JP5498399B2 - 色検出器 - Google Patents
色検出器 Download PDFInfo
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- JP5498399B2 JP5498399B2 JP2010546738A JP2010546738A JP5498399B2 JP 5498399 B2 JP5498399 B2 JP 5498399B2 JP 2010546738 A JP2010546738 A JP 2010546738A JP 2010546738 A JP2010546738 A JP 2010546738A JP 5498399 B2 JP5498399 B2 JP 5498399B2
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- 239000010410 layer Substances 0.000 claims description 78
- 239000011241 protective layer Substances 0.000 claims description 11
- 125000006850 spacer group Chemical group 0.000 claims description 8
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 6
- 229910052709 silver Inorganic materials 0.000 claims description 3
- 239000004332 silver Substances 0.000 claims description 3
- 238000004891 communication Methods 0.000 claims description 2
- 239000003989 dielectric material Substances 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 claims description 2
- 230000001419 dependent effect Effects 0.000 claims 1
- 238000001228 spectrum Methods 0.000 description 21
- 238000013459 approach Methods 0.000 description 14
- 239000000463 material Substances 0.000 description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 10
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- 230000005540 biological transmission Effects 0.000 description 7
- 239000003086 colorant Substances 0.000 description 6
- 235000012239 silicon dioxide Nutrition 0.000 description 5
- 239000000377 silicon dioxide Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 230000000593 degrading effect Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 230000001590 oxidative effect Effects 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000003466 anti-cipated effect Effects 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000002329 infrared spectrum Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 235000012736 patent blue V Nutrition 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000002211 ultraviolet spectrum Methods 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
- G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
- G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
- G01J3/513—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters having fixed filter-detector pairs
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/284—Interference filters of etalon type comprising a resonant cavity other than a thin solid film, e.g. gas, air, solid plates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/30—Coatings
- H10F77/306—Coatings for devices having potential barriers
- H10F77/331—Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/23—Sheet including cover or casing
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Spectrometry And Color Measurement (AREA)
- Light Receiving Elements (AREA)
Description
分光測定法は、可視スペクトル、近紫外線スペクトル、近赤外線スペクトルの電磁波の研究である。分光光度計は、強度、色、及び/又は波長を含む光の様々な特性を測定するように構成された光測定デバイスである。分光光度計は、広い使用範囲を有する。例えば、それらは、テレビ受像器、プロジェクタ、モニタ、ビデオカメラのファインダーのようなディスプレイ装置での色を検出するために使用され得る。代案として、分光光度計は、印刷された色を較正するために印刷装置で使用され得る。
