JP2018031612A - Optical device and inspection system - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an optical device which can realize a highly-accurate inspection system for a wavelength multiplex type optical transceiver, even while system construction is easy, and an inspection system.SOLUTION: An optical device 1 for inspecting a wavelength multiplex type optical transceiver 11 includes: a plurality of optical attenuators 2 into which optical signals with wavelengths different from each other are input, and which adjust optical intensity of the input optical signals, so as to output the optical signals; an optical multiplexer 3 for multiplexing the optical signals output from the plurality of optical attenuators 2, so as to output them to the wavelength multiplex type optical transceiver 11; and a housing 7 for integrally storing the plurality of optical attenuators 2 and the optical multiplexer 3.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an optical apparatus and an inspection system for inspecting a wavelength division multiplexing optical transceiver.

  In recent years, optical transceivers that can transmit large-capacity signals of 10 Gbit / sec to 40 Gbit / sec are widely used. As an optical transceiver, a wavelength division multiplexing optical transceiver is known in which a plurality of optical signals having different wavelengths are multiplexed and signal transmission is performed using a single optical fiber.

  When checking the reception sensitivity characteristics of a wavelength division multiplexing optical transceiver, the error detector (ED) calculates the code error rate for input light of a specific optical power incident from a light source driven by a pulse pattern generator (PPG). The reception sensitivity characteristic is generally obtained by plotting and extrapolating the result as a code error rate curve.

  As an inspection system that uses the reception sensitivity characteristics of a wavelength division multiplexing optical transceiver for inspection, a single-wavelength light source that emits an optical signal of one wavelength is used, the optical signal from the single-wavelength light source is input to the optical attenuator, and light is emitted by the optical attenuator. 2. Description of the Related Art A system is known that attenuates and adjusts the light intensity of a signal and inputs the signal to a device under test (DUT) optical transceiver.

  In addition, as another inspection system, a wavelength multiplexing optical transceiver different from the DUT optical transceiver or a wavelength multiplexing light source having the same performance as the wavelength multiplexing optical transceiver is used as a light source, and an optical signal (wavelength from the light source) There is known a system in which a multiplexed optical signal) is input to an optical attenuator, the level of the optical signal is adjusted by the optical attenuator, and the optical signal is input to a DUT optical transceiver.

  In addition, there exists patent document 1 as prior art document information relevant to invention of this application.

JP 2003-139552 A

  However, in an inspection system using a single wavelength light source and a single optical attenuator, the inspection is repeated multiple times (the same number of wavelengths multiplexed by the wavelength multiplexing optical transceiver) using single wavelength light sources having different wavelengths. Need to be done, and a great deal of time and effort is required. Although it is conceivable to shorten the inspection time by using a plurality of single wavelength light sources and an optical switch, an optical multiplexer, or the like, in this case, the inspection system becomes complicated and the system construction becomes difficult.

  In addition, in an inspection system using a wavelength-multiplexed light source and one optical attenuator, the system construction is easy, but it is difficult to equalize the optical power of optical signals of each wavelength with the optical attenuator. There is a problem from the viewpoint of accuracy.

  Therefore, an object of the present invention is to provide an optical apparatus and an inspection system that can realize a highly accurate inspection system for a wavelength division multiplexing optical transceiver while being easy to construct a system.

  In order to solve the above-described problems, the present invention provides an optical device used for inspection of a wavelength division multiplexing optical transceiver, in which optical signals having different wavelengths are input and the light intensity of the input optical signal is adjusted. A plurality of optical attenuators that can be output, an optical multiplexer that multiplexes optical signals output from the plurality of optical attenuators and outputs them to the wavelength division multiplexing optical transceiver, the plurality of optical attenuators, and the optical multiplexer An optical device is provided.

  In order to solve the above problems, the present invention includes the optical device and a light source that outputs an optical signal for inspection, and the optical signal output from the light source passes through the optical device. And an inspection system that is output to the wavelength division multiplexing optical transceiver to be inspected.

  ADVANTAGE OF THE INVENTION According to this invention, the optical apparatus and test | inspection system which can implement | achieve the test | inspection system for wavelength division multiplexing type optical transceivers with high precision while being system construction easy can be provided.

1 is a schematic configuration diagram of an inspection system using an optical device according to an embodiment of the present invention. It is a schematic block diagram of the test | inspection system using the optical apparatus which concerns on one modification of this invention.

[Embodiment]
Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings.

