JP2010192111A - Stamper and evaluation method of stamper - Google Patents

Abstract

A light-transmitting stamper is easily checked for the presence or absence of defects.
A data recording unit is irradiated with a laser having a wavelength of 450 nm or less and NA of 0.6 or more, and a maximum voltage value within a frequency range of 60 to 170 times the rotation speed of a stamper in a sum signal of the voltage signals. It is determined whether the level Vf and the average sum signal voltage value Vave of the data recording unit satisfy Vf / Vave <7.7 × 10 ⁻⁴ (1).
[Selection] Figure 1

Description

  The present invention relates to a stamper used for manufacturing a magnetic recording medium having a discrete track on the surface of a magnetic recording layer, and more particularly to a light transmissive stamper for transferring a concavo-convex pattern corresponding to a discrete track to a resist.

  In recent years, in order to improve the recording density of magnetic recording media, discrete track recording media (DTR media) in which recording tracks are physically separated have been proposed.

  In the process of manufacturing the DTR medium, an imprint stamper is pressed against the resist applied on the surface of the magnetic recording layer, the uneven pattern is transferred to the resist, and the magnetic recording layer is processed using the resist as a mask (for example, Patent Document 1).

  Conventionally, as such an imprint stamper, a Ni stamper manufactured by an electroforming process has been used as a father stamper, a mother stamper, or a sun stamper. However, when the electroforming process is used, a long production time of about 1 hour is required for each Ni stamper, and the Ni stamper has a short life and is not suitable for mass production. On the other hand, if the first Ni stamper is produced as a father stamper by an electroforming process, and the mother stamper or sun stamper produced thereafter is produced by using an injection molding process, it is as short as several seconds per sheet. A resin stamper can be obtained in production time.

  Such an injection molding process has been used to produce optical disks.

  For example, in an optical disc such as a DVD (Digital Versatile Disc) in which two molded substrates are bonded, an uneven pattern with a track pitch of 300 nm or more is formed on at least one molded substrate, and optical recording with a thickness of 30 μm or more including the unevenness is formed. A layer is deposited.

  However, in the DTR medium, a pattern having a track pitch and an uneven height of 100 nm or less is formed. As described above, when the data is densified and the track becomes fine, the life of the resin stamper tends to be reduced due to transfer and peeling of the resist pattern.

  In addition, when investigating with a general defect inspection apparatus, the defect is detected by using reflection of normal light, but the light transmissive stamper including the resin stamper has low reflectance because it transmits light, Further, since the light from not only the pattern surface but also the back surface of the pattern is reflected, it is difficult to inspect the pattern surface for defects.

JP 2003-157520 A

  An object of this invention is to confirm easily the presence or absence of the defect of a resin stamper.

The stamper of the present invention is suitable for an ultraviolet curable resin layer provided as a mask for forming a track pattern and / or an address pattern on the surface of a perpendicular magnetic recording layer of a perpendicular magnetic recording medium. A resin stamper having a concavo-convex pattern for transferring a pattern to be transferred,
The concavo-convex pattern has a region corresponding to a data region including a data recording portion and an address portion of the perpendicular magnetic recording medium,
While rotating the stamper, a laser having a wavelength of 450 nm or less and a laser numerical aperture NA of 0.6 or more is irradiated to the data recording unit, and in the sum signal of the voltage signal obtained based on the reflected light, the stamper When the maximum voltage value level in the frequency range of 60 to 170 times the number of revolutions is Vf and the average sum signal voltage value of the data recording unit is Vave,
The following formula (1) is satisfied.

Vf / Vave <7.7 × 10 ⁻⁴ (1)
The method for evaluating a stamper according to the present invention comprises pressing a track pattern and / or an address pattern on a surface of a perpendicular magnetic recording layer of a perpendicular magnetic recording medium against an ultraviolet curable resin layer provided as a mask. And / or a method of evaluating a stamper having a concavo-convex pattern for transferring a pattern corresponding to an address pattern to the ultraviolet curable resin layer,
The concavo-convex pattern has a region corresponding to a data region including a data recording portion and an address portion of the perpendicular magnetic recording medium,
While rotating the stamper, a laser having a wavelength of 450 nm or less and a laser numerical aperture NA of 0.6 or more is irradiated to the data recording unit, and a sum signal of voltage signals obtained based on the reflected light is transferred to the transfer state. In order to judge pass / fail, the maximum voltage value level measured by the FFT analyzer within the frequency range of 60 to 170 times the rotation speed of the stamper is Vf, and the average sum signal voltage value of the data recording unit is Vave. When
The following formula (1) is satisfied. Vf / Vave <7.7 × 10 ⁻⁴ (1).

