JP7641492B2 - 電力増幅装置及びrf回路モジュール - Google Patents
電力増幅装置及びrf回路モジュール Download PDFInfo
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- JP7641492B2 JP7641492B2 JP2020209635A JP2020209635A JP7641492B2 JP 7641492 B2 JP7641492 B2 JP 7641492B2 JP 2020209635 A JP2020209635 A JP 2020209635A JP 2020209635 A JP2020209635 A JP 2020209635A JP 7641492 B2 JP7641492 B2 JP 7641492B2
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- H03F3/245—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers of transmitter output stages with semiconductor devices only
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Description
第1実施形態に係るRF回路ユニットの概要について説明する。
図1(A)は、RF回路モジュール300の平面図である。図1(B)は、図1(A)に示したRF回路モジュール300のII-II線に沿った断面の構成を概略的に示す断面図である。
第1実施形態に係る電力増幅回路について説明する。
図6は、電力増幅回路61の回路図である。図6に示すように、電力増幅回路61は、第1回路400と、第2回路500と、整合回路601(第1整合回路)と、を含む。第1回路400は、増幅器制御回路401と、終端回路411(第1終端回路)と、を含む。第2回路500は、増幅器501(第1増幅器)と、バイアス回路502と、を含む。バイアス回路502は、バイアス用トランジスタ503と、トランジスタ504及び505と、抵抗素子506と、電流源507と、を含む。
第1実施形態に係る電力増幅装置のレイアウトについて説明する。図8は、第1部材110における第1回路400のレイアウトの一例を示す図である。図9は、第1部材110及び第2部材210のz軸-側に設けられた電極のレイアウトの一例を示す図である。図10は、第2部材210における第2回路500のレイアウトの一例を示す図である。図11は、増幅器501及びヒートスプレッダ131の辺りを拡大した図である。図8~図11は、例えば、z軸-側から第1部材110または第2部材210を平面視したときの平面図である。
第2実施形態に係る電力増幅装置及び電力増幅回路について説明する。第2実施形態以降では第1実施形態と共通の事柄についての記述を省略し、異なる点についてのみ説明する。特に、同様の構成による同様の作用効果については実施形態毎には逐次言及しない。
第2実施形態に係る電力増幅装置12のレイアウトについて説明する。
図18は、第1部材110における第1回路400のレイアウトの一例を示す図である。図19は、第1部材110及び第2部材210のz軸-側に設けられた電極のレイアウトの一例を示す図である。図18及び図19は、例えば、z軸-側から第1部材110または第2部材210を平面視したときの平面図である。なお、説明を分かりやすくするために、図18には、第2回路500における増幅器501の位置が示される。図19には、キャパシタ421、422及び423の位置が示される。
第3実施形態に係る電力増幅装置及び電力増幅回路について説明する。
図26は、電力増幅回路63の電力増幅装置13における配置を説明するための図である。図26には、電力増幅装置13の断面における電力増幅回路63の配置が模式的に示される。図26に示すように、第3実施形態に係る電力増幅回路63は、終端回路におけるキャパシタの容量が変更可能となっている点で第1実施形態に係る電力増幅回路61と異なる。
第4実施形態に係る電力増幅装置及び電力増幅回路について説明する。
図27は、電力増幅回路64の電力増幅装置14における配置を説明するための図である。図27には、電力増幅装置14の断面における電力増幅回路64の配置が模式的に示される。図27に示すように、第4実施形態に係る電力増幅装置14は、整合回路が第1部材110に設けられる点で第1実施形態に係る電力増幅装置11と異なる。
第5実施形態に係る電力増幅装置及び電力増幅回路について説明する。
図29は、電力増幅回路65の電力増幅装置15における配置を説明するための図である。図29には、電力増幅装置15の断面における電力増幅回路65の配置が模式的に示される。図29に示すように、第5実施形態に係る電力増幅回路65は、整合回路におけるキャパシタの容量が変更可能となっている点で第4実施形態に係る電力増幅回路64と異なる。
第6実施形態に係る電力増幅装置及び電力増幅回路について説明する。
図30は、電力増幅回路66の電力増幅装置16における配置を説明するための図である。図30には、電力増幅装置16の断面における電力増幅回路66の配置が模式的に示される。図30に示すように、第6実施形態に係る電力増幅回路66は、終端回路及び整合回路が同じ部材間接続導体を通じて第2部材210における増幅器に接続される点で第4実施形態に係る電力増幅回路64と異なる。
