JP5650382B2 - Light reflection film - Google Patents
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- JP5650382B2 JP5650382B2 JP2009119821A JP2009119821A JP5650382B2 JP 5650382 B2 JP5650382 B2 JP 5650382B2 JP 2009119821 A JP2009119821 A JP 2009119821A JP 2009119821 A JP2009119821 A JP 2009119821A JP 5650382 B2 JP5650382 B2 JP 5650382B2
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- backlight unit
- light reflecting
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- 239000010408 film Substances 0.000 claims description 63
- 239000002245 particle Substances 0.000 claims description 48
- 239000010409 thin film Substances 0.000 claims description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 9
- 229910052751 metal Inorganic materials 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 9
- 239000000758 substrate Substances 0.000 claims description 7
- 239000011230 binding agent Substances 0.000 claims description 6
- 239000012948 isocyanate Substances 0.000 claims description 5
- 150000002513 isocyanates Chemical class 0.000 claims description 5
- 238000007740 vapor deposition Methods 0.000 claims description 5
- 239000000377 silicon dioxide Substances 0.000 claims description 4
- 229920005822 acrylic binder Polymers 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 12
- 229910052782 aluminium Inorganic materials 0.000 description 11
- 239000004973 liquid crystal related substance Substances 0.000 description 9
- 239000000126 substance Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 6
- -1 polyethylene terephthalate Polymers 0.000 description 6
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 4
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- IDCBOTIENDVCBQ-UHFFFAOYSA-N TEPP Chemical compound CCOP(=O)(OCC)OP(=O)(OCC)OCC IDCBOTIENDVCBQ-UHFFFAOYSA-N 0.000 description 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 3
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 2
- 229910002113 barium titanate Inorganic materials 0.000 description 2
- 230000001186 cumulative effect Effects 0.000 description 2
- 238000001723 curing Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000013007 heat curing Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000000016 photochemical curing Methods 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 238000004062 sedimentation Methods 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 229920005992 thermoplastic resin Polymers 0.000 description 2
- 229920001187 thermosetting polymer Polymers 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910000611 Zinc aluminium Inorganic materials 0.000 description 1
- AYJRCSIUFZENHW-DEQYMQKBSA-L barium(2+);oxomethanediolate Chemical compound [Ba+2].[O-][14C]([O-])=O AYJRCSIUFZENHW-DEQYMQKBSA-L 0.000 description 1
- 229910000019 calcium carbonate Inorganic materials 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000003431 cross linking reagent Substances 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Landscapes
- Liquid Crystal (AREA)
- Optical Elements Other Than Lenses (AREA)
Description
本発明は光反射フィルムに関し、詳しくは、液晶表示装置のバックライトユニットの光反射板として用いられる光反射フィルムに関する。 The present invention relates to a light reflecting film, and more particularly to a light reflecting film used as a light reflecting plate of a backlight unit of a liquid crystal display device.
大型液晶テレビなどの大型で高い輝度が必要な液晶表示装置には、直下型バックライトユニットが用いられている。この直下型バックライトユニットは、線状の光源を液晶画面と反射板の間に平行に並べて配置する形式であり、反射板として、内部に微細なボイドを含有する白色フィルムが広く利用されている(特許文献1)。
直下型バックライトユニットは、その構造上、線状の各光源の直上の位置と、真上以外の位置、特に二つの線状の光源の間の位置とで、輝度差が生じやすく、バックライトユニットの輝度ムラの原因となる。
A direct type backlight unit is used in a large-sized liquid crystal display device such as a large-sized liquid crystal television that requires high luminance. This direct type backlight unit is a type in which linear light sources are arranged in parallel between a liquid crystal screen and a reflector, and a white film containing fine voids inside is widely used as the reflector (patent) Reference 1).
The direct-type backlight unit has a structure in which a difference in brightness is likely to occur between a position directly above each linear light source and a position other than directly above, particularly between two linear light sources. It causes uneven brightness of the unit.
