JP3757155B2 - Spectroscopic analyzer - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a spectroscopic analysis apparatus that performs chemical analysis using a photometer, and in particular, it is possible to easily perform analysis procedure creation and result processing for handling chemical analysis in a special field, and those procedures. The present invention relates to a spectroscopic analyzer that can be easily changed.
[0002]
[Prior art]
The analyzers using spectrophotometers that have been put to practical use have been mainly research and development in laboratories and the like, and often analyzed a wide variety of samples. However, in recent years, spectrophotometers have become cheaper, and demand is increasing in fields such as routine analysis such as quality inspection of industrial products. For such purposes, if you want to determine the ratio of the abundance between specific inclusions, or to achieve a specific analysis method, change the analysis conditions based on the analysis results, and further remeasure, There was a case where I wanted to perform an analysis that was a very complicated operation. In the traditional method, all this was done by analysts.
[0003]
Taking the measurement of the characteristics of an optical filter with a photometer as an example, there is a case where it is desired to confirm in detail the entire used wavelength band and a portion where the change near the transient band wavelength is steep. In such a case, first, obtain a profile for the entire wavelength band to be used with low resolution, then select the part where the change near the transient band wavelength is steep, and select the vicinity of that wavelength. The measurement procedure of measuring again with high resolution was performed. This is because scanning with high resolution takes time and the amount of information becomes enormous, so that measurement within a limited range is desired.
[0004]
Because the target wavelength may fluctuate due to variations in individual characteristics of the optical filter, even if you try to acquire a detailed scan wavelength range in advance and acquire it with high resolution, a profile is acquired when the variation is outside the acquisition range. It becomes impossible. When the target profile could not be observed accurately in this way, it was necessary to adjust the scan range and repeat the measurement.
[0005]
When it is necessary to measure a large amount of samples, the measurer needs to repeat this entire procedure, and thus it is required to repeat a very complicated operation. For this reason, measurement failure due to an operator's mistake and data reliability degradation have been problems.
[0006]
Repeating such complicated procedures can be a problem, so some users have requested measurement equipment manufacturers to develop applications specialized for the measurements they want to perform in the form of special orders. Was. In this case, although the problem of complexity is solved, it is difficult to change the developed application on the user side, so even if you want to divert to the same kind of analysis, due to slight differences in application conditions There were occasions when the application was re-developed.
[0007]
For these reasons, in analytical applications using photometers, it is desirable to have a method that can easily implement a specific measurement method, and a method that can easily transfer and reuse the created analysis procedure for other types of analysis. It was.
[0008]
[Problems to be solved by the invention]
Conventional general-purpose analyzers using photometers measure the intensity of light at a target wavelength or use light-specific phenomena to allow a liquid containing a certain component to transmit light at a specific wavelength. In general, the purpose is to measure the abundance of a specific substance in an analysis sample by utilizing a phenomenon that causes a change.
[0009]
In such an analyzer, the phenomenon that the user wants to observe is not directly observable, such as the intensity of a specific wavelength, but is used for measurement such as the difference in light intensity between two wavelengths or the transmission characteristics by wavelength. When it is necessary to devise, it is often necessary to repeat the measurement or to perform a manual calculation by the user using the measurement result.
[0010]
In addition, there are analyzers that can program measurement procedures and calculation processes for such fields. Some of these analyzers can collectively process the measurement and calculation intended by the user. However, such an apparatus requires knowledge about computer programming, and is difficult for general analytical instrument users. If the user does not have the skill to create a program, there is a case where the development of a dedicated application is requested to the manufacturer in the form of a special order as another method, but such an application cannot be diverted to other analysis, Further, since the development cost is a burden on the user, it is very expensive.
[0011]
Therefore, the object of the present invention is to make it possible to easily create and execute an analysis procedure and a processing process of a measurement result without using a programming language in a routine analysis field using a spectroscopic analyzer, and further to analyze the procedure. Can be changed more easily than before Spectroscopic analyzer Is to provide.