第7実施形態に係る電力増幅装置及び電力増幅回路について説明する。
図32は、電力増幅回路67の電力増幅装置17における配置を説明するための図である。図32には、電力増幅装置17の断面における電力増幅回路67の配置が模式的に示される。図32に示すように、第7実施形態に係る電力増幅回路67は、入力信号が差動増幅回路によって増幅される点で第1実施形態に係る電力増幅回路61と異なる。
第8実施形態に係る電力増幅装置及び電力増幅回路について説明する。
図33は、電力増幅回路68の電力増幅装置18における配置を説明するための図である。図33には、電力増幅装置18の断面における電力増幅回路68の配置が模式的に示される。図33に示すように、第8実施形態に係る電力増幅装置18は、整合回路が第1部材110に設けられる点で第7実施形態に係る電力増幅装置17と異なる。
第9実施形態に係る電力増幅装置及び電力増幅回路について説明する。
図34は、電力増幅回路69の電力増幅装置19における配置を説明するための図である。図34には、電力増幅装置19の断面における電力増幅回路69の配置が模式的に示される。図34に示すように、第9実施形態に係る電力増幅回路69は、整合回路におけるキャパシタの容量が変更可能となっている点で第8実施形態に係る電力増幅回路68と異なる。
第10実施形態に係る電力増幅装置及び電力増幅回路について説明する。
図35は、電力増幅回路70の電力増幅装置20における配置を説明するための図である。図35には、電力増幅装置20の断面における電力増幅回路70の配置が模式的に示される。図35に示すように、第10実施形態に係る電力増幅回路70は、APT(Average Power Tracking)方式またはET(Envelope Tracking)方式によって増幅器501に電力が供給される点で第1実施形態に係る電力増幅回路61と異なる。
第11実施形態に係る電力増幅装置及び電力増幅回路について説明する。
図36は、電力増幅回路71の電力増幅装置21における配置を説明するための図である。図37は、図36に示す90度位相シフト回路444及び出力整合回路445の詳細示す図である。図36及び図37には、電力増幅装置21の断面における電力増幅回路71の配置が模式的に示される。図36及び図37に示すように、第11実施形態に係る電力増幅回路71は、ドハティー増幅器によって増幅される点で第1実施形態に係る電力増幅回路61と異なる。
キャパシタ445acは、インダクタ445baの第2端に接続された第1端と、第1導体突起116を通じて接地された第2端と、を有する。キャパシタ445adは、キャパシタ445acの第1端に接続された第1端と、第2端と、を有する。スイッチ445cbは、キャパシタ445adの第2端に接続された第1端と、キャパシタ445acの第2端に接続された第2端と、を有する。
第12実施形態に係る電力増幅装置及び電力増幅回路について説明する。
図38は、電力増幅回路72の電力増幅装置22における配置を説明するための図である。図38には、電力増幅装置22の断面における電力増幅回路72の配置が模式的に示される。図38に示すように、第12実施形態に係る電力増幅回路72は、終端回路411r及び整合回路442が第1部材110の外部で接地される点で第5実施形態に係る電力増幅回路65と異なる。
31…入力端子
32…出力端子
33…電源供給端子
61、62、63、64、65、66、67、68、69、70、71、72…電力増幅回路
110…第1部材
111…接着層
113…第1部材側電極
114…導体ピラー
115…はんだ層
116…第1導体突起
119…レジスト膜
121…基板
122…第1絶縁膜
123…第2絶縁膜
124…第3絶縁膜
131…ヒートスプレッダ
132a、132b、132cb、132cd、132db、132dd、132de…第1部材電極
132ca、132cc、132ce、132da、132dc、132e、132ia、132ib、132ic、132id、132ie、132if…第1部材金属配線
133…第1部材ビア
210…第2部材
211…母基板
212…剥離層
213…第2部材側電極
213a…エミッタパッド
214…導体ピラー
215…はんだ層
216…第2導体突起
221B…ベース層
221C…コレクタ層
221E…エミッタ層
222B…ベース電極
222C…コレクタ電極
222E…エミッタ電極
223E…エミッタ配線
224…層間絶縁膜
225…第1絶縁膜
226…第2絶縁膜
300…RF回路モジュール
301…PA回路素子
310…モジュール基板
311…基板側電極
312…基板側電極
313…モールド樹脂
351a、351b、351c、351d、351i、351j、351k、351m、351n、351p…部材間接続導体
351aa、351da、351e、351f、351g…再配線
351ab、351db、351h…再配線ビア
400…第1回路
401…増幅器制御回路
402…スイッチ制御回路
411、412、413…終端回路
431、432、433、434、435、436…スイッチ
441、442、443、443a…整合回路
444…90度位相シフト回路
445…出力整合回路
500…第2回路
501、501c…増幅器
501a…トランジスタ素子
502…バイアス回路
503…バイアス用トランジスタ