反射板を光源の配置に合わせて変形させて光の反射方向を制御すれば、輝度ムラが大幅に低減できるという報告例があるが(特許文献2および3)、この方法では、反射板を精密な曲面に形成する必要があり、バックライトの設計に合わせて、大掛りな装置で一枚一枚を加工する必要があるので生産が低く、成形後の反射板の取扱いが難しい。さらに、立体的な形状の反射板となるために反射板自体の厚みが数cmとなり、バックライトを反射板の形状よりも薄型化できない構造となってしまう。 Although there is a report example that luminance unevenness can be greatly reduced if the reflecting plate is deformed according to the arrangement of the light source to control the light reflection direction (Patent Documents 2 and 3), in this method, the reflecting plate is precisely It is necessary to form a curved surface, and it is necessary to process each piece with a large apparatus according to the design of the backlight. Therefore, the production is low and it is difficult to handle the reflector after molding. Further, since the reflector has a three-dimensional shape, the thickness of the reflector itself is several centimeters, and the backlight cannot be made thinner than the shape of the reflector.
本発明は、液晶表示装置の直下型バックライトユニットに光反射板として用いたときに輝度ムラを低減することができる光反射フィルムであって、生産の高いものを提供することを課題とする。 An object of the present invention is to provide a light reflecting film that can reduce unevenness in luminance when used as a light reflecting plate in a direct type backlight unit of a liquid crystal display device, and has high production.
すなわち本発明は、基材フィルムおよび該基材フィルム上に支持された平均粒径D50が0.5〜100μmの粒子からなる凹凸状の表面を備える光反射フィルムであり、該粒子はシリカからなり、複数の角を備える立体形状であり当該立体の表面が平面から構成されている形状であり、凹凸状の表面に蒸着による金属薄膜層を備える、直下型バックライトユニット用光反射フィルムである。
That is, the present invention is a light reflecting film comprising a base film and a concavo-convex surface made of particles having an average particle diameter D50 of 0.5 to 100 μm supported on the base film, and the particles are made of silica. The light reflecting film for a direct type backlight unit has a three-dimensional shape including a plurality of corners, the surface of the three-dimensional surface is formed from a flat surface, and includes a metal thin film layer formed by vapor deposition on the uneven surface.
本発明によれば、液晶表示装置の直下型バックライトユニットに光反射板として用いたときに輝度ムラを低減することができる光反射フィルムであって、生産の高いものを提供することができる。 ADVANTAGE OF THE INVENTION According to this invention, it is a light reflection film which can reduce a brightness nonuniformity when it uses as a light reflection board for the direct type | mold backlight unit of a liquid crystal display device, Comprising: The thing with high production can be provided.
以下、本発明を詳細に説明する
〔基材フィルム〕
基材フィルムとしては、表面に粒子を支持することができる強度を備えるものを用いることができ、具体的には、例えば、熱可塑性樹脂フィルムを用いることができる。熱可塑性樹脂のフィルムとしては、機械的特性や耐熱性に優れたものを安価に得ることができることから、ポリエステルの二軸延伸フィルムが好ましい。具他的には、例えば、ポリエチレンテレフタレートの二軸延伸フィルム、ポリエチレンナフタレンジカルボキシレートの二軸延伸フィルムを例示することができる。
Hereinafter, the present invention will be described in detail. [Base Film]
As a base film, what has the intensity | strength which can support particle | grains on the surface can be used, and specifically, a thermoplastic resin film can be used, for example. As the thermoplastic resin film, a polyester biaxially stretched film is preferable because a film excellent in mechanical properties and heat resistance can be obtained at low cost. Specifically, for example, a biaxially stretched film of polyethylene terephthalate and a biaxially stretched film of polyethylene naphthalene dicarboxylate can be exemplified.
生産性と取扱性の点から、基材フィルムの厚みは、例えば10〜1000μm、好ましくは100〜250μmである。
基材フィルムとしてポリエチレンテレフタレートの二軸延伸フィルムを用いる場合、市場で入手することができ、例えば、帝人デュポンフィルム製 テイジンテトロンO3−188、テイジンテトロンUX−225を使用いることができる。
From the viewpoint of productivity and handleability, the thickness of the base film is, for example, 10 to 1000 μm, preferably 100 to 250 μm.
When a biaxially stretched film of polyethylene terephthalate is used as the base film, it can be obtained on the market, and for example, Teijin Tetron O3-188 and Teijin Tetron UX-225 made by Teijin DuPont Film can be used.