[0012]
[Means for Solving the Problems]
In order to solve the above object, the present invention A spectroscopic analyzer executes analysis processing control and measurement result processing of a spectroscopic analyzer by a computer, and creates a program of processing procedures of analysis processing and measurement result processing by operating a computer screen. The tool bar for selecting one process to be performed in the process procedure, the canvas on which multiple controls indicating one process of the process procedure are arranged, and the detailed settings of the process in the control can be listed, and the detailed process is set in the control A list of setting items to perform and a variable list for defining variables for storing the results of analysis processing and measurement result processing are displayed, and one processing step is arranged in the control by operating the toolbar. The processing contents are displayed as characters and the controls are connected with arrows in each processing order. It is characterized by that.
[0013]
Further, the present invention is characterized in that functions necessary for creating an analysis procedure are individually provided, and means for arbitrarily selecting and arranging these functions in the analysis procedure is provided.
[0014]
According to the present invention, it is possible to create a measurement procedure, measurement conditions, and calculation processing intended by a user by providing an input unit that can create a measurement procedure graphically and easily. -Conditions and the like can be freely stored in a computer or the like, and the procedures and conditions can be easily executed.
[0015]
In addition, it is possible to easily change the created procedure / condition and the like, and to provide a mechanism that allows a user to easily perform an intended analysis.
[0016]
DETAILED DESCRIPTION OF THE INVENTION
Examples of the present invention will be described. FIG. 2 shows the configuration of an apparatus necessary for analysis processing according to the present invention. Here, an example of mounting on a spectrophotometer is given as an analyzer using a photometer.
[0017]
In FIG. 2, the spectroscopic analyzer is composed of a photometer device unit 207 and a computer unit 208. In the photometer device unit 207, the light emitted from the light source 200 is dispersed by the spectroscope 201 incorporating the diffraction grating 203, and Light of a specific wavelength is passed through a sample placed in the sample chamber 205, the transmitted light is measured by a detector 206, and the result is converted into a signal format that can be processed by a computer by a data processing unit 206. To communicate.
[0018]
In the photometer device unit 207, only the sample is loaded after the power is turned on, and the measurement operation and the like are performed from the computer unit 208.
[0019]
The computer unit 208 controls the entire photometer device unit 207, and can analyze the transmittance for each wavelength in the sample by processing and observing the result transmitted from the photometer device unit 207. It is also possible to directly specify the measurement wavelength and continuously observe the transmittance and intensity at that wavelength. The computer unit 208 sets conditions for measurement by the user for measurement and how to process the measurement results.
[0020]
FIG. 1 shows a screen for defining measurement conditions and processing of measurement results. In this screen, a toolbar 100 for selecting a process to be arranged, a menu 101 for selecting an application function, a canvas 102 for visually arranging measurement / result processing, a setting item list 103 for displaying setting items for the arranged process, a setting The screen includes an annotation 104 for displaying annotations of items displayed in the item list, and a variable list 105 for defining and displaying variables for storing values and results of processing steps.
[0021]
In the upper part of the tool bar 100, there is a function type button 106 for classifying the selectable functions for each type. By selecting this button, a button corresponding to each classification item is displayed. Therefore, the toolbar 100 is configured so that a desired button can be quickly selected.
[0022]
As functions that can be selected from the toolbar, for example, the following can be selected.
Measurement: Wavelength scan, wavelength monitor
Basic operations: Four arithmetic operations, function operations, judgment
Calculation by application: half width measurement, interference filter measurement, band gap measurement, background correction, threshold detection, ratio calculation, purity calculation, concentration calculation, molar concentration calculation, chlorophyll method calculation, robibond method calculation
Device control / procedure control, etc .: Wavelength shift, result display, message display, time waiting
The functions corresponding to the buttons can be added later as an option if necessary, in addition to those provided by the application standard.
[0023]
Hereinafter, an outline of an operation procedure actually performed by the measurer will be described step by step with reference to the drawings. FIG. 3 shows an outline of the creation procedure. In order to define the measurement procedure and the processing of the results, first the start control 301 is arranged. This is arranged by selecting a process to be performed from the toolbar 100 shown in FIG. 1 and then clicking an arbitrary point on the canvas 102. This square to be placed is called “control” and is placed at an arbitrary point clicked.
