JP4303550B2 - 発光装置 - Google Patents
発光装置 Download PDFInfo
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- JP4303550B2 JP4303550B2 JP2003342705A JP2003342705A JP4303550B2 JP 4303550 B2 JP4303550 B2 JP 4303550B2 JP 2003342705 A JP2003342705 A JP 2003342705A JP 2003342705 A JP2003342705 A JP 2003342705A JP 4303550 B2 JP4303550 B2 JP 4303550B2
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- light emitting
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- 238000007789 sealing Methods 0.000 claims description 90
- 239000000758 substrate Substances 0.000 claims description 45
- 239000011521 glass Substances 0.000 claims description 44
- 239000000919 ceramic Substances 0.000 claims description 18
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 8
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 5
- 239000000463 material Substances 0.000 description 29
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- 239000011347 resin Substances 0.000 description 14
- 239000010931 gold Substances 0.000 description 9
- 238000007747 plating Methods 0.000 description 8
- 238000002844 melting Methods 0.000 description 7
- 230000035882 stress Effects 0.000 description 7
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- 239000004020 conductor Substances 0.000 description 5
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- 238000006243 chemical reaction Methods 0.000 description 4
- 238000004040 coloring Methods 0.000 description 4
- 238000000465 moulding Methods 0.000 description 4
- 239000003566 sealing material Substances 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 3
- 238000000605 extraction Methods 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 2
- 230000006378 damage Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000002223 garnet Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000006060 molten glass Substances 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 239000002210 silicon-based material Substances 0.000 description 2
- 238000004383 yellowing Methods 0.000 description 2
- 229910052727 yttrium Inorganic materials 0.000 description 2
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 150000004703 alkoxides Chemical class 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 230000003685 thermal hair damage Effects 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48257—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a die pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01057—Lanthanum [La]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Led Device Packages (AREA)
- Led Devices (AREA)
Description
(1)ガラス材による封止部材14で全体を封止したことにより、樹脂封止で問題になった黄変や着色による光の減衰を低減することができる。
(2)LED素子12の周囲に緩衝層13を設けたことにより、封止部材14の封止時に粘度の高いガラス材を介してLED素子12に付与される外力が緩和される。すなわち、緩衝層13の介在によってLED素子12と封止部材14とが直接接触しないので、熱膨張・熱収縮によって生じる応力を緩衝層13によって吸収できる。
(3)緩衝層13を介してLED素子12をガラス封止することによって、封止部材14のLED素子12近傍に生じていたクラックの発生を防止することが可能になる。このような緩衝層13を設ける構成は、封止部材14との接触面積が広くなるラージサイズ(1mm×1mm)のLED素子12において特に有効である。
(4)LED素子12を緩衝層13で包囲することによって、バンプの圧潰による電極間の短絡を防ぐことができる。また、緩衝層13がバンプ形状の崩れを抑制することから、ガラス封止によってLED素子12の光軸が傾くことを防げる。
(5)ウェハをスクライブすることによりLED素子12を形成する場合、スクライブされたLED素子12の側面には微細な凹凸が生じている。この凹凸はガラス封止型の発光装置10にとってLED素子12と封止部材14との界面に応力の不均衡部分を形成し、ひいてはマイクロクラックを発生させる要因となる。
このような問題に対しては、LED素子12のスクライブ面となる側面に緩衝層13が設けられているので、封止部材14の熱収縮時におけるマイクロクラックの発生を防げる。
(1)サブマウント52の下部に放熱を促す放熱部材51を設けたため、LED素子41の点灯に伴う発熱を効率良く外部へ放散でき、ガラス材による封止部材55等の温度上昇に伴う熱膨張・熱収縮の発生を抑制してクラックの発生を防止することができる。
(2)緩衝層54に蛍光体54aを混合させたことにより、波長変換が行えると共に光の取り出し効率の向上が可能になる。
11 基板部
11a セラミック基板
11b,11c,11d,11e,11f,11g 配線層
11h,11i,11j,11k Auメッキ膜
11l,11m スルーホール
12 LED素子
12a,12b 電極
13 緩衝層
14 封止部材
20 発光装置
21 緩衝層
30 発光装置
31 基板部
31a セラミック基板
31b,31c,31d,31e 配線層
31f,31g スルーホール
32 LED素子
33 緩衝層
34 封止部材
35a,35b ワイヤ(ボンディングワイヤ)
40 発光装置
41 LED素子
42 バンプ
43 サブマウント
43a,43b 電極
43c スルーホール
44a,44b リード部
45 緩衝層
46 封止部材
50 発光装置
51 放熱部材
52 サブマウント
52a,52b 配線パターン
53a,53b リード部
54 緩衝層
55 封止部材
200 発光装置
201,202 配線導体
203 カップ部
203A 底部
204 LED素子
205 ワイヤ
206 ガラス層
206A 蛍光物質
207 封止樹脂
Claims (3)
- 側面に凹凸が生じている発光素子と、
前記発光素子が上面に搭載され、前記発光素子に給電を行う配線層と、前記配線層が上面に形成されたセラミック基板と、を有する基板部と、
前記発光素子と前記基板部の前記配線層とを接続するワイヤと、
前記発光素子の全体及び前記ワイヤの全部分を覆う多孔質のセラミックからなる緩衝層と、
前記緩衝層の表面及び前記基板部の上面を覆うように形成され、前記発光素子を封止し前記発光素子と熱膨張率が異なる透光性のガラスからなり、前記発光素子の封止加工後に熱収縮による応力が生じている封止部材と、を備え、
前記緩衝層は、前記発光素子と前記封止部材との間に介在して熱収縮によって生じている前記封止部材の応力を吸収し、前記封止部材の封止時と封止加工後の温度変化により前記発光素子と前記封止部材の熱膨張率差に起因して生じる前記封止部材の前記発光素子の近傍におけるクラックの発生を防止することを特徴とする発光装置。 - 前記緩衝層は、SiO 2 であることを特徴とする請求項1に記載の発光装置。
