CN211374847U - Extended Test Probes and Test Tools for Test Tools - Google Patents

Abstract

The embodiment of the present application discloses an extended test probe and a test tool of a test tool. The extension test probe includes: a first connection end for establishing a connection with the probe of the test tool; a connection line for connecting the first connection end and the second connection end; and a second connection end for connecting with the first connection end The connection includes at least: a socket connector, which is used to establish a test connection for testing with a pin connector on the test object.

Description

Extended Test Probes and Test Tools for Test Tools

technical field

The embodiments of the present application relate to electronic technology, and relate to, but are not limited to, an extended test probe of a test tool and a test tool.

Background technique

A multimeter is a multi-function, multi-range measuring instrument. Generally, a multimeter can measure DC current, DC voltage, AC current, AC voltage, resistance and audio level, etc., and some can also measure AC current, capacitance, inductance and semiconductors. some parameters, etc. In the related art, a multimeter has at least two test pens, a positive electrode and a negative electrode, and the pens are usually probe-shaped. When using, manually make the test lead contact the terminal to be tested to form a signal path. However, in the manufacturing process of various electronic products, multi-pin pin header test terminals are often encountered. Due to the close spacing between the pin connectors of the pin header test terminals, short circuits are prone to occur when contacting with multimeter test leads, and it is not easy to operate. .

SUMMARY OF THE INVENTION

In view of this, embodiments of the present application provide an extended test probe and a test tool of a test tool.

According to a first aspect of the embodiments of the present application, an extended test probe of a test tool is provided, including:

a first connection end, used to establish a connection with the probe of the test tool;

a connecting wire for connecting the first connecting end and the second connecting end;

The second connection end, which is connected to the first connection end, at least includes a socket connector, and the socket connector is used to establish a test connection for testing with a pin connector on the test object.

According to a second aspect of the embodiments of the present application, a test tool is provided, the test tool has at least one probe connected to the first connection end of the above-mentioned extended test probe.

In the embodiment of the present application, by setting the first connection end that matches the probe of the test tool and the socket connector that matches the pin connector of the test object, it provides a convenient way to test the test object with the pin connector. The implementation method reduces the probability of poor contact or short circuit during testing.

Description of drawings

1A is a schematic diagram of an extended test probe of a test tool provided by an embodiment of the application;

1B is a schematic diagram of the physical structure of an extended test probe of a test tool provided by an embodiment of the application;

2A is a schematic diagram of an extended test probe of another test tool provided by an embodiment of the present application;

2B is a schematic diagram of the physical structure of the connecting hook in the extension test probe provided by the embodiment of the application;

3 is a schematic diagram of an extended test probe of another test tool provided by an embodiment of the present application;

4 is a schematic diagram of an extended test probe of another test tool provided by an embodiment of the present application;

5 is a schematic diagram of an extended test probe of another test tool provided by an embodiment of the present application;

6 is a schematic diagram of a multimeter provided by an embodiment of the present application;

7 is a schematic diagram of a test object with pin headers provided by an embodiment of the present application;

FIG. 8 is a schematic diagram of a physical structure of an extended test probe of another test tool provided by an embodiment of the present application.

Detailed ways

An embodiment of the present application provides an extended test probe of a test tool. As shown in FIG. 1A , the extended test probe 100 includes:

The first connection end 110 is used to establish a connection with the probe 200 of the test tool;

a connecting wire 130 for connecting the first connecting end 110 and the second connecting end 120;

The second connection end 120, connected to the first connection end 110, at least includes a socket connector 121, the socket connector is used to establish a test connection for testing with the pin connector 300 on the test object.

The physical object of the above-mentioned extended test probe is shown in Figure 1B. The test tool is a tool used for electrical testing, including instruments, meters, etc., such as multimeters, oscilloscopes, voltmeters, ammeters, and the like. The probe of the test tool is used to contact the end to be tested and receive electrical signals. Here, an extended test probe is provided, which is used to connect with the probe of the test tool, and provides a connector to connect with the end to be tested, so as to receive the electrical signal and perform the test, that is, to realize the test connection.

Here, the first connection end is used to connect with the probe, and therefore, the first connection end is set as a connector matching the probe of the test tool.

The second connection end is used to connect with the test object, where the test object includes at least one pin connector, such as a pin header. The socket connector of the second connection end is sheathed on the pin connector to form an electrical connection. That is, the pin connector can be inserted into the socket connector. In addition, it is possible to extend the use of the test probe by setting different lengths of the connecting wires.