[0024]
Next, the control 303 is connected with the connector 303. This is to connect controls with arrows for defining the order of processing. At this time, the flow of this arrow must always start from the start and connect to the end via the process. This operation can be easily performed with a mouse attached to the computer.
[0025]
Next, variables necessary for processing are declared. This is defined by inputting an arbitrary variable name on the variable list screen 105. Further, for each control arranged on the canvas 102, detailed setting of each control is performed. For this, a control to be set is selected and set according to the item list displayed in the setting item list 103.
[0026]
The measurement procedure defining the necessary processing and order in this way can be saved. If not particularly necessary, this procedure can be omitted. It is also possible to call an operation procedure that has already been saved. In this case, it is convenient because the measurement can be performed immediately after the operation procedure is called.
[0027]
When the preparation of the operation procedure is completed, the measurement can be performed as soon as the analysis apparatus is ready, such as the introduction of the analysis sample. In the measurement, since the measurement is automatically performed according to the measurement procedure, the user does not need to perform any operation unless particularly necessary. When the measurement is completed, the result is displayed as set in the procedure. Here, the analysis result intended by the user is displayed.
[0028]
Next, taking an example of characteristic measurement of an optical filter as an actual analysis example, a detailed description will be given based on an operation procedure actually performed by a measurer.
[0029]
An optical filter is an element having a characteristic of transmitting or attenuating light with respect to light having a target wavelength. In general, in the case of using as an optical element, it is necessary to know how much transmittance / attenuation rate is in the wavelength band to be used.
[0030]
In such a characteristic measurement of the optical filter, a transmission amount profile in the entire used wavelength band is acquired, but there are cases where it is desired to acquire detailed characteristics with high resolution in the vicinity of the transient band wavelength where the transmission amount changes. At this time, if the measurement is performed with high resolution in the entire band, the amount of information becomes large and the measurement takes too much time. Therefore, only the portion where the change is steep is scanned with high resolution. The part needs to be acquired with a wide range of low resolution.
[0031]
In the measurement of this example, in order to acquire the characteristics of the long wavelength pass optical filter, first the entire used wavelength band is scanned with low resolution, and then the characteristics near the transient band wavelength are scanned with high resolution. Observe. In addition, the wavelength at the point where the transmittance is 50% is shown as a numerical value, which is the analysis result.
[0032]
First, a measurement procedure according to the above purpose is created. The state of the canvas 102 when the application is activated is shown in FIG. In the state where the application is activated, a start control 301 and an end control 305 are arranged. Among these controls, a rectangular border called a selection frame 302 appears in the start control 301 immediately after activation. This indicates that the control is the target of the editing function described later. Clicking on another control changes the selected state to the clicked control, or combining multiple controls with the keyboard operation. You can also In addition, a connector 303 is displayed on the control in the selected state, and an arrow for determining the order of measurement can be set by clicking and dragging this connector to another control.
[0033]
Controls are placed in a frame 306 indicated by a dotted line on the canvas 102, but any control can be added to a place where no control is placed. A procedure is created by arbitrarily adding a control as a unit of processing that the user wants to perform.
[0034]
In order to place a control on the canvas 102, a control to be placed is selected from the toolbar 100, and when an arbitrary position on the canvas 102 where the control is to be placed is clicked, the control is placed at that position. If a control that has already been arranged is clicked without selecting the control to be arranged, the control is selected, and the position can be moved, the setting item can be input, copied, and deleted.
[0035]
Also, by dragging so as to enclose a plurality of controls on the canvas 102, all of these can be selected, and can be moved, copied, and deleted at once. When copying all at once, in the control to which the arrow is connected, it is copied while keeping the connected state. This makes it easy to copy a part of the measurement procedure as it is.
[0036]
The processing desired to be performed in this example can be created as shown in FIG. 4 using the respective controls of wavelength scanning, threshold value detection, and determination.
[0037]
When all controls have been placed, connect the arrows according to the measurement procedure. The arrow is connected by dragging a square portion called a connector 303 displayed when each control is selected to a control of processing to be performed next, starting from the start control 401. In this example, when the measurement procedure is started, an arrow following the start control 401 is connected to the wavelength scan 402, which means that the entire scan is executed first. Similarly, when the whole scan is completed, threshold value detection 403 is performed.