〔粒子のサイズ〕
本発明において基材フィルムの上に支持される粒子は、平均粒径D50が0.5〜100μmである。この平均粒径D50は、HORIBA製LA−750パーティクルサイズアナライザー(Particle Size Analyzer)を用いて測定した遠心沈降曲線をもとに算出した各粒径の粒子とその存在量とのcumulative曲線から読み取った、50マスパーセントに相当する粒径である。
[Particle size]
In the present invention, the particles supported on the base film have an average particle diameter D50 of 0.5 to 100 μm. This average particle size D50 was read from a cumulative curve of particles of each particle size calculated based on a centrifugal sedimentation curve measured using a HORIBA LA-750 particle size analyzer (Particle Size Analyzer). , A particle size corresponding to 50 mass percent.
平均粒径D50が0.5μm未満であると粒子により形成される表面の凹凸のサイズが小さくなり、ミー散乱により拡散反射され、凹凸の形状による光反射すなわち幾何光学に基づいた光反射が得られにくくなる。平均粒径D50が100μmを超えると粒子により形成される光反射フィルム表面の凹凸が粗くなり、反射光が過度に拡散されて視野角方向の輝度が低下する。 When the average particle diameter D50 is less than 0.5 μm, the size of the surface irregularities formed by the particles is reduced, diffusely reflected by Mie scattering, and light reflection due to the uneven shape, that is, light reflection based on geometric optics is obtained. It becomes difficult. When the average particle diameter D50 exceeds 100 μm, the unevenness of the light reflecting film surface formed by the particles becomes rough, the reflected light is excessively diffused, and the luminance in the viewing angle direction is lowered.
〔粒子の形状〕
本発明の光反射フィルムは、基材フィルムの上に粒子を支持することにより表面に凹凸面が形成されている。この凹凸面を効率よく形成するために、粒子の形状は、角張った形状であることが好ましい。ここで、角張った形状とは、複数の角を備える立体形状であり当該立体の表面が平面から構成されている形状をいい、例えば立方体状、直方体状、八面体状を例示することができる。特に立方体状の粒子は凹凸サイズのムラの少ない表面を形成し易いため好ましい。他方、粒子の形状が角張った形状で無く、例えば角がない形状であったり、表面が外側に凸の曲面から構成されている形状であると、得られる光反射フィルムの表面での反射光の拡散が弱くなり好ましくない。
[Particle shape]
The light reflecting film of the present invention has an uneven surface formed on the surface by supporting particles on a substrate film. In order to efficiently form the uneven surface, the shape of the particles is preferably an angular shape. Here, the angular shape is a solid shape having a plurality of corners, and a shape in which the surface of the solid is constituted by a plane. Examples thereof include a cubic shape, a rectangular parallelepiped shape, and an octahedral shape. In particular, cubic particles are preferable because a surface with less unevenness of uneven size is easily formed. On the other hand, if the shape of the particles is not angular, for example, there are no corners, or if the surface is a shape composed of an outwardly convex curved surface, the reflected light on the surface of the resulting light reflecting film Diffusion is weak and not preferable.
〔粒子の材質〕
粒子の材質は、有機物質でも無機物質でもよく、屈折率が高いことから無機物質が好ましい。屈折率が高いことで、フィルム表面での光反射率が高くなる。
[Particle material]
The material of the particles may be an organic substance or an inorganic substance, and an inorganic substance is preferred because of its high refractive index. Since the refractive index is high, the light reflectance on the film surface is increased.
有機物質としては、例えばポリスチレン、アクリルの粒子を用いることができる。無機物質としては、例えば、シリカ、酸化チタン、チタン酸バリウム、酸化亜鉛、酸化アルミニウム、硫酸バリウム、炭酸バリウム、炭酸カルシウム、マイカ、アルミニウムを用いることができる。これらのうち屈折率の高くさらに好ましいものは、酸化チタン、チタン酸バリウム、酸化亜鉛、アルミニウムであり、酸化チタンが特に好ましい。
なお、粒子として、立方体状粒子を用いる場合には、平均粒径D50が0.5〜100μmの立方体状粒子が比較的安価に市販されていることからシリカが好ましい。
As the organic substance, for example, polystyrene or acrylic particles can be used. As the inorganic substance, for example, silica, titanium oxide, barium titanate, zinc oxide, aluminum oxide, barium sulfate, barium carbonate, calcium carbonate, mica, and aluminum can be used. Of these, titanium oxide, barium titanate, zinc oxide, and aluminum are more preferable because of high refractive index, and titanium oxide is particularly preferable.
When cubic particles are used as the particles, silica is preferable because cubic particles having an average particle diameter D50 of 0.5 to 100 μm are commercially available at a relatively low cost.