In this way, the needle-shaped end to be tested can be tested by the test tool, and the socket connector can be sleeved on the needle connector without manually maintaining the connection, and the test connection can be fixed and not easily affected by other nearby conductive structures. It is easy to operate and improve the accuracy of the test.

In some embodiments, the socket joint is a cylindrical structure; the outer wall of the cylindrical structure has an insulating protective layer;

The inner wall of the cylindrical structure is a conductive layer that forms a conductive connection with the first connection end, and is used to provide an insertion hole for the pin connector.

The socket joint is a cylindrical structure. In order to avoid contact with other conductive structures during testing, an insulating protective layer can be provided on the outer wall of the cylindrical structure to insulate the outside of the socket joint from the inner wall of the cylindrical structure.

The elastic sheet-like inner wall of the cylindrical structure has a conductive layer, and the conductive layer can be connected to the first connection end through conductive material, for example, by wire connection, so that the first connection end and the second connection end form an extended conductive path. The pin connector of the test object is inserted into the cylindrical structure and contacts with the conductive layer on the inner wall of the cylindrical structure, thereby forming a conductive connection with the first connection end through the conductive layer. The inner wall of the tubular structure may be the inner wall of the elastic sheet type, and the metal elastic sheet has an elastic force toward the center of the tubular structure. When the pin-type connector is inserted into the cylindrical structure, the metal dome is pressed against the metal connecting pin, thereby forming a close contact and improving the electrical conductivity.

Since the outer wall of the socket joint has an insulating protective layer, it can avoid short-circuiting with nearby conductive structures. For example, when testing a pin header in a pin header, it can be directly sleeved on the corresponding pin header to prevent short circuit with other nearby pin headers, thereby improving test accuracy and safety.

In some embodiments, the second connection end: further comprises:

The connection joint is connected with the socket joint.

Both the connection joint and the socket joint are used to establish a test connection with the test object. The connection joint includes various types or shapes of joints, and is not limited to the way of socket connection, as long as it can achieve electrical connection with the connection point of the test object. The joints are all within this range. For example, various types of hook connectors, plug connectors, and connector clips are available.

The connection connector and the end of the socket connector can be connected together to realize the transfer of different connection methods.

In some embodiments, as shown in FIG. 2A , the connecting joint is at least one hook-type joint 122 , and the at least one hook-type joint 122 is connected to the tail of the socket joint 121 for connecting with the test object. The connection ring or hook to establish a test connection for testing. The first connection end 110 is connected to the test probe 200 , and the socket connector 121 is used to establish a test connection with the pin connector 300 . Figure 2B is a physical view of the above hook-type joint.

In order to facilitate the application of the above-mentioned extended test probe to different test objects, the above-mentioned second connection end may have at least two different types of joints, including the above-mentioned socket joints and hook-shaped hook-type joints. Since only one of the connectors needs to be used for one test, the plurality of connectors of the second connection end can be connected to each other at the tail and connected to the above-mentioned first connection end through the same conductive path. When in use, use one of the joints and the other joints can be left floating, or placed on insulating material.

Here, the hook joint has a hook-like connection structure made of conductive material, such as a metal hook. When the connection structure on the test object is in the form of a ring or hook, a hook joint can be used for connection.

The above-mentioned hook-type joint may also include an insulating protective cover, which is wrapped around the outside of the above-mentioned hook-shaped connection structure. An elastic structure, such as an elastic sheet, a spring, etc., may also be arranged between the above-mentioned insulating protective cover and the hook-like connecting structure, and the insulating protective cover and the hook-like connecting structure are movably arranged. When the outer wall of the insulating protective sleeve is subjected to an external force opposite to the direction of the hook-shaped connecting structure, the hook-shaped connecting structure can be extended from the insulating protective sleeve; when the insulating protective sleeve is not subjected to the above external force, the hook-shaped connecting structure retracts the insulating protective sleeve middle.

Through the above structure, an interchangeable connector is provided, which is suitable for different test objects and effectively improves the convenience of operation.

In some embodiments, as shown in FIG. 3 , the connection connector is at least one plug connector 123, the at least one plug connector 123 and the socket connector 121 (may also include other types such as hook connectors 122) The tails of the connector) are connected to each other to establish a test connection for testing with the connection hole on the test object. The first connection end 110 is connected to the test probe 200 , and the socket connector 121 is used to establish a test connection with the pin connector 300 .