[0038]
In this process, the wavelength that matches the threshold value is detected from the result of the previous scan, and that wavelength is stored for the next control process. In the same manner, the processing is sequentially performed according to the direction of the arrow. The process proceeds with the four arithmetic operations 404, the wavelength scan 405, the threshold value detection 406, and the determination 407. Here, two arrows appearing from the control of the judgment 407 indicate that the branching is performed in either direction of the two arrows by giving a branching condition. If this branching condition is met, the process proceeds from the determination 407 to the four arithmetic operations 408, and then returns to the wavelength scan 405. If the branch condition is not met, the process proceeds to result display 409 and end 410 to end the measurement procedure.
[0039]
In the control, the type of the control and a name set in a setting item described later are displayed.
[0040]
Next, an area for storing the results of each control is declared as a “variable” so that the results of each control can be used for subsequent processing. The variable is declared by adding a variable name and a comment to the variable list 105 at the lower right of the screen shown in FIG. An example of setting the variable list is shown in FIG.
[0041]
In the variable name 501, a variable name for identifying the variable to be declared is input. This variable name 501 must not have a duplicate name. A comment 502 inputs an annotation for the variable. This is information on the screen display and is not related to actual measurement. These variables can be freely defined by the user and can be used as setting items for each control, and can be used in place of setting values or as a storage destination of results.
[0042]
In this procedure, in order to obtain profiles for the entire scan and the detailed scan, variables storing these results are declared as OutlinePrf 503 and DetailPrf 504, respectively. In addition, WaveLength 505 for storing threshold detection results, and variables ScanWL_Lower 506 and ScanWL_Upper 507 for storing the start and end wavelengths of the range for performing the detailed scan are declared.
[0043]
Next, setting items are set for each control arranged on the campus 102. First, select the control you want to set the item with the mouse. Thereby, the setting item of the control is instantly displayed in the setting item list, and the value can be freely changed by the user. The displayed setting items vary depending on the type of control selected.
[0044]
In FIG. 4, when the wavelength scan control 402 of the created measurement procedure is selected using a mouse, detailed conditions at the time of scanning are displayed in the setting item list at the upper right of the screen. An example at this time is shown in FIG. An annotation of the selected control is displayed in the annotation 104, but the description is omitted here.
[0045]
In this example, in the whole scan process, the name 603 on the control screen is set to the whole scan, the scan start 604 and the scan end 605 are set to 190 and 900 nm, respectively, and the resolution 606 at the time of scanning is set to every 0.60 nm. It has become. For this value, the scan range required by the user is directly entered as a numerical value. In addition, the result storage destination 607 of the scan is stored in a variable called OutlinePrf. For these setting items 601, necessary items and standard setting items for each control are determined in advance, and the user cannot change them. In addition, standard setting values are set in advance for the setting values of the value 602, and the user may change the settings as necessary.
[0046]
The threshold detection control 403 can set items as shown in FIG.
[0047]
In this example, the control name 703 is an overall threshold value, OutlinePrf is used as detection data 704 for detecting the threshold value, the detection value 705 is 500, and a slope 706 that specifies whether the detection point is rising or falling. Set to rising. Also, the detected result storage destination 707 is set to WaveLength.
[0048]
The arithmetic operation control 404 has a function of setting a range for performing detailed scanning by addition / subtraction for the wavelength obtained by threshold detection. This allows you to enter mathematical expressions directly and store the results in any variable. An example of this setting is shown in FIG. The control name 803 is set as the scan range, the variables to store the calculation results are set to ScanWL_Lower and ScanWL_Upper in the storage destination 1 804 and storage destination 2 806, respectively, and the calculation formulas to store the results in them are Formula 1 805 and Calculation Set in Equation 2 807 as WaveLength-10 and WaveLength + 10, respectively.
