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JPH04336044A - Grid structure of X-ray CT device - Google Patents

Grid structure of X-ray CT device

Info

Publication number
JPH04336044A
JPH04336044A JP3105455A JP10545591A JPH04336044A JP H04336044 A JPH04336044 A JP H04336044A JP 3105455 A JP3105455 A JP 3105455A JP 10545591 A JP10545591 A JP 10545591A JP H04336044 A JPH04336044 A JP H04336044A
Authority
JP
Japan
Prior art keywords
rays
grid
ray
scattered
grid structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3105455A
Other languages
Japanese (ja)
Inventor
Mitsuru Hachiman
満 八幡
Yasuo Saito
泰男 斉藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP3105455A priority Critical patent/JPH04336044A/en
Publication of JPH04336044A publication Critical patent/JPH04336044A/en
Pending legal-status Critical Current

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  • Apparatus For Radiation Diagnosis (AREA)
  • Nuclear Medicine (AREA)
  • Measurement Of Radiation (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】[Detailed description of the invention]

[発明の目的] [Purpose of the invention]

【0001】0001

【産業上の利用分野】本発明は、X線検出器に入射する
散乱X線を遮断するX線CT装置のグリッド構造に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a grid structure for an X-ray CT apparatus that blocks scattered X-rays incident on an X-ray detector.

【0002】0002

【従来の技術】一般に、X線装置ではX線管からX線を
放射し、被検体透過後のX線をX線検出器で収集する。 このとき、X線検出器では、透過X線だけでなく、被検
体内で散乱した散乱X線をも収集してしまうので、ノイ
ズの発生や画質の劣化の原因となってしまう。そこで、
従来より、この散乱X線を除去する目的で、次に示す2
つの方法が考案されている。
2. Description of the Related Art Generally, in an X-ray apparatus, an X-ray tube emits X-rays, and an X-ray detector collects the X-rays after passing through a subject. At this time, the X-ray detector collects not only transmitted X-rays but also scattered X-rays scattered within the subject, which causes noise generation and deterioration of image quality. Therefore,
Conventionally, the following two methods have been used to remove these scattered X-rays.
Two methods have been devised.

【0003】図3は第一の方法を示す説明図であり、主
検出器6の側部近傍に散乱X線検出器5が設置される。 そして、X線管1から放射されたX線が被検体2内で散
乱した散乱X線3は、散乱線検出器5で検出される。そ
の後、この散乱X線3の量に基づいて、経験的に主検出
器6では収集される散乱X線の量が求められるので、主
検出器6で収集された全X線量から散乱X線を除去して
透過X線量を求める。
FIG. 3 is an explanatory diagram showing the first method, in which a scattered X-ray detector 5 is installed near the side of the main detector 6. Scattered X-rays 3 obtained by scattering the X-rays emitted from the X-ray tube 1 within the subject 2 are detected by a scattered ray detector 5. Then, based on the amount of scattered X-rays 3, the amount of scattered X-rays to be collected by the main detector 6 is determined empirically. The amount of transmitted X-rays is determined by removing it.

【0004】図4は第二の方法を示す説明図であり、複
数のシンチレータ7の各接合部位置には、グリッド8が
設けられている。そして、透過X線4はグリッド8間を
透過してシンチレータ7に収集され、散乱X線3はグリ
ッド8に入射して吸収される。これによって、散乱X線
3が除去される。
FIG. 4 is an explanatory diagram showing the second method, in which a grid 8 is provided at each joint position of a plurality of scintillators 7. The transmitted X-rays 4 are transmitted between the grids 8 and collected by the scintillator 7, and the scattered X-rays 3 are incident on the grids 8 and absorbed. This removes the scattered X-rays 3.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、前記第
一の方法では、散乱X線3を検出するための散乱検出器
5,及び主検出器6で収集された散乱線量を演算するた
めの演算機能(不図示)が必要になるので、設置がスペ
ースが大きくなり、かつコストアップにつながる。
However, in the first method, the scattering detector 5 for detecting the scattered X-rays 3 and the calculation function for calculating the scattered radiation dose collected by the main detector 6 are (not shown), the installation requires a large space and increases costs.

