JP2000356707A - Anti-reflection film and display device having the anti-reflection film - Google Patents

Abstract

(57) [Summary] [Object] To provide a high-performance antireflection film with low reflection over a wide visible wavelength region, and a display device provided with the same. [Structure] A film containing a dye having an absorption peak in a near infrared region of 700 to 900 nm or a dye having an absorption peak in a region of 600 to 700 nm, or a film containing both of them, is provided immediately below. An antireflection film having a laminated film of a film containing a dye having an absorption peak in a region of 600 nm and utilizing a change in reflectance due to anomalous refractive index dispersion of the dye-containing film. [Effect] The refractive index of the layer immediately below the uppermost layer is abnormally dispersed due to the absorption of the red dye, and the refractive index of the dye having absorption in the near-infrared region of the uppermost layer, the blue dye, or a layer containing both of them. By this balance, an antireflection film having low reflection over the entire visible light region can be produced (FIG. 1, curve 1). Further, a red dye having an absorption peak in the region of 500 to 600 nm contained in the layer immediately below the uppermost layer absorbs green and red side bands, and improves color purity.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a surface treatment film, and more particularly to an antireflection film or a reflection antistatic film provided on a front surface of a face plate of a display device such as a cathode ray tube.

[0002]

2. Description of the Related Art In recent years, as a part of improving the performance of a display device, for example, a cathode ray tube, an anti-reflection film which forms a single layer or a laminated optical thin film on the front surface of a face plate and prevents external light reflection by a light interference effect has been developed. The formed one has been produced.
As the antireflection film, a film generally called a quarter-wave film is used. When the refractive index of air is n ₀ , the refractive index and film thickness of the antireflection film are n ₁ and d, the refractive index of the substrate is n ₂ , and the wavelength at which reflection is to be prevented is λ, A single-layer film that satisfies the conditions (1) and (2) is used.

[0003] _{n 1 d = λ / 4 (} 1) n 1 2 = n 0 n 2 (2) However, in the case of using the glass as a substrate, n ₂ is 1.5
2 and n ₀ is 1.0, which is the refractive index of air, so that the refractive index n ₁ of the antireflection film must be 1.23. However, since a substance having a refractive index of 1.23 is not known at present, a film having a sufficient antireflection effect cannot be produced with a single-layer film.

Conventionally, as shown in the schematic cross-sectional view of FIG. 2, a laminated anti-reflection film in which a two-layer film composed of an upper film 3 and a lower film 4 is laminated on a substrate 5 is generally used. When the light beam 10 is incident on the laminated anti-reflection film, the reflected light 11 at the interface between the air and the upper film 3, the reflected light 12 at the interface between the upper film 3 and the lower film 4, and the reflected light 13 at the interface between the lower film and the substrate 5.
And the actual reflected light 14 is the reflected light 1
1, 12, and 13 are combined. The laminated anti-reflection film has a refractive index of air of n ₀ , a refractive index of the substrate 5 of n ₂ , a refractive index and a film thickness of the upper layer film 3 of the laminated anti-reflection film of n ₃ , respectively.
Assuming that d ₃ , the refractive index and the film thickness of the lower film 4 are n ₄ and d ₄ , respectively, and the wavelength for which reflection is to be prevented is λ, the following conditions (3) to (5) are satisfied: A layer film is used.

[0005] _{n 3 d 3 = λ / 4} (3) n 4 d 4 = λ / 4 (4) n 2 n 3 2 = n 0 n 4 2 (5) Therefore, when using a glass substrate, n ₂ is Since it is 1.52 and n ₀ is 1.0, which is the refractive index of air, a high refractive index / low refractive index film such that the refractive index ratio of the upper and lower antireflection films is 1.23. Choose a combination of Further, since the film thickness is determined by the wavelength of the light whose reflection is to be prevented, the reflectance of N wavelengths can be reduced by forming an N-layer antireflection film.

[0006] A high-quality television cathode-ray tube in which a wavelength selective absorption film (optical filter) is formed on the front surface of a face plate has been manufactured. This filter selectively absorbs light of a certain wavelength with this filter to prevent reflection, and also absorbs the sideband of the phosphor emission spectrum, which is the cause of color purity degradation, to improve contrast and color purity. It is. Usually, an organic dye-glass gel composite film produced by a sol-gel method is used for this filter (Japanese Patent Application Laid-Open No. 1-320742). This is formed by applying a sol solution in which an organic dye is mixed and then performing a heat treatment.

[0007] Further, there are also known ones in which conductive fine particles such as tin oxide are contained in the film to have an antistatic effect, and those in which a laminated film is formed to have antireflection and antistatic effects. (JP-A-4-218247). Further, a method is known in which at least one layer of the laminated film contains a dye having absorption in the entire visible light wavelength range of 400 to 700 nm, thereby increasing the refractive index in the entire visible light wavelength range and reducing the reflectance. (Japanese Patent Laid-Open No. 6-208003)
No.). In order to improve the contrast, a method has been proposed in which a pigment having a reflection spectrum close to the emission spectrum of the phosphor is applied to the phosphor. According to this method, the light emitted from the phosphor is hardly absorbed, and the outside light is reduced because light outside the reflection region is absorbed, and the contrast is improved.
This method has been practiced with blue and red phosphors.

[0008]

As described above, an antireflection film utilizing a light interference effect by forming a laminated film having a low refractive index / high refractive index or a multilayer film of these on a substrate is well known. Have been. At this time, if the refractive index difference between the upper and lower layers is small, a relatively flat spectral reflectance curve can be obtained over the entire visible light range, but the reflection at the bottom wavelength cannot be sufficiently reduced. Conversely, if the difference between the refractive indices of the upper and lower layers is large, the reflectance at the bottom wavelength can be reduced, but the spectral reflectance curve rises sharply as the wavelength deviates from the bottom wavelength, causing the problem of screen glare. there were.

In recent years, a low-resistance film is often used as a lower film from the viewpoint of improving the antistatic effect. However, since a low-resistance film generally has a high refractive index, the refractive index difference from the upper film is large. The glare of the screen becomes a big problem.
Further, when a dye is doped in either layer of the laminated antireflection film, there is a disadvantage that the reflectance of the film abnormally changes in a specific region. Furthermore, water,
Organic dyes such as azo dyes and anthraquinone dyes which are very soluble in solvents such as alcohols are used. For this reason, when the surface of the cathode ray tube is wiped with a cloth containing water or alcohol after the film is formed, there is a disadvantage that the organic dye oozes out.

