CN211669544U - Test system - Google Patents
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- CN211669544U CN211669544U CN202020686561.2U CN202020686561U CN211669544U CN 211669544 U CN211669544 U CN 211669544U CN 202020686561 U CN202020686561 U CN 202020686561U CN 211669544 U CN211669544 U CN 211669544U
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Abstract
The utility model relates to a test technical field discloses a test system. The utility model discloses in, include: the device comprises a control board, a test board for testing the control board, and an upper computer for burning a test program to the control board and sending a test instruction to the test board after the burning of the test program is finished; the control panel with survey test panel and be connected, the host computer with survey test panel is connected. By integrating the program burning function and the control function in the upper computer, the program burning process and the test process can be performed in a centralized manner in the test process, and compared with the prior art in which the program burning and test operation is performed through two different devices, the program burning process and the test process are not required to be separated, so that the position of the control board and the connection line of the control board are not required to be changed through manual operation when the two processes of burning and testing are switched, the test efficiency is improved, and the labor cost is reduced.
Description
Technical Field
The utility model relates to a test technical field, in particular to test system.
Background
At present, a control panel is widely applied to electronic equipment as a device capable of realizing a control function, but the quality problem is caused because the control panel is restricted by factors such as raw material quality, processing technology, human influence and the like in a production process, and therefore, a functional test needs to be performed on the produced control panel to ensure that each function of the control panel is good. In the prior art, a control board is tested by first burning a program into the control board by a burning device and then testing the control board by a testing device.
The inventor finds that at least the following problems exist in the prior art: the process of burning the test program is separated from the process of testing the control panel, and in the switching process of the two processes, the control panel needs to switch the position and the connection relation in a manual mode, so that the test efficiency of the whole test system is low.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a test system improves efficiency of software testing and has reduced the cost of labor.
In order to solve the above technical problem, an embodiment of the present invention provides a test system, which includes: the device comprises a control board, a test board for testing the control board, and an upper computer for burning a test program to the control board and sending a test instruction to the test board after the burning of the test program is finished; the control panel with survey test panel and be connected, the host computer with survey test panel is connected.
The embodiment of the utility model provides a through burning the program function and control function all concentrate on the host computer, in the test procedure, the process of burning the program can concentrate on going on with the test procedure, carries out the program through two different devices and burns and test operation for prior art, the invention need not to burn the program process and the test procedure separation for when burning the program and testing and switching over between two processes, the position of control panel and the line of control panel need not to change through manual operation, thereby has improved efficiency of software testing and has reduced the cost of labor.
In addition, the control board comprises N circuits to be tested, the test board comprises N test circuits, and the test circuits are connected with the test circuits in a one-to-one correspondence manner; wherein N is an integer greater than or equal to 1. In the specific test process, each circuit of the control board is connected with the corresponding test circuit in the test board, so that the test circuit detects the circuit to be tested.
In addition, the N circuits to be tested comprise an MCU circuit, a communication circuit, a digital circuit, an analog circuit and a power circuit. The type of circuitry the control board specifically comprises is defined.
In addition, the test board comprises a WIFI module; the test board is in communication connection with the upper computer through the WIFI module. The connection mode of the upper computer and the test board is specifically limited.
In addition, the number of the upper computers is multiple, and the WIFI module is connected with each upper computer in a wireless WIFI hotspot mode. The number of the upper computers is limited to be a plurality of, and the WIFI module opens the hot spot, so that a plurality of upper computers in the hot spot connection range can be connected to the WIFI module, test results sent by the WIFI module are received, the test results can be analyzed in time through a plurality of devices, and the detection efficiency is improved.
In addition, the probe module comprises a needle bed, probes arranged on the needle bed and flat cables correspondingly connected with the probes; the flat cable is connected to the test circuit of the test board; the probes correspondingly connected with the flat cables are connected to the circuit to be tested corresponding to the circuit to be tested.
Drawings
Fig. 1 is a schematic structural diagram of a test system according to a first embodiment of the present invention;
fig. 2 is a schematic structural diagram of a test system according to a second embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, embodiments of the present invention will be described in detail below with reference to the accompanying drawings. However, it will be appreciated by those of ordinary skill in the art that in the embodiments of the present invention, numerous technical details are set forth in order to provide a better understanding of the present application. However, the technical solutions claimed in the claims of the present application can be implemented without these technical details and with various changes and modifications based on the following embodiments.