504、505…トランジスタ
506…抵抗素子
507…電流源
601…整合回路
602…バラン
651、652、653…インダクタ
651a、652a、653a…中間タップ
701…終端回路
702、703…整合回路
751…電源
Claims (23)
- 部品搭載用の電極を有するモジュール基板と、
第1回路が形成された第1部材と、
第2回路が形成された第2部材と、
前記第1回路と前記第2回路とを前記モジュール基板を通じないで電気的に接続する部材間接続導体と、を備え、
前記第2部材は、前記第1部材にマウントされ、
前記第2回路は、無線周波数信号を増幅して第1増幅信号を出力する第1増幅器を含み、
前記第1回路は、前記第2回路の動作を制御する制御回路を含み、
前記第1部材は、前記モジュール基板にフリップチップボンディングされ、
前記第1部材は、前記モジュール基板の前記電極に接続される第1部材側導体突起部を有し、
前記第2部材は、前記モジュール基板の前記電極に接続される第2部材側導体突起部を有し、
前記第1部材には、前記部材間接続導体を通じて前記第1増幅器に接続され、前記第1増幅信号の高調波成分を減衰させる第1終端回路の少なくとも一部が形成されている、
RF回路モジュール。 - 請求項1に記載のRF回路モジュールであって、
前記第1終端回路は、前記第1部材に形成された第1インダクタを含む、
RF回路モジュール。 - 請求項1または請求項2に記載のRF回路モジュールであって、
前記第1終端回路は、前記部材間接続導体によって形成された第2インダクタを含む、
RF回路モジュール。 - 請求項1から請求項3のいずれか一項に記載のRF回路モジュールであって、
前記第1終端回路は、減衰させる前記高調波成分の周波数を切り替えるスイッチを含む、
RF回路モジュール。 - 請求項1から請求項4のいずれか一項に記載のRF回路モジュールであって、
前記第1部材には、前記第1増幅器から前記第1増幅器の後段の回路を見たときの、前記第1増幅信号の基本波についてのインピーダンスを調整する第1整合回路の少なくとも一部が形成され、
第1整合回路は、前記インピーダンスを切り替えるスイッチを含む、
RF回路モジュール。 - 請求項1から請求項5のいずれか一項に記載のRF回路モジュールであって、
前記第1部材には、前記第1終端回路の一部が形成され、
前記第1部材には、前記第1増幅器から前記第1増幅器の後段の回路を見たときの、前記第1増幅信号の基本波についてのインピーダンスを調整する第1整合回路の一部が形成され、
前記第1終端回路及び前記第1整合回路は、前記部材間接続導体によって形成され、かつ前記第1増幅器に接続される第2インダクタを含む、
RF回路モジュール。 - 請求項1から請求項3のいずれか一項に記載のRF回路モジュールであって、
前記無線周波数信号は、平衡信号を構成する第1信号と第2信号とを含み、
前記第1増幅器は、前記第1信号を増幅して前記第1増幅信号を出力し、
前記第2回路は、前記第2信号を増幅して第2増幅信号を出力する第2増幅器をさらに含み、
前記制御回路は、前記第2増幅器の動作をさらに制御し、
前記第1部材には、前記部材間接続導体を通じて前記第2増幅器に接続され、前記第2増幅信号の高調波成分を減衰させる第2終端回路の少なくとも一部が形成されている、
RF回路モジュール。 - 請求項1から請求項3のいずれか一項に記載のRF回路モジュールであって、
前記無線周波数信号は、分配された、第1信号、及び前記第1信号と位相が異なる第2信号を含み、
前記第1増幅器は、前記第2信号の電力レベルが所定の電力レベル以上を示すときに、前記第2信号を増幅して第2増幅信号を出力し、
前記第2回路は、前記第1信号を増幅して前記第1増幅信号を出力する第2増幅器をさらに含み、
前記制御回路は、前記第2増幅器の動作をさらに制御し、
前記第1部材には、前記部材間接続導体を通じて前記第2増幅器に接続され、前記第2増幅信号の高調波成分を減衰させる第2終端回路の少なくとも一部が形成されている、
RF回路モジュール。 - 請求項8に記載のRF回路モジュールであって、
前記第1回路は、前記第1増幅信号の位相をシフトさせる位相シフト回路を含み、
前記位相シフト回路は、前記位相のシフト量を切り替えるスイッチを含む、
RF回路モジュール。 - 請求項8または請求項9に記載のRF回路モジュールであって、
前記第1部材には、前記第1増幅信号及び前記第2増幅信号を合成して第3増幅信号を生成するとともに、前記第1増幅器及び前記第2増幅器から前記第1増幅器及び前記第2増幅器の後段の回路を見たときの、前記第3増幅信号の基本波についてのインピーダンスを調整する第1整合回路が形成され、
前記第1整合回路は、前記インピーダンスを切り替えるスイッチを含む、
RF回路モジュール。 - 請求項1から請求項10のいずれか一項に記載のRF回路モジュールであって、
前記第1部材には、前記第2部材を平面視したときに前記第1増幅器と重なる位置にヒートスプレッダが設けられる、
RF回路モジュール。 - 請求項1から請求項11のいずれか一項に記載のRF回路モジュールであって、
前記第1終端回路は、
前記第1増幅器に接続された第1端と、中間タップと、接地された第2端と、を有する第3インダクタと、
前記第3インダクタの中間タップに接続された第1端と、接地された第2端と、を有するスイッチであって、前記第1端と前記第2端との導通及び非導通を切り替えるスイッチと、を含む、