In an organic dye-containing film having an antireflection effect and an antistatic effect, a sol solution of conductive fine particles such as tin oxide and silicon oxide containing an organic dye is applied and formed on the surface of a cathode ray tube. A sol solution of silicon oxide alone is applied to form a layered film.Since the sol solution of silicon oxide alone contains a large amount of alcohol and water as solvents, the lower organic dye seeps into the upper layer and abnormal refractive index dispersion occurs. There is a problem that the reflectance causes an abnormality in the reflectance. In the method disclosed in JP-A-6-208003, since the refractive index increases in the entire visible light region, the refractive index difference between the upper and lower layers increases, and as described above, the bottom wavelength of 5
Compared to the reflectance near 60 nm, the reflectance around 400 nm and 7
There is a problem that the reflectance around 00 nm becomes an abnormally high film.

An object of the present invention is to provide an anti-reflection film having an anti-reflection effect in a wide wavelength range by solving the above-mentioned problems of the prior art, and to provide a high contrast, anti-static effect and reflection using the film. An object of the present invention is to provide a display device having a prevention effect.

[0012]

According to the present invention, a laminated antireflection film capable of realizing a high antireflection effect in a wide wavelength range is obtained by positively utilizing the refractive index dispersion of the film. That is, the antireflection film of the present invention has a laminated structure in which two thin films are stacked, and the two thin films have a large refractive index difference on the long wavelength side with respect to the center wavelength of the wavelength region to be antireflective, and have a short refractive index. It is characterized by having a refractive index dispersion such that the refractive index difference is small on the wavelength side. For example, in order to obtain an antireflection film in which reflection is suppressed in the entire visible light region, 56
A layer having a large difference in refractive index near 0 nm and a small difference in refractive index near 400 nm may be stacked.

Further, the antireflection film of the present invention has a laminated structure in which two thin films are laminated, and the two thin films have a high refractive index on the long wavelength side and a high refractive index on the short wavelength side in a wavelength region to be antireflective. It is characterized by having a refractive index dispersion such that the refractive index is low.
Further, the antireflection film of the present invention has a laminated structure in which two layers of thin films are laminated, and the two-layer thin film has an optical path length of about a quarter wavelength at each wavelength in a wavelength region to be antireflection, and It has a refractive index dispersion such that the ratio of the refractive index at each wavelength is substantially constant.

A film having a desired refractive index dispersion can be obtained by utilizing anomalous dispersion of the refractive index of a substance having absorption, that is, by incorporating a dye having an absorption peak in a predetermined wavelength region into the film. . More specifically,
The antireflection film according to the present invention has a multilayer structure in which at least two thin films are stacked, and the uppermost film and the film immediately below the uppermost film contain different types of dyes.
Here, the refractive index of the uppermost film is set smaller than the refractive index of the film immediately below. The dye contained in the uppermost film is
A dye having an absorption in the near infrared region of 700 to 900 nm, or a dye having an absorption peak in the region of 600 to 700 nm,
Or both. The dye contained in the film immediately below the uppermost layer is preferably a dye having an absorption peak in the range of 500 to 600 nm.

It is preferable that at least one layer of the multilayer film has conductivity, and the film having conductivity is preferably a high refractive index film immediately below the uppermost layer. As a specific embodiment of the antireflection film, an antireflection film in which a film immediately below the uppermost layer is conductive and contains a substance having an absorption peak in a region of 500 to 600 nm, a film of the uppermost layer Is 700 ~
An anti-reflection film containing a substance having an absorption peak in a near-infrared region of 900 nm, a substance having an absorption peak in a region of 600 to 700 nm, or both, and a film immediately below the uppermost layer being a conductive film. 700-900n for the uppermost layer
m, a substance having an absorption peak in the near infrared region, or 600 to
An antireflection film containing a substance having an absorption peak in a region of 700 nm or both thereof, a film immediately below the uppermost layer is a film containing a substance having an absorption peak in a region of 500 to 600 nm, and the film of the uppermost layer is 700 A material having an absorption peak in the near infrared region of ~ 900 nm, or a material having an absorption peak in the region of 600-700 nm, or both, and the film immediately below the top layer has an absorption peak in the region of 500-600 nm. An antireflection film or the like, which is a film containing a substance having conductivity and having conductivity.

Further, the antireflection film according to the present invention has a multilayer structure in which at least two thin films are stacked, and an odd-numbered film counted from above contains a substance having an absorption peak in a region of 300 to 400 nm. It is characterized by. In any of the above antireflection films, the layer immediately below the uppermost layer is Sn
O ₂ , ZnO, or ITO can be included.

The film of each layer is preferably formed by applying and forming a coating solution mainly containing a solvent in which the dye contained in the layer adjacent thereto does not dissolve or disperse well. 700
As the substance having an absorption peak in the near infrared region of about 900 nm, naphthalocyanine dyes such as brilliant cresyl blue and silicon naphthalocyanine, anthraquinone dyes, and polymethine dyes can be used. 60
As the substance having an absorption peak in the range of 0 to 700 nm, a phthalocyanine dye such as copper phthalocyanine or a phenoxazine dye such as methylene green can be used. Substances having an absorption peak in the range of 500 to 600 nm include azo dyes such as acid red, anthraquinone dyes such as alizarin red S, triphenylmethane dyes such as crystal violet, and xanthene dyes such as rhodamine B. Can be used. 300-40
As a substance having an absorption peak in a region of 0 nm, a phthalocyanine dye such as copper phthalocyanine, a benzophenone dye, or the like can be used.

The pigment used may be either a dye or a pigment. When a pigment is used, the pigment has a dispersed particle size of 100%.
It is desirable to set it to nm or less. For example, a pigment close to acid red is a quinacridone pigment. Phthalocyanine and naphthalocyanine dyes include those in which various substituents are introduced into a compound to increase the solubility in addition to the use as a pigment. Examples of the infrared absorber include anthraquinone-based compounds and polymethine-based compounds. When these antireflection films are formed on the surface of a display device such as a cathode ray tube, a high-definition display device can be obtained.

