CN221007789U - FPGA core board IO port detection circuit and detection tooling - Google Patents
FPGA core board IO port detection circuit and detection tooling Download PDFInfo
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Abstract
本实用新型涉及一种FPGA核心板IO口检测电路,包括:数据选择子电路(1),与被测FPGA核心板(2)的IO口连接;指示子电路(3),与所述数据选择子电路(1)连接,用于指示IO口的高/低电平状态;计数子电路(4),分别与信号源和所述指示子电路(3)连接。与现有技术相比,本实用新型的计时子电路与数据选择子电路连接,能够选择当前测试的FPGA核心板IO口,最终通过指示子电路显示当前IO口的高低电平状态,测试人员通过观察当前IO口的高低电平状态判断是否故障。
The utility model relates to an FPGA core board IO port detection circuit, comprising: a data selection subcircuit (1), connected to the IO port of the FPGA core board (2) under test; an indication subcircuit (3), connected to the data selection subcircuit (1), used to indicate the high/low level state of the IO port; a counting subcircuit (4), respectively connected to a signal source and the indication subcircuit (3). Compared with the prior art, the timing subcircuit of the utility model is connected to the data selection subcircuit, and can select the FPGA core board IO port under test, and finally display the high and low level states of the current IO port through the indication subcircuit, and the tester can judge whether there is a fault by observing the high and low level states of the current IO port.
Description
技术领域Technical Field
本实用新型涉及检测电路技术领域,尤其是涉及一种FPGA核心板IO口检测电路和检测工装。The utility model relates to the technical field of detection circuits, in particular to an FPGA core board IO port detection circuit and a detection tool.
背景技术Background technique
随着集成电路技术的发展,芯片的集成度越来越高,芯片的测试工作量也相应增加。FPGA(Field-Programmable Gate Array)由于其可重复编程性、高灵活性等特点在复杂电路中使用情况越来越多,其稳定性是保证电路工作的重要因素。FPGA的IO(Input/Output)口故障检测是保证FPGA正常工作的重要步骤之一。之前的测试是依靠测试人员使用信号发生器、万用表和示波器等仪器来进行测试。以下是几种常见的背景技术:With the development of integrated circuit technology, the integration of chips is getting higher and higher, and the workload of chip testing is also increasing accordingly. FPGA (Field-Programmable Gate Array) is increasingly used in complex circuits due to its reprogrammability and high flexibility. Its stability is an important factor in ensuring the operation of the circuit. FPGA IO (Input/Output) port fault detection is one of the important steps to ensure the normal operation of FPGA. Previous tests relied on testers to use instruments such as signal generators, multimeters and oscilloscopes to perform tests. The following are several common background technologies:
端口扫描:该技术逐个扫描每个IO端口并读取其状态,从而检测出可能存在的故障。例如,可以使用JTAG接口扫描IO端口,并将扫描结果与预期值进行比较,以确定是否存在故障。该方法需要额外配置带有控制芯片的设备,成本较高。Port scanning: This technique scans each IO port one by one and reads its status to detect possible faults. For example, the JTAG interface can be used to scan the IO port and the scan result can be compared with the expected value to determine whether there is a fault. This method requires additional equipment with a control chip, which is costly.
电压和电流测试:通过测量芯片上各个端口的电压和电流,可以确定是否存在短路、断路或其他电气故障。这可以通过使用万用表或示波器来实现,但是每次智能检验一个端口,效率较低。Voltage and current testing: By measuring the voltage and current of each port on the chip, it is possible to determine whether there is a short circuit, open circuit or other electrical fault. This can be achieved by using a multimeter or oscilloscope, but it is inefficient to test one port at a time.
视觉检查:通过视觉检查芯片上的焊盘、引脚和连接器等部件的物理状态,可以确定是否存在松动、损坏或其他机械故障。这些技术通常需要结合使用,以确保可靠地检测到FPGA的IO口故障情况。这种测试方法测试效率低,速度较慢无法实现大规模大批量的测试。Visual inspection: By visually inspecting the physical state of components such as pads, pins, and connectors on the chip, it can be determined whether there is looseness, damage, or other mechanical failures. These techniques usually need to be used in combination to ensure that FPGA IO port failures are reliably detected. This test method has low test efficiency and slow speed and cannot achieve large-scale and large-volume testing.
