JPH04149743A - Drive method of data processing device - Google Patents

Abstract

PURPOSE:To preliminarily check errors or the possibility of error generation by varying the operation environment conditions such as the phase of a basic clock to be supplied respectively to microprocessors, the intensity of power supply voltage, or the scales of radiation of heat within the range of the operation assurance range. CONSTITUTION:A basic clock to be supplied to a microprocessor 1 is directly supplied from a basic clock supply line 11. On the other hand, the clock to be supplied to a microprocessor 2 supplies the clock where the phase is delayed by a delay line 15 from the clock to the basic clock supply line 11. In the microprocessor 1, the power supply is directly supplied from a power source supply line 12. In the microprocessor 2, the power supply voltage is supplied from the power supply line 12 through a resistor 13 as a power supply step-down means. When the changes of the operation environment such as the conventional noise, the fluctuation of power supply voltage, periodic temperature exceed the operation assurance range, the processing result due to the normal operation and the processing result due to misoperation are outputted to microprocessors 1 and 2 as data processing component. Thus, the misoperation is detected by comparing different processing results.

Description

[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a drive system for a data processing device used in the field of office processing, which requires extremely high reliability guarantee for data processing results. The present invention relates to a drive system for a highly reliable data processing device that performs the same processing using two data processing elements and compares the results to guarantee the results.

[Conventional technology]

FIG. 6 shows the configuration of a data processing device according to the prior art, which is configured to execute the same data processing using two data processing components, compare the output results, and detect a mismatch as an erroneous operation. It is a diagram.

In the figure, 1 is a microprocessor as a data processing component, 2 is another microprocessor with the same configuration and function as microprocessor 1 and provided for comparing data processing results, and 3 is the output of microprocessor 1. a comparator for comparing the output of the microprocessor 2;
4 is an interrupt control device that generates a malfunction interrupt to microprocessor 1 and microprocessor 2 in response to the mismatch signal from comparator 3; 5 is an input for data processing performed by microprocessor 1 and microprocessor 2; An input bus 6 carries information, an output bus 6 outputs the results processed by the microprocessor 1, and a microprocessor 2 7 outputs the results processed by the microprocessor 2 to the comparator 3.
8 is a mismatch signal from which the comparator 3 notifies the output results of microprocessor 1 and microprocessor 2, and 9 is a microprocessor 1 malfunction signal that generates a malfunction interrupt from interrupt control device 4 to microprocessor 1. An interrupt line 10 is a microprocessor 2 malfunction interrupt line that generates a malfunction interrupt from the interrupt control device 4 to the microprocessor 2; 11 is a basic tarlock supply system for the microprocessor 1 and the microprocessor 2; is a power supply line for microprocessor 1 and microprocessor 2.

FIG. 7 shows how two microprocessors, microprocessor 1 and microprocessor 20, as data processing components are mounted on a printed wiring board. In the figure, ■ is a microprocessor, 2 is a microprocessor, 16 is a printed wiring board on which the two microprocessors are mounted, and 17 and 18 are heat dissipation fins attached to the microprocessor 1 and the microprocessor 2, respectively.

Figure 8 shows microprocessor 1 and microprocessor 2.
However, since they react in exactly the same way to external noise, the output comparison results always match.

Figure 9 shows microprocessor 1 and microprocessor 2.
1 is a diagram showing that since the source voltage is commonly supplied, the operating environment conditions of the two microprocessors are the same even when the upper and lower limits of the operating power supply voltage are exceeded.

Figure 10 is a diagram showing that since the heat dissipation conditions of microprocessor 1 and microprocessor 2 are the same, the operating environment conditions of the two microprocessors are the same even if the element temperature of the microprocessor exceeds the guaranteed upper limit temperature. It is.

Next, the operation will be explained. In FIG. 6, the microprocessor 5 and the microprocessor 2 are connected to a common T source supply line 12, a common basic tarlock supply line 11, and a common input bus 5, and as shown in FIG. are the same, and are configured to process data under completely the same operating environment conditions.

The condition results of the microprocessor 1 are output to the output bus 6 as processing results of the data processing device, and are also supplied to the comparator 3, where they are compared with the processing results of the microprocessor 2.

The internal states of microprocessor 1 and microprocessor 2, including the built-in puffer memory, are initialized, and control is performed so that the output results match, including time conditions.

The output results of microprocessor 1 and microprocessor 2 operated in this way are compared by comparator 3, and if a mismatch is detected, it means that somewhere in the data processing device has malfunctioned, and comparator 3 Discrepancy signal from 8
Accordingly, the interrupt control device 4 generates an interrupt to the microprocessor 1 and the microprocessor 2 by malfunction interrupts wA9 and wA10, and executes processing related to the malfunction.

In this way, the processing results are guaranteed to be legitimate only when the output results of the data processing components match.

