JP2004354342A - Optical analyzer - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To prevent a sample from falling toward a reflection objective mirror at a low cost. <P>SOLUTION: A disposable shutter 16 using paper as a base material covers an upper part of a converging mirror 7 of a photometric analyzer wherein one of two Cassegrain mirrors is mounted in an upper side as the reflection objective mirror 4, wherein the other is mounted in a lower side as the converging mirror 7, and wherein a sample stage 6 is arranged to mount the sample 13 therebetween to be fixed. The sample 13 is prevented from falling into the converging mirror 7 from the sample stage 6, by the covering with the shutter 16 excepting the time when light is transmitted from the converging mirror 7. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to an optical analyzer used for qualitative / quantitative determination of a substance, and more particularly, to an optical analyzer using a pair of reflection objective mirrors facing up and down.
[0002]
[Prior art]
FIG. 7 shows a configuration diagram of an infrared microscope used in combination with a conventional Fourier transform infrared spectrophotometer 60 as an example of an optical analyzer (for example, see Patent Document 1). This infrared microscope is a device that performs microspectroscopy in the infrared wavelength range.It is a microscope designed to focus infrared light on a very small area to be suitable for micro samples. It is used to analyze the composition of composite materials, study biological tissues, and study the composition, structure, crystallinity, anisotropy of molecules and crystals, etc. of materials.
[0003]
In general, an infrared microscope can use either a transmission method or a reflection method. In the case of using a transmission method, a focus adjustment dial 9 is provided on a side surface of the apparatus main body. Can be moved to The halogen lamp 12 for reflection observation illumination is turned on, the sample 13 is placed on the sample stage 6, the observation is performed from the eyepiece lens 2, the focus adjustment dial 9 is rotated, and the surface of the sample 13 is reflected on the focal plane ( (A position where the image can be observed sharply). Then, the reflection observation illumination halogen lamp 12 is turned off. Next, infrared light from the Michelson interferometer of the Fourier transform infrared spectrophotometer 60 is reflected by the transmission / reflection switching mirror 10 and passes through the reflection mirror 31 via the reflection mirrors 37 and 36 shown in the lower part of the figure. Then, the light is reflected by the reflecting mirror 32 and enters the condensing mirror 7 (Casegrain mirror). The light is narrowed down to about 1 mm in diameter, and is irradiated on the sample 13 on the sample stage 6.
[0004]
On the other hand, the light transmitted through the sample 13 is condensed by a reflection objective mirror 4 (Cassegrain mirror) having a magnification of about 15 times, transmitted through the reflection mirror 33, transmitted through the variable aperture 3, and the reflection mirror 38, and reflected by the reflection mirror. The light is condensed by the concave reflecting mirror 41 via 39 and 40 and enters the semiconductor (MCT) detector 11 such as HgCdTe having a small area and is detected. The detected signal is Fourier transformed into an infrared spectrum.
[0005]
When the visible image of the sample 13 is observed with eyes, photographed, or observed with a TV monitor, light from the halogen lamp 8 for transmission observation illumination is condensed by the reflecting mirrors 31 and 32. At 7, the light is applied to the sample 13 on the sample stage 6, and the transmitted light passes through the reflecting objective mirror 4 and the reflecting mirror 33, passes through the variable aperture 3, is reflected by the reflecting mirror 38, passes through the reflecting mirror 42, and passes through a prism. The sample image is reflected from the eyepiece 43 and observed from the eyepiece lens 2. In addition, a photographing camera or a TV camera is attached to the photographing device mounting opening 1 to photograph or photograph.
[0006]
The sample stage 6 is provided with a window hole 6b for transmitting light to a moving table 6a as shown in FIGS. 8A and 8B, and a sample 13 is gripped and fixed around the window hole 6b. Gripping tool 6c is provided. Although not shown, the sample stage 6 is provided with a motor for moving in three axial directions so that a microcomputer can perform three-dimensional mapping of the sample surface. FIG. 8B is a cross-sectional view taken along the line AA in FIG.
[0007]
As shown in FIG. 9A, a convex mirror 4a and a concave mirror 4b are incorporated in the reflection objective mirror 4, and a convex mirror 7a and a concave mirror 7b are incorporated in the condensing mirror 7 so as to face each other. 9 (b) (a view as viewed from the plane AA in FIG. 9 (a)) exists in the periphery of each frame supporting the convex mirror 4a and the convex mirror 7a.