〔バインダー〕
本発明において粒子は基材フィルムの上に支持されている。粒子を基材フィルムの上に支持する方法として、バインダーを用いる方法を用いることができる。すなわち、未硬化の熱硬化性樹脂もしくは光硬化性樹脂に粒子を分散させたものを、基材フィルムの上に塗布し、硬化させる方法である。硬化方法としては、熱硬化、光硬化のいずれも適用することができるが、光硬化を適用しようとする基材フィルムとして光線透過率の高いものを用いる必要があり、基材フィルムが限定されてしまうため、熱硬化の方が好ましい。
〔binder〕
In the present invention, the particles are supported on a base film. As a method for supporting the particles on the base film, a method using a binder can be used. That is, it is a method in which an uncured thermosetting resin or a photocurable resin in which particles are dispersed is applied onto a substrate film and cured. As the curing method, either heat curing or photocuring can be applied, but it is necessary to use a material having a high light transmittance as a substrate film to which photocuring is applied, and the substrate film is limited. Therefore, thermosetting is preferable.
バインダー組成としては、アクリル系、イソシアネート系、エポキシ系などが一般的に広く知られており、いずれの系も本発明に適用できるが、硬化方法として熱硬化を適用する場合、比較的マイルドな条件で硬化できることからアクリル系、イソシアネート系が好ましい。アクリル系とイソシアネート系の混合系を用いると、基材フィルムとの密着性が良好であることが多いため特に好ましい。 As the binder composition, acrylic, isocyanate, epoxy, and the like are generally widely known, and any system can be applied to the present invention. However, when heat curing is applied as a curing method, relatively mild conditions are used. Acrylic type and isocyanate type are preferable because they can be cured by the above. It is particularly preferable to use an acrylic and isocyanate mixed system because the adhesion to the substrate film is often good.
〔金属薄膜〕
本発明の光反射フィルムの凹凸を示す面は、蒸着による金属薄膜を備える。金属薄膜の金属として、反射率の高い金属を用いることが好ましく、例えば、アルミニウム、クロム、金、銀、銅を用いることができ、コストの点でアルミニウムが好ましい。
[Metal thin film]
The surface which shows the unevenness | corrugation of the light reflection film of this invention is equipped with the metal thin film by vapor deposition. As the metal of the metal thin film, a metal having high reflectivity is preferably used. For example, aluminum, chromium, gold, silver, or copper can be used, and aluminum is preferable in terms of cost.
凹凸面に蒸着による金属薄膜を備えることで、粒子により形成された表面の凹凸形状に応じて鏡面反射する光反射特性を得ることができ、光反射フィルムを液晶表示装置のバックライトユニットの反射板に用いたときの輝度ムラを解消することができる。 By providing a metal thin film by vapor deposition on the concavo-convex surface, it is possible to obtain a light reflecting property that reflects specularly according to the concavo-convex shape of the surface formed by particles, and the light reflecting film is used as a reflector for a backlight unit of a liquid crystal display device. Luminance unevenness when used in the can be eliminated.
金属薄膜の膜厚は、例えば1〜500nm、好ましくは5〜200nmである。この範囲の膜厚であることで、粒子により形成された凹凸面を損なうことなく、そして光が透過することなく反射し、良好な輝度ムラ解消効果を得ることができる。 The film thickness of the metal thin film is, for example, 1 to 500 nm, preferably 5 to 200 nm. When the film thickness is in this range, the uneven surface formed by the particles is reflected without being damaged, and the light is reflected without being transmitted, and a favorable luminance unevenness eliminating effect can be obtained.
以下、実施例により本発明を詳述する。
なお、基材フィルムとして、フィルムの厚みが225μmのポリエチレンテレフタレートの二軸延伸フィルム(帝人デュポンフィルム製 テイジンテトロンUX−225)を使用した。
各評価およびアルミ蒸着は以下の方法で行った。
Hereinafter, the present invention will be described in detail by way of examples.
A biaxially stretched film of polyethylene terephthalate having a film thickness of 225 μm (Teijin Tetron UX-225 made by Teijin DuPont Film) was used as the base film.
Each evaluation and aluminum vapor deposition were performed by the following methods.