RF回路モジュール。 - 請求項1から請求項12のいずれか一項に記載のRF回路モジュールであって、
前記第1部材には、前記第1増幅器から前記第1増幅器の後段の回路を見たときの、前記第1増幅信号の基本波についてのインピーダンスを調整する第1整合回路の少なくとも一部が形成され、
前記第1整合回路は、
前記第1増幅器に接続された第1端と、中間タップと、出力端子に接続された第2端と、を有する第4インダクタと、
前記第4インダクタの中間タップに接続された第1端と、前記出力端子に接続された第2端と、を有するスイッチであって、前記第1端と前記第2端との導通及び非導通を切り替えるスイッチと、を含む、
RF回路モジュール。 - 請求項1から請求項13のいずれか一項に記載のRF回路モジュールであって、
前記第1部材には、入力端子から前記第1増幅器を見たときの、前記無線周波数信号の基本波についてのインピーダンスを調整する第2整合回路の少なくとも一部が形成されており、
前記第2整合回路は、
前記第1増幅器に接続された第1端と、中間タップと、前記入力端子に接続された第2端と、を有する第5インダクタと、
前記第5インダクタの中間タップに接続された第1端と、前記入力端子に接続された第2端と、を有するスイッチであって、前記第1端と前記第2端との導通及び非導通を切り替えるスイッチと、を含む、
RF回路モジュール。 - 請求項1から請求項14のいずれか一項に記載のRF回路モジュールであって、
前記第1部材は、単体半導体の部材であり、
前記第2部材は、化合物半導体の部材である、
RF回路モジュール。 - 請求項1から請求項15のいずれか一項に記載のRF回路モジュールであって、
前記第1部材の熱伝導率は、前記第2部材の熱伝導率と比べて大きい、
RF回路モジュール。 - 請求項1から請求項16のいずれか一項に記載のRF回路モジュールであって、
前記第2部材の厚さは、前記第1部材の厚さより薄い、
RF回路モジュール。 - 請求項7に記載のRF回路モジュールであって、
前記モジュール基板には、前記第2部材側導体突起部を通じて供給される前記第1増幅信号及び前記第2増幅信号を、非平衡信号である第3増幅信号に変換するバランが設けられる、
RF回路モジュール。 - 請求項18に記載のRF回路モジュールであって、
前記第1部材には、前記バランから前記第1部材側導体突起部を通じて前記第3増幅信号が供給され、前記バランから前記バランの後段の回路を見たときの、前記第3増幅信号の基本波についてのインピーダンスを調整する第1整合回路が形成され、
第1整合回路は、前記インピーダンスを切り替えるスイッチを含む、
RF回路モジュール。 - 請求項7から請求項10のいずれか一項に記載のRF回路モジュールであって、
前記第2増幅器は、前記第2部材側導体突起部を通じて接地され、
前記第2終端回路は、前記第2部材及び前記第2部材側導体突起部を通じて接地される、
RF回路モジュール。 - 請求項1から請求項17のいずれか一項に記載のRF回路モジュールであって、
前記第1増幅器は、前記第2部材側導体突起部を通じて接地され、
前記第1終端回路は、前記第2部材及び前記第2部材側導体突起部を通じて接地される、
RF回路モジュール。 - 請求項1から請求項17のいずれか一項に記載のRF回路モジュールであって、
前記第1部材は、前記第1部材側導体突起部によって前記モジュール基板にフリップチップボンディングされ、
前記部材間接続導体は、前記第1部材及び前記第2部材のいずれか一方に形成された導体である、
RF回路モジュール。 - 請求項1から請求項17のいずれか一項に記載のRF回路モジュールであって、
前記第2部材は、1または複数の前記第2部材側導体突起部を有し、
前記1または複数の前記第2部材側導体突起部のうちの少なくとも1つは、前記第2部材を平面視したときに、前記第1増幅器と重なるように設けられる、
RF回路モジュール。
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Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005303771A (ja) | 2004-04-14 | 2005-10-27 | Mitsubishi Electric Corp | 高周波電力増幅器 |
| US20080136729A1 (en) | 2006-12-08 | 2008-06-12 | Electronics And Telecommunications Research Institute | Antenna matching device and transceiver having the same |
| JP2013197655A (ja) | 2012-03-16 | 2013-09-30 | Mitsubishi Electric Corp | 高周波電力増幅器 |
| US20130307628A1 (en) | 2011-01-24 | 2013-11-21 | Nationz Technologies Inc. | Radio Frequency Power Amplifier and Packaging and Fabrication Method Thereof |
| JP2016526306A (ja) | 2014-07-11 | 2016-09-01 | インテル コーポレイション | スケーラブルパッケージアーキテクチャ並びに関連する技法及び構造 |