[0008]
[Patent Document 1]
JP 2001-174708 A
[Problems to be solved by the invention]
The conventional infrared microscope is configured as described above. Since the window hole 6b for transmitting light to the sample stage 6 is provided, the sample 13 is placed on the sample stage 6 and the position and the direction are adjusted. In some cases, the sample may be erroneously dropped from the window hole 6b while being fixed with the gripper 6c. In this case, the sample 13 falls into the space of the condensing mirror 7 below, and it takes a lot of trouble to take out the sample 13 or the sample may be lost in some cases. As a countermeasure to solve such a problem, a method of providing a window plate made of a material that allows infrared rays to pass therethrough at the window hole 6b of the sample stage 6 or above the light collecting mirror 7 is considered. This causes a new problem that the light transmittance is reduced. In order to solve this drawback, it is conceivable to attach a mechanical shutter that opens the optical path only at the time of luminous intensity measurement and closes it during the preparation for measurement. However, this causes another problem that the cost is increased.
The present invention has been made in view of such circumstances, and it is an object of the present invention to provide an optical analyzer capable of preventing a sample from being dropped or lost at a low cost without causing a decrease in light transmittance. Aim.
[0010]
[Means for Solving the Problems]
In order to achieve the above object, an optical analyzer of the present invention comprises a pair of reflecting objective mirrors facing up and down, a sample placed between the reflecting objective mirrors, the sample is irradiated with light, and transmitted light or reflected light of the light is emitted. And a disposable shutter for preventing the sample from penetrating into the reflective objective located below.
The optical analyzer of the present invention is configured as described above, and is provided with a disposable shutter that covers the reflection objective mirror at the lower position, thereby preventing the sample from dropping into the reflection objective mirror.
[0011]
BEST MODE FOR CARRYING OUT THE INVENTION
An embodiment of the optical analyzer of the present invention will be described with reference to the drawings. FIG. 1 shows a configuration for analyzing a sample with an infrared microscope as an embodiment of the optical analyzer of the present invention. This infrared microscope has a disposable shutter 16 for preventing the sample 13 from dropping from the sample stage 6 of the infrared microscope shown in FIG. It is a feature.
[0012]
The disposable shutter 16 is made of paper as a base material, and as shown in the plan view of FIG. 2, a circular portion 16a larger than the upper surface diameter of the condenser mirror 7, two short convex portions 16b and 16c on the left and right, and a long portion. It has a shape like a tadpole consisting of the convex portion 16d. The disposable shutter 16 has a plurality of disposable shutters 16 formed in an A4 size slightly thick paper material as shown in FIG. 3, for example. It is enclosed in the instruction manual or supplied as an accessory. Thus, after the disposable shutter 16 is hollowed out and used up, it is possible to copy and use the remaining disposable shutter on supply paper by using the shape of the remaining disposable shutter.
[0013]
When using the disposable shutter 16, as shown in FIG. 4, the short convex portions 16b and 16c and the long convex portion 16d are bent so as to be respectively on the mountain side, and the long convex portion 16d is It is put on the upper part of the condenser mirror 7 so as to come to the front.
[0014]
Next, a procedure for using the disposable shutter 16 when analyzing a sample using the infrared microscope will be described with reference to FIG. First, when the sample 13 is analyzed by the transmission method, as shown in FIG. 4, the short convex portions 16b and 16c and the long convex portion 16d of the disposable shutter 16 are bent so as to be on the mountain side, respectively, and are put on the focusing mirror 7. Next, the sample 13 is fixed on the sample stage 6. Next, the reflection observation illumination halogen lamp 12 is turned on, the observation is performed through the eyepiece lens 2, the focus adjustment dial 9 is rotated, and the surface of the sample 13 is positioned at the focal plane of the light by the reflected light. Then, the reflection observation illumination halogen lamp 12 is turned off.
[0015]
Next, the disposable shutter 16 is removed from the condenser mirror 7 by holding the long convex portion 16d. If necessary, visual observation with the halogen lamp 12 is performed with the disposable shutter 16 removed before the infrared light is irradiated. Then, infrared light from the Michelson interferometer of the Fourier transform infrared spectrophotometer 60 is applied to the transmission / reflection switching mirror 10. The infrared light is reflected by the transmission / reflection switching mirror 10, passes through the reflecting mirror 31, passes through the reflecting mirrors 37 and 36 in the lower part of the drawing, is reflected by the reflecting mirror 32, and enters the condensing mirror 7 to be sampled. The sample 13 is applied to the stage 6.
[0016]
On the other hand, the light transmitted through the sample is condensed by the reflection objective mirror 4, transmitted through the reflection mirror 33, transmitted through the variable aperture 3 and the reflection mirror 38, and passed through the reflection mirrors 39 and 40 to form a concave reflection mirror 41. And enters the semiconductor detector 11 and is detected. This detection signal is further Fourier transformed into an infrared spectrum.