  By using the present invention, it is possible to easily confirm the presence or absence of defects in the light transmissive stamper.

It is a block diagram which shows schematic structure of the test | inspection apparatus of a stamper. It is a figure showing the flowchart of the test | inspection method of a stamper. It is a figure which shows an example of the waveform of Have. It is a figure for demonstrating the method of producing a magnetic recording medium using the stamper of this invention. It is a figure showing the measurement result by a FFT analyzer. It is a figure showing an example of a magnetic recording device.

  The stamper used in the present invention is a pattern corresponding to the track pattern and / or address pattern on the ultraviolet curable resin layer provided as a mask for forming the track pattern and / or address pattern on the surface of the recording layer of the recording medium. And has a concavo-convex pattern having a region corresponding to a data region including a data recording portion and an address portion of the recording medium.

Furthermore, the stamper of the present invention irradiates the data recording portion with a laser having a wavelength of 450 nm or less and a laser numerical aperture NA of 0.6 or more while rotating the stamper, and a voltage signal obtained based on the reflected light. When the maximum voltage value level in the frequency range of 60 to 170 times the rotation speed of the stamper is Vf and the average sum signal voltage value of the data recording unit is Vave,
Vf / Vave <7.7 × 10 ⁻⁴ (1)
Satisfied.

  Such a resin stamper has no defects and can be used for transferring an uneven pattern to an ultraviolet curable resin layer.

The stamper evaluation method of the present invention is obtained based on the reflected light by irradiating a data recording portion with a laser having a wavelength of 450 nm or less and a laser numerical aperture NA of 0.6 or more while rotating the stamper. When the maximum voltage value level in the frequency range of 60 to 170 times the rotation speed of the stamper is Vf and the average sum signal voltage value of the data recording unit is Vave,
It is determined whether the following formula (1) is satisfied.

Vf / Vave <7.7 × 10 ⁻⁴ (1)
With the stamper evaluation method according to the present invention, the presence or absence of a stamper defect can be easily determined. This also allows a stamper without defects to be used for transferring a pattern corresponding to the track pattern.

  Further, before and after the pattern is transferred to the ultraviolet curable resin, the sum signal of the voltage signals is measured, and the value of Vf / Vave can be obtained. If this value satisfies the above equation (1) and there is no significant change in the value before and after pattern transfer, it can be determined that no defect has occurred in this stamper and it can be determined that it can be reused.

The stamper used in the present invention is:
Hereinafter, an inspection apparatus for the stamper after the ultraviolet curable resin transfer will be described.

  Here, a resin stamper for a 1.8 inch magnetic recording medium molded to a thickness of 0.6 mm is taken as an example.

  The resin stamper has a data area in a radius range of 9.0-23.0 mm from the center. The data area has a data recording portion and an address portion. The data recording portion has a track pitch of 0.1 μm (L / G = 70 nm / 30 nm) and a depth of 50 nm.

  FIG. 1 is a block diagram showing a schematic configuration of an inspection apparatus that reproduces a data area of a stamper and checks whether there is a transfer failure of an ultraviolet curable resin.

  As shown in FIG. 1, the stamper is a stamper made of, for example, a resin. A semiconductor laser light source 120 is used as the light source. The wavelength of the emitted light is, for example, in the violet wavelength band in the range of 400 nm to 410 nm. The numerical aperture NA of the laser is preferably 0.6 or more. The emitted light 110 from the semiconductor laser light source 120 is converted into parallel light by the collimator lens 121, passes through the polarization beam splitter 122 and the λ / 4 plate 123, and enters the objective lens 124. Thereafter, the light passes through the substrate of the stamper D and is focused on the surface on which the grooves are formed on the substrate. The reflected light 111 from the information recording layer of the stamper D passes through the substrate of the stamper D again, passes through the objective lens 124 and the λ / 4 plate 123, is reflected by the polarization beam splitter 122, and then passes through the condenser lens 125. Then, the light enters the photodetector 126.

  The light receiving unit of the photodetector 127 is normally divided into a plurality of parts, and outputs a current corresponding to the light intensity from each light receiving unit. The output current is converted into a voltage by an unillustrated I / V amplifier (current / voltage conversion) and then input to the arithmetic circuit 140. The input voltage signal is arithmetically processed by the arithmetic circuit 140 into a tilt error signal, HF signal, focus error signal, track error signal, and the like. The tilt error signal is for performing tilt control, the HF signal is for reproducing recorded information, the focus error signal is for performing focus control, and the track error signal is for tracking. It is for performing control.