(1)平均粒径D50
HORIBA製LA−750パーティクルサイズアナライザー(Particle Size Analyzer)を用いて測定した。この測定器によって得られる遠心沈降曲線をもとに算出した各粒径の粒子とその存在量とのcumulative曲線から、50mass percentに相当する粒径を読み取り、この値を上記平均粒径とした。
(1) Average particle diameter D50
It measured using the HORIBA LA-750 particle size analyzer (Particle Size Analyzer). The particle size corresponding to 50 mass percent was read from the cumulative curve of particles of each particle size calculated based on the centrifugal sedimentation curve obtained by this measuring instrument and the abundance thereof, and this value was taken as the average particle size.
(2)輝度ムラ
輝度ムラの評価は、直下型バックライトユニットを備える液晶テレビ(Samsung社製、バックライトユニット型番LTY320AB01、バックライトサイズ32インチ、線状光源として蛍光管を8本搭載)を分解し、バックライトユニットのみを取り出し、該バックライトユニットに搭載されている反射板を評価対象の光反射フィルムに置き換え、バックライトを点灯させた状態で輝度ムラが発生しているかどうかを下記の方法で評価した。
(2) Luminance unevenness Evaluation of luminance unevenness is disassembling a liquid crystal television equipped with a direct type backlight unit (manufactured by Samsung, backlight unit model number LTY320AB01, backlight size 32 inches, 8 fluorescent tubes as linear light sources) Then, take out only the backlight unit, replace the reflector mounted on the backlight unit with the light reflecting film to be evaluated, and check whether the brightness unevenness occurs when the backlight is lit. It was evaluated with.
輝度計(大塚電子製、瞬間マルチ測光システムMCPD−7700)を用いて、受光用オプティカルファイバーの受光部を、評価用バックライトユニットの光学シート面に対し垂直(0°)かつ評価用バックライトユニットの光学シート面との距離が50cmとなる位置に固定し、視野角を2°視野、バックライトを点灯してから1時間後の輝度を測定した。輝度の測定は、輝度計の受光部を蛍光管の真上に置いた場合と、蛍光管と蛍光管の中間点の真上に置いた場合でそれぞれ測定を行い、輝度ムラを以下の式に従って算出した。
輝度ムラ
=(輝度計の受光部を蛍光管と蛍光管の中間点の真上に置いた場合の輝度)
÷(輝度計の受光部を蛍光管の真上に置いた場合の輝度)
Using a luminance meter (manufactured by Otsuka Electronics Co., Ltd., instantaneous multi-metering system MCPD-7700), the light receiving portion of the light receiving optical fiber is perpendicular to the optical sheet surface of the evaluation backlight unit (0 °) and the evaluation backlight unit. Was fixed at a position where the distance from the optical sheet surface was 50 cm, the viewing angle was 2 °, and the luminance was measured 1 hour after the backlight was turned on. The luminance is measured when the light-receiving part of the luminance meter is placed directly above the fluorescent tube and when it is placed directly above the midpoint between the fluorescent tube and the fluorescent tube. Calculated.
Unevenness of brightness = (Luminance when the light receiving part of the luminance meter is placed directly above the midpoint between the fluorescent tube and fluorescent tube)
÷ (Luminance when the light-receiving part of the luminance meter is placed directly above the fluorescent tube)
(3)アルミ蒸着
真空蒸着装置((株)中央理研製 IT−L20P)にサンプルフィルムをセットし、設定電圧を2.5V、設定電流を90Aにして所定の操作を進め、厚み100μmのアルミ蒸着膜を形成した。
(3) Aluminum deposition A sample film is set in a vacuum deposition apparatus (IT-L20P, manufactured by Chuo Riken Co., Ltd.), a predetermined voltage is set to 2.5 V, a set current is set to 90 A, and a predetermined operation is performed. A film was formed.