[0049]
A setting example in the wavelength scan control 405 is shown in FIG. In this example, the control name 903 is a detailed scan, and we want to scan within the detailed scan range calculated by the four arithmetic operations control in the previous step, so the scan start 904 and scan end 905 setting items are scanned using the previous four arithmetic operations. The variables ScanWL_Lower and ScanWL_Upper that store the range are used. The resolution is set to 0.01 nm so that detailed observation is possible, and DetailPrf is set as the storage destination.
[0050]
Next, threshold detection 406 of the detailed scan is performed. This is equivalent to the threshold value detection 403 of the whole threshold value, and only the detection data 704 becomes DetailPrf among the setting items shown in FIG.
[0051]
A setting example of the determination control is shown in FIG. This control can branch by comparing two values, a fixed value or a variable. As a comparison condition, one of “large”, “small”, and “equal” is selected, and a branch destination is determined according to the condition. In this example, the control name 1003 is set as the threshold judgment, and the threshold detection result of the detailed threshold is stored in WaveLength, so the comparison value 1 1004 can detect WaveLength and the threshold. Since it was determined whether or not there was, -1 is set to each of the comparison values 2 1005. Also, as the comparison condition 1006, “equal” is selected as a condition for comparing these two values.
[0052]
The result display control 409 has a function of displaying the variable designated by the user on the screen. With this control, items as shown in FIG. 11 can be set.
[0053]
Display items 1 to 10 can be used, and the data to be displayed and the name to be displayed can be specified. In the figure of this example, since the screen size becomes too large, not all items are displayed. However, by operating the scroll bar 1111, the remaining items can be easily displayed / edited.
[0054]
These items can be left blank if not necessary. When a wavelength scan result or the like is designated, it is automatically graphed and displayed. In this case, by inputting the name corresponding to the value of each axis, the name is displayed as the name of the x-axis and y-axis values of the graph, respectively.
[0055]
Here, in order to display the overall profile, detailed profile, and threshold detection wavelength, OutlinePrf is displayed in display item 1 data 1104, and the wavelength (nm) and intensity is displayed in display item 1 name 1105, which is the display name of each axis of the graph. Display item 2 data 1106, DetailPrf, display item 2 name 1107 which is the display name of each axis of the graph, wavelength (nm), intensity, display item 3 data 1108, WaveLength, display item 3 name 1109, threshold The detection wavelength is set.
[0056]
In this way, setting items are input for all controls. In addition, since the start / end control is only the setting item of the name, it is omitted in this description. Further, in this example, the details of each of the setting items beyond this are not particularly important and will be omitted.
[0057]
By creating a measurement procedure by the above operation, the measurement procedure can be easily defined. Since the created procedure can be saved as a file as it is, it is possible to call the procedure instantly by creating a necessary procedure in advance and saving it as a file. This operation is performed by operating the menu 101 or the icon button 107 displayed in the form of an icon.
[0058]
Next, an operation when the created procedure is executed will be described. The execution of the procedure is immediately executed by selecting an execution menu from the application menu 101 or by clicking an execution button from the icon button 107 displayed in the form of an icon.
[0059]
When the execution of the measurement procedure starts, the wavelength scan 402 is first performed according to the procedure defined in FIG. In this scan, the start and end wavelengths are set so as to cover the entire use wavelength range of the filter whose characteristics are to be measured. In this example, the scan start wavelength 604 is set to 190 nm, and the scan end wavelength 605 is set to 900 nm. However, it may be changed according to the wavelength range of the optical filter to be measured if necessary. In addition, the resolution is appropriately set so that the data amount of the measurement result and the measurement time are not so large. In this example, the resolution 606 is 0.60 nm. As described above, this setting can be set by a setting item for each control.
[0060]
When the entire scan is completed, the result is stored in OutlinePrf according to the setting item of the result storage destination 607. Thereby, the result of this whole scan can be used in the subsequent processing of this procedure. At this time, since the range of 190 nm to 900 nm is scanned at an interval of 0.60 nm, the number of measurement points of the scan result is (900 nm-190 nm) /0.60 nm = 1200 points. Such multi-point data can be easily handled without requiring the user to be particularly conscious.
