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DE112018001405T5 - Leistungsumsetzvorrichtung - Google Patents

Leistungsumsetzvorrichtung Download PDF

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Publication number
DE112018001405T5
DE112018001405T5 DE112018001405.3T DE112018001405T DE112018001405T5 DE 112018001405 T5 DE112018001405 T5 DE 112018001405T5 DE 112018001405 T DE112018001405 T DE 112018001405T DE 112018001405 T5 DE112018001405 T5 DE 112018001405T5
Authority
DE
Germany
Prior art keywords
current
conversion device
temperature
power conversion
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE112018001405.3T
Other languages
German (de)
English (en)
Inventor
Naoki Sakurai
Takashi Ogawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of DE112018001405T5 publication Critical patent/DE112018001405T5/de
Granted legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M7/00—Conversion of AC power input into DC power output; Conversion of DC power input into AC power output
    • H02M7/42—Conversion of DC power input into AC power output without possibility of reversal
    • H02M7/44—Conversion of DC power input into AC power output without possibility of reversal by static converters
    • H02M7/48—Conversion of DC power input into AC power output without possibility of reversal by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Inverter Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Power Conversion In General (AREA)
DE112018001405.3T 2017-04-19 2018-02-27 Leistungsumsetzvorrichtung Granted DE112018001405T5 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2017082909A JP6861079B2 (ja) 2017-04-19 2017-04-19 電力変換装置
JP2017-082909 2017-04-19
PCT/JP2018/007271 WO2018193720A1 (fr) 2017-04-19 2018-02-27 Dispositif de conversion de puissance

Publications (1)

Publication Number Publication Date
DE112018001405T5 true DE112018001405T5 (de) 2019-12-19

Family

ID=63857049

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112018001405.3T Granted DE112018001405T5 (de) 2017-04-19 2018-02-27 Leistungsumsetzvorrichtung

Country Status (3)

Country Link
JP (1) JP6861079B2 (fr)
DE (1) DE112018001405T5 (fr)
WO (1) WO2018193720A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021253064A3 (fr) * 2020-06-16 2022-02-10 Avl List Gmbh Système de mesure pour un convertisseur et ensemble convertisseur

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102572754B1 (ko) 2018-09-26 2023-08-29 가부시키가이샤 지씨 치과용 조성물
WO2025197297A1 (fr) * 2024-03-22 2025-09-25 パナソニックＩｐマネジメント株式会社 Circuit de réception de puissance
CN119199462B (zh) * 2024-11-29 2025-03-14 青岛中微创芯电子有限公司 一种rc-igbt的电气特性测试方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0936356A (ja) 1995-07-18 1997-02-07 Fuji Electric Co Ltd 温度検知部内蔵型バイポーラ半導体素子の使用方法
JP2013142704A (ja) 2012-01-11 2013-07-22 Abb Research Ltd Ｉｇｂｔデバイスの動作状態を実時間で監視するシステムと方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0556553A (ja) * 1991-08-20 1993-03-05 Okuma Mach Works Ltd Ｉｇｂｔのゲートドライブ回路
US7522434B2 (en) * 2005-10-27 2009-04-21 Wisconsin Alumni Research Foundation Temperature estimation based on a signal oscillation
JP4862616B2 (ja) * 2006-11-08 2012-01-25 日産自動車株式会社 電力変換装置
JP5037368B2 (ja) * 2008-01-11 2012-09-26 アルパイン株式会社 温度検出装置及び方法、並びに回路
JP5294335B2 (ja) * 2010-06-18 2013-09-18 三菱電機株式会社 半導体装置
JP6162639B2 (ja) * 2014-04-22 2017-07-12 トヨタ自動車株式会社 温度算出装置
JP2017123704A (ja) * 2016-01-05 2017-07-13 株式会社日立製作所 電力変換装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0936356A (ja) 1995-07-18 1997-02-07 Fuji Electric Co Ltd 温度検知部内蔵型バイポーラ半導体素子の使用方法
JP2013142704A (ja) 2012-01-11 2013-07-22 Abb Research Ltd Ｉｇｂｔデバイスの動作状態を実時間で監視するシステムと方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021253064A3 (fr) * 2020-06-16 2022-02-10 Avl List Gmbh Système de mesure pour un convertisseur et ensemble convertisseur
KR20230024403A (ko) * 2020-06-16 2023-02-20 아페엘 리스트 게엠바흐 인버터용 측정 조립체 및 인버터 조립체
US12255553B2 (en) 2020-06-16 2025-03-18 Avl List Gmbh Measuring assembly for an inverter and inverter assembly
KR102841672B1 (ko) * 2020-06-16 2025-08-04 아페엘 리스트 게엠바흐 인버터용 측정 조립체 및 인버터 조립체

Also Published As

Publication number Publication date
WO2018193720A1 (fr) 2018-10-25
JP6861079B2 (ja) 2021-04-21
JP2018179878A (ja) 2018-11-15

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