The utility model discloses a first embodiment relates to a test system. As shown in fig. 1, includes: the test system comprises a control board 101, a test board 102 for testing the control board, and an upper computer 103 for burning a test program to the control board and sending a test instruction to the test board after the burning of the test program is completed.
Specifically, the control board 101 is connected to the test board 102, and the host computer 103 is connected to the test board 102.
In practical application, when the control board 101 is installed on the carrier, the upper computer 103 burns a test program into the control board 101 to provide a software basis for testing the control board 101; then, the upper computer 103 sends a test instruction to the test board 102, and after receiving the test instruction, the test board 102 controls signal excitation in the control board 101 according to the test instruction, so as to realize detection of the control board 101; the test board 102 can collect test data of the control board 101 in the test process while testing the control board 101, and return the test data to the upper computer 103; the upper computer 103 judges whether the control panel 101 passes the test or not according to the returned test data, and generates a test result report, so that a tester can visually observe and analyze the test result through the upper computer; finally, if the control board 101 has a test item that fails the test, the control board 101 is processed according to different fault types and different fault flows.
In practical application, software in the upper computer 103 is developed by adopting a Visual Studio integrated development environment, the interface is simple, the use habits of testers are met, and the operation and observation are easy.
In one example, the control board 101 and the test board 102 are connected by a probe module.
In one example, the control board 101 includes N circuits to be tested, and the test board 102 includes test circuits connected in one-to-one correspondence with each of the test circuits; wherein N is an integer greater than or equal to 1. In the specific test process, each circuit of the control board is connected with the corresponding test circuit in the test board, so that the test circuit detects the circuit to be tested.
Specifically, a circuit under test of the control board 101 is correspondingly connected to a corresponding test circuit of the test board 102 through the probe modules. In one example, the probe module comprises a needle bed, probes mounted on the needle bed, and a flat cable correspondingly connected with each probe, and the connection between the control board 101 and the test board 102 is realized through the probe module; the probes are connected with a circuit to be tested of the test board 102, wherein a plurality of test points exist on the circuit to be tested of the control board 101, and one probe is correspondingly connected with one test point; the test circuit of the test board 102 is connected to the bus corresponding to the probes, so that the test circuit of the test board 102 can be connected to the test points of the corresponding control board 101 circuit through the probe modules. In other embodiments, the control board 101 can be connected to the test board 102 by a wire connection, as long as the test board 102 can perform the function of testing the control board 101, which is not limited in this embodiment.
In one example, the N circuits under test include an MCU (micro controller Unit) circuit, a communication circuit, a digital circuit, an analog circuit, and a power supply circuit.
Specifically, since the test board 102 is to perform detection of each circuit in the control board 101, the test board 102 is provided with a detection circuit corresponding to the circuit of the control board 101, thereby performing detection of each circuit in the control board 101; correspondingly, the test board 102 includes an MCU test circuit, a communication test circuit, a digital quantity test circuit, an analog quantity test circuit, and a power supply test circuit; that is, the detection circuit of the test board 102 is used to detect the corresponding circuit in the control board 101, for example, the digital quantity test circuit is used to detect the digital quantity circuit.
In practical application, the number of the test circuits of the test board is greater than that of the circuits to be tested of the control board, so that the circuits to be tested in the control board only need to be connected to the corresponding test circuits, and the test circuits which are not needed to be used in the test board can not be connected to the control board.
In practical application, the power supply test circuit includes one or more of a 5V power supply, a 10V power supply and a 24V power supply, and the communication test circuit includes a 485 communication detection circuit and a CAN (Controller Area Network) communication detection circuit.
In the embodiment, the program burning function and the control function are integrated in the upper computer, the program burning process and the test process can be performed in a centralized manner in the test process, and compared with the prior art in which the program burning and the test operation are performed through two different devices, the program burning process and the test process are not required to be separated, so that the position of the control panel and the connection line of the control panel are not required to be changed through manual operation when the two processes of burning and testing are switched, the test efficiency is improved, and the labor cost is reduced.
