each power supply module is provided with a power supply connecting socket; the testing board is provided with at least one single chip microcomputer, at least one testing socket is further formed in the testing board, the testing sockets are connected with the single chip microcomputers in a one-to-one correspondence mode, and the testing sockets are connected with the power supply connecting sockets through channel flat cables.
2. The foolproof device for integrated circuit testing of claim 1, wherein the single chip microcomputer is of the type XC8P8600, and comprises 8 pins, pin 1 of the single chip microcomputer is externally connected with a 5V power supply, pin 3 is electrically connected with the test socket and receives the test voltage of the corresponding power module, pin 5 is connected with the first light emitting diode, pin 6 is connected with the second light emitting diode, and pin 8 is grounded.
3. The fool-proofing device for integrated circuit testing according to claim 1, wherein said testing board is a PCB board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222315378.3U CN218331852U (en) | 2022-08-30 | 2022-08-30 | Fool-proof device for integrated circuit test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222315378.3U CN218331852U (en) | 2022-08-30 | 2022-08-30 | Fool-proof device for integrated circuit test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218331852U true CN218331852U (en) | 2023-01-17 |
Family
ID=84833431
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222315378.3U Active CN218331852U (en) | 2022-08-30 | 2022-08-30 | Fool-proof device for integrated circuit test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218331852U (en) |
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2022
- 2022-08-30 CN CN202222315378.3U patent/CN218331852U/en active Active
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