JP2008151559A - Infrared thickness / orientation meter and infrared thickness / orientation measuring method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To remove an influence of film orientation, and to measure the thickness of a thin film. <P>SOLUTION: This infrared thickness/orientation meter has a transmission means for allowing an infrared ray to be transmitted through a sheet-shaped film from each of two or more different angles, a reflection means for reflecting transmission light transmitted by the transmission means by a reflecting mirror provided on the facing side of the film, a re-transmission means for allowing the transmission light reflected by the reflection means to be transmitted again through the film, and a calculation means for receiving light transmitted by the re-transmission means by each detection means corresponding to the infrared ray and calculating an absorption index from an attenuation amount received by each detection means. A mean value of each absorption index calculated by the calculation means is the thickness of the film, and a ratio between the maximum value and the minimum value of each absorption index calculated by the calculation means is an orientation index showing the degree of orientation. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to an infrared thickness / orientation meter and an infrared thickness / orientation measuring method, and more specifically, an infrared thickness / orientation meter that can measure the orientation of a film in addition to measuring the thickness of a sheet-like film. The present invention relates to an orientation meter and an infrared thickness / orientation measuring method.

As a conventional technique, there is an infrared film thickness meter that measures the thickness of a film by measuring the absorption sensitivity of the film.
Further, a film sheet molecular orientation meter has been proposed in which light is irradiated in the vertical direction to the film to be measured, and the orientation angle and orientation index of the film are obtained from the distribution of scattered light. The film sheet orientation meter also has a method of detecting light components reflected in the vertical direction by irradiating light obliquely from a plurality of angles around the measurement point.
Japanese Laid-Open Patent Publication No. 4-212003 (page 3, FIG. 3)

When the thickness of a thin film (for example, 10 μm or less) is measured with the infrared film thickness meter described in the prior art, optical interference occurs between the front and back of the film, resulting in a measurement error. When light polarized in a component parallel to the film surface is incident on the film from an oblique direction, the influence of light interference can be removed and the thickness of the thin film can be measured accurately. If they are arranged at different angles, they are affected by the orientation, resulting in measurement errors, so that accurate measurement cannot be performed.
FIG. 3 is a result of measuring a polyester film of 15 μm with an infrared film thickness meter, and is a result of recording the relationship between the angle and the absorption index by rotating the measurement film every 10 ° around the measurement point.
When the measurement film is rotated around the measurement point, an angle with a large absorption index and a small angle appear. When the thickness of the stretched film is measured online, the orientation difference varies depending on the strength and direction of stretching, and the infrared absorption index changes even in the same thickness film. It occurs and accurate thickness measurement cannot be performed.

  There is a film sheet molecular orientation meter that measures the molecular orientation of the film with a sensor different from the infrared film thickness meter. The measurement principle is that the molecular orientation of the film is measured by irradiating light perpendicular to the film surface and measuring the distribution of scattered light. Although the degree of orientation of the film surface and the shallow part of the film surface can be measured, it is difficult to measure the orientation of the entire film. Since most of the energy of the incident light is scattered, the light detected by the detector is a part and the detected signal level becomes weak.

The film is produced by a method of stretching from a softened state by heat. At this time, the film is stretched with a strong force and stretched thinly, and the orientation direction and the orientation index are determined.
In a biaxially stretched film that stretches the film in the width direction, since a strong stress is applied to the film, the orientation angle and orientation tendency may differ in the film width direction.
In an optically important film, the degree of orientation may be an important factor, and a method for measuring the orientation is required for quality control of the film.

  Therefore, in addition to the method of measuring the thickness of the film, there is a problem to be solved by a method and a thickness meter that can measure the orientation characteristics of the entire film without simultaneously limiting the orientation of the film to only the surface.

  In order to solve the above problems, an infrared thickness / orientometer and an infrared thickness of the present invention. The orientation measurement method has the following configuration.

(1) An infrared thickness / orientometer is a transmission means for transmitting infrared rays to a sheet-like film from each of two or more different angles, and the opposite side of the film for transmitted light transmitted by the transmission means Reflecting means for reflecting by the reflecting mirror provided on the film, re-transmitting means for transmitting the light reflected by the reflecting means again through the film, and light transmitted by the re-transmitting means corresponding to the infrared rays, respectively. And calculating means for calculating an extinction index from the amount of attenuation received by each detecting means, and the average value of each extinction index calculated by the calculating means is the thickness of the film. In addition, the ratio between the maximum value and the minimum value of each absorption index calculated by the calculation means is an orientation index indicating the degree of orientation.
(2) The infrared ray is an infrared ray having two or more different angles obtained by dispersing an infrared ray generated from a single light source with a spectroscopic mirror. Infrared thickness / orientometer.
(3) The infrared ray is divided into each component of absorption band wavelength M light (measurement light) of the film and wavelength band (reference light) R1 light and R2 light with little absorption across the M light by a band pass filter. The infrared thickness / orientometer according to (2), wherein the film is irradiated with the infrared ray.
(4) The infrared ray thickness / orientometer according to (3), wherein the infrared ray is polarized by a polarizing filter into light having a component parallel to the film surface and irradiated on the film.