[0019]

[Function] Substances having absorption in a specific wavelength region, such as dyes,
It is well known that the refractive index is abnormally dispersed in the absorption region. This is a principle that can be theoretically predicted from the following equation (6), which generally indicates the refractive index of a substance having absorption.

[0020]

(Equation 1)

From the above equation (6), since the value of k is not 0 for a film having absorption, the refractive index changes depending on the magnitude of absorption. Therefore, when a dye is doped into one of the low refractive index / high refractive index laminated films, the reflectance is abnormal in the absorption wavelength region of the dye as compared with the reflectance of the laminated film not doped with the dye. Changes to This is an essential problem,
On the other hand, it is suggested that a film having a low reflectance can be formed over the entire visible light region by using anomalous dispersion of the refractive index.
That is, the present invention is based on the consideration that a film having a low reflectance can be formed over a wide wavelength range by forming the following film.

First, considering the two-layer antireflection film shown in FIG. 2 formed on glass, from the above equations (3) to (5), n
_{4 / n 3 = 1.23, n} 3 d 3 = λ 0/4, n 4 d 4 = λ 0/4
Is zero at a wavelength λ ₀ that satisfies the following condition, but the reflectance increases as the incident wavelength deviates from λ ₀ . Therefore, the curve of the reflectivity is usually V-shaped with λ ₀ as the bottom. At this time, the amplitude of the reflected light 11 at the interface between the air and the upper film 3 is (n ₀ −n ₃ ) / (n ₀ + n ₃ ).
The amplitude of the reflected light 12 at the interface between the upper film 3 and the lower film 4 is (n ₃ −n ₄ ) / (n ₃ + n ₄ ), and the amplitude of the reflected light 13 at the interface between the lower film 4 and the substrate 5 is _{(n 4 -n 2) / (} n 4 + n 2)
It is represented by The phase of the reflected light 12 at the interface between the upper film 3 and the lower film 4 is 4πn ₃ d ₃ / λ, and the phase of the reflected light 13 at the interface between the lower film 4 and the substrate 5 is 4πn ₄ d ₄ / λ. It is represented by Therefore, if the wavelength changes, the phase of the reflected light also changes,
Depending on a certain wavelength, the phases of the reflected lights from the respective interfaces coincide with each other, and as a result, the reflection may be enhanced. In order to prevent this phase shift, the refractive index of the thin film may be changed according to the wavelength. Generally, the wavelength λ _{0 at} which the reflection is to be suppressed most is
On the shorter wavelength side, the phase shift is smaller as the difference between n ₃ and n ₄ is smaller, and on the longer wavelength side, the phase shift is smaller as the difference between n ₃ and n ₄ is larger. However, since the change in the refractive index affects not only the phase but also the amplitude, it must be carefully set.

Considering the requirement to go one step further and reduce the reflectance to zero at all wavelengths in the wavelength region where it is desired to prevent reflection, the non-reflection conditions of the above equations (3) to (5) are satisfied at all wavelengths. Is to meet. This requirement can be satisfied if a film whose refractive index changes continuously depending on the wavelength can be obtained as shown in FIG. By controlling the refractive index using the absorption by the dye described above, FIG.
In order to obtain such a refractive index dispersion as shown in FIG. 4, a dye having absorption over the entire visible light may be mixed as shown in FIG.
However, even without actually using such a dye having one broad absorption, for example, as shown schematically in FIG. 5, it is necessary to adjust the concentration to include various kinds of dyes having different absorption peaks. Can have the same effect as above.

Next, as a simple model of a laminated anti-reflection film for the visible wavelength region, in a film having a layer structure in which two thin films are laminated (low-refractive-index film / high-refractive-index film), an upper film and a lower film are respectively provided. A system including another type of dye having a different absorption peak will be described with reference to FIG. In the figure, 3 is a lower refractive index upper layer film, 4 is a high refractive index lower layer film, and 5 is a substrate. Upper layer film 3
Has a refractive index of 1.46 when no dye is contained, and the dye contained in the film includes a dye having an absorption peak in the near infrared region of 700 to 900 nm and a dye having an absorption peak in the region of 600 to 700 nm. I do. The pigment contained in the lower layer film 4 is 500
A red dye having an absorption peak in the region of -600 nm. The refractive index of the lower layer film 4 when no dye is contained is 1.8. When the refractive index of the upper layer of this laminated film shows absorption as shown in FIG. 6 (a) due to the inclusion of the dye, the effect of the absorption of the dye causes the length of the refractive index to be centered on each absorption peak as shown in FIG. 6 (b). Abnormal dispersion occurs such that the refractive index increases on the wavelength side and decreases on the short wavelength side. Also, the refractive index of the lower layer,
7A, when the absorption is as shown in FIG. 7A, the refractive index becomes large on the long wavelength side with respect to each absorption peak, and on the short wavelength side, as shown in FIG. Anomalous dispersion such as becoming smaller. Therefore, a film having a high refractive index on the high wavelength side in the visible region and a low refractive index on the low wavelength side can be obtained.

A low-refractive-index / high-refractive-index film is laminated, and a dye is placed above and below the laminated film that suppresses reflection by utilizing the light interference effect. The simulation results show that the effect of the anomalous dispersion can be suppressed to a low level over the entire visible wavelength region as shown by the spectral reflectance curve 1 shown in FIG. Here, the spectral reflectance curve 2 is for a dye-free laminated film. By incorporating a dye, a film having a very low reflection can be produced over the entire visible region.

Here, the pigment contained in the uppermost layer is 700 to
Even if one of the dye having an absorption peak in the near-infrared region of 900 nm and the dye having an absorption peak in the region of 600 to 700 nm, it is possible to realize an antireflection effect superior to that when no dye is contained. it can. However, for example, 6
When only a dye having an absorption peak is mixed in the region of 00 to 700 nm, a sufficient antireflection effect can be realized in the visible light region of 600 nm or less, but the reflectance around 600 to 700 nm is lower than that in the case where the dye is not contained. However, there is a problem that is slightly increased. Also, 700-900
In the case where only a dye having an absorption peak in the near-infrared region of nm is mixed, there is a problem that the reflectance at around 560 nm where reflection is to be suppressed most cannot be sufficiently reduced. Therefore, it is most effective and desirable to simultaneously mix both a dye having an absorption peak in the near infrared region of 700 to 900 nm and a dye having an absorption peak in the region of 600 to 700 nm.