(Overall configuration of inspection system)
FIG. 1 is a schematic configuration diagram of an inspection system using the optical device according to the present embodiment.

  As shown in FIG. 1, the inspection system 10 is for inspecting the reception sensitivity characteristic of the wavelength division multiplexing optical transceiver 11, and outputs the optical device 1 according to the present embodiment and an optical signal for inspection. A light source 12. The inspection system 10 is configured so that the optical signal output from the light source 12 is output to the wavelength division multiplexing optical transceiver 11 to be inspected via the optical device 1.

  In the present embodiment, as the light source 12, a plurality of single wavelength light sources 12a that emit optical signals of one wavelength (wavelength band) are used. Each single wavelength light source 12a outputs optical signals having different wavelengths (wavelength bands) and has a wavelength (wavelength band) used in each channel in the wavelength division multiplexing optical transceiver 11 to be inspected. An optical signal (that is, an optical signal having a wavelength to be inspected) is output.

  Although not shown, each single wavelength light source 12a is connected to a pulse pattern generator that drives the single wavelength light source 12a and generates an optical signal for inspection.

  Although not shown, the inspection system 10 includes a control device 13 that controls the pulse pattern generator and the like. The control device 13 is realized by executing predetermined software on a personal computer, for example.

  The control device 13 includes a light source control unit 13a that controls an optical signal output from the light source 12 by controlling a pulse pattern generator (not shown).

  Further, the control device 13 has an error detector 13 b that calculates the code error rate of the signal received by the wavelength division multiplexing optical transceiver 11 with respect to the optical signal output from the light source 12. The reception sensitivity characteristic can be obtained by plotting and extrapolating the code error rate obtained by the error detector 13b as a code error rate curve. The control device 13 receives an electrical signal output from the wavelength division multiplexing optical transceiver 11 (an electrical signal obtained by photoelectrically converting the optical signal received from the optical device 1).

  Furthermore, the control device 13 includes a light intensity control unit 13c that controls the attenuation amount in each optical attenuator 2 of the optical device 1 described later. Details of the light intensity control unit 13c will be described later.

(Description of optical device 1)
The optical device 1 adjusts the light intensity of the optical signal of each wavelength input from the light source 12 to a desired light intensity (for example, the light intensity specified in the inspection), and the light of each wavelength whose light intensity is adjusted. This is a device that multiplexes and multiplexes signals and outputs them to the wavelength division multiplexing optical transceiver 11 to be inspected.

  The optical device 1 according to the present embodiment receives a plurality of optical attenuators 2 that can input optical signals having different wavelengths and can adjust and output the optical intensity of the input optical signals, and outputs from the plurality of optical attenuators 2. The optical multiplexer 3 that multiplexes the optical signals that have been combined and outputs them to the wavelength division multiplexing optical transceiver 11, and the housing 7 that integrally accommodates the plurality of optical attenuators 2 and the optical multiplexer 3.

  Further, in the present embodiment, the optical device 1 includes the same number of input ports 5 and one output port 6 as the plurality of single wavelength light sources 12a. The plurality of single wavelength light sources 12a are optically connected to the plurality of input ports 5 of the optical device 1, respectively. The output port 6 is optically connected to the input of the wavelength division multiplexing optical transceiver 11 to be inspected.

  The input port 5 and the output port 6 are, for example, optical connectors such as an SC connector fixed to the housing 7. An optical cable (optical fiber) can be used for the connection between the single wavelength light source 12a and the input port 5 and the connection between the output port 6 and the wavelength division multiplexing optical transceiver 11.

  Each input port 5 is optically connected to the input of the optical attenuator 2 in the housing 7. In the housing 7, the same number of optical attenuators 2 as the input ports 5 (the same number as the single wavelength light sources 12a) are accommodated. The optical signal output from each single wavelength light source 12 a is input to the optical attenuator 2 via the input port 5.

  The output of each optical attenuator 2 is optically connected to the input of the optical multiplexer 3 in the housing 7. The output of the optical multiplexer 3 is optically connected to the output port 6 in the housing 7. An optical fiber can be used for optical connection between the members in the housing 7.

  The optical attenuator 2 adjusts to a desired light intensity (for example, a light intensity defined by inspection) by attenuating the input optical signal. In the present embodiment, the attenuation amount of each optical attenuator 2 is controlled by the light intensity control unit 13 c of the control device 13.