  The objective lens 124 can be driven by the actuator 128 in the vertical direction, the disk radial direction, and the tilt direction (radial direction and / or tangential direction), and is controlled by the servo driver 150 so as to follow the information track on the stamper D. Is done.

  In this inspection apparatus, an example of the wavelength of the semiconductor laser is in the range of 400 to 410 nm. However, the present invention is not limited to this, and a shorter wavelength may be used.

  Moreover, although NA was 0.6 or more, the larger the NA, the smaller the spot diameter of the laser, and finer defects can be found.

  The stamper of the present invention can be regenerated using such a stamper inspection device. In this example, DDU-1000 manufactured by Pulstec was used. The laser wavelength at this time was 405 nm and NA (numerical aperture) was 0.65. The laser spot diameter is about 0.6 μm, which is about 6 times the track pitch of the data recording portion. Therefore, when this pattern is reproduced, the unevenness of the pattern of the data recording portion is not visible from the reflected light of the laser, but is detected as a constant reflected light. The same applies to the address portion, and a detailed pattern cannot be detected by reflected light. Therefore, there is an advantage that the overall tendency can be easily examined without being confused by each signal intensity.

  Next, a method for inspecting the stamper after transferring the ultraviolet curable resin will be described.

  FIG. 2 is a flowchart showing the stamper inspection method of the present invention.

  A stamper was set in the evaluation apparatus, and in this example, the stamper was rotated at a linear velocity of 1.2 m / s (ST1).

  Laser irradiation is performed (ST2), the tilt and offset are adjusted to the maximum difference signal (push-pull signal), and focusing is performed (ST3). Take the output signal of the sum signal from the evaluation device and capture the waveform with a digital oscilloscope. An average voltage value Vave of the data recording portion for one rotation is obtained (ST5).

  Here, an example of the waveform of the obtained Vave is shown in FIG.

  This waveform is obtained by extracting a part of the waveform for one rotation. However, the waveform is a mixture of the address part and the data recording part, and only the signal level of the data recording part is examined. A typical voltage value Vave is examined for one rotation and used for calculation.

  Next, the output signal of the sum signal was observed with an FFT analyzer (using Ono Sokki's CF-5210). The measurement conditions of the FFT analyzer are data obtained by averaging 100 samples.

  At a linear velocity of 1.2 m / s, the frequency of one rotation at r = 22.5 mm is 8.5 Hz, the frequency of 60 times is 510 Hz, and the frequency of 170 times is 1445 Hz. A value having a maximum voltage value between 510 Hz and 1445 Hz is extracted, and this is defined as Vf.

  The quality of the transfer state is determined by normalizing the Vf thus obtained with the previously obtained Vave.

  It should be noted that only one radial position may be measured here, or several or a whole stamper may be examined. The best method is to examine the entire stamper. However, if the transfer is insufficient, defects due to the remaining UV curable resin occur on the entire surface.

When Vf / Vave is smaller than 7.7 × 10 ⁻⁴ , the transfer is OK, and the used resin stamper can be reused if necessary (ST6). If this value is larger than 7.7 × 10 ⁻⁴ , the transfer is not good, and the magnetic recording medium becomes defective due to transfer failure (ST7).

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  First, a medium manufacturing method common to each example and comparative example will be described.

  The transparent resin stamper is produced by the following method.

  First, a resist was applied to the master, and a servo area and a data area were drawn by electron beam lithography to produce a resist master. A positive resist was used, and the resist thickness was 50 nm. The uneven pattern corresponding to the discrete track in the data area had a track pitch (TP) of 100 nm.

  The resist master was electroformed to produce a Ni stamper for injection molding. As the Ni stamper, any of a so-called father stamper first produced from the master, a mother stamper replicated from the father stamper by the electroforming method, and a sun stamper further replicated from the mother stamper by the electroforming method may be used. Good.

  Using one Ni stamper, resin-made transparent stampers A to D were respectively produced by injection molding. Polycarbonate (PC) may be used as the material for the transparent stamper. However, considering releasability from the ultraviolet curable resin, cycloolefin polymer (COP), cycloolefin copolymer (COC), polymethyl methacrylate (PMMA) ) Etc. can be used. In each material, an organic compound having a fluorine substituent or silicon can be mixed as a release agent.