For example, silicon naphthalocyanine as a dye having an absorption in the near infrared region of 700 to 900 nm, 6
Copper phthalocyanine is used as a dye having an absorption peak between 00 and 700 nm, and Acid Red is used as a dye having an absorption peak between 500 and 600 nm.
_{When the two-} system film and the lower layer are made of an ITO-based film, an effect of preventing reflectance in the entire visible region is actually obtained as shown by a spectral reflectance curve 1 shown in FIG.

Here, the order of lamination of the layers containing the dye is as follows.
Some are optimal depending on the type of dye to be added. For example, when a red dye having absorption at 500 to 600 nm is brought to the uppermost layer, the refractive index at around 600 nm increases due to the influence of the absorption peak at around 560 nm.
The reflectance around 600 nm becomes abnormally high. However, copper phthalocyanine having an absorption around 650 nm is
Since it acts to lower the refractive index of 600 nm or less, a material having a low reflectance can be obtained. As described above, if the order of the layers in which the dyes are mixed is apologized, there is a possibility that the effect may be adversely affected.

Further, light near 560 nm, which has the highest human luminous sensitivity, is absorbed by the absorption of the red dye. Also, this is a display device using a phosphor such as a cathode ray tube,
It also works to absorb the phosphor sidebands. If the lower layer is made of a conductive film, it also has an antistatic effect.
In preparing these laminated films, it is necessary to add independent dyes to the upper and lower films. this is,
This means that when a laminated film is produced, no bleeding of the dye should occur in each layer. For this reason, when the uppermost layer film is formed by applying and forming a coating solution mainly containing a solvent in which the dye contained in the layer immediately below does not dissolve or disperse well, the lower dye may seep to the upper part. No control of refractive index. The layer immediately below the uppermost layer is formed by applying and forming a coating solution mainly containing a solvent in which the dye contained in the uppermost layer does not dissolve or disperse well. Control of the refractive index is easy.

A film containing SiO ₂ as a main component and a dye and a blue dye having absorption in the near infrared region, and a dye and a blue dye having conductivity immediately below and having absorption in the near infrared region are formed. A CRT having at least two layers of a conductive film formed by applying a coating solution containing a solvent that does not dissolve or disperse well as a main component on the outermost surface is also shown in FIG.
As shown in the above, a CRT with lower reflection over the entire visible light region than the conventional CRT can be obtained.

If the layer immediately below the uppermost layer contains SnO ₂ , ZnO or ITO, it acts as a high refractive index film. Since these films have conductivity, they can also have an antistatic effect. This conductive film is desirably a layer immediately below the uppermost layer. This is because the refractive index of a conductive film is generally classified into a larger one among oxide-based materials. Therefore, when a two-layer film on glass is considered, the refractive index of the lower layer must be larger than that of the upper layer in order for the ratio to be 1.23.

In addition, the effect of the pigment mixture is only for the even-numbered
Or, it is also observed when a dye is added to only odd-numbered films. A film having a multilayer structure in which at least two thin films are stacked is provided on the surface, and an odd-numbered film counted from the top has a thickness of 300 to
When an antireflection film containing a substance having an absorption peak in the region of 400 nm is manufactured, reflection at around 400 nm can be suppressed even if the layer immediately below does not contain a red pigment. This is because, when an absorption peak is in the region of 300 to 400 nm, the refractive index near 400 nm on the longer wavelength side becomes larger, and as a result, the difference in refractive index from the underlying high refractive index film becomes smaller. .

The principle described above for obtaining a high-performance antireflection film can be applied not only to a film having a two-layer structure but also to a film having a multilayer structure. However, the layer in which the dye is mixed is desirably a layer as close to the uppermost layer as possible. Because, when external light is incident on the anti-reflection film and reflected at the interface with the lower layer, the reflection at the interface between the uppermost layer and the layer immediately below it is the largest, and as the light progresses to the lower layer, it becomes smaller in order. Become. Therefore, the effect of the incorporation of the dye is most remarkably exhibited when it is added to the uppermost layer and the layer immediately below.

[0034]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to examples. EXAMPLE 1 Si in a weight ratio _{(OC 2 H 5) 4:} H 2 O: HNO
₃ : A solution of THF = 2: 1: 0.1: 20 was prepared, and silicon naphthalocyanine having an absorption peak in the near infrared region of 700 nm to 900 nm was added thereto.
Copper phthalocyanine having an absorption peak at 0 nm was mixed so as to be 0.18% by weight. Acid red having an absorption peak between 500 nm and 600 nm was mixed with ethanol in which ITO fine particles having a particle diameter of 20 nm were dispersed so that the weight became 0.06%.

This acid red-containing ITO solution was spin-coated at 150 rpm on the surface of a cathode ray tube, dried, and then dried with silicon naphthalocyanine and copper phthalocyanine-containing SiO _2.
The solution was spin coated at 150 rpm. At this time, the phthalocyanine and naphthalocyanine dyes are well dispersed in THF but are hardly dispersed in ethanol, and acid red is dissolved in ethanol but hardly dissolved in THF. It did not seep into other layers. After the film formation, heat treatment was performed at 160 ° C. for 30 minutes.

FIG. 8 shows a sectional view of the produced cathode ray tube. In the figure, 6 is a SiO ₂ film containing silicon naphthalocyanine and copper phthalocyanine, and 7 is ITO containing acid red.
Reference numeral 8 denotes a cathode ray tube. Each film thickness is about 100
nm. FIGS. 6A and 6B show the transmittance and the refractive index of the film on the outermost surface of the cathode ray tube. FIGS. 7A and 7B show the transmittance and the refractive index of the second film from the outermost surface.