色検出器は、光源、フォトダイオード、及び光源とフォトダイオードとの間に配置されたフィルタを含む。フィルタは、特定の波長のスペクトルを有する光のみがフォトダイオードへと通過することを可能にするように同調される。光がフォトダイオードに到達すると、フォトダイオードは電流を出力する。その電流は、特定の波長のスペクトルにおける色の存在を示す。複数の色検出器は、検出器の出力を直接的に読み出すことにより複数の色の存在を示すためにアレイに構成され得るか、又は代案として、アレイに構成された複数の色検出器の出力が、適切な色変換アルゴリズムと協働して使用されて、入力の色を求めることができる。フィルタは、銀のような反射金属で覆われた一対の部分反射層を含むことができる。金属の酸化または金属の環境との反応を防止するために、反射層は、窒化アルミニウムのような保護層で覆われ得る。色検出器は更に、一般に高低の屈折率の材料の組み合わせを有する色増強層を含み、それにより対象となる波長領域の透過が最大にされる。高低の屈折率の材料の組み合わせに関する厚みの選択は、最大化の波長領域をもたらす。最後に、色検出器は、所与のスペクトル帯を網羅するように同調/設計された色検出器の所与のアレイにわたってフィルタのピーク透過を平坦化または均等化する傾向があるキャッピング層を含むことができる。従って、本明細書で提供される色検出器により、フィルタに関して、普通は酸化または劣化する金属を部分反射層に使用することを可能にし、並びに特定の波長のスペクトルの検出される光を最大化することが可能になる。
Claims (6)
- 光源(12)と、
前記光源(12)と光学的に連絡するフォトダイオード(14)と、
前記フォトダイオード(14)上で一体的に形成されたフィルタ(16)であって、そのフィルタ(16)が第2の部分反射層(28)から間隔を置いて配置された第1の部分反射層(26)、及び前記第1の部分反射層と前記第2の部分反射層との間に配置されたスペーサ層(30)を含む、フィルタ(16)と、
前記フォトダイオード(14)と前記フィルタ(16)との間に配置され、且つ前記フォトダイオード(14)上に配置された色増強装置(36)とを含み、
前記色増強装置(36)が、前記フィルタ(16)の前記第2の部分反射層(28)上に配置された色増強層(38)を含み、
前記色増強層(38)が、前記フィルタ(16)の前記第2の部分反射層(28)上に配置された第1の色増強層(40)、及び前記第1の色増強層(40)上に配置された第2の色増強層(42)を含み、前記第1の色増強層(40)が窒化アルミニウムから形成されている、色検出器(10)。 - 前記スペーサ層(30)の反対側に前記第1の部分反射層(26)上に配置された第1の保護層(32)、及び前記色増強装置(36)の反対側に前記第2の部分反射層(28)上に配置された第2の保護層(34)を更に含む、請求項1に記載の色検出器(10)。
- 前記色増強装置(36)が、前記第2の色増強層(42)上に及び前記フォトダイオード(14)上に配置されたカバー層(44)を含む、請求項1又は2に記載の色検出器(10)。
- 前記第1の保護層(32)および前記第2の保護層(34)が、窒化アルミニウムから形成される、請求項2及び請求項2に従属する請求項3に記載の色検出器(10)。
- 前記第1の部分反射層(26)および前記第2の部分反射層(28)が銀から形成されている、請求項1〜4の何れかに記載の色検出器(10)。
- 前記第1の保護層(32)上に配置されたキャッピング層(46)を更に含み、前記キャッピング層(46)が誘電体材料から形成されている、請求項2及び請求項2に直接的または間接的に従属する請求項3から5の何れかに記載の色検出器(10)。
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/US2008/053721 WO2009102323A1 (en) | 2008-02-12 | 2008-02-12 | Color detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2011511945A JP2011511945A (ja) | 2011-04-14 |
| JP5498399B2 true JP5498399B2 (ja) | 2014-05-21 |
Family
ID=40957197
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010546738A Expired - Fee Related JP5498399B2 (ja) | 2008-02-12 | 2008-02-12 | 色検出器 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8330955B2 (ja) |
| EP (1) | EP2243009B1 (ja) |
| JP (1) | JP5498399B2 (ja) |
| KR (1) | KR101388539B1 (ja) |
| TW (1) | TWI470195B (ja) |
| WO (1) | WO2009102323A1 (ja) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5569002B2 (ja) * | 2010-01-21 | 2014-08-13 | セイコーエプソン株式会社 | 分析機器および特性測定方法 |
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2008
- 2008-02-12 JP JP2010546738A patent/JP5498399B2/ja not_active Expired - Fee Related
- 2008-02-12 WO PCT/US2008/053721 patent/WO2009102323A1/en active Application Filing
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Also Published As
| Publication number | Publication date |
|---|---|
| KR20100115799A (ko) | 2010-10-28 |
| TWI470195B (zh) | 2015-01-21 |
| US20100328668A1 (en) | 2010-12-30 |
| EP2243009A4 (en) | 2013-11-20 |
| WO2009102323A1 (en) | 2009-08-20 |
| US8330955B2 (en) | 2012-12-11 |
| JP2011511945A (ja) | 2011-04-14 |
| KR101388539B1 (ko) | 2014-04-23 |
| TW200936994A (en) | 2009-09-01 |
| EP2243009A1 (en) | 2010-10-27 |
| EP2243009B1 (en) | 2018-10-10 |
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