  Here, a cycloolefin polymer was used as a material for the transparent stamper.

  FIG. 4 is a diagram for explaining a method of producing a magnetic recording medium using the stamper of the present invention.

  As shown in FIG. 4A, magnetic layers 52 were formed on both surfaces of a donut glass substrate 51 that is a medium substrate.

  As the magnetic layer, a so-called perpendicular double-layer medium having a perpendicular magnetic recording layer on a soft magnetic (backing) layer can be formed.

  For the soft magnetic (backing) layer, for example, a material containing Fe, Ni, or Co can be used. Examples of such materials include FeCo alloys such as FeCo and FeCoV, FeNi alloys such as FeNi, FeNiMo, FeNiCr, and FeNiSi, FeAl alloys, FeSi alloys such as FeAl, FeAlSi, FeAlSiCr, FeAlSiTiRu, and FeAlO. Examples thereof include FeTa, FeTaC, and FeTaN, and FeZr alloys such as FeZrN.

  The perpendicular magnetic recording layer contains Co as a main component and contains Pt, and can be made of a material optionally containing an oxide. As this oxide, silicon oxide and titanium oxide can be selected.

  In the perpendicular magnetic recording layer, magnetic particles (crystal grains having magnetism) are preferably dispersed in the layer. The magnetic particles preferably have a columnar structure penetrating the perpendicular magnetic recording layer vertically. By forming such a structure, the orientation and crystallinity of the magnetic particles in the perpendicular magnetic recording layer are improved, and as a result, a signal / noise ratio (S / N ratio) suitable for high-density recording can be obtained. it can. In order to obtain such a structure, the amount of oxide to be contained is important. The oxide content is preferably 3 mol% or more and 12 mol% or less with respect to the total amount of Co, Cr, and Pt. More preferably, it is 5 mol% or more and 10 mol% or less. The above range is preferable as the content of the oxide in the perpendicular magnetic recording layer because, when the layer is formed, the oxide is precipitated around the magnetic particles, so that the magnetic particles can be isolated and refined. It is.

  The thickness of the perpendicular magnetic recording layer is preferably 5 to 60 nm, more preferably 10 to 40 nm. Within this range, the magnetic recording / reproducing apparatus suitable for higher recording density can be operated. If the thickness of the perpendicular magnetic recording layer is less than 5 nm, the reproduction output tends to be too low and the noise component tends to be higher. If the thickness of the perpendicular magnetic recording layer exceeds 40 nm, the reproduction output is too high. There is a tendency to distort the waveform.

  On the magnetic layer 52 on one side of the glass substrate 51, an ultraviolet curable resin having a viscosity of 5 cps (hereinafter referred to as an ultraviolet curable resin) is spin-coated so as not to reach the center hole, and is shaken off at 10000 rpm for 30 seconds. An ultraviolet curable resin layer 61 having a thickness T1 of 60 nm was formed.

  As shown in FIG. 4B, a resin-made first transparent stamper 71 on which an uneven pattern was formed was prepared.

  In the vacuum chamber 81, one surface of the glass substrate 51 and the pattern surface of the first transparent stamper 71 were bonded via the ultraviolet curable resin layer 61 in a vacuum atmosphere of 103 Pa or less.

  As shown in FIG. 4C, the vacuum was released, and the UV curable resin layer 61 was cured by irradiating UV through the first transparent stamper 71 under atmospheric pressure. The time required for curing depends on the curing characteristics of the polymerization initiator contained in the ultraviolet curable resin used and the ability of the UV light source, but it can usually be cured in several tens of seconds.

  As shown in FIG. 4D, the first transparent stamper 71 was peeled from the glass substrate 51 to form an ultraviolet curable resin layer 61 to which the concavo-convex pattern was transferred. The thickness T2 of the ultraviolet curable resin layer 61 remaining in the recess was 30 nm.

  In this embodiment, the ultraviolet curable resin is applied to the glass substrate, but the ultraviolet curable resin may be applied to the pattern surface of the transparent stamper, or the ultraviolet curable resin is applied to both the glass substrate and the transparent stamper. May be.

  The first resin stamper 71 used here was inspected with the above inspection apparatus.

  The experiment was performed four times, and the stampers used were stamper A, stamper B, stamper C, and stamper D, respectively.

The Vf / Vave value obtained as a result, the transfer status to the ultraviolet curable resin layer, and the bit error rate are shown in Table 1 below.