The above-mentioned second connection end may further include a plug connector for being plugged into the connection hole of the test object, and the plug connector may include a needle-like structure made of conductive material, for example, a metal needle. The plug connector can be connected with the tail of the above-mentioned socket connector, and can be used alternatively, and can also be connected with the tail of the socket connector and the hook connector, so as to provide a variety of different test connectors, suitable for different test objects.

In order to ensure that the metal conductor will not touch other test objects and cause accidents when the plug connector is not in use, the metal outer end of the plug connector can be covered with a detachable insulating protective cover.

In some embodiments, as shown in FIG. 4 , the connection joint is at least one joint clip 124, and the at least one joint clip 124 is connected to the socket joint 121 (which may also include hook joint 122, plug joint 123 and other types of connectors) are connected to each other to establish a test connection for testing with the raised connector on the test object. The first connection end 110 is connected to the test probe 200 , and the socket connector 121 is used to establish a test connection with the pin connector 300 .

The above-mentioned second connecting end may further comprise a joint clip for connecting to the convex connecting piece. For example, the connector of the test object is a metal sheet, and the above-mentioned connection methods such as socket connection, hook connection, and plug connection cannot be performed. In this case, the metal sheet can be clamped by a joint clip to form a test connection.

The inner side of the clip opening of the joint clip is made of conductive material, and can also be a metal clip as a whole. The clip tail of the joint clip is connected with the tail part of the socket joint, and is connected to the first connection end through different conductive paths.

In other embodiments, as shown in FIG. 5 , any connectors such as the connector clip 124 , the hook connector 122 , and the plug connector 123 can be designed to be detachable, which can be used interchangeably with the above-mentioned socket connector 121 . The conductive path, that is, the connection wire 130 is connected to the first connection end 110, so that different test connectors can be replaced when different test objects are used.

Through the above structure, a variety of interchangeable connectors can be provided for the same test probe, which is suitable for different test objects, and has a simple structure and convenient operation. In some embodiments, the test tool is a multimeter, and the probe of the test tool is a test lead of the multimeter, wherein the first connection end of the extended test probe is used for connecting the tip of the test lead .

The above test tool can be a multimeter. The multimeter has test probes for connecting to the test object. However, the shape of the test probes is fixed, which is not suitable for all test objects, and there is no socketable test probe suitable for pin connectors. . Therefore, the first connection end of the extended test probe in any of the above embodiments is connected with the above test probe, and the test object is connected by extending the second connection end of the test probe.

In other embodiments, the extended test probe can be used in any type of probing instrument.

An embodiment of the present application provides a test tool, the test tool has at least one probe connected to the first connection end of any one of the above-mentioned extended test probes.

The test tool is used for testing electrical signals, and its test probe needs to form an electrical connection with the test object. Here, the test probe of the test tool is connected to the test object through the extended test probe provided in any of the above embodiments. Since the probe structure of the test tool is fixed, it matches and establishes a connection with the extended test probe. Therefore, through this solution, the test tool can use the appropriate second connection end connector to establish a connection with the test object according to actual needs. The two connecting ends have a socket connector that can be socketed on the pin connector, which is suitable for testing the test object in the form of a pin header.

In some embodiments, the above-mentioned test tool is a multimeter. As shown in FIG. 6 , the above-mentioned test probe 200 is a test lead of the multimeter.

This application also provides the following examples:

When using a multimeter to test the test object, you can use the following methods:

First, use the multimeter pen for point measurement, that is, manually control the multimeter pen to contact the test object;

Second, use the clip-type multimeter pen;

Third, use hook-type multimeter test pens;

Fourth, use a test extension cable, one end is connected to the test object, and the other end is connected to the multimeter test lead through a copper wire;

In the power input circuit of many engineering test circuit boards, test terminals such as voltage/current are reserved in the form of pin headers, as shown in Figure 7, for testing. However, if the above-mentioned first method is directly used, that is, point measurement with multimeter test leads, the operation is extremely inconvenient, and short circuit or poor contact are likely to occur. If the above-mentioned second or third method is adopted, that is, the clip-type multimeter pen or the hook-type multimeter pen, it is difficult to fix it on the designated pin connector to be tested, and it is easy to short-circuit with the adjacent pin connector, resulting in the test Not allowed or the test object is damaged by a short circuit. With the above fourth method, it is necessary to manually connect the copper wire with the multimeter pen, which is inconvenient to operate.