  In addition, the optical device 1 according to the present embodiment is provided between each of the plurality of optical attenuators 2 and the optical multiplexer 3 and can detect the optical intensity of the optical signal output from the corresponding optical attenuator 2. The optical monitor mechanism 4 is further provided.

  Each optical monitor mechanism 4 detects a light demultiplexer 4a for branching a part of the optical signal output from the corresponding optical attenuator 2, and the light intensity of the light branched by the monitor optical demultiplexer 4a. Each of which has an optical sensor 4b. In the present embodiment, the output of each optical sensor 4 b is output to the control device 13.

  The light intensity control unit 13c of the control device 13 is based on the output of each optical sensor 4b (the optical intensity detected by each optical sensor 4b), or the optical intensity (or light) of the optical signal output from each optical attenuator 2. The light intensity of the optical signal that passes through the monitoring optical demultiplexer 4a of the monitor mechanism 4 and is input to the optical multiplexer 3 is calculated, and the light intensity is set in advance by a target light intensity (for example, specified by inspection) The attenuation amount of each optical attenuator 2 is controlled so that the optical intensity of the optical attenuator 2 can be obtained.

  In the present embodiment, the light intensity control unit 13c of the control device 13 controls the attenuation amount of each optical attenuator 2 so that the optical intensity of the optical signal output from each optical attenuator 2 becomes equal. That is, in this embodiment, the target light intensity of each optical attenuator 2 is set to the same value. In this case, for example, the light intensity of the optical signal output from each optical attenuator 2 is set to the minimum light intensity (or a predetermined light intensity equal to or less than the minimum light intensity) as the target light intensity, and each light The attenuation amount of the attenuator 2 may be controlled.

(Operation and effect of the embodiment)
As described above, the optical device 1 according to the present embodiment includes a plurality of optical attenuators 2 that can input optical signals having different wavelengths and can output the optical signals by adjusting the optical intensity of the input optical signals. An optical multiplexer 3 that multiplexes the optical signals output from the optical attenuator 2 and outputs the multiplexed optical signal to the wavelength division multiplexing optical transceiver 11, and a housing 7 that integrally accommodates the optical attenuators 2 and the optical multiplexer 3. It is equipped with.

  In the optical apparatus 1, the optical intensity of each wavelength optical signal output to the wavelength division multiplexing optical transceiver 11 can be individually adjusted by the plurality of optical attenuators 2, so that the optical signals of the multiplexed optical signals as in the past are collectively processed. As compared with the case where the adjustment is performed, the optical intensities of the optical signals of the respective wavelengths can be made equal, and the inspection accuracy can be increased.

  Further, in the optical device 1, since the plurality of optical attenuators 2 and the optical multiplexer 3 are integrally accommodated in the housing 7, the plurality of optical attenuators 2 and the optical multiplexer 3 are used separately. In comparison, the construction of the inspection system 10 is facilitated. That is, by using the optical device 1 according to the present embodiment, it is possible to realize the inspection system 10 for the wavelength division multiplexing optical transceiver 11 with high accuracy while the system construction is easy.

  Further, in the optical device 1, a plurality of optical monitor mechanisms 4 provided between the plurality of optical attenuators 2 and the optical multiplexer 3 and capable of detecting the light intensity of the optical signal output from the corresponding optical attenuator 2 are provided. It has more.

  By providing the optical monitoring mechanism 4, it becomes possible to constantly monitor the optical intensity of the optical signal output from the optical attenuator 2, and to attenuate the optical attenuator 2 more precisely based on the monitored optical intensity. It is possible to control the amount and adjust the light intensity of the optical signal of each wavelength output to the wavelength division multiplexing optical transceiver 11 more precisely.

(Modification)
In the above embodiment, a plurality of single-wavelength light sources 12a are used as the light source 12. However, as in the inspection system 10a shown in FIG. 2, the light source 12 is an optical signal obtained by multiplexing a plurality of optical signals having different wavelengths. A wavelength-multiplexed light source 12b that outputs an optical signal) may be used. In FIG. 2, the control device 13 is omitted.

  As the wavelength multiplexing type light source 12b, a wavelength multiplexing type optical transceiver having a performance equivalent to that of the wavelength multiplexing type optical transceiver 11 to be inspected may be used. May be used as the wavelength-multiplexed light source 12b.

  The optical device 1a used in the inspection system 10a is provided with one input port 5 to which the multiplexed optical signal from the wavelength multiplexing type light source 12b is input. The optical device 1 a also includes an optical demultiplexer 8 that demultiplexes the multiplexed optical signal from the input port 5 for each wavelength and outputs the demultiplexed optical signal to the plurality of optical attenuators 2. The optical demultiplexer 8 is accommodated in the housing 7.