[実施例1]
基材フィルムに、AMT−50(水澤化学工業製、D50=5μm、立方体状のシリカの粒子)を80重量部、アクリルバインダーとしてユーダブルS2740(日本触媒製、アクリル系バインダー)を15重量部、架橋剤としてコロネートHL(日本ポリウレタン工業社製、イソシアネート系架橋剤)を5重量部、有機溶剤として酢酸ブチル(和光純薬工業製)135重量部を混合させて得られた塗液を、wet塗布量で25g/m2塗布し、その後オーブン内にて80℃で2分間乾燥して、粒子が表面に支持された光反射フィルムを得た。粒子により凹凸が形成された表面にアルミニウムを蒸着し、表面がアルミニウムの薄膜で覆われた光反射フィルムを得た。得られた光反射フィルムを、アルミニウム薄膜を反射面として直下型バックライトの反射板に用いて輝度ムラを評価したところ、輝度ムラはほぼ解消されており、輝度ムラは0.8であり、目視では輝度ムラがわずかに見える程度であった。
[Example 1]
80 parts by weight of AMT-50 (manufactured by Mizusawa Chemical Industry, D50 = 5 μm, cubic silica particles) on the base film, and 15 parts by weight of Udouble S2740 (manufactured by Nippon Shokubai, acrylic binder) as an acrylic binder Wet coating amount obtained by mixing 5 parts by weight of Coronate HL (manufactured by Nippon Polyurethane Industry Co., Ltd., isocyanate crosslinking agent) as an agent and 135 parts by weight of butyl acetate (manufactured by Wako Pure Chemical Industries) as an organic solvent Was applied at 25 g / m 2 , and then dried in an oven at 80 ° C. for 2 minutes to obtain a light reflecting film having particles supported on the surface. Aluminum was vapor-deposited on the surface on which the irregularities were formed by the particles, and a light reflecting film whose surface was covered with an aluminum thin film was obtained. When the obtained light reflecting film was evaluated for luminance unevenness using an aluminum thin film as a reflecting surface for a reflector of a direct type backlight, the luminance unevenness was almost eliminated, and the luminance unevenness was 0.8. Then, the brightness unevenness was slightly visible.
[比較例1]
基材フィルムをそのまま直下型バックライトの反射板に用いて輝度ムラを評価したところ、輝度ムラは0.7であり、目視では輝度ムラが鮮明に見えた。
[Comparative Example 1]
When the uneven brightness was evaluated using the base film as it was for the reflector of the direct type backlight, the uneven brightness was 0.7, and the uneven brightness looked visually.
[比較例2]
アルミ蒸着をしない他は実施例1と同様にして光反射フィルムを作成した。この光反射フィルムを直下型バックライトの反射板に用いて輝度ムラを評価したところ、輝度ムラは0.7であり、目視では輝度ムラが鮮明に見えた。
[Comparative Example 2]
A light reflecting film was prepared in the same manner as in Example 1 except that aluminum deposition was not performed. When this light reflecting film was used for a reflector of a direct type backlight and luminance unevenness was evaluated, the luminance unevenness was 0.7, and the luminance unevenness was clearly visible.
[比較例3]
基材フィルムの表面にアルミニウムを蒸着し、アルミニウム薄膜で覆われた光反射フィルムを得た。得られた光反射フィルムを直下型バックライトの反射板に用いて輝度ムラを評価したところ、輝度ムラは0.7であり、目視では輝度ムラが鮮明に見えた。
[Comparative Example 3]
Aluminum was vapor-deposited on the surface of the base film to obtain a light reflecting film covered with an aluminum thin film. When the obtained light reflection film was used for a reflector of a direct type backlight and luminance unevenness was evaluated, the luminance unevenness was 0.7, and the luminance unevenness was clearly visible.
本発明の光反射フィルムは、液晶表示装置のバックライトユニットの光反射板として、特に直下型バックライトユニットの光反射板として、好適に用いることができる。 The light reflecting film of the present invention can be suitably used as a light reflecting plate of a backlight unit of a liquid crystal display device, particularly as a light reflecting plate of a direct type backlight unit.
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| JPH11240099A (en) * | 1997-12-22 | 1999-09-07 | Sumitomo Metal Ind Ltd | Solar heat reflective surface treatment plate |
| JPH11326609A (en) * | 1998-05-20 | 1999-11-26 | Dainippon Ink & Chem Inc | Wide observation angle diffuse reflection sheet |
| JP2002006399A (en) * | 2000-06-26 | 2002-01-09 | Kawasaki Steel Metal Products & Engineering Inc | Reflection screen and method for manufacturing the same |
| JP2003252384A (en) * | 2002-02-28 | 2003-09-10 | Fuji Seal Inc | Heat-insulating container and manufacturing method therefor |
| JP2003297122A (en) * | 2002-04-05 | 2003-10-17 | Mitsui Chemicals Inc | Reflector, sidelight type backlight device and liquid crystal display device using the same |
| JP2004252384A (en) * | 2003-02-21 | 2004-09-09 | Mitsui Chemicals Inc | Reflection sheet |
| KR101073043B1 (en) * | 2004-11-16 | 2011-10-12 | 삼성전자주식회사 | Display device |
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