(5) The infrared thickness / orientation measuring method transmits infrared rays to a sheet-like film from each of two or more different angles, and the transmitted light is provided on the opposite side of the film. Reflecting by the reflecting mirror, the reflected transmitted light is transmitted again through the film, and the extinction index is calculated from the attenuation received by the respective detecting means corresponding to the infrared light, The average value of the extinction index calculated by the detecting means is the thickness of the film, and the ratio between the maximum value and the minimum value of the calculated extinction index is an orientation index indicating the degree of orientation. is there.
(6) The infrared ray is an infrared ray having two or more different angles obtained by dispersing the infrared ray generated from a single light source with a spectroscopic mirror. Infrared thickness / orientation measurement method.
(7) The infrared ray is divided into each component of the absorption band wavelength M light (measurement light) of the film and the wavelength band (reference light) R1 light and R2 light with little absorption by sandwiching the M light by a band pass filter. And irradiating the film with the infrared thickness / orientation measuring method according to (6).
(8) The infrared ray thickness / orientation measuring method according to (7), wherein the infrared ray is irradiated to the film after being polarized into light having a component parallel to the film surface by a polarizing filter. .

In the present invention, with respect to the measurement point of the film whose thickness is to be measured, by measuring the thickness in a plurality of combinations from the direction in which the angle is changed, the influence of the film orientation is removed, and the thickness of the thin film is reduced. It can be measured accurately.
In addition, the infrared rays irradiating the film are polarized into the light component in the direction parallel to the film surface and incident on the film surface at an oblique angle to measure the film thickness. The optical interference of the film to be measured can be removed.

  Next, an embodiment of an infrared thickness / orientation meter capable of embodying the infrared thickness / orientation measuring method according to the present invention will be described with reference to the drawings.

FIG. 1 is a side view of a film to be measured, and shows a set of basic measurement configurations. FIG. 2 shows a device configuration as seen from above, in which the basic configuration shown in FIG. 1 is a combination of four sets, arranged at a measurement point and rotated at an angle of 45 °.
A light source 11 that emits infrared rays from an oblique lateral direction, an absorption band wavelength M light (measurement light) of the infrared rays of the film 12, and a wavelength band (reference light) R1 light with little absorption across the M light, A bandpass filter B that splits light into R2 light, a polarizing filter F that polarizes light in a direction parallel to the surface of the film 12, a film 12 that is the object to be measured, and a reflection provided on the opposite side of the film 13 And a detector D that receives the light reflected by the reflecting mirror M5, and a calculator 13 that calculates an extinction index from the amount of attenuation received by the detector D.

  With respect to such a basic configuration, in the present invention, as shown in FIG. 2, infrared rays from one light source 11 are distributed by spectroscopic mirrors (M1 to M4), and infrared rays are emitted from two or more different angles. And each detector (D1 to D4) corresponding to each infrared ray receives the light.

Infrared rays emitted from the light source 11 are split into M light (measurement light) having absorption sensitivity in the film and R1 light and R2 light having low absorption sensitivity by the bandpass filters (B1 to B4). The spectrally separated light is reflected by the spectroscopic mirrors (M1 to M4), and then is polarized by the polarizing filter (F1 to F4) into light of a component in a direction parallel to the film surface, and passes through the measurement film (transmission means). .
The light that has passed through the film is reflected by the reflecting mirror (M5) placed in the opposite direction of the film (reflecting means), is again transmitted through the film (retransmitting means), and is detected by the detectors (D1 to D4). (Detection means). The detected light component is converted into an electrical signal, and the extinction index (K1 to K4) is obtained from the attenuation detected by each detector (calculation means).
The extinction index described here is the ratio (M light / (R1 light + R2 light)) of the measurement wavelength light (M light) having infrared absorption and the reference light (R1 light, R2 light) having a small absorption wavelength. Show.
As the film thickness increases, the light absorption index increases, but the light absorption index also varies depending on the fiber direction (orientation) of the film molecules.
When the number of detector combinations is n (4 in the embodiment), the average value of the extinction index (K1 to Kn) is Kave, the maximum value is Kmax, and the minimum value is Kmin.
The thickness of the film is obtained by calculation from an absorption index obtained by averaging the absorption index (K1 to Kn);
An orientation index indicating the degree of orientation is calculated as Kmax / Kmin.

  In this way, by measuring the thickness with the light absorption index obtained by a plurality of combinations from the direction in which the angle is changed with respect to the measurement point of the film whose thickness is to be measured, the influence of the film orientation is removed and thinned. The film thickness can be accurately measured.