【0006】また、前記第二の方法では、各シンチレー
タ間にグリッド8が配設されるので、例えばグリッド8
の厚さをL1 ,シンチレータ7のチャネル間ピッチを
L2 とすれば、グリッド7で収集できる幅は(L2 
−L1 )となってしまい幾何効率が著しく低下してし
まうという欠点があった。
Furthermore, in the second method, since the grid 8 is disposed between each scintillator, for example, the grid 8
If the thickness of the scintillator 7 is L1 and the pitch between the channels of the scintillator 7 is L2, then the width that can be collected by the grid 7 is (L2
-L1), resulting in a significant drop in geometric efficiency.

【0007】この発明はこのような従来の課題を解決す
るためになされたもので、その目的とするところは、幾
何効率を低下させるこなく、かつ簡易に散乱X線を除去
することのできるX線CT装置のグリッド構造を提供す
ることにある。 [発明の構成]
[0007] This invention was made in order to solve the conventional problems, and its purpose is to provide an X-ray system that can easily remove scattered X-rays without reducing the geometric efficiency. The object of the present invention is to provide a grid structure for a line CT device. [Structure of the invention]

【0008】[0008]

【課題を解決するための手段】上記目的を達成するため
、本発明は、被検体透過後のX線を収集するX線検出器
に余儀なく入射する散乱X線を遮断するX線CT装置の
グリッド構造において、前記X線検出器は複数個並設さ
れた検出素子から構成され、2以上の検出素子毎にグリ
ッド板を配設したことが特徴である。また、請求項1に
おいて、前記グリッド板の開口幅と奥行き長さは所定の
比率となるように構成されることを特徴とする。
[Means for Solving the Problems] In order to achieve the above object, the present invention provides a grid for an X-ray CT apparatus that blocks scattered X-rays that inevitably enter an X-ray detector that collects X-rays after passing through a subject. In terms of structure, the X-ray detector is characterized in that it is composed of a plurality of detection elements arranged in parallel, and that a grid plate is provided for each of two or more detection elements. Further, in claim 1, the opening width and the depth of the grid plate are configured to have a predetermined ratio.

【0009】[0009]

【作用】上述の如く構成すれば、各検出素子毎にグリッ
ド板を設けたときよりもグリッド板の個数が少なくなる
ので、グリッド板の厚みによって遮断される透過X線の
量が減少する。従って、この分だけ幾何効率が向上し、
CT画像の画質が向上する。
[Function] With the above structure, the number of grid plates is smaller than when a grid plate is provided for each detection element, so the amount of transmitted X-rays blocked by the thickness of the grid plate is reduced. Therefore, the geometric efficiency improves by this amount,
The image quality of CT images is improved.

【0010】0010

【実施例】以下、本発明の一実施例を図面に基づいて説
明する。図1は本発明が適用されたX線CT装置のグリ
ッド構造の一実施例を示す構成図である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram showing an embodiment of the grid structure of an X-ray CT apparatus to which the present invention is applied.

【0011】同図に示すシンチレータ7は、透過X線を
収集するものであり、複数個並設されている。また、各
シンチレータ7には、検出されたX線を電気信号に変換
するフォトダイオード9が接続されている。
A plurality of scintillators 7 shown in the figure are arranged in parallel to collect transmitted X-rays. Furthermore, each scintillator 7 is connected to a photodiode 9 that converts detected X-rays into electrical signals.

【0012】シンチレータ7のX線入射側には、3個の
シンチレータ7ごとにグリッド8が設けられている。こ
のグリッド8は、モリブデンやタングステン等の金属で
構成され、照射されるX線を吸収するようになっている
A grid 8 is provided for every three scintillators 7 on the X-ray incident side of the scintillator 7 . This grid 8 is made of metal such as molybdenum or tungsten, and is designed to absorb the irradiated X-rays.