FIG. 1 shows the spectral reflectance curve of this CRT.
Is shown by curve 1. Curve 2 in FIG. 1 is the spectral reflectance curve of a CRT with the same antireflection film containing no dye as in the present example. As is clear from FIG. 1, the cathode ray tube of the present embodiment does not show an extreme V-shaped reflection curve, which is a problem when no dye is mixed in each layer, although the refractive index of the lower layer is sufficiently low. It had very little reflection over the entire visible light region, and had high definition without side bands around 560 nm. In addition, this cathode ray tube had a low surface resistance of the order of 10 ⁵ Ω / □ because the ITO fine particles had conductivity, and also had an antistatic effect.

Further, methylene green or brilliant cresyl blue is used in place of copper phthalocyanine, alizarin red, crystal violet or quinacridone is used in place of acid red, and anthraquinone or polymethine is used in place of silicon naphthalocyanine. An antireflection film was produced in the same manner as described above. The concentration of each dye is 0.06 wt%, and the film thickness is about 100 n
m. FIG. 9 shows the reflection spectra of various antireflection films thus produced. In the drawing, curve 21 is a reflectance curve of a laminated film in which azaline red is mixed in the lower layer, methylene green and anthraquinone are mixed in the upper layer, and curve 22 is a reflection of a laminated film in which crystal violet is mixed in the lower layer and brilliant cresyl blue and polymethine are mixed in the upper layer. Rate curve, curve 23
Is a reflectance curve of a laminated film in which quinacridone is mixed in the lower layer and methylene green and polymethine are mixed in the upper layer. As can be seen from FIG. 9, a film having excellent reflection characteristics can be obtained using any dye as long as the dye has the same absorption peak position.

Example 2 Si (OC ₂ H ₅ ) _{4 in} weight ratio:
A solution of H ₂ O: HNO ₃ : THF = 2: 1: 0.1: 20 was prepared, and copper phthalocyanine having an absorption peak between 600 nm and 700 nm was mixed therein to be 0.18% by weight. did. Further, 5% by weight of ethanol was dispersed in ethanol in which ITO fine particles having a particle diameter of 20 nm were dispersed so as to be 0.06%.
Acid red having an absorption peak between 00 nm and 600 nm was mixed.

The ITO solution containing acid red was spin-coated on the outermost surface of the cathode ray tube at 150 rpm, and after drying, the SiO ₂ solution containing copper phthalocyanine was spin-coated at 150 rpm. At this time, the phthalocyanine dye is well dispersed in THF but hardly dispersed in ethanol, and acid red is dissolved in ethanol but hardly dissolved in THF. It did not seep. After the film formation, heat treatment was performed at 160 ° C. for 30 minutes. The thickness of each layer was about 100 nm.

FIGS. 10A and 10B show the transmittance and the refractive index of the film on the outermost surface of the cathode ray tube. As shown in FIG. 11, the CRT had very little reflection in a region of 600 nm or less and had high definition without a side band around 560 nm. In addition, this cathode ray tube is IT
Surface resistance is 10 ⁵ Ω / □ because O particles are conductive
It was as low as a table and had an antistatic effect.

Example 3 Si (OC ₂ H ₅ ) _{4 by} weight ratio:
A solution of H ₂ O: HNO ₃ : THF = 2: 1: 0.1: 20 was prepared, and silicon naphthalocyanine having an absorption peak between 700 nm and 900 nm was added thereto in an amount of 0.18 by weight.
%. In addition, ITO having a particle size of 20 nm
Rhodamine B having an absorption peak between 500 nm and 600 nm was mixed with ethanol in which the fine particles were dispersed so as to be 0.06% by weight.

This rhodamine B-containing ITO solution was spin-coated at 150 rpm on the top surface of a cathode ray tube, dried, and then silicon naphthalocyanine-containing SiO ₂ solution was rolled at 150 rpm.
And spin coated. At this time, the naphthalocyanine dye is T
The pigment in each layer was well dispersed in HF but hardly dispersed in ethanol, and the rhodamine dye was soluble in ethanol but hardly dissolved in THF, so that the dye in each layer did not seep into other layers. . After film formation, 1
Heat treatment was performed at 60 ° C. for 30 minutes. Each film thickness is about 10
It was 0 nm.

FIGS. 12A and 12B show the transmittance and the refractive index of the film on the outermost surface of the cathode ray tube. The transmittance and the refractive index of the second layer were the same as in FIGS. 7A and 7B. As shown in FIG. 13, this CRT had high reflection with little reflection over the entire visible light range and no side band near 560 nm. Also, this CRT is I
Since the TO fine particles have conductivity, the surface resistance is 10 ⁵ Ω.
/ □ low, and also had an antistatic effect.

Example 4 Si (OC ₂ H ₅ ) _{4 in} weight ratio:
A solution of H ₂ O: HNO ₃ : THF = 2: 1: 0.1: 20 was prepared, and silicon naphthalocyanine having an absorption peak between 700 nm and 900 nm was added thereto.
Copper phthalocyanine having an absorption peak between 700 nm was mixed so as to be 0.18% by weight. Also, by weight ratio, Ti (OC ₃ H ₇ ) ₄ : H ₂ O: HNO ₃ : Et.
A solution of OH = 3: 1: 0.1: 20 was prepared.

This TiO ₂ solution is applied to the top surface of the cathode ray tube by 1
After spin-coating at 50 rpm and drying, the SiO ₂ solution containing silicon naphthalocyanine and copper phthalocyanine is
Spin coating at pm. At this time, the phthalocyanine and naphthalocyanine dyes were well dispersed in THF but hardly dispersed in ethanol, so that the dyes did not seep into the lower layer. After the film formation, heat treatment was performed at 160 ° C. for 30 minutes. Each film thickness was about 100 nm. As shown in FIG. 14, this cathode ray tube had a high definition with very little reflection over the entire visible light region.

Example 5 Si (OC ₂ H ₅ ) _{4 in} weight ratio:
A solution of H ₂ O: HNO ₃ : THF = 2: 1: 0.1: 20 was prepared, and silicon naphthalocyanine having an absorption peak in a near-infrared region from 700 nm to 900 nm was added thereto.
Copper phthalocyanine having an absorption peak between 0 nm and 700 nm was mixed so as to be 0.18% by weight. In addition, 500 nm so that the weight becomes 0.06% in ethanol in which SnO ₂ fine particles having a particle diameter of 20 nm are dispersed.
Acid red having an absorption peak between -600 nm was mixed.