| JP2016528735A (ja) | 2013-09-27 | 2016-09-15 | インテル・コーポレーション | 受動素子用のスーパーポーザ基板を備えるダイパッケージ |
| US20160285420A1 (en) | 2015-03-24 | 2016-09-29 | Freescale Semiconductor, Inc. | Rf amplifier module and methods of manufacture thereof |
| JP2020028108A (ja) | 2018-08-10 | 2020-02-20 | 株式会社村田製作所 | 電力増幅モジュール |
| WO2020100219A1 (ja) | 2018-11-13 | 2020-05-22 | 三菱電機株式会社 | 高周波増幅器および高周波増幅器モジュール |
| JP2020136729A (ja) | 2019-02-13 | 2020-08-31 | 株式会社デンソー | 周波数帯域可変高周波増幅器 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6466094B2 (en) * | 2001-01-10 | 2002-10-15 | Ericsson Inc. | Gain and bandwidth enhancement for RF power amplifier package |
| GB2510084B (en) * | 2011-11-04 | 2018-02-21 | Skyworks Solutions Inc | Apparatus and methods for power amplifiers |
| WO2013188712A1 (en) * | 2012-06-14 | 2013-12-19 | Skyworks Solutions, Inc. | Power amplifier modules including related systems, devices, and methods |
| US9344140B2 (en) | 2014-02-25 | 2016-05-17 | Skyworks Solutions, Inc. | Systems, devices and methods related to improved radio-frequency modules |
| JP2017208729A (ja) * | 2016-05-19 | 2017-11-24 | 株式会社村田製作所 | 電力増幅モジュール |
-
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Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005303771A (ja) | 2004-04-14 | 2005-10-27 | Mitsubishi Electric Corp | 高周波電力増幅器 |
| US20080136729A1 (en) | 2006-12-08 | 2008-06-12 | Electronics And Telecommunications Research Institute | Antenna matching device and transceiver having the same |
| US20130307628A1 (en) | 2011-01-24 | 2013-11-21 | Nationz Technologies Inc. | Radio Frequency Power Amplifier and Packaging and Fabrication Method Thereof |
| JP2013197655A (ja) | 2012-03-16 | 2013-09-30 | Mitsubishi Electric Corp | 高周波電力増幅器 |
| JP2016528735A (ja) | 2013-09-27 | 2016-09-15 | インテル・コーポレーション | 受動素子用のスーパーポーザ基板を備えるダイパッケージ |
| JP2016526306A (ja) | 2014-07-11 | 2016-09-01 | インテル コーポレイション | スケーラブルパッケージアーキテクチャ並びに関連する技法及び構造 |
| US20160285420A1 (en) | 2015-03-24 | 2016-09-29 | Freescale Semiconductor, Inc. | Rf amplifier module and methods of manufacture thereof |
| JP2020028108A (ja) | 2018-08-10 | 2020-02-20 | 株式会社村田製作所 | 電力増幅モジュール |
| WO2020100219A1 (ja) | 2018-11-13 | 2020-05-22 | 三菱電機株式会社 | 高周波増幅器および高周波増幅器モジュール |
| JP2020136729A (ja) | 2019-02-13 | 2020-08-31 | 株式会社デンソー | 周波数帯域可変高周波増幅器 |
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