现有的部分FPGA核心板IO口检测只能进行单IO口检测,每次检测完需要改变电路连接,非常不便。Some existing FPGA core board IO port detection can only perform single IO port detection, and the circuit connection needs to be changed after each detection, which is very inconvenient.
因此,当前缺少一种FPGA核心板IO口检测电路,以便操作人员方便、快速地对FPGA芯片IO口进行检查,从而避免因FPGA芯片故障阻碍板级验证或干扰问题定位。Therefore, there is currently a lack of an FPGA core board IO port detection circuit so that operators can easily and quickly check the FPGA chip IO port, thereby avoiding obstruction of board-level verification or interference problem location due to FPGA chip failure.
实用新型内容Utility Model Content
本实用新型的目的就是为了克服上述现有技术存在的缺陷而提供一种FPGA核心板IO口检测电路和检测工装。The purpose of the utility model is to provide an FPGA core board IO port detection circuit and detection tooling in order to overcome the defects of the above-mentioned prior art.
本实用新型的目的可以通过以下技术方案来实现:The purpose of the utility model can be achieved through the following technical solutions:
本实用新型的一个方面,提供了一种FPGA核心板IO口检测电路,包括:One aspect of the utility model provides an FPGA core board IO port detection circuit, comprising:
数据选择子电路,与被测FPGA核心板的IO口连接;The data selection subcircuit is connected to the IO port of the FPGA core board under test;
指示子电路,与所述数据选择子电路连接,用于指示IO口的高/低电平状态;An indication subcircuit, connected to the data selection subcircuit, for indicating a high/low level state of the IO port;
计数子电路,分别与信号源和所述指示子电路连接。The counting subcircuit is connected to the signal source and the indicating subcircuit respectively.
作为优选的技术方案,还包括:As a preferred technical solution, it also includes:
选通开关,公共端与所述计数子电路连接,两个选通端分别与波形发生器和手动触发子电路连接,所述波形发生器和/或手动触发子电路作为所述信号源。A strobe switch, a common end of which is connected to the counting subcircuit, and two strobe ends of which are respectively connected to the waveform generator and the manual trigger subcircuit, and the waveform generator and/or the manual trigger subcircuit serve as the signal source.
作为优选的技术方案,所述的计数子电路包括:As a preferred technical solution, the counting subcircuit includes:
计数器芯片,计数输出端与所述数据选择子电路连接,触发端与所述选通开关的公共端连接;A counter chip, wherein a counting output terminal is connected to the data selection subcircuit, and a trigger terminal is connected to the common terminal of the gating switch;
与非门,输入端为所述计数器芯片的计数输出端,输出端与所述计数器芯片的清零端连接。The NAND gate has an input end that is the counting output end of the counter chip and an output end that is connected to the reset end of the counter chip.
作为优选的技术方案,所述的手动触发子电路包括:As a preferred technical solution, the manual trigger subcircuit includes:
按键,与所述选通开关的一个选通端连接。A button is connected to a selection end of the selection switch.
作为优选的技术方案,所述的按键为Omron轻触按键。As a preferred technical solution, the button is an Omron touch button.
作为优选的技术方案,所述的数据选择子电路包括多个数据选择器芯片,所述数据选择器芯片的数据输入端与所述被测FPGA核心板的IO口连接,数据输出端与所述指示子电路连接,计数输入端与所述计数子电路连接。As a preferred technical solution, the data selection subcircuit includes multiple data selector chips, the data input end of the data selector chip is connected to the IO port of the FPGA core board under test, the data output end is connected to the indication subcircuit, and the counting input end is connected to the counting subcircuit.
作为优选的技术方案,所述的多个数据选择器芯片并行设置,所述的数据选择器芯片为8路数据选择器芯片。As a preferred technical solution, the multiple data selector chips are arranged in parallel, and the data selector chip is an 8-way data selector chip.