Therefore, the above-mentioned test leads are combined together to form a test extension cord with a replaceable connector. The front end of the test extension cable adopts a special cap that matches the multimeter pen, which can be plugged with the multimeter pen and form a good conductive connection. The rear end of the extension cable adopts a DuPont wire female head that can be directly inserted into the pin header. The DuPont wire female head and the pin header can form a good conductive connection, and because the outer wall of the DuPont wire female head has insulating material, it can reduce other contact with the pin header. The probability of pin connector, thus reducing the occurrence of short circuit and improving the test accuracy.

In addition, as shown in FIG. 8 , the test extension cord can also have multiple test connectors 10 , and the tails are connected to each other, and connected to the special cap 20 at the front end of the test extension cord through the same wire for establishing connection with the test probe 30 . The plurality of test connectors 10 may include the above-mentioned DuPont wire female connectors 11 , clip-type connectors 12 , hook-type connectors 13 , and other types of connectors such as pin connectors. In addition, the positive and negative poles of the test extension cable can also be distinguished by color. For example, a group of red DuPont cable females, clip-type connectors, hook-type connectors, and wires and caps can be connected together as a positive test extension. Wire; connect the black DuPont wire female end, clip-type connector, hook-type connector, wire and cap as a group, and connect them together as a negative test extension cable. This multi-turn design, while retaining a variety of connectors with different structures, can match different test objects and expand the application range of the multimeter.

It is to be understood that reference throughout the specification to "one embodiment" or "an embodiment" means that a particular feature, structure or characteristic associated with the embodiment is included in at least one embodiment of the present application. Thus, appearances of "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily necessarily referring to the same embodiment. Furthermore, the particular features, structures or characteristics may be combined in any suitable manner in one or more embodiments. It should be understood that, in various embodiments of the present application, the size of the sequence numbers of the above-mentioned processes does not mean the sequence of execution, and the execution sequence of each process should be determined by its functions and internal logic, and should not be dealt with in the embodiments of the present application. implementation constitutes any limitation. The above-mentioned serial numbers of the embodiments of the present application are only for description, and do not represent the advantages or disadvantages of the embodiments.

It should be noted that, herein, the terms "comprising", "comprising" or any other variation thereof are intended to encompass non-exclusive inclusion, such that a process, method, article or device comprising a series of elements includes not only those elements, It also includes other elements not expressly listed or inherent to such a process, method, article or apparatus. Without further limitation, an element qualified by the phrase "comprising a..." does not preclude the presence of additional identical elements in a process, method, article or apparatus that includes the element.

The above is only the embodiment of the present application, but the protection scope of the present application is not limited to this. Covered within the scope of protection of this application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims (10)

1. an extension test probe of a test tool, is characterized in that, described extension test probe comprises: a first connection end, used to establish a connection with the probe of the test tool; a connecting wire for connecting the first connecting end and the second connecting end; The second connection end, which is connected to the first connection end, at least includes a socket connector, and the socket connector is used to establish a test connection for testing with a pin connector on the test object. 2 . The extension test probe according to claim 1 , wherein the socket joint is a cylindrical structure; the outer wall of the cylindrical structure has an insulating protective layer; 3 . The inner wall of the cylindrical structure is a conductive layer that forms a conductive connection with the first connection end, and is used to provide an insertion hole for the pin connector. 3 . The extension test probe according to claim 1 or 2 , wherein the second connection end further comprises: a connection joint, and the connection joint is connected to the socket street. 4 . 4. The extended test probe of claim 3, wherein The connecting joint is at least one hook-type joint, and the at least one hook-type joint is connected with the tail of the socket joint to establish a test connection for testing with a connecting ring or a connecting hook on the test object. 5. The extended test probe of claim 3, wherein The connection joint is at least one plug-in joint, and the at least one plug-in joint is connected with the tail of the socket joint to establish a test connection for testing with the connection hole on the test object. 6 . The extension test probe according to claim 3 , wherein the connecting joint is at least one joint clip, and the at least one joint clip is connected to the tail of the socket joint for connecting with the test object. 7 . Raised connectors establish test connections for testing. 7. The extended test probe of claim 3, wherein: The tail portion of the connection connector is connected with the tail portion of the socket connector, and is connected to the first connection end through different conductive paths. 8 . The extension test probe according to claim 3 , wherein the head of the connection connector is connected with the tail of the socket connector, and is connected to the first connection end through the same conductive path. 9 . 9. The extended test probe according to claim 1, wherein the test tool is a multimeter, and the probe of the test tool is a test lead of the multimeter, wherein the first The connecting end is used for connecting the tip of the test lead. 10. A test tool, characterized in that the test tool has at least one probe connected to the first connection end of the extended test probe according to any one of claims 1 to 9.

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