[0061]
An example of the scan result is shown in FIG. This figure is actually displayed as a result display at the end of the procedure. The next threshold value detection 403 is performed using this scan result. In the threshold detection 403, the wavelength of a specific transmittance is detected from the scan result data. Thereby, the actual measurement value of the transient band wavelength of the optical filter can be estimated.
[0062]
As an example of calculation of threshold value detection, a wavelength of intensity 500 that is 50% from the maximum value to the minimum value is obtained. This value is designated by the detection value 705 in the control setting list. In addition, the result storage location 707 is specified so that the detection result is assigned to the variable WaveLength. As a special case of control, if the target intensity cannot be detected, -1 is stored as a result instead of the wavelength. By such processing, the wavelength is calculated to be about 550 nm in the scan result of this example.
[0063]
In the next range setting process, the range to be scanned in the detailed scan is determined. In the detailed scan, which is the processing after this, because it is desired to change the scan wavelength range according to the detection result of the threshold value, refer to the values of the variables ScanWL_Lower and ScanWL_Upper for the wavelengths of the scan start 904 and the scan end 905 shown in FIG. Set to do. For this reason, the setting is made so that the wavelength of +10 nm is substituted for ScanWL_Upper and the wavelength of −10 nm is substituted for ScanWL_Lower with respect to the threshold wavelength detected in the previous step.
[0064]
Subsequently, a detailed scan is performed using the detection wavelength. Here, it is necessary to change the scan wavelength according to the detection result of the threshold value, and the scan start wavelength and the end wavelength are respectively substituted for ScanWL_Lower and ScanWL_Upper calculated in the above calculation, so these values are used. If you want to use the value stored in a variable as a setting item, you can scan the ScanWL_Lower and ScanWL_Upper because the variable name is described in each setting item and the variable value is automatically referenced. The start 904 and the scan end 905 may be set respectively. Further, since it is desired to obtain a profile with high resolution in the detailed scan, the resolution 906 is set to 0.01 nm. In addition, DetailPrf is specified as the result storage destination 907. An example of the scan result is shown in FIG.
[0065]
The threshold value of the next step is detected using this scan result. This is confirmation of whether the target threshold value is captured in the profile acquired by the detailed scan. Here, the same processing as the above-described threshold value detection is performed. Thereby, it is calculated as approximately 550.15 nm. Specify this result in the control settings list to store in WaveLength. Although the previous threshold detection result is overwritten by this storage, it is lost, but there is no problem because the previous detection result is never used. If necessary, processing may be performed using different variables.
[0066]
Next, processing for determining whether or not the above result has been detected normally is performed. First, regarding the detection of the threshold value, if the target threshold value is not detected, it is assumed that the result is −1 as a special case, but here it is determined whether or not the result is −1. If so, it branches to the right on the canvas and shifts to a range correction process. If it is not -1, it branches downward and shifts to a result display process.
[0067]
An example in which the threshold cannot be detected is shown in FIG. In this case, the transition band is shifted to the long wavelength side, and the wavelength corresponding to the intensity 500 cannot be detected, so the result of the threshold detection 406 is -1. As a result, in the process of decision 407 for judging the next threshold value, the threshold detection result is equal to −1, so the routine proceeds to four arithmetic operations 408, which is a range correction process.
[0068]
In the four arithmetic operations 408 of the range correction process, a process for moving the scan range upward or downward is performed using the profile obtained by the detailed scan. In the present invention, the contents of the processing algorithm are not particularly important and will not be described. However, the scanning WL_Lower and ScanWL_Upper are moved to the longer wavelength side so that the profile can be appropriately observed. On the contrary, if the intensity is 500 or more in the entire scan range, the ScanWL_Lower and ScanWL_Upper are moved to the short wavelength side, respectively, and the profile is corrected so that it can be observed appropriately.
[0069]
Thereafter, the detailed scan is performed again by the wavelength scan 405, and the profile is acquired in the corrected wavelength range. Further, threshold detection 406 is performed using the acquired profile, and if the threshold is not detected, similar processing is performed. In this way, the profile acquisition is repeated until a normal profile is detected in which the threshold is detected.