【0013】そして、図1に示すグリッド構造(以下、
実施例装置という)の各寸法を次のように決める。即ち
、グリッド8の厚さをL1 ,シンチレータ7のチャネ
ル間ピッチをL2 ,グリッド8の奥行き距離をL3 
,そして、グリッド8の開口幅をL4 とする。
[0013] Then, the grid structure shown in Fig. 1 (hereinafter,
The dimensions of the device (referred to as the example device) are determined as follows. That is, the thickness of the grid 8 is L1, the pitch between channels of the scintillator 7 is L2, and the depth distance of the grid 8 is L3.
, and the opening width of the grid 8 is assumed to be L4.

【0014】一方、この実施例装置と幾何効率を比較す
るために、図3には従来のグリッド構造(以下、従来装
置という)が示されており、グリッド8の奥行き距離が
L6,グリッド8の開口幅がL5 と決められている。 次に、図1,図2を用いて実施例装置と従来装置との幾
何効率を比較する。いま、散乱X線の除去効率を等しく
すれば、次の(1) 式が条件となる。 3・L2 /L3 =L2 /L6       …(
1)従って、 L3 =3・L6                 
            …(2)そして、従来装置の
幾何効率E1 は、E1 =L5 /L2       =(L2 −L1 )/L2      
=1−(L1 / L2 )            
      …(3)また、実施例装置の幾何効率E2
 は、E2 =L4 /(3・L2 ) =(3・L2 −L1 )/(3・L2 )=1−{L
1 /(3・L2 )}          …(4)
そして、(3) 式第二項と(4) 式第2項を比較す
ると、L1 /L2 >L1 /(3・L2 )  …
(5)なる関係が成立するので、 (3),(4)式か
ら、E1 <E2                 
                  …(6)が得ら
れ、従来装置よりも実施例装置の方が幾何効率が向上し
ていることがわかる。
On the other hand, in order to compare the geometrical efficiency with the device of this embodiment, a conventional grid structure (hereinafter referred to as the conventional device) is shown in FIG. The opening width is determined to be L5. Next, the geometric efficiency of the embodiment device and the conventional device will be compared using FIGS. 1 and 2. Now, if the removal efficiency of scattered X-rays is made equal, the following equation (1) becomes the condition. 3・L2 /L3 =L2 /L6 ...(
1) Therefore, L3 = 3・L6
...(2) And the geometric efficiency E1 of the conventional device is E1 = L5 /L2 = (L2 - L1) / L2
=1-(L1/L2)
...(3) Also, the geometric efficiency E2 of the example device
is E2=L4/(3・L2)=(3・L2−L1)/(3・L2)=1−{L
1/(3・L2)} …(4)
Comparing the second term of equation (3) and the second term of equation (4), we find that L1 /L2 >L1 /(3・L2)...
Since the relationship (5) holds true, from equations (3) and (4), E1 < E2
...(6) is obtained, and it can be seen that the geometrical efficiency of the example device is better than that of the conventional device.

【0015】このようにして、本実施例では、グリッド
8を3個のシンチレータ7毎に設置して散乱X線を除去
している。従って、従来よりも高い幾何効率で透過X線
を収集することができるようになる。なお、本実施例で
は、3個のシンチレータ7毎にグリッド8を設ける構成
としたが、2以上の個数であれば良いことは勿論である
In this way, in this embodiment, the grid 8 is installed every three scintillators 7 to remove scattered X-rays. Therefore, it becomes possible to collect transmitted X-rays with higher geometric efficiency than before. In this embodiment, the grid 8 is provided for every three scintillators 7, but it goes without saying that the number may be two or more.