This acid red-containing SnO ₂ solution was spin-coated at 150 rpm on the outermost surface of a cathode ray tube, dried and dried.
Silicon containing naphthalocyanine and copper phthalocyanine
The O ₂ solution was spin coated at 150 rpm. At this time, the phthalocyanine and naphthalocyanine dyes are well dispersed in THF but are hardly dispersed in ethanol, and acid red is dissolved in ethanol but hardly dissolved in THF. It did not seep into other layers. After the film formation, heat treatment was performed at 160 ° C. for 30 minutes. The thickness of each layer was about 100 nm. As shown in the reflectance curve of FIG. 15, the CRT had very little reflection over the entire visible light range, and had high definition without a side band near 560 nm. The cathode ray tube had a low surface resistance of the order of 10 ⁶ Ω / □ due to the electrical conductivity of the SnO ₂ fine particles, and also had an antistatic effect.

Example 6 Si (OC ₂ H ₅ ) _{4 in} weight ratio:
A solution of H ₂ O: HNO ₃ : THF = 2: 1: 0.1: 20 was prepared, and silicon naphthalocyanine having an absorption peak between 700 nm and 900 nm and 600 nm to 7 nm.
Copper phthalocyanine having an absorption peak between 00 nm was mixed so as to be 0.18% by weight. Also,
Ti (OC ₃ H ₇ ) ₄ : H ₂ O: HNO ₃ : EtOH by weight ratio
= 3: 1: 0.1: 20 solution was prepared, 0.0
Acid red having an absorption peak between 500 nm and 600 nm was mixed so as to be 6%.

The acid red-containing TiO ₂ solution was spin-coated at 150 rpm on the top surface of a cathode ray tube, dried, and then dried.
Silicon containing naphthalocyanine and copper phthalocyanine
The O ₂ solution was spin coated at 150 rpm. Then 160
Heat treated at 300C for 30 minutes. The thickness of each layer is about 10
It was 0 nm. FIG. 16 shows the reflectance of this CRT. The CRT had very little reflection over the entire visible light region and had high definition without a side band around 560 nm.

Example 7 Si (OC ₂ H ₅ ) _{4 in} weight ratio:
A solution of H ₂ O: HNO ₃ : THF = 2: 1: 0.1: 20 was prepared, and silicon naphthalocyanine having an absorption peak between 700 nm and 900 nm and 600 nm to 7 nm.
Copper phthalocyanine having an absorption peak between 00 nm was mixed so as to be 0.18% by weight. Also,
Zn (OC ₂ H ₅ ) ₂ : H ₂ O: HNO ₃ : EtOH by weight ratio
= 1.5: 1: 0.1: 20 was prepared, and acid red having an absorption peak between 500 nm and 600 nm was mixed so as to be 0.06% by weight.

This acid red-containing ZnO solution was spin-coated at 150 rpm on the top surface of a cathode ray tube, dried, and then dried with silicon naphthalocyanine and copper phthalocyanine-containing SiO2.
_{The two} solutions were spin-coated at 150 rpm. Then 160 ° C
For 30 minutes. The thickness of each layer is about 100
nm. FIG. 17 shows the reflectance of this cathode ray tube. The reflectance is very small over the entire visible light range.
It was a high-definition device having no side band near 0 nm. In addition, this cathode-ray tube had a low surface resistance of the order of 10 ⁷ Ω / □ due to the conductivity of ZnO, and also had an antistatic effect.

Example 8 Si (OC ₂ H ₅ ) _{4 in} weight ratio:
A solution of H ₂ O: HNO ₃ : THF = 2: 1: 0.1: 20 was prepared, and copper phthalocyanine having an absorption peak in a region of 300 nm to 400 nm was mixed with the solution to 0.18% by weight. did. An ethanol solution in which ITO fine particles having a particle size of 20 nm are dispersed is applied to the top surface of the cathode ray tube at 150 rpm
After spin-coating and drying, copper phthalocyanine-containing SiO ₂
The solution was spin coated at 150 rpm. After film formation, 160 ° C
For 30 minutes. The thickness of each layer is about 100
nm.

This cathode-ray tube also had an antistatic effect because the ITO fine particles had conductivity and the surface resistance was as low as 10 ⁴ Ω / □. In addition, despite the large difference in base refractive index between the upper and lower films when no dye was added, there was no rise of reflection around 400 nm which was a problem when the dye was not mixed into the antireflection film, and FIG. As shown, a high-definition object with small reflection over the entire visible light range was obtained. Further, even when a benzophenone-based dye as a UV absorber was mixed in place of copper phthalocyanine, a film having a reflection characteristic without absorption rising near 400 nm was obtained.

Example 9 Si (OC ₂ H ₅ ) ₄ :
A solution of H ₂ O: HNO ₃ : THF = 2: 1: 0.1: 20 was prepared, and copper phthalocyanine and silicon naphthalocyanine each having an absorption peak in a region of 200 nm to 400 nm were added by 0.18% by weight. It was mixed so that it might become. An ethanol solution in which ITO fine particles having a particle diameter of 20 nm are dispersed is spin-coated at 150 rpm on the outermost surface of the cathode ray tube,
After drying, a SiO ₂ solution containing copper phthalocyanine and silicon naphthalocyanine was spin-coated at 150 rpm. After the film formation, heat treatment was performed at 160 ° C. for 30 minutes. The thickness of each layer was about 100 nm.

[0056] The cathode ray tube because the ITO fine particles is electrically conductive, the surface resistance was also combines 10 ⁴ Ω / □ platform and antistatic effect with a low resistance. In addition, despite the large refractive index of the base film and the large difference in base refractive index between the upper and lower films when the dye is not added, the reflection around 400 nm which has become a problem when the dye is not mixed into the antireflection film. , And a high-definition device with small reflection over the entire visible light region was obtained as shown in FIG.

[Embodiment 10] Si (OC
_{2 H 5) 4: H 2} O: HNO 3: THF = 2: 1: 0.1: 2
0 was prepared, and a silicon naphthalocyanine having an absorption peak in the near infrared region of 700 nm to 900 nm and a copper phthalocyanine having an absorption peak between 600 nm to 700 nm were respectively 0.18% by weight. Mixed. In addition, 50% by weight of 20% by weight of ethanol in ethanol in which ITO fine particles having a particle size of 20 nm are dispersed.
Acid red having an absorption peak between 0 nm and 600 nm was mixed. Also, the weight ratio of Ti (OC ₃ H ₇ ) ₄ : H ₂
A solution of O: HNO ₃ : EtOH = 3: 1: 0.1: 20 was prepared.