[Problem to be solved by the invention]

Because conventional data processing equipment is configured as described above, malfunctions of the data processing equipment due to disturbances common to multiple data processing components, such as external noise, power supply voltage fluctuations, and ambient temperature fluctuations, are not detected. However, there were problems such as difficulty in guaranteeing the processing results of the data processing device.

This invention was made to solve the above-mentioned problems, and can detect malfunctions caused by external noise, as well as detect malfunctions caused by fluctuations in the supply ttA voltage and errors in data processing results due to disturbances caused by malfunctions caused by fluctuations in ambient temperature. ,
Alternatively, it is an object of the present invention to obtain a data processing device that can detect the possibility of an error occurring in advance and has highly reliable data processing results.

[Means to solve the problem]

The driving method of the data processing device according to the present invention is based on operating environment conditions such as the phase of the basic clock supplied to each of the microprocessors 1 and 2 as data processing components, the magnitude of the power supply voltage, or the height of the heat dissipation temperature. are made to differ from each other within the guaranteed operation range.

When the operation guarantee range is exceeded, the microprocessor 1.2 as a data processing component outputs a processing result due to normal operation to one side and a processing result due to malfunction to the other side. Malfunctions are detected by comparing these different processing results.

[Embodiments of the invention]

An embodiment of the present invention will be described below with reference to the drawings. 1st
In the figure, 1 is a microprocessor as a data processing component, 2 is a microprocessor as another data processing component, 3 is a comparator that compares the outputs of microprocessor 1 and microprocessor 2, and 4 is a comparator 3. The microprocessor 1 receives the mismatch signal 8 from the microprocessor 1.
and an interrupt control device that generates a malfunction interrupt to the microprocessor 2; 5 is an input bus of the microprocessor; 6
is an output bus that outputs the results processed by the microprocessor 1, 7 is a microprocessor 2 output bus, 8 is a mismatch signal from the comparator 3, and 9 is a malfunction interrupt signal sent from the interrupt control device 4 to the microprocessor 1. 10 is a microprocessor 2 malfunction interrupt line that generates a malfunction interrupt from the interrupt control device 4 to the microprocessor 2, 11 is a basic clock supply line, and 12 is a power supply line. line, 13 is microprocessor 2
a resistor as a means of lowering the supply voltage to the
4 is a capacitor for the purpose of stabilizing the power supply voltage supplied to the microprocessor 2, and 15 is a delay line as means for shifting the phase of the basic clock supplied to the microprocessor 2.

Figure 2 shows how two microprocessors, microprocessor 1 and microprocessor 2, as data processing components are mounted on a printed wiring board. In Figure 0, l is a microprocessor, 2 is a microprocessor, 16 is a printed wiring board, 17 is a heat radiation fin attached to the microprocessor 1, and 18 is a heat radiation fin attached to the microprocessor 2.

FIG. 3 shows that the phase of the basic tarock supplied to the microprocessor 2 is shifted by the delay line 15, and when an external noise causes a disturbance at the beginning of the basic clock T-2 of the microprocessor 1, the microprocessor Although the processor 1 produces an erroneous output, the microprocessor 2 operates normally, so the comparison mismatch signal 8 becomes significant, indicating that a malfunction has been detected.

Figure 4 shows microprocessor 1 and microprocessor 2.
This shows the voltage fluctuation of the power supply to the

Figure 5 shows microprocessor 1 and microprocessor 2.
shows the element temperature fluctuation.

Next, the operation will be explained. In FIG. 1, the basic clock supplied to microprocessor 1 is directly supplied from basic clock supply line 11, while the clock supplied to microprocessor 2 is supplied directly from basic clock supply line 11.
1 is supplied with a clock whose phase is delayed by a delay vA15. Power is directly supplied to the microprocessor l from a power supply line 12.

A power supply voltage is supplied to the power supply line 12 through a resistor 13 as a power voltage step-down means.

Both microprocessors1. In order to have the same logical state including the internal state of the two, after initializing the built-in puffer memory, data processing is performed using data processing commands and data supplied from the commonly connected input bus 5, Microprocessor l has output bus 6 and comparator 3
Output the processing results to. The microprocessor 2 outputs the processing result to the comparator 3 through the microprocessor 2 output bus flow, and the comparator 3 is connected to both microprocessors 1.
Compare the outputs of 2.

Under normal conditions with no disturbance, the difference in the basic clock phase is also
The difference in power supply voltage also affects the radiation fins 17. shown in FIG.
Since the operating temperature difference of the elements caused by the difference in the heat dissipation area of the microprocessors 1 and 18 is all within the guaranteed operating environment conditions, both the microprocessors 1 and 2 output the processing results normally, and the comparison results from the comparator 3 are consistent. There is.