作为优选的技术方案,所述的指示子电路包括:As a preferred technical solution, the indication subcircuit includes:
LED灯,一端连接电源;LED light, one end is connected to the power supply;
三极管,集电极与所述LED灯的另一端连接,基极与所述数据选择子电路连接,发射极接地。The transistor has a collector connected to the other end of the LED lamp, a base connected to the data selection subcircuit, and an emitter connected to the ground.
作为优选的技术方案,还包括:As a preferred technical solution, it also includes:
供电子电路,分别与所述被测FPGA核心板和所述计数子电路连接。The power supply sub-circuit is connected to the FPGA core board under test and the counting sub-circuit respectively.
本实用新型的另一个方面,提供了一种检测工装,包括与被测FPGA核心板匹配的安装座以及上述的FPGA核心板IO口检测电路。Another aspect of the utility model provides a detection tool, including a mounting seat matching the FPGA core board to be tested and the above-mentioned FPGA core board IO port detection circuit.
与现有技术相比,本实用新型具有以下优点:Compared with the prior art, the utility model has the following advantages:
实现多IO口的灵活检测:本申请的计时子电路与数据选择子电路连接,能够选择当前测试的FPGA核心板IO口,最终通过指示子电路显示当前IO口的高低电平状态,测试人员通过观察当前IO口的高低电平状态判断是否故障。Realize flexible detection of multiple IO ports: The timing subcircuit of the present application is connected with the data selection subcircuit, which can select the FPGA core board IO port currently being tested, and finally display the high and low level status of the current IO port through the indication subcircuit. The tester can judge whether there is a fault by observing the high and low level status of the current IO port.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
图1为实施例中FPGA核心板IO口检测电路的示意图;FIG1 is a schematic diagram of an FPGA core board IO port detection circuit in an embodiment;
图2为实施例中选通开关和手动触发子电路的示意图;FIG2 is a schematic diagram of a gate switch and a manual trigger subcircuit in an embodiment;
图3为实施例中计数子电路的示意图;FIG3 is a schematic diagram of a counting subcircuit in an embodiment;
图4为实施例中数据选择子电路的示意图;FIG4 is a schematic diagram of a data selection subcircuit in an embodiment;
图5为实施例中指示子电路的示意图,FIG5 is a schematic diagram of an indication subcircuit in an embodiment,
其中,1、数据选择子电路,101、数据选择器芯片,2、FPGA核心板,3、指示子电路,301、LED灯,302、三极管,4、计数子电路,401、计数器芯片,402、与非门,5、选通开关,6、波形发生器,7、手动触发子电路,701、按键,8、供电子电路。Among them, 1. data selection subcircuit, 101. data selector chip, 2. FPGA core board, 3. indication subcircuit, 301. LED light, 302. transistor, 4. counting subcircuit, 401. counter chip, 402. NAND gate, 5. selection switch, 6. waveform generator, 7. manual trigger subcircuit, 701. button, 8. power supply subcircuit.
具体实施方式Detailed ways
下面将结合本实用新型实施例中的附图,对本实用新型实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例是本实用新型的一部分实施例,而不是全部实施例。基于本实用新型中的实施例,本领域普通技术人员在没有做出创造性劳动的前提下所获得的所有其他实施例,都应属于本实用新型保护的范围。The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are part of the embodiments of the utility model, not all of them. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the utility model.
实施例1Example 1
参见图1,本实施例提供了一种FPGA核心板IO口检测电路,包括Referring to FIG. 1 , this embodiment provides an FPGA core board IO port detection circuit, including
数据选择子电路1,与被测FPGA核心板2的IO口连接;The data selection subcircuit 1 is connected to the IO port of the FPGA core board 2 under test;
指示子电路3,与数据选择子电路1连接,用于指示当前对应的IO口的高/低电平状态;The indication sub-circuit 3 is connected to the data selection sub-circuit 1 and is used to indicate the high/low level state of the current corresponding IO port;
计数子电路4,分别与信号源和指示子电路3连接,通过改变信号源电平使内置的计数值改变,进而选择不同的IO口电平输出至指示子电路3。The counting subcircuit 4 is connected to the signal source and the indicating subcircuit 3 respectively, and changes the built-in counting value by changing the signal source level, thereby selecting different IO port levels to output to the indicating subcircuit 3.