  In the inspection system 10a, since the number of the light sources 12 is one, the inspection system 10a that is simpler and easier to construct can be realized by using the optical device 1a in which the optical demultiplexer 8 is accommodated in the housing 7.

(Summary of embodiment)
Next, the technical idea grasped from the embodiment described above will be described with reference to the reference numerals in the embodiment. However, the reference numerals and the like in the following description are not intended to limit the constituent elements in the claims to the members and the like specifically shown in the embodiments.

[1] An optical apparatus (1) used for inspection of a wavelength division multiplexing optical transceiver (11), which can input optical signals having different wavelengths and adjust and output the optical intensity of the input optical signals. An optical attenuator (2), an optical multiplexer (3) for multiplexing the optical signals output from the plurality of optical attenuators (2) and outputting them to the wavelength division multiplexing optical transceiver (11), and the plurality of the optical attenuators (2) An optical device (1) comprising an optical attenuator (2) and a housing (7) that integrally accommodates the optical multiplexer (3).

[2] A plurality of optical attenuators (2) provided between the plurality of optical attenuators (2) and the optical multiplexer (3), respectively, capable of detecting the light intensity of the optical signals output from the corresponding optical attenuators (2). The optical device (1) according to [1], further comprising an optical monitoring mechanism (4).

[3] [1] or [2] provided with a plurality of input ports (5) to which optical signals having different wavelengths are input and respectively optically connected to the inputs of the plurality of optical attenuators (2) ] The optical apparatus (1).

[4] One input port (5) to which an optical signal obtained by multiplexing a plurality of optical signals having different wavelengths is input, and is accommodated in the casing (7), and is received from the input port (2). An optical demultiplexer (1a) according to [1] or [2], comprising: an optical demultiplexer (8) that demultiplexes an optical signal for each wavelength and outputs the demultiplexed optical signal to the plurality of optical attenuators (2).

[5] An optical device (1) according to any one of [1] to [4], and a light source (12) that outputs an optical signal for inspection, and output from the light source (12). The inspection system (10), wherein the optical signal is output to the wavelength division multiplexing optical transceiver (11) to be inspected via the optical device (1).

  While the embodiments of the present invention have been described above, the embodiments described above do not limit the invention according to the claims. In addition, it should be noted that not all the combinations of features described in the embodiments are essential to the means for solving the problems of the invention.

  The present invention can be appropriately modified and implemented without departing from the spirit of the present invention.

DESCRIPTION OF SYMBOLS 1 ... Optical apparatus 2 ... Optical attenuator 3 ... Optical multiplexer 4 ... Optical monitor mechanism 4a ... Optical demultiplexer for monitoring 4b ... Optical sensor 5 ... Input port 6 ... Output port 7 ... Case 10 ... Inspection system 11 ... Wavelength multiplexing Type optical transceiver 12 ... light source 13 ... control device 13a ... light source control unit 13b ... error detector 13c ... light intensity control unit

Claims (5)

An optical device used for inspection of a wavelength division multiplexing optical transceiver,
A plurality of optical attenuators capable of outputting optical signals having different wavelengths and adjusting the light intensity of the input optical signals;
An optical multiplexer that multiplexes the optical signals output from the plurality of optical attenuators and outputs them to the wavelength division multiplexing optical transceiver;
A housing that integrally accommodates the plurality of optical attenuators and the optical multiplexer;
Optical device. A plurality of optical monitor mechanisms provided between the plurality of optical attenuators and the optical multiplexer, respectively, and capable of detecting the light intensity of the optical signal output from the corresponding optical attenuator;
The optical device according to claim 1. Optical signals having different wavelengths from each other are input, and a plurality of input ports that are optically connected to the inputs of the plurality of optical attenuators are provided.
The optical device according to claim 1. One input port to which an optical signal obtained by multiplexing a plurality of optical signals having different wavelengths is input;
An optical demultiplexer that is housed in the housing and demultiplexes the optical signal from the input port for each wavelength and outputs the demultiplexed optical signals to the plurality of optical attenuators.
The optical device according to claim 1. An optical device according to any one of claims 1 to 4,
A light source that outputs an optical signal for inspection,
The optical signal output from the light source is output to the wavelength division multiplexing optical transceiver to be inspected via the optical device.
Inspection system.

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