This Ti (OC ₃ H ₇ ) ₄ sol solution was spin-coated at 150 rpm on the outermost surface of the cathode ray tube, dried, and then acid-red-containing ITO solution was spin-coated at 150 rpm, dried, and dried with silicon naphthalocyanine and copper phthalocyanine. Spin coating was performed at 150 rpm with a SiO ₂ solution. At this time, the phthalocyanine and naphthalocyanine dyes are THF
Disperses well in ethanol but hardly disperses in ethanol, and acid red dissolves in ethanol,
The dye in each layer did not seep into the other layers because it hardly dissolved in the dye. After forming the three-layer film in this way, it was heat-treated at 160 ° C. for 30 minutes. The thickness of each layer was about 100 nm.

FIG. 20 shows a sectional view of the produced cathode ray tube. In the figure, 9 is a TiO ₂ film, 6 is a SiO ₂ film containing silicon naphthalocyanine and copper phthalocyanine, 7 is an ITO film containing acid red, and 8 is a cathode ray tube. The thickness of each film was about 100 nm. FIG. 21 shows the reflectance of this cathode ray tube. The CRT had very little reflection over the entire visible light region and had high definition without a side band around 560 nm. Also, this CRT is
Since the ITO fine particles have conductivity, the surface resistance is 10 ⁵
The resistance was as low as Ω / □, and it also had an antistatic effect.

[0060]

According to the present invention, it is possible to obtain an anti-reflection film having low reflection over a wide visible wavelength region by utilizing a change in reflectance due to anomalous dispersion of the refractive index of the dye-containing film. A high-definition display device having a prevention effect can be manufactured.

[Brief description of the drawings]

FIG. 1 shows a dye having absorption in the near infrared region and a blue dye-containing S
shows the reflectance in the visible region of the laminated film of the iO ₂ film and the red dye-containing ITO film.

FIG. 2 is a sectional view of an antireflection film.

FIG. 3 is a view showing a refractive index of a film satisfying a non-reflection condition in a wide range of wavelengths.

FIG. 4 is a diagram showing an absorption peak for achieving the refractive index dispersion shown in FIG.

FIG. 5 is an explanatory diagram of a method for realizing an absorption peak with various kinds of dyes.

6A is a diagram showing the transmittance of a dye having absorption in the near infrared region and a SiO ₂ film containing a blue dye, and FIG. 6B is a diagram showing the transmittance of dye having absorption in the near infrared region and SiO ₂ containing a blue dye. FIG. 4 is a diagram showing a refractive index of a film.

7A is a diagram showing the transmittance of a red dye-containing ITO film, and FIG. 7B is a diagram showing the refractive index of a red dye-containing ITO film.

FIG. 8 is a schematic diagram of a cathode ray tube provided with a laminated film of a SiO ₂ film containing a dye and a blue dye having absorption in the near infrared region and ITO containing a red dye on the outermost surface.

FIG. 9 is a graph showing the reflectance of an antireflection film in which the type of dye is changed.

10A is a diagram showing the transmittance of a copper phthalocyanine-containing SiO ₂ film, and FIG. 10B is a diagram showing the copper phthalocyanine-containing SiO ₂ film.
_The figure which shows the refractive index of _two films.

FIG. 11 is a diagram showing the reflectance of a CRT provided with a laminated film of a copper phthalocyanine-containing SiO ₂ film and an acid red-containing ITO film on the outermost surface.

FIG. 12 (a) shows silicon-naphthalocyanine-containing Si
O ₂ film shows a transmittance of, (b) is a diagram showing a refractive index of the silicon naphthalocyanine-containing SiO ₂ film.

FIG. 13 is a view showing the reflectance of a CRT provided with a laminated film of a silicon naphthalocyanine-containing SiO ₂ film and a rhodamine-containing ITO film on the outermost surface.

FIG. 14 is a diagram showing the reflectance of a CRT provided with a laminated film of a SiO ₂ film containing silicon naphthalocyanine and copper phthalocyanine and a TiO ₂ film on the outermost surface.

FIG. 15 is a diagram showing the reflectance of a CRT provided with a laminated film of an SiO ₂ film containing silicon naphthalocyanine and copper phthalocyanine and a SnO ₂ film containing acid red on the outermost surface.

FIG. 16 is a diagram showing the reflectance of a CRT provided with a laminated film of a SiO ₂ film containing silicon naphthalocyanine and copper phthalocyanine and a TiO ₂ film containing acid red on the outermost surface.

FIG. 17 is a diagram showing the reflectance of a CRT provided with a laminated film of a SiO ₂ film containing silicon naphthalocyanine and copper phthalocyanine and a ZnO film containing acid red on the outermost surface.

FIG. 18 is a view showing the reflectance of a CRT provided with a laminated film of a copper phthalocyanine-containing SiO ₂ film and an ITO film on the outermost surface.

FIG. 19 is a view showing the reflectance of a CRT provided with a laminated film of an SiO ₂ film containing silicon naphthalocyanine and copper phthalocyanine and an ITO film on the outermost surface.

FIG. 20 is a schematic cross-sectional view of a cathode ray tube provided with a three-layer laminated film of a dye and a blue dye-containing SiO ₂ film having absorption in the near infrared region, a red dye-containing ITO film, and a TiO ₂ film on the outermost surface.

FIG. 21 is a diagram showing the reflectance of a CRT provided with a three-layer laminated film of a dye and a blue dye-containing SiO ₂ film having absorption in the near infrared region, a red dye-containing ITO film, and a TiO ₂ film on the outermost surface. .