  In addition, the state of transfer to the ultraviolet curable resin layer is a double circle when there is no defect caused by transfer peeling when observed with an optical microscope, and a case where there are 1 to 3 defects caused by transfer peeling. When the number of defects generated by transfer peeling was 4 or more, each was evaluated as x.

  Moreover, the FFT analyzer evaluation result used at this time is shown in FIG.

In the stamper A, Vf = 1.01 × 10 ⁻⁴ V, Vave = 0.1328 V, and thus Vf / Vave = 7.62 × 10 ⁻⁴ . When the transfer state of the magnetic recording medium after peeling was observed with an atomic force microscope (AFM), no problem was found.

In the stamper B, Vf = 6.71 × 10 ⁻⁵ V and Vave = 0.1315 V, and thus Vf / Vave = 5.10 × 10 ⁻⁴ . When the transfer state of the magnetic recording medium after peeling was observed with an AFM, it was transferred sharper than the stamper A.

In the stamper C, Vf = 3.06 × 10 ⁻⁴ V and Vave = 0.1267 V, and thus Vf / Vave = 2.41 × 10 ⁻³ . When the transfer state of the magnetic recording medium after peeling was observed with an AFM, it was found that the shape was disordered.

In the stamper D, Vf = 1.02 × 10 ⁻⁴ V and Vave = 0.1288 V, and thus Vf / Vave = 2.89 × 10 ⁻⁴ . When the transfer state of the magnetic recording medium after peeling was observed with an AFM, it was found that the shape was disordered.

  Next, as shown in FIG. 4E, the residual of the ultraviolet curable resin 61 was removed by oxygen gas RIE (reactive ion etching). Subsequently, as shown in FIG. 4 (f), magnetic material processing was performed by etching using an Ar ion beam (Ar ion milling) using an etching mask from which residues generated in the imprint process were removed. Further, after milling, the ultraviolet curable resin was peeled off. Etch back is performed until the carbon protective film on the magnetic film is exposed. After the etch back, a C protective film (not shown) was formed, and a magnetic recording medium was produced as shown in FIG.

  FIG. 6 shows a magnetic recording apparatus for performing RRO evaluation and recording / reproducing of the magnetic recording medium.

  The magnetic recording device 60 includes a magnetic recording medium 62, a spindle motor 63 that rotates the magnetic recording medium 62, a head slider 64 that includes a recording / reproducing head, and a head suspension that supports the head slider 64. An assembly (suspension 65 and actuator arm 66), a voice coil motor 67, and a circuit board are provided.

  The magnetic recording medium 62 is attached to a spindle motor 63 and rotated, and various digital data are recorded by a perpendicular magnetic recording method. The magnetic head incorporated in the head slider 64 is a so-called composite type head, and includes a single magnetic pole structure write head and a read head using a GMR film, a TMR film, or the like. A suspension 65 is held at one end of the actuator arm 66, and the head slider 64 is supported by the suspension 65 so as to face the recording surface of the magnetic recording medium 62. The actuator arm 66 is attached to the pivot 68. A voice coil motor 67 is provided at the other end of the actuator arm 64 as an actuator. The head suspension assembly is driven by the voice coil motor 67 to position the magnetic head at an arbitrary radial position of the magnetic recording medium 62. The circuit board includes a head IC, and generates a drive signal for the voice coil motor, a control signal for controlling reading and writing by the magnetic head, and the like. Information was recorded using this magnetic disk device, and the recorded signal was reproduced to measure the bit error rate.

  In the magnetic recording medium transferred from the stamper A and processed, a good result was obtained with a bit error rate (bER) of −6.3 digits. Note that the bit error rate in this embodiment is defined as good when it is -6 digits or less when the track center is measured.

  In the magnetic recording medium transferred from the stamper B and processed, a good result was obtained with a bit error rate (bER) of −7.1 digits.

  In the magnetic recording medium transferred from the stamper C and processed, the head could not float on the magnetic recording medium due to uneven transfer, and the recording / reproducing characteristics could not be examined.

  In the magnetic recording medium transferred from the stamper D and processed, the bit error rate (bER) was as bad as -5.1 digits.

From the above experimental results, it can be said that when Vf / Vave <7.7 × 10 ⁻⁴ , the transfer of the magnetic recording medium after peeling is good.

  Here, the stampers A and B, which had good transfer, were reused, and pattern transfer was performed again in the same manner as the magnetic recording medium A to process the magnetic recording medium.