- 前記緩衝層は、蛍光体が混入されていることを特徴とする請求項1または2に記載の発光装置。
Priority Applications (11)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003342705A JP4303550B2 (ja) | 2003-09-30 | 2003-09-30 | 発光装置 |
| US10/548,560 US7824937B2 (en) | 2003-03-10 | 2004-03-10 | Solid element device and method for manufacturing the same |
| CN2010101176741A CN101789482B (zh) | 2003-03-10 | 2004-03-10 | 固体元件装置及其制造方法 |
| KR1020057016878A KR100693969B1 (ko) | 2003-03-10 | 2004-03-10 | 고체 소자 디바이스 및 그 제조 방법 |
| TW093106393A TWI246780B (en) | 2003-03-10 | 2004-03-10 | Solid-state component device and manufacturing method thereof |
| EP04719060.8A EP1603170B1 (en) | 2003-03-10 | 2004-03-10 | Method for manufacturing a solid-state optical element device |
| CN2004800064031A CN1759492B (zh) | 2003-03-10 | 2004-03-10 | 固体元件装置的制造方法 |
| EP13156568.1A EP2596948B1 (en) | 2003-03-10 | 2004-03-10 | Method of making a semiconductor device |
| PCT/JP2004/003089 WO2004082036A1 (ja) | 2003-03-10 | 2004-03-10 | 固体素子デバイスおよびその製造方法 |
| US12/923,788 US8154047B2 (en) | 2003-03-10 | 2010-10-07 | Solid element device and method for manufacturing the same |
| US13/419,093 US8685766B2 (en) | 2003-03-10 | 2012-03-13 | Solid element device and method for manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003342705A JP4303550B2 (ja) | 2003-09-30 | 2003-09-30 | 発光装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009064718A Division JP5126127B2 (ja) | 2009-03-17 | 2009-03-17 | 発光装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2006054209A JP2006054209A (ja) | 2006-02-23 |
| JP4303550B2 true JP4303550B2 (ja) | 2009-07-29 |
Family
ID=36031511
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003342705A Expired - Fee Related JP4303550B2 (ja) | 2003-03-10 | 2003-09-30 | 発光装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4303550B2 (ja) |
Families Citing this family (41)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7915085B2 (en) | 2003-09-18 | 2011-03-29 | Cree, Inc. | Molded chip fabrication method |
| JP4632426B2 (ja) * | 2004-03-31 | 2011-02-16 | シーアイ化成株式会社 | 発光ダイオード組立体の組立方法および発光ダイオード組立体 |
| JP4632427B2 (ja) * | 2004-03-31 | 2011-02-16 | シーアイ化成株式会社 | 発光ダイオード組立体の組立方法および発光ダイオード組立体 |
| US7217583B2 (en) | 2004-09-21 | 2007-05-15 | Cree, Inc. | Methods of coating semiconductor light emitting elements by evaporating solvent from a suspension |
| EP1963743B1 (en) | 2005-12-21 | 2016-09-07 | Cree, Inc. | Lighting device |
| US8969908B2 (en) | 2006-04-04 | 2015-03-03 | Cree, Inc. | Uniform emission LED package |
| CN101443922B (zh) | 2006-05-18 | 2011-01-12 | 旭硝子株式会社 | 发光装置的制造方法及发光装置 |
| JP5555971B2 (ja) * | 2006-07-18 | 2014-07-23 | 日亜化学工業株式会社 | 線状発光装置およびそれを用いた面状発光装置 |
| US7943952B2 (en) | 2006-07-31 | 2011-05-17 | Cree, Inc. | Method of uniform phosphor chip coating and LED package fabricated using method |
| WO2008026699A1 (fr) * | 2006-08-30 | 2008-03-06 | Kyocera Corporation | Dispositif émetteur de lumière |
| US10295147B2 (en) | 2006-11-09 | 2019-05-21 | Cree, Inc. | LED array and method for fabricating same |
| US9024349B2 (en) | 2007-01-22 | 2015-05-05 | Cree, Inc. | Wafer level phosphor coating method and devices fabricated utilizing method |
| US9159888B2 (en) | 2007-01-22 | 2015-10-13 | Cree, Inc. | Wafer level phosphor coating method and devices fabricated utilizing method |
| US8232564B2 (en) | 2007-01-22 | 2012-07-31 | Cree, Inc. | Wafer level phosphor coating technique for warm light emitting diodes |
| US9401461B2 (en) | 2007-07-11 | 2016-07-26 | Cree, Inc. | LED chip design for white conversion |
| US10505083B2 (en) | 2007-07-11 | 2019-12-10 | Cree, Inc. | Coating method utilizing phosphor containment structure and devices fabricated using same |
| KR20090015734A (ko) * | 2007-08-09 | 2009-02-12 | 엘지이노텍 주식회사 | 광원 장치 |
| JP5212777B2 (ja) * | 2007-11-28 | 2013-06-19 | スタンレー電気株式会社 | 半導体発光装置及び照明装置 |
| US8167674B2 (en) | 2007-12-14 | 2012-05-01 | Cree, Inc. | Phosphor distribution in LED lamps using centrifugal force |
| US9041285B2 (en) | 2007-12-14 | 2015-05-26 | Cree, Inc. | Phosphor distribution in LED lamps using centrifugal force |
| US8878219B2 (en) | 2008-01-11 | 2014-11-04 | Cree, Inc. | Flip-chip phosphor coating method and devices fabricated utilizing method |
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