Figure 3 shows one microblossom due to external noise.5.
The basic clock supplied to the microprocessor 1 is the MPU 1 basic clock, the basic clock supplied to the microprocessor 2 is the MPU 2 basic clock, and the basic clock supplied to the microprocessor 2 is the MPU 2 basic clock. Electrostatic discharge and pulsed external noise superimposed on the AC line are external noise, and microprocessor l output is used as MPU.
I output, the microprocessor 2 output is shown as the MPU 2 output, and the mismatch detection signal of the comparator 3 that compares the outputs of both microprocessors 1.2 is shown as the comparison mismatch signal 8, respectively. External noise occurs exactly at the beginning of MPU 1 basic clock [2], and due to micro-progression, normal processing results can be output without detecting external noise.

As a result, the processing results of the two microprocessors 1.2 are different, the comparator 3 outputs a comparison mismatch signal 8, a malfunction interrupt is generated via the interrupt control device 4, and the processing results of the two microprocessors 1.2 are different. 2 executes malfunction interrupt processing.

Figure 4 shows that malfunctions due to power supply voltage fluctuations can be detected by the difference in the operating power supply voltages of both microprocessor sensors 1 and 2, and shows that the supply voltage to the microprocessor 1 is MP
U1iit [voltage, the supply voltage to the microprocessor 2 is written as the MPU2it source voltage.

Due to power supply voltage fluctuations, when the microprocessor power supply voltage exceeds the upper limit, even if the MPU1 source voltage exceeds the upper limit value, the MPU2'i source voltage is within the guaranteed operation range.

Conversely, when the microprocessor power supply voltage falls below the lower limit, even if the MPU2 power supply voltage falls below the lower limit, the MP
The UI power supply voltage is within the operating range, and by configuring the system so that one is guaranteed to operate normally and the other passes through a combination that malfunctions, malfunctions caused by the t power supply ♂i are reliably detected.

FIG. 5 is a diagram showing that it is possible to detect malfunctions due to changes in ambient temperature based on the difference in element temperature of the microblossom unit 17 and 1.2, and as shown in FIG. By varying the area, two microbrosses 1. If there is a difference between the element temperatures of 1 and 2, and the element temperature exceeds the guaranteed operating temperature range due to an increase in ambient temperature, the temperature of the MPU 2 element with the smaller heat dissipation fin product will be the 11] limit temperature. Even if the MPUI has a large heat dissipation fin area, the element temperature is within the guaranteed operating temperature range, and even if one malfunctions, the other is guaranteed to operate normally by configuring the device to pass through the combination. Detects malfunctions due to changes in ambient temperature.

In addition, in the embodiment described above, the input bus 5 and output bus 6 of the microprocessor 1.2-. The same result can be obtained by configuring the result comparison to be performed only during the output time.

Furthermore, in the embodiment described in (g), a resistor 13 is used as the power supply voltage step-down means (5). Heat radiation fins with different heat radiation areas were used for the purpose of providing differences in final temperature during operation, but different power supply voltages were supplied to each microprocessor 1.2 from separate power supplies 5, and each microprocessor The same effect can be obtained by cooling the prosensors 1 and 2 with different amounts of cooling air.

Further, the desired effect can be obtained even if any one of the operating environment conditions is made different, without making all of the phase of the basic clock, the magnitude of the power supply voltage, and the height of the heat radiation temperature different.

[Effects of the Invention] As described above, according to the present invention, the operating environment, such as the phase of the basic clock supplied to each microprocessor as a data processing component, the magnitude of the power supply voltage, or the height of the heat radiation temperature, etc. It is possible to detect in advance an error in the data processing result due to a disturbance due to a malfunction under certain conditions, or the possibility of the occurrence of an error, and it is possible to perform data processing with high reliability of the data processing result.

[Brief explanation of drawings]

FIG. 1 is a configuration diagram of a drive system of a data processing device according to an embodiment of the present invention, FIG. 2 is a diagram of a state in which a heat dissipation fin is attached to a microprocessor according to an embodiment of the present invention, and FIG. FIG. 4 is a diagram showing power supply voltage fluctuations according to an embodiment of the present invention; FIG. 5 is a diagram showing microprocessor element temperature fluctuations according to an embodiment of the present invention; Fig. 6 is a configuration diagram of a conventional data processing device, Fig. 7 is a diagram of a microprocessor heat dissipation fin installation state according to a conventional example, Fig. 8 is a diagram showing malfunction due to external noise according to a conventional example, and Fig. 9 is a conventional example. FIG. 10 is a diagram showing the temperature fluctuation of a microprocessor element according to a conventional example. 1.2...Microprocessor, 3...
- Comparator, 4...Interrupt control device. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

[Claims] Multiple data processing components with the same configuration and functions are made to execute the same process, the output results of each data processing component are compared, and the processing result is authentic only when the comparison results match. In a data processing device configured to guarantee that A drive method for a data processing device, characterized in that the drive method is made to differ.