Information was similarly recorded on this magnetic recording medium, and the recorded signal was reproduced and the bit error rate was measured. In the magnetic recording medium E transferred from the reused stamper A and processed,
A good result was obtained with a bit error rate (bER) of -6.5 digits.

  With the magnetic recording medium F transferred from the reused stamper B and processed, a good result was obtained with a bit error rate (bER) of −6.7 digits.

  In addition, the resin stamper after molding (before transfer) can be inspected similarly to the resin stamper after transfer.

  By inspecting the stamper after using the ultraviolet curable resin transfer with an optical inspection device, it is possible to determine whether the transfer to the magnetic recording medium is simple or not. In addition, when a favorable result is obtained in the evaluation of the stamper, it is possible to omit the inspection of the magnetic recording medium after transferring the ultraviolet curable resin, and accordingly, the risk of generating defects can be reduced. Further, a stamper in which no defect is found by this inspection can be reused, and resources can be used without waste.

  In this embodiment, the defect inspection using the resin stamper has been described. However, the present invention is not limited to this. For example, the same process is performed when a light-transmitting stamper having a pattern formed on quartz or glass is used. It becomes possible. In particular, quartz and glass are more expensive than resin stampers, so it is important to inspect whether they can be used repeatedly, and the inspection using the present invention is very useful.

In this embodiment, the resin stamper having both the track pattern and the address pattern is used as a pattern. However, a light transmissive stamper having a pattern of only the address portion can also be used.

  62 ... Recording medium, 61 ... Recording layer, ... UV curable resin layer, 71 ... Resin stamper

Claims (5)

A pattern corresponding to the track pattern and / or address pattern by being pressed against an ultraviolet curable resin layer provided as a mask for forming the track pattern and / or address pattern on the surface of the perpendicular magnetic recording layer of the perpendicular magnetic recording medium Is a stamper having a concavo-convex pattern for transferring the ultraviolet curable resin layer,
The concavo-convex pattern has a region corresponding to a data region including a data recording portion and an address portion of the perpendicular magnetic recording medium,
While rotating the stamper, the data recording unit is irradiated with a laser having a wavelength of 450 nm or less and a laser numerical aperture NA of 0.6 or more, and a sum signal of voltage signals obtained based on the reflected light is applied to the FFT analyzer. When the maximum voltage value level in the frequency range of 60 times to 170 times the rotation speed of the stamper measured by the above is Vf and the average sum signal voltage value of the data recording unit is Vave,
The stamper characterized by satisfy | filling following formula (1).
Vf / Vave <7.7 × 10 ⁻⁴ (1) Before transferring the pattern to the ultraviolet curable resin layer and after transferring the pattern, the maximum voltage value level Vf and the average sum signal voltage value are Vave,
The stamper characterized by satisfy | filling following formula (1).
Vf / Vave <7.7 × 10 ⁻⁴ (1)
The stamper according to claim 1, wherein: A pattern corresponding to the track pattern and / or address pattern by being pressed against an ultraviolet curable resin layer provided as a mask for forming the track pattern and / or address pattern on the surface of the perpendicular magnetic recording layer of the perpendicular magnetic recording medium Is a method for evaluating a stamper having a concavo-convex pattern for transferring to the ultraviolet curable resin layer,
The concavo-convex pattern has a region corresponding to a data region including a data recording portion and an address portion of the perpendicular magnetic recording medium,
While rotating the stamper, a laser having a wavelength of 450 nm or less and a laser numerical aperture NA of 0.6 or more is irradiated to the data recording unit, and in the sum signal of the voltage signal obtained based on the reflected light, the stamper When the maximum voltage value level in the frequency range of 60 to 170 times the number of revolutions is Vf and the average sum signal voltage value of the data recording unit is Vave,
A stamper evaluation method satisfying the following formula (1):
Vf / Vave <7.7 × 10 ⁻⁴ (1) Before and after transferring the pattern corresponding to the track pattern to the UV curable resin,
The maximum voltage value level Vf and the average sum signal voltage value are expressed by the following equation (1).
The method for evaluating a stamper according to claim 3, wherein it is determined whether or not the condition is satisfied.
Vf / Vave <7.7 × 10 ⁻⁴ (1) The relationship between the maximum voltage value level Vf before and after transfer of the pattern corresponding to the track pattern and the average sum signal voltage value Vave satisfies the following formula (1), and Vf / 5. The stamper evaluation method according to claim 4, wherein the reuse of the stamper is determined when the values of Vave are the same.
Vf / Vave <7.7 × 10 ⁻⁴ (1)

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