A second embodiment of the present invention relates to a test system. The second embodiment is substantially the same as the first embodiment, with the main differences being: the utility model discloses in the second embodiment, survey test panel and include the WIFI module, host computer and WIFI module communication connection.
The present embodiment relates to a structural schematic diagram of a test system as shown in fig. 2, which includes: control panel 201, survey test panel 202, host computer 203, wherein, control panel 201 passes through the probe module with survey test panel 202 and is connected.
In one example, the test board 202 includes a WIFI module 2021; the test board 202 is in communication connection with the upper computer 203 through the WIFI module 2021. Specifically, the WIFI module 2021 is configured to receive a test instruction sent by the upper computer 203, and after the test board 202 tests the control board 201 according to the test instruction, the WIFI module 2021 may further collect test data of the control board 201, and return the test data to the upper computer 203.
In practical applications, the WIFI module 2021 employs an ESP8266 series chip.
In one example, the number of the upper computers 203 is multiple, and the WIFI module 2021 is connected to the upper computers in a WIFI hotspot manner. In this embodiment, the connection type between the upper computer 203 and the WIFI module 2021 of the test board 202 is limited, so that the upper computer inside the WIFI hotspot local area network can receive the test result sent by the WIFI module, and the test result can be analyzed in time through a plurality of devices, thereby improving the detection efficiency.
In one example, the WIFI module 2021 includes a voltage regulator, and the voltage stability of the WIFI module is ensured by disposing the voltage regulator in the WIFI module 2021 during the operation process. In practical applications, the voltage regulator is an RT9193 voltage regulator.
It will be understood by those skilled in the art that the foregoing embodiments are specific examples for carrying out the invention, and that various changes in form and detail may be made therein without departing from the spirit and scope of the invention in practice.
Claims (7)
1. A test system, comprising: the device comprises a control board, a test board for testing the control board, and an upper computer for burning a test program to the control board and sending a test instruction to the test board after the burning of the test program is finished;
the control panel with survey test panel and be connected, the host computer with survey test panel is connected.
2. The test system of claim 1, wherein the control board comprises N circuits under test, and the test board comprises test circuits connected in one-to-one correspondence with each of the circuits under test; wherein N is an integer greater than or equal to 1.
3. The test system of claim 2, wherein the N circuits under test comprise an MCU circuit, a communication circuit, a digital circuit, an analog circuit, and a power circuit.
4. The test system of claim 2, wherein the control board is connected to the test board via a probe module.
5. The test system of claim 1, wherein the test board comprises a WIFI module;
the test board is in communication connection with the upper computer through the WIFI module.
6. The test system of claim 5, wherein the number of the upper computers is multiple, and the WIFI module is connected with each upper computer in a wireless WIFI hotspot mode.
7. The test system of claim 4, wherein the probe module comprises a needle bed, probes mounted on the needle bed, and a flat cable connected to each probe;
the flat cable is connected to the test circuit of the test board; the probes correspondingly connected with the flat cables are connected to the circuit to be tested corresponding to the test circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020686561.2U CN211669544U (en) | 2020-04-29 | 2020-04-29 | Test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020686561.2U CN211669544U (en) | 2020-04-29 | 2020-04-29 | Test system |
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| CN211669544U true CN211669544U (en) | 2020-10-13 |
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| CN202020686561.2U Active CN211669544U (en) | 2020-04-29 | 2020-04-29 | Test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117389815A (en) * | 2023-12-08 | 2024-01-12 | 浙江普可医疗科技有限公司 | Testing device, method and equipment of wearable data acquisition terminal and storage medium |
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2020
- 2020-04-29 CN CN202020686561.2U patent/CN211669544U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117389815A (en) * | 2023-12-08 | 2024-01-12 | 浙江普可医疗科技有限公司 | Testing device, method and equipment of wearable data acquisition terminal and storage medium |
| CN117389815B (en) * | 2023-12-08 | 2024-03-22 | 浙江普可医疗科技有限公司 | Testing device, method and equipment of wearable data acquisition terminal and storage medium |
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