[0070]
Next, the result is displayed on the result display 409. In the previous measurement procedure, the entire scan result, detailed scan result, and threshold detection wavelength at the time of detailed scan are stored in OutlinePrf, DetailPrf, and WaveLength, respectively, and these are displayed. FIG. 15 shows a result display example.
[0071]
In the above procedure, it is possible to easily define a measurement that requires a complicated procedure such as adjusting the conditions while confirming the measurement result, and performing measurement again, and execute it with fewer operations. However, although omitted in this example procedure, exception processing is required if the threshold value is not detected in the entire scan or if the threshold value cannot be detected even after repeated measurements are performed in addition to the above procedure. In some cases.
[0072]
The case of measuring optical filters having different characteristics by using the above-described analysis procedure example will be described.
[0073]
The present invention has a feature that the created measurement procedure can be easily changed and appropriately modified according to the purpose with respect to an application specially created by a conventional special order or the like. For this reason, compared to building a dedicated application from the beginning, it is much easier to change to a new target application.
[0074]
A filter having a characteristic of passing only a specific wavelength region will be described. This filter performs a detailed scan as in the previous example for the long-wavelength side transient band and the short-wavelength side transient band in the pass region, and measures the detailed scan result and the threshold detection wavelength during the detailed scan. To do. Also, the setting items and threshold detection conditions at the time of each scan are the same as those in the previous example if they do not need to be changed. A characteristic example of this optical filter is shown in FIG.
[0075]
In this example, there are two bands where detailed scanning is performed, so from the threshold detection after the entire scan, detailed scanning, threshold judgment, and re-measurement processing when the threshold cannot be detected, etc. It is necessary to carry out even in the side transition band. For this reason, a part of the procedure created in the previous example is copied and changed so that the detailed scanning process can be performed at two wavelengths. Procedure duplication is performed by mouse operation on the canvas. The display state at this moment is shown in FIG.
[0076]
To copy a procedure, first, the upper left point of a square called a selection line 1701 surrounding the entire procedure to be copied is indicated by the mouse cursor 1702, and the left mouse button is pressed. Next, hold down the left mouse button and move to the lower right corner of the square surrounding the entire procedure you want to copy.
[0077]
By releasing the left mouse button in this state, all the controls contained in the rectangle are selected. This state is shown in FIG. In FIG. 17, it can be seen that the control included in the rectangle is selected.
[0078]
Here, the procedure can be copied by selecting “Copy” from the menu 101 of the application and then arbitrarily selecting a copy destination location with the mouse. FIG. 19 shows an example of a state where the previously selected control is copied to the right side.
[0079]
Since the copied control has the same setting values as the copy source, there is no need to change these setting values unless particularly necessary.
[0080]
Next, in order to make the procedure according to the measurement purpose of this measurement example, the second detailed scan is performed after the first detailed scan, and then the result is displayed and then the arrows are reconnected. . The method of connecting arrows is the same as that for creating a new procedure.
[0081]
The result display and end may be moved below the second detailed scan so that the flow of the procedure is easy to see. FIG. 20 shows an example of a measurement procedure finally created by performing these operations.
[0082]
Although the detailed scan is changed to be performed twice by changing the measurement procedure described above, since the setting items of the copied part are the same as described above, it is necessary to appropriately change them. This change is made as follows.
[0083]
Since the detail scan was changed to perform both the long-wavelength side transient band and the short-wavelength side transient band of the pass region, another storage region for the detailed scan is required to store these results separately. . An example of setting the variable list at this time is shown in FIG. As in this example, DetailPrf2 2101 is added as the storage destination of the detailed profile of the long wavelength side transient band, and WaveLength2 2102 is added as the storage destination of the threshold detection wavelength of the long wavelength side transient band.
[0084]
Next, change the setting items of each control that needs to be changed. FIG. 22 shows a setting example of setting items for threshold detection for the entire scan in the long wavelength side transient band. Here, the slope 2201 at the time of detection is set to fall so that detection is performed with respect to the slope of the transition band on the long wavelength side. In addition, as the result storage destination 2202, since the detection result on the short wavelength side is overwritten if it is the same as before, WaveLengh2 is set as the storage destination.