[Explanation of symbols]

1: Dye having absorption in near infrared region and SiO containing blue dye
₂ Reflection spectrum of laminated film composed of red dye-containing ITO film, 2 ... Reflection spectrum of laminated film composed of SiO ₂ film and ITO film, 3 ... Lower refractive index upper film, 4 ... High refractive index lower film, 5 ... substrate, 6 ... copper phthalocyanine and silicon naphthalocyanine-containing SiO ₂ film, 7 ... acid Red containing ITO film, 8 ... CRT, 9 ... TiO ₂ film, 10 ...
Incident light, 14 ... synthetic reflected light

──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. ⁷ Identification symbol FI Theme coat ゛ (Reference) G09F 9/00 313 G09F 9/00 313 H01J 29/88 H01J 29/88 H04N 5/72 H04N 5/72 A (72) Inventor Takao Ishikawa 7-1-1, Omika-cho, Hitachi City, Ibaraki Prefecture Inside Hitachi, Ltd.Hitachi Research Laboratory Co., Ltd. (72) Inventor Daigoro Kamoto 7-1-1, Omika-cho, Hitachi City, Ibaraki Prefecture Stock Company Inside Hitachi Research Laboratory, Hitachi, Ltd. (72) Inventor Ken Takahashi 7-1-1, Omika-cho, Hitachi City, Ibaraki Prefecture Inside Hitachi Research Laboratory, Hitachi Research Laboratory (72) Inventor, Masahiro Nishizawa 3300 Hayano, Mobara-shi, Chiba Co., Ltd. Hitachi, Ltd.Electronic Device Division (72) Inventor Norikazu Uchiyama 3300 Hayano, Mobara-shi, Chiba Pref.Hitachi, Ltd. In the Division

Claims (24)

[Claims] 1. An antireflection film having a multilayer structure in which at least two layers of thin films are stacked, wherein the uppermost film and the film immediately below it contain dyes having different light absorption peaks. 2. The antireflection film according to claim 1, wherein the refractive index of the uppermost film is smaller than that of the film immediately below the uppermost film. 3. A substance having an absorption peak in a near infrared region of 700 to 900 nm, or a material having an absorption peak of 600 to 700 nm.
3. The anti-reflection film according to claim 2, comprising a substance having an absorption peak in a region of m or both of them. 4. The film immediately below the uppermost layer has a thickness of 500 to 600 n.
3. The antireflection film according to claim 2, comprising a substance having an absorption peak in a region of m. 5. The antireflection film according to claim 2, wherein the film immediately below the uppermost layer has conductivity. 6. The antireflection film according to claim 2, wherein the film immediately below the uppermost layer has conductivity and contains a substance having an absorption peak in a range of 500 to 600 nm. 7. A substance whose uppermost layer has an absorption peak in the near infrared region of 700 to 900 nm, or 600 to 700 n.
3. The anti-reflection coating according to claim 2, wherein a material having an absorption peak in a region m or both of them is included, and a film immediately below the uppermost layer has conductivity. 8. A substance whose uppermost film has an absorption peak in a near infrared region of 700 to 900 nm, or a material having an absorption peak of 600 to 700 nm.
3. A film having an absorption peak in the region of m or both thereof, and the film immediately below the uppermost layer contains a material having an absorption peak in the region of 500 to 600 nm.
The antireflection film as described in the above. 9. A substance whose uppermost layer has an absorption peak in the near infrared region of 700 to 900 nm, or 600 to 700 n
The film immediately below the uppermost layer contains a substance having an absorption peak in a region of 500 to 600 nm and has conductivity, including a substance having an absorption peak in a region of m or both. 2. The antireflection film according to 2. 10. The method according to claim 2, wherein the solution for forming the uppermost layer film is a solution mainly composed of a solvent in which the dye contained in the layer immediately below the layer does not dissolve or disperse well. Method for producing an anti-reflection film. 11. The solution for preparing a layer immediately below the uppermost layer, wherein a solution mainly containing a solvent in which a dye contained in the uppermost layer does not dissolve or disperse well is used. Method for producing an anti-reflection film. 12. 700 to 900 nm contained in the uppermost layer
Wherein the substance having an absorption peak in the near infrared region is a dye selected from naphthalocyanine dyes, anthraquinone dyes, and polymethine dyes.
10. The antireflection film according to 8 or 9. 13. 600 nm to 700 nm contained in the uppermost layer
10. The antireflection film according to claim 3, wherein the substance having an absorption peak in the region is a dye selected from a phthalocyanine dye, a phenoxazine dye, and a brilliant cresyl blue dye. . 14. 500 in a layer immediately below the top layer
The substance having an absorption peak in a range of from about 600 nm to about 600 nm is a dye selected from an azo dye, a xanthene dye, an anthraquinone dye, a triphenylmethane dye, and a quinacridone dye. 10. The antireflection film according to 6, 8 or 9. 15. The anti-reflection coating according to claim 5, wherein the layer immediately below the uppermost layer contains SnO ₂ . 16. The antireflection film according to claim 5, wherein the layer immediately below the uppermost layer contains ITO. 17. The antireflection film according to claim 5, wherein the layer immediately below the uppermost layer contains ZnO. 18. A multilayer structure in which at least two layers of thin films are stacked, wherein odd-numbered films counted from above have a thickness of 300 to 40.
An anti-reflection film comprising a substance having an absorption peak in a region of 0 nm. 19. The antireflection film according to claim 18, wherein the substance having an absorption peak in a range of 300 to 400 nm is a phthalocyanine dye or a benzophenone dye. 20. A laminated structure in which two thin films are stacked, wherein the two thin films have a large difference in refractive index on the long wavelength side with respect to the center wavelength of the wavelength region to be antireflection, and refraction on the short wavelength side. An antireflection film having a refractive index dispersion such that a difference in index is small. 21. A laminated structure in which two thin films are stacked, wherein the two thin films have a high refractive index on the long wavelength side and a low refractive index on the short wavelength side in a wavelength region to be antireflective. An anti-reflection film having dispersion. 22. A laminated structure in which two layers of thin films are laminated, wherein the two-layer thin film has an optical path length of about a quarter wavelength at each wavelength in a wavelength region to be prevented from being reflected, and An antireflection film having a refractive index dispersion such that a refractive index ratio is substantially constant. 23. The anti-reflection film according to claim 20, wherein the refractive index dispersion of the thin film is achieved by containing a dye having an absorption peak in a predetermined wavelength region. 24. A display device comprising the antireflection film according to claim 1 on a surface thereof.