【0016】[0016]

【発明の効果】以上説明したように、本発明では、グリ
ッド板を複数の検出素子毎に設置し、該グリッド板の奥
行き長さと開口距離とが所定の比率となるように構成さ
れている。従って、従来に比べて高い幾何効率下で散乱
X線を除去することができる。その結果、散乱X線に影
響されない鮮明なCT画像を得ることができるという効
果が得られる。
As explained above, in the present invention, a grid plate is installed for each of a plurality of detection elements, and the grid plate is configured such that the depth and opening distance are in a predetermined ratio. Therefore, scattered X-rays can be removed with higher geometrical efficiency than in the past. As a result, it is possible to obtain a clear CT image that is not affected by scattered X-rays.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の一実施例を示す構成図である。FIG. 1 is a configuration diagram showing an embodiment of the present invention.

【図2】従来装置の幾何効率を求める説明図である。FIG. 2 is an explanatory diagram for determining the geometric efficiency of a conventional device.

【図3】従来例を示す構成図である。FIG. 3 is a configuration diagram showing a conventional example.

【図4】従来例を示す構成図である。FIG. 4 is a configuration diagram showing a conventional example.

【符号の説明】[Explanation of symbols]

1  X線管 2  被検体 3  散乱X線 4  透過X線 7  シンタレータ 8  グリッド 1. X-ray tube 2. Subject 3 Scattered X-rays 4 Transmission X-ray 7 Sintering 8 Grid

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】  被検体透過後のX線を収集するX線検
出器に余儀なく入射する散乱X線を遮断するX線CT装
置のグリッド構造において、前記X線検出器は複数個並
設された検出素子から構成され、2以上の検出素子毎に
グリッド板を配設したことを特徴とするX線CT装置の
グリッド構造。
Claim 1: In a grid structure of an X-ray CT apparatus that blocks scattered X-rays that inevitably enter an X-ray detector that collects X-rays after passing through a subject, a plurality of the X-ray detectors are arranged in parallel. 1. A grid structure for an X-ray CT apparatus comprising detection elements, characterized in that a grid plate is provided for each of two or more detection elements.
【請求項2】  前記グリッド板の開口幅と奥行き長さ
は所定の比率となるように構成される請求項1記載のX
線CT装置のグリッド構造。
2. The grid plate according to claim 1, wherein the opening width and the depth length of the grid plate are configured to have a predetermined ratio.
Grid structure of line CT device.
JP3105455A 1991-05-10 1991-05-10 Grid structure of X-ray CT device Pending JPH04336044A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3105455A JPH04336044A (en) 1991-05-10 1991-05-10 Grid structure of X-ray CT device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3105455A JPH04336044A (en) 1991-05-10 1991-05-10 Grid structure of X-ray CT device

Publications (1)

Publication Number Publication Date
JPH04336044A true JPH04336044A (en) 1992-11-24

Family

ID=14408065

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3105455A Pending JPH04336044A (en) 1991-05-10 1991-05-10 Grid structure of X-ray CT device

Country Status (1)

Country Link
JP (1) JPH04336044A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5615279A (en) * 1993-11-02 1997-03-25 Hitachi Medical Corporation Method of and apparatus for correcting scattered X-rays for X-ray computerized tomograph
US6826256B2 (en) 2000-02-04 2004-11-30 Canon Kabushiki Kaisha Apparatus and method for a radiation image through a grid
JP2010220880A (en) * 2009-03-24 2010-10-07 Toshiba Corp Radiation detector and X-ray CT apparatus
JP2020024167A (en) * 2018-08-08 2020-02-13 セメス株式会社Semes Co., Ltd. X-ray inspection device and x-ray inspection method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5615279A (en) * 1993-11-02 1997-03-25 Hitachi Medical Corporation Method of and apparatus for correcting scattered X-rays for X-ray computerized tomograph
US6826256B2 (en) 2000-02-04 2004-11-30 Canon Kabushiki Kaisha Apparatus and method for a radiation image through a grid
US6868137B2 (en) 2000-02-04 2005-03-15 Canon Kabushiki Kaisha Apparatus and method for a radiation image through a grid
JP2010220880A (en) * 2009-03-24 2010-10-07 Toshiba Corp Radiation detector and X-ray CT apparatus
JP2020024167A (en) * 2018-08-08 2020-02-13 セメス株式会社Semes Co., Ltd. X-ray inspection device and x-ray inspection method

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