[0085]
Similarly, for each copied control, WaveLength is replaced with WaveLength2, and DetailPrf is replaced with DetailPrf2. Other setting values do not need to be changed unless there is a particular problem.
[0086]
Finally, the result display control is added to display the detailed scan result of the long wavelength side transient band and the short wavelength side threshold detection result, and the name is changed so that each can be easily discriminated. A setting example in this case is shown in FIG. A display example of the result is shown in FIG.
[0087]
As described above, it is possible to easily add a new measurement procedure and result calculation process using existing measurement conditions.
[0088]
【The invention's effect】
According to the present invention, the result processing after measurement in a special field can be easily constructed, and can be created and displayed visually. Therefore, the measurement result processing that has been performed by the user can be easily and easily created. Can do.
[Brief description of the drawings]
FIG. 1 is a diagram showing a display example of a screen for creating an analysis procedure of a spectroscopic analyzer according to the present invention.
FIG. 2 is a configuration diagram of an apparatus necessary for analysis processing according to the present invention.
FIG. 3 is a diagram illustrating a state of a canvas immediately after starting the application.
FIG. 4 is a diagram showing an example of creating an analysis procedure.
FIG. 5 is a diagram illustrating an example of setting a variable list in an example of creating an analysis procedure.
FIG. 6 is a diagram illustrating a setting example of wavelength scanning.
FIG. 7 is a diagram illustrating a setting example of threshold detection.
FIG. 8 is a diagram illustrating a setting example of four arithmetic operations.
FIG. 9 is a diagram illustrating a setting example of wavelength scanning.
FIG. 10 is a diagram illustrating a setting example of determination.
FIG. 11 is a diagram illustrating a setting example of a result display.
FIG. 12 is a diagram illustrating an example of a result at the time of a full scan.
FIG. 13 is a diagram illustrating an example of a result at the time of a detailed scan.
FIG. 14 is a diagram illustrating an example of a detailed scan result for which a threshold value cannot be determined.
FIG. 15 is a diagram illustrating a result display example;
FIG. 16 is a diagram illustrating a characteristic example of another optical filter.
FIG. 17 is a diagram illustrating an example of a control selection procedure.
FIG. 18 is a diagram illustrating an example of a control selection state.
FIG. 19 is a diagram showing an example immediately after copying a control.
FIG. 20 is a diagram illustrating an example of a new measurement procedure.
FIG. 21 is a diagram illustrating a variable list setting example of a new measurement procedure.
FIG. 22 is a diagram illustrating a setting example of threshold detection of a new measurement procedure.
FIG. 23 is a diagram illustrating a setting example of a result display of a new measurement procedure.
FIG. 24 is a diagram illustrating a result display example of a new measurement procedure.
[Explanation of symbols]
100 ... Toolbar, 101 ... Menu, 102 ... Canvas, 103 ... Setting item list, 104 ... Annotation, 105 ... Variable list, 106 ... Function type button, 107 ... Icon button, 200 ... Light source, 201 ... Spectroscope, 203 ... Diffraction Grid, 205 ... Sample chamber, 206 ... Data processing unit, 207 ... Photometer device unit, 208 ... Computer unit, 301 ... Control arrangement, 302 ... Selection frame, 303 ... Control connector.

Claims (2)

The analysis processing control and the measurement result processing of the spectroscopic analyzer are executed by a computer, and a program for the processing procedure of the analysis processing and the measurement result processing is created by a screen operation of the computer,
The computer screen lists a toolbar for selecting one process to be performed in the process procedure, a canvas on which a plurality of controls indicating one process in the process procedure are arranged, and detailed settings of the process in the control. A list of setting items for setting detailed processing in the control, and a variable list for defining variables for storing the results of the analysis processing and the measurement result processing, are displayed.
The spectroscopic analyzer characterized in that the toolbar is operated so that one process of the processing procedure is arranged in the control, the processing content is displayed in characters, and the controls are connected by an arrow in each processing order. .   The spectroscopic analysis apparatus according to claim 1, wherein the computer includes a mouse for editing the canvas-arranged control.

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