[0017]
As described above, at the stage of fixing the sample 13 to the sample stage 6 or focusing, the condensing mirror 7 is covered by the disposable shutter 16 so that the sample 13 is Even if it falls from the light source, it does not enter the focusing mirror 7. If the inclination of the sample 13 needs to be changed, the disposable shutter 16 should be put on the condensing mirror 7 again, so that the sample 13 does not enter the condensing mirror 7 during this time. it can.
[0018]
Further, as shown in FIGS. 5A and 5B, the disposable shutter 16 may be a disposable shutter 17 in which a ring 17a made of paper is bonded around the circular portion 16a. Thus, even if the sample 13 falls from the sample stage 6, it is possible to prevent the sample 13 from remaining in the disposable shutter 17 and dropping to the floor and being lost. FIG. 5B is a cross-sectional view taken along a line AA in FIG.
[0019]
FIG. 6 shows a configuration in the case where the sample 13 is analyzed by the reflection method using the infrared microscope. The tilt direction of the transmission / reflection switching mirror 10 is opposite to that in the case of the transmission method of FIG. ing. In this case, the disposable shutter 16 is put on the condenser mirror 7 from the beginning as shown in FIG. Then, the reflection observation illumination halogen lamp 12 is turned on, and the light is turned off after the surface of the sample 13 is positioned at the focal plane of light as in the case of the transmission method. The infrared light from the Michelson interferometer of the Fourier transform infrared spectrophotometer 60 is reflected by the transmission / reflection switching mirror 10, reflected by the reflection mirrors 34 and 35 above the figure, reflected by the reflection mirror 33, It enters the reflection objective 4 and strikes the sample 13. On the other hand, the light reflected from the sample 13 is detected by the semiconductor detector 11 in the same manner as in the case of the transmission method, and is converted into an infrared spectrum.
[0020]
The disposable shutter 16 represents the shape shown in FIG. 2 by the coordinates of the X-Y axis, stores the digital value as each coordinate point in a storage medium such as a floppy, and uses this as an accessory of the infrared microscope. Can be supplied. The user puts this storage medium into a personal computer and outputs it with a printer to obtain the shape of the disposable shutter 16 as shown in FIG. 2, and cuts out and uses this.
[0021]
Although the above embodiment is based on an infrared microscope, the present invention is applied to an optical analyzer for observing and analyzing a sample by measuring a transmitted light or a transmitted light of the sample with a pair of reflecting objectives facing each other. It comes with a disposable shutter made of paper base material, and covers it with a reflective objective mirror below to prevent intrusion of foreign substances such as samples. It is not limited to the example.
[0022]
【The invention's effect】
With the above configuration, it is possible to prevent foreign matter from entering the optical system at low cost by using a disposable shutter made of paper base material, and further, it is possible to easily reproduce the disposable shutter.
[Brief description of the drawings]
FIG. 1 is a configuration diagram of an optical analyzer of the present invention.
FIG. 2 is an external view of a disposable shutter according to the embodiment.
FIG. 3 is a supply sheet of a disposable shutter according to the embodiment.
FIG. 4 is a perspective view of a disposable shutter according to the embodiment.
5A is a plan view of another disposable shutter according to the embodiment, and FIG.
FIG. 6 is a configuration diagram of an optical analyzer of the present invention.
FIG. 7 is a configuration diagram of a conventional infrared microscope.
FIG. 8A is a plan view of the sample stage, and FIG.
FIGS. 9A and 9B are a diagram showing a light collecting state by a reflecting objective mirror and a light collecting mirror, and a top view of the light collecting mirror; FIGS.
[Explanation of symbols]
REFERENCE SIGNS LIST 1 photographing device mounting opening 2 eyepiece 3 variable aperture 4 reflection objective mirror 4 a, 7 a convex mirror 4 b, 7 b concave mirror 6 sample stage 6 a moving table 6 b window hole 6 c gripping tool 7 focusing mirror 8 halogen lamp for transmission observation illumination 9 focal point Adjustment dial 10 Transmission / reflection switching mirror 11 Semiconductor detector 12 Halogen lamp for reflection observation illumination 13 Sample 16, 17 Disposable shutter 16a Circular portion 16b, 16c Short convex portion 16d Long convex portion 17a Rings 31, 32, 33, 34, 35 , 36, 37, 38, 39, 40, 41, 42 Reflecting mirror 43 Prism 60 Fourier transform infrared spectrophotometer

Claims (1)

A pair of reflecting objective mirrors face up and down, a sample is placed between them, and light is applied to the sample. An optical analyzer comprising a disposable shutter for preventing a sample from entering a reflection objective mirror.

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