  In addition, the infrared rays irradiating the film are polarized into the light component in the direction parallel to the film surface and incident on the film surface at an oblique angle to measure the film thickness. The optical interference of the film to be measured can be removed.

  Furthermore, in the embodiment, there are four combinations of the infrared light irradiation light and the detector, but by increasing the number of combinations, an orientation angle can be obtained in addition to the orientation index.

  The light to be measured is more accurate than the light distribution obtained by conventional diffuse reflection by using light of the measurement wavelength with infrared absorption (M light) and reference light (R1 light, R2 light) with less absorption. The molecular orientation can be measured well. In contrast to the method of measuring the light reflected from the film in the conventional method, the orientation information inside the film can be obtained by transmitting the film.

  Further, in the embodiment, four measurement systems are prepared, and infrared rays are irradiated and transmitted through each angle with respect to the measurement point of the film. However, the present invention is not limited to this. A set of measurement systems shown in FIG. 5 may be prepared, and the absorption index may be measured while rotating the film to be measured on a turntable. In this manner, an off-line orientation meter capable of obtaining an accurate orientation angle and orientation index can be realized by recording the rotation angle and the absorption index as shown in FIG.

  To measure the thickness of a thin film accurately by removing the influence of the film orientation by measuring the thickness in multiple combinations from the direction in which the angle was changed with respect to the measurement point of the film whose thickness is to be measured. An infrared thickness / orientation meter is provided.

It is explanatory drawing which shows the basic composition of the measurement system of this invention. It is explanatory drawing which shows the structure of the apparatus of this invention. It is explanatory drawing which shows the orientation characteristic of a film.

Explanation of symbols

DESCRIPTION OF SYMBOLS 11 Light source 12 Film 13 Calculation part B Band pass filter B1 Band pass filter B2 Band pass filter B3 Band pass filter B4 Band pass filter F Polarizing filter F1 Polarizing filter F2 Polarizing filter F3 Polarizing filter F4 Polarizing filter D Detector D1 Detector D2 Detection Device D3 detector M1 spectroscopic mirror M2 spectroscopic mirror M3 spectroscopic mirror M4 spectroscopic mirror M5 reflective mirror

Claims (8)

Transmission means for transmitting infrared rays to the sheet-like film from each of two or more different angles;
Reflecting means for reflecting the transmitted light transmitted by the transmitting means with a reflecting mirror provided on the opposite side of the film;
Re-transmission means for allowing the transmitted light reflected by the reflection means to pass through the film again;
Receiving light transmitted by the retransmitting means by each detecting means corresponding to the infrared ray, and calculating means for calculating an extinction index from the attenuation received by each detecting means;
Have
The average value of each absorption index calculated by the calculation means is the thickness of the film, and the ratio between the maximum value and the minimum value of each absorption index calculated by the calculation means indicates the degree of orientation Infrared thickness and orientation meter characterized by being an index.   2. The infrared thickness according to claim 1, wherein the infrared ray is an infrared ray having two or more different angles obtained by dispersing the infrared ray generated from a single light source with a spectroscopic mirror. -Orientation meter.   The infrared ray is divided into each component of absorption band wavelength M light (measurement light) of the film and wavelength band (reference light) R1 light and R2 light with little absorption across the M light by a band pass filter. The infrared thickness / orientation meter according to claim 2, wherein the film is irradiated with a film.   4. The infrared thickness / orientometer according to claim 3, wherein the infrared light is polarized by a polarizing filter into light having a component in a direction parallel to the film surface and irradiated to the film. Infrared rays are transmitted through the sheet-like film from each of two or more different angles, and the transmitted light is reflected by a reflecting mirror provided on the opposite side of the film,
The reflected transmitted light is again transmitted through the film,
Calculate the extinction index from the amount of attenuation received by the respective detection means corresponding to the infrared light the transmitted light,
The average value of the extinction index calculated by the respective detection means is the thickness of the film, and the ratio between the maximum value and the minimum value of the calculated extinction index is the orientation index indicating the degree of orientation. An infrared thickness / orientation measuring method characterized by the above.   6. The infrared ray thickness according to claim 5, wherein the infrared ray is an infrared ray having two or more different angles obtained by dispersing the infrared ray generated from a single light source with a spectroscopic mirror. -Orientation measurement method.   The infrared ray is divided into each component of absorption band wavelength M light (measurement light) of the film and wavelength band (reference light) R1 light and R2 light with little absorption across the M light by a band pass filter. The infrared thickness / orientation measuring method according to claim 6, wherein the film is irradiated.   8. The infrared thickness / orientation measuring method according to claim 7, wherein the infrared ray is irradiated to the film after being polarized into light having a component in a direction parallel to the film surface by a polarizing filter.

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