参见图3为计数子电路4的示意图,包括:3 is a schematic diagram of a counting subcircuit 4, comprising:
计数器芯片401,计数输出端与数据选择子电路1连接,触发端与信号源连接;The counter chip 401 has a counting output terminal connected to the data selection sub-circuit 1 and a trigger terminal connected to the signal source;
与非门402,输入端为计数器芯片401的计数输出端,输出端与计数器芯片401的清零端连接。The NAND gate 402 has an input terminal that is the counting output terminal of the counter chip 401 , and an output terminal that is connected to the reset terminal of the counter chip 401 .
数据选择子电路1包括多个并行设置的数据选择器芯片101(本实施例中为8个),参见图4为其中一个数据选择器芯片101的示意图,数据选择器芯片101的数据输入端与被测FPGA核心板2的IO口连接,数据输出端与指示子电路3连接,计数输入端与计数子电路4连接。本实施例中,数据选择器芯片101采用8路数据选择器芯片。其余7个数据选择器芯片101除连接的FPGA核心板的IO口不同外其余连接方式类似。The data selection subcircuit 1 includes a plurality of data selector chips 101 (8 in the present embodiment) arranged in parallel, and referring to FIG4 for a schematic diagram of one of the data selector chips 101, the data input end of the data selector chip 101 is connected to the IO port of the FPGA core board 2 under test, the data output end is connected to the indication subcircuit 3, and the counting input end is connected to the counting subcircuit 4. In the present embodiment, the data selector chip 101 adopts an 8-way data selector chip. The remaining 7 data selector chips 101 are similar in connection mode except that the IO ports of the connected FPGA core boards are different.
参见图5为指示子电路的示意图,指示子电路3包括:LED灯301,一端连接电源,另一端连接三极管302的集电极,三极管302的基极与数据选择子电路1连接,发射极接地。5 is a schematic diagram of the indication subcircuit, the indication subcircuit 3 includes: an LED lamp 301, one end of which is connected to the power supply, and the other end is connected to the collector of a transistor 302, the base of the transistor 302 is connected to the data selection subcircuit 1, and the emitter is grounded.
供电子电路8,分别与被测FPGA核心板2和计数子电路4连接,本实施例中输入电压为DC12V,采用12V转5V的电源芯片及外围电路实现供电。The power supply sub-circuit 8 is connected to the FPGA core board 2 under test and the counting sub-circuit 4 respectively. In this embodiment, the input voltage is DC12V, and a 12V to 5V power supply chip and peripheral circuits are used to realize power supply.
实施例2Example 2
参见图1,在实施例1的基础上,本实施例的FPGA核心板IO口检测电路还包括:Referring to FIG. 1 , based on Example 1, the FPGA core board IO port detection circuit of this embodiment further includes:
选通开关5,其连接关系如图2所示,公共端与计数子电路4连接,两个选通端分别与波形发生器6和手动触发子电路7连接,波形发生器6和/或手动触发子电路7作为信号源,此时计数器芯片401的触发端与选通开关5的公共端连接。The connection relationship of the selection switch 5 is shown in Figure 2. The common end is connected to the counting sub-circuit 4, and the two selection ends are respectively connected to the waveform generator 6 and the manual trigger sub-circuit 7. The waveform generator 6 and/or the manual trigger sub-circuit 7 serve as signal sources. At this time, the trigger end of the counter chip 401 is connected to the common end of the selection switch 5.
参见图2,手动触发子电路7包括:Referring to FIG. 2 , the manual trigger subcircuit 7 includes:
按键701,与选通开关5的一个选通端连接。The button 701 is connected to an enabling terminal of the enabling switch 5 .
本实施例中按键701采用Omron轻触按键,优选的,按键701外围使用消抖、防静电电路。In this embodiment, the button 701 is an Omron touch button. Preferably, the periphery of the button 701 uses a debouncing and anti-static circuit.
FPGA核心板IO口检测电路的工作原理为:The working principle of the FPGA core board IO port detection circuit is:
操作人员先将被测FPGA核心板2上的需要测试的IO口与数据选择子电路1连接,本实施例中针对FPGA核心板的88个IO口进行测试,使88个IO口分别与8个数据选择器芯片101连接,然后通过选通开关5设置信号源,信号源可以是波形发生器6也可以是手动触发子电路7,信号源产生电平变化会使得计数子电路4中计数器芯片401内的计数值改变,进而使得数据选择子电路1选通的IO口改变,选通的IO口通过指示子电路3中LED灯301的亮和灭指示IO口的通断,与非门402的设置能够与计数器芯片401构成计数器保证当计数子电路4能够循环计数。The operator first connects the IO port to be tested on the FPGA core board 2 to the data selection subcircuit 1. In this embodiment, the 88 IO ports of the FPGA core board are tested, and the 88 IO ports are connected to 8 data selector chips 101 respectively. Then, the signal source is set through the selection switch 5. The signal source can be a waveform generator 6 or a manual trigger subcircuit 7. The level change generated by the signal source will cause the count value in the counter chip 401 in the counting subcircuit 4 to change, thereby changing the IO port selected by the data selection subcircuit 1. The selected IO port indicates the on and off of the IO port by turning on and off the LED light 301 in the indication subcircuit 3. The setting of the NAND gate 402 can form a counter with the counter chip 401 to ensure that the counting subcircuit 4 can count cyclically.
本申请通过设置选通开关,测试人员可以根据实际测试需要灵活选择自动触发和手动触发,在自动触发下由波形发生器产生触发信号,手动触发下由人工产生触发信号,触发信号进入计数子电路实现计数,接通下一个IO口。By setting a selection switch, the present application allows testers to flexibly select automatic triggering and manual triggering according to actual test needs. Under automatic triggering, the waveform generator generates a trigger signal, and under manual triggering, the trigger signal is manually generated. The trigger signal enters the counting subcircuit to realize counting and connect the next IO port.
实施例3Example 3
本实施例提供了一种检测工装,包括与被测FPGA核心板2匹配的安装座以及前文如实施例1或实施例2的FPGA核心板IO口检测电路。本实施例提供的检测工装能够省去FPGA核心板2的IO口与数据选择子电路1间的连接过程,直接将FPGA核心板2固定在安装坐上即可完成连接。将FPGA核心板1插入安装座,根据LED灯301的显示情况就可以直观判断核心板IO口的电平情况。The present embodiment provides a detection tool, including a mounting seat matching the FPGA core board 2 to be tested and the FPGA core board IO port detection circuit as described in the above embodiment 1 or embodiment 2. The detection tool provided in the present embodiment can save the connection process between the IO port of the FPGA core board 2 and the data selection subcircuit 1, and the connection can be completed by directly fixing the FPGA core board 2 on the mounting seat. The FPGA core board 1 is inserted into the mounting seat, and the level of the core board IO port can be intuitively judged according to the display of the LED light 301.
以上所述,仅为本实用新型的具体实施方式,但本实用新型的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本实用新型揭露的技术范围内,可轻易想到各种等效的修改或替换,这些修改或替换都应涵盖在本实用新型的保护范围之内。因此,本实用新型的保护范围应以权利要求的保护范围为准。The above is only a specific implementation of the utility model, but the protection scope of the utility model is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed by the utility model, and these modifications or replacements should be included in the protection scope of the utility model. Therefore, the protection scope of the utility model should be based on the protection scope of the claims.
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| CN120294544A (en) * | 2025-06-10 | 2025-07-11 | 杭州广立微电子股份有限公司 | Low pin count chip test circuit, test method and equipment |
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Effective date of registration: 20250211 Address after: 200233, 1st and 4th floors, Building 8, No. 1001 Qinzhou North Road, Xuhui District, Shanghai Patentee after: Shanghai Shende Wuchuang Era Medical Technology Co.,Ltd. Country or region after: China Patentee after: Qinhuangdao Shende Noninvasive Era Medical Equipment Co.,Ltd. Address before: 200233, 1st and 4th floors, Building 8, No. 1001 Qinzhou North Road, Xuhui District, Shanghai Patentee before: Shanghai Shende Wuchuang Era Medical Technology Co.,Ltd. Country or region before: China Patentee before: Nantong Shende medical equipment Technology Co.,Ltd. Patentee before: Shen De (Ningbo) medical equipment Technology Co.,Ltd. |